CN112945109B - Laser displacement meter array system parameter calibration method based on horizontal displacement table - Google Patents

Laser displacement meter array system parameter calibration method based on horizontal displacement table Download PDF

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CN112945109B
CN112945109B CN202110106587.4A CN202110106587A CN112945109B CN 112945109 B CN112945109 B CN 112945109B CN 202110106587 A CN202110106587 A CN 202110106587A CN 112945109 B CN112945109 B CN 112945109B
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laser
displacement meter
laser displacement
flat plate
horizontal displacement
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CN112945109A (en
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赵宏
高旭
张春伟
张振洋
赵金磊
鲍勍慷
刘发恒
燕家兴
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Xian Jiaotong University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates

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Abstract

The invention discloses a method for calibrating system parameters of a laser displacement meter array based on a horizontal displacement platform, which can calibrate the system parameters of the laser displacement meter array in the modes of parallelism parameters, coplanarity parameters and relative position parameters. The method comprises the following steps: fixing a flat plate with a mark point on a horizontal displacement table, and fixing a laser displacement meter array on a clamping device; adjusting the relative position relation of the measuring equipment; when the horizontal displacement table moves for a certain distance, recording corresponding reading and a flat plate image with a mark point; solving a parallelism parameter and a coplanarity parameter through the reading and the actual distance; the relative position parameters are obtained by image processing. The parameters obtained by the method can be used for adjusting the array arrangement, and meanwhile, the three-dimensional coordinates of the laser light spots can be solved, so that the subsequent measurement is more accurate.

Description

Laser displacement meter array system parameter calibration method based on horizontal displacement table
Technical Field
The invention belongs to the technical field of optical measurement, and particularly relates to a parameter calibration method of a laser displacement meter array system based on a horizontal displacement table.
Background
The laser displacement meter is an optical distance measuring instrument, which irradiates a laser beam on the surface of a measured object to obtain the linear distance between the measured point and the laser emitting point by methods such as a laser triangulation method and the like. The device has the advantages of high precision, high sampling rate, no electromagnetic interference, non-contact measurement and the like, and is widely applied to height and position measurement in laboratories and industrial environments. However, a single laser displacement meter can only measure the distance variation at a certain point, and in order to obtain the distances between a plurality of target points on the measured object, the laser displacement meters can be used by forming an array. Through the laser displacement meter array, the three-dimensional coordinate change condition of the laser light spot can be obtained, and therefore three-dimensional information such as the pose and the form of the measured workpiece is obtained.
However, when the laser displacement meters are combined into an array for use, the relative inclination angle, the position and the posture of the array are unknown quantities, and the parameters are system parameters of the laser displacement meter array. If the system parameters are not calibrated, the data obtained by the laser displacement meters do not have a uniform reference and coordinate system, and the measurement results are difficult to be effectively utilized. Therefore, it is necessary to calibrate the system parameters of the laser displacement meter array, and the measurement data is effectively utilized by calibrating the parameters and combining the measurement data.
The currently commonly used method for acquiring the array system parameters of the laser displacement meter is an external constraint method, namely, the laser displacement meter is fixed by processing a fixing device of the laser displacement meter, and the system parameters can also be obtained by the design parameters of the fixing device. Ideally, the position of each laser displacement meter is determined by a preset fixing device, but in practice, machining errors, assembly errors, manufacturing errors including the laser displacement meters and the like influence system structural parameters of the laser displacement meter array. At the moment, if calculation is carried out according to the ideal arrangement mode of the laser displacement meter array, the measured data will be distorted, and therefore misjudgment on the pose and the form of the measured workpiece is caused. Meanwhile, the parameters obtained by the method are only design parameters, and the multipoint laser displacement meter array system cannot be adjusted according to the parameters, so that the use of the laser displacement meter array is influenced.
Disclosure of Invention
The invention provides a method for calibrating laser displacement meter array system parameters based on a horizontal displacement table, which is used for obtaining laser displacement meter array system parameters with practical physical significance.
In order to achieve the above purpose, the method for calibrating the parameters of the laser displacement meter array system based on the horizontal displacement table comprises the following steps:
step 1: fixing a flat plate with mark points on a moving plate of a horizontal displacement table, and fixing a laser displacement meter array on a clamping device;
step 2: adjusting the relative position between the flat plate with the mark points and the horizontal displacement table, and adjusting the relative position between the horizontal displacement table and the laser displacement meter array to ensure that the flat plate with the mark points is vertical to the moving direction of the horizontal displacement table;
and step 3: driving the horizontal displacement platform to drive the flat plate with the mark points to move, recording the moving distance of the horizontal displacement platform and the reading of the laser displacement meter array once the flat plate moves, and shooting the image of the flat plate with the mark points;
and 4, step 4: extracting the image coordinates of the mark points and the image coordinates of the laser light spots in the flat images of the mark points shot in the step 3;
and 5: obtaining a parallelism parameter and a coplanarity parameter of the laser displacement meter array through the moving distance of the horizontal displacement table and the reading of the laser displacement meter array;
step 6: and obtaining the relative position parameters of the laser displacement meter array through the shot flat image with the mark points and the physical coordinates of the mark points.
Further, in step 1, the distribution range of the marked points of the flat plate with the marked points covers the whole flat plate area.
Furthermore, in step 2, the position of the horizontal displacement table is such that the light spot of the laser displacement meter array always hits on the flat plate with the mark point, and the light spot does not exceed the range of the flat plate in the moving process of the flat plate with the mark point.
Further, in step 2, the mark points are printed on the flat plate.
Further, in step 3, the moving range of the horizontal displacement table is within the measuring range of the laser displacement meter, data recording is performed after each movement is completed, and the shot flat plate image of the mark point comprises all the characteristic points and the laser light points.
Further, in step 4, the serial numbers of the same mark points extracted from the flat plate image of each mark point are consistent and correspond to the serial numbers of the physical coordinates, and the serial numbers of the same laser spot extracted from each image are also consistent.
Further, in step 5, the parallelism parameter and the coplanarity parameter are obtained by performing linear fitting on the moving distance of the horizontal displacement table and the reading of the laser displacement meter, and the expression is as follows:
Figure BDA0002917626440000031
wherein p is i ,d i I =1, 2.. N, n is the number of laser displacement meters in the laser displacement meter array, and k is the parallelism parameter and the coplanarity parameter of the ith laser displacement meter in the laser displacement meter array respectively i ,b i The slope and intercept of the line fitted by the reading of the ith laser displacement meter and the moving distance of the horizontal displacement table are respectively.
Further, step 6 comprises the following steps:
s6.1, obtaining a projection homography matrix H of the image according to the extracted image coordinates of the mark points and the physical coordinates of the mark points;
s6.2, obtaining the physical coordinates of the laser spot through the homography matrix H obtained in the S6.1 and the image coordinates of the laser spot;
and S6.3, reversely deducing the coordinates of the laser displacement meters according to the physical coordinates of the laser spots at all the positions, and selecting the same origin for representing the coordinates of all the laser displacement meters, namely the relative position parameters of the laser displacement meter array.
Compared with the prior art, the invention has at least the following beneficial technical effects:
and obtaining laser displacement meter array system parameters with practical physical significance, including a parallelism parameter, a coplanarity parameter and a relative position parameter. The parallelism parameter is the ratio of the measured distance to the theoretical distance of the laser, and the physical meaning is the cosine value of the included angle between the light ray of each laser and the displacement direction of the displacement table. The coplanarity parameter is the average difference between the measured distance and the theoretical distance of the laser, and the physical meaning is the vertical distance between each laser and the laser emitting plane. The relative position parameter is a two-dimensional position relation among the lasers, and the physical meaning of the relative position parameter is a two-dimensional coordinate of the light point position of the lasers on a laser emitting plane.
By the three sets of parameters, the deviation of the relative position and the ideal position of each displacement meter of the laser displacement meter array can be checked, and therefore each laser displacement meter of the array can be adjusted. Meanwhile, the three-dimensional coordinates of the laser light spot can be obtained through conversion according to the obtained system parameters, and the three-dimensional characteristics of the workpiece to be detected can be restored conveniently. Meanwhile, the method is simple and convenient to operate, visual in process and convenient to use practically.
Drawings
FIG. 1 is a schematic diagram of the distribution of the flat plate markers used in the experiment;
FIG. 2 is a schematic diagram of the experimental facility after adjustment;
fig. 3 is an image with a marking point and a laser spot taken by an imaging device in an experiment.
In the drawings: 1 is a first laser spot, 2 is a second laser spot, and 3 is a third laser spot; 4 is a flat plate with a mark point, 5 is a horizontal displacement table, and 6 is a laser displacement meter array.
Detailed Description
In order to make the objects and technical solutions of the present invention clearer and easier to understand. The present invention will be described in further detail with reference to the following drawings and examples, wherein the specific examples are provided for illustrative purposes only and are not intended to limit the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to implicitly indicate the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified. In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1, the method for calibrating the parameters of the laser displacement meter array system based on the horizontal displacement table comprises the following steps:
step 1: the flat plate 4 with the mark points is fixed on a moving plate 7 of a horizontal displacement table, and the laser displacement meter array 6 is fixed on a clamping device.
Wherein, the flat plate 4 with the mark points needs to satisfy the following requirements: the physical coordinates of the marking points are known, and the distribution range of the marking points covers the whole flat plate area as much as possible, so that the calibration precision is improved.
The mark points can be directly processed on the flat plate, or can be printed on paper and then pasted on the flat plate.
As shown in fig. 1, in this embodiment, checkerboard corner points with a size of 31 × 24 are used as the mark points, and the corner point spacing is 5mm. The requirement that the real coordinates of all the mark points are known can be met, the angular points of the checkerboard are easy to identify and position, and meanwhile, in order to guarantee replaceability, the checkerboard image is printed on white paper and then pasted on a flat plate, so that the flat plate 4 with the mark points is obtained. After the laser displacement meter array is pasted, the flat plate 4 with the mark points is fixed on a movable plate 7 of a horizontal displacement table, and the laser displacement meter array 6 is fixed on a shock insulation platform after being fixed on a clamping device, so that the laser displacement meter is prevented from generating relative displacement due to vibration.
The laser displacement meter array 6 is composed of a plurality of laser displacement meters which are arranged in an array manner, and the emergent rays of all the laser displacement meters are basically parallel.
And 2, step: the relative position between the flat plate 4 with the mark points and the horizontal displacement table is adjusted, and then the relative position between the horizontal displacement table and the laser displacement meter array 6 is adjusted.
The plate 4 with the marked points should be adjusted to a position perpendicular to the moving direction of the horizontal displacement table.
The horizontal displacement table is positioned so that the light spot of the laser displacement meter array 6 always hits on the flat plate 4 with the mark point, and the laser light spot does not exceed the range of the flat plate 4 with the mark point in the moving process of the flat plate.
As shown in fig. 2, in this embodiment, the direction of the flat plate 4 with the mark points is adjusted to be perpendicular to the moving direction of the displacement table, and then the position of the flat plate 4 with the mark points is fixed so that the relative displacement does not occur during the movement. And then adjusting the position of the horizontal displacement table until the light of the laser displacement meter array is vertical to the flat plate 4 with the mark points, so that the light spots of the displacement meter array are always on the flat plate in the moving process of the displacement table and do not exceed the range of the mark points.
And step 3: and driving the horizontal displacement table to move horizontally, recording the moving distance of the horizontal displacement table and the reading of the distance between the laser spot and the laser emergent point measured by the laser displacement meter array every time the horizontal displacement table moves, and shooting the image of the flat plate 4 with the mark points by using an imaging element.
In the step 3, the moving range of the horizontal displacement table is within the measuring range of the laser displacement meter, data recording is performed after each movement is completed, and the flat image shot by the imaging element completely comprises each mark point and the laser spot emitted by the laser displacement meter array 6.
In this example, according to the measuring range of the laser displacement meter array 6 of 150mm-250mm, from the distance of the flat plate 4 with the mark point from the laser displacement meter array 6 of 152mm, a recording position is selected every 10mm, after the horizontal displacement table is moved to the corresponding position, the reading of the laser displacement meter array is recorded, and a camera is used for taking a picture from the side, so that the mark point on the flat plate 4 with the mark point and the laser spot are both in the center of the shot image. The experimental recorded image is shown in fig. 3.
And 4, step 4: and extracting the image coordinates of the mark point and the image coordinates of the laser spot in the shot image.
In the step 4, the number sequence of the same mark point image coordinate extracted from each image should be kept consistent and correspond to the number sequence of the mark point physical coordinate, so as to ensure that the mark point coordinate mapping relationship is correct. The number sequence of the same laser spot image coordinate extracted from each image is kept consistent so as to ensure that the laser spots of different laser displacement meters are not mixed up.
In this example, the method for extracting the coordinates of the mark point image is a general checkerboard corner extraction method, and the arrangement sequence of the method is determined as follows: the upper left corner is the starting point, and then the corners are arranged from top to bottom in a column to the lower right corner. The arrangement sequence of the physical coordinates of the marking points is consistent with the image coordinates. The method for extracting the coordinates of the laser spot images is a gray scale gravity center method, and the arrangement sequence of the coordinates of the laser spot images is as follows: numbering in sequence in the counterclockwise direction with the starting point directly above as shown in fig. 3: the first laser spot 1, the second laser spot 2 and the third laser spot 3 are numbered in an increasing order in the counter clockwise direction.
And 5: and obtaining the parallelism parameter and the coplanarity parameter of the laser displacement meter array through the moving distance of the horizontal displacement table and the distance reading of the laser displacement meter array.
In the step 5, the parallelism parameter and the coplanarity parameter are obtained by performing linear fitting on the moving distance of the horizontal displacement table and the distance reading of the laser displacement meter, and the expression is as follows:
Figure BDA0002917626440000071
wherein p is i ,d i I =1, 2.. N, n is the number of laser displacement meters in the laser displacement meter array, and k is the parallelism parameter and the coplanarity parameter of the ith laser displacement meter in the laser displacement meter array respectively i ,b i Respectively the slope and intercept of a straight line fitted by the distance reading of the ith laser displacement meter and the moving distance value of the horizontal displacement table.
In this example, the obtained readings of the laser displacement meters and the moving distance of the horizontal displacement table are used as a scatter diagram, straight line fitting is performed by a least square method to obtain parameters of each fitted straight line, and the parameters of parallelism and coplanarity of the laser displacement meter array obtained by substituting the formula are as follows:
Figure BDA0002917626440000072
step 6: and obtaining the relative position parameters of the laser displacement meter array through the extracted image coordinates of the mark points, the image coordinates of the laser light spots and the physical coordinates of the mark points.
The method for calculating the relative position parameter in step 6 is as follows:
firstly, obtaining a projection homography matrix H of the image according to the extracted image coordinates of the mark points and the physical coordinates of the mark points;
secondly, obtaining a laser spot physical coordinate through the homography matrix H and the laser spot image coordinate;
and finally, reversely deducing the coordinates of the laser displacement meter according to the physical quantity coordinates of the laser spots at each position, and selecting the same origin for representing each coordinate to obtain the relative position parameters of the laser displacement meter array.
In this example, since the image coordinates and the corresponding physical coordinates have a perspective transformation relationship, the two coordinates can be converted by a homography matrix. Therefore, firstly, according to the perspective transformation relation between the extracted image coordinates of the corresponding mark points and the physical coordinates of the mark points, the homography matrix between the plane of the camera and the plane of the flat plate at each position of the horizontal displacement platform is obtained, and the horizontal displacement platform passes through 10 positions in total, so that 10 different homography matrixes exist. And multiplying the homography matrix of each measuring position by the image coordinates of the laser spot to obtain the physical coordinates of the laser spot at 10 positions. And finally, respectively drawing the physical coordinates of the laser spots in the same coordinate system, fitting the laser spots belonging to the same laser into a straight line, and reversely pushing out the positions of the laser emergent points on the fitted straight line to obtain the relative position parameters of the laser displacement meter array as follows:
Figure BDA0002917626440000081
wherein (x) i ,y i ) N is the x-direction and y-direction coordinates of the ith laser displacement meter.
The laser displacement meter array parameters obtained by the method can acquire the specific arrangement information of the laser displacement meter array, so that the relative position, the pitch angle and the like of the laser displacement meter array can be adjusted. If the parallelism parameters are all close to 1 in this example, the light rays of the three lasers of the laser displacement meter array are approximately emitted in parallel, but the coplanarity parameters have larger difference, and the front and back positions of the laser displacement meter can be adjusted to reduce the coplanarity error. Meanwhile, the three-dimensional coordinates of the laser spot can be obtained according to the parameters, and a more accurate result is obtained.
The method can calibrate the system parameters of the laser displacement meter array in the modes of parallelism parameters, coplanarity parameters and relative position parameters. The method mainly comprises the following steps: fixing a flat plate with a mark point on a horizontal displacement table, and fixing a laser displacement meter array on a clamping device; adjusting the relative position relation of the measuring equipment; when the horizontal displacement table moves for a certain distance, recording corresponding reading and a flat plate image with a mark point; solving a parallelism parameter and a coplanarity parameter through the reading and the actual distance; the relative position parameters are obtained by image processing. The parameters obtained by the method can be used for adjusting array arrangement, and simultaneously, the three-dimensional coordinates of the laser light spots can be solved, so that the subsequent measurement is more accurate.
The above-mentioned contents are only for illustrating the technical idea of the present invention, and the protection scope of the present invention is not limited thereby, and any modification made on the basis of the technical idea of the present invention falls within the protection scope of the claims of the present invention.

Claims (6)

1. The method for calibrating the parameters of the laser displacement meter array system based on the horizontal displacement table is characterized by comprising the following steps of:
step 1: fixing a flat plate (4) with a mark point on a moving plate (7) of a horizontal displacement table, and fixing a laser displacement meter array (6) on a clamping device;
step 2: adjusting the relative position between the flat plate (4) with the mark points and the horizontal displacement table, and adjusting the relative position between the horizontal displacement table and the laser displacement meter array (6) to ensure that the flat plate (4) with the mark points is vertical to the moving direction of the horizontal displacement table;
and step 3: driving the horizontal displacement platform to drive the flat plate (4) with the mark points to move, recording the moving distance of the horizontal displacement platform and the reading of the laser displacement meter array (6) once the horizontal displacement platform moves, and shooting the image of the flat plate (4) with the mark points;
and 4, step 4: extracting the image coordinates of the mark points and the image coordinates of the laser light spots in the flat plate (4) image of the mark points shot in the step (3);
and 5: obtaining a parallelism parameter and a coplanarity parameter of the laser displacement meter array (6) according to the moving distance of the horizontal displacement table and the reading of the laser displacement meter array;
and 6: obtaining relative position parameters of the laser displacement meter array through shot flat plate (4) images with the mark points and the physical coordinates of the mark points;
in the step 5, the parallelism parameter and the coplanarity parameter are obtained by performing linear fitting on the moving distance of the horizontal displacement table and the reading of the laser displacement meter, and the expression is as follows:
Figure FDA0003950703450000011
wherein p is i ,d i I =1,2, \ 8230, n, n is the number of the laser displacement meters in the laser displacement meter array, k is the depth of parallelism parameter and the coplanarity parameter of the ith laser displacement meter in the laser displacement meter array respectively i ,b i The slope and intercept of a straight line fitted by the reading of the ith laser displacement meter and the moving distance of the horizontal displacement table are respectively;
the step 6 comprises the following steps:
s6.1, obtaining a projection homography matrix H of the image according to the extracted image coordinates of the mark points and the physical coordinates of the mark points;
s6.2, obtaining the physical coordinates of the laser spot through the homography matrix H obtained in the S6.1 and the image coordinates of the laser spot;
and S6.3, reversely deducing the coordinates of the laser displacement meters according to the physical coordinates of the laser spots at all the positions, and selecting the same origin for representing the coordinates of all the laser displacement meters, namely the relative position parameters of the laser displacement meter array.
2. The method for calibrating the parameters of the laser displacement meter array system based on the horizontal displacement table as claimed in claim 1, wherein in the step 1, the distribution range of the marking points of the flat plate (4) with the marking points covers the whole flat plate area.
3. The method for calibrating the system parameters of the laser displacement meter array based on the horizontal displacement table as claimed in claim 1, wherein in the step 2, the horizontal displacement table is positioned so that the light spot of the laser displacement meter array always impinges on the flat plate (4) with the marked point, and the light spot does not exceed the range of the flat plate (4) with the marked point during the movement of the flat plate.
4. The method for calibrating the parameters of the laser displacement meter array system based on the horizontal displacement table as claimed in claim 1, wherein in the step 2, the mark points are printed on a flat plate.
5. The method for calibrating the parameters of the laser displacement meter array system based on the horizontal displacement table as claimed in claim 1, wherein in the step 3, the moving range of the horizontal displacement table is within the measuring range of the laser displacement meter, data recording is performed after each movement is completed, and the shot flat plate (4) image of the mark point comprises all the characteristic points and the laser light point.
6. The method for calibrating the array system parameters of the laser displacement meter based on the horizontal displacement table as claimed in claim 1, wherein in the step 4, the serial numbers of the same marking points extracted from the flat plate (4) image of each marking point are consistent and correspond to the serial numbers of the physical coordinates, and the serial numbers of the same laser spots extracted from each image are also consistent.
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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011220794A (en) * 2010-04-08 2011-11-04 Seiko Epson Corp Calibration jig and imaging apparatus calibration method using the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003062744A1 (en) * 2002-01-16 2003-07-31 Faro Technologies, Inc. Laser-based coordinate measuring device and laser-based method for measuring coordinates
CN1260544C (en) * 2004-07-14 2006-06-21 天津大学 Compatible and accurate calibration method for double eye line structure photo-sensor and implementing apparatus
JP2009068995A (en) * 2007-09-13 2009-04-02 Panasonic Corp Microarray device
CN101814185B (en) * 2010-04-14 2012-10-10 天津大学 Line structured light vision sensor calibration method for micro-size measurement
CN105091782A (en) * 2015-05-29 2015-11-25 南京邮电大学 Multilane laser light plane calibration method based on binocular vision
CN106949845B (en) * 2017-01-19 2019-02-26 南京航空航天大学 Two dimension laser galvanometer scanning system and scaling method based on binocular stereo vision
CN109443209B (en) * 2018-12-04 2019-12-31 四川大学 Line structured light system calibration method based on homography matrix

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011220794A (en) * 2010-04-08 2011-11-04 Seiko Epson Corp Calibration jig and imaging apparatus calibration method using the same

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
基于平面标靶的线结构光参数一体标定算法;魏一等;《光电子.激光》;20130815;第24卷(第08期);第1557-1562页 *

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