CN112816811A - Management method of convergence terminal aging test system - Google Patents
Management method of convergence terminal aging test system Download PDFInfo
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- CN112816811A CN112816811A CN202011614917.2A CN202011614917A CN112816811A CN 112816811 A CN112816811 A CN 112816811A CN 202011614917 A CN202011614917 A CN 202011614917A CN 112816811 A CN112816811 A CN 112816811A
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- 230000032683 aging Effects 0.000 title claims abstract description 66
- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 238000007726 management method Methods 0.000 title claims abstract description 14
- 238000001514 detection method Methods 0.000 claims abstract description 20
- 238000007689 inspection Methods 0.000 claims abstract description 12
- 238000007619 statistical method Methods 0.000 claims description 3
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- 238000013461 design Methods 0.000 description 1
- 238000007431 microscopic evaluation Methods 0.000 description 1
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
A management method of a fusion terminal aging test system comprises the following steps of S1, recording information of all aging racks in a test system platform in a filing mode; s2, selecting aging racks and station information according to requirements, establishing aging schemes, and correcting each aging scheme; step S3, executing an aging scheme, wherein each scheme is subjected to a flow of 'to be detected- > in detection- > detected'; the 'to-be-detected' state is a default state after the newly added initialization test scheme; in the inspection state, station detection results can be periodically obtained for presentation; the 'inspected' state, after the report is generated, the state of the test scheme is changed from 'inspection' to 'inspected', and the test scheme in the state can be overhauled and analyzed according to the detection result; and step S4, presenting a conclusion in a report form and a pie chart form. The method adopts the flow of aging rack files, testing schemes, execution and dynamic detection of the aging rack epitopes, is convenient for understanding the health state information of the aging rack epitopes and realizes the full utilization of epitope resources.
Description
Technical Field
The invention belongs to the technical field of information acquisition, and particularly relates to a management method of a convergence terminal aging test system.
Background
The management method of the fusion terminal aging test system is to examine whether the hardware performance of a product meets the design requirement of the product in a high-temperature aging environment or not in the production and manufacturing links of user electricity utilization information acquisition system equipment, and mainly detect main hardware performance indexes of storage (Flash, EFROM, I2C, FRam and the like), remote communication, local various channels, a backup power supply, an expansion interface, remote signaling, remote control and the like of the equipment.
Disclosure of Invention
The technical problem to be solved by the invention is to overcome the defects of the prior art, and provide a management method of a fusion terminal aging test system, wherein the aging rack epitopes are dynamically detected by adopting an aging rack file, a test scheme and an execution process, so that the health state information of the aging rack epitopes is conveniently known, and the epitope resources are fully utilized.
The invention provides a management method of a convergence terminal aging test system, which comprises the following steps,
step S1, recording information of all aging racks in a test system platform in a filing mode;
s2, selecting aging racks and station information according to requirements, establishing aging schemes, and correcting each aging scheme;
step S3, executing an aging scheme, wherein each scheme is subjected to a flow of 'to be detected- > in detection- > detected'; the 'to-be-detected' state is a default state after the newly added initialization test scheme;
in the inspection state, station detection results can be periodically obtained for presentation;
the 'inspected' state, after the report is generated, the state of the test scheme is changed from 'inspection' to 'inspected', and the test scheme in the state can be overhauled and analyzed according to the detection result;
and step S4, presenting a conclusion in a report form and a pie chart form.
As a further technical scheme of the invention, in step S1, all burn-in rack models in the system are firstly accessed into the test system platform, the system records burn-in rack information in a filing mode, and after the burn-in rack information files in the system are recorded, the corresponding attribution information of the station to be checked under each burn-in rack is recorded.
Further, in step S2, an aging scheme is established in the test platform, and the aging rack and the station information are configured according to the requirement, and after the scheme is established, the state is "to be checked".
Further, in step S3, after the "execute" operation is performed on the scheme, the status of the scheme is changed to "check" and the scheme in the "check" status can dynamically check the detection status information of the aging rack and the workstation of the scheme, then a report is generated, the detection report information is obtained, and after the report is generated, the status of the scheme is changed to "checked", that is, the scheme is executed completely; and finally, performing statistical analysis on the checked scheme to generate a report and a pie chart.
Furthermore, the pie chart comprises a total fault proportion pie chart, a classification fault proportion pie chart and a complete machine good product proportion pie chart.
The method has the advantages that the aging rack files, the test scheme and the execution overall process are adopted to dynamically detect the aging rack epitopes, so that the health state information of the aging rack epitopes can be more conveniently acquired, and the next step of processing can be reasonably carried out.
By the arrangement of the solution, fusion/modular aging rack epitope information can be conveniently managed, and epitope resources are fully utilized.
Drawings
FIG. 1 is a schematic block diagram of the process flow of the present invention;
FIG. 2 is a schematic diagram of a system burn-in rack access process in the method of the present invention;
FIG. 3 is a schematic flow chart of the aging scheme established in the method of the present invention;
fig. 4 is a schematic diagram of a scheme execution flow in the method of the present invention.
Detailed Description
Referring to fig. 1, the present embodiment provides a management method of a converged terminal burn-in test system, which includes the following steps,
step S1, recording information of all aging racks in a test system platform in a filing mode;
s2, selecting aging racks and station information according to requirements, establishing aging schemes, and correcting each aging scheme;
step S3, executing an aging scheme, wherein each scheme is subjected to a flow of 'to be detected- > in detection- > detected'; the 'to-be-detected' state is a default state after the newly added initialization test scheme;
in the inspection state, station detection results can be periodically obtained for presentation;
the 'inspected' state, after the report is generated, the state of the test scheme is changed from 'inspection' to 'inspected', and the test scheme in the state can be overhauled and analyzed according to the detection result;
and step S4, presenting a conclusion in a report form and a pie chart form.
The key point of the method is as follows,
aging rack and epitope file management: the aging rack in the user electricity collection system equipment and the files of the corresponding epitopes on the aging rack are managed in a unified manner, and are managed in an automatic aging test system in a unified manner, so that the structure level is distinct.
Configuring a test scheme: different test schemes can be established according to different ageing racks and epitopes thereof, and flexible test is realized. Meanwhile, each scheme to be detected can be corrected so as to achieve the feasibility of each detection scheme.
Executing the test scheme: the entire life cycle will be experienced for each set of test protocol "to be examined- > at inspection- > inspected".
The state to be detected is a default state after the newly added initialization test scheme.
And in the inspection state, the station detection result can be periodically acquired for presentation.
And after the report is generated, the state of the test scheme is changed from 'in-test' to 'tested', and the proportion analysis of detecting faults, good products of the whole machine and the like can be carried out on the test scheme in the state.
For all test schemes in the checked state, the historical data information can be checked for unlimited times. Specific test schemes at different time periods can be compared, and valuable reference information can be provided for a new test scheme.
Conclusion viewing: and the conclusion is displayed in a report form and a pie chart (total fault ratio, classification fault ratio and overall good product ratio).
From the macroscopic analysis, the running conditions of various indexes of remote communication, local various channels, a backup power supply, an expansion interface, remote communication, remote control and the like of each aging station can be more visually seen through the detection of each aging rack station device in a high-temperature aging environment.
From the microscopic analysis, after the analysis data (especially the total fault proportion and the classification fault proportion) such as the fault proportion, the overall good product proportion and the like are obtained, the method can be used for fault big data analysis or artificial intelligence fault data analysis, and can well play a corresponding decision-making role in the processing of a production department, a purchasing department, a research and development department and the like.
As shown in fig. 2, in step S1,
system burn-in rack access flow: firstly, all burn-in rack models of a system are accessed in a test system platform, and the burn-in rack information is recorded by the system in a filing mode.
A system aging rack station access process: after the information files of the aging rack in the system are recorded, the information of the station to be detected belonging to a certain aging rack can be recorded.
As shown in fig. 3, in step S2, a burn-in scheme is established in the test platform, and the burn-in rack and the station information can be freely selected. Once the test protocol is established, its state is "suspect".
As shown in fig. 4, in step S3, after the "execute" operation is performed on the test scenario, its status is changed to "check".
The test scheme in the 'inspection' state can dynamically check the execution state of the scheme (the detection state information of the burn-in rack and the workstation). And the master station acquires the detection result when entering the detection interface, and periodically acquires the verification result on each epitope.
Then generating a report, and at the moment, seeing the corresponding detection report information: general list, detail list and unqualified detail list.
After the report is generated, the status of this test solution becomes "checked". Indicating that the scheme has been executed.
Finally, a statistical analysis chart can be viewed for the checked scheme: the method comprises the following steps of total fault item ratio analysis, classification fault ratio analysis and whole machine good product ratio analysis.
The method adopts an 'ageing rack file' -testing scheme '-executing' overall process to dynamically detect the positions of the ageing rack epitopes, so that the health state information of the positions of the ageing rack epitopes can be seen more conveniently, and the next step of processing is carried out reasonably.
By the arrangement of the solution, fusion/modular aging rack epitope information can be conveniently managed, and epitope resources are fully utilized.
The foregoing illustrates and describes the principles, general features, and advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are intended to further illustrate the principles of the invention, and that various changes and modifications may be made without departing from the spirit and scope of the invention, which is intended to be protected by the appended claims. The scope of the invention is defined by the claims and their equivalents.
Claims (5)
1. A management method of a convergence terminal aging test system is characterized by comprising the following steps,
step S1, recording information of all aging racks in a test system platform in a filing mode;
s2, selecting aging racks and station information according to requirements, establishing aging schemes, and correcting each aging scheme;
step S3, executing an aging scheme, wherein each scheme is subjected to a flow of 'to be detected- > in detection- > detected'; the 'to-be-detected' state is a default state after the newly added initialization test scheme;
in the inspection state, station detection results can be periodically obtained for presentation;
the 'inspected' state, after the report is generated, the state of the test scheme is changed from 'inspection' to 'inspected', and the test scheme in the state can be overhauled and analyzed according to the detection result;
and step S4, presenting a conclusion in a report form and a pie chart form.
2. The management method for the converged terminal aging testing system according to claim 1, wherein in the step S1, all aging rack models in the system are firstly accessed in the testing system platform, the system records aging rack information in a filing mode, and after the recording of the aging rack information files in the system is completed, the corresponding attribution information of the station to be inspected under each aging rack is recorded.
3. The management method of the converged terminal burn-in test system according to claim 1, wherein in the step S2, a burn-in scheme is established in the test platform, the burn-in shelf and the station information are configured according to requirements, and after the scheme is established, the status is "to be checked".
4. The management method of the converged terminal aging testing system according to claim 1, wherein in the step S3, after the operation of "executing" the scheme, the status of the scheme is changed to "on-inspection" and "on-inspection" status, the detection status information of the aging rack and the workstation of the scheme can be dynamically checked, then a report is generated, the detection report information is obtained, and after the report is generated, the status of the scheme is changed to "inspected", that is, the scheme is executed completely; and finally, performing statistical analysis on the checked scheme to generate a report and a pie chart.
5. The management method of the converged terminal aging test system according to claim 1 or 4, wherein the pie chart comprises a total fault proportion pie chart, a classification fault proportion pie chart and a total good product proportion pie chart.
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| CN108801896A (en) * | 2018-08-07 | 2018-11-13 | 合肥品特电子有限公司 | A kind of aging testing system |
| CN109918241A (en) * | 2019-02-21 | 2019-06-21 | 广州技象科技有限公司 | A kind of smart lock production test method |
| CN110825020A (en) * | 2019-10-21 | 2020-02-21 | 四川南格尔生物科技有限公司 | Protection monitoring system of full-automatic composition blood collection system |
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2020
- 2020-12-31 CN CN202011614917.2A patent/CN112816811A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104007340A (en) * | 2014-05-21 | 2014-08-27 | 杭州互诚控制技术有限公司 | Electronic product aging test system and aging test method |
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Application publication date: 20210518 |