CN112867045A - Multi-compact range measuring system and method - Google Patents
Multi-compact range measuring system and method Download PDFInfo
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- CN112867045A CN112867045A CN202110053296.3A CN202110053296A CN112867045A CN 112867045 A CN112867045 A CN 112867045A CN 202110053296 A CN202110053296 A CN 202110053296A CN 112867045 A CN112867045 A CN 112867045A
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Abstract
The application discloses a multi-compact range measuring system, which comprises a microwave darkroom, a first reflecting surface, a second reflecting surface, a first linear guide rail, a second linear guide rail, a first reflecting surface direction rotating shaft and a second reflecting surface direction rotating shaft, wherein the first reflecting surface, the second reflecting surface, the first linear guide rail, the second linear guide rail, the first reflecting surface direction rotating shaft and the second reflecting surface direction rotating shaft are positioned in the microwave darkroom; the first reflecting surface azimuth rotating shaft drives the first reflecting surface to rotate and is connected with the first linear guide rail, so that the first reflecting surface moves along the first linear guide rail; the second reflecting surface azimuth rotating shaft drives the second reflecting surface to rotate and is connected with the second linear guide rail, so that the second reflecting surface moves along the second linear guide rail; the extension lines of the first linear guide rail and the second linear guide rail are intersected; moving the first and second reflective surfaces about the test point to produce a plurality of azimuthal incoming waves generates a compact field quiet zone covering the test point. The application also includes methods of using the system for multiple compact range measurements. The scheme of this application effectively reduces millimeter wave equipment measuring cost, improves measurement of efficiency.
Description
Technical Field
The application relates to the field of radio, in particular to a system and a method for measuring multiple compact ranges.
Background
With the rapid development of 5G mobile communication technology, the data volume and service carrying capacity in the communication system are increasing continuously, and the communication frequency band in 5G is divided into two segments, wherein FR1 is a lower frequency band, the frequency is 410MHz-7125MHz, also called Sub 6GHz frequency band, FR2 is a higher frequency band, the frequency is 24250MHz-52600MHz, also called millimeter wave frequency band. In the millimeter wave frequency band measurement, the device needs to be measured under multiple incoming wave arrival angles under multiple measurement scenarios, for example, the device to be measured needs to measure two or more beam arrival angles, such as the measurement of radio resource management needs to perform transceiving measurement at multiple angles.
At present, a compact range measurement scheme is mostly adopted for measurement of 5G millimeter wave equipment, and the compact range is formed in a near field range of a reflector antenna by utilizing a principle that a reflector collimates spherical waves emitted by a feed source antenna into quasi-plane waves, so that the field size required by direct far field measurement is reduced.
For the measurement of the arrival angles from multiple directions required by wireless resource management and the like, in order to further reduce the cost of darkroom size and keep the uncertainty index of the test in a quiet zone unchanged, a novel multi-compact range measurement system is provided, and a plurality of compact ranges are utilized to meet the test scene requiring multiple angle transceiving measurement in the tests of the wireless resource management and the like specified by 3 GPP.
Disclosure of Invention
The application provides a many tight yards measurement system and method, solves the problem that single tight yard test system can not satisfy many base station simulations, especially, through the integrated design of a plurality of portable plane of reflection, solves the great problem of microwave dark room size under the many base station simulation test condition, effectively reduces millimeter wave equipment measuring cost, improves measurement of efficiency.
The embodiment of the application provides a multi-compact range measuring system, which comprises a microwave darkroom, a first reflecting surface, a second reflecting surface, a first linear guide rail, a second linear guide rail, a first reflecting surface direction rotating shaft and a second reflecting surface direction rotating shaft, wherein the first reflecting surface, the second reflecting surface, the first linear guide rail, the second linear guide rail, the first reflecting surface direction rotating shaft and the second reflecting surface direction rotating shaft are positioned in the microwave darkroom;
the first reflecting surface azimuth rotating shaft drives the first reflecting surface to rotate and is connected with the first linear guide rail, so that the first reflecting surface moves along the first linear guide rail;
the second reflecting surface azimuth rotating shaft drives the second reflecting surface to rotate and is connected with the second linear guide rail, so that the second reflecting surface moves along the second linear guide rail;
the extension lines of the first linear guide rail and the second linear guide rail are intersected; and moving the first reflecting surface and the second reflecting surface by taking the test point as a center to generate incoming waves in a plurality of directions under the action of the feed source, and generating a compact field quiet zone covering the test point.
Preferably, the first and second electrodes are formed of a metal,
the central point of the quiet zone is taken as the center, the connecting line of the center of the first reflecting surface and the center of the quiet zone can be rotated by 60 degrees along the first linear guide rail, and the opening surface of the first reflecting surface faces the center of the quiet zone through the rotation of the azimuth rotating shaft of the first reflecting surface; the central point of the quiet zone is taken as the center, the connecting line of the center of the second reflecting surface and the center of the quiet zone can be rotated by 60 degrees along the second linear guide rail, and the opening surface of the second reflecting surface faces the center of the quiet zone through the rotation of the azimuth rotating shaft of the second reflecting surface;
the horizontal included angle formed by the connecting line of the initial positions of the first reflecting surface and the second reflecting surface and the central point of the quiet zone is 30 degrees.
Preferably, when the first reflecting surface and the second reflecting surface are respectively located at the position 1 and the position 2, an included angle of incoming waves received by the equipment to be tested in the quiet zone is 30 degrees; when the first reflecting surface and the second reflecting surface are respectively positioned at the position 1 and the position 4 or respectively positioned at the position 3 and the position 2, the included angle of incoming waves received by the equipment to be tested in the quiet zone is 90 degrees; when the first reflecting surface and the second reflecting surface are respectively positioned at the position 3 and the position 4, the included angle of incoming waves received by the tested equipment in the quiet zone is 150 degrees.
Preferably, the length L direction of the microwave dark room is taken as the X-axis direction, the width W direction of the microwave dark room is taken as the Y-axis direction, and the height H direction is taken as the Z-axis direction; the included angle of the X axis of the first linear guide rail is 30 degrees, the typical included angle of the second linear guide rail and the X axis is 60 degrees, and the directions of the two included angles are opposite.
Preferably, the quiet zone is a cylinder, the radius of the bottom surface is r, and the height is g; the constraint relation between the size of the dead zone and the size of the microwave darkroom is as follows: l is more than or equal to 5 × g, W is more than or equal to 8 × r, and H is more than or equal to 8 × r.
Further preferably, the first reflecting surface and the second reflecting surface are identical curled compact field reflecting surfaces, and the typical size of the opening surface of the reflecting surface is 400-600 mm.
Further preferably, the first reflection surface azimuth plane rotation axis and the second reflection surface azimuth plane rotation axis are central mechanical rotation axes, and the reflection surfaces can be rotated by 0 ° to 360 °, respectively.
Further preferably, the first compact range feed source and the second compact range feed source are dual-polarized broadband feed sources, and the frequency range covers the frequency range of 5G FR 2; the two feed sources are controlled by a polarization selection switch to be polarized and turned over, and the two feed sources are respectively connected with a radio frequency circuit and a switch control circuit.
The embodiment of the present application further provides a multi-compact range measurement method, which uses the system according to any one of the embodiments of the present application, and includes the following steps:
the first reflecting surface guide rail and the second reflecting surface guide rail support the reflecting surface to move along a straight line;
rotating the first reflecting surface orientation rotating shaft and the second reflecting surface orientation rotating shaft to enable the first reflecting surface and the second reflecting surface to face the test point;
simulating base station incoming waves in multiple directions through the action of the feed source, the first reflecting surface and the second reflecting surface to generate a compact field quiet zone covering the test point;
the center of the quiet area is taken as the center, the initial included angle of the two reflecting surfaces is 30 degrees, and the movable angle of the center of the first reflecting surface around the center of the quiet area is 60 degrees; the center of the second reflecting surface can move around the center of the dead zone by an angle of 60 degrees, and the base station pair simulation test of typical angles of 30 degrees, 60 degrees, 90 degrees, 120 degrees, 150 degrees and other arbitrary angles is realized.
The embodiment of the application adopts at least one technical scheme which can achieve the following beneficial effects:
a multi-compact range measuring system is provided, which can remarkably reduce the cost of compact range measurement and improve the measuring efficiency under the condition of meeting the standard requirement.
The invention adopts a multi-compact range system, and the quiet zone positions of a plurality of compact ranges are the same. During testing, the base stations in the direction of the arrival angles of a plurality of different beams can be simulated to measure the incoming wave signals, and the equipment to be tested is subjected to received signal quality measurement under different frequencies and different time slots. The microwave darkroom has compact size and convenient test, a plurality of reflecting surfaces can move, and compared with a single reflecting surface measuring system, the microwave darkroom greatly improves the testing efficiency and saves the measuring time.
The invention adopts the linear moving guide rail and the reflecting surface azimuth surface central rotating shaft, so that the reflecting surface moves along a straight line when moving along the guide rail, and the position error of the reflecting surface coming by adopting an arc-shaped guide rail is eliminated.
The invention relates to a multi-compact range signal transmitting and receiving system, which can process the receiving signals under the condition of multi-beam simultaneously and further improve the testing efficiency.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a typical rotation angle for a prior art compact range test;
FIG. 2 is a diagram of a darkroom layout of the multi-compact range measurement system of the present invention;
FIG. 3 is a detail view of a multiple compact field layout of the present invention;
FIG. 4 is a schematic illustration of a multi-compact range quiet zone;
FIG. 5 shows an embodiment of the multi-compact range measurement method of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
r is the radius of the cylindrical quiet zone bottom surface and g is the cylindrical quiet zone height.
FIG. 1 is a typical rotation angle for a prior art compact range test.
Fig. 1 is a view showing the rotation angle of the reflecting surface with the dead zone center as the rotation center. According to the specification of 3GPP for 5G air interface radio resource management, it defines measurements under 5 types of base station pairs, which are respectively located at different relative angular distances, and the angular distances of the base station pairs are respectively: the performance of the wireless device is measured for each pair of angle of arrival cases broadcast in different frequencies and different time slots, 30 °, 60 °, 90 °, 120 ° and 150 °.
FIG. 2 is a layout view of a microwave darkroom according to the present invention.
The embodiment of the multi-compact range measuring system comprises a first compact range feed source, a second compact range feed source, a first reflecting surface, a second reflecting surface, a first linear guide rail, a second linear guide rail, a first reflecting surface azimuth rotating shaft, a second reflecting surface azimuth rotating shaft, a measured object rotating turntable and a microwave darkroom.
The feed source and the reflecting surface in the device form a multi-compact range signal transmitting and receiving system; the first compact range feed source, the second compact range feed source, the first reflecting surface, the second reflecting surface, the first linear guide rail, the second linear guide rail, the first reflecting surface azimuth rotating shaft, the second reflecting surface azimuth rotating shaft and the measured object rotating table are all configured in the microwave darkroom.
The phase center of the first compact range feed source is located at the focal position of the first reflecting surface, the feed source beam points to the central region of the reflecting surface, the reflecting surface and the feed source are fixed in relative positions in the process that the compact range moves along a straight line and rotates, the first reflecting surface is connected with the first reflecting surface azimuth rotating shaft, and the first reflecting surface azimuth rotating shaft is connected with the first reflecting surface moving guide rail.
The phase center of the second compact range feed source is positioned at the focus position of the second reflecting surface, the beam of the feed source is directed to the central region of the reflecting surface, the reflecting surface and the feed source are fixed in relative position in the process of linear motion and rotation of the compact range, the second reflecting surface is connected with the azimuth rotating shaft of the second reflecting surface, and the azimuth rotating shaft of the second reflecting surface is connected with the moving guide rail of the second reflecting surface.
The extension lines of the first linear guide rail and the second linear guide rail are intersected; and moving the first reflecting surface and the second reflecting surface by taking the test point as a center to generate incoming waves in a plurality of directions under the action of the feed source, and generating a compact field quiet zone covering the test point. During measurement, the first reflecting surface and the second reflecting surface can be moved by taking the central point of the quiet zone as a center, and incoming waves of base stations in a plurality of directions are simulated.
The rotating shaft of the azimuth plane of the reflecting surface is a central mechanical rotating shaft and is connected with the reflecting surface, so that the reflecting surface can be driven to rotate 360 degrees on the azimuth plane, and the mouth surface of the reflecting surface can be rotated to face a quiet area according to test requirements.
On the first linear guide rail, there is a first reflecting surface with a horizontal distance L from the center of the quiet zone1Is at an angle of 60 deg. to the centre of the quiet zone (position 1 and position 3). On the second linear guide rail, there is a second reflecting surface with a horizontal distance L from the center of the quiet zone2Is at an angle of 60 deg. to the centre of the quiet zone (position 2 and position 4). In the above-mentioned positions, one position (for example, position 1) of the first reflecting surface and one position (for example, position 2) of the second reflecting surface form an angle of 30 ° with the center of the dead space, and the other position (for example, position 3) of the first reflecting surface and the other position of the second reflecting surfaceFor example, position 4, makes an angle of 150 with the center of the quiet zone.
The length of the microwave dark room is L, the width of the microwave dark room is W, and the height of the microwave dark room is H. The microwave dark room is a compact size dark room, for example, the typical size of the microwave dark room capable of supporting 5G FR2 frequency band multiple transmit-receive angle measurement is 1.6m × 1.2m (L × W × H), so that the measurement cost is reduced.
The reflecting surfaces are same curled reflecting surfaces, and the width of the first reflecting surface is W1The width of the second reflecting surface is W2. The typical size of the reflecting surface is 400-600 mm. The first reflecting surface and the second reflecting surface are curled reflecting surfaces, and the surfaces of the curled reflecting surfaces are in a paraboloid form. The reason for adopting the curled reflecting surface is that the curled reflecting surface can reduce the low-frequency cut-off frequency of the test system to 6GHz, effectively reduce edge diffraction and scattering, keep the size of the reflecting surface small and make the whole test system more compact. The surface average roughness root mean square value of the curled reflecting surface after surface processing can be less than 1.6 mu m, so that the high-frequency cut-off frequency of the test system can reach more than 200 GHz.
The first reflecting surface azimuth rotating shaft and the second reflecting surface azimuth rotating shaft are central mechanical rotating shafts and can respectively rotate the reflecting surfaces by 0-360 degrees.
The first compact range feed source and the second compact range feed source are dual-polarized broadband feed sources, the frequency ranges of the two feed sources can cover the frequency range of 5G FR2, and the measurement of FR2 frequency bands can be supported at the same time. The two feed sources are controlled by a polarization selection switch to be polarized and turned over, and the two feed sources are respectively connected with a radio frequency circuit and a switch control circuit.
FIG. 3 is a detailed view of the multiple compact field layout of the present invention.
In the drawing, a first reflecting surface 3, a second reflecting surface 4, a first linear guide 5, a second linear guide 6 and a cylindrical compact range quiet zone 10 are included. d1Length of linear guide rail of first compact range, d2The length of the second compact range linear guide rail. L is1Is the distance, L, of the center of the first reflecting surface from the center of the quiet zone2The distance from the center of the second reflecting surface to the center of the quiet zone.
The microwave darkroom is compact in size, a coordinate system of the multi-compact range system takes the center of a quiet zone as the origin of coordinates, the length L direction of the microwave darkroom is the X-axis direction, the width W direction of the microwave darkroom is the Y-axis direction, and the height H direction of the microwave darkroom is the Z-axis direction.
The first reflecting surface guide 5 and the second reflecting surface guide 6 are linear mechanical guides. The first reflecting surface guide rail is typically at an angle of 30 ° to the X-axis, and the second reflecting surface guide rail is typically at an angle of 60 ° to the X-axis. The reflecting surface can be supported to move along a straight line.
The first reflecting surface moving guide may rotate the first reflecting surface 3 by an angle of 60 ° around the center point of the dead zone 10. The second reflecting surface moving guide may rotate the second reflecting surface 4 by an angular range of 60 ° with the center point of the dead zone as a center. The horizontal angle between the initial positions of the first reflecting surface and the second reflecting surface is 30 degrees. The azimuth plane rotation axis of the reflection plane can rotate the plane of the reflection plane in the direction of 60 degrees to make the plane face the quiet zone.
For example, position 1 is a position at which the first reflecting surface is located at the motion start point of the first linear guide, position 3 is a position at which the first reflecting surface is located at the motion end point of the first linear guide, position 2 is a position at which the second reflecting surface is located at the motion start point of the second linear guide, and position 4 is a position at which the second reflecting surface is located at the motion end point of the second linear guide.
When the first reflecting surface and the second reflecting surface are respectively positioned at the position 1 and the position 2, the included angle of incoming waves received by the tested equipment in the quiet zone is 30 degrees. When the first reflecting surface and the second reflecting surface are respectively located at the position 1 and the position 4 or respectively located at the position 3 and the position 2, the included angle of incoming waves received by the equipment to be tested in the quiet zone is 90 degrees. When the first reflecting surface and the second reflecting surface are respectively positioned at the position 3 and the position 4, the included angle of incoming waves received by the tested equipment in the quiet zone is 150 degrees.
FIG. 4 is a schematic illustration of a multi-compact range quiet zone.
The quiet zone 10 is typically a cylindrical quiet zone with a radius of r at the bottom of the quiet zone and a height of g at the quiet zone. The constraint relation between the size of the dead zone and the size of the microwave darkroom is as follows: l is more than or equal to 5 × g, W is more than or equal to 8 × r, and H is more than or equal to 8 × r.
For example, g is 200mm and r is 100 mm.
The compact range quiet zone is typically but not limited to a cylindrical quiet zone, and a design margin can be reserved according to measurement requirements to form a rectangular quiet zone.
FIG. 5 shows an embodiment of the multi-compact range measurement method of the present application.
The application also comprises a multi-compact range measurement method, wherein the reflection surface can be moved during the measurement process of the wireless equipment in the dead zone by using the system in any embodiment of the application, and the incoming wave test of the base station pair under different relative angles specified by 3GPP is completed.
Step 11, the first reflecting surface guide rail and the second reflecting surface guide rail support the reflecting surface to move along a straight line;
on the first linear guide rail, there is a first reflecting surface with a horizontal distance L from the center of the quiet zone1Is at an angle of 60 deg. to the centre of the quiet zone (position 1 and position 3). On the second linear guide rail, there is a second reflecting surface with a horizontal distance L from the center of the quiet zone2Is at an angle of 60 deg. to the centre of the quiet zone (position 2 and position 4). In the above-described positions, one position (for example, position 1) of the first reflecting surface and one position (for example, position 2) of the second reflecting surface make an angle of 30 ° with the center of the dead space, and the other position (for example, position 3) of the first reflecting surface and the other position (for example, position 4) of the second reflecting surface make an angle of 150 ° with the center of the dead space.
Step 12, rotating the first reflecting surface orientation rotating shaft and the second reflecting surface orientation rotating shaft to enable the first reflecting surface and the second reflecting surface to face the test point;
the rotating shaft of the azimuth surface of the reflecting surface is directly connected with the reflecting surface, and the reflecting surface can be controlled to rotate 360 degrees by taking the shaft as a rotation center, so that the reflecting surface can be moved along a linear guide rail according to the measurement requirement when in measurement, and then the rotating shaft of the azimuth surface of the reflecting surface is rotated to enable the orientation test point of the reflecting surface, so that the compact range quiet zone is always positioned at the tested equipment. Therefore, the measurement under the diagonal distance test requirements of different base stations can be carried out on the tested equipment.
Step 13, simulating base station incoming waves in multiple directions through the action of the feed source, the first reflecting surface and the second reflecting surface to generate a compact range quiet zone covering the test points, and realizing the test of the incoming waves at multiple angles;
for example, the present multi-compact range system is able to satisfy the test of incoming waves with angular intervals of 30 °, 60 °, 90 °, 120 ° and 150 ° by the movement of two reflecting surfaces.
And designing the motion postures of the reflecting surface moving guide rail and the reflecting surface rotating shaft according to the angular distance measurement requirement. According to the minimum base station diagonal distance of 30 degrees, the initial angular distance of the two reflecting surfaces is 30 degrees, and the angle range of the first linear guide rail and the second linear guide rail capable of moving the first reflecting surface and the second reflecting surface is at least 60 degrees. During measurement, the reflecting surface moves between the starting point and the end point of the reflecting surface linear guide rail along a straight line, the positions of the reflecting surfaces are changed, namely when the positions of the first reflecting surface and the second reflecting surface are respectively located at the position 1 and the position 2, the base station pairs with the angle interval of 30 degrees can be simulated, when the positions of the first reflecting surface and the second reflecting surface are respectively located at the position 3 and the position 4, the base station pairs with the angle interval of 150 degrees can be simulated, and when the positions of the first reflecting surface and the second reflecting surface are respectively located at the position 1 and the position 4 or the position 3 and the position 2, the base station pairs with the angle interval of 90 degrees can be simulated.
Aiming at the defects that in tests such as air interface wireless resource management, the single compact range has low test efficiency and can not realize the measurement of the arrival angles of two or more beams, the invention provides a multi-compact range measurement system, which is used for simultaneously completing the measurement of a plurality of arrival angle beams through a plurality of compact ranges and is very important for improving the test efficiency and the function of equipment needing to carry out simultaneous multi-incoming-wave test.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (10)
1. A multi-compact range measuring system is characterized by comprising a microwave darkroom, a first reflecting surface, a second reflecting surface, a first linear guide rail, a second linear guide rail, a first reflecting surface direction rotating shaft and a second reflecting surface direction rotating shaft, wherein the first reflecting surface, the second reflecting surface, the first linear guide rail, the second linear guide rail, the first reflecting surface direction rotating shaft and the second reflecting surface direction rotating shaft are positioned in the microwave darkroom;
the first reflecting surface azimuth rotating shaft drives the first reflecting surface to rotate and is connected with the first linear guide rail, so that the first reflecting surface moves along the first linear guide rail;
the second reflecting surface azimuth rotating shaft drives the second reflecting surface to rotate and is connected with the second linear guide rail, so that the second reflecting surface moves along the second linear guide rail;
the extension lines of the first linear guide rail and the second linear guide rail are intersected; and moving the first reflecting surface and the second reflecting surface by taking the test point as a center to generate incoming waves in a plurality of directions under the action of the feed source, and generating a compact field quiet zone covering the test point.
2. The multi-compact range measurement system of claim 1,
the central point of the quiet zone is taken as the center, the connecting line of the center of the first reflecting surface and the center of the quiet zone can be rotated by 60 degrees along the first linear guide rail, and the opening surface of the first reflecting surface faces the center of the quiet zone through the rotation of the azimuth rotating shaft of the first reflecting surface;
the central point of the quiet zone is taken as the center, the connecting line of the center of the second reflecting surface and the center of the quiet zone can be rotated by 60 degrees along the second linear guide rail, and the opening surface of the second reflecting surface faces the center of the quiet zone through the rotation of the azimuth rotating shaft of the second reflecting surface;
the horizontal included angle formed by the connecting line of the initial positions of the first reflecting surface and the second reflecting surface and the central point of the quiet zone is 30 degrees.
3. The multi-compact range measurement system of claim 1,
when the first reflecting surface and the second reflecting surface are respectively positioned at the position 1 and the position 2, the included angle of incoming waves received by the equipment to be tested in the quiet zone is 30 degrees;
when the first reflecting surface and the second reflecting surface are respectively positioned at the position 1 and the position 4 or respectively positioned at the position 3 and the position 2, the included angle of incoming waves received by the equipment to be tested in the quiet zone is 90 degrees; when the first reflecting surface and the second reflecting surface are respectively positioned at the position 3 and the position 4, the included angle of incoming waves received by the tested equipment in the quiet zone is 150 degrees.
4. The multi-compact range measurement system of claim 1,
the length L direction of the microwave anechoic chamber is taken as the X-axis direction, the width W direction of the chamber is taken as the Y-axis direction, and the height H direction is taken as the Z-axis direction; the included angle of the X axis of the first linear guide rail is 30 degrees, the typical included angle of the second linear guide rail and the X axis is 60 degrees, and the directions of the two included angles are opposite.
5. The multi-compact range measurement system of claim 1, wherein the length L direction of the micro-chamber is the X-axis direction, the width W direction of the chamber is the Y-axis direction, and the height H direction is the Z-axis direction; the quiet zone is a cylinder, the radius of the bottom surface is r, and the height is g; the constraint relation between the size of the dead zone and the size of the microwave darkroom is as follows: l is more than or equal to 5 × g, W is more than or equal to 8 × r, and H is more than or equal to 8 × r.
6. The multi-compact measuring system according to any one of claims 1 to 5, wherein said first and second reflecting surfaces are identical hemmed compact reflecting surfaces, with typical dimensions of the reflecting surface aperture being 400 to 600 mm.
7. The multi-compact range measurement system according to any one of claims 1 to 5, wherein the first reflection surface azimuth plane rotation axis and the second reflection surface azimuth plane rotation axis are central mechanical rotation axes, and the reflection surfaces are respectively rotated by an angle of 0 ° to 360 °.
8. The multi-compact range measurement system according to any one of claims 1 to 5, wherein the first compact range feed source and the second compact range feed source are dual-polarized broadband feed sources, and the frequency range covers a 5G FR2 frequency range; the two feed sources are controlled by a polarization selection switch to be polarized and turned over, and are respectively connected with a radio frequency circuit and a switch control circuit.
9. A multi-compact range measurement method using the system according to any one of claims 1 to 8, comprising the steps of:
the first reflecting surface guide rail and the second reflecting surface guide rail support the reflecting surface to move along a straight line;
rotating the first reflecting surface orientation rotating shaft and the second reflecting surface orientation rotating shaft to enable the first reflecting surface and the second reflecting surface to face the test point;
through the action of the feed source, the first reflecting surface and the second reflecting surface, the base station incoming waves in multiple directions are simulated, and a compact field quiet zone covering the test point is generated.
10. The multi-compact range measurement method according to claim 9,
the center of the quiet area is taken as the center, the initial included angle of the two reflecting surfaces is 30 degrees, and the movable angle of the center of the first reflecting surface around the center of the quiet area is 60 degrees; the center of the second reflecting surface can move around the center of the dead zone by an angle of 60 degrees, and the base station pair simulation test of typical angles of 30 degrees, 60 degrees, 90 degrees, 120 degrees, 150 degrees and other arbitrary angles is realized.
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| CN114553327A (en) * | 2022-02-16 | 2022-05-27 | 中国信息通信研究院 | System and method for testing wireless resource management consistency of multi-angle-of-arrival millimeter wave terminal |
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