CN112906203B - Simulation design method for main reflector - Google Patents

Simulation design method for main reflector Download PDF

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CN112906203B
CN112906203B CN202110124282.6A CN202110124282A CN112906203B CN 112906203 B CN112906203 B CN 112906203B CN 202110124282 A CN202110124282 A CN 202110124282A CN 112906203 B CN112906203 B CN 112906203B
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gap
value
gap value
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CN112906203A (en
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俞俊生
姚远
于海洋
张家旺
冯日金
陈晓东
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Beijing University of Posts and Telecommunications
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Beijing University of Posts and Telecommunications
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Abstract

The embodiment of the invention provides a main reflector simulation design method which is applied to the technical field of antennas and can search a corresponding assembly error according to a preset gap value of a main reflector; establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of the gap between the partitioned mirrors in the main reflector; simulating the simulation model to obtain a dead zone characteristic parameter of the simulation model; resetting a preset gap value according to the characteristic parameters of the dead zone for iteration; and selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as the design gap value. By the method provided by the embodiment of the invention, the influence of the assembly error on the performance of the main reflector can be considered in the simulation process, and the maximum gap value of the preset gap values meeting the design requirements is obtained as the design gap value, so that the main reflector can be partitioned according to the design gap value, and the main reflector after assembly meets the design requirements.

Description

Simulation design method for main reflector
Technical Field
The invention relates to the technical field of antennas, in particular to a main reflector simulation design method.
Background
The compact range antenna measuring system can convert spherical waves emitted by a feed source into pseudo plane waves in a compact space, and test the measured antenna. Currently, with the development of terahertz technology, the electromagnetic characteristics of a high-frequency and large-size antenna force the main reflector in a compact field system to develop towards a large aperture.
Since the large-diameter mirror is often difficult to process, the main mirror is generally divided into a plurality of segmented mirrors for processing and assembling. However, in the process of machining and assembling, due to factors such as machining process, the value of the gap of the assembled main reflector is often different from the value of the designed gap, so that the assembled main reflector cannot meet the design requirement.
Disclosure of Invention
The embodiment of the invention aims to provide a main reflector simulation design method which is used for solving the problem that the assembled main reflector cannot meet the design requirement due to the change of a gap value in the processing and assembling processes. The specific technical scheme is as follows:
in a first aspect of the present invention, there is provided a method for designing a main mirror in a simulation manner, the method including:
searching a corresponding assembly error according to a preset gap value of the main reflector;
establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of the gap between the partitioned mirrors in the main reflector;
simulating the simulation model to obtain a dead zone characteristic parameter of the simulation model;
resetting the preset gap value according to the characteristic parameters of the dead zone, returning to the step of searching the corresponding assembly error according to the preset gap value of the main reflector, and continuing to execute until the iteration stop condition is met;
and selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the characteristic parameters of the quiet zone meet the design requirements in the iteration process as the design gap value.
Optionally, resetting the preset gap value according to the quiet zone characteristic parameter includes:
judging whether the characteristic parameters of the dead zone meet design requirements or not;
if so, increasing the preset gap value; if not, reducing the preset gap value.
Optionally, the method for obtaining the assembly error in advance includes:
counting actual gap values of the assembled main reflectors according to the target gap value, wherein the gap values of the assembled main reflectors in the design process are all the target gap values;
respectively calculating the difference between each actual gap value and the target gap value to obtain a plurality of gap difference values;
counting the number of the gap differences with different values in the plurality of gap differences;
calculating the probability of the gap difference values with different values according to the number of the gap difference values with different values and the total number of the gap difference values;
and carrying out weighted summation by using the probability when the gap difference value is different values and the different values to obtain the assembly error corresponding to the target gap value.
Optionally, searching for a corresponding assembly error according to a preset gap value of the main reflector includes:
searching for a corresponding assembly error according to a preset gap value and a preset gap shape of the main reflector;
the method comprises the following steps of taking the sum of a preset gap value and an assembly error as the gap value of gaps among all partitioned mirrors in a main reflector, and establishing a simulation model of the main reflector, wherein the simulation model comprises the following steps:
establishing a simulation model of the main reflector according to a preset gap shape by taking the sum of a preset gap value and an assembly error as a gap value of a gap between each partitioned mirror in the main reflector;
selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the characteristic parameters of the quiet zone meet the design requirements in the iteration process as the design gap value, wherein the selecting step comprises the following steps:
selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the characteristic parameters of the quiet zone meet the design requirements in the iteration process as the reference gap value of the current gap shape;
resetting the preset gap shape, returning to the step of searching for the corresponding assembly error according to the preset gap value and the preset gap shape of the main reflector, and continuing to execute the step until a reference gap value of each preset gap shape is obtained;
and selecting the maximum value of the reference gap values of the preset gap shapes as a design gap value, and selecting the gap shape corresponding to the design gap value as the design gap shape.
Optionally, the simulating the simulation model to obtain the dead zone characteristic parameters of the simulation model includes:
according to design requirements, the dead zone characteristics of the simulation model are calculated by a simulation program, and dead zone characteristic parameters of the simulation model are obtained, wherein the dead zone characteristics comprise amplitude jitter, phase jitter and cross polarization isolation in the dead zone.
In a second aspect of an embodiment of the present invention, there is provided a main mirror simulation design apparatus, the apparatus comprising:
the assembling error searching module is used for searching a corresponding assembling error according to a preset gap value of the main reflector;
the model establishing module is used for establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembling error as the gap value of the gap between the partitioned mirrors in the main reflector;
the model simulation module is used for simulating the simulation model to obtain the dead zone characteristic parameters of the simulation model;
the loop iteration module is used for resetting a preset gap value according to the characteristic parameters of the quiet zone and continuously executing the preset gap value through the assembly error searching module until the iteration stop condition is met;
and the design gap value selection module is used for selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as the design gap value.
Optionally, the loop iteration module is specifically configured to:
judging whether the characteristic parameters of the dead zone meet the design requirements or not;
if so, increasing the preset gap value; if not, reducing the preset gap value.
Optionally, the apparatus further includes an assembly error obtaining module;
the assembling error acquiring module is used for counting actual gap values of the assembled main reflectors according to the target gap value, wherein the gap values of the assembled main reflectors in the design process are all the target gap values; respectively calculating the difference between each actual gap value and the target gap value to obtain a plurality of gap difference values; counting the number of the gap differences which are different values in the plurality of gap differences; calculating the probability of the gap difference values with different values according to the number of the gap difference values with different values and the total number of the gap difference values; and carrying out weighted summation by using the probability when the gap difference value is different values and the different values to obtain the assembly error corresponding to the target gap value.
Optionally, the assembly error searching module includes:
the gap shape searching submodule is used for searching a corresponding assembling error according to a preset gap value and a preset gap shape of the main reflector;
a model building module comprising:
the preset gap shape simulation submodule is used for establishing a simulation model of the main reflector according to the preset gap shape by taking the sum of a preset gap value and an assembly error as the gap value of gaps among the blocked mirrors in the main reflector;
the design gap value selection module comprises:
the reference gap value selection submodule is used for selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as the reference gap value of the current gap shape;
the gap shape setting submodule is used for resetting the preset gap shape, and the searching submodule continues to execute the preset gap shape until a reference gap value of each preset gap shape is obtained;
and the target gap value selection submodule is used for selecting the maximum value in the reference gap values of the preset gap values as a design gap value, and the gap shape corresponding to the design gap value is used as the design gap shape.
Optionally, the model simulation module includes:
and the quiet zone characteristic calculation submodule is used for calculating the quiet zone characteristics of the simulation model by utilizing a simulation program according to the design requirements to obtain the quiet zone characteristic parameters of the simulation model, wherein the quiet zone characteristics comprise amplitude jitter, phase jitter and cross polarization isolation in the quiet zone.
In another aspect of the present invention, there is also provided an electronic device, including a processor, a communication interface, a memory and a communication bus, where the processor, the communication interface, and the memory complete communication with each other through the communication bus;
a memory for storing a computer program;
and the processor is used for realizing the simulation design method of any main reflector when executing the program stored in the memory.
In yet another aspect of the present invention, there is further provided a computer readable storage medium having a computer program stored therein, the computer program, when executed by a processor, implementing any one of the above-described primary mirror simulation design methods.
In yet another aspect of an implementation of the present invention, there is also provided a computer program product containing instructions which, when run on a computer, cause the computer to perform any of the above described primary mirror simulation design methods.
The embodiment of the invention has the following beneficial effects:
according to the simulation design method of the main reflector, provided by the embodiment of the invention, the corresponding assembly error can be searched according to the preset gap value of the main reflector; establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of gaps among the partitioned mirrors in the main reflector; simulating the simulation model to obtain a dead zone characteristic parameter of the simulation model; resetting the preset gap value according to the characteristic parameters of the dead zone, returning to the step of searching the corresponding assembly error according to the preset gap value of the main reflector, and continuing to execute until the iteration stop condition is met; and selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the characteristic parameters of the quiet zone meet the design requirements in the iteration process as the design gap value. By the method provided by the embodiment of the invention, the influence of the assembly error on the performance of the main reflector can be considered in the simulation process, and the maximum gap value of the preset gap value meeting the design requirement is obtained as the design gap value.
Of course, it is not necessary for any product or method to achieve all of the above-described advantages at the same time for practicing the invention.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other embodiments can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a compact range antenna measurement system according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart illustrating a simulation design method for a main mirror according to an embodiment of the present invention;
FIG. 3a is a schematic diagram of a method for blocking a main mirror according to an embodiment of the present invention;
FIG. 3b is another schematic diagram of a primary mirror blocking method according to an embodiment of the present invention;
FIG. 4 is a schematic flowchart of a method for obtaining assembly errors according to an embodiment of the present invention;
FIG. 5 is a schematic view of a gap between segments of a primary mirror according to an embodiment of the present invention;
FIG. 6 is a schematic flow chart illustrating a simulation design method for a main mirror according to an embodiment of the present invention;
FIG. 7 is a schematic structural diagram of a simulation design apparatus for a main mirror according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by one skilled in the art based on the embodiments of the present invention, are within the scope of the present invention.
In a first aspect of the present invention, there is provided a simulation design of a main mirror, the method including:
searching a corresponding assembly error according to a preset gap value of the main reflector;
establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of gaps among the partitioned mirrors in the main reflector;
simulating the simulation model to obtain a dead zone characteristic parameter of the simulation model;
resetting the preset gap value according to the characteristic parameters of the dead zone, returning to the step of searching the corresponding assembly error according to the preset gap value of the main reflector, and continuing to execute until the iteration stop condition is met;
and selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as the design gap value.
Therefore, by the main reflector simulation design method provided by the embodiment of the invention, the influence of the assembly error on the performance of the main reflector can be considered in the simulation process, and the maximum gap value of the preset gap values meeting the design requirements is obtained as the design gap value, so that the main reflector can be partitioned according to the design gap value, and the main reflector after being assembled can meet the design requirements.
The main reflector is a main reflector in a compact range antenna measuring system, and the compact range antenna measuring system is used for measuring an antenna to be measured and judging whether the antenna to be measured meets design requirements or not. Referring to fig. 1, fig. 1 is a schematic structural diagram of a compact range antenna measurement system according to an embodiment of the present invention, when an electromagnetic signal is generated by a feed source, the electromagnetic signal passes through a secondary reflector 1 and a secondary reflector 2 in sequence, the electromagnetic wave is reflected to a main reflector, and is reflected by the main reflector, where a dead zone is a region at a certain distance from the main reflector. Whether the system requirement is met can be judged by measuring the characteristic parameters of the dead zone such as amplitude jitter and the like in the dead zone.
Referring to fig. 2, fig. 2 is a schematic flow chart of a simulation design method of a main mirror according to an embodiment of the present invention, including:
and S21, searching a corresponding assembly error according to the preset gap value of the main reflector.
The preset gap value may be a gap value estimated according to the design requirement of the current main mirror. For example, when the mirror is a 3 × 3m mirror of the main mirror, the preset slit value may be estimated to be 5mm by experience. The assembly error is an error caused by problems such as an assembly process in the process of machining and assembly.
The corresponding assembly error can be searched according to the preset gap value of the main reflector, an error table of the corresponding assembly error when the design gap value of the main reflector is different in value can be established in advance, and when the corresponding assembly error needs to be searched according to the preset gap value of the main reflector, the corresponding assembly error can be searched according to the established error table. For example, the actual gap values and the design gap values of the plurality of main reflectors are counted in advance, for any design gap value, the actual gap value measured by the main reflector with the design gap value in the plurality of main reflectors is selected, then the difference between the selected actual gap value and the design gap value is calculated, and finally the assembling error is obtained by averaging or performing weighted summation on the obtained difference.
The main reflector simulation design method provided by the embodiment of the invention is applied to an intelligent terminal, a simulation model of the main reflector can be created through the intelligent terminal, and the simulation of the model is carried out by utilizing a simulation tool, and specifically, the intelligent terminal can be a computer or a server and the like.
And S22, establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of the gap between the partitioned mirrors in the main reflector.
The simulation model of the main reflector in the invention can be a model of the whole compact range antenna measuring system, and can also be a model which only comprises the main reflector and the dead zone and carries out the measurement of the characteristic parameters of the dead zone by setting the input of the main reflector.
And establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value between the blocked mirrors in the main reflector, and dividing the main reflector into a preset number of blocked mirrors with the same or different sizes by taking the sum of the preset gap value and the assembly error as the gap value between the blocked mirrors in the main reflector so as to establish the model. For example, referring to fig. 3a, fig. 3a is a schematic diagram of a main mirror blocking method provided in an embodiment of the present invention, when the main mirror is a rectangle of 3 × 3m, the main mirror is divided into 16 rectangular blocking mirrors with the same size, and a plurality of corresponding slits are obtained, referring to fig. 3b, fig. 3b is another schematic diagram of the main mirror blocking method provided in the embodiment of the present invention, and when the main mirror is divided into 16 blocking mirrors, 6 corresponding slits can be obtained.
In the actual use process, a General Reflector Antenna Package (GRASP) can be used, the main mirror is set to be 16 block mirrors by sequentially setting a Geometrical Objects- > scanner- > Reflector with a circuits- > induced by fine mirrors, and the gap width between the block mirrors can be set by changing the size of each block mirror Rim.
And S23, simulating the simulation model to obtain the dead zone characteristic parameters of the simulation model.
The simulation model is simulated according to the pre-loaded simulation software, for example, the simulation model is simulated by the GRASP to obtain the dead zone characteristic parameters of the simulation model. The characteristic parameters of the quiet zone may include values of amplitude jitter, phase jitter, cross polarization isolation, and the like in the quiet zone.
Optionally, simulating the simulation model to obtain the dead zone characteristic parameters of the simulation model, including: according to design requirements, the dead zone characteristics of the simulation model are calculated by a simulation program, and dead zone characteristic parameters of the simulation model are obtained, wherein the dead zone characteristics comprise amplitude jitter, phase jitter and cross polarization isolation in the dead zone.
And S24, resetting the preset gap value according to the characteristic parameters of the dead zone, returning to the step of searching the corresponding assembly error according to the preset gap value of the main reflector, and continuing to execute until the iteration stop condition is met.
Optionally, resetting the preset gap value according to the dead zone characteristic parameter includes: judging whether the characteristic parameters of the dead zone meet the design requirements or not; if so, increasing the preset gap value; if not, reducing the preset gap value. The design requirements may include specific criteria for amplitude jitter, phase jitter, cross-polarization isolation, etc. within the dead band. For example, design requirements: amplitude jitter in a dead zone is less than 1dB, phase jitter is less than 10 degrees, and cross polarization isolation is greater than 40dB. Specifically, the preset gap value is reset according to the quiet zone characteristic parameters, the step length of each iteration can be set, when the quiet zone characteristic parameters obtained through simulation meet the design requirements, the step length is increased on the basis of the design gap value to obtain the reset gap value, and when the quiet zone characteristic parameters obtained through simulation do not meet the design requirements, the step length is subtracted on the basis of the design gap value to obtain the reset gap value. And the setting can be carried out by a 'decimal regression two' principle, when the characteristic parameters of the quiet zone obtained by simulation meet the design requirements, the original design gap value is expanded by two times to obtain a reset gap value, and when the characteristic parameters of the quiet zone obtained by simulation do not meet the design requirements, the original design gap value is reduced by ten times to obtain the reset gap value.
The iteration stop condition may include that the iteration number reaches a preset iteration stop number, or when a preset gap value is set by a decimal-backward principle, and a difference value between a maximum preset gap value meeting the design requirement and a minimum preset gap value not meeting the design requirement is smaller than a preset threshold value, the iteration stop condition is stopped.
In the actual use process, the preset gap value can be reset by changing the size of each blocking mirror Rim (edge) by using the GRASP and setting the gap width between the blocking mirrors.
And S25, selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as a target gap value.
In the iteration process, the maximum value of a plurality of preset gap values corresponding to a plurality of iterations when the characteristic parameter of the quiet zone meets the design requirement is selected as a target gap value, whether the characteristic parameter of the quiet zone obtained in the iteration meets the design requirement or not and the preset gap value corresponding to the iteration are recorded after each iteration, and the maximum value of the plurality of preset gap values corresponding to the plurality of iterations when the characteristic parameter of the quiet zone meets the design requirement is selected as the design gap value after the iteration stop condition is met. After the design gap value is obtained, the main reflecting mirror can be designed according to the design gap value, and the target gap value is taken as the gap value between every two block mirrors. Wherein the maximum value can be selected to facilitate processing and assembly during assembly.
Therefore, according to the main reflector simulation design method provided by the embodiment of the invention, the influence of the assembly error on the performance of the main reflector can be considered in the simulation process, and the maximum gap value of the preset gap values meeting the design requirements is obtained as the design gap value, so that the main reflector can be partitioned according to the design gap value, and the main reflector after assembly can be ensured to meet the design requirements.
Optionally, in an actual use process, the monte carlo method may be used to obtain the assembly error by calculating a weighted average. Referring to fig. 4, fig. 4 is a schematic flowchart of a method for obtaining an assembly error according to an embodiment of the present invention, including:
step S41, for the target gap value, the actual gap values of the plurality of assembled main mirrors are counted.
The method comprises the steps that the target gap value is obtained through calculation, the actual gap value and the design gap value obtained through measurement of a plurality of main reflectors can be calculated by taking the target gap value as the design gap value, and the actual gap value of the main reflector with the target gap value is selected from the plurality of main reflectors according to any design gap value. The actual gaps between the primary mirror segments may not be of regular shape during actual use. For example, referring to FIG. 5, FIG. 5 is a schematic view of a gap between primary mirror segments provided in an embodiment of the present invention, the gap between the primary mirror segments being irregularly shaped. When the gaps among the main reflector blocks are irregular, the actual gap values are obtained, and the actual gap values can be obtained by obtaining the gap values of a plurality of sampling points on the corresponding gaps and calculating the average value. For example, the measured gap values corresponding to 5 sampling points are 5.1mm, 4.8mm, 4.9mm and 5.2mm respectively corresponding to the gap between the block mirrors of a certain assembled main mirror, and the actual gap value is 5.1mm by calculating the average value.
And step S42, respectively calculating the difference between each actual gap value and the target gap value to obtain a plurality of gap difference values.
Calculating the difference between each actual gap value and the target gap value to obtain a plurality of gap difference values, for example, for a main reflector with a target gap value of 5mm, obtaining actual gap values of 5.1mm, 4.8mm, 4.9mm, 5.2mm and 5.1mm for six assembled main reflectors respectively, and then calculating to obtain corresponding gap difference values of 0.1mm, -0.2mm, -0.1mm, 0.2mm and 0.1mm respectively.
And S43, counting the number of the gap differences with different values in the plurality of gap differences.
The number of the gap differences among the plurality of gap differences is counted, for example, when the corresponding gap differences are respectively 0.1mm, -0.2mm, -0.1mm, 0.2mm, and 0.1mm, the number of the gap differences is respectively 0.1mm, 0.2mm, -0.1mm, and 0.2mm, and the number of the gap differences is respectively 3, 1, and 1 when the gap differences are respectively 0.1mm, 0.2mm, -0.1mm, and 0.2 mm.
And step S44, calculating the probability of the gap difference values with different values according to the number of the gap difference values with different values and the total number of the gap difference values.
And calculating to obtain the probability when the gap difference values are different values according to the number when the gap difference values are different values and the total number of the gap difference values, and dividing the number when the gap difference values are different values by the total number of the gap difference values to obtain the probability when the gap difference values are different values. For example, if the obtained numbers are 3, 1, and 1, respectively, and the total number is 6, the probabilities of obtaining the gap difference values as different values are 0.5, 0.167, and 0.167, respectively.
And S45, carrying out weighted summation by using the probability when the gap difference value is different values and the different values to obtain the assembly error corresponding to the target gap value.
And performing weighted summation by using the probabilities of the gap differences with different values and the different values, for example, obtaining the probabilities of the gap differences with different values as 0.5, 0.167, and obtaining the gap differences as 0.1mm, 0.2mm, -0.1mm, -0.2mm, respectively, and then performing weighted summation by using the probabilities of the gap differences with different values and the different values, so as to obtain the assembly error corresponding to the target gap value as 0.1 × 0.5+ (-0.2 × 0.167) + (-0.1 × 0.167) + (-0.2 × 0.167) =0.03.
Therefore, by the method for acquiring the random gap value, the assembling error corresponding to the target gap value can be obtained by using the probability when the gap difference value is different values and the method for weighting and summing different values, so that the main reflector can be conveniently simulated according to the assembling error in the simulation process.
Referring to fig. 6, fig. 6 is another schematic flow chart of a simulation design method of a main mirror according to an embodiment of the present invention, including:
and S61, searching a corresponding assembly error according to the preset gap value and the preset gap shape of the main reflector.
The target slit type may be a predetermined plurality of shapes, for example, the target slit shape may be a straight line type, a sine wave type, or the like.
And S62, establishing a simulation model of the main reflector according to a preset gap shape by taking the sum of the preset gap value and the assembly error as the gap value of the gap between the partitioned mirrors in the main reflector.
The simulation model of the main reflector is established according to the preset gap shape, the sum of the preset gap value and the assembly error is the gap width of the gap between the blocked mirrors in the main reflector, and the simulation model of the main reflector is established.
And S23, simulating the simulation model to obtain the dead zone characteristic parameters of the simulation model.
And S24, resetting the preset gap value according to the characteristic parameters of the dead zone, returning to the step of searching for the corresponding assembly error according to the preset gap value and the preset gap shape of the main reflector, and continuing to execute until the iteration stop condition is met.
And S63, selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as the reference gap value of the current gap shape.
And S64, resetting the preset gap shape, returning to the step of searching for the corresponding assembly error according to the preset gap value and the preset gap shape of the main reflector, and continuing to execute until the reference gap value of each preset gap shape is obtained.
And iterating after resetting the shape of the preset gap to obtain a reference gap value corresponding to each preset gap. For example, by a plurality of iterations, the reference slit values corresponding to the shapes of the straight-line type and the sine wave type are 5.1mm and 5.2mm respectively,
step S65, selecting the maximum value of the reference gap values of the preset gap values as a design gap value, and selecting the gap shape corresponding to the design gap value as the design gap shape.
For example, when the reference gap values corresponding to the shapes of the straight-line type and the sinusoidal type are 5.1mm and 5.2mm, respectively, the reference gap value corresponding to the sinusoidal type is selected as the target gap value.
Therefore, by the method provided by the embodiment of the invention, the maximum value of the reference gap values of the preset gap shapes can be selected as the target gap value, and the gap shape corresponding to the target gap value is used as the target gap shape, so that the design of the main reflector can be conveniently carried out according to the target gap value and the target gap shape.
In a second aspect of the implementation of the present invention, there is also provided a main mirror simulation design apparatus, referring to fig. 7, fig. 7 is a schematic structural diagram of the main mirror simulation design apparatus provided in the embodiment of the present invention, the apparatus includes:
an assembly error searching module 701, configured to search for a corresponding assembly error according to a preset gap value of the primary mirror;
a model establishing module 702, configured to establish a simulation model of the main mirror by taking a sum of a preset gap value and an assembly error as a gap value of a gap between each segmented mirror in the main mirror;
the model simulation module 703 is configured to simulate the simulation model to obtain a dead zone characteristic parameter of the simulation model;
a loop iteration module 704, configured to reset a preset gap value according to the quiet zone characteristic parameter, and continue execution through the assembly error lookup module until an iteration stop condition is satisfied;
the design gap value selecting module 705 is configured to select a maximum value of a plurality of preset gap values corresponding to a plurality of iterations where the quiet zone characteristic parameter meets the design requirement in the iteration process as the design gap value.
Optionally, the loop iteration module 704 is specifically configured to:
judging whether the characteristic parameters of the dead zone meet the design requirements or not;
if so, increasing the preset gap value; if not, reducing the preset gap value.
Optionally, the apparatus further includes an assembly error obtaining module;
the assembling error acquiring module is used for counting actual gap values of the assembled main reflectors according to the target gap value, wherein the gap values of the assembled main reflectors in the design process are all the target gap values; respectively calculating the difference between each actual gap value and the target gap value to obtain a plurality of gap difference values; counting the number of the gap differences which are different values in the plurality of gap differences; calculating the probability of the gap difference values with different values according to the number of the gap difference values with different values and the total number of the gap difference values; and carrying out weighted summation by using the probability when the gap difference value is different values and the different values to obtain the assembly error corresponding to the target gap value.
Optionally, the assembly error searching module 701 includes:
the gap shape searching submodule is used for searching a corresponding assembly error according to a preset gap value and a preset gap shape of the main reflector;
a model building module 702, comprising:
the preset gap shape simulation submodule is used for establishing a simulation model of the main reflector according to the preset gap shape by taking the sum of a preset gap value and an assembly error as the gap value of gaps among the blocked mirrors in the main reflector;
the design gap value selecting module 705 includes:
the reference gap value selection submodule is used for selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as the reference gap value of the current gap shape;
the gap shape setting submodule is used for resetting the preset gap shapes, and the gap shape searching submodule continues to execute the preset gap shapes until reference gap values of the preset gap shapes are obtained;
and the target gap value selection submodule is used for selecting the maximum value in the reference gap values of the preset gap values as a design gap value, and the gap shape corresponding to the design gap value is used as the design gap shape.
Optionally, the model simulation module 703 includes:
and the quiet zone characteristic calculation submodule is used for calculating the quiet zone characteristics of the simulation model by utilizing a simulation program according to the design requirements to obtain the quiet zone characteristic parameters of the simulation model, wherein the quiet zone characteristics comprise amplitude jitter, phase jitter and cross polarization isolation in the quiet zone.
Therefore, by the main reflector simulation design device provided by the embodiment of the invention, the influence of the assembly error on the performance of the main reflector can be considered in the simulation process, and the maximum gap value of the preset gap values meeting the design requirements is obtained as the design gap value, so that the main reflector can be partitioned according to the design gap value, and the main reflector after being assembled can meet the design requirements.
An embodiment of the present invention further provides an electronic device, as shown in fig. 8, which includes a processor 801, a communication interface 802, a memory 803, and a communication bus 804, where the processor 801, the communication interface 802, and the memory 803 complete mutual communication through the communication bus 804,
a memory 803 for storing a computer program;
the processor 801 is configured to implement the following steps when executing the program stored in the memory 803:
searching for a corresponding assembly error according to a preset gap value of the main reflector;
establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of gaps among the partitioned mirrors in the main reflector;
simulating the simulation model to obtain a dead zone characteristic parameter of the simulation model;
resetting the preset gap value according to the characteristic parameters of the dead zone, returning to the step of searching the corresponding assembly error according to the preset gap value of the main reflector, and continuing to execute until the iteration stop condition is met;
and selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the characteristic parameters of the quiet zone meet the design requirements in the iteration process as the design gap value.
The communication bus mentioned in the electronic device may be a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, or the like. The communication bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one thick line is shown, but this does not mean that there is only one bus or one type of bus.
The communication interface is used for communication between the electronic equipment and other equipment.
The Memory may include a Random Access Memory (RAM) or a Non-Volatile Memory (NVM), such as at least one disk Memory. Alternatively, the memory may be at least one memory device located remotely from the processor.
The Processor may be a general-purpose Processor, including a Central Processing Unit (CPU), a Network Processor (NP), and the like; but also Digital Signal Processors (DSPs), application Specific Integrated Circuits (ASICs), field Programmable Gate Arrays (FPGAs) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components.
In yet another embodiment provided by the present invention, there is also provided a computer readable storage medium having stored therein a computer program which when executed by a processor implements any of the above described primary mirror simulation designs.
In yet another embodiment provided by the present invention, there is also provided a computer program product containing instructions which, when run on a computer, cause the computer to perform any of the primary mirror simulation designs of the above embodiments.
In the above embodiments, all or part of the implementation may be realized by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, cause the processes or functions described in accordance with the embodiments of the invention to occur, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored in a computer readable storage medium or transmitted from one computer readable storage medium to another computer readable storage medium, for example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital Subscriber Line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device, such as a server, a data center, etc., that includes one or more available media. The usable medium may be a magnetic medium (e.g., floppy Disk, hard Disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid State Disk (SSD)), among others.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a," "8230," "8230," or "comprising" does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
All the embodiments in the present specification are described in a related manner, and the same and similar parts among the embodiments may be referred to each other, and each embodiment focuses on differences from other embodiments. In particular, for the apparatus, the electronic device, the storage medium, and the computer program product embodiment, since they are substantially similar to the method embodiment, the description is relatively simple, and reference may be made to the partial description of the method embodiment for relevant points.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention shall fall within the protection scope of the present invention.

Claims (10)

1. A method for simulation design of a primary mirror, the method comprising:
searching a corresponding assembly error according to a preset gap value of the main reflector;
establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of the gap between the partitioned mirrors in the main reflector;
simulating the simulation model to obtain quiet zone characteristic parameters of the simulation model, wherein the quiet zone characteristics comprise amplitude jitter, phase jitter and cross polarization isolation in a quiet zone;
resetting the preset gap value according to the characteristic parameter of the dead zone, returning to the step of searching the corresponding assembly error according to the preset gap value of the main reflector and continuing to execute until an iteration stop condition is met;
and selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the characteristic parameters of the quiet zone meet the design requirements in the iteration process as the design gap value.
2. The method according to claim 1, wherein the resetting the preset gap value according to the dead band characteristic parameter comprises:
judging whether the characteristic parameters of the dead zones meet the design requirements or not;
if so, increasing the preset gap value; and if not, reducing the preset gap value.
3. The method of claim 1, wherein pre-learning the assembly error comprises:
counting actual gap values of a plurality of assembled main reflectors according to a target gap value, wherein the gap values of the plurality of assembled main reflectors in the design process are the target gap values;
calculating the difference between each actual gap value and the target gap value respectively to obtain a plurality of gap difference values;
counting the number of the gap differences in the plurality of gap differences which are different values;
calculating the probability of the gap difference values with different values according to the number of the gap difference values with different values and the total number of the gap difference values;
and carrying out weighted summation by using the probability when the gap difference value is different values and the different values to obtain the assembly error corresponding to the target gap value.
4. The method of claim 1, wherein said finding a corresponding assembly error based on a preset slit value of the primary mirror comprises:
searching for a corresponding assembly error according to a preset gap value and a preset gap shape of the main reflector;
the establishing of the simulation model of the main reflector by taking the sum of the preset gap value and the assembly error as the gap value of the gap between the partitioned mirrors in the main reflector comprises the following steps:
establishing a simulation model of the main reflector according to the preset gap shape by taking the sum of the preset gap value and the assembly error as the gap value of the gap between the partitioned mirrors in the main reflector;
in the selecting iteration process, the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements is used as the design gap value, and the selecting iteration process comprises the following steps:
selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the characteristic parameters of the quiet zone meet the design requirements in the iteration process as the reference gap value of the current gap shape;
resetting the preset gap shape, returning to the step of searching for the corresponding assembly error according to the preset gap value and the preset gap shape of the main reflector, and continuing to execute the step until a reference gap value of each preset gap shape is obtained;
and selecting the maximum value of the reference gap values of the preset gap shapes as the design gap value, and taking the gap shape corresponding to the design gap value as the design gap shape.
5. The method of claim 1, wherein the simulating the simulation model to obtain the dead zone characteristic parameters of the simulation model comprises:
and according to the design requirement, calculating the quiet zone characteristics of the simulation model by using a simulation program to obtain the quiet zone characteristic parameters of the simulation model, wherein the quiet zone characteristics comprise amplitude jitter, phase jitter and cross polarization isolation in the quiet zone.
6. A primary mirror design simulation apparatus, comprising:
the assembling error searching module is used for searching a corresponding assembling error according to the preset gap value of the main reflector;
the model establishing module is used for establishing a simulation model of the main reflector by taking the sum of the preset gap value and the assembling error as the gap value of the gap between the partitioned mirrors in the main reflector;
the model simulation module is used for simulating the simulation model to obtain the characteristic parameters of the quiet zone of the simulation model, wherein the characteristics of the quiet zone comprise amplitude jitter, phase jitter and cross polarization isolation in the quiet zone;
the loop iteration module is used for resetting the preset gap value according to the quiet zone characteristic parameters and continuously executing the preset gap value through the assembly error searching module until an iteration stop condition is met;
and the design gap value selection module is used for selecting the maximum value of a plurality of preset gap values corresponding to a plurality of iterations in which the quiet zone characteristic parameters meet the design requirements in the iteration process as the design gap value.
7. The apparatus of claim 6, wherein the loop iteration module is specifically configured to:
judging whether the characteristic parameters of the dead zone meet the design requirements or not;
if so, increasing the preset gap value; and if not, reducing the preset gap value.
8. The apparatus of claim 6, further comprising an assembly error acquisition module;
the assembling error obtaining module is used for counting actual gap values of a plurality of assembled main reflectors according to a target gap value, wherein the gap values of the plurality of assembled main reflectors in the design process are the target gap values; calculating the difference between each actual gap value and the target gap value respectively to obtain a plurality of gap difference values; counting the number of the gap differences in the plurality of gap differences which are different values; calculating the probability of the gap difference values with different values according to the number of the gap difference values with different values and the total number of the gap difference values; and carrying out weighted summation by using the probability when the gap difference value is different values and the different values to obtain the assembly error corresponding to the target gap value.
9. An electronic device is characterized by comprising a processor, a communication interface, a memory and a communication bus, wherein the processor and the communication interface are used for realizing mutual communication by the memory through the communication bus;
a memory for storing a computer program;
a processor for implementing the method steps of any one of claims 1 to 5 when executing a program stored in the memory.
10. A computer-readable storage medium, characterized in that a computer program is stored in the computer-readable storage medium, which computer program, when being executed by a processor, carries out the method steps of any one of the claims 1-5.
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