CN112666733B - Lcd灰阶画面下线型缺陷检测方法、电子设备及存储介质 - Google Patents
Lcd灰阶画面下线型缺陷检测方法、电子设备及存储介质 Download PDFInfo
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CN103913858A (zh) * | 2013-01-07 | 2014-07-09 | 北京兆维电子(集团)有限责任公司 | 一种tft-lcd屏自动光学检测中的滤波方法 |
CN108876733A (zh) * | 2018-05-30 | 2018-11-23 | 上海联影医疗科技有限公司 | 一种图像增强方法、装置、设备和存储介质 |
CN112184744A (zh) * | 2020-11-29 | 2021-01-05 | 惠州高视科技有限公司 | 显示屏边缘缺陷检测方法和装置 |
CN112419228A (zh) * | 2020-10-14 | 2021-02-26 | 惠州高视科技有限公司 | 盖板立体边缘缺陷的检测方法及装置 |
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JP5180608B2 (ja) * | 2008-01-30 | 2013-04-10 | 株式会社日立ハイテクノロジーズ | ディスク表面の欠陥検査方法及び欠陥検査装置 |
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CN103913858A (zh) * | 2013-01-07 | 2014-07-09 | 北京兆维电子(集团)有限责任公司 | 一种tft-lcd屏自动光学检测中的滤波方法 |
CN108876733A (zh) * | 2018-05-30 | 2018-11-23 | 上海联影医疗科技有限公司 | 一种图像增强方法、装置、设备和存储介质 |
CN112419228A (zh) * | 2020-10-14 | 2021-02-26 | 惠州高视科技有限公司 | 盖板立体边缘缺陷的检测方法及装置 |
CN112184744A (zh) * | 2020-11-29 | 2021-01-05 | 惠州高视科技有限公司 | 显示屏边缘缺陷检测方法和装置 |
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