CN113037370B

CN113037370B - BOSA (British automatic acquisition) received power calibration device and method

Info

Publication number: CN113037370B
Application number: CN201911351226.5A
Authority: CN
Inventors: 徐兆文
Original assignee: Sanechips Technology Co Ltd
Current assignee: Sanechips Technology Co Ltd
Priority date: 2019-12-24
Filing date: 2019-12-24
Publication date: 2024-03-15
Anticipated expiration: 2039-12-24
Also published as: WO2021129764A1; CN113037370A

Abstract

The invention provides a BOSA (Brillouin optical time shift) receiving power calibration method and device, wherein the BOSA receiving power calibration method comprises the following steps: determining a calibration type according to the BOSA parameter information; calibration parameters were determined from the following: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received light power information corresponding to the preset sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and performing BOSA (bidirectional optical subsystem) receiving power calibration according to the relation between the optical power information and the ADC information. According to the invention, the problem of inaccurate BOSA received power calibration caused by the fact that factors which possibly influence optical power information and ADC information cannot be comprehensively considered in the BOSA received power calibration process in the related art is solved, so that the effect of improving the BOSA received power calibration accuracy is achieved.

Description

BOSA (British automatic acquisition) received power calibration device and method

Technical Field

The invention relates to the field of microelectronics, in particular to a BOSA (British analog) receiving power calibration device and a BOSA receiving power calibration device.

Background

With the development of fiber optic communication technology and the construction of core networks and access networks, passive fiber optic networks (Passive Optical Network, PON) have continuously demonstrated the ability to provide reliable data, voice and video communications to end users in order to achieve full network fiber to the home (Fibre To The Home, FTTH) of the fiber. Among the current PON technologies, gigabit passive optical network (Gigabit Passive Optical Network, GPON) and ethernet passive optical network (Ethernet Passive Optical Network, EPON) are two mainstream high-efficiency broadband access technologies.

The PON technology may be implemented by using a PON board, and for the PON board, bi-directional Optical Sub-Assembly (BOSA) may be mounted to connect with an optical line terminal (Optical line terminal, OLT). The BOSA replaces the traditional optical module scheme, the shell and the control chip are removed, the cost of the single board is reduced, and the performance of the single board is improved. The BOSA is directly used for being connected with the OLT, so that the receiving performance of the BOSA directly affects the quality of the optical communication service.

A photoelectric avalanche diode (Avalanche Photon Diode, APD) is arranged in the BOSA; for a PON board using an onboard BOSA, a boost circuit module needs to be provided for the BOSA, and due to the use of the boost circuit, temperature lookup tables of APDs in the BOSA, that is, records of mapping relationships between different temperatures and photocurrent values output by the APDs, are required to be subjected to temperature compensation, and the process of the temperature compensation is to calibrate the received power of the BOSA.

In the related art, in the process of calibrating the BOSA received power, a two-point determination or three-point determination method is generally adopted to establish a model for calibrating the BOSA received power, so as to calibrate the BOSA received power. However, in the above-mentioned process of establishing the BOSA received power calibration model, many factors in the establishment of the model may not be considered fully, which may cause the fact that the BOSA received power calibration model does not conform to the actual situation, and thus the accuracy of the BOSA received power calibration is low.

In the above related art, no effective solution has been proposed in the related art for the problem of inaccurate BOSA received power calibration due to failure to comprehensively consider factors that may affect optical power information and ADC information in the BOSA received power calibration process.

Disclosure of Invention

The embodiment of the invention provides a BOSA received power calibration device and a method thereof, which at least solve the problem that in the BOSA received power calibration process in the related art, the BOSA received power calibration is inaccurate due to the fact that factors which possibly influence optical power information and ADC information are not comprehensively considered

According to an embodiment of the present invention, there is provided a BOSA received power calibration method, including:

Determining a calibration type according to the BOSA parameter information;

calibration parameters were determined from the following: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating preset received light power information corresponding to the sampling point;

and determining the relation between the optical power information and the ADC information according to the calibration parameters, and performing BOSA received power calibration according to the relation between the optical power information and the ADC information.

According to another embodiment of the present invention, there is also provided a BOSA received power calibration method, including:

acquiring a corresponding relation between temperature information and DAC information of the APD, wherein the DAC information of the APD is used for indicating control information of the APD working in the corresponding temperature indicated by the temperature information;

according to the corresponding relation between the temperature information and the DAC information, DAC information corresponding to working temperature information is determined, wherein the working temperature information is used for indicating the working temperature of the BOSA;

and determining the relation between the optical power information and the ADC information according to the DAC information corresponding to the working temperature information, and performing BOSA receiving power calibration according to the relation between the optical power information and the ADC information.

According to another embodiment of the present invention, there is also provided a BOSA received power calibration apparatus including:

the first determining module is used for determining a calibration type according to the BOSA parameter information;

a second determining module for determining calibration parameters according to: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating preset received light power information corresponding to the sampling point;

and the first calibration module is used for determining the relation between the optical power information and the ADC information according to the calibration parameters and performing BOSA received power calibration according to the relation between the optical power information and the ADC information.

the acquisition module is used for acquiring a corresponding relation between temperature information and DAC information of the APDs, wherein the DAC information of the APDs is used for indicating control information of the APDs working in the corresponding temperature indicated by the temperature information;

the corresponding module is used for determining DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information, wherein the working temperature information is used for indicating the working temperature of the BOSA;

And the second calibration module is used for determining the relation between the optical power information and the ADC information according to the DAC information corresponding to the working temperature information, and performing BOSA receiving power calibration according to the relation between the optical power information and the ADC information.

According to a further embodiment of the invention, there is also provided a computer-readable storage medium having stored therein a computer program, wherein the computer program is arranged to perform the steps of any of the method embodiments described above when run.

According to a further embodiment of the invention, there is also provided an electronic device comprising a memory having stored therein a computer program and a processor arranged to run the computer program to perform the steps of any of the method embodiments described above.

According to the invention, the calibration type can be determined according to the BOSA parameter information; and determining the calibration parameters from: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating preset received light power information corresponding to the sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and performing BOSA received power calibration according to the relation between the optical power information and the ADC information. Therefore, the invention can solve the problem of inaccurate BOSA received power calibration caused by the fact that factors which possibly influence optical power information and ADC information are not comprehensively considered in the BOSA received power calibration process in the related technology, so as to achieve the aim of effectively improving the accuracy of BOSA received power calibration.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiments of the invention and together with the description serve to explain the invention and do not constitute a limitation on the invention. In the drawings:

fig. 1 is a flowchart (a) of a BOSA received power calibration method according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a single board according to an embodiment of the present invention;

FIG. 3 is a flow chart of BOSA received power calibration according to one embodiment of the invention;

FIG. 4 is a schematic circuit diagram of a boost chip in an on-board BOSA according to one embodiment of the invention;

fig. 5 is a flowchart (two) of a BOSA received power calibration method according to an embodiment of the present invention;

fig. 6 is a block diagram (a) of a BOSA received power calibration device according to an embodiment of the present invention;

fig. 7 is a block diagram (two) of a BOSA received power calibration device according to an embodiment of the present invention.

Detailed Description

The invention will be described in detail hereinafter with reference to the drawings in conjunction with embodiments. It should be noted that, in the case of no conflict, the embodiments and features in the embodiments may be combined with each other.

It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order.

Example 1

The present embodiment provides a BOSA received power calibration method, fig. 1 is a flowchart (a) of the BOSA received power calibration method according to an embodiment of the present invention, and as shown in fig. 1, the BOSA received power calibration method in the present embodiment includes:

s102, determining a calibration type according to BOSA parameter information;

s104, determining calibration parameters according to the following objects: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received light power information corresponding to the preset sampling point;

s106, determining the relation between the optical power information and the ADC information according to the calibration parameters, and performing BOSA received power calibration according to the relation between the optical power information and the ADC information.

In the above embodiment, the BOSA parameter information in step S102 is inherent information in the BOSA, and the calibration type may be determined by querying related hardware or software information of the BOSA, such as a BOSA driver chip manual, etc., to obtain the above BOSA parameter information. The calibration type is used to indicate the relationship between the optical power information and the ADC information, and may specifically be a specific function type of a corresponding model in the function model between the optical power information and the ADC information, such as a quadratic function model, a cubic function model, and the like.

In the above embodiment, the ADC information in step S104 is used to indicate the output value of the electrical signal converted from the optical power value output by the APD in the BOSA, and in a specific implementation process, the ADC value corresponding to the BOSA received optical power measured by the GUI software correspondingly provided by the BOSA driving chip may be directly read as the ADC information in the above embodiment. Correspondingly, the first sampling information in the above embodiment is the output value of the electrical signal converted from the optical power value output by the APD acquired at one or more application points.

The optical power information in step S104 is used to indicate an optical power value obtained by directly measuring the actual optical power value of the APD in the above-described embodiment by an optical power monitoring device, such as an optical power meter, or the like. Correspondingly, the second sampling information in the above embodiment is the actual optical power value received by the optical power monitoring device acquired at one or more utilization points.

It should be further noted that, in the above embodiment, the adopted points in the first sampling information and the second sampling information are in a one-to-one correspondence.

In step S104, the calibration parameter may be a model parameter of a function model between the optical power information and the ADC information, or may be understood as a function coefficient of the function model; on the basis of obtaining the first sampling information and the second sampling information, the calibration parameters can be determined through a fitting calculation mode and the like. It should be further noted that the calibration parameters may include a plurality of aspects, such as one or more positions corresponding to the function model between the optical power information and the ADC information, and corresponding values at the positions; the specific number and location of the calibration parameters may be determined by the type of calibration in step S102.

In the above embodiment, in step S106, the relationship between the optical power information and the ADC information, specifically, the function model between the optical power information and the ADC information, is obtained on the basis of determining the calibration parameter, so that the BOSA received power can be calibrated.

By the BOSA received power calibration method in the embodiment, the calibration type can be determined according to the BOSA parameter information; and determining the calibration parameters from: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating preset received light power information corresponding to the sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and performing BOSA received power calibration according to the relation between the optical power information and the ADC information. Therefore, the BOSA received power calibration method in the embodiment can solve the problem of inaccurate BOSA received power calibration caused by failing to comprehensively consider factors possibly influencing optical power information and ADC information in the BOSA received power calibration process in the related art, so as to achieve the problem of effectively improving accuracy of BOSA received power calibration.

Specifically, by the BOSA received power calibration method in the above embodiment, firstly, the relationship between the optical power information and the ADC information is primarily determined according to the BOSA parameter information in the BOSA received power calibration process, so as to determine the type of the function model between the optical power information and the ADC information corresponding to the APD in the BOSA as the calibration object; on the basis, parameters or coefficients corresponding to a function model between the optical power information and the ADC information are determined through the sampling mode of the first sampling information and the second sampling information, so that an accurate function model between the optical power information and the ADC information is established. The accuracy can be remarkably improved by using the model as a model for BOSA received power calibration to calibrate the BOSA received power.

On the other hand, the BOSA received power calibration method in the embodiment is not limited to the type of the single board corresponding to the on-board BOSA, and has good applicability.

In an optional embodiment, before determining the calibration type according to the BOSA parameter information in step S102, the method further includes:

acquiring type information of a register preset in the BOSA;

and determining BOSA parameter information according to the type information of the register.

It should be further noted that, the type information of the register in the BOSA is inherent information of the BOSA, and the type information of the register may be obtained by querying related hardware or software information of the BOSA, such as a BOSA driver chip manual, etc.; the type information of the registers can specifically indicate the number of the registers corresponding to the APDs, the types of the registers and other related information, so that the type information of the registers can be directly used as BOSA parameter information to determine the BOSA parameter information.

In an alternative embodiment, in step S104, the calibration parameters are determined according to the following objects: calibration type, first sampling information, second sampling information, including:

obtaining fitting optical power information according to the following objects: the calibration type, the first sampling information and the second sampling information; the fitting optical power information is used for indicating optical power information obtained by fitting processing at a preset sampling point;

and determining calibration parameters according to the fitting optical power information and the receiving optical power information.

It should be further noted that, in the above alternative embodiment, the fitting optical power information indicates a fitting value of optical power corresponding to one or more preset adopted points in the fitting process according to the first sampling information and the second sampling information, where the fitting value may be obtained by a least square fitting method. The process of fitting according to a plurality of adopted values to obtain corresponding fitting values is known to those skilled in the art, and will not be described herein.

It should be further noted that, since the fitting values obtained in the fitting process have non-uniqueness, that is, the fitting values vary within a certain range, correspondingly, the fitting curve formed by a plurality of fitting values also varies within a certain range. In this regard, in the above-mentioned alternative embodiment, after the fitting optical power information is obtained after the fitting, the fitting optical power information may be further selected according to the received optical power information, so as to obtain a unique calibration parameter, so as to establish a functional model between the optical power information and the ADC information.

In an optional embodiment, determining the calibration parameter according to the fitting optical power information and the received optical power information includes:

determining a calibration value, wherein the calibration value is a value of a calibration parameter under the condition that an error between fitting optical power information in a sampling point and receiving optical power information in a corresponding sampling point is a minimum value;

and determining the calibration parameters according to the calibration type and the calibration value.

It should be further noted that, in the above alternative embodiment, the calibration value is a specific value for indicating a corresponding position of the calibration parameter in the functional model between the optical power information and the ADC information; specifically, according to the non-uniqueness of fitting optical power information, different fitting optical power information is adopted to obtain a function model between different optical power information and ADC information so as to correspond to different calibration parameters; in the above optional implementation, the fitting optical power information corresponding to the situation that the error between the fitting optical power information and the received optical power information in the corresponding sampling point is the minimum value is adopted in the fitting optical power information to establish a function model between the optical power information and the ADC information, and the corresponding value of the calibration parameter corresponding to the model is the calibration value.

acquiring a corresponding relation between temperature information and DAC information of the APD, wherein the DAC information of the APD is used for indicating control information of the APD working in the temperature indicated by the corresponding temperature information;

and determining DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information, wherein the working temperature information is used for indicating the working temperature of the BOSA.

It should be further noted that, in the above-mentioned alternative embodiment, the control information is used to indicate the driving voltages/currents corresponding to the APD in different temperature environments, so as to drive the APD to work normally in the corresponding temperature environments; based on the above, the correspondence between the temperature information and the DAC information of the APD is obtained, that is, the DAC information that can drive the APD to perform normal operation under different temperature information is determined. Therefore, the current working temperature of the BOSA, namely DAC information which can normally work by the APD under the working temperature information, can be further determined so as to drive the APD.

It should be further noted that, DAC information corresponding to the APD under different temperature information may be referred to as a temperature lookup table of the APD; generally, in the related art, when a board corresponding to the on-board BOSA is powered on, a preset temperature lookup table of the APD is burned through GUI software corresponding to the BOSA driving chip. However, the material or processing technology of the PCB in the single board and the BOSA device or the chip selection or processing technology are likely to influence the photoelectric effect of the APD; that is, the photoelectric effect of APD in different types of single boards, or even single boards of the same signal, that is, the actual correspondence between the temperature information in APD and the DAC information may be different.

Therefore, the temperature lookup table of the APD preset by the APD or the single board manufacturer or the user often has a certain error, and the specific performance is that under certain temperature information, the corresponding DAC information in the APD temperature lookup table cannot realize the normal driving of the APD, so that the working effect of the APD is poor, and meanwhile, the subsequent received power calibration of the BOSA is also affected.

Based on this, in the above alternative embodiment, the corresponding relation between the temperature information of the APD and the DAC information may be redetermined before the received power calibration of the BOSA is performed, so as to calibrate the temperature lookup table of the APD, thereby overcoming the influence of the difference between the veneers on the photoelectric effect of the APD, so that the APD can be ensured to work normally by the redetermined DAC information at the current working temperature of the BOSA, so that the accuracy of the received power calibration of the BOSA in the present embodiment is further improved while the stability of the overall operation of the BOSA is improved.

In an alternative embodiment, the obtaining the correspondence between the temperature information and the DAC information of the APD includes:

acquiring a corresponding relation between temperature information and initial DAC information of an APD; the initial DAC information of the APD is control information for indicating the APD to work theoretically in the temperature indicated by the corresponding temperature information;

Acquiring the corresponding relation between the temperature information and the actual DAC information of the APD according to the corresponding relation between the temperature information and the initial DAC information; the actual DAC information of the APD is control information for indicating that the APD actually works in the BOSA in the temperature indicated by the corresponding temperature information;

according to the corresponding relation between the temperature information and the DAC information, determining the DAC information corresponding to the working temperature information comprises the following steps:

according to the corresponding relation between the temperature information and the actual DAC information, the actual DAC information corresponding to the working temperature information is obtained, and the DAC information corresponding to the working temperature information is determined.

It should be further noted that, the initial DAC information of the APD indicates DAC information corresponding to certain temperature information in a preset APD temperature lookup table, that is, DAC information before calibration is not performed on the APD temperature lookup table. Correspondingly, the actual DAC information of the APD is DAC information which can actually drive the APD to work normally under certain temperature information, namely DAC information in the calibrated APD temperature lookup table.

In an optional embodiment, the obtaining the correspondence between the temperature information and the actual DAC information of the APD according to the correspondence between the temperature information and the initial DAC information includes:

Acquiring first initial DAC information and second initial DAC information of the APD corresponding to the temperature information according to the corresponding relation between the temperature information and the initial DAC information; the first initial DAC information is used for indicating DAC information of the APD which normally works in the temperature indicated by the temperature information, and the second initial DAC information is used for indicating DAC information of the APD which critically emits light in the temperature indicated by the temperature information;

determining a target difference value between first initial DAC information and second initial DAC information corresponding to the working temperature information according to the working voltage of the BOSA;

selecting first initial DAC information and second initial DAC information corresponding to target temperature information, wherein the difference value between the first initial DAC information and the second initial DAC information corresponding to the target temperature information accords with a target difference value;

and configuring initial DAC information corresponding to the target temperature information as actual DAC information corresponding to the working temperature information so as to acquire a corresponding relation between the temperature information and the actual DAC information.

In an alternative embodiment, the method in this embodiment further includes:

inputting test light to an external optical power measuring unit to obtain first optical power information, wherein the first optical power information is obtained by measuring the test light by the optical power measuring unit;

Inputting test light to the BOSA to obtain second optical power information, wherein the second optical power information is the optical power information of the test light output by the BOSA;

and acquiring the relation between the first optical power information and the second optical power information.

It should be further noted that, the optical power measurement unit is independent of the BOSA in the present embodiment, that is, the comparison result between the first optical power information and the second optical power information obtained by the optical power measurement unit and the BOSA for the same test light respectively is used to verify the accuracy of the function model established between the optical power information and the ADC information in the above embodiment.

In an optional embodiment, after the acquiring the relationship between the first optical power information and the second optical power information, the method includes:

performing BOSA receiving power calibration according to the relation between the optical power information and the ADC information under the condition that the difference value between the first optical power information and the second optical power information is smaller than or equal to a preset error threshold value; or,

in the case that the difference between the first optical power information and the second optical power information is greater than a preset error threshold, performing the following operations: acquiring a corresponding relation between temperature information and DAC information of an APD, and determining DAC information corresponding to working temperature information according to the corresponding relation between the temperature information and the DAC information; determining a calibration type according to BOSA parameter information; calibration parameters were determined from the following: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating preset received light power information corresponding to the sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and performing BOSA received power calibration according to the relation between the optical power information and the ADC information.

It should be further noted that in the above-mentioned alternative embodiment, in the case that the difference between the first optical power information and the second optical power information is greater than the preset error threshold, that is, the accuracy of determining the function model established between the optical power information and the ADC information is low, calibration of the temperature lookup table of the APD may be performed again, and based on this, the function model between the optical power information and the ADC information may be re-established. By this reciprocation, the accuracy of the function model between the finally established optical power information and the ADC information can be remarkably improved.

In order to further explain the method for calibrating the BOSA received power in this embodiment, the following description is given by way of specific embodiments.

DETAILED DESCRIPTION OF EMBODIMENT (S) OF INVENTION

In this embodiment, a 10G PON board is used to calibrate BOSA received power, fig. 2 is a schematic structural diagram of a board according to an embodiment of the present invention, and the structure of the board on which the BOSA is mounted is shown in fig. 2. Fig. 3 is a flowchart of calibrating BOSA received power according to an embodiment of the present invention, and a flow of calibrating BOSA received power by the above board is shown in fig. 3.

S1, a single board is electrified to run and load version files, a version kernel configures a luminous command and a code pattern through a serial port tool, and GUI software of a BOSA driving chip at a PC end burns a plurality of lookup tables for the single board through a USB-to-IIC interface module, wherein the method specifically comprises the following steps: a lookup table containing information such as SFF-8472 protocol diagnostics, lookup table selection, and passwords, a lookup table containing information such as SFF-8472 protocol user-writable memory space, alarm settings, and the like, an initial APD temperature lookup table, and a lookup table containing register setting information.

S2, aiming at the difference among single boards, performing calibration processing on the initial APD temperature lookup table in the S1. The specific method is that the APD_DAC value (namely the initial DAC value in the embodiment) of the APD critical luminescence under the current working temperature of the single board is determined through the BOSA driving chip GUI software, and the corresponding relation between the temperature in the APD temperature lookup table and the APD_DAC value is redetermined through a temperature compensation mode, so that the APD_DAC value corresponding to the current working temperature environment in the APD temperature lookup table is the APD_DAC value capable of enabling the APD to work normally.

The process of adjusting the correspondence between the temperature in the APD temperature lookup table and the apd_dac value in step S2 is as follows.

Fig. 4 is a schematic circuit diagram of a boost chip in an on-board BOSA according to an embodiment of the present invention, where the circuit structure of the boost chip in the on-board BOSA is shown in fig. 4. In the boost circuit shown in fig. 4, the APD operating voltage of the BOSA on board in the single board is first determined to be Vbr-3V, so that it can be known from the reference circuit and manual of the boost chip:

apd_bias in the above formula 12 is an APD working voltage, apd_bias1 is specifically an ideal value of the working voltage, and apd_bias2 is specifically a critical value of the working voltage. From this equation 12 above, it can be further determined that:

Apd_dac1 in the above formula 13 is the APD critical light emitting state value of BOSA, that is, corresponds to the second initial DAC information in the above embodiment; apd_dac2 is the value of BOSA under APD normal operation, i.e. corresponds to the first initial DAC information in the above embodiment; r1 and R2 are resistance values in the booster circuit shown in fig. 4. In the process of calibrating the APD temperature lookup table, the bias temperature value in the APD temperature lookup table enables the APD_DAC1 and the APD_DAC2 to meet the relation of the formula (13), so that the calibration of the APD temperature lookup table can be realized.

S3, 10G OLT module is connected to the single board through single mode fiber series connection adjustable optical attenuator, in the bearable range of single board BOSA tube, the ADC value (x ₁ ,x ₂ ,…,x _m ) As the second sampling information in the above embodiment, and the optical power count (t) in dBm among the plurality of sampling points is read ₁ ,t ₂ ,...,t _m ) And converted into uW (y ₁ ,y ₂ ,...,y _m ) As the first sampling information in the above-described embodiment; the above-mentioned reading conversion process is as follows:

y＝10 ^0.1t mW＝10 ^0.1t *1000uW (15)

the corresponding ADC value and the optical power value are recorded as (x) _i ,y _i ) (i=0, 1,., m), m being the sampling pointNumber of the pieces.

Further, according to the BOSA driver chip manual, the receiving register corresponding to the on-board BOSA has three parameters, namely, BOSA parameter information in the above embodiment, rx_pwr (Slope C2), rx_pwr (Slope C1) and rx_pwr (Offset C0), so that a function model between the ADC value and the optical power value can be determined as a second-order receiving calibration model, and the type of the function model is the calibration type in the above embodiment:

Coefficient a in the second-order reception calibration model ₀ ,a ₁ ,a ₂ I.e. the calibration parameters in the above embodiments; based on the second-order receiving calibration model, a least square fitting method is adopted to calculate a corresponding coefficient according to the first sampling information and the second sampling information; in the fitting process, the selected termination fitting condition is that the sum of squares of errors of the fitting value and the measured value is minimum, namely:

then there are:

equation 17 above is a ₀ ，a ₁ ，a ₂ If the multiple functions of (a) are to be further found i=i (a ₀ ，a ₁ ，a ₂ ) Is an extremum of (a).

Namely:

equation 19 above is a ₀ ，a ₁ ，a ₂ Is a linear system of equations of (2).

List calculationAnd->

The following equations are listed according to the above list:

thus, the curve parameter a corresponding to the second-order receiving calibration model can be obtained ₀ ,a ₁ ,a ₂ And establishing a unique second-order BOSA optical power receiving calibration model by the parameters:

s4, further processing curve parameters of the second-order BOSA optical power receiving calibration model. In order to meet the requirement that the EEPROM registers hung on the BOSA driving chip can identify the parameters of the receiving model, all the parameters need to be converted into a format readable by the registers; specifically, shifting the quadratic coefficient by 29 or 30 bits to the right depends on bit1 of the A2 table lookup table 0xC1 register, and Offset C0 adopts a two's complement method:

RxPower _{Slope_C2} ＝a ₂ /0.1/2 ²⁹ Or RxPower _{Slope_C2} ＝a ₂ /0.1/2 ³⁰ (21)

RxPower _{Slope_C1} ＝a ₁ /0.1/2 ¹³ (22)

Register names, addresses and ranges corresponding to coefficients of the calibration model are received.

After the calibration parameters are written into the EEPROM, the accuracy of the second-order BOSA optical power receiving calibration model can be checked, specifically, the optical power value of the test light and the optical power value of the BOSA driving chip software at the PC end are read and compared through the optical attenuator, and if the error allowable range is exceeded, the S2 and the S3 are returned and re-executed.

From the description of the above embodiments, it will be clear to a person skilled in the art that the method according to the above embodiments may be implemented by means of software plus the necessary general hardware platform, but of course also by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) comprising instructions for causing a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present invention.

Example 2

The present embodiment provides a BOSA received power calibration method, and fig. 5 is a flowchart (two) of the BOSA received power calibration method according to an embodiment of the present invention, as shown in fig. 5, where the BOSA received power calibration method in the present embodiment includes:

s202, obtaining a corresponding relation between temperature information and DAC information of the APD, wherein the DAC information of the APD is used for indicating control information of the APD working in the temperature indicated by the corresponding temperature information;

s204, determining DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information, wherein the working temperature information is used for indicating the working temperature of the BOSA;

s206, determining the relation between the optical power information and the ADC information according to the DAC information corresponding to the working temperature information, and performing BOSA receiving power calibration according to the relation between the optical power information and the ADC information.

In an optional embodiment, in step S202, obtaining the correspondence between the temperature information and the DAC information of the APD includes:

It should be further noted that, the initial DAC information of the APD indicates DAC information corresponding to certain temperature information in a preset APD temperature lookup table, that is, DAC information before calibration is not performed on the APD temperature lookup table. Correspondingly, the actual DAC information of the APD is DAC information which can actually drive the APD to work normally under certain temperature information, namely DAC information in the calibrated APD temperature lookup table

In an alternative embodiment, the method in this embodiment further includes:

And under the condition that the difference value between the first optical power information and the second optical power information is larger than a preset error threshold value, executing the operation of acquiring the corresponding relation between the temperature information and the DAC information of the APD, and determining the DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information.

It should be further noted that in the above-mentioned alternative embodiment, in the case that the difference between the first optical power information and the second optical power information is greater than the preset error threshold, that is, the accuracy of determining the function model established between the optical power information and the ADC information is low, so that calibration of the temperature lookup table of the APD can be performed again. By this reciprocation, the accuracy of the function model between the finally established optical power information and the ADC information can be remarkably improved.

Example 3

The present embodiment provides a BOSA received power calibration device, which is used to implement the foregoing embodiments and preferred embodiments, and is not described in detail. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. While the means described in the following embodiments are preferably implemented in software, implementation in hardware, or a combination of software and hardware, is also possible and contemplated. Fig. 6 is a block diagram (a) of a BOSA received power calibration device according to an embodiment of the present invention, as shown in fig. 6, the BOSA received power calibration device in this embodiment includes:

a first determining module 302, configured to determine a calibration type according to BOSA parameter information;

a second determining module 304, configured to determine the calibration parameter according to: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received light power information corresponding to the preset sampling point;

the first calibration module 306 is configured to determine a relationship between the optical power information and the ADC information according to the calibration parameter, and perform BOSA received power calibration according to the relationship between the optical power information and the ADC information.

The other optional embodiments and technical effects of the BOSA received power calibration device in this embodiment are all corresponding to the BOSA received power calibration method in embodiment 1, and thus are not described herein.

In an optional embodiment, before determining the calibration type according to the BOSA parameter information, the method further includes:

acquiring type information of a register preset in the BOSA;

In an alternative embodiment, the calibration parameters are determined from the following: calibration type, first sampling information, second sampling information, including:

In an alternative embodiment, before the step of calibrating the APD according to the preset avalanche photodiode includes:

In an alternative embodiment, the apparatus is further configured to:

It should be noted that each of the above modules may be implemented by software or hardware, and for the latter, it may be implemented by, but not limited to: the modules are all located in the same processor; alternatively, the above modules may be located in different processors in any combination.

Example 4

The present embodiment provides a BOSA received power calibration device, which is used to implement the foregoing embodiments and preferred embodiments, and is not described in detail. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. While the means described in the following embodiments are preferably implemented in software, implementation in hardware, or a combination of software and hardware, is also possible and contemplated. Fig. 7 is a block diagram (two) of a BOSA received power calibration device according to an embodiment of the present invention, as shown in fig. 7, the BOSA received power calibration device in this embodiment includes:

an obtaining module 402, configured to obtain a correspondence between temperature information and DAC information of an APD, where the DAC information of the APD is used to indicate control information that the APD works in a temperature indicated by the corresponding temperature information;

A correspondence module 404, configured to determine DAC information corresponding to the operating temperature information according to a correspondence between the temperature information and the DAC information, where the operating temperature information is used to indicate an operating temperature of the BOSA;

the second calibration module 406 is configured to determine a relationship between the optical power information and the ADC information according to DAC information corresponding to the operating temperature information, and perform BOSA received power calibration according to the relationship between the optical power information and the ADC information.

The other optional embodiments and technical effects of the BOSA received power calibration device in this embodiment are all corresponding to the BOSA received power calibration method in embodiment 2, and thus are not described herein.

In an alternative embodiment, the apparatus is further configured to:

Example 5

Embodiments of the present invention also provide a computer readable storage medium having a computer program stored therein, wherein the computer program is arranged to perform the steps of any of the method embodiments described above when run.

Alternatively, in the present embodiment, the above-described computer-readable storage medium may be configured to store a computer program for executing the method steps described in the above-described embodiment:

alternatively, in the present embodiment, the above-described computer-readable storage medium may include, but is not limited to: a usb disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a removable hard disk, a magnetic disk, or an optical disk, or other various media capable of storing a computer program.

Example 6

An embodiment of the invention also provides an electronic device comprising a memory having stored therein a computer program and a processor arranged to run the computer program to perform the steps of any of the method embodiments described above.

Optionally, the electronic apparatus may further include a transmission device and an input/output device, where the transmission device is connected to the processor, and the input/output device is connected to the processor.

Alternatively, in the present embodiment, the above-described processor may be configured to execute the method steps described in the above-described embodiment by a computer program.

Alternatively, specific examples in this embodiment may refer to examples described in the foregoing embodiments and optional implementations, and this embodiment is not described herein.

It will be appreciated by those skilled in the art that the modules or steps of the invention described above may be implemented in a general purpose computing device, they may be concentrated on a single computing device, or distributed across a network of computing devices, they may alternatively be implemented in program code executable by computing devices, so that they may be stored in a memory device for execution by computing devices, and in some cases, the steps shown or described may be performed in a different order than that shown or described, or they may be separately fabricated into individual integrated circuit modules, or multiple modules or steps within them may be fabricated into a single integrated circuit module for implementation. Thus, the present invention is not limited to any specific combination of hardware and software.

The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for calibrating BOSA received power of a bi-directional optical subsystem, comprising:

determining a calibration type according to the BOSA parameter information;

and determining the relation between the optical power information and the ADC information according to the calibration parameters, and calibrating the BOSA receiving power of the bidirectional optical subsystem according to the relation between the optical power information and the ADC information.

2. The method of claim 1, wherein prior to determining the calibration type from BOSA parameter information, further comprising:

Acquiring type information of a register preset in the BOSA;

and determining the BOSA parameter information according to the type information of the register.

3. The method according to claim 1, wherein the calibration parameters are determined from: the calibration type, the first sampling information and the second sampling information comprise:

obtaining fitting optical power information according to the following objects: the calibration type, the first sampling information and the second sampling information; the fitting optical power information is used for indicating optical power information obtained by fitting processing at the preset sampling points;

and determining the calibration parameters according to the fitting optical power information and the received optical power information.

4. A method according to claim 3, wherein said determining said calibration parameters from said fitting optical power information and said received optical power information comprises:

determining a calibration value, wherein the calibration value is a value of the calibration parameter under the condition that an error between the fitting optical power information in the sampling points and the received optical power information in the corresponding sampling points is a minimum value;

5. The method of claim 1, wherein prior to determining the calibration type from BOSA parameter information, comprising:

acquiring a corresponding relation between temperature information and DAC information of APDs in the BOSA, wherein the DAC information of the APDs is used for indicating control information of the APDs working in the corresponding temperature indicated by the temperature information;

6. The method of claim 5, wherein the obtaining a correspondence between temperature information and DAC information for the APD comprises:

acquiring a corresponding relation between the temperature information and initial DAC information of the APD; the initial DAC information of the APDs is used for indicating control information indicating that the APDs work theoretically in the temperature indicated by the corresponding temperature information;

acquiring a corresponding relation between the temperature information and actual DAC information of the APD according to the corresponding relation between the temperature information and the initial DAC information; the actual DAC information of the APD is control information for indicating that the APD actually works in a BOSA in the temperature indicated by the corresponding temperature information;

Determining DAC information corresponding to the operating temperature information according to the correspondence between the temperature information and the DAC information, including:

and acquiring the actual DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the actual DAC information, and determining the DAC information corresponding to the working temperature information.

7. The method of claim 6, wherein the obtaining the correspondence between the temperature information and actual DAC information for the APD according to the correspondence between the temperature information and the initial DAC information comprises:

determining a target difference value between the first initial DAC information and the second initial DAC information corresponding to the working temperature information according to the working voltage of the BOSA;

Selecting the first initial DAC information and the second initial DAC information corresponding to target temperature information, wherein the difference value between the first initial DAC information and the second initial DAC information corresponding to the target temperature information accords with the target difference value;

and configuring the initial DAC information corresponding to the target temperature information into the actual DAC information corresponding to the working temperature information so as to acquire a corresponding relation between the temperature information and the actual DAC information.

8. The method according to any one of claims 5 to 7, further comprising:

inputting test light to an external optical power measurement unit to obtain first optical power information, wherein the first optical power information is obtained by measuring the test light by the optical power measurement unit;

inputting the test light to the BOSA to obtain second optical power information, wherein the second optical power information is the optical power information of the test light output by the BOSA;

9. The method of claim 8, wherein after the obtaining the relationship between the first optical power information and the second optical power information, comprising:

Performing BOSA received power calibration according to the relationship between the optical power information and the ADC information when the difference between the first optical power information and the second optical power information is less than or equal to a preset error threshold; or,

in the case that the difference between the first optical power information and the second optical power information is greater than a preset error threshold, performing the following operations:

the corresponding relation between the acquired temperature information and DAC information of the APD is obtained, and DAC information corresponding to the working temperature information is determined according to the corresponding relation between the temperature information and the DAC information;

determining a calibration type according to BOSA parameter information; calibration parameters were determined from the following: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating preset received light power information corresponding to the sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and performing BOSA received power calibration according to the relation between the optical power information and the ADC information.

10. A BOSA received power calibration apparatus, comprising:

and the first calibration module is used for determining the relation between the optical power information and the ADC information according to the calibration parameters and carrying out BOSA receiving power calibration according to the relation between the optical power information and the ADC information.

11. A computer readable storage medium, characterized in that the computer readable storage medium has stored therein a computer program, wherein the computer program is arranged to execute the method of any of the claims 1 to 9 when run.

12. An electronic device comprising a memory and a processor, characterized in that the memory has stored therein a computer program, the processor being arranged to run the computer program to perform the method of any of the claims 1 to 9.