CN112748300A - Test method, test device and test system for microwave equipment - Google Patents

Test method, test device and test system for microwave equipment Download PDF

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Publication number
CN112748300A
CN112748300A CN202011555931.XA CN202011555931A CN112748300A CN 112748300 A CN112748300 A CN 112748300A CN 202011555931 A CN202011555931 A CN 202011555931A CN 112748300 A CN112748300 A CN 112748300A
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China
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instruction
test signal
test
microwave
testing
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常婷
赵志峰
徐波
安瑞康
陈洁
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XI'AN AVIONICS TECHNOLOGY CO LTD
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XI'AN AVIONICS TECHNOLOGY CO LTD
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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Abstract

The invention belongs to the field of microwave equipment, and discloses a test method, a test device and a test system of microwave equipment, which comprise the following steps: acquiring a first test signal selection instruction, and selecting a target test signal instruction from a plurality of preset test signal instructions according to the first test signal selection instruction; sending a target test signal instruction to a microwave radio frequency device; and acquiring a second test signal selection instruction, selecting the second test signal instruction from a plurality of preset test signal instructions according to the second test signal selection instruction, selecting and carrying out logic processing on the second test signal instruction according to the switching processing logic instruction from a plurality of preset switching processing logic instructions, switching the target test signal instruction into the second test signal instruction after logic processing, receiving and analyzing all test feedback signals sent by the microwave equipment to be tested, and obtaining a test result. The requirement on the professional level of a tester is greatly reduced, a large amount of testing time is saved, and the testing efficiency is greatly improved.

Description

Test method, test device and test system for microwave equipment
Technical Field
The invention belongs to the field of microwave equipment, and relates to a test method, a test device and a test system of microwave equipment.
Background
In the microwave test, generally, a microwave radio frequency device is controlled to output a radio frequency signal to excite a microwave device to be tested, and bus data output by the microwave device to be tested is received and analyzed to perform performance index test and fault detection and positioning before installation on the microwave device to be tested, so as to ensure normal use of the microwave device.
However, the existing microwave testing method and device have the problems of complex operation, imperfect response mechanism, high requirement for professional ability of users and the like in configuration and use, and consequently, the testing efficiency of the microwave equipment is low.
Disclosure of Invention
The present invention is directed to overcome the disadvantage of low testing efficiency of microwave equipment in the prior art, and provides a testing method, a testing apparatus and a testing system for microwave equipment.
In order to achieve the purpose, the invention adopts the following technical scheme to realize the purpose:
in a first aspect of the present invention, a method for testing microwave equipment includes the following steps:
s1: acquiring a first test signal selection instruction, and selecting a first test signal instruction from a plurality of preset test signal instructions according to the first test signal selection instruction to obtain a target test signal instruction;
s2: sending a target test signal instruction to a microwave radio frequency device; the target test signal instruction is used for triggering the microwave radio frequency device to generate a target test signal and sending the target test signal to the microwave equipment to be tested;
s3: acquiring a second test signal selection instruction, selecting the second test signal instruction from a plurality of preset test signal instructions according to the second test signal selection instruction, selecting a target switching processing logic instruction from a plurality of preset switching processing logic instructions according to the first test signal instruction and the second test signal instruction, performing logic processing on the second test signal instruction according to the switching processing logic instruction, switching the target test signal instruction into the logically processed second test signal instruction, and performing S2;
s4: s3 repeated a preset number of times; and receiving and analyzing all test feedback signals sent by the microwave equipment to be tested to obtain a test result.
The test method of the microwave equipment of the invention is further improved in that:
before generating the target test signal according to the target test signal command in S2, the method further includes:
s201: setting parameters of preset types in each test signal instruction as editable parameters according to the test requirements of the microwave equipment to be tested;
s202: and acquiring a parameter modification instruction, modifying editable parameters in the target test signal instruction according to the parameter modification instruction to obtain a modified test signal instruction, and updating the target test signal instruction by the modified test signal instruction.
The preset type parameters comprise basic parameters and beam control parameters; the basic parameters comprise one or more of waveform frequency, radio frequency amplitude, sequence mode, fading rate, update rate, symmetry, AZ ratio, P polarity, 6.75Hz modulation and propeller modulation, and the beam control parameters comprise one or more of angle, amplitude, width, shape, clearance size, clearance angle and data word switch.
The target test signal instruction is also used for triggering the microwave radio frequency device to generate and send a state information feedback signal; the testing method of the microwave equipment further comprises the following steps: s5: and receiving and displaying the state information feedback signal.
Further comprising: t11: acquiring a self-checking instruction of the microwave radio frequency device, and sending the self-checking instruction to the microwave radio frequency device; the microwave radio frequency device self-checking instruction is used for triggering the microwave radio frequency device self-checking to generate and send a microwave radio frequency device self-checking result; t12: and receiving and displaying the self-checking result of the microwave radio frequency device and the self-checking result of the communication module.
The specific method for receiving all test feedback signals sent by the microwave equipment to be tested comprises the following steps: receiving all test feedback signals sent by microwave equipment to be tested through a communication module; the testing method of the microwave equipment further comprises the following steps: t21: acquiring a self-checking instruction of the communication module and sending the self-checking instruction to the communication module; the communication module self-checking instruction is used for triggering the communication module self-checking to generate and send a communication module self-checking result; t22: and receiving and displaying a self-checking result of the communication module.
Further comprising: s6: presetting an initial test state; acquiring an initial test state recovery instruction, and recovering the current test state to the initial test state according to the initial test state recovery instruction; s7: acquiring a previous test state recovery instruction, and recovering the current test state to a previous test state according to the previous test state recovery instruction, wherein the previous test state is a test state stored when the previous test is finished; s8: and recording all test records and test results.
Further comprising: s9: receiving a remote control instruction sent by a remote control device, wherein the remote control instruction comprises a first test signal selection instruction and a second test signal selection instruction; s10: and sending the test result to the remote control device.
In a second aspect of the present invention, a testing apparatus for microwave equipment includes:
the first acquisition module is used for acquiring a first test signal selection instruction, and selecting a first test signal instruction from a plurality of preset test signal instructions according to the first test signal selection instruction to obtain a target test signal instruction;
the transmitting module is used for transmitting the target test signal instruction to the microwave radio frequency device; the target test signal instruction is used for triggering the microwave radio frequency device to generate a target test signal and sending the target test signal to the microwave equipment to be tested;
the second acquisition module is used for acquiring a second test signal selection instruction, selecting the second test signal instruction from a plurality of preset test signal instructions according to the second test signal selection instruction, selecting a target switching processing logic instruction from a plurality of preset switching processing logic instructions according to the first test signal instruction and the second test signal instruction, performing logic processing on the second test signal instruction according to the switching processing logic instruction, switching the target test signal instruction into the second test signal instruction after the logic processing, and triggering the sending module; and
the analysis module is used for triggering the second acquisition module repeated for preset times; and receiving and analyzing all test feedback signals sent by the microwave equipment to be tested to obtain a test result.
In a third aspect of the present invention, a testing system for microwave equipment comprises a remote control device, a main control computer, a microwave radio frequency device and a communication module; the main control computer is internally provided with a testing device of the microwave equipment; the remote control device, the microwave radio-frequency device and the communication module are all connected with the testing device of the microwave equipment, and the communication module is connected with the microwave equipment to be tested.
Compared with the prior art, the invention has the following beneficial effects:
the testing method of the microwave equipment can obtain a target testing signal instruction by obtaining a first testing signal selection instruction and then selecting the first testing signal instruction from a plurality of preset testing signal instructions according to the first testing signal selection instruction, does not need additional configuration process, changes the complex configuration process into a simple selection process, simultaneously selects a target switching processing logic instruction from a plurality of preset switching processing logic instructions according to the testing signal instruction before switching and the testing signal instruction after switching when switching the testing signal instruction, and performs logic processing of a second testing signal instruction according to the switching processing logic instruction, saves a large number of processing logic configuration processes in the whole process, greatly reduces the professional level requirement on testers, and saves a large amount of testing time, the test efficiency is greatly improved.
Drawings
Fig. 1 is a flow chart of a testing method of microwave equipment according to an embodiment of the present invention;
FIG. 2 is a flowchart comparing a target test signal obtaining instruction with a conventional target test signal obtaining instruction according to an embodiment of the present invention;
FIG. 3 is a flowchart comparing a test signal switching command with a conventional test signal switching command according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a testing system of a microwave device according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
The invention is described in further detail below with reference to the accompanying drawings:
referring to fig. 1, in an embodiment of the present invention, a method for testing a microwave device is provided, where a microwave radio frequency is controlled to output a corresponding microwave signal to excite the microwave device, and bus data output by the microwave device is received and analyzed, so as to implement performance index testing and fault detection and positioning before installation of the microwave device. Specifically, the test method of the microwave equipment comprises the following steps:
s1: and acquiring a first test signal selection instruction, and selecting the first test signal instruction from a plurality of preset test signal instructions according to the first test signal selection instruction to obtain a target test signal instruction.
Specifically, in this embodiment, a plurality of test signal instructions are set according to the test requirements of the microwave device to be tested and experience, the test signal instructions are used to control the microwave rf to output corresponding test signals, and the test signal instructions may be stored in a set manner so as to be called when in use.
After the testing device is started, the configuration parameters of all the test signal instructions are initialized to corresponding values in a normal testing mode, a user can configure one or more waveforms of the test signal instructions according to requirements after entering the testing mode, any selection can be completed only by one-key operation of the user, and all control instructions (opening instructions, closing instructions, calculation instructions and the like) required by the selection are automatically completed by internal calling.
Referring to fig. 2, in the present embodiment, a comparison between a target test signal instruction obtained by the present embodiment and a current target test signal instruction obtained by the present embodiment shows that the current target test signal instruction includes 6 setting steps, the operation is very complicated, and it is necessary for an operator to have certain professional knowledge.
S2: sending a target test signal instruction to a microwave radio frequency device; the target test signal instruction is used for triggering the microwave radio frequency device to generate a target test signal and sending the target test signal to the microwave equipment to be tested.
Specifically, the target test signal instruction is sent to the microwave radio frequency device, the microwave radio frequency device generates a target test signal according to the target test signal, then the microwave equipment is excited by the target test signal, and the microwave equipment generates a corresponding test feedback signal under the excitation action of the target test signal.
Preferably, before generating the target test signal according to the target test signal command, the method further includes:
s201: and setting parameters of preset types in the test signal instructions as editable parameters according to the test requirements of the microwave equipment to be tested.
Specifically, the preset type of parameters include: the first type: basic parameters including several of waveform frequency, radio frequency amplitude, sequence pattern, fading rate, update rate, symmetry, AZ ratio, P-polarity, 6.75Hz modulation, and propeller modulation. The second type: beam control parameters including angle, amplitude, width, shape, clearance size, clearance angle, and several of the data word switches.
S202: and acquiring a parameter modification instruction, modifying editable parameters in the target test signal instruction according to the parameter modification instruction to obtain a modified test signal instruction, and updating the target test signal instruction by the modified test signal instruction.
The modification of the configuration parameters in the test signal instruction is realized through the above steps S201 and S202, and then the parameter attribute information of the target test signal generated by the microwave radio frequency is modified, so as to better complete the test work of the microwave equipment.
S3: acquiring a second test signal selection instruction, selecting the second test signal instruction from a plurality of preset test signal instructions according to the second test signal selection instruction, selecting a target switching processing logic instruction from a plurality of preset switching processing logic instructions according to the first test signal instruction and the second test signal instruction, performing logic processing on the second test signal instruction according to the switching processing logic instruction, switching the target test signal instruction into the logically processed second test signal instruction, and performing S2.
Specifically, the signal types and the mutual restriction relationship under different test signals of the microwave test are complex, and it is difficult to directly set a correct test signal by using a microwave radio frequency without completely mastering the test principle. In this embodiment, by summarizing all the test signals commonly used for testing, in the process of switching the test signals by the user, the switching processing logic when two test signals are switched is actively processed, such as turning off the mutex, turning on the necessary signal, and enabling or disabling the related configuration parameters.
The switching processing logic processing when actively switching the two test signals mainly depends on a switching processing logic instruction which is set in advance and stored in the test device, and the switching processing logic instruction is obtained by summarizing and analyzing switching processing logics which should be made when any two test signals are switched. Different switching processing logic instructions can be corresponded according to the test signal before switching and the test signal after switching. In this embodiment, the test signals correspond to the test signal instructions one to one, so that different switching processing logic instructions can be corresponded according to the test signal instruction before switching and the test signal instruction after switching.
Referring to fig. 3, the flow comparison between the switching test signal instruction and the current switching test signal instruction in this embodiment shows that the current flow of switching the test signal instruction needs 5 setting steps, the operation is very complicated, and it is necessary for an operator to have certain professional knowledge.
S4: s3 repeated a preset number of times; and receiving and analyzing all test feedback signals sent by the microwave equipment to be tested to obtain a test result.
Specifically, the step S3 of repeating the preset number of times is to set the number of times of repetition according to the testing requirement of the microwave device to be tested, and the second test signal commands corresponding to the selected second test signal selection command may be different each time S3 is repeated.
The testing device has the advantages that the testing device has complete loop testing capability, the microwave device to be tested is excited after the microwave radio frequency device is controlled to output signals, feedback information of the microwave device to be tested is output to a bus receiving end of the testing device through a bus, and the testing device has the acquisition and analysis capabilities of various general buses and is provided for a tester to test and observe an interface so as to rapidly judge the testing effectiveness. The test result comprises state information of each functional module in the microwave equipment, and the performance index test and fault detection positioning before installation of the microwave equipment are realized.
In summary, the testing method of the microwave device of the present invention obtains the target test signal instruction by obtaining the first test signal selection instruction, and then selects the first test signal instruction from the plurality of preset test signal instructions according to the first test signal selection instruction, does not need an additional configuration process, changes the complex configuration process into a simple selection process, and at the same time, selects the target switching processing logic instruction from the plurality of preset switching processing logic instructions according to the test signal instruction before switching and the test signal instruction after switching when switching the test signal instruction, and performs the logic processing of the second test signal instruction according to the switching processing logic instruction, thereby saving a large number of processing logic configuration processes in the whole process, greatly reducing the professional level requirement for the tester, and saving a large amount of testing time, the test efficiency is greatly improved.
Preferably, the target test signal instruction is further used for triggering the microwave radio frequency device to generate and send a state information feedback signal; the testing method of the microwave equipment further comprises the following steps: s5: and receiving and displaying the state information feedback signal.
Specifically, in the existing testing method for microwave equipment, the user is only prompted to set successfully in a state that the user sets successfully, in actual use, general testing conditions need to be set in multiple steps, and any setting error can result in setting failure. In this embodiment, the setting result is displayed on the interface for each setting result of the user, and not only is the configuration successful, but also a feedback result is displayed when the configuration fails, so as to guide the user to quickly and correctly set the instruction. And sending the target test signal instruction to the microwave radio frequency device, triggering the microwave radio frequency device by the target test signal to generate state information after the response of the microwave radio frequency device is finished, actively reading and analyzing the state information of the microwave radio frequency device, and displaying a result so that a user can quickly judge a set result.
Preferably, the method further comprises the following steps: t11: acquiring a self-checking instruction of the microwave radio frequency device, and sending the self-checking instruction to the microwave radio frequency device; the microwave radio frequency device self-checking instruction is used for triggering the microwave radio frequency device self-checking to generate and send a microwave radio frequency device self-checking result; t12: and receiving and displaying the self-checking result of the microwave radio frequency device and the self-checking result of the communication module.
The method comprises the steps of setting a self-checking function of the microwave radio frequency device, automatically obtaining a self-checking instruction of the microwave radio frequency device stored inside after the microwave radio frequency device is powered on, sending the self-checking instruction to the microwave radio frequency device, carrying out self-checking on the microwave radio frequency device according to the self-checking instruction of the microwave radio frequency device, traversing all functional instructions of the microwave radio frequency device during self-checking, carrying out comprehensive checking on the functional instructions, generating a self-checking result of the microwave radio frequency device, sending the self-checking result to a testing device, and displaying the self-checking result on an interface by the testing device to guarantee the.
Preferably, the specific method for receiving all test feedback signals sent by the microwave device to be tested is as follows: receiving all test feedback signals sent by microwave equipment to be tested through a communication module; the testing method of the microwave equipment further comprises the following steps: t21: acquiring a self-checking instruction of the communication module and sending the self-checking instruction to the communication module; the communication module self-checking instruction is used for triggering the communication module self-checking to generate and send a communication module self-checking result; t22: and receiving and displaying a self-checking result of the communication module.
In this embodiment, the communication module is implemented by using two bus boards communicating with each other, one bus board is disposed on the testing device, and the other bus board is disposed on the microwave device to be tested. The normal communication state is a basic condition for ensuring that the testing method can monitor the state of the microwave equipment to be tested in real time. The method has a bus communication module self-checking function, automatically acquires a communication module self-checking instruction stored inside after power-on, sends the communication module self-checking instruction to the communication module, carries out self-checking on the communication module according to the communication module self-checking instruction, carries out read-write operation check on the communication module during self-checking, generates a communication module self-checking result and sends the communication module self-checking result to the testing device for displaying on an interface, and ensures that the communication module is normal in function or helps to position faults of the communication module.
Preferably, the method further comprises the following steps: s6: presetting an initial test state; acquiring an initial test state recovery instruction, and recovering the current test state to the initial test state according to the initial test state recovery instruction; s7: acquiring a previous test state recovery instruction, and recovering the current test state to a previous test state according to the previous test state recovery instruction, wherein the previous test state is a test state stored when the previous test is finished; s8: and recording all test records and test results.
Specifically, the initial test state is the most common basic test state in the microwave test, the test method stores the configuration file of the initial test state, and after a user needs to test for many times, the user can return to the initial test state by one key, so that the complicated step of gradually setting by testers is omitted.
The traditional microwave testing device is only restored to a factory state after being started and powered on every time, if a user wants to remember common configuration parameter change items, the user can only edit and store a parameter configuration file by himself, and then the user can read files after being started to update the configuration parameters of the user. The testing method has the capability of recording the configuration state of the user in real time so as to ensure that the user returns to the testing state when the user is powered off last time when the user is powered on next time, thereby saving the work of repeated configuration and simultaneously not needing to edit the configuration files one by one and save the configuration files.
The testing method has the function of recording the testing process in real time, and when a user tests, the parameter configuration conditions, the testing results, the testing time, the testing state and the like of each step are recorded in real time, so that the testing personnel can analyze and arrange the data conveniently, the testing results can be analyzed, and the data analysis efficiency can be greatly improved.
Preferably, the method further comprises the following steps: s9: receiving a remote control instruction sent by a remote control device, wherein the remote control instruction comprises a first test signal selection instruction and a second test signal selection instruction; s10: and sending the test result to the remote control device.
Specifically, a remote control command is sent by the remote control device, the remote control command comprises a first test signal selection command and a second test signal selection command, subsequent test operations of S1, S2, S3 and S4 are carried out according to the received first test signal selection command and the second test signal selection command, remote control testing is achieved, meanwhile, a test result is sent to the remote control device, and synchronization between the remote control device and the site is achieved.
The following are embodiments of the apparatus of the present invention that may be used to perform embodiments of the method of the present invention. For details of non-careless mistakes in the embodiment of the apparatus, please refer to the embodiment of the method of the present invention.
In another embodiment of the present invention, a testing apparatus for microwave equipment is provided, where the testing apparatus for microwave equipment can be used to implement the testing method for microwave equipment described above, and specifically, the testing apparatus for microwave equipment includes a first obtaining module, a sending module, a second obtaining module, and an analyzing module.
The first obtaining module is used for obtaining a first test signal selection instruction, and selecting the first test signal instruction from a plurality of preset test signal instructions according to the first test signal selection instruction to obtain a target test signal instruction; the transmitting module is used for transmitting the target test signal instruction to the microwave radio frequency device; the target test signal instruction is used for triggering the microwave radio frequency device to generate a target test signal and sending the target test signal to the microwave equipment to be tested; the second obtaining module is used for obtaining a second test signal selection instruction, selecting the second test signal instruction from a plurality of preset test signal instructions according to the second test signal selection instruction, selecting a target switching processing logic instruction from a plurality of preset switching processing logic instructions according to the first test signal instruction and the second test signal instruction, performing logic processing on the second test signal instruction according to the switching processing logic instruction, switching the target test signal instruction into the second test signal instruction after the logic processing, and triggering the sending module; the analysis module is used for triggering a second acquisition module repeated for preset times; and receiving and analyzing all test feedback signals sent by the microwave equipment to be tested to obtain a test result.
Referring to fig. 4, in another embodiment of the present invention, a testing system for microwave equipment is provided, which includes a remote control device, a main control computer, a microwave rf and a communication module; the main control computer is internally provided with a testing device of the microwave equipment; the remote control device, the microwave radio-frequency device and the communication module are all connected with the testing device of the microwave equipment, and the communication module is connected with the microwave equipment to be tested.
Specifically, a remote control interface function is set, and in order to improve the test efficiency to a greater extent and increase the flexibility of the test, the remote control function is designed. In actual test work, when the microwave equipment to be tested has a certain distance from the test platform, the tester can use the remote control end equipment to control the test device in order to more quickly and clearly know the test process or fault diagnosis, the test function which is completely the same as that of the test device can be completed, the data returned by the test are simultaneously returned to the remote control end, the test state can be conveniently observed by the tester in real time, and the test platform is not limited by the position of the test platform. The remote control function depends on a perfect and powerful communication system with the test platform. When a user has a requirement of remote control, the remote control end equipment is used for sending a control request to the testing device, and after the request passes, the remote control end equipment has the control, acquisition and communication functions almost the same as those of the testing device of the testing platform. At the moment, the testing task can be finished through the remote control end equipment without the limit of distance environment.
When the remote control function of the testing device is used, the remote control end equipment can complete the control and acquisition work which is almost the same as that of the testing device, and meanwhile, although the active control right is given to the remote control end at the main control end of the microwave testing equipment, information such as interface operation instructions, testing processes, testing results and the like of the remote control end can be completely displayed on the testing device in real time through a communication network. In addition, the test data to be stored can be transmitted to the test device in real time and be stored properly. Therefore, the real-time synchronization function of the remote end and the testing device is realized, the testing requirement of the remote end is met, the testing device can monitor the testing requirement, and the testing work is greatly facilitated.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solutions of the present invention and not for limiting the same, and although the present invention is described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: modifications and equivalents may be made to the embodiments of the invention without departing from the spirit and scope of the invention, which is to be covered by the claims.

Claims (10)

1. A testing method of microwave equipment is characterized by comprising the following steps:
s1: acquiring a first test signal selection instruction, and selecting a first test signal instruction from a plurality of preset test signal instructions according to the first test signal selection instruction to obtain a target test signal instruction;
s2: sending a target test signal instruction to a microwave radio frequency device; the target test signal instruction is used for triggering the microwave radio frequency device to generate a target test signal and sending the target test signal to the microwave equipment to be tested;
s3: acquiring a second test signal selection instruction, selecting the second test signal instruction from a plurality of preset test signal instructions according to the second test signal selection instruction, selecting a target switching processing logic instruction from a plurality of preset switching processing logic instructions according to the first test signal instruction and the second test signal instruction, performing logic processing on the second test signal instruction according to the switching processing logic instruction, switching the target test signal instruction into the logically processed second test signal instruction, and performing S2;
s4: s3 repeated a preset number of times; and receiving and analyzing all test feedback signals sent by the microwave equipment to be tested to obtain a test result.
2. The method for testing microwave equipment according to claim 1, wherein before generating the target test signal according to the target test signal command in S2, the method further comprises:
s201: setting parameters of preset types in each test signal instruction as editable parameters according to the test requirements of the microwave equipment to be tested;
s202: and acquiring a parameter modification instruction, modifying editable parameters in the target test signal instruction according to the parameter modification instruction to obtain a modified test signal instruction, and updating the target test signal instruction by the modified test signal instruction.
3. The method for testing microwave equipment according to claim 2, wherein the preset type of parameters includes basic parameters and beam control parameters; the basic parameters comprise one or more of waveform frequency, radio frequency amplitude, sequence mode, fading rate, update rate, symmetry, AZ ratio, P polarity, 6.75Hz modulation and propeller modulation, and the beam control parameters comprise one or more of angle, amplitude, width, shape, clearance size, clearance angle and data word switch.
4. The microwave device testing method of claim 1, wherein the target test signal instruction is further configured to trigger a microwave radio to generate and transmit a state information feedback signal;
the testing method of the microwave equipment further comprises the following steps:
s5: and receiving and displaying the state information feedback signal.
5. The method of testing a microwave device of claim 1, further comprising:
t11: acquiring a self-checking instruction of the microwave radio frequency device, and sending the self-checking instruction to the microwave radio frequency device; the microwave radio frequency device self-checking instruction is used for triggering the microwave radio frequency device self-checking to generate and send a microwave radio frequency device self-checking result;
t12: and receiving and displaying the self-checking result of the microwave radio frequency device and the self-checking result of the communication module.
6. The method for testing microwave equipment according to claim 1, wherein the specific method for receiving all test feedback signals transmitted by the microwave equipment to be tested is as follows: receiving all test feedback signals sent by microwave equipment to be tested through a communication module; the testing method of the microwave equipment further comprises the following steps:
t21: acquiring a self-checking instruction of the communication module and sending the self-checking instruction to the communication module; the communication module self-checking instruction is used for triggering the communication module self-checking to generate and send a communication module self-checking result;
t22: and receiving and displaying a self-checking result of the communication module.
7. The method of testing a microwave device of claim 1, further comprising:
s6: presetting an initial test state; acquiring an initial test state recovery instruction, and recovering the current test state to the initial test state according to the initial test state recovery instruction;
s7: acquiring a previous test state recovery instruction, and recovering the current test state to a previous test state according to the previous test state recovery instruction, wherein the previous test state is a test state stored when the previous test is finished;
s8: and recording all test records and test results.
8. The method of testing a microwave device of claim 1, further comprising:
s9: receiving a remote control instruction sent by a remote control device, wherein the remote control instruction comprises a first test signal selection instruction and a second test signal selection instruction;
s10: and sending the test result to the remote control device.
9. A testing apparatus for microwave equipment, comprising:
the first acquisition module is used for acquiring a first test signal selection instruction, and selecting a first test signal instruction from a plurality of preset test signal instructions according to the first test signal selection instruction to obtain a target test signal instruction;
the transmitting module is used for transmitting the target test signal instruction to the microwave radio frequency device; the target test signal instruction is used for triggering the microwave radio frequency device to generate a target test signal and sending the target test signal to the microwave equipment to be tested;
the second acquisition module is used for acquiring a second test signal selection instruction, selecting the second test signal instruction from a plurality of preset test signal instructions according to the second test signal selection instruction, selecting a target switching processing logic instruction from a plurality of preset switching processing logic instructions according to the first test signal instruction and the second test signal instruction, performing logic processing on the second test signal instruction according to the switching processing logic instruction, switching the target test signal instruction into the second test signal instruction after the logic processing, and triggering the sending module; and
the analysis module is used for triggering the second acquisition module repeated for preset times; and receiving and analyzing all test feedback signals sent by the microwave equipment to be tested to obtain a test result.
10. A test system of microwave equipment is characterized by comprising a remote control device, a main control computer, a microwave radio-frequency device and a communication module; a testing device of the microwave equipment in claim 9 is arranged in the main control computer; the remote control device, the microwave radio-frequency device and the communication module are all connected with the testing device of the microwave equipment, and the communication module is connected with the microwave equipment to be tested.
CN202011555931.XA 2020-12-24 2020-12-24 Test method, test device and test system for microwave equipment Pending CN112748300A (en)

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Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1399138A (en) * 2001-07-20 2003-02-26 上海大唐移动通信设备有限公司 RF automatic changing batch testing method
CN105281852A (en) * 2015-10-30 2016-01-27 四川九洲电器集团有限责任公司 L-band test equipment and test method
CN107544882A (en) * 2017-08-24 2018-01-05 杭州金盔甲科技有限公司 Multi-channel serial port method of testing and system
WO2018103584A1 (en) * 2016-12-06 2018-06-14 华为技术有限公司 Method for determining cell, and relevant device and system
CN108469552A (en) * 2018-04-26 2018-08-31 深圳市华讯方舟微电子科技有限公司 T assembly test methods, apparatus and system
CN109840206A (en) * 2018-12-26 2019-06-04 深圳壹账通智能科技有限公司 Data test method, apparatus, terminal and storage medium
CN110683076A (en) * 2019-11-04 2020-01-14 成都锐能科技有限公司 Test board and test method of airborne radio frequency navigation system
CN110851308A (en) * 2019-10-21 2020-02-28 香港乐蜜有限公司 Test method, test device, electronic equipment and storage medium
CN111078482A (en) * 2019-12-20 2020-04-28 西安航空电子科技有限公司 Communication navigation equipment test system, method, equipment and readable storage medium
CN111737073A (en) * 2020-08-26 2020-10-02 鹏城实验室 Automatic testing method, device, equipment and medium
CN111934788A (en) * 2020-10-14 2020-11-13 歌尔光学科技有限公司 Radio frequency index testing method and system of head-mounted equipment and related components

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1399138A (en) * 2001-07-20 2003-02-26 上海大唐移动通信设备有限公司 RF automatic changing batch testing method
CN105281852A (en) * 2015-10-30 2016-01-27 四川九洲电器集团有限责任公司 L-band test equipment and test method
WO2018103584A1 (en) * 2016-12-06 2018-06-14 华为技术有限公司 Method for determining cell, and relevant device and system
CN107544882A (en) * 2017-08-24 2018-01-05 杭州金盔甲科技有限公司 Multi-channel serial port method of testing and system
CN108469552A (en) * 2018-04-26 2018-08-31 深圳市华讯方舟微电子科技有限公司 T assembly test methods, apparatus and system
CN109840206A (en) * 2018-12-26 2019-06-04 深圳壹账通智能科技有限公司 Data test method, apparatus, terminal and storage medium
CN110851308A (en) * 2019-10-21 2020-02-28 香港乐蜜有限公司 Test method, test device, electronic equipment and storage medium
CN110683076A (en) * 2019-11-04 2020-01-14 成都锐能科技有限公司 Test board and test method of airborne radio frequency navigation system
CN111078482A (en) * 2019-12-20 2020-04-28 西安航空电子科技有限公司 Communication navigation equipment test system, method, equipment and readable storage medium
CN111737073A (en) * 2020-08-26 2020-10-02 鹏城实验室 Automatic testing method, device, equipment and medium
CN111934788A (en) * 2020-10-14 2020-11-13 歌尔光学科技有限公司 Radio frequency index testing method and system of head-mounted equipment and related components

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