CN112474441B

CN112474441B - Full-automatic chip aging test and PCB shielding test assembly line equipment

Info

Publication number: CN112474441B
Application number: CN202011388840.1A
Authority: CN
Inventors: 周光杰; 余振涛
Original assignee: Qunwo Electronic Technology Suzhou Co ltd
Current assignee: Qunwo Electronic Technology Suzhou Co ltd
Priority date: 2020-12-01
Filing date: 2020-12-01
Publication date: 2022-07-29
Anticipated expiration: 2040-12-01
Also published as: CN112474441A

Abstract

The invention relates to full-automatic chip aging test and PCB shielding test assembly line equipment. The apparatus comprises: the first industrial control machine controls the first mechanical arm to grab a device test disc in the full-automatic chip aging test and PCB shielding test feeding machine, places the device test disc on the conveying track, and conveys the device test disc to the full-automatic chip aging test and PCB shielding test machine through the conveying track; the second industrial controller controls the second mechanical arm to grab the device test disc on the conveying track and places the device test disc in an automatic test cabinet of the full-automatic chip aging test and PCB shielding test machine to test a device to be tested of the device test disc; after the test is finished, the second industrial personal computer and the second mechanical mobile phone take out thousands of test discs of the automatic test cabinet, the test discs are placed on a normally mature rail, the test discs are conveyed to a full-automatic chip aging test and PCB shielding test blanking machine through a conveying rail, and test devices in the device test discs are taken out and classified through a third controller and a third manipulator. The invention can improve the testing efficiency and reduce the labor cost.

Description

Full-automatic chip aging test and PCB shielding test assembly line equipment

Technical Field

The invention relates to the field of chip aging test and PCB shielding test, in particular to full-automatic chip aging test and PCB shielding test assembly line equipment.

Background

The chip burn-in test is an electrical stress test method which uses voltage and high temperature to accelerate electrical failure of a device. The burn-in process essentially simulates the overall life of the chip because the electrical stimulus applied during the burn-in process reflects the worst case for the chip to operate. Depending on the aging time, the reliability of the resulting data may be related to the early life or wear of the device. Burn-in testing can be used as a test of device reliability or as a production window to discover early failure of a device. The complexity of chips is increasing, and in order to ensure that a shipped chip has no problem, testing needs to be performed before shipping to ensure functional integrity. And the chip is used as a mass production object, and the mass automatic test is the only solution. Magnetic interference/EMI is a problem which must be faced and overcome in the whole electronic field, and generally, in the process of board test and final test of wireless communication products such as mobile phones, wireless network cards, wireless routers, wireless earphones, Bluetooth earphones, wi-fi, wimax, data cards, interphones, RFID and other wireless communication equipment and wireless communication modules, the test environment is improved by using a radio frequency test shielding box. The shielding box is also called a shielding box and an isolation box. The electromagnetic shielding structure is a metal body which is made of conductive or magnetic conductive materials and has various shapes, limits the electromagnetic capacity in a certain space range and is used for inhibiting radiation interference. And the conduction and the radiation are processed to realize the equipment for providing an interference-free testing environment for the tested wireless communication equipment. The method is mainly used for various enterprises engaged in the production and research and development of wireless electronic products and wireless communication products, various electronic and electric appliance consumer product production enterprises and the like. With the development of the industry, the act of manually performing screening tests is eventually replaced by automated equipment.

Disclosure of Invention

The invention aims to provide full-automatic chip aging test and PCB shielding test assembly line equipment to solve the problems of low efficiency and high labor cost of manual test.

In order to achieve the purpose, the invention provides the following scheme:

a full-automatic chip aging test and PCB shielding test assembly line equipment comprises: the system comprises a full-automatic chip aging test and PCB shielding test feeding machine, a full-automatic chip aging test and PCB shielding test machine and a full-automatic chip aging test and PCB shielding test blanking machine;

the industrial controller is respectively connected with the full-automatic chip aging test and PCB shielding test feeding machine, the full-automatic chip aging test and PCB shielding test machine and the full-automatic chip aging test and PCB shielding test blanking machine;

the full-automatic chip aging test and PCB shield test feeding machine, the full-automatic chip aging test and PCB shield test machine and the full-automatic chip aging test and PCB shield test discharging machine are sequentially connected through a conveying track; the full-automatic chip aging test and PCB shielding test feeding machine is provided with a first mechanical arm and a first industrial personal computer; the full-automatic chip aging test and PCB shielding test machine is provided with a second mechanical arm and a second industrial personal computer; the full-automatic chip aging test and PCB shielding test blanking machine is provided with a third mechanical arm and a third industrial personal computer; the first industrial personal computer, the second industrial personal computer and the third industrial personal computer are connected;

The first industrial controller controls the first mechanical arm to grab the device test disc in the full-automatic chip aging test and PCB shielding test feeding machine, places the device test disc on the conveying rail, and conveys the device test disc to the full-automatic chip aging test and PCB shielding test machine through the conveying rail; the second industrial controller controls the second mechanical arm to grab the device testing disc on the conveying track and places the device testing disc in an automatic testing cabinet of the full-automatic chip aging testing and PCB shielding testing machine to test a device to be tested of the device testing disc; after the test is finished, the third industrial controller controls the third mechanical arm to grab the device test disc in the automatic test cabinet, place the device test disc on the conveying track, and convey the device test disc to the full-automatic chip aging test and PCB shielding test blanking machine through the conveying track.

Optionally, the full-automatic chip aging test and PCB shield test material loading machine specifically includes: the device automatic feeding machine, the device testing disc feeding machine, the first scanner and the first mechanical arm;

the automatic device feeding machine comprises a first tray feeding bin, a first tray discharging bin and a device taking area; the first tray inlet bin is arranged between the first tray outlet bin and the device taking area; the first tray inlet bin is used for placing the tray devices to be tested; the first tray outlet bin is used for storing empty trays which capture the devices to be tested; the device taking area is an area for the first mechanical arm to grab the device to be tested; the device automatic feeding machine is used for conveying a material tray which is fully loaded with the devices to be tested and is in the first tray feeding bin to the device taking area, the devices to be tested are placed in the device testing tray feeding machine through the first mechanical arm, and an empty material tray is conveyed into the first tray discharging bin;

The first code scanner is arranged on the first mechanical arm; the first code scanner is used for scanning the two-dimensional code on the device test disc; device test information is arranged in the two-dimensional code;

the device testing disc feeding machine is used for conveying the device testing disc to the conveying rail through screw rod transmission.

Optionally, the fully automatic chip aging test and PCB shield test machine specifically includes: the automatic testing device comprises a machine metal plate, an automatic testing cabinet, a second mechanical arm, a conveying track and a second code scanner;

the automatic test cabinet is arranged inside the machine metal plate; a plurality of test cells are arranged on the automatic test cabinet; the test unit cell is used for testing a device to be tested in the device test tray; the device is a chip or a PCB module and the like;

a high platform is arranged on the machine metal plate, and an X-axis horizontal moving mechanism of the second mechanical arm is fixed on the high platform; the second mechanical arm is used for grabbing the device test tray, placing the device test tray in the test unit cell and taking out the device test tray in the test unit cell;

the conveying track is arranged on the machine metal plate, and the conveying track and the high platform are oppositely arranged in parallel in the same vertical direction; the conveying track is used for conveying the device testing disc;

The second code scanner is arranged on the machine metal plate and above the feeding end of the conveying track; the second code scanner is used for scanning the two-dimensional code on the device test disc and uploading the chip test information on the two-dimensional code to the second industrial controller;

the second industrial controller is also respectively connected with each test unit cell, the second mechanical arm and the conveying track; and the second industrial controller is used for controlling the second mechanical arm to convey the device test disc from the conveying track to the test unit cell according to the device test information.

Optionally, the full-automatic chip aging test and PCB shield test blanking machine specifically includes: the device automatic feeding machine, the device testing disc discharging machine, the third code scanner and the third mechanical arm;

the device testing disc discharging machine is used for conveying the device testing disc from the conveying rail to the device automatic discharging machine through screw rod transmission;

the automatic device blanking machine comprises a second tray feeding bin, a second tray discharging bin and a device discharging area; the second tray inlet bin is arranged between the second tray outlet bin and the device discharging area; the device discharging area comprises a good product tray, a first defective product tray, a second defective product tray and a third defective product tray; the second tray feeding bin is used for storing empty trays of tested devices; the second tray discharging bin is used for storing trays of devices which are fully loaded and tested; the device placing area is an area for the third mechanical arm to grab the tested devices in the device testing tray; the automatic device blanking machine is used for conveying an empty tray of the second tray feeding bin to a device discharging area, placing the tested devices in the empty tray in the device discharging area by the third mechanical arm, and conveying the tray fully loaded with the tested devices to the second tray discharging bin;

The third code scanner is arranged on the third mechanical arm; the third code scanner is used for scanning the two-dimensional code on the device test disc and sending the device test information embedded in the two-dimensional code to the third industrial controller; and the third industrial controller determines the test result of the devices to be tested in the device test tray according to the device test information, and controls the third mechanical arm to place the tested devices in the empty tray in the device placing area in a classified manner according to the test result of the devices.

Optionally, a plurality of test seats are arranged on the device test tray; one device to be tested is embedded in one test seat;

a device testing butt joint point is arranged in each testing seat; a joint is arranged outside the device testing disc; the device testing butt joint is communicated with the joint; the device testing butt joint is used for connecting the device testing point position of the device to be tested; the connector is used for being connected with the automatic test cabinet.

Optionally, the method further includes: a first limit cylinder;

the first limiting cylinder is arranged at a first position of a transmission track in the full-automatic chip aging test and PCB shielding test machine; the first position is arranged opposite to the code scanner; the first limiting cylinder is electrically connected with the second industrial controller; the first limiting cylinder is used for blocking the device testing disc from transmitting and enabling the device testing disc to stay at the first position; after the two-dimensional code is scanned by the code scanner, the second industrial controller controls the first limiting cylinder to release the device testing disc.

Optionally, the method further includes: a second limiting cylinder;

the second limiting cylinder is arranged at a second position of the conveying track in the full-automatic chip aging test and PCB shielding test machine; the second limiting cylinder is used for blocking the device testing disc from being transmitted, enabling the device testing disc to stay at the second position, and enabling the second mechanical arm to grab the device testing disc.

Optionally, the first mechanical arm specifically includes: the device comprises an X-axis horizontal moving mechanism, a Y-axis horizontal moving mechanism, a Z-axis lifting mechanism and a grabbing mechanism; the X-axis horizontal moving mechanism, the Y-axis horizontal moving mechanism and the Z-axis lifting mechanism are mutually vertical;

the Y-axis horizontal moving mechanism is fixed on the X-axis horizontal moving mechanism; the Z-axis lifting mechanism is fixed on the Y-axis horizontal moving mechanism; the grabbing mechanism is fixed on the Z-axis lifting mechanism; the X-axis horizontal moving mechanism is used for driving the Y-axis horizontal moving mechanism to do X-direction linear motion; the Y-axis horizontal moving mechanism is used for driving the Z-axis lifting mechanism to do Y-direction linear motion; the Z-axis lifting mechanism is used for driving the grabbing mechanism to do vertical linear motion;

The second mechanical arm and the third mechanical arm are both identical in structure to the first mechanical arm.

Optionally, the grabbing mechanism specifically includes: the device comprises a cylinder clamping device, a rotary motor and an upper camera;

the cylinder clamping device is electrically connected with the rotary motor; the rotary motor is electrically connected with the rotary electric machine; the cylinder clamping device is used for clamping the device testing disc; the rotary motor is used for driving the air cylinder clamping device to rotate; the rotary motor is used for adjusting the angle of the air cylinder clamping device when the device test disc is grabbed and placed;

the upper camera is arranged on one side of the cylinder clamping device; the upper camera is used for positioning the current position of the device testing disc.

Optionally, the method further includes: a transfer robot;

the carrying robot is used for carrying the unloaded device testing tray in the device discharging area to the device testing tray feeding machine.

According to the specific embodiment provided by the invention, the invention discloses the following technical effects: the invention provides a full-automatic chip aging test and PCB shielding test assembly line device, which is characterized in that a full-automatic chip aging test and PCB shielding test feeding machine is controlled by an industrial controller to transmit a device to be tested to a full-automatic chip aging test and PCB shielding test machine through a transmission rail, the full-automatic chip aging test and PCB shielding test machine tests the device to be tested and transmits a test result to the industrial controller, and after the test is finished, the tested device is transmitted to the full-automatic chip aging test and PCB shielding test discharging machine through the transmission rail.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.

FIG. 1 is a top view of a fully automatic chip burn-in test and PCB shield test line apparatus provided by the present invention;

FIG. 2 is a top view of a fully automatic chip burn-in test and PCB shield test loader provided in the present invention;

FIG. 3 is a perspective view of a fully automatic chip burn-in test and PCB shield test machine provided by the present invention;

FIG. 4 is a top view of the fully automatic chip burn-in test and PCB shield test blanking machine provided by the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The invention aims to provide full-automatic chip aging test and PCB shielding test assembly line equipment which can improve the test efficiency and reduce the labor cost.

In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.

Fig. 1 is a top view of a full-automatic chip burn-in test and PCB shield test pipeline device provided in the present invention, and as shown in fig. 1, the full-automatic chip burn-in test and PCB shield test pipeline device includes: the system comprises a full-automatic chip aging test and PCB shielding test feeding machine 1, a full-automatic chip aging test and PCB shielding test machine 2 and a full-automatic chip aging test and PCB shielding test blanking machine 3;

the industrial controller is respectively connected with the full-automatic chip aging test and PCB shield test feeding machine 1, the full-automatic chip aging test and PCB shield test machine 2 and the full-automatic chip aging test and PCB shield test blanking machine 3; the industrial computer does not exist alone, and the three possesses the industrial computer alone, controls single independent body board work, and every single monomer board of list has the communication to connect again, and the assembly line work is accomplished together in the cooperation, need not add the industrial controller again.

The full-automatic chip aging test and PCB shield test feeding machine 1, the full-automatic chip aging test and PCB shield test machine 2 and the full-automatic chip aging test and PCB shield test blanking machine 3 are sequentially connected through a conveying track 4; the full-automatic chip aging test and PCB shielding test feeding machine 1 is provided with a first mechanical arm and a first industrial personal computer; the full-automatic chip aging test and PCB shielding test machine 2 is provided with a second mechanical arm 2-3 and a second industrial personal computer; the full-automatic chip aging test and PCB shielding test blanking machine 3 is provided with a third mechanical arm and a third industrial personal computer; the first industrial personal computer, the second industrial personal computer and the third industrial personal computer are connected;

the first industrial personal computer controls the first mechanical arm 1-4 to grab the device testing disc 5 in the full-automatic chip aging test and PCB shielding test feeding machine 1, places the device testing disc on the conveying track 4, and conveys the device testing disc to the full-automatic chip aging test and PCB shielding test machine 2 through the conveying track 4; the second industrial controller controls the second mechanical arm 2-3 to grab the device testing disc 5 on the conveying track 4 and places the device testing disc 5 in an automatic testing cabinet 2-2 of the full-automatic chip aging testing and PCB shielding testing machine 2 to test a device to be tested of the device testing disc 5; after the test is finished, the third industrial controller controls the third mechanical arm to grab the device test tray 5 in the automatic test cabinet 2-2, place the device test tray on the conveying track 4, and convey the device test tray to the full-automatic chip aging test and PCB shielding test blanking machine through the conveying track 4.

Fig. 2 is a top view of a fully automatic chip burn-in test and PCB shield test feeding machine 1 provided in the present invention, and as shown in fig. 2, the fully automatic chip burn-in test and PCB shield test feeding machine 1 specifically includes: the device testing system comprises an automatic device feeding machine 1-1, a device testing disc feeding machine 1-2, a first code scanner 1-3 and a first mechanical arm 1-4; the automatic device feeding machine 1-1 comprises a first tray feeding bin 1-1-1, a first tray discharging bin 1-1-2 and a device taking area 1-1-3; the first tray inlet bin 1-1-1 is arranged between the first tray outlet bin 1-1-2 and the device taking area 1-1-3; the first tray inlet bin 1-1-1 is used for placing tray devices to be tested; the first tray outlet bin 1-1-2 is used for storing empty trays which are used for grabbing the devices to be tested; the device taking area 1-1-3 is an area for the first mechanical arm 1-4 to grab the device to be tested; the device automatic feeding machine 1-1 is used for conveying a material tray which is full of the devices to be tested and is in the first material inlet bin 1-1-1 to the device material taking area 1-1-3, the devices to be tested are placed in the device testing tray 5 in the device testing tray feeding machine 1-2 by the first mechanical arm 1-4, and an empty material tray is conveyed into the first material outlet bin 1-1-2; the first code scanner 1-3 is arranged on the first mechanical arm 1-4; the first code scanner 1-3 is used for scanning the two-dimensional code on the device testing tray 5; device test information is arranged in the two-dimensional code; the device testing tray feeding machine 1-2 is used for conveying the device testing tray 5 to the conveying rail 4 through screw rod transmission.

The automatic device feeding machine 1-1 consists of a first tray feeding bin 1-1-1, a first tray discharging bin 1-1-2 and a device taking area 1-1-3. The first tray inlet bin 1-1-1 is used for placing tray devices to be tested; the first tray outlet bin 1-1-2 is used for storing empty trays which are used for grabbing test devices; the device taking area 1-1-3 is a position where the first mechanical arm takes the device. The automatic device feeding machine 1-1 conveys the full-load device trays in the first tray feeding bin 1-1-1 to the device taking area 1-1-3 for the first mechanical arm to grab, and conveys the empty trays to the first tray discharging bin 1-1-2 after grabbing. The automatic device feeding machine 1-1 comprises 4 tracks, and each track is provided with a first tray feeding bin 1-1-1; the first tray outlet bin 1-1-2 and the device taking area 1-1-3 are arranged, and each first tray inlet bin 1-1-1 can be used for placing more than 20 trays, so that a large number of device trays, namely a large number of devices to be tested, can be placed when the trays are manually added every time, large-batch device testing can be met, and manual feeding times are reduced.

The device test tray 5 is used for loading devices to be tested, each device test tray 5 is provided with 64 or more device test seats, 64 or more test devices can be placed in the 64 or more device test seats, each device test tray 5 is independently provided with a two-dimensional code, and each test tray is marked. The loading device is convenient to transport in the whole testing process; the plurality of seat openings increase the testing number; the device is embedded and fixed to protect the safety of the device in the transportation process; the inner part is connected with the detection point position of each device, and the outer part is provided with a joint which can be connected with the automatic test cabinet 2-2 to play a role of communicating a bridge.

The device test tray 5 is placed in a device test tray empty tray bin of the device test tray feeding machine 1-2, and more than 20 device test trays 5 can be placed in the device test tray empty tray bin. The device test tray feeder 1-2 lifts and carries the device test tray 5 into the transfer rail 4 through internal screw transmission, and moves downward together with the transfer rail 4.

The function of the conveying track 4 in the automatic component feeder 1-1 is to drive the upper component test tray 5 to move to a designated position, where editing of the two-dimensional code information on the component test tray 5 and loading of the component to be tested to the component test tray 5 are started. After the work is finished, the conveying track 4 continues to drive the device testing disc 5 to move downwards, and the device testing disc 5 is conveyed to the conveying track 4 on the full-automatic chip aging testing and PCB shielding testing machine. Therefore, the rear end of the transmission rail 4 is butted with the rail on the full-automatic chip aging test and PCB shielding test machine.

The first code scanner 1-3 is fixed with the Z axis of the first mechanical arm and moves along with the first mechanical arm; for scanning the two-dimensional code on the device test tray 5. After the device test tray 5 reaches the designated position, the barcode scanner moves above the two-dimensional code on the device test tray 5, reads the two-dimensional code, and adds designated information, such as the signal and the number of devices to be loaded, to the two-dimensional code.

Full-automatic chip aging testing and PCB shielding test material loading machine 1 independent motion has independent industrial computer, has solitary display screen, and the operation of local can all be controlled through the computer display screen, and the real-time developments of work also can be looked over through the display screen, and convenient and fast, this industrial computer carries out data interaction with industrial controller.

The first mechanical arm consists of an X axis; the Y-axis Z-axis and the rotating Z-axis form a whole, and the device grabbed by the grabbing mechanism is driven to be placed in the seat opening of the device testing disc 5.

The transfer robot 6 may be an Automated Guided Vehicle (AGV) that is operative to transfer empty device test trays 5 from a designated location into a device test tray empty tray magazine of the device test tray feeders 1-2 in place of manually adding empty device test trays 5.

In practical applications, fig. 3 is a perspective view of a full-automatic chip aging test and PCB shield test machine provided by the present invention, and as shown in fig. 3, the full-automatic chip aging test and PCB shield test machine 2 specifically includes: the automatic testing device comprises a machine metal plate 2-1, an automatic testing cabinet 2-2, a second mechanical arm 2-3, a conveying track 4 and a second code scanner 2-4; the automatic test cabinet 2-2 is arranged inside the machine metal plate 2-1; a plurality of test cells 2-2-1 are arranged on the automatic test cabinet 2-2; the test unit cell 2-2-1 is used for testing a device to be tested in the device test tray 5; a high platform is arranged on the machine metal plate 2-1, and an X-axis horizontal moving mechanism of the second mechanical arm 2-3 is fixed on the high platform; the second mechanical arm 2-3 is used for grabbing the device testing tray 5, placing the device testing tray 5 in the testing unit cell 2-2-1 and taking out the device testing tray 5 in the testing unit cell 2-2-1; the conveying track 4 is arranged on the machine metal plate 2-1, and the conveying track 4 and the high platform are arranged in parallel and oppositely in the same vertical direction; the transfer rail 4 is used for transferring the device test tray 5; the second code scanner 2-4 is arranged on the machine metal plate 2-1 and above the feeding end of the conveying track 4; the second code scanner 2-4 is configured to scan the two-dimensional code on the device test tray 5, and upload the device test information on the two-dimensional code to the second industrial controller; the second industrial controller is also respectively connected with each test unit cell 2-2-1, the second mechanical arm 2-3 and the conveying track 4; the second industrial controller is used for controlling the second mechanical arm 2-3 to convey the device testing tray 5 from the conveying track 4 to the testing unit cell 2-2-1 according to the device testing information.

The automatic test cabinet 2-2 is the core of the whole machine, the automatic test cabinet 2-2 has 24 test cells 2-2-1 which are arranged in horizontal rows 4 x vertical rows 6, and the number of the test cells can be increased to 60 test areas, and each cell is provided with a temperature meter and a timing display independently. Each test unit cell 2-2-1 can independently control the temperature and independently time, and each test unit cell 2-2-1 independently supplies power, so that different voltage and current can be provided for the device test tray 5 according to the requirements for testing. Each test cell 2-2-1 of the automatic test cabinet can be independently and automatically opened; and closing. Each test unit cell is separated by a heat insulation layer and a shielding layer, so that each unit cell is ensured to independently carry out aging or shielding test.

The device is embedded and fixed in the device test tray 5, so that the safety of the device in the transportation process is protected; the device testing tray 5 is internally provided with device testing butt joints which are connected with each device detection point, and the outer joints are connected with the automatic testing cabinets 2-2 to play a role of communicating with a bridge.

The second scanner 2-4 is used to scan the two-dimensional code on the device testing tray 5, the device testing tray 5 is loaded with the device to be tested before entering the conveying track 4, and the device information and the test content to be done are added to the two-dimensional code on the device testing tray 5. When the device testing disc 5 is transported to the position of the first limiting cylinder on the conveying track 4, the code scanner starts to scan the codes, reads the information of the two-dimensional codes and transmits the information to the control computer. The main function of the code scanner is to read and transmit the two-dimensional code information of the device testing disc 5.

Each full-automatic chip aging test and PCB shielding test machine 2 runs independently, so that an independent industrial personal computer is provided, and each full-automatic chip aging test and PCB shielding test machine is provided with a display screen support of a computer display screen machine, and the operation is convenient.

The conveying track 4 in the full-automatic chip aging test and PCB shielding test machine 2 is used for a front butt joint automatic feeding machine, a rear butt joint automatic blanking machine and a transportation device test disc 5. Two barriers, namely a first limiting cylinder and a second limiting cylinder, are arranged on the conveying track 4. The effect of first spacing cylinder is that the position that stops device test panel 5 stop at first spacing cylinder, makes things convenient for the two-dimensional code on bar code scanner reading device test panel 5 and. After the reading is finished, the first limiting cylinder is released, and the device testing disc 5 continues to advance to reach the position of the second limiting cylinder and is blocked by the second limiting cylinder. The computer needs to perform a current test at 150 ℃ for 4 hours and 0.2A according to information obtained by the code scanner, such as S devices, then sequentially selects the first non-working test cell 2-2-1 according to the arrangement sequence of the test cells 2-2-1, inputs test information, and sends an instruction to command the mechanical arm to move the device test tray 5 from the conveying track 4 to the test cell 2-2-1 to start testing. The tested device test disc 5 is conveyed to the rear end of the second limiting cylinder by the mechanical arm and is conveyed by the conveying track 4 to output the full-automatic chip aging test and PCB shielding test machine, the lower camera is added below the rear part of the limiting cylinder, and the lower camera is fixed below the track material disc. After the grabbing mechanism grabs the device test disc 5, the grabbed device test disc 5 is corrected through the camera unloading and the camera image comparison.

The X-axis horizontal moving mechanism in the second mechanical arm 2-3 adopts a linear motor as a power source, is fixed on a high platform of the machine metal plate 2-1, is connected with the Y-axis horizontal moving mechanism and is used for driving the Y-axis horizontal moving mechanism to do X-direction linear motion.

The Y-axis horizontal moving mechanism adopts a linear motor as a power source, is fixed on the X-axis horizontal moving mechanism, is connected with the Z-axis lifting mechanism and is used for driving the Z-axis lifting mechanism to do Y-direction horizontal movement.

The Z-axis lifting mechanism moves in a transmission mode of a motor gear and a gear bar, is fixed on the Y-axis horizontal movement mechanism, is connected with the grabbing mechanism and is used for driving the grabbing mechanism to do vertical linear movement.

The grabbing mechanism consists of a cylinder clamping device, a rotary motor and an upper camera and is fixed on the Z-axis lifting mechanism. The camera is used for positioning the position of the grabbed device test disc 5 and placing the grabbed device test disc at the position of the test unit cell 2-2-1; the cylinder clamping device is driven to rotate under the action of the rotating motor, and the angle of the cylinder clamping device is adjusted when the device testing disc 5 is grabbed and placed. The cylinder clamping device is used to clamp the device testing tray 5.

In practical applications, fig. 4 is a top view of the full-automatic chip burn-in test and PCB shield test feeding machine 3 provided by the present invention, and as shown in fig. 4, the full-automatic chip burn-in test and PCB shield test feeding machine 3 specifically includes: the device testing system comprises an automatic device blanking machine 3-1, a device testing disc discharging machine 3-2, a third code scanner 3-3 and a third mechanical arm;

The device testing disc discharging machine 3-2 is used for conveying the device testing disc 5 from the conveying track 4 to the device automatic discharging machine 3-1 through screw rod transmission; the automatic device blanking machine 3-1 comprises a second tray feeding bin 3-1-1, a second tray discharging bin 3-1-2 and a device discharging area 3-1-3; the second tray inlet bin 3-1-1 is arranged between the second tray outlet bin 3-1-2 and the device discharging area 3-1-3; the device discharging area 3-1-3 comprises a good product tray, a first defective product tray, a second defective product tray and a third defective product tray; the second tray inlet bin 3-1-1 is used for storing an empty tray of a tested device; the second tray outlet bin 3-1-2 is used for storing trays of devices which are fully loaded and tested; the device placing area 3-1-3 is an area for the third mechanical arm to grab the tested devices in the device testing tray 5; the automatic component blanking machine 3-1 is used for conveying empty trays of the second tray feeding bin 3-1-1 to a component discharging area 3-1-3, placing the tested components in the empty trays in the component discharging area 3-1-3 by the third mechanical arm, and conveying trays fully loaded with the tested components to the second tray discharging bin 3-1-2; the third code scanner 3-3 is arranged on the third mechanical arm; the third code scanner 3-3 is configured to scan the two-dimensional code on the device test tray 5, and send the device test information embedded in the two-dimensional code to the third industrial controller; and the third industrial controller determines the test result of the devices to be tested in the device test tray 5 according to the device test information, and controls the third mechanical arm to place the tested devices in the empty trays in the device placing areas 3-1-3 in a classified manner according to the device test result.

The automatic chip discharging machine consists of a second plate feeding bin 3-1-1, a second plate discharging bin 3-1-2 and a device discharging area 3-1-3. The device discharging area 3-1-3 is divided into a good product tray, a first defective product tray, a second defective product tray and a third defective product tray.

The second tray inlet bin 3-1-1 is used for placing empty trays for containing devices after the test is finished; the second tray outlet bin 3-1-2 is used for storing trays filled with devices finished in the test; the device placing area 3-1-3 is a position where the third mechanical arm is placed after grabbing the device. The automatic component blanking machine 3-1 conveys an empty tray in the tray bin to the component taking area 1-1-3, the third mechanical arm grabs the component and then places the component at the designated position of the component taking area 1-1-3, and after the component is placed, the tray full of the tested component is conveyed to the second tray bin 3-1-2. The automatic device feeding machine 1-1 comprises 4 tracks, and each track is provided with a second tray feeding bin 3-1-1; and the material outlet bin and the device taking area are 1-1-3, more than 20 trays can be placed in each material inlet bin, 4 tracks respectively correspond to a good product tray, a first defective product tray, a second defective product tray and a third defective product tray, and devices are classified and placed according to test results.

The parts test tray 5 is fed to the transfer rail 4 by the feeder, and receives the parts test tray 5 transferred by the transfer rail 4. The blanking machine of the device test tray 5 is provided with two bins, namely an NG bin of the device test tray and an empty bin of the device test tray, and the device test tray 5 is stored in the NG bin of the device test tray or the empty bin of the device test tray according to instructions transmitted by a computer.

The front end of a conveying track 4 in the full-automatic chip aging test and PCB shield test blanking machine 3 is in butt joint with the track of the full-automatic chip aging test and PCB shield test machine 2, and the rear end is in butt joint with a device test disc 5. The conveying track 4 is used for driving the device testing disc 5 flowing out from the full-automatic chip aging testing and PCB shielding testing machine 2 to move to a specified position, and the code scanner reads the two-dimensional code information on the device testing disc 5 at the position and captures the devices on the device testing disc 5 to the corresponding positions of the device placing areas 3-1-3 according to the two-dimensional code information in a classified mode. After the work is finished, the conveying track 4 continues to drive the device testing tray 5 to move downwards, and the device testing tray 5 is conveyed to the blanking machine of the device testing tray 5.

The third code scanner 3-3 is fixed with the Z axis of the third mechanical arm and moves along with the third mechanical arm; for scanning the two-dimensional code on the device test tray 5. After the device testing disc 5 reaches the designated position, the third code scanner 3-3 moves to the position above the two-dimensional code of the device testing disc 5, reads the two-dimensional code, and transmits the read information to the industrial personal computer to serve as a basis for material distribution.

Full-automatic chip aging testing and PCB shielding test blanking machine 3 independent motion has independent industrial computer, so have solitary display screen, and the operation of local can all be controlled through the computer display screen, and the real-time developments of work also can be looked over through the display screen, convenient and fast.

The third mechanical arm consists of an X axis; the Y-axis Z-axis and the rotating Z-axis are formed, the third mechanical arm moves to the device testing tray 5, the tested device is grabbed from the testing tray, and the device is conveyed to the designated position of the device placing area 3-1-3.

The conveying robot 6 is used for conveying the device test tray 5 of the device test tray empty tray bin to a specified position instead of manually emptying the device test tray empty tray bin; the empty disk warehouse of the device test disk can be emptied manually without an AGV.

A3D camera can be further arranged, and the 3D camera is fixed on a host bottom plate of the full-automatic chip aging test and PCB shielding test blanking machine 3 and used for detecting the appearance of a tested chip.

Based on the full-automatic chip aging test and PCB shielding test assembly line equipment provided by the invention, the invention can achieve the following effects:

each full-automatic chip aging test and PCB shielding tester 2 is provided with 24-60 test cells, 24-60 device test trays 5 can be tested simultaneously, and each device test tray 5 can be placed with 64 or more testable devices, so that the number of chips tested each time is enough to meet the test requirement.

The test seats on the device test tray 5 can be changed at will, so that different device tests can be performed at the same time. The waste of the use space of the test unit cell is avoided.

Each test cell of the full-automatic chip aging test and PCB shielding test machine 2 is independently powered, and test data content is independently stored. And a thermal insulation layer and a shielding layer are added between each test unit cell. Ensuring that each test cell can independently carry out different currents; different temperatures; aging test or shielding test at different humidity.

The grabbing mechanism of the full-automatic chip aging test and PCB shielding test machine 2 is provided with an X-direction moving mechanism and a Y-direction moving mechanism; a Z-axis lifting mechanism; and the grabbing mechanism. Each mechanism independently exists, the work is clear, the mechanism is simple, the assembly is easy, the maintenance is easy, and the replacement of accessories is convenient after the mechanism is used for a long time and has a fault. The main Y-direction moving mechanism and the X-axis moving mechanism are driven by linear motors and move accurately; muting; and (4) stabilizing. And the mechanism is high in integrity and cost performance.

The grabbing mechanism of the full-automatic chip aging test and PCB shielding test machine 2 is provided with a camera, so that the grabbing and placing positions can be automatically positioned, and the grabbing and placing precision is increased.

Each full-automatic chip aging test and PCB shielding test machine 2 independently exists, when a large number of devices which need to be tested for a long time are met, a plurality of full-automatic chip aging test and PCB shielding test machines 2 can be added behind one automatic feeding machine, two full-automatic chip aging test and PCB shielding test machines 2 are added, any full-automatic chip aging test and PCB shielding test machine 2 can be added according to the requirements of customers, and therefore the testing requirements of the customers for a large number of large time lengths are met.

The assembly line can be used for aging tests of electronic components besides aging tests of chips, such as triode aging tests and shielding tests of PCB modules of wireless communication.

The automatic chip discharging machine of the full-automatic chip aging test and PCB shielding test blanking machine 3 is provided with 4 material tray channels which can be set as good product trays for placing tested devices, a first defective product tray, a second defective product tray and a third defective product tray, and the devices with different reasons and test failures are placed in a classified mode according to different requirements. Therefore, the full-automatic chip aging test and PCB shielding test machine 2 can store the tested devices in various categories, and the test results of the devices can be stored in categories, so that the problem analysis in the later period is facilitated.

Each device test disc 5 is provided with a unique two-dimensional code, a code scanner is added to scan the two-dimensional code, the type and the number of chips placed on each device test disc 5, test contents and the like are independently stored, and test information reading and arrangement of the test contents are facilitated. The test chip is recorded and recorded on the corresponding two-dimensional code from the beginning, so that the disorder of test contents and test results is avoided. And collecting data; transmitting; the classification and the storage are both controlled by a computer, so that the possibility of inaccurate manual recording is avoided, and the test structure is more reliable.

The whole set of assembly line replaces the manual work to put into the test seat of device test dish 5 with test device, then puts into the test cell with device test dish 5 and tests, and the test is accomplished the back, takes out device test dish 5 and puts into appointed charging tray in, and is more efficient than the manual work promptly, again can be high-efficient errorless put the chip classification of different test results. The comprehensive automatic operation of chip testing is realized, and the operation of personnel is not required in the production line work.

Increase the 3D camera and detect on full-automatic chip aging testing and PCB shielding test blanking machine 3, through the image contrast of 3D camera, distinguish the device that causes the damage with device pin or outward appearance in the testing process, deposit alone, can make the bad reason subdivision more of device through the test, and than the accurate high efficiency of artifical letter sorting, be favorable to the bad analysis of later stage test.

The device test tray 5 of the full-automatic chip aging test and PCB shielding test feeding machine 1 after emptying has two storage bins, one empty tray bin of the device test tray and one NG bin. The empty tray bin of the device testing tray is used for placing the device testing tray 5 which reaches the standard in the testing process and finishes the cleaning of all devices in the tray, and the NG bin is used for placing the device testing tray 5 which fails in the testing process or cannot clean the chips in the testing tray due to the fact that the testing tray on the device testing tray 5 is damaged in long-term use. The device test tray 5 with normal functions is conveyed to a standby area or a loading machine through an AGV trolley, and cannot be normally used, and is stored firstly to be manually processed.

The full-automatic chip aging test and PCB shield test feeding machine 1 and the full-automatic chip aging test and PCB shield test blanking machine 3 are provided with AGV trolleys, the device test tray 5 is automatically loaded, the device test tray 5 is automatically removed, and manual operation is greatly reduced.

The specific working process of the invention comprises the following steps:

A) and adjusting the ground feet, butting the full-automatic chip aging test and PCB shielding test feeding machine 1, the full-automatic chip aging test and PCB shielding test machine 2 and the full-automatic chip aging test and PCB shielding test blanking machine 3, and connecting a power supply and an air pipe.

B) The full-automatic chip aging test and PCB shielding test feeding machine 1 needs to be independently adjusted to grab and place the point positions of the devices, the full-automatic chip aging test and PCB shielding test machine 2 grabs the point positions of the device test disc 5 and places the device test disc 5, the device grabbing point positions and the discharging point positions of the full-automatic chip aging test and PCB shielding test discharging machine 3 are saved, and the device grabbing point positions and the discharging point positions are saved without being adjusted and saved again in the later period.

C) Setting information such as the type and the number of devices to be tested on a display screen of the full-automatic chip aging test and PCB shielding test feeding machine 1; setting information such as device types and corresponding test contents on a display screen of each full-automatic chip aging test and PCB shielding test machine 2; and setting information such as device types, classification modes of the test data and storage positions of corresponding classified devices on a display screen of the full-automatic chip aging test and PCB shielding test blanking machine 3. And (5) storing.

D) The method comprises the steps of adding a device to be tested into a first tray feeding bin 1-1-1 of a full-automatic chip aging test and PCB shielding test feeding machine 1, adding a device test tray 5 into a device test tray empty bin by an AGV trolley, and adding an empty tray corresponding to the device into a second tray feeding bin 3-1-1 of a full-automatic chip aging test and PCB shielding test discharging machine 3.

E) The full-automatic chip aging test and PCB shielding test feeding machine 1 starts working, a device test disc 5 feeding machine sends the device test disc 5 into a conveying track 4, the conveying track 4 sends the device test disc 5 to a specified position, a code scanner moves to the position above the device test disc 5, two-dimensional codes are read and uploaded, and information such as types and quantity of devices to be placed is arranged and recorded. The device grabbing mechanism starts to grab the device from the device taking area and place the device into the test seat of the device test tray 5 until the test seats on the device test tray 5 are completely filled with chips. The conveying rail 4 drives the device testing tray 5 to flow down into the full-automatic chip aging testing and PCB shielding testing machine 2, and meanwhile, the device testing tray 5 is fed into the conveying rail 4 by the feeding machine of the device testing tray 5 again to repeat the previous work.

F) After the device test disc enters the full-automatic chip aging test and PCB shielding test machine 2, the two-dimensional code on the device test disc 5 is read through a code scanner, the contents such as device signals and the like on the device test disc 5 are identified, the computer compares the previously input test information, after the device test contents are confirmed, test cells are sequentially selected, a test information content instruction is issued, and the cylinder clamping jaw mechanism ascends on the Z axis; a Z-axis rotating mechanism; the X-axis linear horizontal mechanism is driven to move to a specified point position. Then the cylinder jaw mechanism is driven by the jaw rotating motor to rotate to a proper angle to grab the device testing disc 5. And after the test cell is picked, the test cell is carried to the upper part of the lower camera and is photographed by the upper camera, compared and adjusted in angle, and then carried to the upper part of the test cell. Before the device test disc 5 arrives, the test cell of the automatic test cabinet pops up, and the test cell is provided with a placing slot position of the device test disc 5. When the cylinder jack catch mechanism moves to the appointed placing position, the device testing disc 5 is put down, and the device testing disc 5 enters the corresponding notch of the testing unit grid. The test cell is recovered and closed, the joint in the cell is connected with the device test tray 5, and the device test tray 5 is in communication butt joint with the automatic test cabinet. After the temperature is changed to reach the set temperature value, the specified current is switched on to start timing test for the test period. And the automatic test cabinet records and stores test data of the periodic devices at the same time.

G) The E-F operation is repeated until all of the test cells are fully filled with the device test tray 5. During the period, the AGV trolley continuously conveys the empty device test tray 5 from the designated position to be placed into the empty tray bin of the device test tray of the full-automatic chip aging test and PCB shielding test feeding machine 1. When a plurality of full-automatic chip aging tests and PCB shielding test machines 2 are used together, when the first test table is full, the test table 5 of the device is not swept and intercepted any more, and the test table is directly released to the next full-automatic chip aging test and PCB shielding test machine 2. It is known that all test cells are fully populated with device test trays 5.

H) After the test cells are completely filled, the full-automatic chip aging test and PCB shield test feeding machine 1 receives the instruction of the full-automatic chip aging test and PCB shield test machine 2, does not transmit the device test tray 5 downwards any more, and starts to wait.

I) After the test of the device is completed by the test cell, the test cell is opened, the cylinder jaw mechanism grabs the device test disc 5 and carries the device test disc 5 to the conveying track 4, the conveying track 4 drives the device test disc 5 to move downwards, and meanwhile, the full-automatic chip aging test and PCB shielding test feeding machine 1 receives an instruction to start conveying the device test disc 5 to the full-automatic chip aging test and PCB shielding test machine needing the device test disc 5. When a plurality of full-automatic chip aging tests and PCB shielding testers 2 are arranged behind the test device, when each full-automatic chip aging test and PCB shielding tester 2 is reached, the two-dimensional codes on the lower device test disc 5 are read by the code scanner on the machine, and the tested device test disc 5 is found to be not grabbed any more and directly flow out to enter the next unit. Until the full-automatic chip aging test and PCB shielding test blanking machine 3 flows in.

J) After the full-automatic chip aging test and PCB shielding test blanking machine 3 flows into the device test disc 5, the device grabbing mechanism of the full-automatic chip aging test and PCB shielding test blanking machine 3 drives the code scanner to move above the two-dimensional code of the device test disc 5, the two-dimensional code on the device test disc 5 is read and transmitted to a computer host, the host reads the information of the two-dimensional code, and the test result of the device on the device test disc 5 and the position to be carried are confirmed. And the device grabbing mechanism continues to move to the corresponding test seat on the device test tray 5, the device in the grabbing test seat is placed at the corresponding position of the device placing area after being detected by the 3D camera, and the operation is repeated until all the devices in the device test tray 5 are taken out. The conveying track 4 starts to move, the empty device testing tray 5 is conveyed to the device testing tray blanking machine, the device testing tray 5 blanking machine starts to move, and the device testing tray is placed in the empty tray bin of the device testing tray. If it is a device test tray 5 in question, for example: the device can not be taken out or one or more test seats can not work, and the like, the blanking machine of the device test disk 5 carries the NG device test disk 5 to the NG bin of the device test disk under the control of the industrial personal computer, the device test disk 5 with the problems is stored in a certain amount and then alarms, and an operator processes the device test disk 5 with the problems according to the two-dimensional code information on the device test disk 5. The tray is filled with the devices, the automatic device blanking machine conveys the tray fully loaded with the devices into the tray outlet bin, and then the new empty tray is taken out from the tray inlet bin and conveyed to the device discharging area. Or until the device test tray 5 in the device test tray empty tray bin reaches the storage upper limit, the host machine can feed a signal to the AGV trolley, the trolley moves to the lower part of the device test tray empty tray bin, and the empty device test tray 5 is taken out and conveyed to a specified position.

K) And E-J operation is repeated, and all the devices needing to be tested are completely tested.

L) storing the tested electronic file test results of the devices in a classified mode, and finishing the device test.

The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.

The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.

Claims

1. The utility model provides a full-automatic chip aging testing and PCB shielding test assembly line equipment which characterized in that includes: the system comprises a first limiting cylinder, a second limiting cylinder, a full-automatic chip aging test and PCB shielding test feeding machine, a full-automatic chip aging test and PCB shielding test machine and a full-automatic chip aging test and PCB shielding test blanking machine;

the first industrial personal computer controls the first mechanical arm, picks up a device to be tested in the full-automatic chip aging test and PCB shielding test feeding machine, and sends the device to a device test disc, and the full-automatic chip aging test and PCB shielding test feeding machine conveys the device test disc to the conveying track through screw rod transmission and conveys the device to the full-automatic chip aging test and PCB shielding test machine through the conveying track; the second industrial personal computer controls the second mechanical arm to grab the device testing disc on the conveying track and places the device testing disc in an automatic testing cabinet of the full-automatic chip aging testing and PCB shielding testing machine to test a device to be tested of the device testing disc; after the test is finished, the second industrial personal computer controls the second mechanical arm to grab the device test disc in the automatic test cabinet, place the device test disc on the conveying track, and convey the device test disc to the full-automatic chip aging test and PCB shielding test blanking machine through the conveying track;

Full-automatic chip aging testing and PCB shielding test material loading machine specifically includes: the device automatic feeding machine, the device testing disc feeding machine, the first scanner and the first mechanical arm; the automatic device feeding machine is provided with 4 tracks, each track is provided with a first tray feeding bin, a first tray discharging bin and a device material taking area, and more than 20 trays of material trays are placed in each first tray feeding bin;

the device test tray is used for loading devices to be tested, each device test tray is provided with 64 or more device test seats for placing 64 or more test devices, each device test tray is independently provided with a two-dimensional code, and each test tray is marked;

the full-automatic chip aging test and PCB shielding test machine specifically comprises: the automatic testing device comprises a machine metal plate, an automatic testing cabinet, a second mechanical arm, a conveying track and a second code scanner;

the automatic test cabinet is provided with 24 test cells which are arranged in a horizontal row 4 x a vertical row 6, and each cell is provided with a thermometer and a timing display independently; each test cell independently controls temperature and independently times, each test cell independently supplies power, and different voltage and current are provided for the device test disc according to requirements for testing; each test cell of the automatic test cabinet can be independently and automatically opened and closed; each test cell is separated by a heat insulation layer and a shielding layer, so that each test cell is ensured to independently carry out aging or shielding test;

Setting information of the types and the number of devices to be tested on a display screen of a full-automatic chip aging test and PCB shielding test feeding machine; setting device types and corresponding test content information on a display screen of each full-automatic chip aging test and PCB shielding test machine; setting device types, classification modes of the test data and storage position information of corresponding classified devices on a display screen of a full-automatic chip aging test and PCB shielding test blanking machine, and storing the device types and the classification modes;

after the device test disc enters a full-automatic chip aging test and PCB shielding test machine, reading the two-dimensional code on the device test disc through a second code scanner, identifying the device model on the device test disc, comparing the previously input test information by a computer, and after confirming the test content of the device, sequentially selecting test cells and issuing a test information content instruction;

full-automatic chip aging test and PCB shielding test blanking machine specifically includes: the device automatic feeding machine, the device testing disc discharging machine, the third code scanner and the third mechanical arm; the automatic device blanking machine is provided with 4 tracks, each track is provided with a second tray feeding bin, a second tray discharging bin and a device discharging area, more than 20 trays can be placed in each tray feeding bin, the 4 tracks respectively correspond to a good tray, a first defective tray, a second defective tray and a third defective tray, and the devices are classified and placed according to the test result;

The 3D camera is fixed on a host bottom plate of the full-automatic chip aging test and PCB shielding test blanking machine and used for detecting the appearance of a tested chip;

the first limiting cylinder is arranged at a first position of a transmission track in the full-automatic chip aging test and PCB shielding test machine; the first limiting cylinder is electrically connected with the second industrial personal computer; the first limiting cylinder is used for blocking the device testing disc from transmitting and enabling the device testing disc to stay at the first position;

the second limiting cylinder is arranged at a second position of the conveying track in the full-automatic chip aging test and PCB shielding test machine; the second limiting cylinder is used for blocking the device testing disc from being transmitted, enabling the device testing disc to stay at the second position, and enabling the second mechanical arm to grab the device testing disc into the automatic testing cabinet;

the first mechanical arm specifically comprises: the device comprises an X-axis horizontal moving mechanism, a Y-axis horizontal moving mechanism, a Z-axis lifting mechanism and a grabbing mechanism; the X-axis horizontal moving mechanism, the Y-axis horizontal moving mechanism and the Z-axis lifting mechanism are mutually vertical;

the second mechanical arm and the third mechanical arm are both the same in structure as the first mechanical arm;

the grabbing mechanism specifically comprises: the device comprises a cylinder clamping device, a rotary motor and an upper camera;

2. The full-automatic chip aging test and PCB shielding test pipeline apparatus of claim 1, wherein the device automatic feeding machine comprises a first tray feeding bin, a first tray discharging bin and a device material taking area; the first tray inlet bin is arranged between the first tray outlet bin and the device taking area; the first tray inlet bin is used for placing the tray devices to be tested; the first tray outlet bin is used for storing empty trays which capture the devices to be tested; the device taking area is an area for the first mechanical arm to grab the device to be tested; the device automatic feeding machine is used for conveying a material tray which is fully loaded with the devices to be tested and is in the first tray feeding bin to the device taking area, the devices to be tested are placed in the device testing tray feeding machine through the first mechanical arm, and an empty material tray is conveyed into the first tray discharging bin;

3. The full-automatic chip aging test and PCB shielding test assembly line equipment of claim 2, wherein the automatic test cabinet is arranged inside the machine metal plate; a plurality of test cells are arranged on the automatic test cabinet; the test unit cell is used for testing a device to be tested in the device test tray;

the second code scanner is arranged on the machine metal plate and above the feeding end of the conveying track; the second code scanner is used for scanning the two-dimensional code on the device test disc and uploading the device test information on the two-dimensional code to a second industrial controller;

4. The fully automatic chip burn-in test and PCB shield test pipelining apparatus of claim 3, wherein the device test tray discharging machine is configured to transport the device test tray from the conveying track to the device automatic discharging machine through lead screw transmission;

The third code scanner is arranged on the third mechanical arm; the third code scanner is used for scanning the two-dimensional code on the device test disc and sending the device test information embedded in the two-dimensional code to a third industrial controller; and the third industrial controller determines the device test result of the devices to be tested in the device test tray according to the device test information, and controls the third mechanical arm to place the tested devices in the empty tray in the device placing area in a classified manner according to the device test result.

5. The fully automatic chip burn-in test and PCB shielding test pipeline apparatus according to any one of claims 1-4, wherein a plurality of test seats are arranged on the device test tray; one device to be tested is embedded in one test seat; the device is a chip, a triode or a PCB module;

6. The fully automatic chip burn-in test and PCB shield test pipeline apparatus of claim 1, further comprising: a transfer robot;