CN112731126A - Automatic testing system and method for relay protection device environmental test - Google Patents
Automatic testing system and method for relay protection device environmental test Download PDFInfo
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Abstract
An automatic test system and method for an environmental test of a relay protection device are provided with an upper computer, a switch for data exchange, a tester, a power supply device and a temperature box for providing environmental temperature adjustment for a tested device, wherein the switch is in two-way connection with the tester, the upper computer, the power supply device and the temperature box, the tested device is in one-way connection with the tester, the tested device is in one-way connection with the switch, the power supply device is in one-way connection with the tested device, and the tested device is placed in the temperature box. According to the invention, the environmental test of the relay protection device can be automatically carried out after the test parameters are set by the upper computer, so that the time can be saved, and the working efficiency can be improved. The environmental test of the invention is closed loop, without manual intervention, and the temperature test types do not need to be rechecked manually, and another temperature test type can be started directly after one temperature test type is finished.
Description
Technical Field
The invention relates to the technical field of relay protection of power systems, in particular to an automatic test system and method for an environment test of a relay protection device.
Background
The existing relay protection device (short for tested device) environment test is mainly manual test. The manual test process comprises the steps of setting corresponding test temperature or test curve in a temperature box, and carrying out operations such as electrifying or not electrifying the relay protection device after the temperature reaches the set temperature. After the corresponding temperature test time, the relay protection tester is used for testing the protection function of the relay protection device through manual operation, and whether the functional performance of the device can meet the original technical requirements is checked. The manual test has the defects that the temperature needs to be manually set and the manual re-inspection is carried out, so that the test efficiency is influenced. And manual testing can waste a significant amount of time.
The reasons for these disadvantages are: the method comprises the following steps of 1, manually controlling a temperature box, a relay protection tester and a relay protection device by using a power supply non-closed loop. And 2, manually setting the temperature by a human hand, manually powering on the relay protection device and rechecking after the temperature test time. The reason for this is that the time of the tester needs to be calculated in advance, and the tester needs to perform corresponding operations at each time node. In this case, a large time interval exists in the middle of the test to meet the time arrangement of the tester, and time is wasted.
Therefore, it is necessary to provide an automatic testing system and method for environmental test of relay protection device to solve the deficiencies of the prior art.
Disclosure of Invention
One of the purposes of the invention is to provide an automatic testing system for an environmental test of a relay protection device, which avoids the defects of the prior art. The automatic testing system for the relay protection device environmental test can automatically perform the relay protection device environmental test, save time and improve working efficiency.
The above object of the present invention is achieved by the following technical measures:
the utility model provides a relay protection device environmental test automatic test system, be provided with the host computer, be used for data interchange's switch, the tester, power supply unit and be used for providing the temperature box that ambient temperature adjusted to the device under test, switch and tester, host computer, power supply unit and temperature box both way junction, the device under test is connected with the tester one-way, the device under test is connected with the switch one-way, power supply unit and the device under test one-way junction, the device under test is placed inside the temperature box.
Preferably, the upper computer is used for inputting test parameters, controlling an environment temperature curve, calculating a magnitude value output by the tester, collecting an action value of the device to be tested, collecting an action value fed back by the tester, and obtaining a test result according to the magnitude value and the action value of the device to be tested.
Preferably, the tester is used for conveying the measurement value to the device to be tested, collecting the action value of the device to be tested and feeding the action value back to the upper computer.
Preferably, the power supply device outputs a corresponding ac/dc voltage value to the device under test.
Preferably, the temperature box is used for controlling the ambient temperature in the temperature box according to an ambient temperature curve.
Preferably, the upper computer is provided with a test control module, a power supply control module, a temperature control module and a communication module, and the test control module, the power supply control module, the temperature control module and the communication module are respectively connected with the switch.
Preferably, the test control module is configured to receive an input test parameter and calculate an output value of the device under test.
Preferably, the temperature control module is used for obtaining an environment temperature curve according to the test parameters and controlling the temperature of the temperature box.
Preferably, the power control module controls the power supply device to output an ac/dc voltage value according to the ambient temperature curve, so that the power supply device powers on the device to be tested.
Preferably, the communication module is configured to receive an action value of the device under test.
Preferably, the switch is connected with the tester, the upper computer, the power supply device and the temperature box in a bidirectional mode through network cables.
Preferably, the power supply is connected with the device to be tested through a test line.
When the tester is an analog quantity sampling device, the tester is connected with the tested device through a short-circuit wire.
When the tester is a digital device, the tester is connected with the tested device through an optical fiber.
Preferably, the upper computer, the power supply device, the temperature box and the tester are communicated by using a private protocol.
Preferably, the upper computer and the device to be tested communicate with each other by using an IEC61850 protocol.
Preferably, the upper computer is further provided with a model curve database of various environment temperature test curves.
Another object of the present invention is to provide an automatic testing method for environmental testing of a relay protection device, which avoids the disadvantages of the prior art. The automatic testing method for the relay protection device environment test automatically performs the relay protection device environment test, can save time and improve working efficiency.
The above object of the present invention is achieved by the following technical measures:
the automatic testing method for the relay protection device environmental test is carried out by adopting the automatic testing system for the relay protection device environmental test.
The method comprises the following steps:
inputting at least one group of temperature test types and corresponding test parameters in an upper computer, and correspondingly obtaining at least one group of temperature test curves;
step two, judging the working state of the device to be tested;
step three, sequentially selecting a group of temperature test types in the step one and corresponding temperature test curves to control the temperature of the temperature box, testing the ambient temperature of the tested device, and acquiring action values of the tested device to obtain corresponding test results;
step four, controlling the tester to stop the output of the magnitude, and controlling the power supply device to be powered off;
step five, judging whether all temperature test types are tested or not, if so, entering step six, otherwise, entering step seven;
step six, returning to the step two;
and step seven, completing the test.
Preferably, the first step is to input at least one group of temperature test types and corresponding test parameters in the upper computer, and select corresponding environment temperature test curves in the model curve database according to the test parameters and the corresponding temperature test types, so as to obtain at least one group of corresponding temperature test curves.
Preferably, the second step is specifically:
step 2.1, placing the device to be tested in a temperature box, and enabling the temperature box to reach the temperature T0And hold t0Hour, and T0And t0Are both greater than 0;
step 2.2, the power supply device powers on the device to be tested;
step 2.3, calculating the output value of the tester according to the test parameters in the step one;
step 2.4, enabling the tester to output a quantity value to the device to be tested, and collecting an action value of the device to be tested;
step 2.5, judging whether the operation of the tested device is normal or not according to the action value obtained in the step 2.4 and the output quantity value obtained in the step 2.3, if so, entering the step 2.6, otherwise, entering the step 2.7;
step 2.6, entering a step seven;
and 2.7, controlling the power-off of the tested device and entering the third step.
Preferably, the test parameters include a power specification of the device under test, a protection function of the device under test, an operation value of the device under test, and a delay time of the device under test.
Preferably, the temperature test type is at least one of a constant temperature storage test, a constant temperature operation test or a variable temperature operation test.
Wherein the constant temperature storage test comprises a high temperature constant temperature storage test or a low temperature constant temperature storage test.
The constant temperature operation test comprises a high temperature constant temperature operation test or a low temperature constant temperature operation test.
When the temperature test type is a constant temperature storage test, the third step comprises the following steps:
step 3.1a, the tested device is not electrified, the temperature box is controlled according to the temperature test curve in the step one, the temperature change rate is controlled to be less than or equal to q, and the storage temperature T is reached1And at T1Lower hold t1Hour, and T1Is not equal to T0，t1Is a positive number;
step 3.2a, controlling the temperature box according to the temperature test curve in the step one, and controlling the temperature change rate to be less than or equal to q so as to recover to the temperature T0Then, t is held2Hour, and t2Is a positive number;
and 3.3a, electrifying the tested device, controlling the tester to output a value to the tested device according to the test parameters in the first step, collecting an action value of the tested device and obtaining a test result.
When the temperature test type is a constant temperature operation test, the third step comprises the following steps:
step 3.1b, keeping the tested device not powered on, controlling the temperature box according to the temperature test curve in the step one, controlling the temperature change rate to be less than or equal to q, and achieving the constant temperature storage temperature T3Then, t is held3After hours, the tested device is powered on, the tester is controlled to output a quantity value to the tested device according to the test parameters in the step one, the action value of the tested device is collected, and T is3Is not equal to T0，a3And t3Is a positive number;
step 3.2b, at temperature T3Next, keeping the tested device powered on, and keeping t4After hours, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, collecting an action value of the tested device, and t4Is a positive number;
step 3.3b, powering off the tested device, controlling the temperature box according to the temperature test curve in the step one, and controlling the temperature change rate to be less than or equal to q and recovering to T0And hold t5Hour, test results are obtained, and t5Is a positive number.
When the temperature test type is a variable temperature operation test, the third step comprises the following steps:
step 3.1c, defining the temperature change frequency as e, making e equal to 1, and entering step 3.3 c;
step 3.2c, enabling e +1, and entering step 3.4 c;
3.3c, electrifying the tested device;
step 3.4c, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, and collecting an action value of the tested device; meanwhile, the temperature box is controlled according to the temperature test curve in the first step, the temperature change rate is controlled to be less than or equal to q, and the high-temperature operation temperature T is reached4Hold t6Hour, and t6Is a positive number, T4Is not equal to T0；
Step 3.5c, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, and collecting an action value of the tested device; meanwhile, the temperature box is controlled according to the temperature test curve in the first step, the temperature change rate is controlled to be less than or equal to q, and the low-temperature operation temperature T is reached5Hold, holdt7Hour, and t7Is a positive number, T5Is not equal to T0；
Step 3.6c, judging the current temperature change times, and if e is equal to e ', entering step 3.7c, and if e is less than e ', entering step 3.3c, wherein e ' is a positive integer larger than 1;
step 3.7c, controlling the temperature box according to the temperature test curve in the step one, and controlling the speed with the temperature change rate less than or equal to q to recover to T0Entering step 3.8 c;
and 3.8c, obtaining a test result of the tested device.
Preferably, t is0Is 1, t1And t4Are all 16, t3And t2Are all 1, t5≤2， t7And t6Are all 3.
Preferably, q is 1K/min.
Preferably, T is as defined above0T is 20 ℃ below zero and is more than or equal to-200 DEG C1≤100℃，-200℃≤T2≤100℃；-200℃≤T3≤100℃；20℃≤T4≤100℃，-200℃≤T5≤ 20℃。
Preferably, e' is 4.
The invention discloses an automatic testing system and method for an environmental test of a relay protection device, which are provided with an upper computer, a switch for data exchange, a tester, a power supply device and a temperature box for providing environmental temperature regulation for a tested device. According to the invention, the environmental test of the relay protection device can be automatically carried out after the test parameters are set by the upper computer, so that the time can be saved, and the working efficiency can be improved. The environmental test of the invention is closed loop, without manual intervention, and the temperature test types do not need to be rechecked manually, and another temperature test type can be started directly after one temperature test type is finished.
Drawings
The invention is further illustrated by means of the attached drawings, the content of which is not in any way limiting.
Fig. 1 is a schematic signal transmission diagram of an automatic testing system for an environmental test of a relay protection device.
Detailed Description
The technical solution of the present invention is further illustrated by the following examples.
Example 1.
The utility model provides a relay protection device environmental test automatic test system, as shown in figure 1, be provided with the host computer, be used for data interchange's switch, the tester, power supply unit and be used for providing the temperature box of ambient temperature regulation to the device under test, switch and tester, host computer, power supply unit and temperature box both way junction, the device under test is connected with the tester one-way, the device under test is connected with the switch one-way, power supply unit and the device under test one-way junction, the device under test is placed inside the temperature box. And the tester is located outside the temperature box.
The upper computer is used for testing parameter input, controlling an environment temperature curve, calculating a quantity value output by the tester, collecting an action value of the tested device, collecting an action value fed back by the tester, and obtaining a test result according to the quantity value and the action value of the tested device.
The tester is used for conveying the quantity value to the tested device, collecting the action value of the tested device and feeding the action value back to the upper computer.
The power supply device outputs corresponding alternating current and direct current voltage values to the tested device.
Wherein, the temperature case is used for controlling the ambient temperature in the temperature case according to the ambient temperature curve.
The upper computer is provided with a test control module, a power supply control module, a temperature control module and a communication module, wherein the test control module, the power supply control module, the temperature control module and the communication module are respectively connected with the switch.
The test control module is used for receiving input test parameters and calculating the output quantity value of the tested device.
The temperature control module is used for obtaining an environment temperature curve according to the test parameters and controlling the temperature of the temperature box;
the power supply control module controls the power supply device to output an alternating current voltage value and a direct current voltage value according to the environment temperature curve, so that the power supply device powers the tested device.
The communication module is used for receiving the action value of the tested device.
The switch is connected with the tester, the upper computer, the power supply device and the temperature box in a bidirectional mode through the network cable. The power supply is connected with the tested device through a test line. When the tester is an analog quantity sampling device, the tester is connected with the tested device through a short-circuit wire, and when the tester is a digital device, the tester is connected with the tested device through an optical fiber.
The upper computer, the power supply device, the temperature box and the tester of the invention use private protocol communication. And the upper computer and the tested device are communicated by using an IEC61850 protocol. The upper computer is also provided with a model curve database of various environment temperature test curves.
It should be noted that the present invention may directly use the environmental temperature test curve of the model curve database as the environmental temperature curve, or may establish the individually configured environmental temperature curve according to the actually input test data.
According to the automatic testing system for the relay protection device environment test, the relay protection device environment test can be automatically carried out after the upper computer sets the test parameters, so that the time can be saved, and the working efficiency can be improved. The environmental test of the invention is closed loop, without manual intervention, and the temperature test types do not need to be rechecked manually, and another temperature test type can be started directly after one temperature test type is finished.
Example 2.
An automatic test method for an environmental test of a relay protection device is performed by using the automatic test system for an environmental test of a relay protection device in embodiment 1.
The method comprises the following steps:
inputting at least one group of temperature test types and corresponding test parameters in an upper computer, and correspondingly obtaining at least one group of temperature test curves;
step two, judging the working state of the device to be tested;
step three, sequentially selecting a group of temperature test types in the step one and corresponding temperature test curves to control the temperature of the temperature box, testing the ambient temperature of the tested device, and acquiring action values of the tested device to obtain corresponding test results;
step four, controlling the tester to stop the output of the magnitude, and controlling the power supply device to be powered off;
step five, judging whether all temperature test types are tested or not, if so, entering step six, otherwise, entering step seven;
step six, returning to the step two;
and step seven, completing the test.
The first step is specifically that at least one group of temperature test types and corresponding test parameters are input into the upper computer, corresponding environment temperature test curves are selected in the model curve database according to the test parameters and the corresponding temperature test types respectively, and at least one group of temperature test curves are obtained correspondingly.
Wherein the second step is specifically as follows:
step 2.1, placing the device to be tested in a temperature box, and enabling the temperature box to reach the temperature T0And hold t0Hour, and T0And t0Are both greater than 0;
step 2.2, the power supply device powers on the device to be tested;
step 2.3, calculating the output value of the tester according to the test parameters in the step one;
step 2.4, enabling the tester to output a quantity value to the device to be tested, and collecting an action value of the device to be tested;
step 2.5, judging whether the operation of the tested device is normal or not according to the action value obtained in the step 2.4 and the output quantity value obtained in the step 2.3, if so, entering the step 2.6, otherwise, entering the step 2.7;
step 2.6, entering a step seven;
and 2.7, controlling the power-off of the tested device and entering the third step.
The test parameters of the invention are provided with the power supply specification of the tested device, the protection function of the tested device, the action value of the tested device and the delay time of the tested device. The temperature test type is at least one of a constant temperature storage test, a constant temperature operation test or a variable temperature operation test.
Wherein the constant temperature storage test comprises a high temperature constant temperature storage test or a low temperature constant temperature storage test. When tested in high temperature constant temperature storage, then T1Less than 20 ℃ and T1Can be 5 ℃, 10 ℃, 25 ℃ and 40 ℃; when tested in high temperature constant temperature storage, then T1Greater than 20 ℃ and T1Can be at 40 deg.C, 55 deg.C, 70 deg.C.
The constant temperature operation test comprises a high temperature constant temperature operation test or a low temperature constant temperature operation test. When the test is run at a constant temperature and a high temperature, T is3Less than 20 ℃ and T3Can be 5 ℃, 10 ℃, 25 ℃ and 40 ℃; when the test is run at a constant temperature and a high temperature, T is3Greater than 20 ℃ and T3Can be at 40 deg.C, 55 deg.C, 70 deg.C.
It should be noted that, in the first step, different temperature test types, such as a constant temperature storage test and a constant temperature operation test, or a constant temperature storage test, a constant temperature operation test or a variable temperature operation test at a plurality of temperatures may be input, and then the present invention may sequentially perform the constant temperature storage test and the constant temperature operation test on the device under test.
When the temperature test type is a constant temperature storage test, the third step comprises the following steps:
step 3.1a, the tested device is not electrified, the temperature box is controlled according to the temperature test curve in the step one, the temperature change rate is controlled to be less than or equal to q, and the storage temperature T is reached1And at T1Lower hold t1Hour, and T1Is not equal to T0，t1Is a positive number;
step 3.2a, controlling the temperature box according to the temperature test curve in the step one, and controlling the temperature change rate to be less than or equal to q so as to recover to the temperature T0Then, t is held2Hour(s)And t is2Is a positive number;
and 3.3a, electrifying the tested device, controlling the tester to output a value to the tested device according to the test parameters in the first step, collecting an action value of the tested device and obtaining a test result.
When the temperature test type is a constant temperature operation test, the third step comprises the following steps:
step 3.1b, keeping the tested device not powered on, controlling the temperature box according to the temperature test curve in the step one, controlling the temperature change rate to be less than or equal to q, and achieving the constant temperature storage temperature T3Then, t is held3In one hour, the tested device is electrified, the tester is controlled to output a quantity value to the tested device according to the test parameters in the step one, the action value of the tested device is collected, and T is3Is not equal to T0，a3And t3Is a positive number;
step 3.2b, at temperature T3Next, keeping the tested device powered on, and keeping t4After hours, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, collecting an action value of the tested device, and t4Is a positive number;
step 3.3b, powering off the tested device, controlling the temperature box according to the temperature test curve in the step one, and controlling the temperature change rate to be less than or equal to q and recovering to T0And hold t5Hour, test results are obtained, and t5Is a positive number.
When the temperature test type is a variable temperature operation test, the third step comprises the following steps:
step 3.1c, defining the temperature change frequency as e, making e equal to 1, and entering step 3.3 c;
step 3.2c, enabling e +1, and entering step 3.4 c;
3.3c, electrifying the tested device;
step 3.4c, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, and collecting an action value of the tested device; meanwhile, the temperature box is controlled according to the temperature test curve in the first step, the temperature change rate is controlled to be less than or equal to q, and the high-temperature operation temperature T is reached4Hold t6Hour, and t6Is a positive number, T4Is not equal to T0；
Step 3.5c, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, and collecting an action value of the tested device; meanwhile, the temperature box is controlled according to the temperature test curve in the first step, the temperature change rate is controlled to be less than or equal to q, and the low-temperature operation temperature T is reached5Hold t7Hour, and t7Is a positive number, T5Is not equal to T0；
Step 3.6c, judging the current temperature change times, and if e is equal to e ', entering step 3.7c, and if e is less than e ', entering step 3.3c, wherein e ' is a positive integer larger than 1;
step 3.7c, controlling the temperature box according to the temperature test curve in the step one, and controlling the speed with the temperature change rate less than or equal to q to recover to T0Entering step 3.8 c;
and 3.8c, obtaining a test result of the tested device.
Wherein t of the invention0Is 1, t1And t4Are all 16, t3And t2Are all 1, t5≤2， t7And t6Are all 3. q is 1K/min. T is0T is 20 ℃ below zero and is more than or equal to-200 DEG C1≤100℃，-200℃≤T2≤100℃；-200℃≤T3≤100℃；20℃≤T4≤100℃，-200℃≤ T5At 20 ℃ or less, and e' is 4. Specifically, the range of this example is-70 ℃ T.ltoreq.T, according to the usual temperature settings1≤100℃，-70℃≤T2≤100℃；-70℃≤T3≤100℃； 20℃≤T4≤100℃，-70℃≤T5≤20℃。
According to the automatic testing method for the relay protection device environment test, the relay protection device environment test can be automatically carried out after the upper computer sets the test parameters, so that the time can be saved, and the working efficiency can be improved. The environmental test of the invention is closed loop, without manual intervention, and the temperature test types do not need to be rechecked manually, and another temperature test type can be started directly after one temperature test type is finished.
Example 3.
An automatic test method for an environmental test of a relay protection device comprises the steps of placing a device to be tested in a temperature box, and connecting wires.
Inputting only one group of temperature test types and passing corresponding test parameters in an upper computer, wherein the specific temperature test type is constant temperature operation test, the temperature is 55 ℃, the repressing overcurrent protection of the tested device, the action values of the tested device are 50V and 1A, the power supply specification of the tested device is DC220V, and the delay time of the tested device is 1 s.
Step two, judging the working state of the device to be tested;
step 2.1, placing the device to be tested in a temperature box, enabling the temperature of the temperature box to reach 20 ℃, and keeping the temperature for 1 hour;
step 2.2, the power supply device powers on the device to be tested and the power supply outputs 220V;
2.3, after the tested device works, the upper computer controls the tester to apply an action value to the output value of the tested device within the application range of 0.9-1A according to the test parameters in the first step, the test delay time is 1s, and the low-voltage application value is 52-48V;
step 2.4, enabling the tester to output a quantity value to the device to be tested, and collecting an action value of the device to be tested;
step 2.5, the upper computer verifies the action value of the tested device obtained in the step 2.4 and the output value obtained in the step 2.3, judges whether the time delay and the like are correct, and enters the step 2.7 when the time delay and the like are correct;
step 2.7, controlling the tested device to be powered off and stopping the output value of the tester, and entering the step three;
3.1b, keeping the tested device not powered on, controlling a temperature box according to the temperature test curve in the first step, controlling the temperature change rate to be less than or equal to 1 ℃/min to increase the temperature, reaching the constant-temperature storage temperature of 55 ℃, keeping for 2 hours to power on the tested device, controlling the tester to output a value to the tested device according to the test parameters in the first step, and collecting an action value of the tested device;
step 3.2b, electrifying the tested device by the upper computer at the temperature of 55 ℃, keeping for 16 hours, controlling the tester to output a value to the tested device according to the test parameters in the step one, and collecting an action value of the tested device;
and 3.3b, powering off the tested device, stopping the output of the tester, controlling the temperature box according to the temperature test curve in the first step, and controlling the temperature change rate to be less than or equal to 1 ℃/min and recovering to 20 ℃. After the recovery is finished, keeping for 1 hour to obtain a test result;
step four, controlling the tester to stop the output of the magnitude, and controlling the power supply device to be powered off;
step five, judging whether all temperature test types are finished or not, and entering step seven because only one constant temperature test type exists;
and step seven, completing the test.
According to the automatic testing method for the relay protection device environment test, the relay protection device environment test can be automatically carried out after the upper computer sets the test parameters, so that the time can be saved, and the working efficiency can be improved. The environmental test of the invention is closed loop, without manual intervention, and the temperature test types do not need to be rechecked manually, and another temperature test type can be started directly after one temperature test type is finished.
Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention and not for limiting the protection scope of the present invention, and although the present invention is described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that modifications or equivalent substitutions can be made on the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention.
Claims (10)
1. The utility model provides a relay protection device environmental test automatic test system which characterized in that: the device comprises an upper computer, a switch for data exchange, a tester, a power supply device and a temperature box for providing environment temperature regulation for a tested device, wherein the switch is bidirectionally connected with the tester, the upper computer, the power supply device and the temperature box;
the upper computer is used for testing parameter input, controlling an environment temperature curve, calculating a quantity value output by the tester, collecting an action value of the tested device, collecting an action value fed back by the tester, and obtaining a test result according to the quantity value and the action value of the tested device;
the tester is used for conveying the quantity value to the tested device, collecting the action value of the tested device and feeding the action value back to the upper computer;
the power supply device outputs a corresponding alternating current/direct current voltage value to the tested device;
the temperature box is used for controlling the ambient temperature in the temperature box according to the ambient temperature curve.
2. The automatic testing system for environmental tests of relay protection devices according to claim 1, characterized in that: the upper computer is provided with a test control module, a power supply control module, a temperature control module and a communication module, and the test control module, the power supply control module, the temperature control module and the communication module are respectively connected with the switch;
the test control module is used for receiving input test parameters and calculating the output quantity value of the tested device;
the temperature control module is used for obtaining an environment temperature curve according to the test parameters and controlling the temperature of the temperature box;
the power supply control module controls the power supply device to output an alternating current/direct current voltage value according to the environment temperature curve so that the power supply device powers on the device to be tested;
the communication module is used for receiving the action value of the tested device.
3. The automatic testing system for environmental tests of relay protection devices according to claim 2, characterized in that: the switch is connected with the tester, the upper computer, the power supply device and the temperature box in a bidirectional mode through network cables;
the power supply is connected with the tested equipment through a test line;
when the tester is an analog quantity sampling device, the tester is connected with the tested device through a short-circuit wire;
when the tester is a digital device, the tester is connected with the tested device through an optical fiber.
4. The automatic testing system for environmental tests of relay protection devices according to claim 3, wherein: the upper computer, the power supply device, the temperature box and the tester are communicated by using a private protocol;
the upper computer and the tested device are communicated by using an IEC61850 protocol;
the upper computer is also provided with a model curve database of various environment temperature test curves.
5. An automatic testing method for environmental tests of relay protection devices, which is carried out by adopting the automatic testing system for environmental tests of relay protection devices as claimed in any one of claims 1 to 4;
the method comprises the following steps:
inputting at least one group of temperature test types and corresponding test parameters in an upper computer, and correspondingly obtaining at least one group of temperature test curves;
step two, judging the working state of the device to be tested;
step three, sequentially selecting a group of temperature test types in the step one and corresponding temperature test curves to control the temperature of the temperature box, testing the ambient temperature of the tested device, and acquiring action values of the tested device to obtain corresponding test results;
step four, controlling the tester to stop the output of the magnitude, and controlling the power supply device to be powered off;
step five, judging whether all temperature test types are tested or not, if so, entering step six, otherwise, entering step seven;
step six, returning to the step two;
and step seven, completing the test.
6. The automatic testing method for the environmental test of the relay protection device according to claim 5, wherein: inputting at least one group of temperature test types and corresponding test parameters in an upper computer, and selecting corresponding environment temperature test curves in a model curve database according to the test parameters and the corresponding temperature test types respectively to obtain at least one group of corresponding temperature test curves;
the second step is specifically as follows:
step 2.1, placing the device to be tested in a temperature box, and enabling the temperature box to reach the temperature T0And hold t0Hour, and T0And t0Are both greater than 0;
step 2.2, the power supply device powers on the device to be tested;
step 2.3, calculating the output value of the tester according to the test parameters in the step one;
step 2.4, enabling the tester to output a quantity value to the device to be tested, and collecting an action value of the device to be tested;
step 2.5, judging whether the operation of the tested device is normal or not according to the action value obtained in the step 2.4 and the output quantity value obtained in the step 2.3, if so, entering the step 2.6, otherwise, entering the step 2.7;
step 2.6, entering a step seven;
step 2.7, controlling the power-off of the tested device, and entering the step three;
the test parameters are provided with the power supply specification of the tested device, the protection function of the tested device, the action value of the tested device and the delay time of the tested device;
the temperature test type is at least one of a constant temperature storage test, a constant temperature operation test or a variable temperature operation test,
wherein the constant temperature storage test comprises a high temperature constant temperature storage test or a low temperature constant temperature storage test;
the constant temperature operation test comprises a high temperature constant temperature operation test or a low temperature constant temperature operation test.
7. The automatic testing method for the environmental test of the relay protection device according to claim 6, wherein: when the temperature test type is a constant temperature storage test, the third step comprises the following steps:
step 3.1a, the tested device is not electrified, the temperature box is controlled according to the temperature test curve in the step one, the temperature change rate is controlled to be less than or equal to q, and the storage temperature T is reached1And at T1Lower hold t1Hour, and T1Is not equal to T0，t1Is a positive number;
step 3.2a, controlling the temperature box according to the temperature test curve in the step one, and controlling the temperature change rate to be less than or equal to q so as to recover to the temperature T0Then, t is held2Hour, and t2Is a positive number;
and 3.3a, electrifying the tested device, controlling the tester to output a value to the tested device according to the test parameters in the first step, collecting an action value of the tested device and obtaining a test result.
8. The automatic testing method for the environmental test of the relay protection device according to claim 7, wherein: when the temperature test type is a constant temperature operation test, the third step comprises the following steps:
step 3.1b, keeping the tested device not powered on, controlling the temperature box according to the temperature test curve in the step one, controlling the temperature change rate to be less than or equal to q, and achieving the constant temperature storage temperature T3Then, t is held3After hours, the tested device is powered on, the tester is controlled to output a quantity value to the tested device according to the test parameters in the step one, the action value of the tested device is collected, and T is3Is not equal to T0，a3And t3Is a positive number;
step 3.2b, at temperature T3Next, keeping the tested device powered on, and keeping t4After hours, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, collecting an action value of the tested device, and t4Is a positive number;
step 3.3b, powering off the tested device, controlling the temperature box according to the temperature test curve in the step one, and controlling the temperature change rate to be less than or equal to q and recovering to T0And hold t5Hour, test results are obtained, and t5Is a positive number.
9. The automatic testing method for the environmental test of the relay protection device according to claim 8, wherein: when the temperature test type is a variable temperature operation test, the third step comprises the following steps:
step 3.1c, defining the temperature change frequency as e, making e equal to 1, and entering step 3.3 c;
step 3.2c, enabling e +1, and entering step 3.4 c;
3.3c, electrifying the tested device;
step 3.4c, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, and collecting an action value of the tested device; meanwhile, the temperature box is controlled according to the temperature test curve in the first step, the temperature change rate is controlled to be less than or equal to q, and the high-temperature operation temperature T is reached4Hold t6Hour, and t6Is a positive number, T4Is not equal to T0；
Step 3.5c, controlling the tester to output a quantity value to the tested device according to the test parameters in the step one, and collecting an action value of the tested device; meanwhile, the temperature box is controlled according to the temperature test curve in the first step, the temperature change rate is controlled to be less than or equal to q, and the low-temperature operation temperature T is reached5Hold t7Hour, and t7Is a positive number, T5Is not equal to T0；
Step 3.6c, judging the current temperature change times, and if e is equal to e ', entering step 3.7c, and if e is less than e ', entering step 3.3c, wherein e ' is a positive integer larger than 1;
step 3.7c, controlling the temperature box according to the temperature test curve in the step one, and controlling the speed with the temperature change rate less than or equal to q to recover to T0Entering step 3.8 c;
and 3.8c, obtaining a test result of the tested device.
10. The automatic testing method for the environmental test of the relay protection device according to claim 9, wherein: said t is0Is 1, t1And t4Are all 16, t3And t2Are all 1, t5≤2，t7And t6Are all 3;
the q is 1K/min;
the T is0T is 20 ℃ below zero and is more than or equal to-200 DEG C1≤100℃，-200℃≤T2≤100℃；-200℃≤T3≤100℃；20℃≤T4≤100℃，-200℃≤T5≤20℃；
And e' is 4.
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Address after: 461000 No. 17, Shangde Road, Xuchang City, Henan Province Patentee after: XUCHANG KETOP TESTING RESEARCH INSTITUTE CO.,LTD. Address before: 461000 Intersection of Weiwu Avenue and Shangde Road, Xuchang City, Henan Province Patentee before: XUCHANG KETOP TESTING RESEARCH INSTITUTE CO.,LTD. |