CN113340571A - Optical time delay measuring method and device based on optical vector analysis - Google Patents

Optical time delay measuring method and device based on optical vector analysis Download PDF

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CN113340571A
CN113340571A CN202110596035.6A CN202110596035A CN113340571A CN 113340571 A CN113340571 A CN 113340571A CN 202110596035 A CN202110596035 A CN 202110596035A CN 113340571 A CN113340571 A CN 113340571A
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reflection point
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time delay
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CN113340571B (en
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李树鹏
潘时龙
陈旭峰
王祥传
汤晓虎
王立晗
刘熙
李平
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Suzhou 614 Information Technology Co ltd
Nanjing University of Aeronautics and Astronautics
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Abstract

The invention discloses an optical time delay measuring method based on optical vector analysis, which uses a microwave frequency sweeping signal to modulate the intensity of a single-frequency optical carrier with the frequency periodically changing along with the time; then inputting the generated modulated optical signal into an optical link to be tested and converting the reflected modulated optical signal into an electrical signal; and extracting the amplitude-phase information of the electric signal and carrying out inverse Fourier transform on the amplitude-phase information to obtain the time domain impulse response of the optical link to be detected, and calculating the optical time delay of each reflection point according to the time domain impulse response of each reflection point contained in the time domain impulse response. The invention also discloses an optical time delay measuring device based on the light vector analysis. Compared with the prior art, the method has the advantages of super-long measuring distance, higher time domain resolution and higher time delay measuring precision.

Description

Optical time delay measuring method and device based on optical vector analysis
Technical Field
The invention relates to the technical field of light measurement, in particular to an optical time delay measurement method.
Background
With the rapid development of optical information systems, high-precision optical time delay measurement and control become the key for research and application of high-performance information systems such as 5G wireless communication networks, light-controlled phased arrays and distributed radar networks. Optical devices require single-ended testing to improve production efficiency during development and production. However, for an optical link, which generally comprises a plurality of devices, coupling of an optical fiber and other materials is involved, a plurality of reflection points are generated, and the reflected light of each reflection point interferes with each other, which affects the time delay measurement of the optical link. The problems are essentially caused by the fact that a plurality of transmission paths exist in the detection light, and the existing measurement technology has no time domain resolution capability.
The current optical time delay measuring method mainly comprises a pulse method, a frequency scanning interference method and a phase-push method. The measurement precision of the pulse method is limited by the pulse width, generally in the nanosecond level, the requirement of high-precision time delay measurement cannot be met, and the measurement precision and the measurement distance are a pair of contradictory quantities; the frequency scanning interferometry can achieve higher measurement accuracy, but the essence of the interferometry is to exchange large frequency domain bandwidth for high measurement accuracy, cannot measure narrow-band optical devices and long optical fiber links, and is limited in application in many scenes; the phase extrapolation method uses phase change in transmission to calculate the Optical fiber Delay, and can realize Measurement Accuracy of ten femtoseconds (s.p.li, t.qing, j.b.fu, x.c.wang, s.l.pan, "High-Accuracy and Fast Measurement of Optical Transfer Delay," IEEE Transactions on Instrumentation and Measurement, vol.70,8000204,2021.) in a narrow-band Measurement range of several GHz, but it cannot measure multipath transmission Delay, cannot guarantee Measurement distance and Measurement Accuracy, and has time domain resolution capability, and thus cannot be applied to diagnosis of Optical fiber links.
Disclosure of Invention
The technical problem to be solved by the invention is to overcome the defects of the prior art, and provide an optical time delay measurement method based on optical vector analysis, which has an ultra-long measurement distance and higher time domain resolution and time delay measurement precision.
The invention specifically adopts the following technical scheme to solve the technical problems:
an optical time delay measuring method based on optical vector analysis is characterized in that a microwave frequency sweeping signal is used for carrying out intensity modulation on a single-frequency optical carrier with frequency periodically changing along with time; then inputting the generated modulated optical signal into an optical link to be tested and converting the reflected modulated optical signal into an electrical signal; and extracting the amplitude-phase information of the electric signal and carrying out inverse Fourier transform on the amplitude-phase information to obtain the time domain impulse response of the optical link to be detected, and calculating the optical time delay of each reflection point according to the time domain impulse response of each reflection point contained in the time domain impulse response.
Preferably, the optical time delay of each reflection point is calculated according to the time domain impulse response of each reflection point included in the time domain impulse response of the optical link to be measured, specifically according to the following formula:
Figure BDA0003091157610000021
wherein h (t) is the time domain impulse response of the optical link to be measured, η is the responsivity of the photodetector used for converting the reflected modulated optical signal into an electrical signal, G is the optical amplification gain obtained by the reflected light, M is the modulation index of the intensity modulation, N is the number of reflection points, an、τnThe reflected light amplitude and the light time delay of the nth reflection point, t is time, delta (t-tau)n) Representing the time domain impulse response of the nth reflection point.
Further, the method further comprises: respectively transforming the time domain impulse response of each reflection point to a frequency domain to obtain the amplitude and the phase of the reflected light of each reflection point; and calculating the group delay of the reflected light of each reflection point by using the phase of the reflected light of each reflection point through a phase-subtraction method, and taking the calculated group delay as the accurate optical delay of the reflected light of the corresponding reflection point.
Preferably, the optical carrier is generated by a drive signal that periodically varies the amplitude of the distributed feedback laser input.
Preferably, the reflected modulated optical signal is amplified and filtered before being converted into an electrical signal.
Based on the same inventive concept, the following technical scheme can be obtained:
an optical time delay measuring device based on optical vector analysis, comprising:
the detection light input module is used for modulating the intensity of a single-frequency optical carrier with the frequency periodically changing along with time by using a microwave frequency sweeping signal and inputting a generated modulated optical signal into an optical link to be detected;
the optical detection module is used for converting the modulated optical signal reflected by the optical link to be detected into an electrical signal;
the amplitude-phase receiver is used for extracting amplitude-phase information of the electric signal;
and the data processing module is used for carrying out inverse Fourier transform on the amplitude-phase information of the electric signal to obtain the time domain impulse response of the optical link to be detected, and calculating the optical time delay of each reflection point according to the time domain impulse response of each reflection point contained in the time domain impulse response.
Preferably, the data processing module calculates the optical time delay of each reflection point according to the following formula:
Figure BDA0003091157610000031
wherein h (t) is the time domain impulse response of the optical link to be measured, η is the responsivity of the photodetector used for converting the reflected modulated optical signal into an electrical signal, G is the optical amplification gain obtained by the reflected light, M is the modulation index of the intensity modulation, N is the number of reflection points, an、τnThe reflected light amplitude and the light time delay of the nth reflection point, t is time, delta (t-tau)n) Representing the time domain impulse response of the nth reflection point.
Further, the data processing module further comprises:
and the accurate measurement module is used for respectively transforming the time domain impulse response of each reflection point to a frequency domain to obtain the amplitude and the phase of the reflected light of each reflection point, calculating the group delay of the reflected light of each reflection point by using the phase of the reflected light of each reflection point through a phase-subtraction method, and taking the calculated group delay as the accurate optical delay of the reflected light of the corresponding reflection point.
Preferably, the optical carrier is generated by a drive signal that periodically varies the amplitude of the distributed feedback laser input.
Preferably, the apparatus further comprises:
and the amplifying and filtering module is used for amplifying and filtering the reflected modulated optical signal before converting the reflected modulated optical signal into an electric signal.
Compared with the prior art, the invention has the following beneficial effects:
the optical time delay measurement is carried out by adopting the optical vector analysis method with time domain resolution capability, the method has the advantages of high measurement precision, large measurement range, high measurement speed and the like, can measure the multi-path transmission time delay, and has extremely high application value; the invention can also select to carry out rapid but rough measurement on the optical time delay of each reflection point in the optical link to be measured according to actual requirements, can also select to carry out accurate measurement on the optical time delay of each reflection point based on a phase-subtraction method, and has better use flexibility.
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Fig. 1 is a schematic structural diagram of a preferred embodiment of an optical time delay measuring device based on light vector analysis according to the present invention.
Detailed Description
Aiming at the defects in the prior art, the solution idea of the invention is to utilize a special detection optical signal to perform reflective measurement and perform optical time delay measurement with time domain resolution capability based on optical vector analysis, thereby simultaneously obtaining an ultra-long measurement distance and higher time domain resolution and time delay measurement precision.
The invention provides an optical time delay measuring method based on light vector analysis, which comprises the following specific steps: intensity modulation is carried out on a single-frequency optical carrier with frequency periodically changing along with time by using a microwave frequency sweeping signal; then inputting the generated modulated optical signal into an optical link to be tested and converting the reflected modulated optical signal into an electrical signal; and extracting the amplitude-phase information of the electric signal and carrying out inverse Fourier transform on the amplitude-phase information to obtain the time domain impulse response of the optical link to be detected, and calculating the optical time delay of each reflection point according to the time domain impulse response of each reflection point contained in the time domain impulse response.
The invention provides an optical time delay measuring device based on light vector analysis, which comprises:
the detection light input module is used for modulating the intensity of a single-frequency optical carrier with the frequency periodically changing along with time by using a microwave frequency sweeping signal and inputting a generated modulated optical signal into an optical link to be detected;
the optical detection module is used for converting the modulated optical signal reflected by the optical link to be detected into an electrical signal;
the amplitude-phase receiver is used for extracting amplitude-phase information of the electric signal;
and the data processing module is used for carrying out inverse Fourier transform on the amplitude-phase information of the electric signal to obtain the time domain impulse response of the optical link to be detected, and calculating the optical time delay of each reflection point according to the time domain impulse response of each reflection point contained in the time domain impulse response.
The single-frequency optical carrier with the frequency periodically changing along with the time has the function of reducing the time coherence of the optical carrier and avoiding the influence of the interference of a reflected light signal in an optical fiber link on the measurement. The optical carrier can be generated in various ways, for example, by generating the optical carrier with a driving signal that periodically changes the input amplitude of the distributed feedback laser, performing external modulation on the original optical carrier with a wide-spectrum electric signal, and the like. The invention preferably generates the optical carrier by inputting a drive signal with a periodically varying amplitude to the distributed feedback laser.
For the public understanding, the technical scheme of the invention is explained in detail by a specific embodiment and the accompanying drawings:
in this embodiment, a basic structure of the optical time delay measuring apparatus is shown in fig. 1, where a frequency oscillation light source module generates a single-frequency optical signal with a frequency periodically changing with time as an optical carrier, the single-frequency optical signal is subjected to intensity modulation in an electro-optical modulation module by a frequency sweep microwave signal output by a frequency sweep microwave source, and the generated intensity modulation signal is transmitted to an optical fiber link to be measured through an optical circulator; the method comprises the steps that a reflected light signal received from the other port of the optical circulator sequentially passes through an optical amplification module and an optical band-pass filter to be subjected to optical signal amplification and out-of-band noise suppression, then is converted into an electric signal by an optical detection module, a magnitude-phase receiver extracts magnitude-phase information of the electric signal, a data processing module performs inverse Fourier transform on the magnitude-phase information of the electric signal to obtain time domain impulse response of an optical link to be detected, and optical time delay of each reflection point is calculated according to the time domain impulse response of each reflection point contained in the time domain impulse response.
The frequency oscillating light source module in this embodiment comprises a signal generator and a distributed feedback laser, and a fixed frequency sinusoidal signal from the signal generator is sent to an external analog input of a laser diode driver of the distributed feedback laser to obtain a time varying laser drive current. Due to the frequency chirp effect, the distributed feedback laser outputs a single-frequency optical carrier whose frequency varies sinusoidally with time.
In principle, the expression of the intensity modulation signal returned from the optical fiber link to be tested is as follows:
Figure BDA0003091157610000051
wherein A isnIs the amplitude, tau, of the light reflected by each reflection point in the optical fiber link to be measurednIs the optical time delay experienced by the reflected light at each reflection point, M is the modulation index of the intensity modulation, ωmIs the frequency, omega, of the microwave signalcIs the frequency of the optical carrier and N is the number of reflection points. After amplification, filtering and photoelectric conversion, the recovered microwave signal received by the amplitude-phase receiver can be represented in the frequency domain as:
Figure BDA0003091157610000052
where η is the responsivity of the photodetector and G is the optical amplification gain obtained by the reflected light. The time domain response of the optical fiber link to be tested can be obtained by performing inverse Fourier transform on the formula (2), the time domain response comprises the time domain impulse response of each reflection point, and the expression is as follows:
Figure BDA0003091157610000053
the time domain impulse response of each reflection point contained in the time domain response of the optical fiber link to be tested is utilized, and the optical time delay tau of each reflection point can be calculated according to the formula (3)n
In order to obtain more accurate taunThe time domain impulse response of each reflection point can be further subjected to Fourier transform to obtain the amplitude and the phase of the time domain impulse response, and the group delay experienced by the reflected light of each reflection point is calculated by using a phase deduction method by utilizing the phase. The group delay is equal to the phase delay, considering that the group delay of the optical fiber link is constant over a small frequency range. Therefore, the obtained group delay of each reflection point can be used as the accurate optical delay of the reflected light of the corresponding reflection point.
And obtaining the accurate time delay of the reflected light of each reflection point, and further determining the accurate position of each reflection point. In a homogeneous medium, the phase retardation can be measured by the length L of the device, the effective refractive index neffAnd speed of light in vacuum c0So, there are:
Figure BDA0003091157610000061
wherein L isnIndicating the length of the reflection point from the access end. From this the position of the reflection point in the fiber link can be calculated.

Claims (10)

1. An optical time delay measuring method based on optical vector analysis is characterized in that a microwave frequency sweeping signal is used for carrying out intensity modulation on a single-frequency optical carrier with frequency periodically changing along with time; then inputting the generated modulated optical signal into an optical link to be tested and converting the reflected modulated optical signal into an electrical signal; and extracting the amplitude-phase information of the electric signal and carrying out inverse Fourier transform on the amplitude-phase information to obtain the time domain impulse response of the optical link to be detected, and calculating the optical time delay of each reflection point according to the time domain impulse response of each reflection point contained in the time domain impulse response.
2. The optical time delay measurement method based on optical vector analysis according to claim 1, wherein the optical time delay of each reflection point is calculated according to the time domain impulse response of each reflection point included in the time domain impulse response of the optical link under test, specifically according to the following formula:
Figure FDA0003091157600000011
wherein h (t) is the time domain impulse response of the optical link to be measured, η is the responsivity of the photodetector used for converting the reflected modulated optical signal into an electrical signal, G is the optical amplification gain obtained by the reflected light, M is the modulation index of the intensity modulation, N is the number of reflection points, an、τnThe reflected light amplitude and the light time delay of the nth reflection point, t is time, delta (t-tau)n) Representing the time domain impulse response of the nth reflection point.
3. The method for measuring optical time delay based on optical vector analysis according to claim 1 or 2, wherein the method further comprises: respectively transforming the time domain impulse response of each reflection point to a frequency domain to obtain the amplitude and the phase of the reflected light of each reflection point; and calculating the group delay of the reflected light of each reflection point by using the phase of the reflected light of each reflection point through a phase-subtraction method, and taking the calculated group delay as the accurate optical delay of the reflected light of the corresponding reflection point.
4. The optical time delay measurement method based on the optical vector analysis as claimed in claim 1 or 2, wherein the optical carrier is generated by a driving signal with a periodically varying amplitude to the distributed feedback laser input.
5. The optical time delay measuring method based on the optical vector analysis as claimed in claim 1 or 2, wherein the reflected modulated optical signal is amplified and filtered before being converted into an electrical signal.
6. An optical time delay measuring device based on optical vector analysis, comprising:
the detection light input module is used for modulating the intensity of a single-frequency optical carrier with the frequency periodically changing along with time by using a microwave frequency sweeping signal and inputting a generated modulated optical signal into an optical link to be detected;
the optical detection module is used for converting the modulated optical signal reflected by the optical link to be detected into an electrical signal;
the amplitude-phase receiver is used for extracting amplitude-phase information of the electric signal;
and the data processing module is used for carrying out inverse Fourier transform on the amplitude-phase information of the electric signal to obtain the time domain impulse response of the optical link to be detected, and calculating the optical time delay of each reflection point according to the time domain impulse response of each reflection point contained in the time domain impulse response.
7. The optical time delay measuring device based on the optical vector analysis as claimed in claim 6, wherein the data processing module calculates the optical time delay of each reflection point according to the following formula:
Figure FDA0003091157600000021
wherein h (t) is the time domain impulse response of the optical link to be measured, η is the responsivity of the photoelectric detector used for converting the reflected modulated optical signal into an electrical signal, G is the optical amplification gain obtained by the reflected light,m is the modulation index of the intensity modulation, N is the number of reflection points, An、τnThe reflected light amplitude and the light time delay of the nth reflection point, t is time, delta (t-tau)n) Representing the time domain impulse response of the nth reflection point.
8. The optical time delay measuring device based on the optical vector analysis as claimed in claim 6 or 7, wherein the data processing module further comprises:
and the accurate measurement module is used for respectively transforming the time domain impulse response of each reflection point to a frequency domain to obtain the amplitude and the phase of the reflected light of each reflection point, calculating the group delay of the reflected light of each reflection point by using the phase of the reflected light of each reflection point through a phase-subtraction method, and taking the calculated group delay as the accurate optical delay of the reflected light of the corresponding reflection point.
9. The optical time delay measuring device based on the optical vector analysis as claimed in claim 6 or 7, wherein the optical carrier is generated by a driving signal with a periodically varying amplitude to the distributed feedback laser input.
10. The optical time delay measuring device based on the optical vector analysis as claimed in claim 6 or 7, wherein the device further comprises:
and the amplifying and filtering module is used for amplifying and filtering the reflected modulated optical signal before converting the reflected modulated optical signal into an electric signal.
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