CN112505079B - PXRF-based method for analyzing hirudo samples - Google Patents

PXRF-based method for analyzing hirudo samples Download PDF

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CN112505079B
CN112505079B CN202010675175.8A CN202010675175A CN112505079B CN 112505079 B CN112505079 B CN 112505079B CN 202010675175 A CN202010675175 A CN 202010675175A CN 112505079 B CN112505079 B CN 112505079B
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周树斌
袁兆宪
成秋明
杨碧莹
孙群
赵洁
张振杰
杨玠
赵莫雷
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Hebei GEO University
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Abstract

The invention relates to a PXRF-based analysis method for thin (limited) leech samples, which is characterized in that leech standard samples with different thicknesses are prepared for each leech sample after pretreatment. The method comprises the steps of calibrating the element content of leech samples with different thicknesses by using PXRF, standardizing the reading of each element content of the PXRF, further establishing a power function regression model of the relation between the standardized PXRF reading and the thicknesses of leech standard samples, calibrating the PXRF reading of thin (limited) leech samples with unknown element contents by using the established power function regression model, greatly reducing measurement errors and improving accuracy.

Description

PXRF-based method for analyzing hirudo manillensis sample
Technical Field
The invention relates to a method for quickly measuring the element content of a leech sample based on a portable X-ray fluorescence spectrometer (PXRF), belongs to the technical field of chemical analysis, and particularly relates to a method for measuring the element content of leeches based on the portable X-ray fluorescence spectrometer (PXRF).
Background
In the technical field of chemical analysis, an ideal sample of a portable X-ray fluorescence spectrometer is a sample which is thick enough to ensure that most of X-rays are absorbed in the sample, and many biological samples often face the problem of insufficient sample amount, namely the thickness of a sample to be detected is smaller than the penetration depth of the X-rays in the biological sample, while the analysis result of the portable X-ray fluorescence spectrometer on a limited (thin) biological sample has a large error from the actual content, and the reliability of data of the generated element content is poor.
Some thickness correction methods such as a basic parameter method applied in the analysis of the traditional laboratory X-ray fluorescence spectrometer are often more in parameters, complex in calculation and low in efficiency, so that the prospect of the portable X-ray fluorescence spectrometer in content measurement of limited (thin) samples is greatly limited, and particularly the prospect of the portable X-ray fluorescence spectrometer in field measurement of the content of the limited (thin) samples is realized.
Disclosure of Invention
The embodiment of the invention aims to provide a rapid, economic and lossless test method for analyzing the element content in a limited (thin) leech sample by multiple elements, and a thickness correction calibration curve is established to solve the problems of large error of an analysis result of the thin (limited) leech sample by PXRF and low efficiency of a traditional correction method.
To achieve the above object, an embodiment of the present invention provides: portable XRF (PXRF) based analysis of thin (limited) leech samples:
1. a PXRF-based analysis method for thin (finite) leech samples, comprising the steps of:
the method comprises the following steps: preparation of standard (thick) leech samples: drying multiple leech samples at the temperature of below 60 ℃ until the leech samples have constant weight, crushing the leech samples into the particle size of below 250 micrometers, placing the crushed samples in a sample cup, compacting the crushed samples for 10 seconds under the pressure of 118 MPa, preparing the leech sample i into a sample piece with the thickness of L millimeters by a method for regulating the mass of the sample for multiple times, and recording the mass of the sample piece as m i 。
Step two: preparing a standard (thin) leech sample; is obtained by proportional calculationIs prepared into
Figure GDA0003227667230000021
Figure GDA0003227667230000022
The mass of the millimeter sample piece is respectively as follows:
Figure GDA0003227667230000023
the sample cup was also compacted in a 118 mpa pressure for ten seconds to form a sample sheet.
Step three: carrying out PXRF calibration on the element content of the leech standard sample: using the leech standard samples prepared in the first step and the second step of PXRF measurement to obtain a PXRF reading value set Y of the content of the element j in the thickness x of the standard sample i ij (x) (wherein i represents different leech samples, j represents different element species, and x represents the measured thickness of the standard sample);
step four: collecting the reading values obtained in the third step into a set Y ij (x) And (3) carrying out standardization treatment: will Y ij (x) Divided by Y ij (L) wherein Y ij (L) is a content reading of the element j of a leech sample i with the PXRF analysis thickness of L millimeters (enough thick sample), and the ratio of the content reading to the content S of the element j of the sample i after the standardization treatment ij (x) I.e. S ij (x)＝Y ij (x)/Y ij (L)
Step five: establishing a power function regression model of the standardized PXRF readings and sample thicknesses: s obtained in the fourth step ij (x) As ordinate, the corresponding thickness x as abscissa, and a power function regression model was established
Figure GDA0003227667230000024
Wherein a is ij And b ij Is a constant independent of the element type.
Step six: establishing a power function calibration curve by using a power function regression model and performing thickness correction: regression model of the power function obtained in the fifth step
Figure GDA0003227667230000025
Reverse thrustObtaining thickness correction model for element content analysis of thin sample
Figure GDA0003227667230000026
Wherein Y is ij PXRF reading value of the content of element j of a sample i with a thickness x, x being the thickness of the sample, a ij And b ij Is a constant determined in step five, Y p For the content of the j element in the i sample subjected to thickness correction, namely the predicted value of the content of the j element in the ideal sample (thick sample) i by PXRF, the thickness correction can be carried out on the PXRF reading of the thin sample by the correction model.
Preferably, in the first step, the leech sample is dried at a temperature below 60 ℃ until the weight is constant.
Preferably, in step one, the dried leech sample should be crushed to a particle size of 250 μm or less.
Preferably, in step one, the compaction process should ensure a pressure greater than 118 mpa for 10 seconds.
Preferably, in the first step, the thickness L of the thick sample is equal to or slightly larger than the penetration depth of the leech sample after being processed by the X-ray of the fluorescence instrument in the first step and the second step.
Preferably, in the third step, when the standard leech samples with different thicknesses prepared by the second step are calibrated, the measurement should be repeated for a plurality of times, and the arithmetic mean value is taken.
Preferably, in step six, the thin sample to be calibrated should be prepared according to the method described in step one and step two.
The embodiment of the invention has the following advantages:
1. according to the analysis method for the thin (limited) leech sample based on PXRF, the preparation of the leech standard sample is simple, the sample preparation is not required by a hydraulic press or a tablet press, the leech sample in the sample cup can be compacted by a weight of 10 kg, the pressure of 118 MPa can be generated, and the standard sample can be prepared in a simple environment.
2. According to the analysis method for the thin (limited amount) leech sample based on the PXRF, the calibration parameters of the established power function calibration curve for the thickness of the sample are few, the calibration process is simple, the correction from PXRF reading to PXRF reading is realized, the correction efficiency is improved, and the practicability of analyzing the thin (limited amount) leech sample under the field condition of the PXRF is enhanced.
3. According to the PXRF-based analysis method for the thin (limited quantity) leech sample, the problem that the result of PXRF analysis of the thin (limited quantity) leech sample is inaccurate is solved by the aid of the established thickness-based power function calibration curve, and accuracy of data is greatly improved.
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Fig. 1 is a graph of a PXRF-based power function regression model of a thin (finite) leech sample analysis method according to example 1 of the present invention. Wherein the abscissa is the thickness of the prepared leech sample piece, and the ordinate is the standardized content of the zinc element in the leech sample piece measured by PXRF.
Detailed Description
The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.
Example 1
In order to facilitate an understanding of the invention, reference will now be made in detail to the accompanying drawings, and specific examples.
A PXRF-based analysis method for thin (limited amount) leech samples (taking zinc as an example) comprises the following steps:
the method comprises the following steps: preparation of standard (thick) leech samples: drying three leech samples at the temperature of below 60 ℃ until the weight is constant, crushing the leech samples to the particle size of below 250 microns, placing the crushed samples in a sample cup, compacting the crushed samples for 10 seconds under the pressure of 118 MPa, preparing the leech samples into sample pieces with the thickness of 15 millimeters by a method for regulating the quality of the samples for multiple times, and respectively recording the quality.
Step two: preparing a standard (thin) leech sample; the required mass of the sample pieces of 2.5 mm, 5 mm, 7.5 mm, 10 mm and 12.5 mm is calculated by the ratio, and the above mass samples are similarly placed in a sample cup and compacted under 118 mpa pressure for ten seconds to form sample pieces of 2.5 mm, 5 mm, 7.5 mm, 10 mm and 12.5 mm.
Step three: carrying out PXRF calibration on the element content of the leech standard sample: obtaining PXRF reading value set Y of zinc contents of three standard samples with different thicknesses by using the leech standard samples prepared in the PXRF measuring step one and the leech standard sample prepared in the PXRF measuring step two iZn (x) Wherein i represents different samples, zn represents zinc element, and x is different sample thicknesses, and values thereof are 2.5 mm, 5 mm, 7.5 mm, 10 mm, 12.5 mm, and 15 mm.
Step four: collecting the reading values obtained in the third step into a set Y iZn (x) And (3) carrying out standardization treatment: will Y iZn (x) Divided by Y iZn (15) Wherein Y is iZn (15) For PXRF analysis of content reading of zinc element in Hirudo sample with thickness of 15 mm (enough thick sample), the ratio of the content reading to the content S of zinc element in each sample after standardization treatment Zn (x) I.e. S Zn (x)＝Y iZn (x)/Y iZn (15)。
Step five: establishing a power function regression model of the standardized PXRF readings and sample thicknesses: s obtained in the fourth step Zn (x) As the ordinate and the corresponding thickness x as the abscissa, a power function regression model S for the zinc element was established Zn (x)＝2.965x -0.413 As shown in the first drawing, the abscissa in the first drawing is the thickness of the sample piece processed according to the method in the first and second steps, and the ordinate is the normalized zinc content obtained in the fourth step.
Step six: establishing a power function calibration curve by using a power function regression model and performing thickness correction: regression model S of the power function obtained in the fifth step Zn (x)＝2.965x -0.413 Reverse-deducing thickness correction model for thin sample element content analysis
Figure GDA0003227667230000051
Wherein Y is Zn PXRF reading value of the content of zinc element of a thin (limited) leech sample, x is the thickness of the sample, Y p The content of zinc element in the thin (limited) sample with unknown content through thickness correction, namely the predicted value of PXRF on the actual content of zinc element in the sample, is corrected by using the correction modelPreparing a thinner (limited amount) leech sample JS-3-3, preparing a leech sample JS-3-3 into sample pieces of 5 mm and 15 mm according to the first step and the second step, respectively analyzing by using PXRF, wherein the zinc element content obtained by analyzing the JS-3-3 sample with the thickness of 5 mm by using PXRF is 786.65ppm, the zinc element content obtained by analyzing the JS-3-3 sample with the thickness of 15 mm by using PXRF is 498.39ppm, the zinc element content in the JS-3-3 sample is remarkably overestimated by using PXRF, the error is larger, and a power function thickness correction model is applied to the error, so that the error is larger, and the power function thickness correction model is used
Figure GDA0003227667230000061
After correction, the zinc element content in the JS-3-3 sample is predicted to be 520.08ppm, the analysis result of the corrected PXRF on the hirudo gracilis sample is close to the analysis result of an ideal sample (a thick sample), and the accuracy of the analysis result of the PXRF on the hirudo gracilis sample (a limited amount) is greatly improved by the provided power function thickness correction model.
The first step to the sixth step are the preparation of a standard sample, the element content calibration and the establishment of a power function thickness calibration curve, wherein the first step and the second step provide a simple sample processing flow, the preparation of the standard sample can be realized without large-scale equipment (such as a tablet press, a hydraulic press and the like), the sample preparation time is shortened, and the sample preparation efficiency is improved. The third step to the sixth step are element content calibration and establishment of a power function thickness calibration curve, wherein the correlation coefficient R of the power function regression model established in the fifth step 2 The value of (a) is 0.968, indicating that the regression effect of the power function regression model is relatively ideal. The calibration curve solves the problem that the analysis result of the PXRF on the thin (limited quantity) sample is not accurate, and the accuracy of the analysis result of the PXRF on the thin (limited quantity) leech sample is obviously improved.
Preferably, in the first step, the leech sample should be dried at a temperature below 60 ℃ until the weight is constant, and the drying process can avoid the influence of water on the result of the PXRF analysis.
Preferably, in step one, the dried leech sample should be crushed to a particle size of 250 microns or less, and the sample with the particle size of 250 microns or less is generally more uniform, so that the measurement result is more accurate and accidental errors are reduced.
Preferably, in the step one, the compaction process is carried out for 10 seconds under the pressure of more than 118 MPa, and the compaction time of more than 10 seconds can ensure that the leech sample keeps a compacted state continuously, and the volume and the density of the sample are not changed in a short time.
Preferably, in the step one, the thickness L of the thick sample is equal to or slightly larger than the penetration depth of the fluorimeter X-ray in the leech sample processed in the step one and the step two, and the fact that L is equal to or slightly larger than the penetration depth of the X-ray can ensure the fitting effect of the power function regression model.
Preferably, in the third step, when the standard leech samples with different thicknesses prepared by the second step are calibrated, repeated measurement is needed for multiple times, the average value is calculated, and repeated experiments can reduce accidental errors and improve the accuracy of PXRF measurement results
Preferably, in the sixth step, the corrected thin sample is prepared according to the methods in the first step and the second step, so that the (thin) sample to be detected is prepared according to the methods in the first step and the second step, the correction effect of the established power function thickness calibration curve is more ideal, and the accuracy of the corrected content value is improved.
Although the invention has been described in detail with respect to the general description and the specific embodiments, it will be apparent to those skilled in the art that modifications and improvements may be made based on the invention. Accordingly, such modifications and improvements are intended to be within the scope of the invention as claimed.

Claims (7)

1. A PXRF-based method for analyzing a hirudo sample is characterized by comprising the following steps:
the method comprises the following steps: preparation of standard thick leech sample: drying a plurality of leech samples at the temperature of below 60 ℃ until the weight is constant, crushing the leech samples to the particle size of below 250 microns,placing the pulverized sample in a sample cup, compacting under 118 MPa for 10 s, and preparing Hirudo sample i into L mm thick sample pieces by regulating sample mass for several times i ；
Step two: preparing a standard leech sample; is obtained by proportional calculation
Figure FDA0003227667220000011
Figure FDA0003227667220000012
The mass of the millimeter sample piece is respectively as follows:
Figure FDA0003227667220000013
sample pieces were also made in the sample cup by compacting under 118 mpa pressure for ten seconds;
step three: carrying out PXRF calibration on the element content of the leech standard sample: using the leech standard samples prepared in the first step and the second step of PXRF measurement to obtain a PXRF reading value set Y of the content of the element j in the thickness x of the standard sample i ij (x) Wherein i represents different leech samples, j represents different element types, and x represents the measured thickness of the standard sample;
step four: collecting the reading values obtained in the third step into a set Y ij (x) And (3) carrying out standardization treatment: will Y ij (x) Divided by Y ij (L) wherein Y ij (L) is a content reading of the element j of a leech sample i with the thickness of L millimeters analyzed by PXRF, and the ratio of the content reading to the content S of the element j of the sample i after standardization treatment ij (x) I.e. S ij (x)＝Y ij (x)/Y ij (L)；
Step five: establishing a power function regression model of the standardized PXRF readings and sample thicknesses: s obtained in the fourth step ij (x) As ordinate, the corresponding thickness x as abscissa, and a power function regression model was established
Figure FDA0003227667220000014
Wherein a is ij And b ij Is an and elementA class independent constant;
step six: establishing a power function calibration curve by using a power function regression model and performing thickness correction: regression model of power function obtained in the fifth step
Figure FDA0003227667220000015
Reverse deducing thickness correction model for thin sample element content analysis
Figure FDA0003227667220000021
Wherein Y is ij PXRF reading value of the content of element j of a sample i with thickness x, wherein x is the thickness of the sample, a ij And b ij Is a constant determined in step five, Y p The thickness of the PXRF reading of the thin sample can be corrected through the correction model for the content of the j element in the i sample subjected to thickness correction, namely the predicted value of the content of the j element in the standard thick leech sample i by the PXRF.
2. The PXRF-based analysis method for leech samples according to claim 1, wherein the leech samples should be dried at a temperature below 60 ℃ until the weight of the leech samples is constant.
3. The PXRF-based analysis method for leech samples according to claim 1 or 2, wherein in the first step, the dried leech sample is crushed to a particle size of 250 microns or less.
4. The PXRF-based analysis method for hirudo samples according to claim 1, characterized in that in step one, the compaction process is carried out under a pressure of more than 118 mpa for 10 seconds.
5. The PXRF-based analysis method for leech samples according to claim 1, wherein in the first step, the thickness L of the standard thick leech sample is equal to or slightly greater than the penetration depth of the leech sample after being processed by the X-ray of a fluorimeter in the first step and the second step.
6. The PXRF-based analysis method for leech samples according to claim 1, wherein in step three, when calibrating the leech standard samples with different thicknesses prepared by the step two method, the measurement should be repeated several times, and the arithmetic mean value is taken.
7. The PXRF-based analysis method for hirudo samples according to claim 1, wherein in step six, the thin sample to be calibrated is prepared according to the method of step one and step two.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101131369A (en) * 2006-08-23 2008-02-27 北京普析通用仪器有限责任公司 X radial energy spectrometer with compatible measurement of thin sample and thick sample
CN102692426A (en) * 2012-06-09 2012-09-26 深圳市华测检测技术股份有限公司 Thin sample grazing X ray fluorescence (XRF) spectrum analysis system
JP2014190892A (en) * 2013-03-28 2014-10-06 Hitachi High-Technologies Corp Sample observation method, sample pretreatment method, and charged particle beam device
CN110161067A (en) * 2019-06-11 2019-08-23 中国地质大学（北京） A kind of concentrate tenor measuring method based on Portable X RF

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101131369A (en) * 2006-08-23 2008-02-27 北京普析通用仪器有限责任公司 X radial energy spectrometer with compatible measurement of thin sample and thick sample
CN102692426A (en) * 2012-06-09 2012-09-26 深圳市华测检测技术股份有限公司 Thin sample grazing X ray fluorescence (XRF) spectrum analysis system
JP2014190892A (en) * 2013-03-28 2014-10-06 Hitachi High-Technologies Corp Sample observation method, sample pretreatment method, and charged particle beam device
CN110161067A (en) * 2019-06-11 2019-08-23 中国地质大学（北京） A kind of concentrate tenor measuring method based on Portable X RF

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
应用S930树脂富集薄样-X射线荧光光谱现场分析环境水体中8种重金属的方法研究;翟磊 等;《岩矿测试》;20150131;第34卷(第1期);第118-128页 *

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