CN112540883A

CN112540883A - Test system and test method

Info

Publication number: CN112540883A
Application number: CN201910901382.8A
Authority: CN
Inventors: 杨宇庭
Original assignee: Hosin Global Electronics Co Ltd
Current assignee: Hosin Global Electronics Co Ltd
Priority date: 2019-09-23
Filing date: 2019-09-23
Publication date: 2021-03-23

Abstract

The invention provides a test system and a test method. The test system comprises a server and a plurality of electronic devices connected to the server. Each of the plurality of electronic devices collects test data generated by the test module testing the memory device. The electronic devices transmit the test data to the server through a local area network, and the server generates a test report according to the test data. By automatically collecting the test data and automatically generating the test report, the manpower and time for collecting the test data and generating the test report are greatly reduced, and the test accuracy is improved.

Description

Test system and test method

Technical Field

The present invention relates to a test system and a test method, and more particularly, to a test system and a test method for a memory device.

Background

In the past, when testing a memory device, a computer was manually used to collect test data and manually fill in test reports. This is not only labor and time consuming, but also is inevitable with recording errors due to manual recording. Therefore, it is an objective of those skilled in the art to improve the testing efficiency and accuracy of memory devices.

Disclosure of Invention

The invention provides a test system and a test method, which improve the test efficiency and accuracy of a memory device.

The invention provides a test system, comprising: a server; and a plurality of electronic devices connected to the server. Each of the plurality of electronic devices collects test data generated by the test module testing the memory device. The electronic devices transmit the test data to the server through a local area network, and the server generates a test report according to the test data.

The invention provides a test method which is suitable for a test system. The test system comprises a server and a plurality of electronic devices connected to the server. The test method comprises the following steps: each of the plurality of electronic devices collecting test data for testing the memory device by the test module; the plurality of electronic devices transmit the test data to the server through a local area network; and the server generates a test report according to the test data.

Based on the above, in the testing system and the testing method provided by the embodiments of the present invention, the electronic device collects the testing data of the memory device and transmits the testing data to the server through the local area network, so that the server generates the testing report according to the testing data. According to the test system and the test method provided by the embodiment of the invention, the test data is automatically collected and the test report is automatically generated, so that the manpower and time for collecting the test data and generating the test report are greatly reduced, and the test accuracy is improved.

In order to make the aforementioned and other features and advantages of the invention more comprehensible, embodiments accompanied with figures are described in detail below.

Drawings

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and together with the description serve to explain the principles of the invention.

FIG. 1 is a block diagram of a test system according to an embodiment of the present invention;

FIG. 2 is an architecture diagram of a test system according to an embodiment of the present invention;

FIG. 3 is a flow chart of a testing method according to an embodiment of the invention.

Description of the reference numerals

100: testing the system;

111-114: an electronic device;

115-118: a client process;

120: a server;

121: a server process;

130: testing the report;

s301 to S303: and (3) testing the steps of the method.

Detailed Description

Reference will now be made in detail to exemplary embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used throughout the drawings and the description to refer to the same or like parts.

FIG. 1 is a block diagram of a test system according to an embodiment of the present invention; FIG. 2 is an architecture diagram of a test system according to an embodiment of the present invention.

Referring to fig. 1 and fig. 2, a testing system 100 according to an embodiment of the invention includes electronic devices 111 to 114 and a server 120. The electronic devices 111-114 are connected to the server 120. The electronic devices 111 to 114 and the server 120 are, for example, Personal Computers (PCs). Although the test system 100 includes four electronic devices 111-114 in the embodiment, the invention is not limited to the number of the electronic devices.

In one embodiment, each of the electronic devices 111-114 collects test data generated by a test module (e.g., a mass production TOOL ST-TOOL or other mass production TOOL) testing a memory device (not shown). The memory device may include one or more flash disks. The electronic devices 111-114 transmit the test data to the server 120 through the LAN. The server 120 receives the test data and generates a test report 130 according to the test data.

Specifically, each of the electronic devices 111-114 runs the client processes 115-118 to collect the test data of the test module and transmit the test data to the server 120. Server 120 runs server process 121 to collect test data and generate test report 130. The server process 121 can also monitor the test conditions of each client process 115-118.

Since the client process 115 of the electronic device 111 and the test module run on the same computer, the test module and the client process 115 running on the electronic device 111 perform data intercommunication through a data sharing command (e.g., an OnCopyData command). This mechanism of data interworking may also be referred to as a message handling mechanism. The electronic devices 112-114 may also have a mechanism for data communication.

In one embodiment, the server 120 and the electronic devices 111-114 perform data interaction through a Socket mechanism. The server 120 and the electronic devices 111 to 114 need to be in the same local area network, and the electronic devices 111 to 114 are connected to a port monitored by the server 120 through an Internet Protocol (IP) address of the server 120 in the local area network.

In one embodiment, the server 120 generates the test report 130 through an Application Program Interface (API). For example, the server 120 may install document processing software (e.g., Office software) and operate form processing software (e.g., Excel software) through an application programming interface provided by the document processing software to generate the test report 130.

By automatically collecting test data and automatically generating test reports, the test system 100 of an embodiment of the present invention greatly reduces the labor and time for collecting test data and generating the test reports 130 and improves the test accuracy.

Referring to fig. 3, in step S301, a plurality of electronic devices collect test data of the test module for testing the memory device.

In step S302, the plurality of electronic devices transmit test data to the server through the local area network.

In step S303, the server generates a test report according to the test data.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test system, comprising:

a server; and

a plurality of electronic devices connected to the server, wherein

Each of the plurality of electronic devices collects test data generated by the test module testing the memory device,

the electronic devices transmit the test data to the server through a local area network, and the server generates a test report according to the test data.

2. The test system of claim 1, wherein the server runs a server process to collect the test data and generate a test report.

3. The test system of claim 1, wherein each of the plurality of electronic devices runs a client process to collect the test data of the test module and transmit the test data to the server.

4. The test system of claim 1, wherein the test module is in data communication with client processes running on the plurality of electronic devices via data sharing commands.

5. The test system of claim 1, wherein the server interacts data with the plurality of electronic devices via a socket mechanism.

6. The test system of claim 1, wherein the plurality of electronic devices are connected to the port on which the server listens through the server at an internet protocol address of the local area network.

7. The test system of claim 1, wherein the server generates the test report via an application programming interface.

8. The test system of claim 1, wherein the test module is a volume production tool.

9. The test system of claim 1, wherein the memory device comprises one or more flash disks.

10. A test method is applied to a test system, the test system comprises a server and a plurality of electronic devices connected to the server, and the test method comprises the following steps:

each of the plurality of electronic devices collecting test data for testing the memory device by the test module;

the plurality of electronic devices transmit the test data to the server through a local area network; and

and the server generates a test report according to the test data.