CN112904127A - Low-frequency magnetic field interference generating device - Google Patents
Low-frequency magnetic field interference generating device Download PDFInfo
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- CN112904127A CN112904127A CN202110102665.3A CN202110102665A CN112904127A CN 112904127 A CN112904127 A CN 112904127A CN 202110102665 A CN202110102665 A CN 202110102665A CN 112904127 A CN112904127 A CN 112904127A
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- 238000012360 testing method Methods 0.000 claims abstract description 56
- 239000003990 capacitor Substances 0.000 claims description 3
- 239000012780 transparent material Substances 0.000 claims description 3
- 238000004804 winding Methods 0.000 claims description 3
- 230000002159 abnormal effect Effects 0.000 description 6
- 238000012544 monitoring process Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 238000011161 development Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 238000012356 Product development Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000012942 design verification Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
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Abstract
The invention discloses a low-frequency magnetic field interference generating device. The magnetic field load device is connected with the ECU controller; the magnetic field load device comprises six coil loads and a mounting bracket, wherein the six coil loads are arranged at the center positions of six planes of the mounting bracket, one ends of every two coil loads facing the planes are connected together, and the other ends of the two coil loads are connected to the ECU controller; the test load is centrally disposed within the mounting bracket. The device of the invention utilizes the magnetic field existing around the electrified coil, and the magnetic field can be utilized to carry out the low-frequency magnetic field anti-interference test on the automobile electronic control unit or the automobile sensor containing the magnetic element, thereby providing effective equipment for the test of the system reliability.
Description
Technical Field
The invention belongs to a magnetic field generating device in the field of electromagnetism, and particularly relates to a low-frequency magnetic field interference generating device.
Background
Electromagnetic compatibility (EMC) tests are tests that must be performed on board a product. The low-frequency magnetic field anti-interference test is one of items contained in an electromagnetic compatibility test, and is mainly used for examining the capability of automobile parts containing magnetic elements for resisting low-frequency magnetic field interference.
The designed new product is subjected to a low-frequency magnetic field anti-interference test, and the test needs to be carried out in a professional electromagnetic compatibility laboratory due to the lack of simulation interference equipment. This has the following disadvantages: 1. the testing cost is high at the end of touch. 2. Some necessary design verification cannot be carried out in the early stage of design, and the development progress of the product is influenced. 3. The test period is long, and the product verification progress is influenced.
Disclosure of Invention
In order to solve the problems in the background art, the invention provides a low-frequency magnetic field interference generating device.
The technical scheme of the invention is realized as follows:
the invention mainly comprises a magnetic field load device and an ECU controller, wherein the magnetic field load device is connected with the ECU controller; the magnetic field load device comprises six coil loads and a mounting bracket, wherein the six coil loads are arranged at the center positions of six planes of the mounting bracket, one ends of every two coil loads facing the planes are connected together, and the other ends of the two coil loads are connected to the ECU controller; the test load is centrally disposed within the mounting bracket.
The test load is respectively connected with the computer and the power box, and the power boxes are connected to the ECU controller and the six coil loads.
The six coil loads are wound by enameled wires in a spiral line, the number of the wound wires is larger than 5, the winding distance is larger than 5cm, and the wire diameter is larger than 3 mm.
The mounting bracket is made of transparent materials.
The center of six surfaces of the mounting bracket is provided with a raised cylindrical barrel structure, and a coil load is fixed in the cylindrical barrel structure.
The top surface of the mounting bracket is an upper cover which can be detached.
The mounting bracket is hollow inside, the mounting plate is fixed at the center of the mounting bracket, and the test load is mounted on the mounting plate.
The ECU controller comprises an MCU, the MCU is connected with a patch panel module J2, the patch panel module J2 is provided with two OUTPUT ports, one OUTPUT port is grounded, the other OUTPUT port is connected with the anode of a diode D1, the cathode of the diode D1 is connected with an INPUT port of a linear voltage reduction module IC1, the OUTPUT port of the linear voltage reduction module IC1 is grounded through a capacitor C9, every two coil loads facing a plane in six coil loads form a pair of coil load groups, the pair of coil load groups are connected in series and then connected between the anode of the diode D1 and a respective MOS tube, and the MOS tubes are grounded and the MCU.
The six coil loads are respectively coil L1, coil L2, coil L3, coil L4, coil L5 and coil L6, coil L1 and coil L2 are located on two planes of the mounting bracket opposite to each other, coil L3 and coil L4 are located on two planes of the mounting bracket opposite to each other, and coil L5 and coil L6 are located on two planes of the mounting bracket opposite to each other;
the coil L1 and the coil L2 are connected in series and then connected in parallel with the diode D2, two ends of the diode D2 are connected between the anode of the diode D1 and the drain of the MOS tube K2, the source of the MOS tube K2 is grounded, and the gate of the MOS tube K2 is connected to the PAD07 port of the MCU;
the coil L3 and the coil L4 are connected in series and then connected in parallel with the diode D3, two ends of the diode D3 are connected between the anode of the diode D1 and the drain of the MOS tube K3, the source of the MOS tube K3 is grounded, and the gate of the MOS tube K3 is connected to the PAD06 port of the MCU;
coil L5 and coil L6 are connected in series and then connected in parallel with diode D4, two ends of diode D4 are connected between the anode of diode D1 and the drain of MOS tube K4, the source of MOS tube K4 is grounded, and the gate of MOS tube K4 is connected to the PAD05 port of the MCU.
The test load is an automobile electronic control unit or an automobile sensor containing a magnetic element.
The invention aims to provide a low-frequency magnetic field interference generating device. The device utilizes the magnetic field existing around the electrified coil, and the magnetic field can be utilized to carry out the low-frequency magnetic field anti-interference test on the automobile electronic control unit or the automobile sensor containing the magnetic element, thereby providing effective equipment for the test of the system reliability.
The invention has the positive effects that:
the invention can greatly simplify the complexity and the process of the test by carrying out the interference test on the automobile electronic control unit or the automobile sensor, and solves the requirement of carrying out the low-frequency magnetic field anti-interference test on the product in the initial stage of the product development. Compared with a professional electromagnetic compatibility laboratory for testing, the method saves cost, accelerates development and verification progress, and has the characteristics of low price and simplicity in operation and maintenance.
Drawings
FIG. 1 is a schematic diagram of the connection of the present invention.
FIG. 2 is a schematic circuit diagram of the apparatus of the present invention.
FIG. 3 is a schematic view of the magnetic field loading device of the present invention.
FIG. 4 is a schematic view showing the direction of magnetic lines of the coil of the present invention.
Detailed Description
The invention is further described with reference to the following figures and examples.
As shown in fig. 1, the magnetic field load device mainly comprises a magnetic field load device 1 and an ECU controller 2, wherein the magnetic field load device 1 is connected with the ECU controller 2; the magnetic field load device 1 comprises six coil loads 4 and a mounting bracket 5, wherein the mounting bracket 5 is a square bracket, as shown in fig. 3, the six coil loads 4 are arranged at the center positions of six planes of the square of the mounting bracket 5, one ends of every two coil loads 4 facing the planes are connected together, and the other ends of the two coil loads are connected to the ECU controller 2; the test load 6 is arranged centrally inside the mounting bracket 5; in a specific implementation, the other end of each coil load 4 is connected to six control ports of the ECU controller 2.
The mounting bracket 5 is made of transparent material. The centers of six surfaces of the mounting bracket 5 are provided with raised cylindrical barrel structures, and coil loads 4 are fixed in the cylindrical barrel structures. The top surface of the mounting bracket 5 is an upper cover which can be detached. The inside cavity of installing support 5, inside center fixed mounting panel, test load 6 is installed at the mounting panel, fixes test load 6 through the mounting hole on the mounting panel. A cylindrical barrel body with a protruding upper cover on the mounting support 5 is provided with a central hollow hole which is an inlet of a wire harness entering device for testing a load 6.
Under the action of the magnetic field load device 1, the test load 6 can receive low-frequency magnetic field interference in three directions, namely, up and down, front and back, left and right, of the test load 6 by the magnetic field load device 1.
The specific implementation also comprises a power supply box 3, a test load 6 is respectively connected with the computer 7 and the power supply box 3, and the power supply box 3 is connected with the ECU controller 2 and six coil loads 4.
Six coil loads 4 are wound by enameled wires in a spiral line, the number of the wound wires is larger than 5, the winding distance is larger than 5cm, and the wire diameter is larger than 3 mm.
As shown in fig. 2, the ECU controller 2 includes an MCU, which is connected to a jack module J2. Patch port module J2 has two ports, one port grounded and the other port input plus 12V. The +12V path is connected to the anode of the diode D1, and the other path is connected to the No. 2 pins of the coil L1, the coil L3 and the coil L5. The negative electrode of the diode D1 is connected with an INPUT port of the linear voltage-reducing module IC1, an OUTPUT port of the linear voltage-reducing module IC1 is grounded through a capacitor C9, every two coil loads 4 which are opposite to the plane in the six coil loads 4 form a pair of coil load groups, the pair of coil load groups are connected in series and then connected between the positive electrode of the diode D1 and a respective MOS (metal oxide semiconductor) transistor, and the MOS transistors are grounded and the MCU. The method specifically comprises the following steps:
six coil loads 4 are respectively a coil L1, a coil L2, a coil L3, a coil L4, a coil L5 and a coil L6, the coil L1 and the coil L2 are located on two planes of the mounting bracket 5 which are opposite to each other, the coil L3 and the coil L4 are located on two planes of the mounting bracket 5 which are opposite to each other, and the coil L5 and the coil L6 are located on two planes of the mounting bracket 5 which are opposite to each other;
the coil L1 and the coil L2 are connected in series and then connected in parallel with the diode D2, two ends of the diode D2 are connected between the anode of the diode D1 and the drain of the MOS tube K2, the source of the MOS tube K2 is grounded, and the gate of the MOS tube K2 is connected to the PAD07 port of the MCU;
the coil L3 and the coil L4 are connected in series and then connected in parallel with the diode D3, two ends of the diode D3 are connected between the anode of the diode D1 and the drain of the MOS tube K3, the source of the MOS tube K3 is grounded, and the gate of the MOS tube K3 is connected to the PAD06 port of the MCU;
coil L5 and coil L6 are connected in series and then connected in parallel with diode D4, two ends of diode D4 are connected between the anode of diode D1 and the drain of MOS tube K4, the source of MOS tube K4 is grounded, and the gate of MOS tube K4 is connected to the PAD05 port of the MCU.
The linear voltage-dropping module IC 17805 drops the power supply voltage 12V to a VCC voltage for use inside the ECU controller 2.
The diodes D2, D3, and D4 are free-wheeling diodes for suppressing the back electromotive force generated at both ends of the coil when the inductive load coil is deenergized.
The ECU controller 2 controls the six coil loads 4 to work, different interference magnetic fields are applied to the test loads 6, and then the magnetic field interference test is realized.
The present invention is described by taking the example of the upper and lower coil energization interference when the control magnetic field is generated:
1. constant magnetic field interference:
when the MCU controls the K2 MOS tube to be turned on for a long time, the power supply (+12V) supplies power to the coils L1 and L2, and at the moment, the two coils flow more stable current, so that the current flowing through the coils L1 and L2 is more stable, and a constant magnetic field is generated around the two coils. As shown in fig. 4, it can be seen that the currents of the upper and lower coils are both in the counterclockwise direction, and the magnetic field generated around the upper and lower coils is determined according to the right-hand screw rule, so that it can be determined that the directions of the magnetic lines of force of the two coils are both emitted from the bottom to the top, and when the test load 6 is placed therein, the interference magnetic field generated by the coils from the bottom to the top is superimposed on the magnetic element of the test load, thereby interfering with the operation of the load.
2. Alternating magnetic field interference:
when the MCU controls the K2 MOS tube to perform PWM (pulse width modulation), at the moment, the power supply (+12V) discontinuously supplies power to the coils L1 and L2 due to the PWM modulation, and alternating current flows through the two coils at the moment, so that an alternating magnetic field is generated. Compared with constant magnetic field interference, the inductive load current is suddenly changed, larger magnetic field energy can be released, and meanwhile, the electric field interference generated by the coil power failure is accompanied, so that the interference form on the test load 6 is more complicated and the energy is stronger. When the circuit is designed, the current mutation of the coil is considered, and the generated back electromotive force can damage the MOS tube, so that the freewheeling diodes are connected in parallel at two ends of the coil to inhibit the peak voltage and protect the MOS tube.
The specific use test process of the invention is as follows:
as shown in fig. 1 and 2, in the device, a power supply box 3 is connected to an ECU controller 2 and a test load 6, respectively, for supplying power, and the ECU controller 2 is connected to a magnetic field load device 1. The test load 6 is fixedly arranged inside the magnetic field load device 1, and the test load 6 is connected to the computer 7 through a CAN line.
Step 1: as shown in fig. 2, first, the MCU controls the MOS transistor K2 (the coil loads arranged above and below, i.e., the coil L1 and the coil L2) to be always turned on, and the other two MOS transistors K3 and the MOS transistor K4 are in a turned-off state. At this time, a steady current flows through the coil L1 and the coil L2, a magnetic field which is upward from the lower part is generated and acts on the test load 6, and at this time, the computer 7 is used for monitoring whether data are abnormal or not through the CAN network, and a test phenomenon is recorded.
Step 2: the MCU controls the MOS tube K3 (coil loads arranged in front and back, namely a coil L3 and a coil L4) to be normally opened, and the other two MOS tubes K2 and K4 are in closed states. At the moment, the coil L3 and the coil L4 flow through stable current, a backward and forward magnetic field is generated to act on the test load 6, and at the moment, the computer 7 is used for monitoring whether data are abnormal or not through a CAN network and recording a test phenomenon.
And step 3: the MCU controls the MOS tube K4 (the coil loads arranged on the left and the right, namely the coil L5 and the coil L6) to be normally opened, and the other two MOS tubes K2 and K3 are in a closed state. At the moment, the coil L5 and the coil L6 flow through stable current, magnetic fields from left to right are generated to act on the test load 6, and at the moment, the computer 7 is used for monitoring whether data are abnormal or not through a CAN network and recording a test phenomenon.
And 4, step 4: the MCU controls a MOS tube K2 (coil loads arranged up and down, namely a coil L1 and a coil L2) to perform PWM control, the PWM adjusting frequency is 50Hz, and the duty ratio is 50%. The other two MOS transistors K3 and K4 are in an off state. At the moment, alternating field current flows through the coil L1 and the coil L2, the generated magnetic field acts on the test load 6, and at the moment, the computer 7 is used for monitoring whether data are abnormal or not through the CAN network and recording a test phenomenon.
And 5: the MCU controls a MOS tube K3 (coil loads arranged in front and back, namely a coil L3 and a coil L4) to perform PWM control, the PWM adjusting frequency is 50Hz, and the duty ratio is 50%. The other two MOS transistors K2 and K4 are in an off state. At the moment, alternating field current flows through the coil L3 and the coil L4, the generated magnetic field acts on the test load 6, and at the moment, the computer 7 is used for monitoring whether data are abnormal or not through the CAN network and recording a test phenomenon.
Step 6: the MCU controls a MOS tube K4 (coil loads arranged on the left and right, namely a coil L5 and a coil L6) to carry out PWM control, the PWM adjusting frequency is 50Hz, and the duty ratio is 50%. The other two MOS transistors K2 and K3 are in an off state. At the moment, alternating field current flows through the coil L5 and the coil L6, the generated magnetic field acts on the test load 6, and at the moment, the computer 7 is used for monitoring whether data are abnormal or not through the CAN network and recording a test phenomenon.
Therefore, the device provided by the invention can be used for carrying out a low-frequency magnetic field anti-interference test on an automobile electronic control unit or an automobile sensor containing a magnetic element by utilizing the magnetic field existing around the electrified coil, and provides effective equipment for testing the reliability of a system.
Claims (10)
1. A low frequency magnetic field interference generating device, characterized by: the device mainly comprises a magnetic field load device (1) and an ECU controller (2), wherein the magnetic field load device (1) is connected with the ECU controller (2); the magnetic field load device (1) comprises six coil loads (4) and a mounting bracket (5), the six coil loads (4) are arranged at the center positions of six planes of the mounting bracket (5), one ends of every two coil loads (4) facing the planes are connected together, and the other ends of the two coil loads are connected to the ECU controller (2); the test load (6) is arranged centrally inside the mounting bracket (5).
2. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the test device is characterized by further comprising a power supply box (3), a test load (6) is respectively connected with the computer (7) and the power supply box (3), and the power supply box (3) is connected to the ECU controller (2) and the six coil loads (4).
3. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the six coil loads (4) are wound by enameled wires in a spiral line, the number of the wound wires is larger than 5, the winding distance is larger than 5cm, and the wire diameter is larger than 3 mm.
4. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the mounting bracket (5) is made of transparent materials.
5. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the center of six surfaces of the mounting bracket (5) is provided with a raised cylindrical barrel structure, and a coil load (4) is fixed in the cylindrical barrel structure.
6. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the top surface of the mounting bracket (5) is an upper surface cover which can be detached.
7. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the mounting bracket (5) is hollow, the mounting plate is fixed at the center of the mounting bracket, and the test load (6) is mounted on the mounting plate.
8. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the ECU controller (2) comprises an MCU, the MCU is connected with a patch socket module J2, the patch socket module J2 is provided with two OUTPUT ports, one OUTPUT port is grounded, the other OUTPUT port is connected with the anode of a diode D1, the cathode of the diode D1 is connected with an INPUT port of a linear voltage reduction module IC1, the OUTPUT port of the linear voltage reduction module IC1 is grounded through a capacitor C9, every two coil loads (4) facing a plane in six coil loads (4) form a pair of coil load groups, the pair of coil load groups are connected in series and then connected between the anode of the diode D1 and a respective MOS tube, and the MOS tube is grounded and the MCU.
9. A low frequency magnetic field interference generating device as claimed in claim 8, wherein:
six coil loads (4) are respectively coil L1, coil L2, coil L3, coil L4, coil L5 and coil L6, coil L1 and coil L2 are located on two planes of the mounting bracket (5) which are opposite to each other, coil L3 and coil L4 are located on two planes of the mounting bracket (5) which are opposite to each other, and coil L5 and coil L6 are located on two planes of the mounting bracket (5) which are opposite to each other; the coil L1 and the coil L2 are connected in series and then connected in parallel with the diode D2, two ends of the diode D2 are connected between the anode of the diode D1 and the drain of the MOS tube K2, the source of the MOS tube K2 is grounded, and the gate of the MOS tube K2 is connected to the PAD07 port of the MCU; the coil L3 and the coil L4 are connected in series and then connected in parallel with the diode D3, two ends of the diode D3 are connected between the anode of the diode D1 and the drain of the MOS tube K3, the source of the MOS tube K3 is grounded, and the gate of the MOS tube K3 is connected to the PAD06 port of the MCU; coil L5 and coil L6 are connected in series and then connected in parallel with diode D4, two ends of diode D4 are connected between the anode of diode D1 and the drain of MOS tube K4, the source of MOS tube K4 is grounded, and the gate of MOS tube K4 is connected to the PAD05 port of the MCU.
10. A low frequency magnetic field interference generating device as claimed in claim 1, wherein:
the test load (6) is an automobile electronic control unit or an automobile sensor containing a magnetic element.
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| CN202110102665.3A CN112904127A (en) | 2021-01-26 | 2021-01-26 | Low-frequency magnetic field interference generating device |
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| CN202110102665.3A CN112904127A (en) | 2021-01-26 | 2021-01-26 | Low-frequency magnetic field interference generating device |
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