CN112798927A - System and method for testing large signal index of amplitude limiter chip - Google Patents
System and method for testing large signal index of amplitude limiter chip Download PDFInfo
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- CN112798927A CN112798927A CN202011572718.XA CN202011572718A CN112798927A CN 112798927 A CN112798927 A CN 112798927A CN 202011572718 A CN202011572718 A CN 202011572718A CN 112798927 A CN112798927 A CN 112798927A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
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Abstract
The invention relates to the field of limiter chip testing, in particular to a system and a method for testing a large signal index of a limiter chip. The system is convenient to install, uniform in interface and easy to use, solves the problem that the line of the limiter chip is difficult and the test cannot be carried out, and can enable the test of the large signal index of the limiter chip to be carried out smoothly.
Description
Technical Field
The invention belongs to the field of test of an amplitude limiter chip, and particularly relates to a system and a method for testing a large signal index of the amplitude limiter chip.
Background
The indices of the slicer include a small signal index and a large signal index. The small signal index testing method is simple and accurate, the amplitude limiter can be tested through the microwave probe station and the vector network analyzer, and the large signal index testing is complex, so that errors of testing results are easily caused.
The test of the large signal index of the limiter chip is characterized in that: the test instrument is many, and the adapter is many, and the line is complicated etc.. According to the traditional large-signal test scheme of the amplitude limiter chip, the amplitude limiter chip is directly connected with the power amplifier for testing, and the test method is complex in steps, difficult to calibrate and also has many problems: the signal of the power amplifier can be influenced by the back-stage circuit, the actual output power of the power amplifier cannot be monitored in real time, the power reflected by the amplitude limiter influences the signal transmission of the front-stage circuit, and the accuracy of large signal index testing of the amplitude limiter chip is greatly influenced by the problems. Meanwhile, the area of the limiter chip is small, and the connection is difficult, so that the test of the large signal index of the limiter chip is very difficult.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a system and a method for testing the large signal index of an amplitude limiter chip.
In order to solve the technical problems, the invention adopts the following technical scheme: the utility model provides a test system of amplitude limiter chip large signal index, including the signal source, power amplifier, isolator and the coupler that connect gradually with the signal source, power modulator and the direct current source that connect gradually with power amplifier, first attenuator, second attenuator and circulator that connect with the coupler respectively, first attenuator connects first power meter, and the first load is connected to the second attenuator, and the circulator is connected the second load, still include the amplitude limiter chip testing arrangement who connects gradually with the circulator, third attenuator and second power meter.
In the test system of the large signal index of the amplitude limiter chip, the test device of the amplitude limiter chip comprises a signal input connector, a signal output connector, a test box, a carrier sheet and the amplitude limiter chip to be tested; a signal input connector and a signal output connector are respectively led out from two ends of the test box, the carrier sheet is arranged in the test box, and the limiter chip to be tested is arranged on the carrier sheet; the signal input connector is connected with the circulator, and the signal output connector is connected with the third attenuator.
In the test system for the large signal index of the amplitude limiter chip, the carrier plate is made of molybdenum copper, brass or tungsten copper; the material of the test box is aluminum, copper or iron; the signal input connector and the signal output connector are in SMA, BNC or N type.
A test method of a test system for a large signal index of a limiter chip comprises the following steps: the signal source outputs a signal to the power amplifier, the power amplifier outputs a radio frequency signal to the isolator, the signal with a small power value is coupled out through the coupler, monitoring is carried out through the first power meter, the output power of the power amplifier is calculated according to the coupling degree, and real-time monitoring is achieved; the coupler outputs a radio frequency signal to the circulator from the other path, the circulator outputs the radio frequency signal to the amplitude limiter testing device, and a reflected signal of the amplitude limiter testing device is absorbed by a second load; the output signal of the amplitude limiter test device is input into the second power meter through the third attenuator.
Compared with the prior art, the invention has the beneficial effects that:
the isolator is added, so that the radio-frequency signal can pass in a single direction, the signal cannot be reflected back, and the output power of the power amplifier circuit can be protected from being influenced by a circuit behind;
the output signal of the power amplifier is coupled to a signal with a very small power value by adding the coupler, the output power of the power amplifier is accurately calculated by the coupling degree through monitoring by a power meter, and real-time monitoring is realized;
by adding the circulator, the radio-frequency signal can normally enter the amplitude limiter, and the signal reflected by the amplitude limiter can be absorbed by the load, so that the input power of the amplitude limiter cannot be influenced, and the design can improve the accuracy of the test;
the invention has convenient installation, uniform interface and easy use, and can smoothly test the large signal index of the amplitude limiter chip.
Drawings
FIG. 1 is a schematic flow chart of a test system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a testing apparatus for an amplitude limiter chip according to an embodiment of the present invention;
fig. 3 shows the result of a large signal indicator test, the slice level, of the slicer chip according to an embodiment of the present invention.
The device comprises a signal input connector 1, a signal output connector 2, a test box 3, a carrier sheet 4 and an amplitude limiter chip to be tested 5.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the following embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
The present invention is further illustrated by the following examples, which are not to be construed as limiting the invention.
The embodiment provides a system and a method for testing a large signal index of an amplitude limiter chip, which can avoid a test error, monitor the output power of a power amplifier in real time and ensure the accuracy of a test result. The device can be widely applied to the test of the large signal index of the amplitude limiter chip, solves the problem that the amplitude limiter chip is difficult to connect and cannot be tested, and can ensure that the test can be smoothly carried out.
The method for testing the large signal index of the limiter chip in the embodiment comprises the following steps:
the power amplifier can transmit high-power radio-frequency signals, but the output power of the power amplifier in the traditional test scheme is easily influenced by a rear-stage circuit.
The output power of the power amplifier can not be monitored in real time by the traditional test scheme, the output signal of the power amplifier is coupled to a signal with a very small power value by using the coupler, the output power of the power amplifier can be accurately calculated by the coupling degree through monitoring by using a power meter, and real-time monitoring is realized.
Since the slicer chip will reflect most of the input power back, the accuracy of the slicer chip's large signal index will be affected by using the conventional test method. The circulator is added in the embodiment, the radio frequency signal can normally enter the amplitude limiter, but the signal reflected by the amplitude limiter can be absorbed by the load and cannot influence the input power of the amplitude limiter, and the design can improve the accuracy of the test.
Because the area of the limiter chip is small, the connection is difficult, and the test of the large signal index of the limiter chip is seriously influenced. The limiter chip testing device is adopted in the embodiment, the problem that the limiter chip is difficult to connect and cannot be tested is solved, and the test can be smoothly carried out.
In specific implementation, as shown in fig. 1, a system for testing a large signal index of a limiter chip includes a signal source, a power amplifier, an isolator, and a coupler, which are sequentially connected, a power modulator and a dc source, which are sequentially connected to the power amplifier, a first attenuator, a second attenuator, and a circulator, which are respectively connected to the coupler, a first power meter connected to the first attenuator, a first load connected to the second attenuator, and a limiter chip testing apparatus, a third attenuator, and a second power meter, which are sequentially connected to the circulator. The connection sequence of the equipment is strictly required and is not changeable.
As shown in fig. 2, the limiter chip testing device includes a signal input connector 1, a signal output connector 2, a testing box 3, a carrier plate 4 and a limiter chip 5 to be tested. A signal input connector 1 and a signal output connector 2 are respectively led out from two ends of a test box 3, a carrier sheet 4 is arranged in the test box 3, and an amplitude limiter chip 5 to be tested is arranged on the carrier sheet 4; the signal input connector 1 is connected with the circulator, and the signal output connector 2 is connected with the third attenuator.
Moreover, the material of the carrier plate is molybdenum copper, brass or tungsten copper, etc.; the material of the test box is aluminum, copper, iron and the like; the signal input connector and the signal output connector adopt SMA, BNC, N type and the like.
As shown in fig. 3, the result of the test of the slicer large signal indicator, i.e., the slice level, is performed by using the method for testing the slicer large signal indicator of the present embodiment. In order to ensure that the radio frequency signal passes through in a single direction and no signal is reflected back, the output power of the power amplifier circuit is protected from being influenced by a circuit behind; the present embodiment incorporates an isolator after the power amplifier.
In the embodiment, the output signal of the power amplifier is coupled to a signal with a small power value by using the coupler, the output power of the power amplifier is accurately calculated by using the coupling degree through monitoring by using the power meter, and real-time monitoring is realized.
The circulator is added in the embodiment, so that the radio-frequency signal can normally enter the limiter chip, and the signal reflected by the limiter can be absorbed by the first load, so that the input power of the limiter cannot be influenced, and the design can improve the accuracy of the test;
the limiter chip testing device solves the problem that the limiter chip is difficult to connect and cannot be tested, and the test can be smoothly carried out.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention.
Claims (4)
1. The test system is characterized by comprising a signal source, a power amplifier, an isolator and a coupler which are sequentially connected with the signal source, a power modulator and a direct current source which are sequentially connected with the power amplifier, a first attenuator, a second attenuator and a circulator which are respectively connected with the coupler, wherein the first attenuator is connected with a first power meter, the second attenuator is connected with a first load, and the circulator is connected with a second load.
2. The system for testing the large signal index of the amplitude limiter chip as claimed in claim 1, wherein the amplitude limiter chip testing device comprises a signal input connector, a signal output connector, a testing box, a carrier chip and an amplitude limiter chip to be tested; a signal input connector and a signal output connector are respectively led out from two ends of the test box, the carrier sheet is arranged in the test box, and the limiter chip to be tested is arranged on the carrier sheet; the signal input connector is connected with the circulator, and the signal output connector is connected with the third attenuator.
3. The system for testing the large signal indicator of a limiter chip as claimed in claim 2, wherein the carrier plate is made of molybdenum copper, brass or tungsten copper; the material of the test box is aluminum, copper or iron; the signal input connector and the signal output connector are in SMA, BNC or N type.
4. A method for testing a system for testing a large signal indicator of a limiter chip as claimed in any one of claims 1 to 3, the method comprising: the signal source outputs a signal to the power amplifier, the power amplifier outputs a radio frequency signal to the isolator, the signal with a small power value is coupled out through the coupler, monitoring is carried out through the first power meter, the output power of the power amplifier is calculated according to the coupling degree, and real-time monitoring is achieved; the coupler outputs a radio frequency signal to the circulator from the other path, the circulator outputs the radio frequency signal to the amplitude limiter testing device, and a reflected signal of the amplitude limiter testing device is absorbed by a second load; the output signal of the amplitude limiter test device is input into the second power meter through the third attenuator.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011572718.XA CN112798927A (en) | 2020-12-24 | 2020-12-24 | System and method for testing large signal index of amplitude limiter chip |
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| CN202011572718.XA CN112798927A (en) | 2020-12-24 | 2020-12-24 | System and method for testing large signal index of amplitude limiter chip |
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Application publication date: 20210514 |