CN113049945A - Chip test circuit - Google Patents
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- CN113049945A CN113049945A CN202110290155.3A CN202110290155A CN113049945A CN 113049945 A CN113049945 A CN 113049945A CN 202110290155 A CN202110290155 A CN 202110290155A CN 113049945 A CN113049945 A CN 113049945A
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- 238000012545 processing Methods 0.000 claims abstract description 57
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- 239000013256 coordination polymer Substances 0.000 claims description 26
- 238000010586 diagram Methods 0.000 description 13
- 238000000034 method Methods 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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Abstract
The invention discloses a chip test circuit which comprises N switches and a processing module, wherein the N switches and the processing module are arranged between N output channels and M test channels of a driving chip, and the processing module controls the on and off of each switch. Because M is an integer less than N, a plurality of output channels of the driving chip can output driving voltage through one testing channel in sequence, the processing module is not required to be connected with all the output channels of the driving chip, and the processing module can receive the driving voltage output by each output channel of the driving chip only by being connected with the corresponding testing channel so as to judge whether the driving chip works normally or not. The processing module in this application need not to set up the input that equals with driver chip's output channel's quantity and can test the driving voltage of each output channel output of driver chip, reduce cost. And when the number of the input ends of the processing module is larger than M, the processing module can be connected with the test channels corresponding to the plurality of driving chips so as to test the plurality of driving chips, and the testing efficiency is improved.
Description
Technical Field
The invention relates to the field of power electronics, in particular to a chip test circuit.
Background
In order to enable the display panel to display a corresponding picture, in the prior art, a driving chip is generally used to receive a control signal sent by a processor, so that a corresponding driving voltage is output through an output channel connected to each sub-pixel on the display panel, so that each sub-pixel on the display panel displays different colors, and the display panel displays a final picture.
Since the driving voltages corresponding to each color on the subpixel point are different, in order to make the picture displayed by the display panel consistent with the expected picture and ensure the reducibility of the expected picture, the driving voltage output by the driving Chip needs to be tested when the driving Chip is subjected to a CP test (Chip bonding, wafer testing), that is, whether each driving voltage output by the driving Chip meets the corresponding expected voltage value is tested.
During testing, probes on a CP test probe card of a testing machine are respectively connected to output channels on a driver chip in a one-to-one correspondence, and whether the driver chip meets the requirements is determined by testing whether a driving voltage output by each output channel on the driver chip meets an expected voltage value, that is, whether the driving voltage output by the driver chip can cause a display panel to display a response picture. However, a large-sized display panel, such as a television, or a high-resolution display panel, such as a mobile phone screen and a computer display screen, generally needs 6 or 12 driver chips, and because there are many output channels of each driver chip, for example, each driver chip may have 1026, 966, or 960 output channels, if it is desired to test a plurality of output channels of a plurality of chips, the requirement for the CP test pincard is higher, that is, the CP test pincard needs to have a plurality of probes, and the distance between the probes needs to be set at a micron level, so the manufacturing cost is also higher; in addition, because the output channels of a plurality of driving chips are more and limited by the number of probes of the CP test probe card, only one chip can be tested at a time, the testing efficiency is lower, and the cost is higher.
Disclosure of Invention
The invention aims to provide a chip test circuit, a processing module can test the driving voltage output by each output channel of a driving chip without setting input ends with the same number as the output channels of the driving chip, and the cost is reduced. And when the number of the input ends of the processing module is larger than M, the processing module can be connected with the test channels corresponding to the plurality of driving chips so as to test the plurality of driving chips, and the testing efficiency is improved.
In order to solve the above technical problem, the present invention provides a chip test circuit, including:
the first ends of the N switches are respectively connected with the N output channels of the driving chip in a one-to-one correspondence mode, and the second ends of the N switches are respectively connected with the M testing channels and used for switching on or switching off a circuit between the output channels of the chip connected with the N switches and the testing channels based on the control of the processor; m is an integer not less than 1, and N is an integer greater than M;
the M input ends are respectively connected with the M test channels in a one-to-one correspondence manner, the signal output ends are respectively connected with the processing modules connected with the control ends of the N switches in a one-to-one correspondence manner, and the processing modules are used for controlling the plurality of switches connected with the test channels to be sequentially switched on and off according to preset frequency, so that the output channels of the driving chip sequentially output driving voltage through the test channels corresponding to the output channels according to the preset frequency; and the driving chip is also used for judging whether the driving chip works normally or not based on the driving voltage output by each testing channel.
Preferably, the processing module comprises:
the signal output end is the processor of the signal output end of the processor and is used for controlling the plurality of switches connected with the test channels to be sequentially switched on and switched off according to a preset frequency respectively, so that the output channels of the driving chip sequentially output driving voltages through the test channels corresponding to the output channels according to the preset frequency respectively;
the input ends are respectively in one-to-one correspondence with the testing machines of the input ends of the processing module, and the testing machines are used for judging whether the driving chip works normally or not based on the driving voltage output by each testing channel.
Preferably, the testing machine comprises:
and each probe of the CP test probe card corresponds to each input end of the tester one by one respectively and is used for being connected with each test channel so as to receive the driving voltage output by each output channel of the driving chip through the test channel, so that the tester judges whether the corresponding driving chip works normally or not based on the driving voltage output by each test channel.
Preferably, the second ends of the N switches are all connected to one test channel, and M is 1.
Preferably, the method further comprises the following steps:
and the prompt module is connected with the output end of the processing module and is used for carrying out corresponding prompt on the user based on the judgment result of the processing module.
Preferably, the prompting module is a voice prompting module and/or a display prompting module.
Preferably, the sound prompt module is a buzzer.
Preferably, the display prompt module is an indicator lamp.
The application provides a chip test circuit, which comprises N switches and a processing module, wherein the N switches and the processing module are arranged between N output channels and M test channels of a driving chip, and the processing module controls the on and off of each switch. Because M is an integer less than N, a plurality of output channels of the driving chip can output driving voltage through one testing channel in sequence, the processing module is not required to be connected with all the output channels of the driving chip, and the processing module can receive the driving voltage output by each output channel of the driving chip only by being connected with the corresponding testing channel so as to judge whether the driving chip works normally or not. The processing module in this application need not to set up the input that equals with driver chip's output channel's quantity and can test the driving voltage of each output channel output of driver chip, reduce cost. And when the number of the input ends of the processing module is larger than M, the processing module can be connected with the test channels corresponding to the plurality of driving chips so as to test the plurality of driving chips, and the testing efficiency is improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed in the prior art and the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic diagram of a chip test circuit according to the present invention;
FIG. 2 is a schematic diagram of a driving circuit of a display panel in the prior art;
FIG. 3 is a diagram of an output channel of a driver chip in the prior art;
FIG. 4 is a schematic diagram of the connection between the output channel of the driver chip and the switch according to the present invention;
fig. 5 is a schematic diagram of a real-time control sequence of a switch according to the present invention.
Detailed Description
The core of the invention is to provide a chip test circuit, and a processing module can test the driving voltage output by each output channel of a driving chip without setting input ends with the same number as the output channels of the driving chip, thereby reducing the cost. And when the number of the input ends of the processing module is larger than M, the processing module can be connected with the test channels corresponding to the plurality of driving chips so as to test the plurality of driving chips, and the testing efficiency is improved.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a chip testing circuit provided in the present invention, the circuit includes:
the first ends of the N switches are respectively connected with the N output channels of the driving chip 1 in a one-to-one correspondence mode, the second ends of the N switches are respectively connected with the M testing channels, and the N switches are used for switching on or switching off a circuit between the output channels of the chip connected with the N switches and the testing channels based on the control of the processor; m is an integer not less than 1, and N is an integer greater than M;
the M input ends are respectively connected with the M test channels in a one-to-one correspondence manner, the signal output ends are respectively connected with the processing modules 3 connected with the control ends of the N switches 2 in a one-to-one correspondence manner, and the processing modules are used for controlling the plurality of switches 2 connected with each test channel to be sequentially switched on and off according to a preset frequency, so that each output channel of the driving chip 1 sequentially outputs driving voltage through the test channel corresponding to the output channel according to the preset frequency; and is also used for judging whether the driving chip 1 works normally or not based on the driving voltage output by each testing channel.
In order to make the Display panel Display a corresponding picture, in the prior art, a driving chip 1 generally receives a Control signal sent by a processor, so that a corresponding driving voltage is output through an output channel connected to each sub-pixel on the Display panel, so that each sub-pixel on the Display panel displays different colors, thereby making the Display panel Display a final picture, please refer to fig. 2, fig. 2 is a schematic structural diagram of a driving circuit of a Display panel in the prior art, a TCON (Timing Control Register, Timing controller) in the figure sends a Control signal to the driving chip 1, and the driving chip 1 converts the Control signal into an LCD (Liquid Crystal Display panel), that is, a driving voltage of each sub-pixel on the Display panel, and outputs the driving voltage to the Display panel through output channels SD1 to SDn, so that each sub-pixel displays a corresponding color.
In this embodiment, the applicant considers that, in the prior art, when testing the driver chip 1, each probe of the CP test probe card on the testing machine is usually connected to each output channel of the driver chip 1, please refer to fig. 3, fig. 3 is a schematic diagram of the output channels of the driver chip in the prior art, Y1 to Yn in the diagram are each output channel of the driver chip 1, and the detection of the driver chip 1 is realized by detecting the driving voltage of each output channel. Specifically, when the driving voltages output by the driving chip 1 through the output channels are different, the color displayed by the sub-pixel point connected to the output channel of the driving chip 1 on the display screen is different, for example, when the driving voltage output by one output channel of the driving chip 1 corresponds to yellow, the sub-pixel point connected to the output channel on the display screen is displayed in yellow, and therefore, in order to reduce the degree of the picture displayed by the display screen to the desired picture, the driving voltages output by the output channels of the driving chip 1 need to be detected, and it is determined whether the driving voltages output by the output channels can enable the display screen to display an accurate picture. However, each drive chip 1 may be provided with 1026, 966 or 960 output channels, and the number of the driving chips 1 required to be arranged is larger when the resolution requirement is higher or the display screen is larger, in order to detect the driving voltage outputted from each output channel of the driving chip 1, a plurality of probes need to be provided on the CP probe card, thereby being connected with each output channel of the driving chip 1 in a one-to-one correspondence way, therefore, the design requirement of the CP test probe card is higher, the distance between the probes is in micron order, and the manufacturing cost is higher, even if a plurality of probes can be arranged on each CP probe card, the number of probes that can be arranged is limited, and therefore, each CP probe card can be connected with only one driver chip 1 at a time, therefore, only one driving chip 1 can be tested, the testing efficiency is low, and the cost is high.
In order to solve the above technical problem, in the present application, each output channel of the driving chip 1 is provided with one switch 2, the second end of the switch 2 of each output channel is connected to the test channel, and the second ends of the switches 2 corresponding to a plurality of output channels are connected to one test channel, specifically, N output channels are connected to M test channels through N switches 2, please refer to fig. 4, fig. 4 is a schematic diagram of connections between the output channels and the switches of the driving chip provided by the present invention, in the diagram, four output channels, that is, Y1 to Y4 are connected to one test channel through four switches 2, that is, SW1 to SW4, and in the diagram, the output channel Y1 is taken as a test channel. The input ends of the processing modules 3 are respectively connected with the test channels in a one-to-one correspondence mode, and the switches 2 connected with the test channels are controlled to be sequentially switched on and off according to preset frequencies, so that the test channels of the driving chip 1 are enabled to sequentially output driving voltage from the test channels connected with the testing modules according to the preset frequencies, and the control modules can test the driving chip 1 based on the driving voltage. Referring to fig. 5, fig. 5 is a schematic diagram illustrating a real-time control sequence of switches according to the present invention, in which the control signals of the switch 2, i.e., CSW <4:1> time-sharing control of the switches, can output the driving voltages of the 4 output channels in fig. 4 through the test channel Y1, and detect the driving voltages by the CP probe card, so as to perform CP test screening. According to the overall scale of the output channels, 16 output channels can be designed to form a group, namely 16 output channels are output through one test channel, the number of probes of the CP test pin card is only 1/16, the number of the probes is reduced, the distance is enlarged, and the complexity of manufacturing the CP test pin card is reduced. And under the condition that the number of CP pincard probes is not changed, a plurality of driving chips 1 can be tested simultaneously, so that the testing efficiency is improved, and the testing cost is reduced.
Further, when the driving chip 1 normally operates, the switch SW1 is closed, and the switch SW2, the switch SW3 and the switch SW4 are opened, so that the driving voltage is not influenced to be normally output by the respective output channels. When the driving chip 1 starts to test, the control signal is input by the TCON according to the mode in the prior art, and the switch 2 is started to control the signal after the driving chip 1 normally outputs the driving voltage. Referring to fig. 5, SW1 to SW4 are alternatively turned on or off according to the control timing of switch 2, wherein ts is the setup time of the driving chip 1 outputting the driving signal, and tt is the signal sampling time of the probe of the CP probe card. ts and tt are both in microsecond level, and after 4 times of signal sampling, one-time testing is completed, and the switching time of the switch is in microsecond level, so that the relatively integral testing time can be ignored, and the testing efficiency is high.
In addition, it should be noted that the output end of the processing module 3 in the present application corresponds to the probes of the CP probe card, and when the output end of the processing module 3 is set to the number corresponding to the test channels, the number of the probes of the CP probe card is correspondingly reduced, so that the cost is reduced, the scale of the chip test circuit is also small, the control logic is easy to implement, and the area of the driver chip 1 is also small.
It should be noted that, when the driving voltage output by the test channel meets the requirement, the driving chip 1 may be considered to be able to normally operate, and when the driving voltage does not meet the requirement, that is, when the display screen cannot accurately display the screen, the driving chip 1 may be considered to be unable to normally operate.
In summary, the processing module 3 in the present application can test the driving voltage output by each output channel of the driving chip 1 without setting the input terminals equal to the number of the output channels of the driving chip 1, so as to reduce the cost. And when the number of the input ends of the processing module 3 is greater than M, the processing module 3 can be connected with the test channels corresponding to the plurality of driver chips 1 to test the plurality of driver chips 1, so that the test efficiency is improved.
On the basis of the above-described embodiment:
as a preferred embodiment, the processing module 3 comprises:
the signal output end is a processor of the signal output end of the processor and is used for controlling the plurality of switches 2 connected with the test channels to be sequentially switched on and switched off according to a preset frequency respectively, so that the output channels of the driving chip 1 sequentially output driving voltages through the test channels corresponding to the output channels according to the preset frequency respectively;
the input ends are respectively in one-to-one correspondence with the testing machines of the input ends of the processing module 3, and are used for judging whether the driving chip 1 works normally or not based on the driving voltage output by each testing channel.
The processing module 3 in this embodiment includes two parts, one is a processor for controlling the on and off of the switch 2, and the other is a testing machine for testing the driving voltage output from the testing channels, so as to control the switches 2 connected to the testing channels to be sequentially turned on and off according to the preset frequency, so that the output channels of the driving chip 1 sequentially output the driving voltage through the testing channels corresponding to the output channels according to the preset frequency, and determine whether the driving chip 1 normally operates based on the driving voltage output from each testing channel.
As a preferred embodiment, the testing machine comprises:
each probe of the CP test probe card corresponds to each input end of the tester one by one, and is used for connecting with each test channel to receive the driving voltage output by each output channel of the driving chip 1 through the test channel, so that the tester judges whether the corresponding driving chip 1 normally works based on the driving voltage output by each test channel.
It can be known from this embodiment that the input end of the processing module 3 is the probe of the CP test pincard of the testing machine, and when the number of the designed input ends of the processing module 3 is small, that is, the number of the probes of the CP test pincard is small, the manufacturing cost of the CP test pincard can be reduced, and when the number of the test channels corresponding to each driver chip 1 is smaller than the number of the probes of the designed CP test pincard, one CP test pincard, that is, one testing machine can be connected to the test channels of a plurality of driver chips 1, so that the testing can be performed on a plurality of driver chips 1 at the same time, and the testing efficiency is improved.
In a preferred embodiment, the second terminals of the N switches 2 are connected to a test channel, and M is 1.
This embodiment provides a switch 2 and test channel's corresponding relation that sets up, each switch 2 of N of a driver chip 1 all connects a test channel promptly, through setting up order and frequency of switching on of each switch 2 between each output channel and the test channel in this driver chip 1, can make each output channel pass through a test channel output drive voltage once, thereby make processing module 3 detect driver chip 1, the quantity of processing module 3's input has further been reduced, also make processing module 3 can connect a plurality of driver chip 1 simultaneously, thereby test a plurality of driver chip 1 simultaneously.
As a preferred embodiment, the method further comprises the following steps:
and the prompt module is connected with the output end of the processing module 3 and is used for correspondingly prompting the user based on the judgment result of the processing module 3.
In this embodiment, the processing module 3 is added to the driver chip 1, because it needs to inform the worker to perform processing in time when detecting that the driver chip cannot work normally. After the processing module 3 detects that the driving chip 1 cannot work normally, the prompting module is controlled to send out a prompt to prompt a worker to process the driving chip 1.
In a preferred embodiment, the prompting module is a voice prompting module and/or a display prompting module.
In this embodiment, the prompt module includes a voice prompt module or a display prompt module. The voice prompt module can send out voice prompt and the display prompt module can send out light prompt.
Specifically, the prompting module may only include a voice prompting module or a display prompting module, and the prompting module may also include both the voice prompting module and the display prompting module. When the prompting module can simultaneously comprise the sound prompting module and the display prompting module, under a noisy working environment, a worker cannot hear the sound prompt, but can know that the processing module 3 detects that the driving chip 1 cannot normally work through the display prompting module; when the display prompt module cannot be seen in the visual field of the staff, the processing module 3 can be known to detect that the storage module normally works through the sound prompt module, so that the chip to be tested can be processed more quickly.
As a preferred embodiment, the sound prompt module is a buzzer.
In this embodiment, choose buzzer for use as sound prompt module, the suggestion of sound can be realized to buzzer.
In addition, the buzzer has the characteristics of low cost and high sensitivity.
As a preferred embodiment, the display prompt module is an indicator light.
In this embodiment, select for use the pilot lamp as showing the suggestion module, the suggestion of pilot lamp ability realization light.
In addition, the light-emitting diode has the advantage of low cost, and can share one control port with the buzzer.
Of course, the display prompt module in the application is not limited to select the indicator light, and can also select the light emitting diode.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. A chip test circuit, comprising:
the first ends of the N switches are respectively connected with the N output channels of the driving chip in a one-to-one correspondence mode, and the second ends of the N switches are respectively connected with the M testing channels and used for switching on or switching off a circuit between the output channels of the chip connected with the N switches and the testing channels based on the control of the processor; m is an integer not less than 1, and N is an integer greater than M;
the M input ends are respectively connected with the M test channels in a one-to-one correspondence manner, the signal output ends are respectively connected with the processing modules connected with the control ends of the N switches in a one-to-one correspondence manner, and the processing modules are used for controlling the plurality of switches connected with the test channels to be sequentially switched on and off according to preset frequency, so that the output channels of the driving chip sequentially output driving voltage through the test channels corresponding to the output channels according to the preset frequency; and the driving chip is also used for judging whether the driving chip works normally or not based on the driving voltage output by each testing channel.
2. The chip test circuit of claim 1, wherein the processing module comprises:
the signal output end is the processor of the signal output end of the processor and is used for controlling the plurality of switches connected with the test channels to be sequentially switched on and switched off according to a preset frequency respectively, so that the output channels of the driving chip sequentially output driving voltages through the test channels corresponding to the output channels according to the preset frequency respectively;
the input ends are respectively in one-to-one correspondence with the testing machines of the input ends of the processing module, and the testing machines are used for judging whether the driving chip works normally or not based on the driving voltage output by each testing channel.
3. The chip test circuit of claim 2, wherein the tester comprises:
and each probe of the CP test probe card corresponds to each input end of the tester one by one respectively and is used for being connected with each test channel so as to receive the driving voltage output by each output channel of the driving chip through the test channel, so that the tester judges whether the corresponding driving chip works normally or not based on the driving voltage output by each test channel.
4. The chip test circuit according to claim 1, wherein the second terminals of N of said switches are each connected to one test channel, and M is 1.
5. The chip test circuit according to any one of claims 1 to 4, further comprising:
and the prompt module is connected with the output end of the processing module and is used for carrying out corresponding prompt on the user based on the judgment result of the processing module.
6. The chip test circuit according to claim 5, wherein the prompt module is a voice prompt module and/or a display prompt module.
7. The chip test circuit according to claim 6, wherein the sound prompt module is a buzzer.
8. The chip test circuit of claim 6, wherein the display prompt module is an indicator light.
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| CN202110290155.3A CN113049945A (en) | 2021-03-18 | 2021-03-18 | Chip test circuit |
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| CN202110290155.3A CN113049945A (en) | 2021-03-18 | 2021-03-18 | Chip test circuit |
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| CN205317875U (en) * | 2015-09-07 | 2016-06-15 | 康泰医学***（秦皇岛）股份有限公司 | Testing tool |
| CN107069880A (en) * | 2017-05-07 | 2017-08-18 | 长沙方星腾电子科技有限公司 | A kind of time-sharing multiplex circuit for lithium cell charging |
| CN112162206A (en) * | 2020-08-19 | 2021-01-01 | 苏州锴威特半导体股份有限公司 | Voltage detection circuit for multiple lithium batteries |
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2021
- 2021-03-18 CN CN202110290155.3A patent/CN113049945A/en not_active Withdrawn
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1351261A (en) * | 2000-10-31 | 2002-05-29 | 松下电器产业株式会社 | Voltage measuring device |
| US20070200571A1 (en) * | 2006-02-16 | 2007-08-30 | Kevin Quinn | Verifying individual probe contact using shared tester channels |
| KR20080112632A (en) * | 2007-06-21 | 2008-12-26 | 주식회사 동부하이텍 | Probe card for multi site test |
| CN104081164A (en) * | 2012-02-03 | 2014-10-01 | 旭化成株式会社 | Signal processing device |
| US20140354285A1 (en) * | 2013-06-03 | 2014-12-04 | Samsung Display Co., Ltd. | Organic light emitting display panel |
| CN205317875U (en) * | 2015-09-07 | 2016-06-15 | 康泰医学***（秦皇岛）股份有限公司 | Testing tool |
| CN107069880A (en) * | 2017-05-07 | 2017-08-18 | 长沙方星腾电子科技有限公司 | A kind of time-sharing multiplex circuit for lithium cell charging |
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Application publication date: 20210629 |
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