CN112631843A - Equipment testing method and device, electronic equipment, readable medium and product - Google Patents

Equipment testing method and device, electronic equipment, readable medium and product Download PDF

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Publication number
CN112631843A
CN112631843A CN202011526853.0A CN202011526853A CN112631843A CN 112631843 A CN112631843 A CN 112631843A CN 202011526853 A CN202011526853 A CN 202011526853A CN 112631843 A CN112631843 A CN 112631843A
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test
tested
configuration information
cases
case
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王新宇
刘巍
车婷婷
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Beijing Baidu Netcom Science and Technology Co Ltd
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Beijing Baidu Netcom Science and Technology Co Ltd
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Priority to CN202011526853.0A priority Critical patent/CN112631843A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3684Test management for test design, e.g. generating new test cases
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites

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  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)

Abstract

The disclosure discloses a device testing method and device, electronic equipment, a computer readable medium and a product, and relates to the field of intelligent voice, in particular to the technical field of voice interaction device testing. The specific scheme is as follows: determining a test case of each device to be tested according to preset test configuration information; calling a corresponding test case for each device to be tested; controlling each device to be tested to synchronously execute a corresponding test case; the configuration information is used as the distribution basis of the test cases, the automatic distribution of the test cases can be realized, the configuration information can be preset, the full automation of equipment test is realized, no manual participation exists in the whole process, and the labor cost is reduced; in addition, a plurality of devices to be tested are tested synchronously, and the testing efficiency of the devices is improved.

Description

Equipment testing method and device, electronic equipment, readable medium and product
Technical Field
The present disclosure relates to the field of intelligent voice, and in particular, to the field of voice interaction device testing technologies, and in particular, to a device testing method and apparatus, an electronic device, a computer-readable medium, and a computer program product.
Background
With the rapid development of artificial intelligence technology, in order to meet the increasing demands of users and the pursuit of science and technology, more and more types of intelligent devices or mobile phone applications in the market are equipped with voice awakening and recognition technology, and before the devices or applications come into the market, testers should test the voice awakening and recognition functions of the devices or applications so as to ensure the quality of the devices or applications.
At present, most of tests on intelligent equipment and applications adopt a manual or semi-automatic test mode, a complete full-automatic test flow is not available, the labor cost is high, and automatic scheduling and test schemes are not available for simultaneously testing multiple types of equipment.
Disclosure of Invention
The disclosure provides a device testing method and apparatus, an electronic device, a computer readable medium, and a computer program product.
According to a first aspect of the present disclosure, there is provided a device testing method, including:
determining a test case of each device to be tested according to preset test configuration information;
calling a corresponding test case for each device to be tested;
and controlling each device to be tested to synchronously execute the corresponding test case.
According to a second aspect of the present disclosure, there is provided an apparatus testing device, including a first processing module and a testing module, where the first processing module is configured to determine a test case of each device to be tested according to preset test configuration information;
the test module is used for calling corresponding test cases for the devices to be tested and controlling the devices to be tested to synchronously execute the corresponding test cases.
According to a third aspect of the present disclosure, there is provided an electronic device comprising:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform any one of the method of device testing.
According to a fourth aspect of the present disclosure, there is provided a non-transitory computer readable storage medium having stored thereon computer instructions for causing the computer to perform the method of any one of the device testing methods.
According to a fifth aspect of the present disclosure, there is provided a computer program product comprising a computer program which, when executed by a processor, implements the method of any one of the above-described device testing methods.
According to the technology disclosed by the invention, the test case of each device to be tested is determined according to the preset test configuration information, the corresponding test case is called for each device to be tested, and each device to be tested is controlled to synchronously execute the corresponding test case; the configuration information is used as the distribution basis of the test cases, the automatic distribution of the test cases can be realized, the configuration information can be preset, the full automation of equipment test is realized, no manual participation exists in the whole process, and the labor cost is reduced; in addition, a plurality of devices to be tested are tested synchronously, and the testing efficiency of the devices is improved.
It should be understood that the statements in this section do not necessarily identify key or critical features of the embodiments of the present disclosure, nor do they limit the scope of the present disclosure. Other features of the present disclosure will become apparent from the following description.
Drawings
The drawings are included to provide a better understanding of the present solution and are not to be construed as limiting the present disclosure. Wherein:
FIG. 1 is a schematic flow chart diagram of a device testing method according to a first embodiment of the present disclosure;
fig. 2 is a schematic flowchart illustrating a process of controlling each device under test to synchronously execute a corresponding test case in a first test mode according to an embodiment of the present disclosure;
fig. 3 is a schematic flowchart illustrating a process of determining a test case of each device under test in a second test mode according to an embodiment of the present disclosure;
fig. 4 is a schematic flowchart illustrating controlling each device under test to synchronously execute a corresponding test case in the first test mode and the second test mode according to the embodiment of the present disclosure;
FIG. 5 is a schematic flow chart diagram for generating a test report according to an embodiment of the present disclosure;
FIG. 6 is a schematic flow chart diagram for sending test results and performance data according to an embodiment of the present disclosure;
FIG. 7 is a first schematic structural diagram of a device testing apparatus according to a second embodiment of the present disclosure;
FIG. 8 is a second schematic structural view of a device testing apparatus according to a second embodiment of the present disclosure;
FIG. 9 is a schematic structural diagram III of a device testing apparatus according to a second embodiment of the present disclosure;
FIG. 10 is a fourth schematic structural view of a device testing apparatus according to a second embodiment of the present disclosure;
FIG. 11 is a schematic structural diagram of a device testing apparatus according to a second embodiment of the present disclosure;
fig. 12 is a block diagram of an electronic device for implementing the device testing method according to the first embodiment of the present disclosure.
Detailed Description
Exemplary embodiments of the present disclosure are described below with reference to the accompanying drawings, in which various details of the embodiments of the disclosure are included to assist understanding, and which are to be considered as merely exemplary. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the present disclosure. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.
A first embodiment of the present disclosure provides an apparatus testing method, where the apparatus in the embodiment of the present disclosure may be an intelligent apparatus, such as a mobile phone, an intelligent sound box, an intelligent wearable apparatus, and the like, and in the embodiment of the present disclosure, voice wake-up and recognition of the intelligent apparatus are taken as an example for description, but a person skilled in the art may know that any function and performance test of the intelligent apparatus belongs to the protection scope of the present disclosure.
Before executing the device testing method of the first embodiment of the present disclosure, the following operations are performed: each device under test is connected to a device test apparatus, and the device test apparatus supports USB (Universal Serial Bus) connection and network connection. Test configuration information is input to the device testing apparatus, which may be stored in the form of a configuration file. After the test configuration information is input, the equipment testing device is started, and the equipment testing device can be used for automatically completing the test of each equipment to be tested.
Fig. 1 is a schematic flow chart of a device testing method according to a first embodiment of the present disclosure, as shown in fig. 1, the device testing method includes the following steps:
and 11, determining the test cases of the devices to be tested according to preset test configuration information.
In this step, the device testing apparatus may directly determine the test cases of the devices to be tested according to the test configuration information, or determine all the test cases for testing according to the test configuration information, and then allocate the test cases to the devices to be tested.
And step 12, calling corresponding test cases for each device to be tested.
The test case for testing the voice awakening and recognition of the intelligent device can be an audio file or a voice file for power amplification, and can be stored in the device testing device or other storage devices in advance. In this step, the device testing apparatus may obtain corresponding test cases for each device under test from the local or from other storage devices, and load the obtained test cases on the corresponding devices under test.
And step 13, controlling each device to be tested to synchronously execute corresponding test cases.
In this step, the device testing apparatus controls each device under test to synchronously execute the test case loaded locally on the device under test, that is, at the beginning of device testing, each device under test executes the loaded first test case, so as to realize synchronous testing of multiple devices under test and improve testing efficiency.
In the embodiment of the disclosure, the test case of each device to be tested is determined according to the preset test configuration information, the corresponding test case is called for each device to be tested, and each device to be tested is controlled to synchronously execute the corresponding test case; the configuration information is used as the distribution basis of the test cases, the automatic distribution of the test cases can be realized, the configuration information can be preset, the full automation of equipment test is realized, no manual participation exists in the whole process, and the labor cost is reduced; in addition, a plurality of devices to be tested are tested synchronously, and the testing efficiency of the devices is improved.
It should be noted that, the multiple devices to be tested respectively and simultaneously start to execute the test cases, the test cases currently executed by different devices to be tested may be the same or different, and each device to be tested may be a device of the same type and model or a device of different type and model (i.e., a completely different device). If the devices to be tested are the same type and model of devices and the test cases executed on the devices to be tested are also the same, in this case, the test result can reflect the difference between the devices of the same type and model. Each device to be tested can be the same type and model of device, and the test cases executed on each device to be tested can also be different, under the condition, each device to be tested can synchronously test different test functions, and the device test efficiency is improved. If each device to be tested is a device of different type and model and the testing cases executed on each device to be tested are different, under the condition, each device to be tested can be tested in a mode of reading the audio file, the device to be tested can not interfere with each other in the testing process, and the testing efficiency of the device can be improved to the maximum extent.
In some embodiments, the test configuration information may include test items and test cases of the test items of the device under test, or the test configuration information may include test items and test cases of the test items. That is to say, in the embodiment of the present disclosure, there are two device test modes, in the first device test mode, a specific test item and a test case thereof of each device to be tested are respectively specified in configuration information, that is, the test configuration information includes the test item and the test case of the test item of the device to be tested; in the second device testing method, the device to be tested is not specified in the configuration information, and only all test items and test cases (i.e., test items and test cases of all devices to be tested) for testing are specified, that is, the test configuration information includes test items and test cases of test items. The two device test modes are different in the concrete implementation modes of the step of controlling each device to be tested to execute the corresponding test case and the step of determining the test case of each device to be tested according to the test configuration information, and are respectively described in detail with reference to the attached drawings in the following.
At present, the traditional voice awakening and recognition test of the intelligent equipment mainly aims at the function test of voice awakening and recognition, and the test range is not comprehensive. To solve the above problem, in some embodiments of the present disclosure, the test items include at least a functional test, and may further include one or any combination of the following: performance testing, stability testing and effect testing. The embodiment of the disclosure provides a set of complete voice awakening and recognition test scheme, which comprises a function test, a performance test, a stability test and an effect test, and perfects a test range for voice awakening and recognition of intelligent equipment from multiple dimensions of performance, stability and effect.
Fig. 2 is a schematic flowchart illustrating a flow of controlling each device under test to synchronously execute a corresponding test case in a first test mode according to an embodiment of the present disclosure, where in some embodiments, the test configuration information includes a test item and a test case of the device under test, and also includes a priority of the test item and a priority of the test case, as shown in fig. 2, the step of controlling each device under test to synchronously execute a corresponding test case (i.e., step 13) includes the following steps:
and 131, determining the priority of the test item and the priority of the test case according to the test configuration information.
In this step, the device testing apparatus may directly read the configuration file, and determine the priority of the test item and the priority of the test case.
And 132, determining the test case execution sequence of each device to be tested according to the priority of the test item and the priority of the test case.
In this step, the device testing apparatus determines, for each device to be tested, a test case execution order of the device to be tested according to the priority of the test item and the priority of the test case, thereby obtaining each test case execution order corresponding to each device to be tested.
And step 133, controlling each device to be tested to synchronously execute the corresponding test case according to the test case execution sequence of each device to be tested.
In this step, the device testing apparatus controls each device under test to sequentially execute the corresponding test cases according to the test case execution sequence of each device under test, and controls each device under test to simultaneously start executing the first test case in the corresponding test case execution sequence, so as to implement synchronous testing of each device under test.
In order to clearly illustrate the technical solutions of the embodiments of the present disclosure, the first test mode is described in detail below by a specific example.
The configuration file includes the following information:
(1) the test items of the equipment A to be tested comprise a function test and a performance test, and the priority of the test items is from high to low: function- > performance; the test cases of the functional test items comprise a case1 and a case2, and the priority of the test cases is as follows: case2> case 1; the test cases of the performance test item comprise a case3 and a case4, and the priority of the test cases is as follows: case3> case 4.
(2) The test items of the device B to be tested comprise a performance test and a stability test, and the priority of the test items is from high to low: performance- > stability; the test cases of the performance test item comprise a case3 and a case4, and the priority of the test cases is as follows: case3> case 4; the test cases of the stability test item include case5, case6, and case7, and the priority of the test case is: case6> case5> case 7.
The device testing apparatus determines that the test cases of the device a to be tested are case1, case2, case3 and case4 according to the configuration file, and the test cases of the device B to be tested are case3, case4, case5, case6 and case7, and respectively calls corresponding test cases for the device A, B to be tested. The equipment testing device determines that the execution sequence of the test cases of the equipment A to be tested is as follows: case2- > case1- > case3- > case4, and the execution sequence of the test case of the device B to be tested is as follows: case3- > case4- > case6- > case5- > case7, the device testing apparatus controls the device to be tested a to sequentially execute corresponding test cases according to the sequence of case2- > case1- > case3- > case4, controls the device to be tested B to sequentially execute corresponding test cases according to the sequence of case3- > case4- > case6- > case5- > case7, and controls the device to be tested B to start executing the case3 while controlling the device to be tested a to start executing the case 2.
Fig. 3 is a schematic flowchart of a process of determining a test case of each device to be tested in a second test mode according to the embodiment of the present disclosure, where in some embodiments, the test configuration information includes a test item and a test case of the test item, and also includes a priority of the test item and a priority of the test case, as shown in fig. 3, the determining a test case of each device to be tested according to preset test configuration information (i.e., step 11) includes the following steps:
and step 111, determining the test items and the test cases, as well as the priority of the test items and the priority of the test cases according to the configuration information.
In this step, the device testing apparatus may directly read the configuration file, and determine the test items, the test cases, the priorities of the test items, and the priorities of the test cases.
And 112, sequencing the test cases according to the priority of the test items and the priority of the test cases to generate a test case sequence.
In this step, the device testing apparatus sorts all test cases used by each device under test according to the priority of the test items and the priority of the test cases, so as to obtain a test case sequence.
And 113, distributing the test cases for each idle device to be tested according to the sequence of the test cases in the test case sequence.
In this step, the device testing apparatus randomly allocates each test case in the test case sequence to each idle device to be tested according to the sequence of the test cases in the test case sequence. It should be noted that, if the number (n1) of the test cases in the test case sequence is greater than the number (n2) of the currently idle devices under test, the n2 number of test cases in the test case sequence are randomly allocated to each idle device under test according to the sequence, and the allocated test cases are deleted from the test case sequence, so as to update the test case sequence. And when the test case is executed again after the test of the device to be tested (namely, the idle device to be tested appears again), distributing the test cases for the current idle device to be tested according to the sequence of the test cases in the updated test case sequence until all the test cases in the test case sequence are distributed.
According to the method and the device for testing the equipment to be tested, all the test cases used for testing are integrally sequenced according to the priority of the test items and the priority of the test cases, the test cases are distributed to the equipment to be tested according to the sequencing, automatic scheduling of the equipment to be tested can be achieved, manual participation is not needed in the whole process, the priority of the test items and the priority of the test cases can be defined by a user according to requirements in advance, therefore, the test sequence of the test cases is adjusted, and testing is more flexible.
Fig. 4 is a schematic flow chart illustrating that each device to be tested is controlled to synchronously execute a corresponding test case in a first test mode and a second test mode according to the embodiment of the present disclosure, and in some embodiments, the test configuration information may further include a test duration of the test case, as shown in fig. 4, the controlling each device to be tested to synchronously execute the corresponding test case (i.e., step 13) includes the following steps:
and step 131', determining the test duration of each test case according to the test configuration information.
In this step, the device testing apparatus may directly read the configuration file, and determine the test duration of each test case.
And 132', controlling each device to be tested to simultaneously start executing the corresponding test case, and controlling each device to be tested to stop executing the corresponding test case according to the test duration.
In this step, for the first test mode, in the process of controlling each device to be tested to sequentially execute the corresponding test case according to the test case execution sequence of each device to be tested, the device test apparatus controls each device to be tested to simultaneously start executing the first test case, and controls the corresponding device to be tested to stop executing the test case according to the test duration of the first test case. It should be noted that, because the execution sequence of the test cases of each device under test is not necessarily the same, and the test duration of each test case is also not necessarily the same, the device testing apparatus can only control each device under test to start testing at the same time, and control the test time of each test case, but cannot guarantee that each device under test realizes synchronous testing for each test case.
For the second test mode, after the test cases are distributed for the first time, the device test apparatus controls each device to be tested to simultaneously start executing the first test case, and controls the corresponding device to be tested to stop executing the test case according to the test duration of each test case.
In order to solve the above problems, in the embodiment of the present disclosure, in the process of testing the device, the state of the device to be tested and/or the execution condition of the test case are monitored. Correspondingly, in some embodiments, after the controlling each device under test to synchronously execute the corresponding test case (i.e. step 13), the following steps may be further included: and in response to the detection of the abnormal state of at least one device to be tested, after the state of the device to be tested is recovered to be normal, controlling the device to be tested to execute the test case which is interrupted when the abnormal state occurs. And/or, in response to detecting that at least one device to be tested fails to execute the test case, controlling the device to be tested to execute the test case which fails to execute. By monitoring the abnormal state of the equipment to be tested and/or the execution condition of the test case in the test process of the equipment, when the abnormal state occurs, the test case is re-executed aiming at the test case of interrupted execution, the equipment test can be automatically recovered, the manual on-duty test is not needed, and the automation degree of the equipment test is further improved.
In some embodiments, the test configuration information may further include contact information, and after the step of controlling each device under test to synchronously execute the corresponding test case (i.e., step 13), the method may further include the following steps: and in response to the detection of the abnormal state of the at least one device to be tested and/or the failure of the at least one device to be tested to execute the test case, determining contact information according to the test configuration information, and giving an alarm according to the contact information. In some embodiments, the contact information may be a mailbox address, a contact way of social software, a short message, and the like. By monitoring the abnormal state of the equipment to be tested and/or the execution condition of the test case in the test process of the equipment, when the abnormal state occurs, related personnel can be reported in time through automatic alarm so as to find and process problems in time, manual on-duty test is not needed, and the automation degree of the equipment test is further improved.
Fig. 5 is a schematic flowchart of a process of generating a test report according to an embodiment of the present disclosure, in some embodiments, the test configuration information may further include a test duration of a test case, as shown in fig. 4, where the controlling each device to be tested to synchronously execute a corresponding test case (i.e., step 13) includes the following steps:
and 51, responding to the completion of the execution of all the test cases of all the devices to be tested, and acquiring the test result of each test case.
And step 52, generating a test report according to the test result.
In this step, the device testing apparatus may analyze the function, performance, stability, and effect according to the test result of each test case, respectively, to obtain corresponding analysis results, and generate a test report according to the test result and the analysis results.
And 53, determining contact information according to the test configuration information, and sending a test report according to the contact information.
The contact information is the contact information of the relevant person, and in this step, the device testing apparatus sends the generated test report to the specified relevant person.
In the embodiment of the disclosure, when all devices to be tested finish testing, the test report can be automatically generated and sent to relevant personnel, so that the time for manually sorting data and compiling the report can be reduced.
Fig. 6 is a schematic flowchart of sending a test result and performance data according to an embodiment of the present disclosure, and in some embodiments, the test configuration information may further include a presentation address. In order to facilitate the relevant personnel to check the test condition, as shown in fig. 6, the device testing method further includes the following steps:
and 61, responding to the completion of all the execution of all the test cases of all the test items by all the devices to be tested, and locally displaying the test results or determining the display addresses according to the test configuration information.
In this step, the device testing apparatus may locally display the test result, so that the relevant person may view the test result. Or the equipment testing device directly reads the configuration file to determine the display address, wherein the display address is the address of the display device.
And step 62, sending a test result according to the display address.
In this step, the device testing apparatus may send the test result to the display apparatus according to the display address, so that the display apparatus displays the data. The display device is a rear-end platform and can store and display the test result to related personnel, so that the related personnel can remotely check the test result.
In some embodiments, after the controlling each device under test to synchronously execute the corresponding test case (i.e. step 13), the method may further include the following steps: and acquiring performance data of each device to be tested in the process of executing the corresponding test case, and locally displaying the performance data or sending the performance data according to the display address. In some embodiments, performance data may include CPU (Central Processing Unit) utilization, CPU temperature, memory, file handles, thread handles, traffic, response speed, and the like. It should be noted that the performance data is displayed in real time, that is, the device testing apparatus may obtain, according to a preset period, performance data of each device to be tested in a process of executing a corresponding test case during a test of each device to be tested, and correspondingly locally display the obtained performance data, or send the obtained performance data to the display apparatus for remote display.
The device testing method of the embodiment can automatically complete the testing of the functions, stability, performance and effect of voice awakening and recognition of the intelligent device, and improves the testing range of the voice awakening and recognition technology of the intelligent device; and manual configuration of test cases and test duration thereof is supported, and flexible scheduling of a plurality of devices to be tested is automatically realized. The test is triggered by one key, the test voice corresponding to the test case can be automatically played by the equipment to be tested, the operation is convenient, and the test efficiency is improved. In view of the quality issues that may arise from device variability, embodiments of the present disclosure support simultaneous testing of multiple devices. Through the test abnormity monitoring, reporting and abnormity automatic recovery mechanism, the equipment state abnormity and/or test case execution abnormity can be found in time, the test is automatically recovered, and related personnel are reported in time. Uploading the test result and the performance data of each device to be tested to a display device for related personnel to remotely check; after the test is finished, the test report is automatically generated and sent to related personnel, so that the time for manually arranging data and compiling the report can be reduced.
According to an embodiment of the present disclosure, an apparatus testing device is further provided in the present disclosure, fig. 7 is a schematic structural diagram of an apparatus testing device provided in a second embodiment of the present disclosure, as shown in fig. 7, the apparatus testing device includes a first processing module 101 and a testing module 102, where the first processing module 101 is configured to determine a test case of each device to be tested according to preset test configuration information.
The test module 102 is configured to invoke a corresponding test case for each device under test, and control each device under test to synchronously execute the corresponding test case.
In some embodiments, the test configuration information includes test items and test cases of the test items of the device to be tested, or the test configuration information includes test items and test cases of the test items; the test items at least comprise functional tests, and further comprise one or any combination of the following: performance testing, stability testing and effect testing.
In some embodiments, the test configuration information includes test items and test cases of the test items of the device under test, and further includes priorities of the test items and priorities of the test cases. The first processing module 101 is further configured to determine the priority of the test item and the priority of the test case according to the test configuration information.
The test module 102 is configured to determine a test case execution sequence of each device to be tested according to the priority of the test item and the priority of the test case; and controlling the equipment to be tested to synchronously execute the corresponding test cases according to the test case execution sequence of the equipment to be tested.
In some embodiments, the test configuration information includes test items and test cases of the test items, and further includes priorities of the test items and priorities of the test cases. The first processing module 101 is further configured to determine a test item and a test case, and a priority of the test item and a priority of the test case according to the configuration information; sequencing the test cases according to the priority of the test items and the priority of the test cases to generate a test case sequence; and distributing the test cases for each idle device to be tested according to the sequence of the test cases in the test case sequence.
In some embodiments, the test configuration information includes a test duration of the test case, and the test module 102 is configured to determine the test duration of each test case according to the test configuration information; and controlling each device to be tested to simultaneously start executing the corresponding test case, and controlling each device to be tested to stop executing the corresponding test case according to the test duration.
Fig. 8 is a schematic structural diagram of a device testing apparatus according to a second embodiment of the present disclosure, in some embodiments, as shown in fig. 8, the device testing apparatus further includes a recovery module 103, where the recovery module 103 is configured to, in response to detecting that at least one of the devices to be tested is abnormal, after the state of the device to be tested is recovered to be normal, control the device to be tested to execute a test case that is interrupted when the device to be tested is abnormal; and/or, in response to detecting that at least one device to be tested fails to execute the test case, controlling the device to be tested to execute the test case which fails to execute.
Fig. 9 is a third schematic structural diagram of an apparatus testing device according to a second embodiment of the present disclosure, in some embodiments, as shown in fig. 9, the apparatus testing device further includes an alarm module 104, where the alarm module 104 is configured to determine contact information according to the test configuration information and alarm according to the contact information in response to detecting that at least one of the devices to be tested is abnormal in state and/or at least one of the devices to be tested fails to execute a test case.
Fig. 10 is a schematic structural diagram of a device testing apparatus according to a second embodiment of the present disclosure, in some embodiments, the test configuration information includes contact information, as shown in fig. 10, the device testing apparatus further includes a generating module 105, and the generating module 105 is configured to, in response to that all of the test cases of the devices to be tested are completely executed, obtain a test result of each test case; generating a test report according to the test result; and determining contact information according to the test configuration information, and sending the test report according to the contact information.
Fig. 11 is a schematic structural diagram of a device testing apparatus according to a second embodiment of the present disclosure, in some embodiments, the test configuration information further includes a display address, as shown in fig. 11, the device testing apparatus further includes a second processing module 106, and the second processing module 106 is configured to, in response to that all execution of all test cases of each test item by each device to be tested is completed, locally display the test result, or determine the display address according to the test configuration information, and send the test result according to the display address; and acquiring performance data of each device to be tested in the process of executing the corresponding test case, and locally displaying the performance data or sending the performance data according to the display address.
The present disclosure also provides an electronic device, a readable storage medium, and a computer program product according to embodiments of the present disclosure.
FIG. 12 shows a schematic block diagram of an example electronic device 1200, which can be used to implement embodiments of the present disclosure. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be examples only, and are not meant to limit implementations of the disclosure described and/or claimed herein.
As shown in fig. 12, the apparatus 1200 includes a computing unit 1201 which can perform various appropriate actions and processes in accordance with a computer program stored in a Read Only Memory (ROM)1202 or a computer program loaded from a storage unit 1208 into a Random Access Memory (RAM) 1203. In the RAM 1203, various programs and data required for the operation of the device 1200 may also be stored. The computing unit 1201, the ROM 1202, and the RAM 1203 are connected to each other by a bus 1204. An input/output (I/O) interface 1205 is also connected to bus 1204.
Various components in the device 1200 are connected to the I/O interface 1205 including: an input unit 1206 such as a keyboard, a mouse, or the like; an output unit 1207 such as various types of displays, speakers, and the like; a storage unit 1208, such as a magnetic disk, optical disk, or the like; and a communication unit 1209 such as a network card, modem, wireless communication transceiver, etc. The communication unit 1209 allows the device 1200 to exchange information/data with other devices via a computer network such as the internet and/or various telecommunication networks.
The computing unit 1201 may be a variety of general purpose and/or special purpose processing components having processing and computing capabilities. Some examples of the computing unit 1201 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various computing units running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, and so forth. The calculation unit 1201 executes the respective methods and processes described above, such as the device test method. For example, in some embodiments, the device testing method may be implemented as a computer software program tangibly embodied in a machine-readable medium, such as storage unit 1208. In some embodiments, part or all of the computer program may be loaded and/or installed onto the device 1200 via the ROM 1202 and/or the communication unit 1209. When the computer program is loaded into RAM 1203 and executed by computing unit 1201, one or more steps of the device testing method described above may be performed. Alternatively, in other embodiments, the computing unit 1201 may be configured to perform the device testing method in any other suitable manner (e.g., by means of firmware).
Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuitry, Field Programmable Gate Arrays (FPGAs), Application Specific Integrated Circuits (ASICs), Application Specific Standard Products (ASSPs), system on a chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs that are executable and/or interpretable on a programmable system including at least one programmable processor, which may be special or general purpose, receiving data and instructions from, and transmitting data and instructions to, a storage system, at least one input device, and at least one output device.
Program code for implementing the methods of the present disclosure may be written in any combination of one or more programming languages. These program codes may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the program codes, when executed by the processor or controller, cause the functions/operations specified in the flowchart and/or block diagram to be performed. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which a user can provide input to the computer. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic, speech, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a back-end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back-end, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), Wide Area Networks (WANs), and the Internet.
The computer system may include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other.
According to an embodiment of the present disclosure, there is also provided a computer program product comprising a computer program which, when executed by a processor, implements any one of the above-described device testing methods.
It should be understood that various forms of the flows shown above may be used, with steps reordered, added, or deleted. For example, the steps described in the present disclosure may be executed in parallel, sequentially, or in different orders, as long as the desired results of the technical solutions disclosed in the present disclosure can be achieved, and the present disclosure is not limited herein.
The above detailed description should not be construed as limiting the scope of the disclosure. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions may be made in accordance with design requirements and other factors. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present disclosure should be included in the scope of protection of the present disclosure.

Claims (13)

1. A device testing method, comprising:
determining a test case of each device to be tested according to preset test configuration information;
calling a corresponding test case for each device to be tested;
and controlling each device to be tested to synchronously execute the corresponding test case.
2. The method of claim 1, wherein the test configuration information includes test items and test cases of the test items of the device under test, or the test configuration information includes test items and test cases of the test items;
the test items at least comprise functional tests, and further comprise one or any combination of the following: performance testing, stability testing and effect testing.
3. The method according to claim 2, wherein the test configuration information includes test items and test cases of the test items of the devices to be tested, and further includes priorities of the test items and priorities of the test cases, and the controlling the devices to be tested to synchronously execute the corresponding test cases includes:
determining the priority of the test item and the priority of the test case according to the test configuration information;
determining the execution sequence of the test cases of the equipment to be tested according to the priority of the test items and the priority of the test cases;
and controlling the equipment to be tested to synchronously execute the corresponding test cases according to the test case execution sequence of the equipment to be tested.
4. The method according to claim 2, wherein the test configuration information includes test items and test cases of the test items, and further includes priorities of the test items and priorities of the test cases, and determining the test cases of the devices to be tested according to the preset test configuration information includes:
determining a test item and a test case, as well as the priority of the test item and the priority of the test case according to the configuration information;
sequencing the test cases according to the priority of the test items and the priority of the test cases to generate a test case sequence;
and distributing the test cases for each idle device to be tested according to the sequence of the test cases in the test case sequence.
5. The method according to claim 1, wherein the test configuration information includes a test duration of a test case, and the controlling the devices under test to synchronously execute the corresponding test case includes:
determining the test duration of each test case according to the test configuration information;
and controlling each device to be tested to simultaneously start executing the corresponding test case, and controlling each device to be tested to stop executing the corresponding test case according to the test duration.
6. The method according to claim 1, wherein after the controlling the devices under test to synchronously execute the corresponding test cases, the method further comprises:
in response to the detection that the state of at least one piece of equipment to be tested is abnormal, after the state of the equipment to be tested is recovered to be normal, the equipment to be tested is controlled to execute a test case which is interrupted when the equipment to be tested is abnormal; and/or the presence of a gas in the gas,
and controlling the equipment to be tested to execute the test case with the execution failure in response to the detection of the failure of executing the test case by at least one piece of equipment to be tested.
7. The method according to claim 6, wherein the test configuration information includes contact information, and after the controlling the devices under test to synchronously execute the corresponding test cases, the method further includes:
and in response to the detection of the abnormal state of at least one device to be tested and/or the failure of the execution of the test case of at least one device to be tested, determining contact information according to the test configuration information, and giving an alarm according to the contact information.
8. The method according to claim 1, wherein the test configuration information includes contact information, and after the controlling the devices under test to synchronously execute the corresponding test cases, the method further includes:
responding to the completion of the execution of all the test cases of all the devices to be tested, and acquiring the test result of each test case;
generating a test report according to the test result;
and determining contact information according to the test configuration information, and sending the test report according to the contact information.
9. The method of claim 8, wherein the test configuration information further comprises a presentation address, the method further comprising:
responding to the completion of the execution of all the test cases of all the test items by all the devices to be tested, locally displaying the test results, or determining a display address according to the test configuration information and sending the test results according to the display address;
after the controlling the devices to be tested to synchronously execute the corresponding test cases, the method further comprises: and acquiring performance data of each device to be tested in the process of executing the corresponding test case, and locally displaying the performance data or sending the performance data according to the display address.
10. The device testing device comprises a first processing module and a testing module, wherein the first processing module is used for determining a test case of each device to be tested according to preset testing configuration information;
the test module is used for calling corresponding test cases for the devices to be tested and controlling the devices to be tested to synchronously execute the corresponding test cases.
11. An electronic device, comprising:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-9.
12. A non-transitory computer readable storage medium having stored thereon computer instructions for causing the computer to perform the method of any one of claims 1-9.
13. A computer program product comprising a computer program which, when executed by a processor, implements the method according to any one of claims 1-9.
CN202011526853.0A 2020-12-22 2020-12-22 Equipment testing method and device, electronic equipment, readable medium and product Pending CN112631843A (en)

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