CN112954314B - Method for testing optical jitter of camera module - Google Patents
Method for testing optical jitter of camera module Download PDFInfo
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- CN112954314B CN112954314B CN202110184473.1A CN202110184473A CN112954314B CN 112954314 B CN112954314 B CN 112954314B CN 202110184473 A CN202110184473 A CN 202110184473A CN 112954314 B CN112954314 B CN 112954314B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
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Abstract
The application provides a picture card for testing module optical shake makes a video recording, the picture card has square test area, include two at least blocks in the test area, one of them the block is in the central zone of test area, another the block is in an end angle area of test area, two at least the block is axisymmetric figure, the block includes at least hypotenuse, the hypotenuse with the contained angle of the symmetry axis of test area satisfies: 2-8 degrees, the tile further comprises at least two mutually parallel sides, wherein the parallel sides may be the hypotenuse or sides parallel to the symmetry axis of the test zone. The application also provides a device and a method for testing the optical jitter of the camera module.
Description
Technical Field
The application relates to the technical field of optical jitter testing of camera modules, in particular to a graphic card, a device and a method for testing optical jitter of a camera module.
Background
In recent years, with the improvement of life quality, people have increasingly higher requirements on photographic modules of products such as mobile phones and cameras, so that in order to ensure user experience, manufacturers of the photographic modules need to detect the image quality of the photographic modules when producing cameras, thereby ensuring good product quality.
The optical jitter is one parameter in the comprehensive evaluation of the image quality of the camera module, however, in the process of implementing the application, the inventor finds that at least the following problems exist in the prior art: most of the prior art tests the optical jitter of the camera module through the test card with the standard cross, but the test card can only test the optical jitter effect of the center of the standard cross, and cannot measure the test effect of the end angle of the test card.
Disclosure of Invention
In view of the above problems, the present application provides a graphics card, a device and a method for testing optical jitter of an image capturing module, so as to solve the above problems.
The application provides a picture card for testing module optical shake makes a video recording, the picture card has square test area, include two at least blocks in the test area, one of them the block is in the central zone of test area, another the block is in an end angle area of test area, two at least the block is axisymmetric pattern, every the block includes at least one hypotenuse, the hypotenuse with the contained angle of the symmetry axis of test area satisfies: 2-8 degrees, each of the tiles further comprising at least two mutually parallel sides, wherein one of the parallel sides is the oblique side or a side parallel to the symmetry axis of the test zone.
Therefore, the image card with at least two image blocks and different states of the image pickup module, such as an anti-shake mode, an anti-shake mode and an anti-shake mode, can be used for obtaining images of different states according to the preset frequency shake image pickup module, and obtaining the rotation degree, the spatial frequency response value and the inhibition ratio of the image pickup module according to the images so as to determine the optical shake test result of the image pickup module.
In some embodiments, the pattern is formed by splicing a central pattern and four edge patterns with oblique sides, the central pattern is square, the symmetry axis of the central pattern is parallel or coincident with the symmetry axis of the test area, the edge patterns are isosceles trapezoids, and the bottom sides of the isosceles trapezoids are equal to the length of one corresponding side of the square and overlap each other.
Therefore, the optical jitter effect of the quick-test camera module is realized through at least two approximately cross-shaped image blocks.
In some embodiments, the pattern block is square, and the symmetry axis of the square and the symmetry axis of the test area form a preset included angle, and the preset included angle is 2-8 degrees.
Therefore, square image blocks are arranged through at least two inclinations, so that the optical jitter effect of the camera shooting module is rapidly tested, and the corresponding space frequency response value is obtained through setting the preset included angle so that the hypotenuse of the available image blocks.
In some embodiments, the test zone includes five of the tiles, one of the tiles being at a center of the test zone and the other four of the tiles being at end corners of the test zone, respectively.
Therefore, the optical dithering effect of each end angle of the image of the test camera module can be obtained through five image blocks.
In some embodiments, the test zone includes one center tile, four first edge tiles, and four second edge tiles, the center tile being at the center of the test zone, wherein four first edge tiles are at four end corners of the test zone, respectively, each second edge tile being intermediate adjacent two of the first edge tiles.
Therefore, the optical jitter effect of different view fields of the camera module is tested through nine image blocks arranged at preset positions.
In some embodiments, one of the areas within the test area where the tiles are located and other blank areas are both filled with white and the other is filled with black.
Thus, the transmission type image card and the reflection type image card can be formed by setting the colors of the image blocks.
The application provides a device for testing module optical shake of making a video recording simultaneously, includes:
the graphics card for testing optical shake of camera module according to the above embodiment;
the camera module is used for shooting the image card for testing the optical jitter of the camera module;
and the vibration table is used for bearing the test camera module and driving the camera module to shake.
Thus, the camera module is driven to shake through the vibrating table so as to simulate the shake scene of a user using the camera module.
The application provides a method for testing optical jitter of a camera module, which comprises the following steps:
the method comprises the steps that a test image of a graphic card is obtained, the test image is from an image of the graphic card, which is shot by a camera shooting module and used for testing optical shake of the camera shooting module, the graphic card is provided with a square test area, the test area comprises at least two image blocks, one image block is located in the central area of the test area, the other image block is located in one end angle area of the test area, the at least two image blocks are axisymmetric patterns, each image block comprises at least one inclined edge, and the inclined angle between the inclined edge and a symmetry axis of the test area meets the following conditions: 2-8 degrees, wherein each image block further comprises at least two sides which are parallel to each other, one of the parallel sides is the oblique side or the side parallel to the symmetry axis of the test area, the preset test scene comprises that the anti-shake mode of the image pickup module is closed, the image pickup module is in a static state, the image pickup module is in a vibration state, the anti-shake mode is opened, and the image pickup module is in a vibration state, and the anti-shake mode is closed;
and calculating a spatial frequency response value and a suppression ratio according to the test image, and determining an optical jitter test result of the camera module according to the spatial frequency response value and the suppression ratio.
Therefore, through the image card for testing the optical jitter of the camera module and different application scenes of the camera module, the connecting line included angle of the image blocks of the camera module is tested to obtain the space frequency response value and the inhibition ratio to obtain the optical jitter test result of the camera module.
In some embodiments, the tiles include a central tile and four edge tiles with beveled edges, the central tile being square and having the same two symmetry axes as the test zone, the edge tiles being isosceles trapezoids, the base of the isosceles trapezoids being equal in length and overlapping one corresponding side of the square.
Therefore, the optical jitter effect of the quick-test camera module is realized through at least two approximately cross-shaped image blocks.
In some embodiments, the pattern block is square, two symmetry axes perpendicular to each other of the square form a preset included angle with the symmetry axis of the test area, and the preset included angle is 2-8 degrees.
Therefore, square image blocks are arranged through at least two inclinations, so that the optical jitter effect of the quick-test camera module is achieved.
In some embodiments, the calculating the spatial frequency response value and the suppression ratio according to the test image specifically includes:
acquiring a center of a block in the test image and a first coordinate of the center in a preset coordinate system;
acquiring a connecting line included angle between the connecting line of the centers of the two image blocks and the symmetry axis of the test area according to the first coordinates;
acquiring the outline of a block in the test image;
the angular point of the hypotenuse and the second coordinate of the angular point in a preset coordinate system are determined according to the outline;
determining a region of interest corresponding to the hypotenuse according to a second coordinate;
acquiring a spatial frequency response value according to the region of interest;
the corner coordinates of the determined contour blocks and the corner coordinates of the corner in a preset coordinate system;
determining two mutually parallel sides according to the angular point coordinates, and obtaining the number of pixels between the two parallel sides;
and calculating the inhibition ratio of the camera module according to the number of the pixels.
Thus, the spatial frequency response value and the rejection ratio are calculated by testing the hypotenuse and the mutually parallel sides of the image blocks in the image.
Drawings
Fig. 1 is a schematic diagram of a graphic card for testing optical jitter of a camera module according to a first embodiment of the present application.
Fig. 2 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to a second embodiment of the present application.
Fig. 3 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to a third embodiment of the present application.
Fig. 4 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to a fourth embodiment of the present application.
Fig. 5 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to a fifth embodiment of the present application.
Fig. 6 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to a sixth embodiment of the present application.
Fig. 7 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to a seventh embodiment of the present application.
Fig. 8 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to an eighth embodiment of the present disclosure.
Fig. 9 is a schematic diagram of a graphics card for testing optical shake of a camera module according to a ninth embodiment of the disclosure.
Fig. 10 is a schematic diagram of a graphics card for testing optical shake of a camera module according to a tenth embodiment of the present application.
Fig. 11 is a schematic diagram of a graphics card for testing optical shake of a camera module according to an eleventh embodiment of the present application.
Fig. 12 is a schematic diagram of a graphics card for testing optical jitter of a camera module according to a twelfth embodiment of the present application.
Fig. 13 is a schematic diagram of an apparatus for testing optical shake of an image capturing module according to a thirteenth embodiment of the present application.
Description of the main reference signs
Edge tile 1211
Vibrating table 24
Detailed Description
In order that the objects, features and advantages of the present application may be more clearly understood, a more particular description of the application will be rendered by reference to specific embodiments that are illustrated in the appended drawings. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments may be combined with each other. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application, and the described embodiments are merely some, rather than all, of the embodiments of the present application.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
Referring to fig. 1, fig. 1 is a schematic diagram of a card 10 for testing optical jitter of a camera module according to an embodiment of the present application, and the overall outline of the card 10 is square, it will be appreciated that in other embodiments, the card 10 may be circular or have other shapes.
In this embodiment, the image card 10 is a picture, and it is understood that in other embodiments, the image card 10 may be a drawing board, or an image presented through a display screen, so long as the image of the image card 10 can be acquired to test the optical shake of the camera module.
In this embodiment, the card 10 has a square test area 12, and the test area 12 has the same size as the card 10 and has a square shape, wherein the square shape may be rectangular or square, and it is understood that in other embodiments, the size of the test area 12 may be smaller than the size of the card 10.
Referring to fig. 1 again, the test area 12 is provided with two image blocks 121, one image block 121 is located at the center of the test area 12, the other image block 121 is located at an end angle of the test area 12, the image block 121 comprises a center image block 1212 and four edge image blocks 1211 with oblique sides, the center image block 1212 is square and has two same symmetry axes a and b with the test area 12, the edge image blocks 1211 are isosceles trapezoids, the bottom edge of each isosceles trapezoid is the same as the length of one corresponding edge of the center image block 1212 and overlaps with each other, the included angle between the waist of the isosceles trapezoid and one of the symmetry axes satisfies 2-8 degrees, and the angle range can measure the spatial frequency response value of the test image.
In an embodiment, a test image of the test area 12 is obtained by the camera module, and an actual line included angle between a center line and a symmetry axis is obtained according to a center line of two image blocks 121 in the test image, and further, the camera module is set in different modes, such as a static state, vibration according to a preset frequency or direction, and an anti-shake mode on or off state, and test images captured by the camera module in different modes are obtained, and a corresponding line included angle is obtained according to different test images, so as to test whether the images captured by the camera module in different scenes rotate and the rotation degree.
It will be appreciated that the degree of rotation of images of different end angles of the test area 12 can be tested by rotating the graphics card 10 such that one of the tiles 121 is at any one end angle of the test area 12.
In an embodiment, a test image of a test area 12 is obtained through a camera module, a contour of a block 121 in the test image is obtained, a corner point of a hypotenuse of the block 121 and a coordinate of the corner point in a preset coordinate system are determined according to the contour, a region of interest of the hypotenuse is determined according to the coordinate area, a spatial frequency response value is obtained according to the region of interest, and the spatial frequency response values of the camera module in a static state and an anti-shake mode on state are respectively obtained.
The region of interest (region of interest) is a region to be processed, which is defined by a square, a circle, an ellipse, an irregular polygon, etc. from the processed image in the image processing, and is the region where the block 121 is located.
The spatial frequency response value (spatial frequency response, SFR) is mainly used for measuring the influence on a single image caused by the increase of the line of the spatial frequency, and the SFR value of the image can be obtained through an SFR algorithm, wherein the SFR is in the prior art and is not described herein.
In an embodiment, a plurality of test images of the test area 12 in a preset test scene can be obtained through the camera module, the outline of a block 121 in the test image is obtained, the corner points of the outline and the corner point coordinates of the corner points in a preset coordinate system are determined, and at least two parallel sides and the distance between the two parallel sides are determined according to the corner point coordinates; and calculating the inhibition ratio of the camera module according to the distance. The effect of optical jitter is measured in terms of the suppression ratio.
In an embodiment, the preset test scene specifically includes that the camera module is in a vibration state and an anti-shake mode is on, the camera module is in a vibration state and an anti-shake mode is off, and the camera module is in a static state and the anti-shake mode is off, so that the camera module at least acquires three test images of the test area 12.
The suppression ratio (Suppression Ratio, SR) is used to judge the optical shake capability of the camera module. In one embodiment, the rejection ratio of the camera module may be calculated by the number of pixels in the block 121 that are clustered by two opposite sides, which may be two parallel beveled edges or parallel lines parallel or perpendicular to the central axis of the test area 12.
Referring to fig. 2, a schematic diagram of a graphic card 10 for testing optical jitter of a camera module according to a second embodiment of the present application is provided, and the graphic card 10 is provided with a test area 12 similar to the first embodiment, wherein the test area 12 includes five tiles 121, and the difference is that the test area 12 includes five tiles 121, one of which 121 is located at the center of the test area 12 and the other four tiles 121 are respectively located at end corners of the test area 12.
Thus, the rotation of the image of the camera module can be tested by matching the central image block 121 with the image block 121 at the end angle, and if the rotation exists, the rotation degree of different end angles of the test area 12 can be measured by matching different image blocks 121.
In this embodiment, the pattern blocks 121 located at the center of the test area 12 are symmetrically disposed along two symmetry axes a and b of the test area 12, and the pattern blocks 121 located at the end corners of the test area 12 and the other three pattern blocks 121 are symmetrically disposed along the symmetry axis a, the symmetry axis b and the center of the test area 12. The symmetrical pattern blocks 121 can improve the testing efficiency.
Referring to fig. 3, a schematic diagram of a graphics card 10 for testing optical jitter of a camera module according to a third embodiment of the present application is provided, and the graphics card 10 is provided with a test area 12 similar to the first embodiment, wherein the test area 12 includes a block 121, and the difference is that the test area 12 includes nine blocks 121: one central tile, four first edge tiles, and four second edge tiles, the central tile being in the center of the test zone 12, wherein the four first edge tiles are at four end corners of the test zone 12, respectively, and each second edge tile is at the middle of two adjacent first edge tiles.
In the present embodiment, one of the first edge segments and the other three first edge segments are symmetrically disposed along the symmetry axis a, the symmetry axis b and the center of the test area 12, respectively. Two of the four second edge patterns are positioned on the symmetry axis a, the other two are positioned on the symmetry axis b, and the center pattern is positioned on the intersection point of the symmetry axis a and the symmetry axis b.
Referring to fig. 4, a schematic diagram of a graphics card 10 for testing optical jitter of a camera module according to a fourth embodiment of the present application is provided, which is substantially the same as the first embodiment, the graphics card 10 is provided with a testing area 12, and the testing area 12 includes a block 121, except that: in the shape of the pattern block 121, in this embodiment, the pattern block 121 is square, wherein the square includes a square and a rectangle, two mutually perpendicular symmetry axes of the pattern block 121 and the symmetry axis of the test area form a preset included angle, and the preset included angle is 2-8 degrees, so that the included angle range between two parallel sides of the pattern block 121 and the symmetry axis is 2-8 degrees.
Referring to fig. 5, a schematic diagram of a graphic card 10 for testing optical shake of a camera module according to a fifth embodiment of the present application is provided, which is substantially the same as that of the fourth embodiment, the graphic card 10 is provided with a test area 12, the test area 12 includes a block 121, and the blocks 121 are all square, and the difference is that: the number of the blocks 121 is five, one of which is located at the center of the test area 12, and the other four blocks 121 are located at the four end corners of the test area 12, respectively.
Referring to fig. 6, a schematic diagram of a graphics card 10 for testing optical shake of a camera module according to a sixth embodiment of the present application is provided, which is substantially the same as that of the fourth embodiment, the graphics card 10 is provided with a testing area 12, the testing area 12 includes a block 121, and the blocks 121 are all square, and the difference is that: the number of the image blocks 121 is nine, one image block 121 is positioned at the center of the test area 12, the other four image blocks 121 are respectively positioned at four end angles of the test area 12, and the other four image blocks 121 are respectively positioned at the middle of adjacent end angles.
It will be appreciated that in the above embodiments, the test area 12 includes the region where the tile 121 is located and other blank regions, the other blank regions are filled with black, the region where the tile 121 is located is filled with white, and it will be appreciated that in other embodiments, the other blank regions may be filled with white, and the region where the tile 121 is located may be filled with black.
Referring to fig. 7, a schematic diagram of a graphics card 10 for testing optical jitter of a camera module according to a seventh embodiment of the present application is provided, which is substantially the same as that of the first embodiment, the graphics card 10 is provided with a testing area 12, and the testing area 12 includes a block 121, except that: in the shape of the block 121, in this embodiment, the block 121 is formed by splicing two isosceles trapezoid blocks, two mutually perpendicular symmetry axes of the block 121 located at the center of the test area 12 coincide with the symmetry axes of the test area, the symmetry axis a coincides with the coincident sides of the two isosceles trapezoids, the symmetry axis b perpendicularly intersects with the bottom sides of the two isosceles trapezoids, and the included angle between the oblique side of the equivalent trapezoids and the symmetry axis b is 2-8 degrees.
Referring to fig. 8, a schematic diagram of a graphic card 10 for testing optical shake of a camera module according to an eighth embodiment of the present application is provided, which is substantially the same as that of the seventh embodiment, and the graphic card 10 is provided with a test area 12, wherein the test area 12 includes a block 121, and the difference is that: the number of the blocks 121 is five, one of which is located at the center of the test area 12, and the other four blocks 121 are located at the four end corners of the test area 12, respectively.
Referring to fig. 9, a schematic diagram of a graphics card 10 for testing optical shake of a camera module according to a ninth embodiment of the present application is provided, which is substantially the same as that of the seventh embodiment, and the graphics card 10 is provided with a testing area 12, wherein the testing area 12 includes a block 121, and the difference is that: the number of the image blocks 121 is nine, one image block 121 is positioned at the center of the test area 12, the other four image blocks 121 are respectively positioned at four end angles of the test area 12, and the other four image blocks 121 are respectively positioned at the middle of adjacent end angles.
Referring to fig. 10, a schematic diagram of a graphic card 10 for testing optical shake of a camera module according to a tenth embodiment of the present application is provided, which is substantially the same as the seventh embodiment, in which the graphic card 10 is provided with a test area 12, and the test area 12 includes a block 121, and the difference is that: in the shape of the block 121, in this embodiment, the block 121 is formed by splicing two isosceles trapezoid blocks, two mutually perpendicular symmetry axes of the block 121 located at the center of the test area 12 coincide with the symmetry axes of the test area, the symmetry axis b coincides with the coincident sides of the two isosceles trapezoids, the symmetry axis a perpendicularly intersects with the bottom sides of the two isosceles trapezoids, and the included angle between the oblique side of the equivalent trapezoids and the symmetry axis a is 2-8 degrees.
Referring to fig. 11, a schematic diagram of a graphic card 10 for testing optical shake of a camera module according to an eleventh embodiment of the present application is provided, which is substantially the same as the tenth embodiment, and the graphic card 10 is provided with a test area 12, wherein the test area 12 includes a block 121, and the difference is that: the number of the blocks 121 is five, one of which is located at the center of the test area 12, and the other four blocks 121 are located at the four end corners of the test area 12, respectively.
Referring to fig. 12, a schematic diagram of a graphic card 10 for testing optical shake of a camera module according to a twelfth embodiment of the present application is provided, which is substantially the same as the tenth embodiment, and the graphic card 10 is provided with a test area 12, wherein the test area 12 includes a block 121, and the difference is that: the number of the image blocks 121 is nine, one image block 121 is positioned at the center of the test area 12, the other four image blocks 121 are respectively positioned at four end angles of the test area 12, and the other four image blocks 121 are respectively positioned at the middle of adjacent end angles.
Referring to fig. 7 to 12, preferably, if the lengths of the upper base and the side edges of the isosceles trapezoid block in the block 121 are the same, the block 121 has a regular hexagon shape. It will be appreciated that the tiles 121 in the above embodiments are all axisymmetric patterns.
It will be appreciated that the tile 121 in the above embodiment includes at least one oblique side, and the angle between the oblique side and the symmetry axis of the test area 12 ranges from 2 degrees to 8 degrees, and the tile 121 includes at least two pairs of parallel sides, wherein the parallel sides may be the oblique sides or the sides parallel to the symmetry axis of the test area 12.
It will be appreciated that the number of tiles 121 in the above embodiments may be two, five or nine, with at least one tile 121 being located in the center of the test zone 12 and at least one tile 121 being located at an end corner of the test zone 12. It will be appreciated that in other embodiments, the number of tiles may also be three, four, six, seven, eight, etc., provided that at least one tile 121 is centered in the test zone 12, and that at least one tile 121 is located at an end corner of the test zone 12.
Referring to fig. 13, a schematic diagram of an apparatus 20 for testing optical shake of a camera module according to a thirteenth embodiment of the present application, the apparatus 20 for testing optical shake of a camera module includes a graphic card 10 for testing optical shake of a camera module as described in the foregoing embodiments, a camera module 22 and a vibration table 24, the camera module 22 is used for capturing the graphic card 10 for testing optical shake of the camera module to obtain a test image, and the vibration table 24 is used for carrying the camera module 22 and driving the camera module 22 to shake so as to simulate vibration generated by a user using the camera module 22.
In this embodiment, the preset test scene specifically includes a state in which the vibration table 24 is turned on and the camera module 22 is in an anti-shake mode, and a state in which the vibration table 24 is turned off and the camera module 22 is in an anti-shake mode.
In this embodiment, the vibration table 24 can drive the camera module 22 to vibrate along a predetermined direction and then vibrate according to a predetermined frequency.
An embodiment of the present application also provides a method for testing optical shake of a camera module, including the following steps:
the method comprises the steps that a test image of a graphic card is obtained, the test image is from an image of the graphic card, which is shot by a camera shooting module under a preset test scene, and used for testing optical shake of the camera shooting module, the graphic card is provided with a square test area, the test area comprises at least two image blocks, one image block is positioned in the central area of the test area, the other image block is positioned in one end angle area of the test area, the at least two image blocks are axisymmetric patterns, each image block comprises at least one bevel edge, and the included angle between the bevel edge and a symmetry axis of the test area is as follows: 2-8 degrees, each of the tiles further comprising at least two mutually parallel sides, wherein one of the parallel sides is the oblique side or a side parallel to the symmetry axis of the test zone.
Acquiring a center of a block in the test image and a first coordinate of the center in a preset coordinate system;
acquiring a connecting line included angle between the connecting line of the centers of the two image blocks and the symmetry axis of the test area according to the first coordinates;
acquiring the outline of a block in the test image;
the angular point of the hypotenuse and the second coordinate of the angular point in a preset coordinate system are determined according to the outline;
determining a region of interest corresponding to the hypotenuse according to a second coordinate;
acquiring a spatial frequency response value according to the region of interest;
the corner coordinates of the determined contour blocks and the corner coordinates of the corner in a preset coordinate system;
determining two mutually parallel sides according to the angular point coordinates, and obtaining the number of pixels between the two parallel sides; wherein the two mutually parallel sides may be two mutually parallel oblique sides or two sides parallel to the symmetry axis of the test area.
And calculating the inhibition ratio of the camera module according to the number of the pixels.
Therefore, the rotation condition, the definition and the optical jitter of the image of the camera module are tested by acquiring the test image cards of different scenes and acquiring the corresponding connection line included angle, the spatial frequency response value and the inhibition ratio according to the test image cards of different test scenes.
The preset test scene comprises the following steps: the anti-shake mode of the camera shooting module is closed, the camera shooting module is in a static state, the camera shooting module is in a vibration state and the anti-shake mode is opened, and the camera shooting module is in a vibration state and the anti-shake mode is closed. It will be appreciated that in another embodiment, the camera module may be placed on the vibration table, and the optical module may be vibrated or stationary by the vibration table to vibrate or stationary, so as to simulate the state of the user when using the camera module.
Referring to fig. 1 to 3, the test area 12 is provided with at least two tiles 121, wherein one tile 121 is located at the center of the test area 12, the tile 121 comprises a center tile 1212 and four edge tiles 1211 with oblique sides, the center tile 1212 is square and has two same symmetry axes a and b with the test area 12, the edge tiles 1211 are isosceles trapezoids, the bottom edge of each isosceles trapezoid is the same as the length of one corresponding edge of the center tile 1212 and overlaps each other, wherein the included angle between the waist of the isosceles trapezoid and one of the symmetry axes satisfies 2-8 degrees, and the angle range can measure the spatial frequency response value of the test image.
Wherein in fig. 1 the test zone 12 is provided with two segments 121, one segment 121 being in the center of the test zone 12 and the other segment being at the end angle of the test zone 12.
In fig. 2, the test area 12 is provided with five blocks 121, wherein one block 121 is located at the center of the test area 12, and the other four blocks 121 are respectively located at the end corners of the test area 12.
The test zone 12 in fig. 3 comprises nine tiles 121, respectively: one central tile, four first edge tiles, and four second edge tiles, the central tile being in the center of the test zone 12, wherein the four first edge tiles are at four end corners of the test zone 12, respectively, and each second edge tile is at the middle of two adjacent first edge tiles.
Fig. 1, 2 and 3 provide the same shape for the tiles 121 of the application, respectively, but in embodiments, it is understood that in other embodiments, the number of tiles 121 may be three, four, six, seven, eight, etc.
Referring to fig. 4 to 6 again, the test area 12 is provided with at least two image blocks 121, one image block 121 is located at the center of the test area 12, the image block 121 is square, wherein the square comprises a square and a rectangle, two mutually perpendicular symmetry axes of the image block 121 and the symmetry axis of the test area form a preset included angle, and the preset included angle is 2 degrees to 8 degrees, so that the included angle range between two parallel sides of the image block 121 and the symmetry axis is 2 degrees to 8 degrees.
In fig. 4, the test area 12 is provided with two blocks 121, wherein one block 121 is located at the center of the test area 12, and the other block 121 is located at an end angle of the test area 12.
In fig. 5, the test area 12 is provided with five blocks 121, wherein one block 121 is located at the center of the test area 12, and the other four blocks 121 are respectively located at the end corners of the test area 12.
The test zone 12 in fig. 6 includes nine tiles 121, respectively: one central tile, four first edge tiles, and four second edge tiles, the central tile being in the center of the test zone 12, wherein the four first edge tiles are at four end corners of the test zone 12, respectively, and each second edge tile is at the middle of two adjacent first edge tiles.
Fig. 4, 5 and 6 are respectively embodiments provided in the present application in which the shapes of the tiles 121 are the same, but the number of the tiles 121 are different and the arrangement is different, and it is understood that in other embodiments, the number of the tiles 121 may be three, four, six, seven, eight, etc.
Referring to fig. 7 to 9, the test area 12 is provided with at least two tiles 121, wherein one tile 121 is located at the center of the test area 12, the tile 121 comprises a center tile 1212 and four edge tiles 1211 with oblique sides, the center tile 1212 is square and has two same symmetry axes a and b with the test area 12, the edge tiles 1211 are isosceles trapezoids, the bottom edge of each isosceles trapezoid is the same as the length of one corresponding edge of the center tile 1212 and overlaps each other, wherein the included angle between the waist of the isosceles trapezoid and one of the symmetry axes satisfies 2-8 degrees, and the angle range can measure the spatial frequency response value of the test image.
In fig. 7, the test area 12 is provided with two blocks 121, wherein one block 121 is located at the center of the test area 12, and the other block 121 is located at an end angle of the test area 12.
In fig. 8, the test area 12 is provided with five blocks 121, wherein one block 121 is located at the center of the test area 12, and the other four blocks 121 are respectively located at the end corners of the test area 12.
The test zone 12 in fig. 9 includes nine tiles 121, respectively: one central tile, four first edge tiles, and four second edge tiles, the central tile being in the center of the test zone 12, wherein the four first edge tiles are at four end corners of the test zone 12, respectively, and each second edge tile is at the middle of two adjacent first edge tiles.
Fig. 7, 8 and 9 are examples of the same shape of the tiles 121 provided in the application, but different numbers and arrangements of the tiles 121, and it is understood that the number of the tiles 121 may be three, four, six, seven, eight, etc.
Referring to fig. 10 to 12 again, the test area 12 is provided with at least two blocks 121, wherein one block 121 is located at the center of the test area 12, the block 121 is formed by splicing two isosceles trapezoid blocks, two mutually perpendicular symmetry axes of the block 121 located at the center of the test area 12 coincide with the symmetry axes of the test area, the symmetry axis b coincides with the coincident sides of the two isosceles trapezoids, the symmetry axis a perpendicularly intersects with the bottom edges of the two isosceles trapezoids, and the included angle between the oblique side of the equivalent trapezoids and the symmetry axis a is 2-8 degrees.
In fig. 10, the test area 12 is provided with two blocks 121, wherein one block 121 is located at the center of the test area 12, and the other block 121 is located at an end angle of the test area 12.
In fig. 11, the test area 12 is provided with five blocks 121, wherein one block 121 is located at the center of the test area 12, and the other four blocks 121 are respectively located at the end corners of the test area 12.
The test zone 12 in fig. 12 includes nine tiles 121, respectively: one central tile, four first edge tiles, and four second edge tiles, the central tile being in the center of the test zone 12, wherein the four first edge tiles are at four end corners of the test zone 12, respectively, and each second edge tile is at the middle of two adjacent first edge tiles.
Fig. 10, 11 and 12 are examples of the same shape of the tiles 121 provided in the application, but different numbers and arrangements of the tiles 121, and it is understood that the number of the tiles 121 may be three, four, six, seven, eight, etc.
In an embodiment, the pattern blocks include a central pattern block and four edge pattern blocks with oblique sides, the central pattern block is square and has two symmetry axes identical to those of the test area, the edge pattern blocks are isosceles trapezoids, and the bottom sides of the isosceles trapezoids are equal in length to one corresponding side of the square and overlap with each other.
In an embodiment, the pattern block is square, two symmetry axes perpendicular to each other of the square form a preset included angle with the symmetry axis of the test area, and the preset included angle is 2-8 degrees.
Finally, it should be noted that the above embodiments are merely for illustrating the technical solution of the present application and not for limiting, and although the present application has been described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that the technical solution of the present application may be modified or substituted without departing from the spirit and scope of the technical solution of the present application.
Claims (5)
1. A method for testing optical jitter of a camera module, the method comprising the steps of:
the method comprises the steps that test images of a graphic card are obtained, the test images come from images of the graphic card, which are shot by a camera shooting module in a preset test scene, and are used for testing optical shake of the camera shooting module, the graphic card is provided with a square test area, the test area comprises at least two image blocks, one image block is located in the center area of the test area, the other image block is located in one end angle area of the test area, the at least two image blocks are axisymmetric patterns, each image block comprises a center image block and four edge image blocks with oblique edges, the center image block is square and has two identical symmetry axes with the test area, the edge image blocks are isosceles trapezoid, the bottom edges of the isosceles trapezoid are equal in length to one corresponding edge of the square and overlap with each other, and the included angles of the oblique edges and the symmetry axes of the test area are met: 2-8 degrees, wherein the preset test scene comprises that an anti-shake mode of the camera module is closed, the camera module is in a static state, the camera module is in a vibration state and the anti-shake mode is opened, and the camera module is in a vibration state and the anti-shake mode is closed;
acquiring test images shot by the camera module under different modes;
acquiring an actual connecting line included angle between a central connecting line and a symmetry axis according to the central connecting lines of at least two image blocks, and acquiring connecting line included angles corresponding to test images shot by the camera module in different modes so as to judge whether the test images rotate and the rotation degree;
calculating a spatial frequency response value and a suppression ratio according to the test image, and determining an optical jitter test result of the camera module according to the spatial frequency response value and the suppression ratio;
the calculation according to the test image specifically comprises the following steps:
acquiring a center of a block in the test image and a first coordinate of the center in a preset coordinate system;
acquiring a connecting line included angle between the connecting line of the centers of the two image blocks and the symmetry axis of the test area according to the first coordinates;
acquiring the outline of a block in the test image;
the angular point of the hypotenuse and the second coordinate of the angular point in a preset coordinate system are determined according to the outline;
determining a region of interest corresponding to the hypotenuse according to a second coordinate;
calculating a spatial frequency response value according to the region of interest;
the determined corner point coordinates of the outline and the corner point coordinates of the corner point in a preset coordinate system;
determining two mutually parallel sides according to the angular point coordinates, and obtaining the number of pixels between the two parallel sides;
and calculating the inhibition ratio of the camera module according to the number of the pixels.
2. The method for testing optical jitter of a camera module of claim 1 wherein the tile is square, two mutually perpendicular axes of symmetry of the square form a preset angle with the axis of symmetry of the test zone, the preset angle being 2-8 degrees.
3. A method for testing optical jitter of a camera module according to claim 1 or 2 wherein the test zone comprises five of the tiles, one of the tiles being at the center of the test zone and the other four of the tiles being at the end corners of the test zone, respectively.
4. The method for testing optical jitter of a camera module of claim 1 or 2 wherein the test zone includes a center tile, four first edge tiles and four second edge tiles, the center tile being at the center of the test zone, wherein the four first edge tiles are at four end angles of the test zone, respectively, each of the second edge tiles being intermediate adjacent two of the first edge tiles.
5. The method for testing optical jitter of a camera module according to claim 1 or 2, wherein one of the areas of the test area where the tiles are located and other blank areas are filled with white and the other is filled with black.
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| WO2008078537A1 (en) * | 2006-12-22 | 2008-07-03 | The University Of Electro-Communications | Jiggle measuring system and jiggle measuring method |
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| CN105163009B (en) * | 2015-08-04 | 2020-06-16 | 南昌欧菲光电技术有限公司 | Picture and method for testing camera module |
| CN110177272B (en) * | 2019-06-27 | 2020-09-01 | Oppo广东移动通信有限公司 | Anti-shake test method and device for camera, storage medium and intelligent terminal |
| CN112203018A (en) * | 2020-09-30 | 2021-01-08 | 钟竞 | Camera anti-shake self-adaptive adjustment method and system based on artificial intelligence |
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| JPH07168228A (en) * | 1993-12-14 | 1995-07-04 | Nikon Corp | Camera with vibration proof mechanism |
| WO2020181511A1 (en) * | 2019-03-12 | 2020-09-17 | 深圳市大疆创新科技有限公司 | Method for testing image capture stability, calibration device and calibration system |
| CN111225204A (en) * | 2020-01-21 | 2020-06-02 | 上海悦易网络信息技术有限公司 | Camera shake detection method and device |
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