CN112636994A - Device testing method, system, network device and readable storage medium - Google Patents
Device testing method, system, network device and readable storage medium Download PDFInfo
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- CN112636994A CN112636994A CN201910951821.6A CN201910951821A CN112636994A CN 112636994 A CN112636994 A CN 112636994A CN 201910951821 A CN201910951821 A CN 201910951821A CN 112636994 A CN112636994 A CN 112636994A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
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Abstract
The equipment testing method, the system, the network equipment and the readable storage medium provided by the embodiment of the invention detect the current working environment information; and when the working environment information is detected to be qualified, testing various testing items of the equipment to be tested in parallel. Therefore, the test is performed in a parallel mode through various test items of the device to be tested, the time required by the test is greatly reduced, and the efficiency is improved.
Description
Technical Field
The embodiments of the present invention relate to, but are not limited to, the field of communication devices, and in particular, but not limited to, a device testing method, system, network device, and readable storage medium.
Background
The existing automatic testing technology of the tool can realize the self-checking of the single board and cover various communication routing devices; in the related art, the tool version testing method and the tool version testing process are quite long, the contents of the tool version testing method and the tool version testing process cover self-checking of equipment environment information, PCIE, SA200, NP5, forwarding testing, control panel testing, serch mem and the like, and the testing items are executed in a pipeline mode and executed item by item, so that the testing time is long, and the efficiency is low.
Disclosure of Invention
The equipment testing method, the system, the network equipment and the readable storage medium provided by the embodiment of the invention mainly solve the technical problems of long equipment testing mode time and low efficiency in the related technology.
In order to solve the above technical problem, an embodiment of the present invention provides an apparatus testing method, including:
detecting current working environment information;
and when the working environment information is detected to be qualified, testing various testing items of the equipment to be tested in parallel.
An embodiment of the present invention further provides an apparatus testing system, including:
the first testing module is used for detecting the current working environment information;
and the second testing module is used for testing various testing items of the equipment to be tested in parallel when the working environment information is detected to be qualified.
The embodiment of the invention also provides network equipment, which comprises a processor, a memory and a communication bus;
the communication bus is used for realizing connection communication between the processor and the memory;
the processor is configured to execute one or more computer programs stored in the memory to implement the steps of the device testing method described above.
Embodiments of the present invention also provide a computer storage medium, where one or more programs are stored in the computer storage medium, and the one or more programs are executable by one or more processors to implement the steps of the device testing method described above.
The invention has the beneficial effects that:
according to the equipment testing method, the system, the network equipment and the readable storage medium provided by the embodiment of the invention, the current working environment information is detected; and when the working environment information is detected to be qualified, testing various testing items of the equipment to be tested in parallel. Therefore, the test is performed in a parallel mode through various test items of the device to be tested, the time required by the test is greatly reduced, and the efficiency is improved.
Additional features and corresponding advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
Fig. 1 is a flowchart of a device testing method according to an embodiment of the present invention;
fig. 2 is a flowchart of a device testing method according to a second embodiment of the present invention;
fig. 3 is a schematic diagram illustrating a device testing system according to a third embodiment of the present invention;
fig. 4 is a schematic structural diagram of a network device according to a fourth embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention are described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As a communication product, for example, a router of model ZXR 10T 8000 is used as a high-end core router, performing device self-check before performing a product is a very important link, and ZXR 10T 8000 as a core router has the characteristics of high capacity and high performance, and has 18 line card slots, and under the condition of full configuration, it takes a long time for all single boards to complete a round of self-check tests, for example: the total number of test items required for testing the 5Z line card is 176 in 3 hours, and the total number of test items required for testing exchange is 75 in 1 hour. The test of the IZ line card requires 4 hours, the total number of test items is 187, the test of the 6Z line card requires 4 hours, and the total number of test items is 208.
The embodiments of the present application will be described below with reference to the accompanying drawings.
The first embodiment is as follows:
the present embodiment provides an apparatus testing method, please refer to fig. 1, the method includes:
s11, detecting the current working environment information;
and S12, when the working environment information is detected to be qualified, testing various test items of the equipment to be tested in parallel.
The current working environment information includes basic information of the device to be tested and information related to the testing environment.
In some embodiments, the current working environment information includes environment information of the device under test, and the environment information includes:
at least one of change request CR environment information, Boot version information and EPLD version information of the equipment to be tested.
In some embodiments, detecting the current working environment information may further include, in sequence:
starting a tool version for testing;
and self-checking the environmental information.
In some embodiments, before testing various types of test items of the device under test in parallel, the method may further include;
and classifying the test items of the equipment to be tested, wherein the test items in different types do not conflict with each other. The non-conflict means that the test can be divided into different threads to run without influencing the normal working logic of the equipment.
In some embodiments, classifying the test items of the device under test, wherein the test items in different types are not mutually conflicting may include:
test items are classified into five categories: the testing method comprises the steps of high-speed serial computer expansion bus standard PCIE testing, SA (synchronous/asynchronous serial interface) testing, NP (Network Processor) testing, forwarding testing and control plane testing. In the embodiment of the present invention, test items of a single board are split according to each function module implemented by the single board, and for a single board, at least one type and at most five types of the test items may be provided, that is, for a single board, the test items are classified according to the test items of the device to be tested. The tests are not interfered with each other, and the parallel tests can be carried out after classification, so that the time required by the tests can be greatly shortened compared with a serial flow type test scheme.
In some embodiments, the testing the various types of test items of the device under test in parallel further includes:
and triggering the test flow of the corresponding test item according to the test commands of start PCIE test, start SA test, start NP test, start forwarding test and start control plane test. Once the corresponding test command is executed, the corresponding script is started to run, so that the test is realized.
In some embodiments, the specific format of the test command may be: and the start slot < slot number > corresponds to the slot position corresponding to the slot number to be tested. The test command can be classified and executed according to the test items, and can test a specific slot position according to requirements; the slot number in the test command start slot is corresponding to the relevant slot, and the test command is executed, so that the specific slot can be tested according to the slot number in the test command, thereby greatly improving the flexibility of the test, and being beneficial to checking the known problems and the recurrence test of special module problems.
According to the equipment testing method provided by the embodiment, the current working environment information is detected; and when the working environment information is detected to be qualified, testing various testing items of the equipment to be tested in parallel. Therefore, the test is performed in a parallel mode through various test items of the device to be tested, the time required by the test is greatly reduced, and the efficiency is improved.
Example two
Fig. 2 is a flowchart of an apparatus testing method provided in the second embodiment of the present invention, where the apparatus testing method is applied to a router apparatus, for example, a router with a model number of ZXR 10T 8000 is used as a high-end core router, it is a very important link to perform an apparatus self-test before performing a product, ZXR 10T 8000 as the core router has a characteristic of large capacity and high performance, and has 18 line card slots, and in a fully-configured situation, it takes a long time for all single boards to complete a round of self-test, for example: 3 hours are needed for testing the 5Z line card, and the total number of test items is 176; the test exchange needs 1 hour, and the total number of test items is 75; 4 hours are needed for testing the IZ line card, and the total number of test items is 187; testing 6Z line cards requires 4 hours, with a total of 208 test items. The device testing method in the embodiment includes:
s21, CR environment check, Boot/EPLD version check;
s22, starting a tool version test;
s23, environment information and self-checking;
s241, testing PCLE;
s242, testing SA 200;
s243, NP5 test;
s244, forwarding test;
s245, testing a control panel;
and S25, completing the test.
EXAMPLE III
The present embodiment provides an apparatus testing system, please refer to fig. 3, which includes:
the first testing module 31 is used for detecting the current working environment information;
and the second testing module 32 is configured to test various testing items of the device to be tested in parallel when the working environment information is detected to be qualified.
The current working environment information includes basic information of the device to be tested and information related to the testing environment.
In some embodiments, the current working environment information includes environment information of the device under test, and the environment information includes:
at least one of change request CR environment information, Boot version information and EPLD version information of the equipment to be tested.
In some embodiments, detecting the current working environment information may further include:
and starting testing of the tool version. After the tool version starts the test, the method may further include:
and self-checking the environmental information.
In some embodiments, before testing various types of test items of the device under test in parallel, the method may further include;
the test items of the equipment to be tested are at least divided into two types according to a non-conflict mode. The non-conflict means that the test can be divided into different threads to run without influencing the normal working logic of the equipment.
In some embodiments, the classifying the test items of the device under test into at least two categories in a non-conflicting manner may include:
test items are classified into five categories: the method comprises the steps of high-speed serial computer expansion bus standard PCIE testing, SA testing, NP testing, forwarding testing and control plane testing. The tests are not interfered with each other, and the parallel tests can be carried out after classification, so that the time required by the tests can be greatly shortened compared with a serial flow type test scheme.
In some embodiments, the testing the various types of test items of the device under test in parallel further includes:
and triggering the test flow of the corresponding test item according to the test commands of start PCIE test, start SA test, start NP test, start forwarding test and start control plane test. Once the corresponding test command is executed, the corresponding script is started to run, so that the test is realized.
In some embodiments, the specific format of the test command may be: and the start slot < slot number > corresponds to the slot position corresponding to the slot number to be tested. The test command can be classified and executed according to the test items, and can test a specific slot position according to requirements; the slot number in the test command start slot is corresponding to the relevant slot, and the test command is executed, so that the specific slot can be tested according to the slot number in the test command, thereby greatly improving the flexibility of the test, and being beneficial to checking the known problems and the recurrence test of special module problems.
According to the device testing apparatus provided by the embodiment, the first testing module is used for detecting current working environment information; and the second testing module is used for testing various testing items of the equipment to be tested in parallel when the working environment information is detected to be qualified. Therefore, the test is performed in a parallel mode through various test items of the device to be tested, the time required by the test is greatly reduced, and the efficiency is improved.
Example four
The present embodiment further provides a network device, as shown in fig. 4, which includes a processor 41, a memory 42 and a communication bus 43, wherein:
the communication bus 43 is used for realizing connection communication between the processor 41 and the memory 42;
the processor 41 is configured to execute one or more computer programs stored in the memory 42 to implement the steps of the device testing method in the foregoing embodiments, which are not described herein again.
The present embodiments also provide a computer-readable storage medium including volatile or non-volatile, removable or non-removable media implemented in any method or technology for storage of information such as computer-readable instructions, data structures, computer program modules or other data. Computer-readable storage media include, but are not limited to, RAM (Random Access Memory), ROM (Read-Only Memory), EEPROM (Electrically Erasable Programmable Read-Only Memory), flash Memory or other Memory technology, CD-ROM (Compact disk Read-Only Memory), Digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage systems, or any other medium which can be used to store the desired information and which can be accessed by a computer.
The computer readable storage medium in the present embodiment may be used for storing one or more computer programs, and the stored one or more computer programs may be executed by a processor to implement at least one step of the device testing method in the embodiments described above.
The present embodiment also provides a computer program (or computer software), which can be distributed on a computer readable medium and executed by a computing system to implement at least one step of the device testing method in the above embodiments.
The present embodiments also provide a computer program product comprising a computer readable system having stored thereon a computer program as shown above. The computer-readable system in this embodiment may include a computer-readable storage medium as shown above.
It will be apparent to those skilled in the art that all or some of the steps of the methods, systems, functional modules/units in the systems disclosed above may be implemented as software (which may be implemented in computer program code executable by a computing system), firmware, hardware, and suitable combinations thereof. In a hardware implementation, the division between functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be performed by several physical components in cooperation. Some or all of the physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit.
In addition, communication media typically embodies computer readable instructions, data structures, computer program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media as known to one of ordinary skill in the art. Thus, the present invention is not limited to any specific combination of hardware and software.
The foregoing is a more detailed description of embodiments of the present invention, and the present invention is not to be considered limited to such descriptions. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (10)
1. A device testing method, comprising:
detecting current working environment information;
and when the working environment information is detected to be qualified, testing various testing items of the equipment to be tested in parallel.
2. The device testing method according to claim 1, wherein the current working environment information includes environment information of the device under test, and the environment information includes:
at least one of change request CR environment information, Boot version information and EPLD version information of the equipment to be tested.
3. The device testing method of claim 1, wherein said detecting current operating environment information further comprises:
and starting testing of the tool version.
4. The device testing method of claim 3, further comprising, after the tool version initiation test:
and self-checking the environmental information.
5. The device testing method of any of claims 1-4, further comprising, prior to said testing each type of test item of the device under test in parallel;
and classifying the test items of the equipment to be tested, wherein the test items in different types do not conflict with each other.
6. The device testing method of claim 5, wherein classifying the test items of the device under test, wherein the test items at different types do not conflict with each other comprises:
the test items are classified into five categories: the method comprises the steps of high-speed serial computer expansion bus standard PCIE testing, synchronous/asynchronous serial port SA testing, network processor NP testing, forwarding testing and control plane testing.
7. The device testing method of claim 5, wherein the test items are initiated according to a test command, wherein the test command includes slot number information for testing the corresponding slot.
8. A device testing system, comprising:
the first testing module is used for detecting the current working environment information;
and the second testing module is used for testing various testing items of the equipment to be tested in parallel when the working environment information is detected to be qualified.
9. A network device comprising a processor, a memory, and a communication bus;
the communication bus is used for realizing connection communication between the processor and the memory;
the processor is configured to execute one or more computer programs stored in the memory to implement the steps of the device testing method of any one of claims 1-7.
10. A computer-readable storage medium, having one or more computer programs stored thereon, the one or more computer programs being executable by one or more processors to perform the steps of the device testing method of any one of claims 1-7.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910951821.6A CN112636994A (en) | 2019-10-09 | 2019-10-09 | Device testing method, system, network device and readable storage medium |
| PCT/CN2020/112692 WO2021068686A1 (en) | 2019-10-09 | 2020-08-31 | Device testing method, system, network device, and readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910951821.6A CN112636994A (en) | 2019-10-09 | 2019-10-09 | Device testing method, system, network device and readable storage medium |
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| Publication Number | Publication Date |
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| CN112636994A true CN112636994A (en) | 2021-04-09 |
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| CN201910951821.6A Withdrawn CN112636994A (en) | 2019-10-09 | 2019-10-09 | Device testing method, system, network device and readable storage medium |
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| Country | Link |
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| CN (1) | CN112636994A (en) |
| WO (1) | WO2021068686A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113886246A (en) * | 2021-09-30 | 2022-01-04 | 平安普惠企业管理有限公司 | O2O project flow management system testing method, device, equipment and storage medium |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1432916A (en) * | 2002-11-01 | 2003-07-30 | 英业达股份有限公司 | Multiple-thread automatic test method |
| US20140245264A1 (en) * | 2013-02-28 | 2014-08-28 | International Business Machines Corporation | Identifying Test Cases Based on Changed Test Code |
| CN106771961A (en) * | 2016-11-29 | 2017-05-31 | 广州视源电子科技股份有限公司 | board card testing method and system |
| CN108334428A (en) * | 2017-12-13 | 2018-07-27 | 天津津航计算技术研究所 | A kind of parallel test method of system function |
| CN209264906U (en) * | 2018-11-12 | 2019-08-16 | 卡斯柯信号有限公司 | CVC-200T hardware intelligent test system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10600495B2 (en) * | 2017-06-23 | 2020-03-24 | Texas Instruments Incorporated | Parallel memory self-testing |
-
2019
- 2019-10-09 CN CN201910951821.6A patent/CN112636994A/en not_active Withdrawn
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2020
- 2020-08-31 WO PCT/CN2020/112692 patent/WO2021068686A1/en active Application Filing
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1432916A (en) * | 2002-11-01 | 2003-07-30 | 英业达股份有限公司 | Multiple-thread automatic test method |
| US20140245264A1 (en) * | 2013-02-28 | 2014-08-28 | International Business Machines Corporation | Identifying Test Cases Based on Changed Test Code |
| CN106771961A (en) * | 2016-11-29 | 2017-05-31 | 广州视源电子科技股份有限公司 | board card testing method and system |
| CN108334428A (en) * | 2017-12-13 | 2018-07-27 | 天津津航计算技术研究所 | A kind of parallel test method of system function |
| CN209264906U (en) * | 2018-11-12 | 2019-08-16 | 卡斯柯信号有限公司 | CVC-200T hardware intelligent test system |
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| WO2021068686A1 (en) | 2021-04-15 |
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Application publication date: 20210409 |
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