CN112710907A - Power amplifier test method, power amplifier test system and computer readable storage medium - Google Patents
Power amplifier test method, power amplifier test system and computer readable storage medium Download PDFInfo
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- CN112710907A CN112710907A CN201911015092.XA CN201911015092A CN112710907A CN 112710907 A CN112710907 A CN 112710907A CN 201911015092 A CN201911015092 A CN 201911015092A CN 112710907 A CN112710907 A CN 112710907A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a test method, a test system and a computer readable storage medium of a power amplifier, wherein the test method comprises the following steps: s1, configuring a grid power supply voltage Vgg of the power amplifier under a preset drain voltage Vdd; s2, obtaining drain current Idq of the power amplifier under the grid power supply voltage Vgg; s3, judging whether the drain current Idq is in a preset drain current interval, if not, executing a step S4, and if so, executing a step S5; s4, based on Newton iteration method Vgg ═ Vgg- (Idq-Idq)Goal) The gate supply voltage Vgg is iterated by/k and returns to step S1, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d); and S5, testing the power amplifier. The invention fully utilizes the I/V characteristic curve of the power amplifier, adjusts the grid power supply voltage of the power amplifier by applying a Newton iteration method, and sets the powerThe quiescent current of the amplifier has the technical characteristics of high efficiency and reliability, and can be widely applied to the performance test of the power amplifier.
Description
Technical Field
The invention belongs to the technical field of power device testing, and particularly relates to a testing method and a testing system of a power amplifier and a computer readable storage medium.
Background
A Radio Frequency Power Amplifier (RFPA) is an important component of a wireless communication system, and is mainly responsible for amplifying a modulated radio frequency signal and transmitting the amplified radio frequency signal through an antenna, and the performance of the RFPA directly determines the core index of the wireless communication system.
When the radio frequency power amplifier automatically tests the performance of the radio frequency power amplifier, the grid voltage of the power amplifier is controlled by a program, so that the power amplifier is tested under the specified static current. In the prior art, a gate voltage range is programmed, and a dichotomy control gate voltage is adopted to test a power amplifier under a specified quiescent current.
Due to the characteristics of the power amplifier, as the temperature rises, the static current becomes larger under the same gate voltage, and the binary search of the static current has certain blindness. The program controls the gate voltage by bisection, so that the time required for the power amplifier to be in a specified quiescent current is long, and the condition that the program is in a dead cycle exists.
Therefore, in view of the above technical problems, it is desirable to provide a test method, a test system and a computer readable storage medium for a power amplifier.
Disclosure of Invention
In view of the above, the present invention provides a method and a system for testing a power amplifier, and a computer readable storage medium.
In order to achieve the above object, an embodiment of the present invention provides the following technical solutions:
a method of testing a power amplifier, the method comprising:
s1, configuring a grid power supply voltage Vgg of the power amplifier under a preset drain voltage Vdd;
s2, obtaining drain current Idq of the power amplifier under the grid power supply voltage Vgg;
s3, judging whether the drain current Idq is in a preset drain current interval, if not, executing a step S4, and if so, executing a step S5;
s4, based on Newton iteration method Vgg ═ Vgg- (Idq-Idq)Goal) The gate supply voltage Vgg is iterated by/k and returns to step S1, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d);
and S5, testing the power amplifier.
In an embodiment, the predetermined drain current interval in the step S3 is [ Idq1，Idq2]Wherein, Idq1≤IdqGoal≤Idq2。
In an embodiment, the predetermined drain current interval in the step S3 is [ Idq1，Idq2]Wherein, IdqGoal＝(Idq1+Idq2)/2。
In an embodiment, before the step S4, the method further includes:
and acquiring an I/V characteristic curve of drain current Idq-gate-source voltage Vgs of the power amplifier under a preset drain voltage Vdd.
The technical scheme provided by another embodiment of the invention is as follows:
a test system for a power amplifier, the test system comprising:
the configuration unit is used for configuring a grid power supply voltage Vgg of the power amplifier under a preset drain voltage Vdd and configuring a preset drain current interval;
a drain current obtaining unit, configured to obtain a drain current Idq of the power amplifier under the gate power supply voltage Vgg;
the judging unit is used for judging whether the drain current Idq is within a preset drain current interval or not;
an iteration unit, configured to, when the drain current Idq is not within the preset drain current interval, set Vgg ═ Vgg- (Idq-Idq) based on a newton iteration methodGoal) The gate supply voltage Vgg is iterated by/k, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d);
and the testing unit is used for testing the power amplifier when the drain current Idq is within a preset drain current interval.
In one embodiment, the predetermined drain current interval is [ Idq ]1，Idq2]Wherein, Idq1≤IdqGoal≤Idq2。
In one embodiment, the presettingDrain current interval of [ Idq1，Idq2]Wherein, IdqGoal＝(Idq1+Idq2)/2。
In an embodiment, the configuration unit is further configured to:
and acquiring an I/V characteristic curve of drain current Idq-gate-source voltage Vgs of the power amplifier under a preset drain voltage Vdd.
The technical scheme provided by the further embodiment of the invention is as follows:
a computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the above-mentioned method of testing a power amplifier.
Compared with the prior art, the invention has the following advantages:
the invention fully utilizes the I/V characteristic curve of the power amplifier, adjusts the grid power supply voltage of the power amplifier by applying a Newton iteration method, sets the quiescent current of the power amplifier, has the technical characteristics of high efficiency and reliability, and can be widely applied to the performance test of the power amplifier.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a flow chart illustrating a method for testing a power amplifier according to the present invention;
FIG. 2 is a block diagram of a power amplifier test system according to the present invention;
FIG. 3 is a graph illustrating the I/V characteristics of the power amplifier LDMOS according to an embodiment of the present invention;
fig. 4 is a block diagram of a power amplifier performance testing apparatus according to an embodiment of the invention.
Detailed Description
The present invention will be described in detail below with reference to embodiments shown in the drawings. The embodiments are not intended to limit the present invention, and structural, methodological, or functional changes made by those skilled in the art according to the embodiments are included in the scope of the present invention.
Referring to fig. 1, the present invention discloses a method for testing a power amplifier, including:
s1, configuring a grid power supply voltage Vgg of the power amplifier under a preset drain voltage Vdd;
s2, obtaining drain current Idq of the power amplifier under the grid power supply voltage Vgg;
s3, judging whether the drain current Idq is in a preset drain current interval, if not, executing a step S4, and if so, executing a step S5;
s4, based on Newton iteration method Vgg ═ Vgg- (Idq-Idq)Goal) The gate supply voltage Vgg is iterated by/k and returns to step S1, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d);
and S5, testing the power amplifier.
Referring to fig. 2, the present invention also discloses a testing system of a power amplifier, comprising:
the configuration unit 10 is configured to configure a gate power supply voltage Vgg of the power amplifier under a preset drain voltage Vdd, and configure a preset drain current interval;
a drain current obtaining unit 20, configured to obtain a drain current Idq of the power amplifier under the gate power supply voltage Vgg;
a determining unit 30, configured to determine whether the drain current Idq is within a preset drain current interval;
an iteration unit 40, configured to, when the drain current Idq is not within the preset drain current interval, set Vgg ═ Vgg- (Idq-Idq) based on a newton iteration methodGoal) The gate supply voltage Vgg is iterated by/k, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d);
and the test unit 50 is used for testing the power amplifier when the drain current Idq is within a preset drain current interval.
The present invention is further illustrated by the following specific examples.
Referring to fig. 1, a power amplifier according to an embodiment of the invention is illustrated by taking an LDMOS (lateral double-diffused MOSFET) as an example, and includes the following steps:
s1, configuring the gate power supply voltage Vgg of the power amplifier at the predetermined drain voltage Vdd.
Specifically, in the present embodiment, the preset drain voltage Vdd is 28V, the preset gate-source voltage Vgs is 1.8V to 2.1V, the gate power supply voltage Vgg in the present embodiment is configured to be 2V, and when the preset drain voltage Vdd is 28V, the I/V characteristic curve of the drain current Idq — the gate-source voltage Vgs of the power amplifier LDMOS is shown in fig. 3.
And S2, acquiring the drain current Idq of the power amplifier under the grid power supply voltage Vgg.
A gate power supply voltage Vgg of 2V is applied to the gate, and a corresponding drain current Idq is measured when Vgg becomes 2V.
S3, judging whether the drain current Idq is in the preset drain current interval.
In this embodiment, the predetermined drain current interval is [ Idq1，Idq2]Wherein, IdqGoal＝(Idq1+Idq2)/2，IdqGoalIs a preset quiescent current target value. For example, the quiescent current target value is set to 600mA, Idq1＝597mA，Idq2603mA, the preset drain current interval is [597, 603]mA。
S4, based on Newton iteration method Vgg ═ Vgg- (Idq-Idq)Goal) The gate supply voltage Vgg is iterated by/k and returns to step S1, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d).
When the drain current Idq is not in the predetermined drain current interval [597, 603]]Within mA, Vgg is Vgg- (Idq-Idq) based on Newton iteration methodGoal) K pairsThe gate supply voltage Vgg is iterated, Idq in this embodimentGoalWhen the slope of the I/V characteristic curve of the power amplifier in fig. 3 at Idq 600mA is 5.6, the iteration formula of the newton iteration method is Vgg ═ Vgg- (Idq-600 mA)/5.6.
And (4) iterating by a Newton iteration method until the Idq is within a preset drain current interval [597, 603] mA.
S5, when the drain current Idq is within the preset drain current interval [597, 603] mA, testing the power amplifier.
It should be understood that the preset drain current interval [ Idq ] in the present embodiment1，Idq2]Satisfies IdqGoal＝(Idq1+Idq2) /2, in other embodiments, the current interval [ Idq ] is preset1，Idq2]Other intervals can be set, and only the Idq is required to be satisfied1≤IdqGoal≤Idq2That is, e.g., set to [600, 606 ]]mA、[594，600]mA、[598，604]mA、[596，602]mA, etc., and will not be illustrated here.
Specifically, as shown in fig. 4, the performance testing apparatus of the power amplifier includes a device under test DUT, a terminal PC, a signal source SG, a power meter PM, a spectrum analyzer SA, and the like, during testing, first, a gate power supply voltage Vgg and a drain voltage Vdd are applied to the device under test DUT, the signal source SG transmits a signal to the device under test DUT, the power meter PM obtains power of the device under test DUT, and the spectrum analyzer SA measures performance (signal parameters such as signal distortion, modulation, spectrum purity, frequency stability, and intermodulation distortion) of the device under test DUT.
Preferably, a driving amplifier Driver and an Isolator are further arranged between the signal source SG and the device under test DUT, and an Attenuator attentuator and a Power Divider are arranged between the device under test DUT and the Power meter PM and between the device under test DUT and the spectrum analyzer SA.
It should be understood that the performance testing apparatus in fig. 4 is only a specific example, and in other embodiments, the device performance may also be tested by using a testing apparatus with other structures, and all technical solutions that the drain current Idq is within the preset current interval by iterating Vgg by using the newton iteration method belong to the scope protected by the present invention.
Based on the I/V characteristic curve of the power amplifier, the curve may be approximated to a straight line with a specific slope when the curve is a small segment. By utilizing the characteristic, the grid power supply voltage of the power amplifier is set by applying a Newton iteration method, and the power amplifier is quickly adjusted to a specified static current value for testing.
The invention makes full use of the I/V characteristic curve of the radio frequency power amplifier, can realize high-efficiency and reliable adjustment of quiescent current, and performs radio frequency power amplification performance test. The dichotomy does not utilize that the I/V characteristic curve of the power amplifier can be approximate to characteristic slope straight line information when the I/V characteristic curve is in a small section, and the adjustment of the grid power supply voltage has certain blindness.
In addition, the invention also discloses a computer readable storage medium, on which a computer program is stored, which when executed by a processor implements the steps of the method for testing a power amplifier described above.
According to the technical scheme, the invention has the following beneficial effects:
the invention fully utilizes the I/V characteristic curve of the power amplifier, adjusts the grid power supply voltage of the power amplifier by applying a Newton iteration method, sets the quiescent current of the power amplifier, has the technical characteristics of high efficiency and reliability, and can be widely applied to the performance test of the power amplifier.
The systems, devices, modules or units illustrated in the above embodiments may be implemented by a computer chip or an entity, or by a product with certain functions.
For convenience of description, the above devices are described as being divided into various units by function, and are described separately. Of course, the functionality of the various elements may be implemented in the same one or more software and/or hardware implementations in implementing one or more embodiments of the present description.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
As will be appreciated by one skilled in the art, embodiments of one or more embodiments of the present description may be provided as a method, system, or computer program product. Accordingly, one or more embodiments of the present description may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, one or more embodiments of the present description may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
One or more embodiments of the present description may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. One or more embodiments of the specification may also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules may be located in both local and remote computer storage media including memory storage devices.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (9)
1. A method for testing a power amplifier, the method comprising:
s1, configuring a grid power supply voltage Vgg of the power amplifier under a preset drain voltage Vdd;
s2, obtaining drain current Idq of the power amplifier under the grid power supply voltage Vgg;
s3, judging whether the drain current Idq is in a preset drain current interval, if not, executing a step S4, and if so, executing a step S5;
s4, based on Newton iteration method Vgg ═ Vgg- (Idq-Idq)Goal) The gate supply voltage Vgg is iterated by/k and returns to step S1, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d);
and S5, testing the power amplifier.
2. The method according to claim 1, wherein the predetermined drain current interval in step S3 is [ Idq ]1，Idq2]Wherein, Idq1≤IdqGoal≤Idq2。
3. The method according to claim 1, wherein the predetermined drain current interval in step S3 is [ Idq ]1，Idq2]Wherein, IdqGoal＝(Idq1+Idq2)/2。
4. The testing method according to claim 1, wherein the step S4 is preceded by:
and acquiring an I/V characteristic curve of drain current Idq-gate-source voltage Vgs of the power amplifier under a preset drain voltage Vdd.
5. A test system for a power amplifier, the test system comprising:
the configuration unit is used for configuring a grid power supply voltage Vgg of the power amplifier under a preset drain voltage Vdd and configuring a preset drain current interval;
a drain current obtaining unit, configured to obtain a drain current Idq of the power amplifier under the gate power supply voltage Vgg;
the judging unit is used for judging whether the drain current Idq is within a preset drain current interval or not;
an iteration unit, configured to, when the drain current Idq is not within the preset drain current interval, set Vgg ═ Vgg- (Idq-Idq) based on a newton iteration methodGoal) The gate supply voltage Vgg is iterated by/k, where IdqGoalK is Idq ═ Idq in the I/V characteristic curve of the power amplifier for a preset quiescent current target valueGoalThe slope of (d);
and the testing unit is used for testing the power amplifier when the drain current Idq is within a preset drain current interval.
6. The test system of claim 5, wherein the predetermined drain current interval is [ Idq ]1，Idq2]Wherein, Idq1≤IdqGoal≤Idq2。
7. The test system of claim 5, wherein the predetermined drain current interval is [ Idq ]1，Idq2]Wherein, IdqGoal＝(Idq1+Idq2)/2。
8. The test system of claim 5, wherein the configuration unit is further configured to:
and acquiring an I/V characteristic curve of drain current Idq-gate-source voltage Vgs of the power amplifier under a preset drain voltage Vdd.
9. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method for testing a power amplifier according to any one of claims 1 to 4.
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