CN112763902A - Contact pressure checking method for contact pair - Google Patents
Contact pressure checking method for contact pair Download PDFInfo
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- CN112763902A CN112763902A CN202011580636.XA CN202011580636A CN112763902A CN 112763902 A CN112763902 A CN 112763902A CN 202011580636 A CN202011580636 A CN 202011580636A CN 112763902 A CN112763902 A CN 112763902A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
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Abstract
The invention discloses a contact pressure checking method of a contact pair, which comprises the steps of determining a temperature rise variable of a contact by heating the bottom surface of a first contact; closing the first contact and the second contact to form a contact pair; carrying out opposite current on the contact, and applying a first pressure to obtain a pressure-contact resistance function model; obtaining a pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model; on the basis of the pressure-contact temperature rise function model, the rated contact pressure of the contact pair is checked, so that the phenomenon that the heating temperature of the contact exceeds the allowable temperature rise of the contact when the contact pair normally works, the contact is softened, melted or even welded can not occur, and the safety and the reliability of a contact system are ensured.
Description
Technical Field
The invention relates to the field of electric appliances, in particular to a contact pressure checking method of a contact pair.
Background
The contact is an important component of the switching device, the contact pressure is a basic parameter of the contact, the contact resistance is directly influenced by the contact pressure, and the contact resistance is related to the temperature rise of the contact. When other parameters of the contact are kept unchanged, the contact resistance of the contact is higher as the contact pressure of the contact is smaller, the temperature rise of the contact is higher, and the contact is more seriously corroded. When the temperature rise of the contact exceeds the maximum allowable temperature rise or even is higher, the contact is softened, melted or even welded, so that the safe and reliable operation of a contact system is influenced.
The temperature rise of the contact mainly depends on the contact resistance and the magnitude of the electrified current, and in order to ensure that the temperature rise of the contact is within a reasonable range, the contact resistance is small and stable, so that proper contact pressure needs to be selected. The contact pressure cannot be generally less than a certain prescribed value. However, at present, there is no formula for calculating the temperature rise of the contact through pressure, even if there is no accurate formula between pressure and contact resistance, the contact resistance of the contact can only be estimated by an empirical formula of the contact resistance in engineering. For a clean and contamination-free contact surface of the contact (contact surface without surface film), the contact resistance of the contact can be calculated from the contact pressure according to the following formula:
however, to calculate the contact resistance from the pressure, the following parameters must first be obtained: the empirical coefficient eta, the correction coefficient xi and the contact material hardness H, but the parameters are not easy to determine, and the calculation of the contact resistance by the formula is inconvenient. At present, no relevant formula can accurately calculate the highest temperature rise of the contact according to the contact resistance of the contact, and no available method is used for measuring or calculating the temperature rise of the contact through the contact pressure of the contact.
Disclosure of Invention
The invention mainly aims to provide a method for checking the contact pressure of a contact pair, which checks the rated contact pressure of the contact through the allowable temperature rise of the contact, thereby protecting the contact and ensuring the safety and the reliability of a contact system.
In order to achieve the purpose, the invention provides the following technical scheme:
a contact pressure checking method of a contact pair comprises a first contact and a second contact, wherein the first contact comprises a first contact body and a first contact point arranged on the bottom surface of the first contact; the second contact comprises a second contact body and a second contact point arranged on the bottom surface of the second contact body, and the contact pressure checking method of the contact pair comprises the following steps:
heating the bottom surface of the first contact body, and determining a temperature rise variable of the contact;
closing the first contact and the second contact to form a contact pair;
applying current to the contact pair, applying a first pressure to the contact pair, and measuring a first contact resistance corresponding to the first pressure;
obtaining a pressure-contact resistance function model of the contact resistance corresponding to the pressure according to the first pressure and the first contact resistance;
obtaining a pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model;
and checking whether the rated contact pressure of the contact pair is qualified or not based on the pressure-contact temperature rise function model.
Optionally, heating the bottom surface of the first contact body, and determining the contact temperature rise variable specifically includes:
heating the lower bottom surface of the first contact body, and measuring the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body after the temperature rise of the first contact reaches stable temperature rise;
obtaining a contact temperature rise variable according to the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body;
the lower bottom surface of the first contact body is a surface of the first contact body, which is contacted with the second contact body;
the upper bottom surface of the first contact body is a surface of the first contact body which is not in contact with the second contact body, and the upper bottom surface of the first contact body is opposite to the lower bottom surface of the first contact body.
Optionally, the obtaining a contact temperature rise variable according to the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body specifically includes:
according to the formula
Obtaining the temperature rise variable of the contact;
where α represents the temperature rise of the contact, h represents the length of the first contact, τm' denotes the temperature rise, τ, of the lower bottom surface of the first contact body0' denotes a temperature rise of the upper bottom surface of the first contact body.
Optionally, the obtaining, according to the first pressure and the first contact resistance, a pressure-contact resistance function model of a contact resistance corresponding to the pressure and the pressure specifically includes:
according to the formula
Obtaining the pressure-contact resistance function model;
wherein, F1Is a first pressure, Rs1Is a first contact resistance, F is a pressure, RjIs the contact resistance.
Optionally, the obtaining a pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model specifically includes:
substituting the pressure-contact resistance function model into a contact resistance-contact temperature rise function model
Wherein, taudDenotes the maximum temperature rise, τ, of the first contact0The temperature rise of the upper bottom surface of the first contact body is represented, I represents the energizing current of the contact pair, rho represents the resistivity of the contact material, lambda represents the thermal conductivity of the contact material, A represents the cross-sectional area of the contact, h represents the length of the first contact, alpha represents a contact temperature rise variable, and e represents a natural constant.
Optionally, the verifying whether the rated contact pressure of the contact pair is qualified based on the pressure-contact temperature rise function model specifically includes:
obtaining the minimum contact pressure of the contact pair according to the allowable temperature rise of the contact based on the pressure-contact temperature rise function model; the allowable temperature rise of the contact is a critical value of the temperature rise borne by the contact;
and verifying whether the rated contact pressure of the contact pair is qualified or not according to the minimum contact pressure and the rated contact pressure.
Optionally, the verifying whether the rated contact pressure of the contact pair is qualified according to the minimum contact pressure and the rated contact pressure specifically includes:
when the rated contact pressure is smaller than the minimum contact pressure, judging that the rated contact pressure of the contact pair is not qualified in verification;
and when the rated contact pressure is greater than or equal to the minimum contact pressure, judging that the rated contact pressure of the contact pair is qualified.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects:
the contact pressure checking method of the contact pair of the invention is to electrify the contact pair and apply pressure to obtain a pressure-contact resistance function model; obtaining a pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model; and checking the rated contact pressure of the contact pair based on the pressure-contact temperature rise function model so as to protect the contact.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a flow chart of a contact pressure verification method for a contact pair according to the present invention;
FIG. 2 is a schematic view of a contact pair illustrating a contact pressure verification method according to the present invention;
FIG. 3 is a temperature rise-pressure change curve at different currents for the contact pressure verification method of the contact pair of the present invention.
Description of the symbols:
1-the first contact, 2-the second contact.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The contact pressure checking method of the contact pair obtains the temperature rise variable of the contact by heating the contact; applying current and pressure to the contact pair to obtain a pressure-contact resistance function model; obtaining a pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model; and checking the rated contact pressure of the contact pair on the basis of the pressure-contact temperature rise function model.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
The contact pressure checking method of the contact pair adopts a clean pollution-free contact; since the contacts are free from contamination and oxidation, it is considered that there is no film resistance between the contacts, and the shrinkage resistance between the contacts is the contact resistance.
In most cases, the deformation of the contact patch is plastic. Actual contact area A of the contact patchcOnly with respect to the pressure force F and the hardness H of the contact material, and not with respect to the apparent contact area and the dimensions of the contact elements.
F＝ξAcAnd H, wherein xi is a correction coefficient.
Therefore, the equivalent radius a of the conductive patch is calculated as follows:
Ac＝ηπa2η is an empirical coefficient, and since this example studies a clean contact surface, η is 1.
Therefore, the contact resistance, i.e., the shrinkage resistance, of the contact can be calculated as follows:
the contact pressure checking method of the contact pair comprises a first contact and a second contact, wherein the first contact comprises a first contact body and a first contact arranged on the bottom surface of the first contact body; the second contact comprises a second contact body and a second contact point arranged on the bottom surface of the second contact body.
As shown in fig. 1, the method for checking the contact pressure of the contact pair of the present invention comprises:
step 100: heating the bottom surface of the first contact body, and determining a temperature rise variable of the contact;
heating the lower bottom surface of the first contact body when no current flows, and measuring the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body after the temperature rise of the first contact reaches stable temperature rise;
obtaining a contact temperature rise variable according to the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body;
the lower bottom surface of the first contact body is a surface of the first contact body, which is contacted with the second contact body;
the upper bottom surface of the first contact body is a surface of the first contact body which is not in contact with the second contact body, and the upper bottom surface of the first contact body is opposite to the lower bottom surface of the first contact body.
In particular, by the formula τm′＝τ0′eα·hTo obtain
According to the formula
Obtaining the temperature rise variable of the contact;
where α represents the temperature rise of the contact, h represents the length of the first contact, τm' denotes the temperature rise, τ, of the lower bottom surface of the first contact body0' denotes a temperature rise of the upper bottom surface of the first contact body.
Step 200: closing the first contact and the second contact to form a contact pair; as shown in fig. 2.
Step 300: applying current to the contact pair, applying a first pressure to the contact pair, and measuring a first contact resistance corresponding to the first pressure;
specifically, rated current is applied to the contact pair, first pressure is applied, first contact pressure and first contact resistance are generated at the contact surface of the first contact body and the second contact body, and the size of the first contact resistance is measured.
The magnitude of the first contact pressure is consistent with the magnitude of the first pressure.
Step 400: obtaining a pressure-contact resistance function model of the contact resistance corresponding to the pressure according to the first pressure and the first contact resistance;
in particular, based on a formula
From the known first pressure and the measured first contact resistance, η ξ π H is calculated.
When any pressure F is applied to the contact pair, based on the formula
Obtaining contact resistance of the contact
Thus, according to the formula
And obtaining a pressure-contact resistance function model. Wherein, F1Is a first pressure, Rs1Is a first contact resistance, F is a pressure, RjIs the contact resistance.
Step 500: obtaining a pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model;
specifically, substituting the pressure-contact resistance function model into the contact resistance-contact temperature rise function model
Obtaining a pressure-contact temperature rise function model
Wherein, taudDenotes the maximum temperature rise, τ, of the first contact0Showing the temperature rise of the upper bottom surface of the first contact body, I showing the energizing current of the contact pair, ρ showing the resistivity of the contact material, λ showing the thermal conductivity of the contact material, A showing the cross-sectional area of the contact, h showing the length of the first contact, α showing the temperature rise of the contactThe variables, e, and F, represent the natural constants and the contact pressure of the contact pair.
Step 600: and checking whether the rated contact pressure of the contact pair is qualified or not based on the pressure-contact temperature rise function model.
Specifically, based on the pressure-contact temperature rise function model, the minimum contact pressure of the contact pair is obtained according to the allowable temperature rise of the contact; wherein the allowable temperature rise of the contact is a critical value of the temperature rise borne by the contact.
And verifying whether the rated contact pressure of the contact pair is qualified or not according to the minimum contact pressure and the rated contact pressure.
When the rated contact pressure is smaller than the minimum contact pressure, judging that the rated contact pressure of the contact pair is unqualified; specifically, because the contact pressure of the contact pair directly affects the contact resistance of the contact pair, the contact resistance of the contact pair is higher as the contact pressure is lower, and the contact temperature is higher, which may cause the contact to soften, melt or melt. Therefore, when the rated contact pressure is less than the minimum contact pressure, the rated contact pressure of the contact pair is not qualified, and recalibration is required.
When the rated contact pressure is larger than or equal to the minimum contact pressure, judging that the rated contact pressure of the contact pair is qualified; specifically, because the contact pressure of the contact pair directly affects the contact resistance of the contact pair, the contact resistance is smaller the larger the contact pressure of the contact pair is, the lower the temperature rise of the contact is, and the contact pair can work normally. Therefore, the rated contact pressure of the contact pair is qualified.
FIG. 3 is a graph of the pressure-contact temperature rise function model at different currents (curve a is I ═ I)1The temperature rise change curve of the contact under different pressures, and the curve b is I ═ I2The temperature rise change curve of the contact under different pressures, and the curve c is I ═ InTemperature rise curve of contact at different pressures) and I1＜I2<……<In. Wherein tau iswFor the permissible temperature rise of the contact, according to the permissible temperature rise of the contact, in the pressureAnd obtaining the minimum contact pressure under different current conditions in the force-contact temperature rise function model. As can be seen from fig. 3, the larger the current applied to the contacts, the larger the corresponding minimum contact pressure of the contacts.
The method for checking the contact pressure of the contact pair can ensure that the rated contact pressure of the contact is greater than the contact pressure corresponding to the allowable temperature rise of the contact, ensure that the temperature rise of the contact in work does not exceed the standard, and can also determine the range of the rated contact pressure of a newly manufactured contact pair.
The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, this description should not be taken as limiting the invention.
Claims (7)
1. A contact pressure checking method of a contact pair comprises a first contact and a second contact, wherein the first contact comprises a first contact body and a first contact point arranged on the bottom surface of the first contact body; the second contact comprises a second contact body and a second contact point arranged on the bottom surface of the second contact body, and is characterized in that the contact pressure checking method of the contact pair comprises the following steps:
heating the bottom surface of the first contact body, and determining a temperature rise variable of the contact;
closing the first contact and the second contact to form a contact pair;
applying current to the contact pair, applying a first pressure to the contact pair, and measuring a first contact resistance corresponding to the first pressure;
obtaining a pressure-contact resistance function model of the contact resistance corresponding to the pressure according to the first pressure and the first contact resistance;
obtaining a pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model;
and checking whether the rated contact pressure of the contact pair is qualified or not based on the pressure-contact temperature rise function model.
2. The method for verifying contact pressure of a contact pair according to claim 1, wherein the step of heating the bottom surface of the first contact body and determining the temperature rise of the contact comprises:
heating the lower bottom surface of a first contact body, and measuring the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body after the temperature rise of the first contact reaches stable temperature rise;
obtaining a contact temperature rise variable according to the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body;
the lower bottom surface of the first contact body is a surface of the first contact body, which is contacted with the second contact body;
the upper bottom surface of the first contact body is a surface of the first contact body which is not in contact with the second contact body, and the upper bottom surface of the first contact body is opposite to the lower bottom surface of the first contact body.
3. The method for checking contact pressure of a contact pair according to claim 2, wherein the obtaining of the contact temperature rise variable according to the temperature rise of the lower bottom surface of the first contact body and the temperature rise of the upper bottom surface of the first contact body specifically comprises:
according to the formula
Obtaining the temperature rise variable of the contact;
where α represents the temperature rise of the contact, h represents the length of the first contact, τm' denotes the temperature rise, τ, of the lower bottom surface of the first contact body0' denotes a temperature rise of the upper bottom surface of the first contact body.
4. The method for checking contact pressure of a contact pair according to claim 1, wherein the obtaining a pressure-contact resistance function model of the contact resistance corresponding to the pressure according to the first pressure and the first contact resistance specifically comprises:
according to the formula
Obtaining the pressure-contact resistance function model;
wherein, F1Is a first pressure, Rs1Is a first contact resistance, F is a pressure, RjIs the contact resistance.
5. The method for checking contact pressure of a contact pair according to claim 4, wherein the obtaining of the pressure-contact temperature rise function model according to the pressure-contact resistance function model and the contact resistance-contact temperature rise function model specifically comprises:
substituting the pressure-contact resistance function model into a contact resistance-contact temperature rise function model
Wherein, taudDenotes the maximum temperature rise, τ, of the first contact0The temperature rise of the upper bottom surface of the first contact body is represented, I represents the energizing current of the contact pair, rho represents the resistivity of the contact material, lambda represents the thermal conductivity of the contact material, A represents the cross-sectional area of the contact, h represents the length of the first contact, alpha represents a contact temperature rise variable, and e represents a natural constant.
6. The method for checking contact pressure of a contact pair according to claim 1, wherein the step of checking whether the rated contact pressure of the contact pair is qualified or not based on the pressure-contact temperature rise function model specifically comprises the steps of:
obtaining the minimum contact pressure of the contact pair according to the allowable temperature rise of the contact based on the pressure-contact temperature rise function model; the allowable temperature rise of the contact is a critical value of the temperature rise borne by the contact;
and verifying whether the rated contact pressure of the contact pair is qualified or not according to the minimum contact pressure and the rated contact pressure.
7. The method for checking contact pressure of a contact pair according to claim 6, wherein the step of checking whether the rated contact pressure of the contact pair is qualified according to the minimum contact pressure and the rated contact pressure specifically comprises the steps of:
when the rated contact pressure is smaller than the minimum contact pressure, judging that the rated contact pressure of the contact pair is not qualified in verification;
and when the rated contact pressure is greater than or equal to the minimum contact pressure, judging that the rated contact pressure of the contact pair is qualified.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5540958A (en) * | 1978-09-18 | 1980-03-22 | Toshiba Corp | Improper contact detector for switch unit |
| JP2009186563A (en) * | 2008-02-04 | 2009-08-20 | Sharp Corp | Fixing device and image forming apparatus |
| CN202975164U (en) * | 2012-12-18 | 2013-06-05 | 华中科技大学 | Device for measuring contact resistance of heavy-current switch |
| CN107422256A (en) * | 2017-07-03 | 2017-12-01 | 三峡大学 | A kind of temperature rise estimating and measuring method of high-voltage switch electric appliance contact void contact heating |
| CN112033571A (en) * | 2020-09-01 | 2020-12-04 | 国网重庆市电力公司电力科学研究院 | Temperature rise test method and system for GIS isolating switch |
-
2020
- 2020-12-28 CN CN202011580636.XA patent/CN112763902B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5540958A (en) * | 1978-09-18 | 1980-03-22 | Toshiba Corp | Improper contact detector for switch unit |
| JP2009186563A (en) * | 2008-02-04 | 2009-08-20 | Sharp Corp | Fixing device and image forming apparatus |
| CN202975164U (en) * | 2012-12-18 | 2013-06-05 | 华中科技大学 | Device for measuring contact resistance of heavy-current switch |
| CN107422256A (en) * | 2017-07-03 | 2017-12-01 | 三峡大学 | A kind of temperature rise estimating and measuring method of high-voltage switch electric appliance contact void contact heating |
| CN112033571A (en) * | 2020-09-01 | 2020-12-04 | 国网重庆市电力公司电力科学研究院 | Temperature rise test method and system for GIS isolating switch |
Non-Patent Citations (1)
| Title |
|---|
| 任万滨等: ""铆钉电触头接触温升与接触电阻特性研究"", 《电器与能效管理技术》 * |
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Application publication date: 20210507 Assignee: WENZHOU CHENG XIN ELECTRONICS Co.,Ltd. Assignor: Wenzhou University Contract record no.: X2022330000814 Denomination of invention: A method for checking contact pressure of contact pairs Granted publication date: 20220325 License type: Common License Record date: 20221221 |
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