CN113341361B - Electronic equipment rectifying device, system and method - Google Patents
Electronic equipment rectifying device, system and method Download PDFInfo
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- CN113341361B CN113341361B CN202110625780.9A CN202110625780A CN113341361B CN 113341361 B CN113341361 B CN 113341361B CN 202110625780 A CN202110625780 A CN 202110625780A CN 113341361 B CN113341361 B CN 113341361B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The invention discloses an electronic equipment rectifying device, an electronic equipment rectifying system and an electronic equipment rectifying method, and relates to the technical field of testing. The specific implementation mode of the method comprises the following steps: the device comprises an artificial power supply network, tested equipment, a filtering component and a switch matrix, wherein the artificial power supply network, the tested equipment and the filtering component are connected in series to form a rectifying loop; and one end of the switch matrix is connected with the filter assembly, and the other end of the switch matrix is connected with the control equipment and is used for adjusting capacitance parameters and inductance parameters of the filter assembly. The implementation mode reduces the human factor interference in the rectifying and modifying process, is applicable to the testing and rectifying and modifying of various electronic equipment, greatly reduces manpower, time and equipment cost, and ensures the testing safety.
Description
Technical Field
The invention belongs to the technical field of testing, and particularly relates to an electronic equipment rectifying device, system and method.
Background
The conducted emissions (Conducted Emission) test may be used for electrical parameter testing of electronic devices, including testing of current, voltage, loss, etc. parameters.
In the conventional conduction emission test of electronic equipment, aiming at the condition that the parameter of the tested equipment exceeds the standard, a tester is usually required to analyze the reason of the exceeding standard, and a filter is added in a test circuit to rectify the test circuit according to the parameter difference value determined by analysis.
The existing test correction mode is based on personal experience, on one hand, the determined out-of-standard parameter difference value is inaccurate, and the universality is poor; on the other hand, the circuit needs to be repeatedly assembled and disassembled according to the parameter difference value, so that the labor, time and equipment cost are greatly consumed, and a great potential safety hazard exists.
Disclosure of Invention
In view of the above, the invention provides an electronic equipment rectifying device, system and method, which can reduce human factor interference in the rectifying process, can be suitable for testing rectifying of various electronic equipment, greatly reduces manpower, time and equipment cost, and ensures testing safety.
To achieve the above object, according to an aspect of an embodiment of the present invention, there is provided an electronic device rectifying apparatus including:
the device comprises an artificial power network, tested equipment, a filtering component and a switch matrix, wherein,
the artificial power supply network, the tested equipment and the filter component are connected in series to form a rectifying loop;
and one end of the switch matrix is connected with the filter assembly, and the other end of the switch matrix is connected with the control equipment and is used for adjusting capacitance parameters and inductance parameters of the filter assembly.
Optionally, the method further comprises: a test device, wherein,
the test equipment is used for testing the tested parameters of the tested equipment;
when the test equipment is a current probe, the current probe is used for testing the tested parameter of the tested equipment in a first frequency interval;
when the test equipment is an attenuator, the attenuator is used for testing the tested parameters of the tested equipment in a second frequency interval; wherein the measured parameter is current.
According to another aspect of an embodiment of the present invention, there is provided an electronic device rectifying system including:
the device comprises a testing module, an analyzing module and a control module;
the test module comprises an electronic equipment rectifying device and a receiver, wherein the receiver is connected with test equipment of the electronic equipment rectifying device and is used for receiving test data of tested parameters of the test equipment and sending the test data to the analysis module;
the analysis module comprises analysis software and is used for analyzing the test data, determining an analysis result of the test data and sending the analysis result to the control module;
and the control module is used for adjusting the capacitance parameter and the inductance parameter of the filter component through the switch matrix according to the analysis result.
According to still another aspect of the embodiment of the present invention, there is provided an electronic device rectifying method including the steps of:
step A1: receiving test data of a tested parameter sent by a receiver of test equipment, and sending the test data to an analysis module; wherein the test data comprises the out-of-standard data of the tested parameters;
step A2: receiving an analysis result of the analysis module and sending the analysis result to a control module; the analysis result comprises a test difference value and correction data of the test data;
step A3: the control module controls the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter component according to the rectifying data in the analysis result, so that the electronic equipment rectifying device tests the tested equipment according to the adjusted parameters to obtain a test result;
step A4: and (3) judging whether the test result is a target test result, and if not, turning to the step A1.
Optionally, the method further comprises:
before test data of test equipment are received, determining a tested parameter and a tested parameter threshold value through the analysis software, and generating a test task;
and sending the test task to a control module, so that the control module controls the electronic equipment rectifying device to carry out the test.
Optionally, the method further comprises:
after receiving the test task, the control module controls the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter component to return to zero, so that the electronic equipment rectifying device enters a test mode;
and after receiving the rectifying data, the control module controls the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter component according to the rectifying data, so that the electronic equipment rectifying device enters a rectifying mode.
The embodiments of the above invention have the following advantages or benefits: because the technical means of controlling the filter assembly through the switch matrix and further adjusting the test parameters to test is adopted, the technical problem is overcome, and the technical effects of reducing the experience and technical capability requirements of testers, reducing the time consumption of the rectifying process and eliminating the potential safety hazard of the rectifying process are achieved.
Drawings
FIG. 1 is a schematic diagram of an electronic device retrofit apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a test configuration of a test apparatus according to a first embodiment of the present invention;
FIG. 3 is a schematic diagram of a test configuration of a test apparatus according to a second embodiment of the present invention;
FIG. 4 is a schematic diagram of an electronic device retrofit system according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of the main flow of an electronic device modification method according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a software interface of analysis software according to an embodiment of the invention;
fig. 7 is a schematic diagram of a rectifying circuit according to a first embodiment of the present invention;
fig. 8 is a schematic diagram of a rectifying circuit according to a second embodiment of the present invention.
Detailed Description
The invention will now be described in detail by way of example with reference to the accompanying drawings.
Fig. 1 is a schematic diagram of an electronic device rectifying apparatus according to an embodiment of the present invention, and as shown in fig. 1, the electronic device rectifying apparatus of the present invention includes:
the device comprises an artificial power supply network, tested equipment, a filtering suite, a switch matrix and test equipment.
In the embodiment of the invention, the artificial power network is used for isolating power supply interference and providing specified power supply impedance for the tested equipment so as to detect the tested parameters of the tested equipment. The switch matrix is used for adjusting capacitance parameters and inductance parameters of the filter suite, so that different testing requirements, such as cable conduction emission measurement, are met, and then target testing results of tested equipment are obtained. The artificial power supply network, the tested equipment and the filter component are connected in series to form a loop: when the capacitance parameter and the inductance parameter of the filter component are respectively 0, a loop formed by connecting an artificial power supply network, the tested equipment and the filter component in series is a test loop; when the capacitance parameter and the inductance parameter of the filter component are not 0, a loop formed by connecting the artificial power network, the tested equipment and the filter component in series is a rectifying loop. The manual power supply network, the tested equipment and the filtering suite are connected through cables, and the filtering suite is connected with the switch matrix through cables.
In an embodiment of the invention, the artificial power network is a device for isolating power supply disturbances and providing a defined power supply impedance for the device under test. The filtering component is the main body for implementing the rectifying filtering.
In the embodiment of the invention, the electronic equipment rectifying device further comprises a testing device, which is used for testing the tested parameters of the tested equipment, and the testing device can be a current probe with a receiver or an attenuator.
In the embodiment of the invention, as shown in fig. 2, the current probe is used for testing the tested parameter of the tested equipment in the first frequency interval, and the current probe is sleeved on a cable connected with the tested equipment and the artificial power network during testing, so that the tested equipment is tested. The first frequency interval may be 25 Hz-10 kHz and the measured parameter is current.
In the embodiment of the present invention, as shown in fig. 3, the attenuator is used to test the measured parameter of the device under test in a second frequency interval, and the second frequency interval may be 10 kHz-10 MHz.
In the existing conduction emission test, the current value of tested equipment under each frequency needs to be tested, and when the current limit value exceeds the standard, the standard exceeding current needs to be rectified. The common correction mode is that a tester determines the reason of the exceeding standard according to the exceeding standard curve, calculates the required proportion of the filter, adds the matched filter on the tested equipment for retesting, and repeatedly adjusts until the test result is qualified. The existing rectifying and modifying mode needs to frequently disconnect the filter, so that potential safety hazards exist in the test.
According to the invention, the filter assembly is regulated through the switch matrix, frequent disassembly is not needed, the time and equipment cost are greatly reduced, and the safety of the test is ensured.
Fig. 4 is a schematic diagram of an electronic device modification system according to an embodiment of the present invention, and as shown in fig. 4, the electronic device modification system of the present invention includes:
the device comprises a testing module, an analyzing module and a control module;
in the embodiment of the invention, the test module comprises an electronic equipment rectifying device and a receiver, and the receiver is connected with test equipment of the electronic equipment rectifying device and is used for receiving test data of tested parameters of the test equipment and sending the test data to the analysis module. The test data are data obtained when the test equipment tests the tested parameters of the tested equipment. The receiver is connected with the testing equipment and used for acquiring data obtained by testing the tested equipment by the testing equipment.
In the embodiment of the invention, the analysis module comprises analysis software and analysis hardware, wherein the analysis software is used for analyzing the received test data, analyzing and determining the test difference value and the correction data of the test data, and sending the correction data to the control module.
In the embodiment of the invention, the control module is used for controlling the switch matrix of the electronic equipment rectifying device, in particular:
the control module is used for controlling the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter component according to the rectifying data, and rectifying and testing the tested equipment, so that the test data meets the requirements, and a target test result is obtained. The target test result refers to the test data of the tested parameter reaching the standard, for example, under the preset current threshold.
Fig. 5 is a schematic diagram of main flow of an electronic device modifying method according to an embodiment of the present invention, and as shown in fig. 5, the electronic device modifying method of the present invention includes:
step 1: and constructing a capacitance-inductance database of the filter assembly.
In the embodiment of the invention, a capacitance-inductance database of the filter assembly is constructed before testing and rectifying, wherein the database comprises paired data of inductance and capacitance and comprises a plurality of paired groups, and each paired group consists of a single inductance parameter and one or more capacitance parameters. The pairing group corresponds to the measured parameter, for example, the pairing group may be a capacitive-inductive pairing group of a cut-off working frequency, a capacitive-inductive pairing group suitable for current, a capacitive-inductive pairing group of insertion loss corresponding to frequency, and the like.
Step 2: the test mode is turned on.
In the embodiment of the invention, the control module controls the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter component to zero, and the test mode is started.
Step 3: and (5) checking and preparing before testing.
In the embodiment of the invention, the preparation for verification before the test comprises the following steps:
step 31: and respectively applying verification signals of preset frequency points to the test equipment, wherein the signal level is at least 6dB lower than the limit value. For example, as shown in fig. 2, the check numbers of the tested device include 1kHz, 3kHz and 10kHz; as shown in fig. 3, the check numbers of the device under test include 10kHz, 100kHz, 2MHz, and 10MHz.
Step 32: the current level was measured with an oscilloscope and a resistor while checking whether the current waveform was a sine wave.
Step 33: receiving check data of a receiver of the test equipment, judging whether the check data is within +/-3 dB of the level of the injected signal, and if so, turning to the step 4; if not, go to step 34.
Step 34: if the check data deviation exceeds + -3 dB, the error cause is analyzed and corrected so that the check data deviation is within + -3 dB of the injection signal level.
Step 4: and generating a test task.
In the embodiment of the invention, the tested parameters and the tested parameter threshold value are selected by the analysis software of the analysis module, the test name can be established for each test, and the test task is generated and sent to the control module in response to the trigger of the test start button.
In the embodiment of the invention, a software interface of the analysis software is shown in fig. 6, and includes a measured parameter, a measured parameter threshold, an analysis result, a correction proposal, and the like.
Step 5: the test is started.
In the embodiment of the invention, after receiving the test task, the control module controls the electronic equipment rectifying device to start the test.
Step 6: and receiving test data of the tested parameters sent by a receiver of the test equipment, and sending the test data to an analysis module.
Step 7: analyzing the test data, confirming the analysis result and sending the analysis result to the control module.
Step 71: after receiving the test data, a parameter curve is generated in response to the triggering of the correction start button.
Step 72: confirming whether the standard exceeding data exist or not, if so, marking the standard exceeding frequency points in the parameter curve to generate a standard exceeding curve, and turning to step 73; if not, go to step 12.
Step 73: and (3) analyzing the standard exceeding curve, comparing the standard exceeding data with the matched set of the capacitance-inductance database constructed according to the step (1), and confirming the testing difference value.
Step 74: and confirming the rectifying data according to the test difference value and sending the rectifying data to the control module. The rectification data comprise capacitance parameters and inductance parameters to be regulated.
In the embodiment of the invention, the analysis software is used for analyzing the test data, and the test data can comprise an over-standard frequency band, an amplitude value, the lowest over-standard harmonic frequency and amplitude value, the maximum over-standard amplitude value and frequency and the like.
In the embodiment of the invention, the analysis algorithm adopted by the analysis software is as follows:
f is frequency, and the unit is Hz;
l is the inductance of the inductor, and the unit is H;
c, capacitance value, the unit is F;
matching according to the matched group in the capacitance-inductance database to obtain the frequency of 2/3f 0 To f 0 And (3) comparing the insertion loss of each frequency with An exceeding amplitude value group (A0A 1 … … An) in the test data to determine the rectification data.
Wherein f 0 -first exceeding the standard frequency point;
a0 A1 … … an—superscalar amplitude of each superscalar data in the test data.
Step 8: and receiving the rectifying data of the analysis module.
Step 9: the rectification mode is turned on.
In the embodiment of the invention, the control module controls the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter suite according to the rectification data, and starts the rectification mode.
Step 10: and controlling the electronic equipment rectifying device to carry out rectifying test on the tested equipment according to the adjusted parameters, and obtaining a test result.
Step 11: receiving a test result, judging whether the test result is a target test result, and if so, turning to step 12; if not, go to step 6.
Step 12: and confirming that the test is successful.
In an embodiment of the present invention, as shown in fig. 7, a modification circuit for one of the modification modes of the test configuration of fig. 2 is disclosed; as shown in fig. 8, a modification circuit for one of the modification modes of the test configuration of fig. 3 is disclosed.
In the existing conduction emission test, the current value of tested equipment under each frequency needs to be tested, and when the current limit value exceeds the standard, the standard exceeding current needs to be rectified. The common correction mode is that a tester determines the reason of the exceeding standard according to the exceeding standard curve, calculates the required proportion of the filter, adds the matched filter on the tested equipment for retesting, and repeatedly adjusts until the test result is qualified. The existing rectifying and modifying mode needs to have abundant experience of testers and relies on personal experience.
The capacitance-inductance database established based on the historical data is used for analyzing the test data through the analysis software, so that the correction data is determined, the human factor interference in the correction process can be reduced, the method and the device are applicable to the test correction of various electronic equipment, the manpower, the time and the equipment cost are greatly reduced, and the safety of the test is ensured.
In summary, the above embodiments are only preferred embodiments of the present invention, and are not intended to limit the scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (2)
1. An electronic device rectifying method, characterized by comprising the following steps:
step A1: before receiving test data of a tested parameter sent by a receiver of test equipment, determining the tested parameter and a tested parameter threshold value through analysis software to generate a test task;
the test task is sent to a control module, so that the control module controls the electronic equipment rectifying device to test; after receiving the test task, the control module controls the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter component to return to zero, so that the electronic equipment rectifying device enters a test mode;
the preparation of verification before testing comprises:
step 31: respectively applying check signals of preset frequency points to test equipment, wherein the signal level is at least 6dB lower than the limit value;
step 32: measuring the current level with an oscilloscope and a resistor while checking whether the current waveform is a sine wave;
step 33: receiving check data of a receiver of the test equipment, judging whether the check data is within +/-3 dB of the level of the injected signal, and if so, turning to the step A2; if not, go to step 34;
step 34: if the check data deviation exceeds +/-3 dB, analyzing error reasons and correcting so that the check data deviation is within +/-3 dB of the injection signal level;
receiving test data of a tested parameter sent by a receiver of test equipment, and sending the test data to an analysis module; wherein the test data comprises the out-of-standard data of the tested parameters;
step A2: the analysis module analyzes the test data, and the specific process comprises the following steps:
step 71: after receiving the test data, responding to the trigger of the correction start button to generate a parameter curve;
step 72: confirming whether the standard exceeding data exist or not, if so, marking the standard exceeding frequency points in the parameter curve to generate a standard exceeding curve, and turning to step 73; if not, turning to step A3;
step 73: analyzing the standard exceeding curve, comparing the standard exceeding data with the matched set of the capacitance-inductance database constructed according to the step 1, and confirming a test difference value;
step 74: confirming correction data according to the test difference value and sending the correction data to the control module; the rectification data comprise capacitance parameters and inductance parameters to be regulated;
receiving an analysis result of the analysis module and sending the analysis result to a control module; the analysis result comprises a test difference value and correction data of the test data;
step A3: after receiving the rectifying data, the control module controls the switch matrix to adjust capacitance parameters and inductance parameters of the filter component according to the rectifying data, so that the electronic equipment rectifying device enters a rectifying mode; the control module controls the switch matrix to adjust the capacitance parameter and the inductance parameter of the filter component according to the rectifying data in the analysis result, so that the electronic equipment rectifying device tests the tested equipment according to the adjusted parameters to obtain a test result;
step A4: and (3) judging whether the test result is a target test result, and if not, turning to the step A1.
2. An electronic device modification system based on claim 1, comprising: the device comprises a testing module, an analyzing module and a control module; the analysis module and the control module are used in the manner as set forth in claim 1;
the test module comprises an electronic equipment rectifying device and a receiver, wherein the receiver is connected with the test equipment of the electronic equipment rectifying device and is used for receiving test data of tested parameters of the test equipment and sending the test data to the analysis module; the test data are data obtained when the test equipment tests the tested parameters of the tested equipment;
the analysis module comprises analysis software and is used for analyzing the test data, determining an analysis result of the test data and sending the analysis result to the control module;
the control module is used for adjusting capacitance parameters and inductance parameters of the filter assembly through the switch matrix according to the analysis result, and performing rectification test on the tested equipment so as to enable test data to meet the requirements and obtain a target test result; the target test result refers to the test data of the tested parameters reaching the standard;
the electronic equipment rectifying device includes: the device comprises an artificial power supply network, tested equipment, a filtering component and a switch matrix, wherein the artificial power supply network, the tested equipment and the filtering component are connected in series to form a rectifying loop;
the switch matrix is connected with the filter assembly at one end and the control equipment at the other end, and is used for adjusting capacitance parameters and inductance parameters of the filter assembly; further comprises: the test equipment is used for testing the tested parameters of the tested equipment;
when the test equipment is a current probe, the current probe is used for testing the tested parameter of the tested equipment in a first frequency interval;
when the test equipment is an attenuator, the attenuator is used for testing the tested parameters of the tested equipment in a second frequency interval; wherein the measured parameter is current.
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| CN113945786B (en) * | 2021-10-11 | 2024-06-04 | 海检检测有限公司 | Automatic conduction disturbance parameter optimizing device and optimizing method thereof |
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| CN2655528Y (en) * | 2003-08-20 | 2004-11-10 | 中国电子科技集团公司第十三研究所 | Numerically controlled frequency hopping filter |
| CN102130679B (en) * | 2011-04-12 | 2013-01-30 | 广州润芯信息技术有限公司 | Active RC (Resistance-Capacitance) filter bandwidth calibration method |
| CN102749536B (en) * | 2012-06-08 | 2014-05-07 | 北京航空航天大学 | Optimization method for conducted interference fault correcting by using conduction test standard-exceeding strategy |
| CN103926470B (en) * | 2014-04-24 | 2017-07-04 | 成都工业学院 | Electromagnetic interface filter loads insertion loss Auto-Test System |
| CN204008882U (en) * | 2014-06-11 | 2014-12-10 | 中达电子零组件(吴江)有限公司 | Artificial mains network |
| CN108226668A (en) * | 2017-12-07 | 2018-06-29 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of quick rectification device of power cord conduction transmitting test |
| CN108872880B (en) * | 2018-05-29 | 2019-11-22 | 珠海格力电器股份有限公司 | A kind of switch power supply EMI test device and method |
| CN110677139A (en) * | 2019-09-25 | 2020-01-10 | 北京中石正旗技术有限公司 | Numerical control band-pass filtering module |
| CN111781457A (en) * | 2020-07-24 | 2020-10-16 | 上海擎度汽车科技有限公司 | Test system and method for EMC conduction emission of electronic product |
| CN112731017B (en) * | 2020-12-21 | 2023-04-11 | 北京无线电计量测试研究所 | Device for measuring and rectifying conduction emission items of power line |
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