CN112518849A - Optical-grade PET release film slitting process quality monitoring system - Google Patents
Optical-grade PET release film slitting process quality monitoring system Download PDFInfo
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- CN112518849A CN112518849A CN202011251432.1A CN202011251432A CN112518849A CN 112518849 A CN112518849 A CN 112518849A CN 202011251432 A CN202011251432 A CN 202011251432A CN 112518849 A CN112518849 A CN 112518849A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D5/00—Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
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Abstract
The invention discloses a system for monitoring the quality of a slitting process of an optical-grade PET release film, which relates to the technical field of PET release films and comprises an acquisition module, a judgment module, a processing module and an early warning module, wherein the acquisition module is connected with the judgment module; the judging module is used for judging the film thickness and transmitting a judging instruction to the processing module, the processing module receives the instruction, collects film thickness parameters through the collecting module and verifies the judging instruction of the judging module, and pre-warns through the pre-warning module after verification is completed, and the collecting module comprises a light source emitting unit, a signal receiving unit and a calculating unit. According to the invention, the film thickness is judged by the judgment module and the judgment instruction is transmitted to the processing module, the processing module receives the instruction, the film thickness parameter is acquired by the acquisition module, the judgment instruction of the judgment module is verified, and the early warning is carried out by the early warning module after the verification is finished, so that the film thickness of the PET release film slitting process is monitored, the production efficiency is improved, the product quality is improved, and the production cost is reduced.
Description
Technical Field
The invention relates to the technical field of PET release films, in particular to a quality monitoring system for a cutting process of an optical-grade PET release film.
Background
The PET release film is a material commonly used for thermal transfer printing, the substrate is PET, and the PET release film is also called a silicon oil film after being coated with silicon oil. Conventional thicknesses range from 25um to 150 um. The product has good adsorbability and adhesiveness after being subjected to antistatic and scratch-resistant treatment.
In the PET release film slitting process, whether the film thickness is abnormal or not is judged according to experience, and whether the film thickness is abnormal or not cannot be effectively judged, so that a certain defective rate exists.
An effective solution to the problems in the related art has not been proposed yet.
Disclosure of Invention
Aiming at the problems in the related art, the invention provides an optical-grade PET release film slitting process quality monitoring system, wherein a judgment module judges the film thickness and transmits a judgment instruction to a processing module, the processing module receives the instruction, acquires film thickness parameters through an acquisition module and verifies the judgment instruction of the judgment module, and an early warning module is used for early warning after verification is completed, so that the film thickness of the PET release film slitting process is monitored, and the technical problems in the related art are solved.
The technical scheme of the invention is realized as follows:
the system for monitoring the quality of the optical-grade PET release film slitting process comprises an acquisition module, a judgment module, a processing module and an early warning module, wherein the acquisition module is used for acquiring the optical-grade PET release film slitting process;
the judging module is used for judging the film thickness and transmitting a judging instruction to the processing module, the processing module receives the instruction, acquires film thickness parameters through the acquisition module and verifies the judging instruction of the judging module, and the early warning is carried out through the early warning module after the verification is finished;
the acquisition module comprises a light source transmitting unit, a signal receiving unit and a calculating unit;
the light source emission unit is used for emitting incident light to the surface of the pre-coating roller;
the signal receiving unit is used for receiving first reflected light of incident light reflected by the surface of the pre-coating roller before the coating is coated, and is used for receiving second reflected light of incident light reflected by the surface of the coating on the pre-coating roller after the coating is coated;
and the computing unit acquires the reflected light signal to obtain the thickness of the coating on the precoating roller.
Further, the judging module includes:
inputting a process parameter K into the coating machine, wherein the expression K is V/P, K is the process parameter, V is the coating speed of the optical film, and P is the discharge pressure of the nozzle;
when the value of M is stable, the coating machine judges that the film thickness is uniform, and when the value of M is unstable, the coating machine judges that the film thickness is abnormal.
Further, when the V curve is matched with the P curve, the coating machine judges that the film thickness is uniform, and when the V curve is not matched with the P curve, the coating machine judges that the film thickness is abnormal.
Further, the coating machine judges that the deviation of the film thickness is less than or equal to 0.05 and is not risky.
Further, the coating machine also included a risk of judging that the film thickness was more than 0.05.
Further, the coating thickness pre-coating device comprises a storage module used for establishing the corresponding relation between the coating thickness on the pre-coating roller and the coating thickness on the substrate.
The invention has the beneficial effects that:
according to the invention, the film thickness is judged by the judgment module and the judgment instruction is transmitted to the processing module, the processing module receives the instruction, the film thickness parameter is acquired by the acquisition module, the judgment instruction of the judgment module is verified, and the early warning is carried out by the early warning module after the verification is finished, so that the film thickness of the PET release film slitting process is monitored, the production efficiency is improved, the product quality is improved, and the production cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic flow chart of a system for monitoring quality of a cutting process of an optical-grade PET release film according to an embodiment of the invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments that can be derived by one of ordinary skill in the art from the embodiments given herein are intended to be within the scope of the present invention.
According to the embodiment of the invention, a system for monitoring the quality of the optical-grade PET release film slitting process is provided.
As shown in fig. 1, the optical-grade PET release film slitting process quality monitoring system according to the embodiment of the present invention includes an acquisition module 1, a judgment module 2, a processing module 3 and an early warning module 4, wherein;
the judging module 2 is used for judging the film thickness and transmitting a judging instruction to the processing module 3, the processing module 3 receives the instruction, acquires the film thickness parameter through the acquisition module 1 and verifies the judging instruction of the judging module 2, and the early warning is carried out through the early warning module 4 after the verification is finished;
the acquisition module 1 comprises a light source transmitting unit 5, a signal receiving unit 6 and a calculating unit 7, wherein;
the light source emission unit 5 is used for emitting incident light to the surface of the pre-coating roller;
the signal receiving unit 6 is used for receiving first reflected light of incident light reflected by the surface of the pre-coating roller before coating the coating, and is used for receiving second reflected light of incident light reflected by the surface of the coating on the pre-coating roller after coating the coating;
and the calculating unit 7 acquires the reflected light signal to obtain the thickness of the coating on the precoating roller.
Wherein, the judging module 2 comprises:
inputting a process parameter K into the coating machine, wherein the expression K is V/P, K is the process parameter, V is the coating speed of the optical film, and P is the discharge pressure of the nozzle;
when the value of M is stable, the coating machine judges that the film thickness is uniform, and when the value of M is unstable, the coating machine judges that the film thickness is abnormal.
When the V curve is matched with the P curve, the coating machine judges that the film thickness is uniform, and when the V curve is not matched with the P curve, the coating machine judges that the film thickness is abnormal.
Wherein, the coating machine is used for judging that the deviation of the film thickness is less than or equal to 0.05 and no risk exists.
Wherein, the coating machine judges that the film thickness is more than 0.05 and is risky.
The device also comprises a storage module used for establishing the corresponding relation between the thickness of the coating on the pre-coating roller and the thickness of the coating on the substrate.
By means of the technical scheme, the film thickness is judged and the judgment instruction is transmitted to the processing module 3 through the judgment module 2, the processing module 3 receives the instruction, the film thickness parameters are collected through the collection module 1, the judgment instruction of the judgment module 2 is verified, the early warning is carried out through the early warning module 4 after the verification is completed, the film thickness of the PET release film slitting process is monitored, the production efficiency is improved, the product quality is improved, and the production cost is reduced.
In addition, specifically, a film thickness deviation of more than 0.05 and less than or equal to 0.1 is a low risk; a film thickness deviation greater than 0.1 and less than or equal to 0.2 is an intermediate risk; a deviation of the film thickness of more than 0.2 is a high risk. Further, the deviation of the K value from the target value is set to be within 0.05.
In addition, specifically, the upper limit of the target value can be set to be + 0.2% of the constant speed K value, and the lower limit of the target value can be set to be-9.8% of the constant speed K value, so that quality safety can be ensured.
In addition, the light source transmitting unit comprises a light source, a slit and a first converging mirror, the slit and the first converging mirror are sequentially arranged along the advancing direction of light emitted by the light source, the signal receiving unit comprises a second converging mirror and a linear sensor, the second converging mirror and the linear sensor are sequentially arranged along the reflecting direction of the light, the linear sensor comprises a light receiving unit and an amplifier, the light receiving unit is used for receiving the first reflected light and the second reflected light, and the amplifier is used for amplifying a light signal received by the light receiving unit.
In addition, the light source emission unit further comprises a first light folding component, and the first light folding component, the first converging mirror and the slit form a system with the same optical axis. And the signal receiving unit also comprises a second light folding component, and the second light folding component, the second converging mirror and the linear sensor form a coaxial system.
In conclusion, according to the technical scheme of the invention, the film thickness is judged by the judging module 2 and the judging instruction is transmitted to the processing module 3, the processing module 3 receives the instruction, the film thickness parameter is acquired by the acquisition module 1, the judging instruction of the judging module 2 is verified, and the early warning is performed by the early warning module 4 after the verification is completed, so that the film thickness of the PET release film slitting process is monitored, the production efficiency is improved, the product quality is improved, and the production cost is reduced.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (6)
1. The system for monitoring the quality of the optical-grade PET release film slitting process is characterized by comprising an acquisition module (1), a judgment module (2), a processing module (3) and an early warning module (4), wherein the acquisition module is used for acquiring the optical-grade PET release film slitting process;
the judging module (2) is used for judging the film thickness and transmitting a judging instruction to the processing module (3), the processing module (3) receives the instruction, acquires the film thickness parameter through the acquisition module (1), verifies the judging instruction of the judging module (2), and performs early warning through the early warning module (4) after the verification is completed, wherein the judging module (2) is used for judging the film thickness and transmitting the judging instruction to the processing module (3);
the acquisition module (1) comprises a light source transmitting unit (5), a signal receiving unit (6) and a calculating unit (7), wherein;
the light source emission unit (5) is used for emitting incident light to the surface of the pre-coating roller;
the signal receiving unit (6) is used for receiving first reflected light of incident light reflected by the surface of the pre-coating roller before coating, and is used for receiving second reflected light of incident light reflected by the surface of the coating on the pre-coating roller after coating;
and the calculating unit (7) acquires the reflected light signal to obtain the thickness of the coating on the precoating roller.
2. The system for monitoring the quality of the optical-grade PET release film slitting process according to claim 1, wherein the judging module (2) comprises:
inputting a process parameter K into the coating machine, wherein the expression K is V/P, K is the process parameter, V is the coating speed of the optical film, and P is the discharge pressure of the nozzle;
when the value of M is stable, the coating machine judges that the film thickness is uniform, and when the value of M is unstable, the coating machine judges that the film thickness is abnormal.
3. The system for monitoring the quality of the optical-grade PET release film slitting process according to claim 2, further comprising a coating machine for determining that the film thickness is uniform when the V curve is matched with the P curve, and determining that the film thickness is abnormal when the V curve is not matched with the P curve.
4. The system for monitoring the quality of the optical-grade PET release film slitting process according to claim 3, further comprising a coating machine for judging whether the film thickness deviation is less than or equal to 0.05 as risk-free.
5. The system for monitoring the quality of the optical-grade PET release film slitting process according to claim 4, further comprising a coating machine for judging the film thickness of more than 0.05 as risky.
6. The system for monitoring the quality of the optical-grade PET release film slitting process according to claim 1, further comprising a storage module for establishing a corresponding relationship between the thickness of the coating on the pre-coating roller and the thickness of the coating on the substrate.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011251432.1A CN112518849A (en) | 2020-11-10 | 2020-11-10 | Optical-grade PET release film slitting process quality monitoring system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011251432.1A CN112518849A (en) | 2020-11-10 | 2020-11-10 | Optical-grade PET release film slitting process quality monitoring system |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1987005700A1 (en) * | 1986-03-19 | 1987-09-24 | The Secretary Of State For Defence In Her Britanni | Method and apparatus for monitoring surface layer growth |
| CN101162271A (en) * | 2007-11-21 | 2008-04-16 | 北京理工大学 | Optical film automatic monitoring device of rotating monitoring piece |
| CN107218895A (en) * | 2017-06-07 | 2017-09-29 | 深圳市华星光电技术有限公司 | A kind of optical thickness monitor device and monitoring method |
| CN108917580A (en) * | 2018-09-14 | 2018-11-30 | 重庆惠科金渝光电科技有限公司 | Detection method of coagulation of coating head and production process of optical filter |
| CN110038748A (en) * | 2019-04-01 | 2019-07-23 | 深圳市华星光电技术有限公司 | The film thickness monitoring method of optical film |
-
2020
- 2020-11-10 CN CN202011251432.1A patent/CN112518849A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1987005700A1 (en) * | 1986-03-19 | 1987-09-24 | The Secretary Of State For Defence In Her Britanni | Method and apparatus for monitoring surface layer growth |
| CN101162271A (en) * | 2007-11-21 | 2008-04-16 | 北京理工大学 | Optical film automatic monitoring device of rotating monitoring piece |
| CN107218895A (en) * | 2017-06-07 | 2017-09-29 | 深圳市华星光电技术有限公司 | A kind of optical thickness monitor device and monitoring method |
| CN108917580A (en) * | 2018-09-14 | 2018-11-30 | 重庆惠科金渝光电科技有限公司 | Detection method of coagulation of coating head and production process of optical filter |
| CN110038748A (en) * | 2019-04-01 | 2019-07-23 | 深圳市华星光电技术有限公司 | The film thickness monitoring method of optical film |
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Application publication date: 20210319 |
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