CN112605069B - Automatic cleaning device for cleaning ion source pole piece of mass spectrometer - Google Patents
Automatic cleaning device for cleaning ion source pole piece of mass spectrometer Download PDFInfo
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- CN112605069B CN112605069B CN202011479929.9A CN202011479929A CN112605069B CN 112605069 B CN112605069 B CN 112605069B CN 202011479929 A CN202011479929 A CN 202011479929A CN 112605069 B CN112605069 B CN 112605069B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
- B08B7/0042—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like by laser
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0064—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by temperature changes
- B08B7/0071—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by temperature changes by heating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
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Abstract
The invention discloses an automatic cleaning device for cleaning an ion source pole piece of a mass spectrometer, which comprises an ion source unit, an infrared laser unit and an instrument shell, wherein the infrared laser unit comprises a laser emission component and a focusing lens, when in use, the position of the infrared laser unit is adjusted to be positioned at the bottom of the ion source pole piece, the laser emission component is started, the positions of the focusing lens and the laser emission component are adjusted to facilitate the focusing of laser facula, the infrared laser unit is moved to temporarily heat the area around an ion beam hole in the ion source pole piece to 80-250 ℃, and the time of about 10min is kept, so that an electric insulator coating deposited in the area around the ion beam hole in the ion source pole piece is sublimated and evaporated in vacuum high temperature, thereby realizing the automatic cleaning of the ion source pole piece without manually disassembling the instrument, the distance between the focusing lens and the laser emission component can be adjusted, and the service efficiency of the automatic cleaning device is improved.
Description
Technical Field
The invention relates to the technical field of a biomass spectrometer and peripheral supporting facilities thereof, in particular to an automatic cleaning device for cleaning an ion source pole piece of a mass spectrometer.
Background
Matrix-assisted laser desorption time-of-flight mass spectrometry (MALDI-TOFMS) is a widely used type of mass biological spectrometer. The method is characterized in that a sample to be analyzed and a matrix are mixed to form a cocrystal, when laser irradiates the cocrystal, the matrix absorbs energy of the laser, and then the energy is transferred to the sample, so that the sample generates desorption and ionization processes. Particles produced by ionization of the sample are accelerated under the influence of the electric field and eventually reach the time-of-flight mass spectrometer detector. The different species will arrive at the mass spectrometer detector at different times, so that the molecular weight of the ions can be accurately calculated from the arrival times of the different ions.
In the practical working process of MALDI, matrix-assisted laser desorption (MALDI) is more used for ionization of biomacromolecules,
the number of the biological macromolecule samples to be detected is very large, and each time the sample is bombarded, besides the analyte, the biological macromolecule samples also contain a large amount of matrix substances, and plasma cloud can be generated under the action of laser pulse. In some cases, the plasma cloud also contains solid or liquid spray particles from the explosive matrix material. As the plasma cloud expands further, some of the vaporized or sprayed material is deposited on the accelerating tabs. After tens of thousands of bombardments, a visible coating is formed around the hole through which the ion beam passes on these accelerating plates. These coatings are electrical insulators. They can become charged and interfere with the acceleration and focusing processes of the ions. Affecting the performance of the instrument and therefore necessitating removal of the coating.
To remove these coatings, it is common practice to open the ion source cover after the instrument is vented and manually clean the ion source pole piece. In general, a solvent such as ethanol or acetone is usually used for the ion source cleaning pole piece. The first acceleration pole piece can be cleaned without disassembling the ion source in the actual cleaning process. However, after the plasma source electrode plate is cleaned, it takes several hours for the apparatus to return to the experimental vacuum condition, and the risk of air leakage of the apparatus due to vacuum breaking is brought. And after the vacuum of the instrument is recovered to be normal, the relevant parameters and calibration functions of the instrument experiment are required to be readjusted, so that the normal experiment operation can be carried out, and the normal use of the instrument is influenced.
Therefore, how to change the current situation that cleaning of the ion source pole piece requires manual disassembly of the instrument to affect the use of the instrument in the prior art becomes a problem to be solved urgently by those skilled in the art.
Disclosure of Invention
The invention aims to provide an automatic cleaning device for cleaning an ion source pole piece of a mass spectrometer, which is used for solving the problems in the prior art and cleaning the ion source pole piece by the cleaning device without manually disassembling an instrument.
In order to achieve the purpose, the invention provides the following scheme: the invention provides an automatic cleaning device for cleaning an ion source pole piece of a mass spectrometer, which comprises:
the ion source unit comprises an ion source cavity, and an ion source pole piece can be accommodated and fixed in the ion source cavity;
the infrared laser unit comprises a laser emission assembly and a focusing lens, the laser emission assembly can emit laser towards the direction of the ion source pole piece, the focusing lens is arranged right opposite to the laser emission assembly, the distance between the laser emission assembly and the focusing lens can be adjusted, the focusing lens is positioned between the laser emission assembly and the ion source pole piece, and laser spots emitted by the laser emission assembly can be focused by the focusing lens;
the infrared laser unit can be arranged in the instrument shell in a sliding mode, the relative sliding direction of the infrared laser unit and the instrument shell is perpendicular to the relative displacement direction of the focusing lens and the laser emission assembly, and the ion source cavity is detachably connected with the instrument shell.
Preferably, the instrument casing includes instrument chamber lid, instrument cavity and connection terminal, instrument chamber lid set up in the top of instrument cavity, instrument chamber lid with the connection can be dismantled to the instrument cavity, infrared laser unit set up in instrument chamber lid with in the space that the instrument cavity encloses, the connection terminal runs through the lateral wall of instrument cavity, infrared laser unit can utilize the connection terminal links to each other with external power source.
Preferably, the ion source cavity is detachably connected with the instrument cavity cover, the ion source cavity is located at the top of the instrument cavity cover, the instrument cavity cover is provided with a first through hole, and the ion source pole piece is opposite to the first through hole.
Preferably, the infrared laser unit further comprises an X-axis moving platform and a Y-axis moving platform, the Y-axis moving platform is slidably disposed in the instrument cavity, the X-axis moving platform is slidably disposed on the Y-axis moving platform, the relative sliding direction of the instrument cavity is perpendicular to the relative sliding direction of the X-axis moving platform and the Y-axis moving platform, and the laser emitting assembly is connected to the X-axis moving platform.
Preferably, slide rails are arranged between the Y-axis moving platform and the instrument cavity and between the X-axis moving platform and the Y-axis moving platform.
Preferably, the X-axis moving platform and the Y-axis moving platform are both connected with a driving element.
Preferably, the laser emission assembly is detachably connected with the X-axis moving platform.
Preferably, the laser emission assembly comprises a laser anode and a laser cathode, the laser anode is positioned at the top of the laser cathode, and the laser anode and the laser cathode are both connected with an external power supply.
Preferably, the infrared laser unit further comprises a focusing lens mounting block, the focusing lens mounting block is detachably connected with the X-axis moving platform, the focusing lens mounting block is provided with a second through hole, the focusing lens is right opposite to the second through hole, and the focusing lens can be slidably connected with the focusing lens mounting block.
Compared with the prior art, the invention has the following technical effects: the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer comprises an ion source unit, an infrared laser unit and an instrument shell, wherein the ion source unit comprises an ion source cavity, and the ion source pole piece can be accommodated and fixed in the ion source cavity; the infrared laser unit comprises a laser emission assembly and a focusing lens, the laser emission assembly can emit laser towards the direction of the ion source pole piece, the focusing lens is arranged over against the laser emission assembly, the distance between the laser emission assembly and the focusing lens can be adjusted, the focusing lens is positioned between the laser emission assembly and the ion source pole piece, and laser spots emitted by the laser emission assembly can be focused by the focusing lens; the infrared laser unit is slidably arranged in the instrument shell, the relative sliding direction of the infrared laser unit and the instrument shell is perpendicular to the relative displacement direction of the focusing lens and the laser emission assembly, and the ion source cavity is detachably connected with the instrument shell. When the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer is used, the position of the infrared laser unit is adjusted to be positioned at the bottom of the ion source pole piece, the laser emission assembly is started, the positions of the focusing lens and the laser emission assembly are adjusted to facilitate the focusing of laser spots, the infrared laser unit is moved to temporarily heat the area around the ion beam hole in the ion source pole piece to 80-250 ℃, and maintaining for about 10min to make the electric insulator coating deposited in the area around the ion beam hole in the ion source pole piece sublimate and evaporate in vacuum high temperature, thereby realizing automatic cleaning of the ion source pole piece without manual disassembly of the instrument, simultaneously, the distance between the focusing lens and the laser emission component can be adjusted, can improve self-cleaning device's availability factor according to the distance intelligence focus of wasing the pole piece.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is an exploded view of the automatic cleaning device for cleaning ion source pole pieces of mass spectrometers of the present invention;
FIG. 2 is an exploded view from another perspective of the automatic cleaning device for cleaning ion source pole pieces of a mass spectrometer of the present invention;
FIG. 3 is a schematic structural diagram of an infrared laser unit of the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer;
FIG. 4 is an exploded view of the structure of FIG. 3 at A;
FIG. 5 is a schematic diagram of the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer of the invention in operation;
FIG. 6 is a schematic diagram of a matrix cleaning mode of the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer;
FIG. 7 is a schematic diagram of a ring cleaning mode of the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer;
FIG. 8 is a schematic diagram of an automatic random sample application cleaning mode of the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer;
FIG. 9 is a schematic diagram of a manual random sample cleaning mode of the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer;
the laser device comprises an ion source unit 1, an ion source cavity 101, an ion source pole piece 102, an infrared laser unit 2, a laser emission assembly 201, a focusing lens 202, an X-axis moving platform 203, a Y-axis moving platform 204, a sliding rail 205, a driving element 206, a laser anode 207, a laser cathode 208, a focusing lens mounting block 209, a second through hole 210, a laser beam 211, an instrument shell 3, an instrument cavity cover 301, an instrument cavity 302, a wire holder 303 and a first through hole 304.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention aims to provide an automatic cleaning device for cleaning an ion source pole piece of a mass spectrometer, which is used for solving the problems in the prior art and cleaning the ion source pole piece by the cleaning device without manually disassembling an instrument.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
Referring to fig. 1-9, wherein fig. 1 is an exploded view of an automatic cleaning device for cleaning a mass spectrometer ion source pole piece according to the present invention, fig. 2 is an exploded view of an automatic cleaning device for cleaning a mass spectrometer ion source pole piece according to the present invention from another angle, fig. 3 is a schematic diagram of a structure of an infrared laser unit of the automatic cleaning device for cleaning a mass spectrometer ion source pole piece according to the present invention, fig. 4 is an exploded view of a structure at a position a in fig. 3, fig. 5 is a schematic diagram of an operation of the automatic cleaning device for cleaning a mass spectrometer ion source pole piece according to the present invention, fig. 6 is a schematic diagram of a matrix type cleaning mode of the automatic cleaning device for cleaning a mass spectrometer ion source pole piece according to the present invention, fig. 7 is a schematic diagram of a ring type cleaning mode of the automatic cleaning device for cleaning a mass spectrometer ion source pole piece according to the present invention, fig. 8 is a schematic diagram of an automatic random proofing cleaning mode of the automatic cleaning device for cleaning a mass spectrometer ion source pole piece according to the present invention, fig. 9 is a schematic diagram of a manual random sample cleaning mode of the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer.
The invention provides an automatic cleaning device for cleaning an ion source pole piece of a mass spectrometer, which comprises:
the ion source unit 1 comprises an ion source cavity 101, wherein an ion source pole piece 102 can be accommodated and fixed in the ion source cavity 101;
the ion source comprises an infrared laser unit 2, wherein the infrared laser unit 2 comprises a laser emission assembly 201 and a focusing lens 202, the laser emission assembly 201 can emit a laser beam 211 towards the ion source pole piece 102, the focusing lens 202 is arranged right opposite to the laser emission assembly 201, the distance between the laser emission assembly 201 and the focusing lens 202 can be adjusted, the focusing lens 202 is positioned between the laser emission assembly 201 and the ion source pole piece 102, and the focusing lens 202 can focus laser spots emitted by the laser emission assembly 201;
the ion source cavity 101 is detachably connected with the instrument shell 3, and the relative sliding direction of the infrared laser unit 2 and the instrument shell 3 is perpendicular to the relative displacement direction of the focusing lens 202 and the laser emission component 201.
When the automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer is used, the position of the infrared laser unit 2 is adjusted to be positioned at the bottom of the ion source pole piece 102, the laser emission assembly 201 is started, the positions of the focusing lens 202 and the laser emission assembly 201 are adjusted to facilitate laser spot focusing, the infrared laser unit 2 is moved to temporarily heat the area around the ion beam hole in the ion source pole piece 102 to 80-250 ℃, and the time of about 10min is kept, so that the electric insulator coating deposited on the area around the ion beam hole in the ion source pole piece 102 is sublimated and evaporated in vacuum high temperature, the ion source pole piece 102 is automatically cleaned without manually disassembling an instrument, meanwhile, the distance between the focusing lens 202 and the laser emission assembly 201 can be adjusted, and intelligent focusing can be realized according to the distance for cleaning the ion source pole piece 102, the purpose that coatings of areas, needing to be cleaned, of the ion source pole piece 102 can be removed is achieved, and the service efficiency of the automatic cleaning device is improved.
Wherein, instrument housing 3 includes instrument chamber lid 301, instrument chamber 302 and connection terminal 303, instrument chamber lid 301 sets up in the top of instrument chamber 302, instrument chamber lid 301 can dismantle with instrument chamber 302 and be connected, make things convenient for dismouting and inside spare part to maintain, infrared laser unit 2 sets up in the space that instrument chamber lid 301 and instrument chamber 302 enclose, instrument housing 3 provides the installation basis for infrared laser unit 2, can also play dustproof pleasing to the eye effect, connection terminal 303 runs through the lateral wall of instrument chamber 302, infrared laser unit 2 can utilize connection terminal 303 to link to each other with external power source, improve instrument housing 3's structural integrity, connection terminal 303 can protect the cable safety.
Specifically, ion source cavity 101 and instrument chamber lid 301 can be dismantled and be connected, make things convenient for the dismouting in order to wash different mass spectrometers, and ion source cavity 101 is located the top of instrument chamber lid 301, and instrument chamber lid 301 has first clearing hole 304, and ion source pole piece 102 is just setting up first clearing hole 304, and instrument chamber lid 301 sets up first clearing hole 304, avoids instrument chamber lid 301 to influence laser and washs ion source pole piece 102.
In this embodiment, the infrared laser unit 2 further includes an X-axis moving platform 203 and a Y-axis moving platform 204, the Y-axis moving platform 204 is slidably disposed in the instrument cavity 302, the X-axis moving platform 203 is slidably disposed on the Y-axis moving platform 204, a relative sliding direction of the Y-axis moving platform 204 and the instrument cavity 302 is perpendicular to a relative sliding direction of the X-axis moving platform 203 and the Y-axis moving platform 204, the laser emitting assembly 201 is connected to the X-axis moving platform 203, the laser emitting assembly 201 can drive the laser emitting assembly 201 and the focusing lens 202 to move in a plane parallel to the instrument cavity cover 301 by using the X-axis moving platform 203 and the Y-axis moving platform 204, and the focusing lens 202 can reciprocate (in this embodiment, move up and down) in a direction perpendicular to the plane of the instrument cavity cover 301, so that the laser spot can move right under the ion source 102, laser spots are focused, and finally the purpose that coatings of the area, which needs to be cleaned, of the ion source pole piece 102 can be removed is achieved.
In order to make the reciprocating sliding of the X-axis moving platform 203 and the Y-axis moving platform 204 smoother, sliding rails 205 are respectively arranged between the Y-axis moving platform 204 and the instrument cavity 302 and between the X-axis moving platform 203 and the Y-axis moving platform 204, so as to improve the moving convenience and the moving accuracy of the laser emitting assembly 201 and the focusing lens 202.
In this embodiment, the X-axis moving platform 203 and the Y-axis moving platform 204 are both connected to a driving element 206, and the driving element 206 can select a motor, so that the convenience of operation is improved, and the workload of an operator is reduced.
More specifically, laser emission subassembly 201 can be dismantled with X axle moving platform 203 and be connected, and the dismouting is convenient, makes things convenient for operating personnel to maintain the adjustment to laser emission subassembly 201.
In addition, the laser emission assembly 201 comprises a laser anode 207 and a laser cathode 208, the laser anode 207 is positioned at the top of the laser cathode 208, and the laser anode 207 and the laser cathode 208 are both connected with an external power supply to realize the emission of the laser beam 211.
Further, the infrared laser unit 2 further includes a focusing lens mounting block 209, the focusing lens mounting block 209 is detachably connected to the X-axis moving platform 203, the focusing lens mounting block 209 has a second through hole 210, the focusing lens 202 is disposed right opposite to the second through hole 210, the focusing lens 202 is slidably connected to the focusing lens mounting block 209, the focusing lens mounting block 209 provides a stable mounting base for the focusing lens 202, the working reliability of the infrared laser unit 2 is improved, and the focusing lens mounting block 209 can also play a role in protecting the laser emitting assembly 201.
When the instrument sample is bombarded tens of thousands of times, a visible coating is formed on the ion source pole piece 102 around the hole through which the ion beam passes. The automatic cleaning device for cleaning the ion source pole piece 102 of the mass spectrometer has the advantages that when in use, the automatic cleaning function is started through software, the X-axis moving platform 203 and the Y-axis moving platform 204 immediately move the laser emission assembly 201 to the position under the ion source pole piece 102 after receiving the instruction, the laser emission assembly 201 is started, the X-axis moving platform 203 and the Y-axis moving platform 204 move the laser emission assembly 201 according to the selected path (4 modes in total: automatic matrix type, automatic annular type, automatic random sampling and manual random), so as to temporarily heat the area around the ion beam hole in the ion source pole piece 102 to 80-250 ℃ for about 10min, so that the electrical insulator coating deposited in the area around the ion beam aperture in the ion source pole piece 102 sublimates and evaporates in a vacuum at high temperature, thereby cleaning the ion source pole piece 102.
The principle and the implementation mode of the invention are explained by applying a specific example, and the description of the embodiment is only used for helping to understand the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (9)
1. An automatic cleaning device for cleaning a mass spectrometer ion source pole piece, comprising:
the ion source unit comprises an ion source cavity, and an ion source pole piece can be accommodated and fixed in the ion source cavity;
the infrared laser unit comprises a laser emission assembly and a focusing lens, the laser emission assembly can emit laser towards the direction of the ion source pole piece, the focusing lens is arranged right opposite to the laser emission assembly, the distance between the laser emission assembly and the focusing lens can be adjusted, the focusing lens is positioned between the laser emission assembly and the ion source pole piece, and laser spots emitted by the laser emission assembly can be focused by the focusing lens;
the infrared laser unit can be arranged in the instrument shell in a sliding mode, the relative sliding direction of the infrared laser unit and the instrument shell is perpendicular to the relative displacement direction of the focusing lens and the laser emission assembly, and the ion source cavity is detachably connected with the instrument shell.
2. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer of claim 1, wherein: the instrument casing includes instrument chamber lid, instrument cavity and connection terminal, instrument chamber lid set up in the top of instrument cavity, instrument chamber lid with the connection can be dismantled to the instrument cavity, infrared laser unit set up in instrument chamber lid with in the space that the instrument cavity encloses, the connection terminal runs through the lateral wall of instrument cavity, infrared laser unit can utilize the connection terminal links to each other with external power source.
3. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer of claim 2, wherein: the ion source cavity is detachably connected with the instrument cavity cover, the ion source cavity is located at the top of the instrument cavity cover, the instrument cavity cover is provided with a first through hole, and the ion source pole piece is arranged right opposite to the first through hole.
4. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer of claim 2, wherein: the infrared laser unit further comprises an X-axis moving platform and a Y-axis moving platform, the Y-axis moving platform can be slidably arranged in the instrument cavity, the X-axis moving platform can be slidably arranged on the Y-axis moving platform, the relative sliding direction of the instrument cavity is perpendicular to the relative sliding direction of the X-axis moving platform and the Y-axis moving platform, and the laser emitting assembly is connected with the X-axis moving platform.
5. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer according to claim 4, characterized in that: slide rails are arranged between the Y-axis moving platform and the instrument cavity and between the X-axis moving platform and the Y-axis moving platform.
6. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer of claim 5, wherein: the X-axis moving platform and the Y-axis moving platform are both connected with driving elements.
7. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer according to claim 4, characterized in that: the laser emission assembly is detachably connected with the X-axis moving platform.
8. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer of claim 1, wherein: the laser emission assembly comprises a laser anode and a laser cathode, the laser anode is positioned at the top of the laser cathode, and the laser anode and the laser cathode are connected with an external power supply.
9. The automatic cleaning device for cleaning the ion source pole piece of the mass spectrometer of claim 6, wherein: the infrared laser unit further comprises a focusing lens mounting block, the focusing lens mounting block is detachably connected with the X-axis moving platform, the focusing lens mounting block is provided with a second through hole, the focusing lens is right opposite to the second through hole, and the focusing lens can be slidably connected with the focusing lens mounting block.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| DE102008008634B4 (en) * | 2008-02-12 | 2011-07-07 | Bruker Daltonik GmbH, 28359 | Automatic cleaning of MALDI ion sources |
| GB2486628B (en) * | 2010-08-02 | 2016-05-25 | Kratos Analytical Ltd | Methods and apparatuses for cleaning at least one surface of an ion source |
| GB2530768B (en) * | 2014-10-01 | 2019-07-17 | Kratos Analytical Ltd | Method and apparatuses relating to cleaning an ion source |
| DE102016124889B4 (en) * | 2016-12-20 | 2019-06-06 | Bruker Daltonik Gmbh | Mass spectrometer with laser system for generating photons of different energy |
| US11443932B2 (en) * | 2017-12-22 | 2022-09-13 | Micromass Uk Limited | Device for rapid exchange of ion sources and ion transmission devices |
| GB201809901D0 (en) * | 2018-06-15 | 2018-08-01 | Ascend Diagnostics Ltd | Improvements in and relating to mass spectrometers |
| CN110940723A (en) * | 2018-09-25 | 2020-03-31 | 广州禾信康源医疗科技有限公司 | Mass spectrum detection device and optical system thereof |
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