CN113295957A - Test control device, method and micro control unit - Google Patents
Test control device, method and micro control unit Download PDFInfo
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- CN113295957A CN113295957A CN202110626182.3A CN202110626182A CN113295957A CN 113295957 A CN113295957 A CN 113295957A CN 202110626182 A CN202110626182 A CN 202110626182A CN 113295957 A CN113295957 A CN 113295957A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
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Abstract
The embodiment of the invention relates to the technical field of testing, and discloses a testing control device, a testing control method and a micro control unit. The test control device includes: the micro control unit is used for outputting a first voltage firstly and outputting a second voltage which is greater than or equal to the power supply voltage of the part to be tested when the sampling voltage is judged to be greater than or equal to a preset threshold value, so that the micro control unit can test the part to be tested. This application judges whether the part that awaits measuring has accessed test control device according to whether the voltage at detection circuitry both ends is greater than or equal to and predetermines the threshold value, and after detecting the part that awaits measuring and accessing test control device, increase detection circuitry's output voltage, in order to supply power to the part that awaits measuring, avoid when detection circuitry's output voltage is great, with the part that awaits measuring access test control device, can show and reduce the access in-process at the inside pulse in the twinkling of an eye that produces of part that awaits measuring, and then promoted the yields of the part that awaits measuring.
Description
Technical Field
The embodiment of the invention relates to the technical field of testing, in particular to a testing control device, a testing control method and a micro control unit.
Background
In the production process of mobile phone parts, a factory usually adopts a hot plug mode to connect an IC chip, a semi-finished product and a finished product module to a testing device for testing, taking the testing IC chip as an example, when the testing device is in a power-on state, a micro control unit in the testing device repeatedly reads to detect whether the IC chip is connected with the testing device, and when the IC chip is detected to be connected with the testing device, the testing device supplies power to the IC chip and starts a testing process to test the IC chip; after the test flow is finished, the micro control unit in the test device repeatedly performs reading operation to detect whether the IC chip is pulled out of the test device, and after the IC chip is detected to be pulled out of the test device, the operation is repeated to continuously test the part to be tested.
However, in the process of connecting the component to be tested to the testing device in a hot plugging manner or pulling the component to be tested out of the testing device, an instantaneous pulse is generated inside the component to be tested, which may cause irreversible damage to the component to be tested, thereby affecting the yield of the component to be tested.
Disclosure of Invention
The embodiment of the invention aims to provide a test control device, a test control method and a micro control unit, wherein after the low voltage is detected that a component to be tested is connected into the test control device, the output voltage of a detection circuit is increased to supply power to the component to be tested, the condition that the component to be tested is connected into the test control device when the output voltage of the detection circuit is larger is avoided, the transient pulse generated in the component to be tested in the connection process can be obviously reduced, and the yield of the component to be tested is improved.
In order to solve the above technical problem, an embodiment of the present invention provides a test control apparatus for testing an externally connected device to be tested, including: the device comprises a micro control unit, a detection circuit and a sampling unit; the first output end of the micro control unit is connected with the input end of the detection circuit, the output end of the detection circuit is used for being connected with a component to be detected, the first input end of the sampling unit is connected with the input end of the detection circuit, the second input end of the sampling unit is connected with the output end of the detection circuit, and the output end of the sampling unit is connected with the detection end of the micro control unit; the micro control unit is used for outputting a first voltage firstly and outputting a second voltage when the sampling voltage is judged to be greater than or equal to a preset threshold value so that the micro control unit can test the component to be tested; the sampling voltage is a voltage between the input end of the detection circuit and the output end of the detection circuit, the first voltage is smaller than the power supply voltage of the component to be detected, and the second voltage is larger than or equal to the power supply voltage of the component to be detected.
The embodiment of the invention also provides a test control method, which comprises the following steps: compared with the prior art, the test control device is applied to a micro control unit in the test control device and used for testing an externally accessed component to be tested, and the test control device further comprises a detection circuit and a sampling unit; the first output end of the micro control unit is connected with the input end of the detection circuit, the output end of the detection circuit is used for being connected with a component to be detected, the first input end of the sampling unit is connected with the input end of the detection circuit, the second input end of the sampling unit is connected with the output end of the detection circuit, and the output end of the sampling unit is connected with the detection end of the micro control unit; the method comprises the following steps: the micro control unit outputs a first voltage, and outputs a second voltage when the sampling voltage is judged to be greater than or equal to a preset threshold value, so that the micro control unit can test the component to be tested; the sampling voltage is a voltage between the input end of the detection circuit and the output end of the detection circuit, the first voltage is smaller than the power supply voltage of the component to be detected, and the second voltage is larger than or equal to the power supply voltage of the component to be detected.
An embodiment of the present invention further provides a micro control unit, including: at least one processor; and a memory communicatively coupled to the at least one processor; the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute the test control method.
Compared with the related art, the micro control unit firstly outputs a first voltage which can enable the voltage of the output end of the detection circuit to be smaller than the power supply voltage of the component to be detected by default, at the moment, the component to be detected is not powered, the sampling unit firstly collects the voltages at two ends of the detection circuit as the sampling voltage, when the component to be detected is not connected to the test control device, specifically, when the component to be detected is not connected to the output end of the detection circuit, the output end of the detection circuit is in an open-circuit state, the resistance value of the detection circuit can be considered to be infinite, and at the moment, the sampling voltage is smaller than the preset threshold value; when the part to be tested is connected into the test control device, the output end of the detection circuit is no longer in an open circuit state, the resistance value of the detection circuit can be considered to be no longer infinite, the sampling voltage can be greater than or equal to a preset threshold value at the moment, the micro control unit can output a second voltage when judging that the sampling voltage is greater than or equal to the preset threshold value, the second voltage can enable the voltage of the output end of the detection circuit to be greater than or equal to the power supply voltage of the part to be tested, so that the part to be tested is powered on, and then the micro control unit can start a test flow to test the part to be tested. The device judges whether the part to be tested is connected with the test control device according to whether the voltage at two ends of the detection circuit is greater than or equal to a preset threshold value or not when the micro control unit outputs the voltage which is not enough to supply power to the part to be tested, and after the part to be tested is judged to be connected with the test control device, the micro control unit outputs voltage enough for supplying power to the part to be tested so as to supply power to the part to be tested, when the test control device outputs voltage enough to supply power to the component to be tested, the component to be tested is connected to the test control device, thereby generating instant pulse in the part to be tested, the application can effectively reduce the instant pulse generated in the part to be tested in the process of connecting the part to be tested into the test control device, further, irreversible damage to the component to be tested can be avoided as much as possible, and the yield of the component to be tested can be improved to a certain extent.
In addition, the detection circuit comprises a first switch tube, a second switch tube, a first resistor and a second resistor; the first end of the first switch tube is used as the input end of the detection circuit, the second end of the first switch tube is connected to the first end of the first resistor, the second end of the first resistor is used as the output end of the detection circuit, the first end of the second switch tube is connected to the first end of the first switch tube, the second end of the second switch tube is connected to the first end of the second resistor, the second end of the second resistor is connected to the second end of the first resistor, the third end of the first switch tube is connected to the second output end of the micro control unit, and the third end of the second switch tube is connected to the third output end of the micro control unit; the resistance value of the first resistor is far larger than that of the second resistor; the micro control unit is further used for outputting a third voltage to the first switching tube, outputting a fourth voltage to the second switching tube, outputting a fifth voltage to the first switching tube and outputting a sixth voltage to the second switching tube when the sampling voltage is judged to be greater than or equal to the preset threshold value; the third voltage is greater than or equal to the conduction voltage of the first switch tube, the fourth voltage is less than the conduction voltage of the second switch tube, the fifth voltage is less than the conduction voltage of the first switch tube, and the sixth voltage is greater than or equal to the conduction voltage of the second switch tube. In this embodiment, the detection circuit includes two branches, which are a branch where the first switch tube is located and a branch where the second switch tube is located, and the branch where the first switch tube is located is connected to the component to be tested in the process that the component to be tested is connected to the test control device, and because the resistance value of the first resistor of the branch where the first switch tube is located is larger (much larger than that of the second resistor), the detection circuit can form a series circuit with the component to be tested (not working under the first voltage, in a high-resistance state) and generate a voltage that can be easily captured by the sampling circuit; after the part to be tested is connected with the test control device, the micro control unit outputs a second voltage to supply power to the part to be tested, at the moment, the branch circuit where the second switch tube is located is connected with the part to be tested (working under the second voltage and in a low-resistance state), because the second resistance value of the branch circuit where the second switch tube is located is small (far smaller than the resistance value of the first resistance), the sampling unit can monitor the voltage at two ends of the detection circuit in real time, and the normal work of the part to be tested is not influenced when the part to be tested is judged whether large current is abnormal or not.
In addition, the test control device also comprises a first conversion unit and a second conversion unit; the second output end of the micro control unit is connected to the third end of the first switch tube through the first conversion unit, and the third output end of the micro control unit is connected to the third end of the second switch tube through the second conversion unit; the first conversion unit is used for converting the voltage output by the micro control unit into a third voltage or a fifth voltage for output; the second conversion unit is used for converting the voltage output by the micro control unit into a fourth voltage or a sixth voltage for output. In this embodiment, the first conversion unit and the second conversion unit may respectively convert the first voltage and the second voltage output by the micro control unit into a voltage capable of turning on the first switching tube or the second switching tube, and a voltage incapable of turning on the first switching tube or the second switching tube, so that the voltage range requirement on the voltage output by the micro control unit may be relatively relaxed.
In addition, the first conversion unit specifically comprises a power supply, a capacitor, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6 and an amplifier; the first end of the capacitor is grounded, the second end of the capacitor is connected to the output end of the power supply, the second end of the capacitor is also connected to the first end of a third resistor R3, the second end of a third resistor R3 is respectively connected to the inverting input end of the amplifier and the first end of a fourth resistor R4, the second end of a fourth resistor R4 is connected to the output end of the amplifier, the first end of a fifth resistor R5 is used as the input end of the first conversion unit, the second end of a fifth resistor R5 is respectively connected to the non-inverting input end of the amplifier and the first end of a sixth resistor R6, the second end of a sixth resistor R6 is grounded, and the output end of the amplifier is used as the output end of the first conversion unit; the power supply is used for outputting a constant voltage Vs; the amplifier is used for outputting the conversion voltage Vo; wherein the content of the first and second substances,
Vdacthe voltage output by the micro control unit to the first conversion unit. In the embodiment, a specific implementation form of the first conversion unit is provided.
In addition, the first switch tube and the second switch tube are both MOS tubes; the first end of the first switching tube is a source electrode or a drain electrode of the MOS tube, the second end of the first switching tube is a drain electrode or a source electrode of the MOS tube, and the third end of the first switching tube is a grid electrode of the MOS tube; the first end of the second switch tube is the source electrode or the drain electrode of the MOS tube, the second end of the second switch tube is the drain electrode or the source electrode of the MOS tube, and the third end of the second switch tube is the grid electrode of the MOS tube.
In addition, the communication end of the micro control unit is used for being connected with the communication end of the component to be tested; and the micro control unit is used for transmitting data through the communication end of the micro control unit and the communication end of the component to be tested after outputting the second voltage.
In addition, the test control device also comprises a third conversion unit, and the communication end of the micro control unit is used for being connected to the communication end of the component to be tested through the third conversion unit; the third conversion unit is used for converting the data output by the micro control unit into data which can be received by the component to be tested and then outputting the data to the component to be tested; and converting the data output by the component to be tested into data which can be received by the micro control unit and then outputting the data to the micro control unit.
In addition, the power supply end of the third conversion unit is connected with the fourth output end of the micro control unit; the micro control unit is used for forbidding the third conversion unit to output a voltage which is larger than or equal to the power supply voltage of the third conversion unit when the first voltage is output to the detection circuit. In this embodiment, when the micro control unit does not supply power to the component to be tested yet, but the communication end of the component to be tested is connected to the third conversion unit, if the third conversion unit is started to start working, a current backflow phenomenon may occur in an internal device of the component to be tested, and the component to be tested may be damaged.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
FIG. 1 is a block schematic diagram of a test control device in accordance with one embodiment;
FIG. 2 is a block schematic diagram of a test control device according to one embodiment;
FIG. 3 is a circuit diagram of a first switching unit in a test control apparatus according to one embodiment;
FIG. 4 is a block schematic diagram of a test control device in accordance with one embodiment;
FIG. 5 is a flow diagram of a test control method in accordance with one embodiment;
FIG. 6 is a block schematic diagram of a micro control unit in accordance with one embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that in various embodiments of the invention, numerous technical details are set forth in order to provide a better understanding of the present application. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments. The following embodiments are divided for convenience of description, and should not constitute any limitation to the specific implementation manner of the present invention, and the embodiments may be mutually incorporated and referred to without contradiction.
One embodiment of the present invention relates to a test control apparatus for testing externally accessed devices to be tested, and referring to fig. 1, the test control apparatus includes: little the control unit 1, detection circuitry 2 and sampling unit 3, little the control unit 1 first output 101 is connected in detection circuitry 2's input 201, detection circuitry 2's output 202 is used for connecting in the part 4 that awaits measuring, sampling unit 3's first input 301 is connected in detection circuitry 2's input 201, sampling unit 3's second input 302 is connected in detection circuitry 2's output 202, sampling unit 3's output 303 is connected in little the control unit 1's sense terminal 102.
The micro control unit 1 outputs a first voltage by default, and outputs a second voltage when the sampling voltage output by the sampling unit 3 is judged to be greater than or equal to a preset threshold value, so that the micro control unit 1 can test the component 4 to be tested.
In one embodiment, when the micro control unit 1 outputs the first voltage, the voltage of the output end 202 of the detection circuit 2 is less than the power supply voltage of the component to be detected 4, and when the micro control unit 1 outputs the second voltage, the voltage of the output end 202 of the detection circuit 2 is greater than or equal to the power supply voltage of the component to be detected 4.
In this embodiment, the micro control unit may first output a first voltage by default, where the first voltage makes the voltage at the output end of the detection circuit smaller than the power supply voltage of the component to be tested, and at this time, the component to be tested is not powered first, and the sampling unit first collects the voltages at the two ends of the detection circuit as a sampling voltage; when the part to be tested is connected into the test control device, the output end of the detection circuit is no longer in an open circuit state, the resistance value of the detection circuit can be considered to be no longer infinite, the sampling voltage can be greater than or equal to a preset threshold value at the moment, the micro control unit can output a second voltage when judging that the sampling voltage is greater than or equal to the preset threshold value, the second voltage can enable the voltage of the output end of the detection circuit to be greater than or equal to the power supply voltage of the part to be tested, so that the part to be tested is powered on, and then the micro control unit can start a test flow to test the part to be tested. The device judges whether the part to be tested is connected with the test control device according to whether the voltage at two ends of the detection circuit is greater than or equal to a preset threshold value or not when the micro control unit outputs the voltage which is not enough to supply power to the part to be tested, and after the part to be tested is judged to be connected with the test control device, the micro control unit outputs voltage enough for supplying power to the part to be tested so as to supply power to the part to be tested, when the test control device outputs voltage enough to supply power to the component to be tested, the component to be tested is connected to the test control device, thereby generating instant pulse in the part to be tested, the application can effectively reduce the instant pulse generated in the part to be tested in the process of connecting the part to be tested into the test control device, further, irreversible damage to the component to be tested can be avoided as much as possible, and the yield of the component to be tested can be improved to a certain extent.
Specifically, when the to-be-tested component 4 is not connected to the test control device, specifically, when the to-be-tested component 4 is not connected to the output end 202 of the detection circuit 2, the detection circuit 2 is in an open circuit state, it can be considered that the resistance value of the detection circuit 2 is infinite, at this time, the sampling voltage is smaller than the preset threshold value, the micro control unit 1 can output a voltage insufficient for supplying power to the to-be-tested component 4 when determining that the sampling voltage output by the sampling unit 3 is smaller than the preset threshold value, further, the voltage can be as small as possible, so as to avoid that in the process of connecting the to-be-tested component 4 to the test control device, the voltage of the output end 202 of the detection circuit 2 is too large, so that the to-be-tested component 4 generates an instantaneous pulse, and further the to-be-damaged component 4.
When the part to be tested 4 is connected to the test control device, the detection circuit 2 is no longer in an open circuit state, the resistance value of the detection circuit 2 is no longer infinite, the sampling voltage is greater than or equal to the preset threshold value, and the micro control unit 1 outputs a voltage which is enough to supply power to the part to be tested 4 when the sampling voltage output by the sampling unit 3 is greater than or equal to the preset threshold value, so that the micro control unit 1 can test the part to be tested 4.
In one embodiment, referring to fig. 2, the detection circuit 2 includes a first switch 21, a second switch 22, a first resistor R1 and a second resistor R2.
A first end 211 of the first switch tube 21 is used as an input end 201 of the detection circuit 2, a second end 212 of the first switch tube 21 is connected to a first end of a first resistor R1, a second end of the first resistor R1 is used as an output end 202 of the detection circuit 2, a first end 221 of the second switch tube 22 is connected to the first end 211 of the first switch tube 21, a second end 222 of the second switch tube 22 is connected to a first end of a second resistor R2, a second end of the second resistor R2 is connected to a second end of the first resistor R1, a third end 213 of the first switch tube 21 is connected to the second output end 103 of the micro control unit 1, and a third end 223 of the second switch tube 22 is connected to the third output end 104 of the micro control unit 1; the resistance of the first resistor R1 is much larger than that of the second resistor R2.
Specifically, in fig. 2, the first switch tube 21 and the second switch tube 22 are both MOS tubes, the first end 211 of the first switch tube 21 is a source or a drain of the MOS tube, the second end 212 of the first switch tube 21 is a drain or a source of the MOS tube, the third end 213 of the first switch tube 21 is a gate of the MOS tube, the first end 221 of the second switch tube 22 is a source or a drain of the MOS tube, the second end 222 of the second switch tube 22 is a drain or a source of the MOS tube, and the third end 223 of the second switch tube 22 is a gate of the MOS tube.
The micro control unit 1 outputs a third voltage to the first switch tube 21 by default, specifically, outputs a voltage greater than or equal to the turn-on voltage of the first switch tube 21 to the first switch tube 21, so that the first switch tube 21 is in a turn-on state, outputs a fourth voltage to the second switch tube 22, and specifically, outputs a voltage less than the turn-on voltage of the second switch tube 22 to the second switch tube 22, so that the second switch tube 22 is in a turn-off state.
When the micro control unit 1 determines that the sampling voltage is greater than or equal to the preset threshold, it outputs a fifth voltage to the first switching tube, that is, outputs a voltage smaller than the turn-on voltage of the first switching tube 21 to the first switching tube 21, so that the first switching tube 21 is in an off state; and outputs a sixth voltage to the second switch tube 22, that is, outputs a voltage greater than or equal to the turn-on voltage of the second switch tube 22 to the second switch tube 22, so that the second switch tube 22 is in a turn-on state.
In this embodiment, the detection circuit includes two branches, which are a branch where the first switch tube is located and a branch where the second switch tube is located, and the branch where the first switch tube is located is connected to the component to be tested in the process that the component to be tested is connected to the test control device, and because the resistance value of the first resistor of the branch where the first switch tube is located is larger (much larger than that of the second resistor), the detection circuit can form a series circuit with the component to be tested (not working under the first voltage, in a high-resistance state) and generate a voltage that can be easily captured by the sampling circuit; after the part to be tested is connected with the test control device, the micro control unit outputs a second voltage to supply power to the part to be tested, at the moment, the branch circuit where the second switch tube is located is connected with the part to be tested (working under the second voltage and in a low-resistance state), because the second resistance value of the branch circuit where the second switch tube is located is small (far smaller than the resistance value of the first resistance), the sampling unit can monitor the voltage at two ends of the detection circuit in real time, and the normal work of the part to be tested is not influenced when the part to be tested is judged whether large current is abnormal or not.
In an embodiment, on the basis of the corresponding embodiment of fig. 2, the test control apparatus further comprises a first converting unit 5 and a second converting unit 6.
The second output terminal 103 of the micro control unit 1 is connected to the third terminal 213 of the first switch tube 21 through the first converting unit 5, the second output terminal 103 of the micro control unit 1 is connected to the input terminal 501 of the first converting unit 5, the output terminal 502 of the first converting unit 5 is connected to the third terminal 213 of the first switch tube 21, the third output terminal 104 of the micro control unit 1 is connected to the third terminal 223 of the second switch tube 22 through the second converting unit 6, the third output terminal 104 of the micro control unit 1 is connected to the input terminal 601 of the second converting unit 6, and the output terminal 602 of the second converting unit 5 is connected to the third terminal 223 of the second switch tube 22.
When the sampling voltage is determined to be less than the preset threshold, the mcu 1 outputs a voltage to the first conversion unit 5 and the second conversion unit 6, the first conversion unit 5 converts the obtained voltage into a third voltage and outputs the third voltage to the first switch tube 21, specifically, the third voltage is converted into a conduction voltage greater than or equal to that of the first switch tube 21 and outputs the conduction voltage to the third terminal 213 of the first switch tube 21, so as to control the conduction of the first switch tube 21, the second conversion unit 6 converts the obtained voltage into a fourth voltage and outputs the fourth voltage to the second switch tube 22, specifically, the third voltage is converted into a conduction voltage less than that of the second switch tube 22 and outputs the conduction voltage to the third terminal 223 of the second switch tube 22, so as to control the turn-off of the second switch tube 22, wherein the conduction voltages of the first switch tube 21 and the second switch tube 22 may be equal or unequal.
The micro control unit 1 also outputs a voltage to the first conversion unit 5 and the second conversion unit 6 respectively when determining that the sampling voltage is greater than or equal to the preset threshold, the first conversion unit 5 converts the obtained voltage into a fifth voltage to be output to the first switch tube 21, specifically, converts the obtained voltage into a conduction voltage smaller than the first switch tube 21 to be output to the third terminal 213 of the first switch tube 21 to control the first switch tube 21 to be turned off, the second conversion unit 6 converts the obtained voltage into a sixth voltage to be output to the second switch tube 22, specifically, converts the obtained voltage into a conduction voltage greater than or equal to the second switch tube 22 to be output to the third terminal 223 of the second switch tube 22 to control the second switch tube 22 to be turned on.
In one embodiment, referring to fig. 3, the first converting unit 5 specifically includes a power supply 51, a capacitor C, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, and an amplifier 52.
A first end of the capacitor C is grounded, a second end of the capacitor C is connected to the output terminal 511 of the power supply 51, a second end of the capacitor C is further connected to a first end of a third resistor R3, a second end of the third resistor R3 is connected to the inverting input terminal 522 of the amplifier 52 and a first end of a fourth resistor R4, a second end of the fourth resistor R4 is connected to the output terminal 523 of the amplifier 52, a first end of the fifth resistor R5 serves as the input terminal 501 of the first converting unit 5, a second end of the fifth resistor R5 is connected to the non-inverting input terminal 521 of the amplifier 52 and a first end of a sixth resistor R6, a second end of the sixth resistor R6 is grounded, and the output terminal 523 of the amplifier 52 serves as the output terminal 502 of the first converting unit 5.
The power supply 51 outputs a constant voltage Vs, and the amplifier 52 outputs a converted voltage Vo calculated by the following equation:
For example, if the output Vs of the control power supply 51 is 1.0V, VdacThe output range of (a) is 0 to 3.3V, and R3 ═ R4 ═ R5 ═ R6 ═ 1K Ω, then according to the above formula, it can be obtained: vo is VdacThe output range of-Vs and Vo is-1.0V-2.3V, and the first conversion unit 5 can convert the voltage of 0V-3.3V output by the micro control unit 1 into the voltage of-1.0V-2.3V and output the voltage to the third end 213 of the first switch tube 21. In one embodiment, the second conversion unit 6 has the same structure and principle as the first conversion unit 5.
In one embodiment, in particular, the output voltage Vo converted by the first conversion unit 5 may be controlled to be less than 0 by controlling the second voltage output by the micro control unit 1. When the first switch tube 5 is in the on state, if the first switch tube 5 is to be turned off, the first switch tube 21 can be turned off faster than outputting a voltage smaller than the on voltage of the first switch tube 21 but larger than 0 to the third terminal 213 of the first switch tube 21, and outputting a negative voltage smaller than 0 directly, so that when two detection branches of the detection circuit 2 need to be switched, the switching can be performed faster.
In this embodiment, the micro control unit may first output a first voltage by default, where the first voltage is a voltage that will cause the voltage at the output end of the detection circuit to be smaller than the power supply voltage of the component to be detected, and at this time, the component to be detected is not powered first, and the sampling unit first collects the voltages at the two ends of the detection circuit as a sampling voltage; when the part to be tested is connected into the test control device, the output end of the detection circuit is no longer in an open circuit state, the resistance value of the detection circuit can be considered to be no longer infinite, the sampling voltage can be greater than or equal to a preset threshold value at the moment, the micro control unit can output a second voltage when judging that the sampling voltage is greater than or equal to the preset threshold value, the second voltage can enable the voltage of the output end of the detection circuit to be greater than or equal to the power supply voltage of the part to be tested, so that the part to be tested is powered on, and then the micro control unit can start a test flow to test the part to be tested. The device judges whether the part to be tested is connected with the test control device according to whether the voltage at two ends of the detection circuit is greater than or equal to a preset threshold value or not when the micro control unit outputs the voltage which is not enough to supply power to the part to be tested, and after the part to be tested is judged to be connected with the test control device, the micro control unit outputs voltage enough for supplying power to the part to be tested so as to supply power to the part to be tested, when the test control device outputs voltage enough to supply power to the component to be tested, the component to be tested is connected to the test control device, thereby generating instant pulse in the part to be tested, the application can effectively reduce the instant pulse generated in the part to be tested in the process of connecting the part to be tested into the test control device, further, irreversible damage to the component to be tested can be avoided as much as possible, and the yield of the component to be tested can be improved to a certain extent.
Another embodiment of the present invention relates to a test control apparatus, please refer to fig. 4, in which the communication terminal 105 of the micro control unit 1 is used for connecting to the communication terminal 401 of the device under test 4, and fig. 4 shows that the communication terminal 105 of the micro control unit 1 is connected to the communication terminal 41 of the device under test 4, and after the micro control unit 1 outputs the second voltage, that is, when the micro control unit 1 supplies power to the device under test 4, the communication terminal 105 of the micro control unit 1 and the communication terminal 401 of the device under test 4 transmit data.
In an embodiment, referring to fig. 4, the test control apparatus further includes a third converting unit 7, the communication terminal 105 of the micro control unit 1 is configured to be connected to the communication terminal 401 of the device under test 4 through the third converting unit 7, and fig. 4 illustrates an example in which the second terminal 702 of the third converting unit 7 is connected to the communication terminal 401 of the device under test 4.
The third conversion unit 7 converts the data output by the micro control unit 1 into data which can be received by the component 4 to be tested and outputs the data to the component to be tested; the data output by the component 4 to be tested can be converted into data which can be received by the micro control unit 1 and output to the micro control unit, specifically, the voltage of the data output by the micro control unit 1 is adjusted to the voltage range of the data which can be received by the component 4 to be tested, and the voltage of the data output by the component 4 to be tested is adjusted to the voltage range of the data which can be received by the micro control unit 1, so that the data can be transmitted between the micro control unit 1 and the component 4 to be tested, and then the micro control unit 1 can test various performances of the component 4 to be tested and acquire the test data.
In one embodiment, the supply terminal 703 of the third switching unit 7 is connected to the fourth output terminal 106 of the micro control unit 1.
The mcu 1 outputs a voltage, which is insufficient to supply the third converting unit 7, to the third converting unit 7 when the first voltage is output to the detecting circuit 2, and outputs a voltage, which is sufficient to supply the third converting unit 7, to the third converting unit 7 when the second voltage is output to the detecting circuit 2, so as to supply the third converting unit 7. It can be seen that the micro control unit 1 does not supply power to the third conversion unit 7 when the to-be-tested component 4 is not supplied with power; when the component 4 to be tested is powered on, the third conversion unit 7 is powered on, so that the third conversion unit 7 is in a working state.
In this embodiment, when the micro control unit does not supply power to the component to be tested yet, but the communication end of the component to be tested is connected to the third conversion unit, if the third conversion unit is started to start working, a current backflow phenomenon may occur in an internal device of the component to be tested, and the component to be tested may be damaged.
The steps of the above methods are divided for clarity, and the implementation may be combined into one step or split some steps, and the steps are divided into multiple steps, so long as the same logical relationship is included, which are all within the protection scope of the present patent; it is within the scope of the patent to add insignificant modifications to the algorithms or processes or to introduce insignificant design changes to the core design without changing the algorithms or processes.
The invention relates to a test control method, which is applied to a micro control unit in a test control device and used for testing an externally accessed component to be tested.
Please refer to fig. 5 for a flowchart of the test control method of the present embodiment.
It should be understood that this embodiment is a method embodiment corresponding to the embodiment shown in fig. 1, and this embodiment can be implemented in cooperation with the embodiment shown in fig. 1. The related technical details mentioned in the embodiment corresponding to fig. 1 are still valid in this embodiment, and are not described herein again in order to reduce repetition. Accordingly, the related art details mentioned in the present embodiment can also be applied to the embodiment corresponding to fig. 1.
It should be noted that, all modules related in this embodiment may be logic modules, and in practical application, one logic unit may be one physical unit, may also be a part of one physical unit, and may also be implemented by a combination of multiple physical units. In addition, in order to highlight the innovative part of the present invention, a unit which is not so closely related to solve the technical problem proposed by the present invention is not introduced in the present embodiment, but this does not indicate that there is no other unit in the present embodiment.
One embodiment of the present invention relates to a micro control unit, as shown in fig. 6, comprising at least one processor 601; and a memory 602 communicatively coupled to the at least one processor 601; the memory 602 stores instructions executable by the at least one processor 601, and the instructions are executed by the at least one processor 601 to enable the at least one processor 601 to execute the test control method.
Where the memory and processor are connected by a bus, the bus may comprise any number of interconnected buses and bridges, the buses connecting together one or more of the various circuits of the processor and the memory. The bus may also connect various other circuits such as peripherals, voltage regulators, power management circuits, and the like, which are well known in the art, and therefore, will not be described any further herein. A bus interface provides an interface between the bus and the transceiver. The transceiver may be one element or a plurality of elements, such as a plurality of receivers and transmitters, providing a means for communicating with various other apparatus over a transmission medium. The data processed by the processor is transmitted over a wireless medium via an antenna, which further receives the data and transmits the data to the processor.
The processor is responsible for managing the bus and general processing and may also provide various functions including timing, peripheral interfaces, voltage regulation, power management, and other control functions. And the memory may be used to store data used by the processor in performing operations.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific embodiments for practicing the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in practice.
Claims (10)
1. A test control apparatus for testing an externally accessed component under test, the test control apparatus comprising: the device comprises a micro control unit, a detection circuit and a sampling unit;
the first output end of the micro control unit is connected to the input end of the detection circuit, the output end of the detection circuit is used for being connected to the component to be detected, the first input end of the sampling unit is connected to the input end of the detection circuit, the second input end of the sampling unit is connected to the output end of the detection circuit, and the output end of the sampling unit is connected to the detection end of the micro control unit;
the micro control unit is used for outputting a first voltage firstly and outputting a second voltage when the sampling voltage is judged to be greater than or equal to a preset threshold value, so that the micro control unit can test the component to be tested;
the sampling voltage is a voltage between the input end of the detection circuit and the output end of the detection circuit, the first voltage is smaller than the power supply voltage of the component to be detected, and the second voltage is larger than or equal to the power supply voltage of the component to be detected.
2. The test control device of claim 1, wherein the detection circuit comprises a first switch tube, a second switch tube, a first resistor and a second resistor;
a first end of the first switch tube is used as an input end of the detection circuit, a second end of the first switch tube is connected to a first end of the first resistor, a second end of the first resistor is used as an output end of the detection circuit, a first end of the second switch tube is connected to the first end of the first switch tube, a second end of the second switch tube is connected to the first end of the second resistor, a second end of the second resistor is connected to the second end of the first resistor, a third end of the first switch tube is connected to a second output end of the micro control unit, and a third end of the second switch tube is connected to a third output end of the micro control unit; the resistance value of the first resistor is far larger than that of the second resistor;
the micro control unit is further configured to output a third voltage to the first switching tube, output a fourth voltage to the second switching tube, and output a fifth voltage to the first switching tube and output a sixth voltage to the second switching tube when it is determined that the sampling voltage is greater than or equal to the preset threshold;
the third voltage is greater than or equal to the conduction voltage of the first switch tube, the fourth voltage is less than the conduction voltage of the second switch tube, the fifth voltage is less than the conduction voltage of the first switch tube, and the sixth voltage is greater than or equal to the conduction voltage of the second switch tube.
3. The test control device according to claim 2, characterized in that the test control device further comprises a first conversion unit and a second conversion unit;
the second output end of the micro control unit is connected to the third end of the first switch tube through the first conversion unit, and the third output end of the micro control unit is connected to the third end of the second switch tube through the second conversion unit;
the first conversion unit is used for converting the voltage output by the micro control unit into the third voltage or the fifth voltage for output;
the second conversion unit is used for converting the voltage output by the micro control unit into the fourth voltage or the sixth voltage for output.
4. The test control device of claim 3, wherein the first conversion unit comprises a power supply, a capacitor, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6 and an amplifier;
a first end of the capacitor is grounded, a second end of the capacitor is connected to an output end of the power supply, a second end of the capacitor is further connected to a first end of the third resistor R3, a second end of the third resistor R3 is connected to an inverting input end of the amplifier and a first end of the fourth resistor R4, a second end of the fourth resistor R4 is connected to an output end of the amplifier, a first end of the fifth resistor R5 serves as an input end of the first conversion unit, a second end of the fifth resistor R5 is connected to a non-inverting input end of the amplifier and a first end of the sixth resistor R6, a second end of the sixth resistor R6 is grounded, and an output end of the amplifier serves as an output end of the first conversion unit;
the power supply is used for outputting a constant voltage Vs;
the amplifier is used for outputting a conversion voltage Vo; wherein the content of the first and second substances,
Vdacthe voltage output by the micro control unit to the first conversion unit.
5. The test control device according to any one of claims 2 to 4, wherein the first switching tube and the second switching tube are both MOS tubes;
the first end of the first switch tube is a source electrode or a drain electrode of the MOS tube, the second end of the first switch tube is a drain electrode or a source electrode of the MOS tube, and the third end of the first switch tube is a grid electrode of the MOS tube;
the first end of the second switch tube is the source electrode or the drain electrode of the MOS tube, the second end of the second switch tube is the drain electrode or the source electrode of the MOS tube, and the third end of the second switch tube is the grid electrode of the MOS tube.
6. The test control device of claim 1, wherein the communication terminal of the micro control unit is configured to be connected to the communication terminal of the component to be tested;
and the micro control unit is used for transmitting data with the communication end of the component to be tested through the communication end of the micro control unit after the second voltage is output.
7. The test control device of claim 6, further comprising a third conversion unit, wherein the communication terminal of the micro control unit is connected to the communication terminal of the component to be tested through the third conversion unit;
the third conversion unit is used for converting the data output by the micro control unit into data which can be received by the component to be tested and then outputting the data to the component to be tested; and converting the data output by the component to be tested into data which can be received by the micro control unit and then outputting the data to the micro control unit.
8. The test control device of claim 7, wherein the power supply terminal of the third switching unit is connected to the fourth output terminal of the micro control unit;
the micro control unit is used for prohibiting the third conversion unit from outputting a voltage which is greater than or equal to the power supply voltage of the third conversion unit when the first voltage is output to the detection circuit.
9. A test control method is characterized in that a micro control unit applied to a test control device is used for testing an externally accessed component to be tested, and the test control device further comprises a detection circuit and a sampling unit;
the first output end of the micro control unit is connected to the input end of the detection circuit, the output end of the detection circuit is used for being connected to the component to be detected, the first input end of the sampling unit is connected to the input end of the detection circuit, the second input end of the sampling unit is connected to the output end of the detection circuit, and the output end of the sampling unit is connected to the detection end of the micro control unit;
the method comprises the following steps:
outputting a first voltage, and outputting a second voltage when the sampling voltage is judged to be greater than or equal to a preset threshold value, so that the micro control unit can test the component to be tested;
the sampling voltage is a voltage between the input end of the detection circuit and the output end of the detection circuit, the first voltage is smaller than the power supply voltage of the component to be detected, and the second voltage is larger than or equal to the power supply voltage of the component to be detected.
10. A micro-control unit, comprising:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the test control method of claim 9.
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