CN113091902A - Function testing method and system for Fourier transform infrared spectrometer instrument before emission - Google Patents
Function testing method and system for Fourier transform infrared spectrometer instrument before emission Download PDFInfo
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- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 title claims abstract description 58
- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 238000012886 linear function Methods 0.000 claims abstract description 42
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- 230000003287 optical effect Effects 0.000 claims abstract description 23
- 238000001514 detection method Methods 0.000 claims description 10
- 238000002360 preparation method Methods 0.000 claims description 6
- 238000004364 calculation method Methods 0.000 claims description 5
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- 238000001228 spectrum Methods 0.000 description 8
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- 238000001429 visible spectrum Methods 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract
The invention provides a function testing method and system for a pre-emission instrument of a Fourier transform infrared spectrometer. Before testing, the emergent light of the infrared laser is ensured to pass through beam expanding, an optical window of the vacuum tank and an integrating sphere for light homogenizing and depolarization, then the emergent light passes through a collimation system and then enters an instrument view field, and the view field can be filled. And opening the infrared laser, and recording the interferogram data output by the multiple groups of Fourier transform infrared spectrometers after the output is stable. And then turning off the light source to record a plurality of groups of interferogram data output by the Fourier transform infrared spectrometer. And finally, calculating the linear function of the instrument by analyzing the interferogram data of the Fourier transform infrared spectrometer under the conditions that the infrared laser is turned on and turned off. The method is reasonable, simple and easy to implement, can be applied to linear function measurement of the instrument before emission of the Fourier transform infrared spectrometer, and has wide application prospect.
Description
Technical Field
The invention relates to the technical field of spectrometers, in particular to a function testing method and system for a pre-emission instrument of a Fourier transform infrared spectrometer.
Background
The satellite-borne Fourier transform infrared spectrometer has important application in the fields of atmospheric temperature and humidity profile detection, gas measurement detection and the like. For a spectrometer, whether the spectrometer is a visible spectrum band or an infrared spectrum band, whether the spectrometer is a fourier transform type or a grating light splitting type, in a later application process, an Instrument Line Shape function (ILS) of each spectrum channel is required, and therefore, before the satellite-borne spectrometer emits, the Instrument Line Shape function needs to be measured.
The patent of Changchun optical precision machinery and physical research institute of China academy of sciences, namely the method and the device for obtaining the linear function of the spectrometer (application number: 201710601869.5) provides an instrument linear function testing method of a visible spectrum band imaging spectrometer, wherein a laser is controlled to scan at equal wavelength intervals, the response of the spectrometer is recorded, and the instrument linear function is analyzed according to a radiation responsivity function. Document [1] (wangnan, on-orbit ultra-high resolution fourier spectrometer instrument linear function update method study, 2018) presents a method for updating the instrument linear function measured before emission on the basis of the solar spectrum. Document [2] (instrument linear function and engineering application of the spangle, infrared fourier transform spectrometer, 2015) discloses a method for correcting a spectrum based on the linear function after the instrument linear function is measured. The document [3] (luxingji, instrument linear function study of laser heterodyne spectrometer, 2019) gives the results of linear function analysis for laser heterodyne spectrometer. Document [4] (bear weih, new method for measuring linear function by spatial heterodyne interference spectrometer, 2015) shows a measurement method using tunable laser to scan wavelength.
The Fourier transform infrared spectrometer is different from a grating spectrometer, and the data directly acquired by the instrument is an interferogram rather than a spectrogram, so that the method provided by the spectrometer linear function acquisition method and device (application number: 201710601869.5) cannot be applied. In addition, compared with a visible spectrum spectrometer, the self-emission background of the infrared spectrometer is larger and is not negligible in measurement, so that the method described in the document [4] is not applicable. At present, no description or report exists on a function testing method of an instrument before emission of a Fourier transform infrared spectrometer, and similar data at home and abroad are not collected.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a function testing method and a system for a pre-emission instrument of a Fourier transform infrared spectrometer.
The invention provides a function testing method of a pre-emission instrument of a Fourier transform infrared spectrometer, which comprises the following steps of:
step S1: test preparation, namely ensuring that emergent light of an infrared laser source passes through beam expansion, an optical window of a vacuum tank and an integrating sphere, is homogenized and depolarized, then enters an instrument view field after passing through a collimation system, and can fill the view field;
step S2: the power of the light source of the infrared laser is adjusted outside the tank, so that the output stability of the laser is ensured;
step S3: the ground detection equipment is controlled outside the tank, and interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers under the condition of stable light sources are recorded;
step S4: turning off the infrared laser, and recording interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers;
step S5: and calculating the linear function of the instrument by analyzing the interferogram data of the Fourier transform infrared spectrometer under the conditions of opening and closing the infrared laser.
Preferably, the device for testing the linear function of the instrument comprises a vacuum tank, a ground detection device, an infrared laser light source and a beam expanding system which are positioned outside the vacuum tank, an integrating sphere, a collimation system and a Fourier transform infrared spectrometer to be tested which are positioned inside the vacuum tank.
Preferably, the vacuum tank is equipped with an optical window.
Preferably, step S5 includes the steps of:
step S501: performing phase alignment on the multiple groups of interferograms acquired in the step S3;
step S502: aligning the multiple groups of interferograms obtained in the step S4 to the interferogram in the step S501, and calculating the mean value of the aligned interferogram data to obtain a background interferogram;
step S503: subtracting the background interference pattern obtained in the step S502 from the interference pattern in the step S501 to obtain a laser light source interference pattern;
step S504: the instrument line function is calculated from the laser source interferogram.
Preferably, in step S501, zero optical path difference of the interference pattern when the laser is turned on is detected, and phase alignment of the interference pattern is realized through zero optical path difference alignment.
Preferably, step S502 detects zero optical path difference of the interference pattern when the laser is turned off, and phase alignment of the interference pattern is realized through zero optical path difference alignment.
Preferably, the instrument linear function in step S504 is calculated in the following manner: firstly, zero filling operation is carried out on the laser source interferogram outside the maximum optical path difference, and then discrete Fourier transform is carried out to obtain an instrument linear function.
Preferably, the number of zero padding points of the zero padding operation corresponds to the sampling interval of the instrument linear function.
The invention provides a function test system of a pre-emission instrument of a Fourier transform infrared spectrometer, which comprises the following modules:
a test module: test preparation, namely ensuring that emergent light of an infrared laser source passes through beam expansion, an optical window of a vacuum tank and an integrating sphere, is homogenized and depolarized, then enters an instrument view field after passing through a collimation system, and can fill the view field;
infrared laser instrument regulation module: the power of the light source of the infrared laser is adjusted outside the tank, so that the output stability of the laser is ensured;
the first interferogram data recording module: the ground detection equipment is controlled outside the tank, and interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers under the condition of stable light sources are recorded;
the second interferogram data recording module: turning off the infrared laser, and recording interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers;
a calculation module: and calculating the linear function of the instrument by analyzing the interferogram data of the Fourier transform infrared spectrometer under the conditions of opening and closing the infrared laser.
Compared with the prior art, the invention has the following beneficial effects:
1. the method is reasonable, simple and easy to implement, can be applied to linear function measurement of the instrument before emission of the Fourier transform infrared spectrometer, and has wide application prospect.
2. The invention provides an instrument linear function testing method, related testing equipment and a data processing method for a Fourier transform infrared spectrometer. The method can avoid the influence of background radiation in the measuring process.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
FIG. 1 is a flow chart of a linear function testing method before emission of a Fourier transform infrared spectrometer provided by the invention.
FIG. 2 is raw interferogram data acquired by a satellite Fourier transform infrared spectrometer for performing an instrument linear function test.
FIG. 3 is a laser source interferogram calculated from interferograms of lasers on and off.
FIG. 4 is a global spectrum diagram of a linear function of a certain satellite Fourier transform infrared spectrometer instrument obtained through calculation.
FIG. 5 is a calculated spectral diagram of a local magnification display of a linear function of a certain satellite Fourier transform infrared spectrometer instrument.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that it would be obvious to those skilled in the art that various changes and modifications can be made without departing from the spirit of the invention. All falling within the scope of the present invention.
Referring to the attached figure 1, the function testing method of the instrument before emission of the Fourier transform infrared spectrometer, provided by the invention, firstly needs to perform testing preparation to ensure that emergent light of a light source of the infrared laser passes through beam expansion, an optical window of a vacuum tank and an integrating sphere for light uniformization and depolarization, then passes through a collimation system and then enters the instrument field of view, and the field of view can be filled.
The linear function testing equipment of the instrument comprises a vacuum tank, wherein the vacuum tank is provided with an optical window, ground inspection equipment, an infrared laser light source and a beam expanding system which are positioned outside the tank, an integrating sphere, a collimating system and a Fourier transform infrared spectrometer to be tested which are positioned inside the tank. The instrument is placed in a vacuum tank for testing, so that the purpose that gas such as water vapor, carbon dioxide and the like in the air can have absorption lines in an infrared spectrum band to avoid measuring in a laboratory environment and influence the measuring result of the instrument is avoided.
The light source power of the infrared laser is adjusted outside the tank, and the output stability of the laser is ensured. And then controlling ground detection equipment outside the tank, and recording interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers under the condition of stable light sources.
Since the optical elements of the fourier transform infrared spectrometer also generate infrared radiation, the interference signal output from the fourier transform infrared spectrometer includes a background interference signal generated by the own radiation in addition to the input from the laser light source. Therefore, it is necessary to record a plurality of sets of interferogram data output by the fourier transform infrared spectrometer under the condition that the infrared laser is turned off. And finally, calculating the linear function of the instrument by analyzing the interferogram data of the Fourier transform infrared spectrometer under the conditions of opening and closing the infrared laser.
To subtract the effect of the background, the interference pattern when the laser is on may be subtracted from the interference pattern when the laser is off. Because the multiple groups of interferograms respectively acquired under the conditions that the Fourier analysis infrared laser is turned on and turned off are acquired in a time-sharing manner, and the Fourier transform infrared spectrometer is an instrument sensitive to sampling phases, all interferograms need to be unified to the same phase. In the implementation process, the zero-optical path difference detection can be realized.
After the laser light source interferogram is obtained, in order to obtain an instrument linear function for further spectrum subdivision, zero padding operation can be performed on the laser light source interferogram outside the maximum optical path difference, which is equivalent to performing interpolation on a spectrum after discrete fourier transform. The number of zero padding points depends on the sampling (interpolation) interval of the instrument linear function.
FIG. 2 is raw interferogram data acquired by instrumental linear function testing of a satellite Fourier transform infrared spectrometer according to the method of the present invention. As can be seen, the interference pattern with the laser on is superimposed with a background interference signal. After the phase alignment, the interferogram when the laser is turned on is subtracted from the interferogram when the laser is turned off, and the obtained laser light source interferogram is shown in fig. 3. Performing instrument linear function calculation on the interferogram shown in FIG. 3, wherein the results are shown in FIGS. 4 and 5, FIG. 4 is a global spectrum, and the wave number ranges from 0cm to 4000cm-1FIG. 5 is a partially enlarged spectrum of 1690-1790 cm in wavenumber-1. As can be seen from the attached figures 4 and 5, the linear function of the instrument of the Fourier transform infrared spectrometer can be effectively obtained by the method, and the method is not influenced by background radiation.
The invention also provides a function test system of the instrument before emission of the Fourier transform infrared spectrometer, which comprises the following modules: a test module: test preparation, namely ensuring that emergent light of an infrared laser source passes through beam expansion, an optical window of a vacuum tank and an integrating sphere, is homogenized and depolarized, then enters an instrument view field after passing through a collimation system, and can fill the view field; infrared laser instrument regulation module: the power of the light source of the infrared laser is adjusted outside the tank, so that the output stability of the laser is ensured; the first interferogram data recording module: the ground detection equipment is controlled outside the tank, and interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers under the condition of stable light sources are recorded; the second interferogram data recording module: turning off the infrared laser, and recording interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers; a calculation module: and calculating the linear function of the instrument by analyzing the interferogram data of the Fourier transform infrared spectrometer under the conditions of opening and closing the infrared laser.
The invention provides an instrument linear function testing method, related testing equipment and a data processing method for a Fourier transform infrared spectrometer. The method can avoid the influence of background radiation in the measuring process. The method is reasonable, simple and easy to implement, can be applied to linear function measurement of the instrument before emission of the Fourier transform infrared spectrometer, and has wide application prospect.
In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present application and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application.
The foregoing description of specific embodiments of the present invention has been presented. It is to be understood that the present invention is not limited to the specific embodiments described above, and that various changes or modifications may be made by one skilled in the art within the scope of the appended claims without departing from the spirit of the invention. The embodiments and features of the embodiments of the present application may be combined with each other arbitrarily without conflict.
Claims (9)
1. A function test method of a pre-emission instrument of a Fourier transform infrared spectrometer is characterized by comprising the following steps:
step S1: test preparation, namely ensuring that emergent light of an infrared laser source passes through beam expansion, an optical window of a vacuum tank and an integrating sphere, is homogenized and depolarized, then enters an instrument view field after passing through a collimation system, and can fill the view field;
step S2: the power of the light source of the infrared laser is adjusted outside the tank, so that the output stability of the laser is ensured;
step S3: the ground detection equipment is controlled outside the tank, and interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers under the condition of stable light sources are recorded;
step S4: turning off the infrared laser, and recording interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers;
step S5: and calculating the linear function of the instrument by analyzing the interferogram data of the Fourier transform infrared spectrometer under the conditions of opening and closing the infrared laser.
2. The method as claimed in claim 1, wherein the device for linear function test of the Fourier transform infrared spectrometer comprises a vacuum tank, a ground inspection device, an infrared laser light source and a beam expanding system which are arranged outside the vacuum tank, an integrating sphere, a collimating system and the Fourier transform infrared spectrometer to be tested which are arranged inside the vacuum tank.
3. The method for function testing of a pre-emission instrument of a fourier transform infrared spectrometer of claim 2, wherein the vacuum tank is equipped with an optical window.
4. The method for testing the function of the pre-emission instrument of the Fourier transform infrared spectrometer of claim 1, wherein the step S5 comprises the steps of:
step S501: performing phase alignment on the multiple groups of interferograms acquired in the step S3;
step S502: aligning the multiple groups of interferograms obtained in the step S4 to the interferogram in the step S501, and calculating the mean value of the aligned interferogram data to obtain a background interferogram;
step S503: subtracting the background interference pattern obtained in the step S502 from the interference pattern in the step S501 to obtain a laser light source interference pattern;
step S504: the instrument line function is calculated from the laser source interferogram.
5. The method for testing the function of the instrument before transmission of the Fourier transform infrared spectrometer as claimed in claim 4, wherein step S501 comprises detecting the zero optical path difference of the interferogram when the laser is turned on, and aligning the phase of the interferogram by the zero optical path difference alignment.
6. The method for testing the function of the instrument before transmission of the Fourier transform infrared spectrometer as recited in claim 4, wherein step S502 is performed by detecting the zero optical path difference of the interferogram when the laser is turned off, and the phase alignment of the interferogram is realized by the zero optical path difference alignment.
7. The method for testing the function of the pre-emission instrument of the Fourier transform infrared spectrometer as recited in claim 4, wherein the linear function of the instrument in the step S504 is calculated by: firstly, zero filling operation is carried out on the laser source interferogram outside the maximum optical path difference, and then discrete Fourier transform is carried out to obtain an instrument linear function.
8. The method as claimed in claim 7, wherein the number of zero padding points in the zero padding operation corresponds to the sampling interval of the linear function of the apparatus.
9. A function test system of a pre-emission instrument of a Fourier transform infrared spectrometer is characterized by comprising the following modules:
a test module: test preparation, namely ensuring that emergent light of an infrared laser source passes through beam expansion, an optical window of a vacuum tank and an integrating sphere, is homogenized and depolarized, then enters an instrument view field after passing through a collimation system, and can fill the view field;
infrared laser instrument regulation module: the power of the light source of the infrared laser is adjusted outside the tank, so that the output stability of the laser is ensured;
the first interferogram data recording module: the ground detection equipment is controlled outside the tank, and interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers under the condition of stable light sources are recorded;
the second interferogram data recording module: turning off the infrared laser, and recording interference pattern data output by a plurality of groups of Fourier transform infrared spectrometers;
a calculation module: and calculating the linear function of the instrument by analyzing the interferogram data of the Fourier transform infrared spectrometer under the conditions of opening and closing the infrared laser.
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