CN112763787A - Industrial computer voltage stability testing method - Google Patents
Industrial computer voltage stability testing method Download PDFInfo
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- CN112763787A CN112763787A CN202110067980.7A CN202110067980A CN112763787A CN 112763787 A CN112763787 A CN 112763787A CN 202110067980 A CN202110067980 A CN 202110067980A CN 112763787 A CN112763787 A CN 112763787A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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Abstract
The invention discloses a voltage stability testing method for an industrial computer. The method takes a power supply diagram and a circuit schematic diagram of a test complete machine as test references, simulates the using environment and mode of a customer, and carries out simulation test even if the DC voltage values output by the DC-DC switching voltage stabilizer in the complete machine are the same and the peripheral devices are different. The method simulates the normal running state of the whole machine, and simulates the influence of the voltage fluctuation on the working state of the whole system when the load transient change is carried out on the direct-current voltage output by the DC-DC switching voltage stabilizer in a power supply, a mainboard, an internal memory, a hard disk and the like of the industrial computer. The method finds the incentive and plans a solution for the product in the development stage so as to improve the stability of the product carrying and reduce the reject ratio and the after-sale cost. The method can greatly improve the aspects of performance, efficiency, service life, low cost of the test tool and the like, optimize the development performance index of the whole machine, strengthen the stability of the product under variable actual conditions and improve the competitiveness of the product.
Description
Technical Field
The invention relates to an industrial computer, in particular to a voltage stability testing method for the industrial computer.
Background
The existing voltage test of the industrial computer mainly depends on a multimeter and an oscilloscope to test the voltage value in a normal working state, and because the types and the quantity of the external devices of the industrial computer are more and more at present, higher requirements are provided for the compatibility and the use stability of the external devices of the industrial computer, and certain defects and deficiencies exist in the analysis and the test of the influence of the working state of the voltage on the whole computer when the load is changed in a transient state at present. At the research and development stage of the existing industrial computer, the model selection and matching are carried out according to the requirements of customers, and finally the assembling of a machine is completed, so that a strict circuit design analysis link is lacked, particularly, the existing industrial computer is developed, the application range is wider and wider, the types of peripheral devices are more and more, the voltage is required to be kept stable when the external transient state changes, the use requirement of the performance of the whole computer is further met, and the existing standard cannot be met by a common test method.
Disclosure of Invention
In view of the state of the art and the deficiencies in the prior art, the present invention provides a method for testing voltage stability of an industrial computer. The method simulates the normal running state of the whole machine by using an oscilloscope, a voltage probe, a current clamp and a universal meter to connect a variable resistance box, a variable frequency power supply, a display, various peripheral devices and other equipment together, and simulates the influence of the fluctuation of voltage on the working state of the whole system when load transient change on the direct current voltage output by a DC-DC switching voltage stabilizer in a power supply, a mainboard, a memory, a hard disk and various electronic functional modules in an industrial computer. The method finds the incentive and plans a solution for the product in the development stage so as to improve the stability of the product carrying and reduce the reject ratio and the after-sale cost.
The technical scheme adopted by the invention is as follows: a voltage stability testing method for an industrial computer is characterized by comprising the following steps:
step one, according to the test data of the whole machine, the power supply voltage value of the whole machine power supply at each circuit module is known.
And step two, confirming the actual voltage identification on the circuit board of the whole testing machine, wherein the actual voltage identification is consistent with the name of the direct current voltage output by the circuit schematic diagram.
Testing resistance values at two ends of the variable resistance box by using resistance levels of the universal meter, sequentially pressing the switching keys of the resistance levels, displaying the resistance value of 0 by the universal meter when the button is switched off, displaying the resistance value of the current test nominal resistance value by the universal meter when the button is switched on, and confirming that the state of the variable resistance box is normal; and finally, the opening and closing key of each resistance gear is in an off state.
And step four, the oscilloscope is powered by a variable frequency power supply, after the oscilloscope is started, a run button is pressed, a DC coupling mode and a Sample sampling mode are selected, and after the oscilloscope is aged for 15 minutes, the voltage probe and the current clamp are respectively connected to a CH1 channel and a CH2 channel on the oscilloscope to perform calibration and aging for 10 minutes.
Step five, the testing complete machine is in a shutdown state, the peripheral is connected to the testing complete machine, and the display is connected with the testing complete machine; connecting one end of a voltage probe grounding end and a variable resistance box to a GND end of a test complete machine circuit board, and connecting the other end of the voltage probe and the variable resistance box to a certain voltage output end on the test complete machine circuit board; the current clamp is connected to the output end for testing the voltage on the circuit board of the whole machine.
Step six, the testing complete machine is powered by a variable frequency power supply, after the testing complete machine is started, the sampling rate of the oscilloscope is adjusted to be 10MS/s, the horizontal scale is set to be 10MS/div, the vertical scale of the CH1 channel is set to be 1V/div, and the max, mean, min and pk-pk are selected as testing values; setting the vertical scale of the CH2 channel as 800mA/div, selecting max, rms and min as test values, and recording the test values; the CH1 channel coupling mode was selected for AC coupling, the channel vertical scale was set to 20mV/div, and the pk-pk value for CH1 for this state was recorded.
And step seven, testing the shutdown of the whole machine, connecting a current clamp between a variable resistance box and a voltage test point of a circuit board of the whole machine, testing the whole machine, starting the machine, adjusting the sampling rate of the oscilloscope to be 1MS/S, setting the horizontal scale to be 1S/div, selecting AC coupling in a CH1 channel coupling mode, setting the vertical scale of a CH1 channel to be 80mV/div, setting the vertical scale of a CH2 channel to be 300mA/div, closing a first resistance switch of the adjustable resistance box, disconnecting after 5S, continuously keeping the waveform for 2S, pressing a stop button on the oscilloscope, stopping the waveform on the screen of the oscilloscope, storing the waveform, observing the direction change of CH1 and CH2 waveforms at the moment of loading and disconnecting the resistance, sequentially increasing the resistance of the resistance box and repeating the test according to the load design requirements of a power supply diagram and a circuit principle diagram, and storing and observing the diagram.
And step eight, for other voltage test points of the test complete machine, repeating the test from the step five to the step eight, and after the test is finished, shutting down the test complete machine and shutting down other test equipment.
And step nine, analyzing and sorting the test data.
The beneficial effects produced by the invention are as follows: the invention can greatly improve the aspects of performance, efficiency, service life, low cost of testing tools and the like, optimizes the development performance index of the whole machine, strengthens the stability of products under variable actual conditions, and improves the competitiveness of the products.
Drawings
FIG. 1 is a test flow diagram of an embodiment of the present invention.
Detailed Description
The invention is further illustrated by the following figures and examples.
The invention takes a power supply diagram and a circuit schematic diagram of a test complete machine as test references, simulates the using environment and mode of a client, and carries out simulation test even if the DC voltage values output by the DC-DC switching voltage stabilizer in the complete machine are the same and the peripheral devices are different.
And (3) testing temperature: the lowest working temperature, the normal temperature and the highest working temperature.
An oscilloscope sampling mode: set to Sample mode.
Setting a load: setting the starting point and the stopping point of the load current, the rising rate and the falling rate of the load current and the change period of the load current according to the requirements of a power supply diagram and a circuit schematic diagram, and adjusting the change period of the load current according to the specification requirement after starting.
Variable resistance box: different resistance values are set, and the load value change of the resistor in the circuit of the whole testing machine is adjusted.
The specific test method comprises the following steps:
1. and according to the test data of the whole machine, the power supply voltage value of the whole machine power supply at each circuit module is known.
2. The actual voltage identification on the test complete machine circuit board is confirmed to be consistent with the DC voltage name (such as +12V, +5V, +3.3V, +5VSB and the like) output by the circuit schematic diagram.
3. Testing resistance values at two ends of the variable resistance box by using resistance levels of a universal meter, sequentially pressing the resistance level switching keys, displaying the resistance value of 0 by the universal meter when the button is switched off, displaying the resistance value of the current test nominal resistance value by the universal meter when the button is switched on, and confirming that the state of the variable resistance box is normal; and finally, the opening and closing key of each resistance gear is in an off state.
4. The oscilloscope is powered by a variable frequency power supply, after the oscilloscope is started, a run button is pressed, a DC coupling mode and a Sample sampling mode are selected, and after the oscilloscope is aged for 15 minutes, a voltage probe and a current clamp are respectively connected to a CH1 channel and a CH2 channel on the oscilloscope to perform calibration and aging for 10 minutes.
5. The test complete machine is in a shutdown state, external devices (including a serial port tool, a USB load, a network cable, a sound load, a printing load and the like) are connected to the test complete machine, and the display is connected with the test complete machine. One end of the voltage probe grounding end and one end of the variable resistance box are connected with a GND end of the whole circuit board to be tested, and the other end of the voltage probe and the other end of the variable resistance box are connected with a certain voltage output end (for example, + 5V) on the whole circuit board to be tested. The current clamp is connected to the output terminal of the test voltage.
6. The test complete machine is powered by a variable frequency power supply, after the test complete machine is started, the sampling rate of the oscilloscope is adjusted to be 10MS/s, the horizontal scale is set to be 10MS/div, the vertical scale of the CH1 channel is set to be 1V/div, the test value is selected to be max, mean, min, pk-pk, the vertical scale of the CH2 channel is set to be 800mA/div, the test value is selected to be max, rms and min, the test values are recorded, the CH1 channel coupling mode is selected to be AC coupling, the vertical scale of the channel is set to be 20mV/div, and the CH1 pk-pk value (voltage ripple value) in the state is recorded.
7. The test complete machine is shut down, a current clamp is connected between a variable resistance box and a test complete machine circuit board voltage test point, the test complete machine is started, the sampling rate of an oscilloscope is adjusted to be 1MS/S, the horizontal scale is set to be 1S/div, the CH1 channel coupling mode selects AC coupling, the vertical scale of a CH1 channel is set to be 80mV/div, the vertical scale of a CH2 channel is set to be 300mA/div, a first resistance value (1 ohm) switch of the adjustable resistance box is closed, the adjustable resistance box is opened after lasting for 5S, the waveform is kept for 2S continuously, pressing stop button on oscilloscope, stopping waveform on the screen of oscilloscope, storing the waveform, observing the direction change of CH1 and CH2 waveform at the moment of loading and breaking resistor, and sequentially increasing the resistance value of the resistance box and repeating the test according to the load design requirements of the power supply diagram and the circuit schematic diagram, and storing and observing the graph.
8. In the process of the test, the change curve is observed, the ring phenomenon can not occur, meanwhile, the test whole machine can not work unstably, the picture output is abnormal, the peripheral works abnormally, and the shutdown can not be performed.
9. And repeating the test steps of 5-8 for other voltage test points of the whole testing machine. And after the test is finished, the test whole machine is shut down, and other tests are standby for shutdown.
10. And analyzing and sorting test data.
Claims (1)
1. A voltage stability testing method for an industrial computer is characterized by comprising the following steps:
step one, knowing the power supply voltage value of the power supply of the complete machine power supply at each circuit module according to the test data of the complete machine;
step two, confirming the actual voltage identification on the circuit board of the whole testing machine, wherein the actual voltage identification is consistent with the name of the direct current voltage output by the circuit schematic diagram;
testing resistance values at two ends of the variable resistance box by using resistance levels of the universal meter, sequentially pressing the switching keys of the resistance levels, displaying the resistance value of 0 by the universal meter when the button is switched off, displaying the resistance value of the current test nominal resistance value by the universal meter when the button is switched on, and confirming that the state of the variable resistance box is normal; finally, each resistance gear opening and closing key is in an off state;
step four, the oscilloscope is powered by a variable frequency power supply, after the oscilloscope is started, a run button is pressed, a DC coupling mode and a Sample sampling mode are selected, and after the oscilloscope is aged for 15 minutes, the voltage probe and the current clamp are respectively connected to a CH1 channel and a CH2 channel on the oscilloscope to perform calibration and aging for 10 minutes;
step five, the testing complete machine is in a shutdown state, the peripheral is connected to the testing complete machine, and the display is connected with the testing complete machine; connecting one end of a voltage probe grounding end and a variable resistance box to a GND end of a test complete machine circuit board, and connecting the other end of the voltage probe and the variable resistance box to a certain voltage output end on the test complete machine circuit board; the current clamp is connected to the output end of the voltage on the circuit board of the whole test machine;
step six, the testing complete machine is powered by a variable frequency power supply, after the testing complete machine is started, the sampling rate of the oscilloscope is adjusted to be 10MS/s, the horizontal scale is set to be 10MS/div, the vertical scale of the CH1 channel is set to be 1V/div, and the max, mean, min and pk-pk are selected as testing values; setting the vertical scale of the CH2 channel as 800mA/div, selecting max, rms and min as test values, and recording the test values; selecting AC coupling for the CH1 channel coupling mode, setting the vertical scale of the channel to be 20mV/div, and recording the pk-pk value of CH1 of the state;
step seven, testing the shutdown of the whole machine, connecting a current clamp between a variable resistance box and a voltage test point of a circuit board of the whole machine, testing the whole machine, starting the whole machine, adjusting the sampling rate of an oscilloscope to be 1MS/S, setting the horizontal scale to be 1S/div, selecting AC coupling in a CH1 channel coupling mode, setting the vertical scale of a CH1 channel to be 80mV/div, setting the vertical scale of a CH2 channel to be 300mA/div, closing a first resistance switch of the adjustable resistance box, disconnecting after lasting for 5S, continuously keeping the waveform for 2S, pressing a stop button on the oscilloscope, stopping the waveform on the screen of the oscilloscope, storing the waveform, observing the direction change of CH1 and CH2 waveforms at the moment of loading and disconnecting the resistance, sequentially increasing the resistance of the resistance box and repeating the test according to the load design requirements of a power supply diagram and a circuit principle diagram, storing and observing the diagram;
step eight, for other voltage test points of the test complete machine, repeating the test from the step five to the step eight, and after the test is finished, shutting down the test complete machine and shutting down other test equipment;
and step nine, analyzing and sorting the test data.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202110067980.7A CN112763787A (en) | 2021-01-19 | 2021-01-19 | Industrial computer voltage stability testing method |
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| CN202110067980.7A CN112763787A (en) | 2021-01-19 | 2021-01-19 | Industrial computer voltage stability testing method |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1629818A (en) * | 2003-12-16 | 2005-06-22 | 联想(北京)有限公司 | Computer stability test system and method |
| CN104459566A (en) * | 2014-12-09 | 2015-03-25 | 西京学院 | Secondary electric power supply testing system and method |
| CN107390140A (en) * | 2017-07-21 | 2017-11-24 | 北京小米移动软件有限公司 | The method of testing and equipment of power supply |
-
2021
- 2021-01-19 CN CN202110067980.7A patent/CN112763787A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1629818A (en) * | 2003-12-16 | 2005-06-22 | 联想(北京)有限公司 | Computer stability test system and method |
| CN104459566A (en) * | 2014-12-09 | 2015-03-25 | 西京学院 | Secondary electric power supply testing system and method |
| CN107390140A (en) * | 2017-07-21 | 2017-11-24 | 北京小米移动软件有限公司 | The method of testing and equipment of power supply |
Non-Patent Citations (2)
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| 2105194781: "《是德科技开关电源环路响应（伯德图）测试》", 《百度》 * |
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Application publication date: 20210507 |