CN112445710B - Test method, test device and storage medium - Google Patents
Test method, test device and storage medium Download PDFInfo
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Abstract
The application relates to a test method, a test device and a storage medium, wherein the method comprises the following steps: acquiring a test request, wherein the test request comprises an object identifier of an object to be tested; searching a first test data set of the object to be tested from a preset test database according to the object identification; if the first test data set is searched for unsuccessfully, searching for the first test logic of the object to be tested from a preset test logic library according to the object identification; acquiring a first test parameter set of the object to be tested according to the first test logic; acquiring the first test data set according to the first test parameter set; and testing the object to be tested according to the first test data set. By adopting the embodiment of the application, the generation efficiency of the test data is improved, and the efficiency and the accuracy of the test are improved conveniently.
Description
Technical Field
The application relates to the technical field of block chains, and mainly relates to a testing method, a testing device and a testing medium.
Background
With the progress of computer science and technology and the rapid development of the software industry, the software testing work is more and more concerned by people. In actual practice, the full coverage of test data is an important condition for the success of the test. However, the generation of test data is cumbersome, repetitive and highly error prone. Therefore, how to improve the generation efficiency of the test data is a technical problem to be solved by those skilled in the art.
Disclosure of Invention
The embodiment of the application provides a test method, a test device and a storage medium, which can improve the generation efficiency of test data and are convenient for improving the comprehensiveness of the test.
In a first aspect, an embodiment of the present application provides a test method, where:
acquiring a test request, wherein the test request comprises an object identifier of an object to be tested;
searching a first test data set of the object to be tested from a preset test database according to the object identification;
if the first test data set is searched for unsuccessfully, searching for the first test logic of the object to be tested from a preset test logic library according to the object identification;
acquiring a first test parameter set of the object to be tested according to the first test logic;
acquiring the first test data set according to the first test parameter set;
and testing the object to be tested according to the first test data set.
In a second aspect, an embodiment of the present application provides a testing apparatus, wherein:
the storage unit is used for storing a test database and a test logic library;
the processing unit is used for acquiring a test request, and the test request comprises an object identifier of an object to be tested; searching the test data of the object to be tested from the test database according to the object identification; if the test data is searched for unsuccessfully, searching for the first test logic of the object to be tested from the test logic library according to the object identification; acquiring a first test parameter set of the object to be tested according to the first test logic; acquiring the first test data set according to the first test parameter set; and testing the object to be tested according to the first test data set.
In a third aspect, an embodiment of the present application provides another testing apparatus, including a processor, a memory, a communication interface, and one or at least one program, where the one or at least one program is stored in the memory and configured to be executed by the processor, and the program includes instructions for some or all of the steps described in the first aspect.
In a fourth aspect, the present application provides a computer-readable storage medium, where the computer-readable storage medium stores a computer program, where the computer program makes a computer execute to implement part or all of the steps described in the first aspect.
The embodiment of the application has the following beneficial effects:
after the test method, the test device and the storage medium are adopted, when a test request is received, a first test data set of an object to be tested is searched from a preset test database according to the object identification of the object to be tested. If the search fails, the test data of the object to be tested is not stored in the test database. And then, searching the first test logic of the object to be tested from a preset test logic library according to the object identification of the object to be tested. The first test logic is analyzed to obtain the first test parameter set, and the first test data set corresponding to the first test parameter set is obtained, so that the generation efficiency of the test data can be improved. And the test data is generated according to the first test parameter set corresponding to the first test logic, and the object to be tested is tested according to the first test data set, so that the efficiency and the accuracy of the test are improved conveniently.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Wherein:
fig. 1 is a schematic flowchart of a testing method according to an embodiment of the present disclosure;
FIG. 2 is a schematic flow chart of another testing method provided in the embodiments of the present application;
FIG. 3 is a schematic flow chart of another testing method provided in the embodiments of the present application;
fig. 4 is a schematic logic structure diagram of a testing apparatus according to an embodiment of the present disclosure;
fig. 5 is a schematic physical structure diagram of a testing apparatus according to an embodiment of the present disclosure.
Detailed Description
In order to make the technical solutions of the present application better understood, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art without any inventive work according to the embodiments of the present application are within the scope of the present application.
The terms "first," "second," and the like in the description and claims of the present application and in the above-described drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
The electronic device in the embodiment of the application may be a Personal Computer (PC), a notebook computer or a smart phone, and may also be an all-in-one machine, a palm computer, a tablet computer (pad), a smart television playing terminal, a vehicle-mounted terminal or a portable device.
In the embodiment of the application, information such as test cases, test logics, test parameters, test data, requirement documents and the like of different test objects can be stored in advance according to the object identification of the test objects.
Wherein a Test Case (Test Case) is a set of Test inputs, execution conditions, and expected results tailored for a particular target in order to Test a certain program path or verify whether a certain specific requirement is met. The test logic can be understood as a test script corresponding to a test method or a test step of a test case. Test parameters may be understood as data types of test data. Test data may be understood as input data of a test case and output data corresponding to an expected result.
The requirement document is a document in which a product project enters an implementation stage from a preparation stage, and the requirement document may include multiple categories, such as a requirement background, a requirement target, a feature list, main logic, a feature function point, a feature requirement, a performance requirement, data reporting, and a version number record, which are not limited herein.
The object identifier is used to describe identification information of the test object, and it should be noted that the object identifiers of the same test object in the test case, the test logic, the test parameters, the test data, and the requirement document are the same. The requirement document and the test case may include various formats such as a Word document, an Excel document, a Hypertext Markup Language (HTML) file, or an axle Rapid Prototyping (axle RP) file, which is not limited herein.
Optionally, according to the object identifier of the test object, all test cases are stored in the test case library in advance. Specifically, the test data and the test logic of the target object of the test case to be generated are obtained, the test case is generated according to the test data and the test logic, and the test case is stored in a preset test case library. It can be understood that when the test case library includes the test cases corresponding to the object identifiers, the search efficiency can be improved.
Optionally, according to the object identifier of the test object, all test logics are pre-stored in the test logic library, and all test data are pre-stored in the test database. It can be understood that, by separately storing the test logic and the test data, when the test logic is changed (for example, application functions are added or deleted), new test data can be generated through the test data corresponding to the test logic before being changed and the associated test data in the test database, so that the generation efficiency of the test data can be improved, the stability of the test can be improved, and the maintenance cost of the test work can be reduced.
The test cases, test logics, test parameters, test data, requirement documents and the like can also be stored in a block created on the block chain network. The blockchain is a novel application mode of computer technologies such as distributed data storage, point-to-point transmission, a consensus mechanism and an encryption algorithm. A block chain (Blockchain), which is essentially a decentralized database, is a series of data blocks associated by using a cryptographic method, and each data block contains information of a batch of network transactions, so as to verify the validity (anti-counterfeiting) of the information and generate a next block. The blockchain may include a blockchain underlying platform, a platform product services layer, and an application services layer. Therefore, data are stored in a distributed mode through the block chain, data security is guaranteed, and meanwhile data sharing of information among different platforms can be achieved.
The test method provided by the embodiment of the application can be executed by a test device, wherein the test device can be realized by software and/or hardware and can be generally integrated in electronic equipment, so that the generation efficiency of test data is improved, and the test efficiency and the test accuracy are improved conveniently.
Referring to fig. 1, fig. 1 is a schematic flow chart of a testing method provided in the present application. The method comprises the following steps S101 to S106, wherein:
s101: and acquiring a test request, wherein the test request comprises an object identifier of the object to be tested.
In this embodiment of the present application, the object to be tested may be a complete application system, an application program, or software, or may be an interface or an application function, and the form of the object to be tested may be a program code or a front-end application interface, and is not limited herein.
The test request may be obtained when the object under test fails (e.g., has not responded for a long time, has failed to respond, etc.); or the time is acquired according to a pre-established system test plan, wherein the system test plan can be established based on the completion degree, the time interval and the like of the system; or may be triggered manually, which may be understood as a test instruction sent by a tester, and the like, and is not limited herein.
The test request may include an object identifier of the object to be tested, where the object identifier in this embodiment of the application corresponds to the object to be tested one to one, and the object identifier may be a name, an account, a physical identifier, a network identifier, and the like, which is not limited herein. The test request may further include a test specification of the object to be tested, and the test specification may include a test evaluation index, for example, a coverage rate for describing a test range, an accuracy rate or precision rate for describing a test effect, a safety value for describing test safety, and the like, which are not limited herein.
S102: and searching a first test data set of the object to be tested from a preset test database according to the object identification.
In an embodiment of the application, the first set of test data comprises test data of the object under test. As previously described, all test data may be pre-stored in the test database. Therefore, the test data of the object to be tested is searched from the preset test database according to the object identification of the object to be tested, and the searching efficiency is improved.
S103: and if the first test data set is searched for unsuccessfully, searching for the first test logic of the object to be tested from a preset test logic library according to the object identification.
In this embodiment, the first test logic is a test logic of the object to be tested, and the test step of the object to be tested can be obtained through the first test logic. If the first test data set of the object to be tested is found out in the test database in a failure mode, the test database does not store the test data of the object to be tested, the first test logic of the object to be tested can be found out from a preset test logic library according to the object identification, and therefore the test data can be obtained according to the first test logic, and the diversity of the obtained test data is improved.
S104: and acquiring a first test parameter set of the object to be tested according to the first test logic.
In the embodiment of the present application, the first test parameter set includes test parameters of the object to be tested, which may be understood as a data type of the object to be tested, or a data type of the first test data. The method for obtaining the first test parameter set is not limited, and the program to be tested corresponding to the first test logic can be obtained, so that the test parameters are obtained according to the fields in the program to be tested; or the first test logic may be analyzed to obtain a test step, and then test parameters and the like are obtained according to fields in the test step, and then the obtained test parameters form a first test parameter set.
S105: a first set of test data is obtained according to the first set of test parameters.
In the embodiment of the present application, the first test data set includes at least two test data, which may be understood as at least one normal test data and at least one abnormal test data, and the number of the normal test data may be greater than or equal to the number of the abnormal test data. The method for acquiring the first test data set is not limited, and the first test data set can be acquired according to the data attribute information of each test parameter. The data attribute information may include a data type, and if the test parameter may be a numerical value, the data attribute information may further include a value range, and the like, which is not limited herein. The value range may be a numerical range of continuous data, or may include a set of discrete data. It should be noted that the discrete data may also be a numeric value converted from a word, for example, the product may be divided into two types, i.e., a pass and a fail, wherein the pass may be regarded as 1 and the fail may be regarded as 0. The value range includes a normal value range and an abnormal value range. That is, the test data includes normal test data and abnormal test data.
The input parameters of the test object can be 1 or more, and the value range of each input parameter comprises a plurality of values. If a test object has 6 input parameters, each parameter can take 4 values. In the case of full testing, design 4 is required 6 4096 test cases results in test data occupying a large amount of resources. Therefore, in the embodiment of the application, the test case can be obtained by adopting an orthogonal test method, and then the first test data set is obtained according to the test case, so that the test data can be reduced on the premise of effective test coverage, and the occupied resources can be reduced.
The orthogonal test method is a test design method for researching multiple factors and multiple levels, combines the levels selected by the orthogonal test and lists the levels into a table (called an orthogonal table), and designs the test by using the orthogonal table, so that the result equivalent to a large number of comprehensive tests can be achieved by using the least number of test times. The quantity affecting the test result is called a test factor, which may be referred to as a factor for short. The factors can be understood as independent variables during the test, and the test result can be regarded as a function of the factors. During the testing process, each factor may be in a different state or condition, and the state or condition in which the factor is located is referred to as the level of the factor, which may be referred to as the level.
The number of rows (Runs) in the orthogonal table refers to the number of rows in the orthogonal table, i.e., the number of tests, and also refers to the number of test cases designed by the orthogonal experimental method. The number of Factors (Factors) in the orthogonal table refers to the number of columns in the orthogonal table, i.e., the functional points to be tested. The number of factors is greater than or equal to the number of variables in the test, which is understood to be the number of factors greater than or equal to the number of first test parameters. In an embodiment of the present application, the factor may be a first test parameter. The level numbers (Levels) in the orthogonal table refer to the maximum number of values that any single factor can take, i.e., the input values of the function points to be tested. The number of test cases designed by the orthogonal test method can be calculated by the following formula (1):
n＝c*(s-1)+1 (1)
wherein n is the number of test cases, c is the number of factors, and s is the number of levels.
Designing a test case by adopting an orthogonal experimental method, comprising the following steps A1-A5, wherein:
a1: determining a factor;
a2: determining the value range of the factors;
a3: determining the level of the factor according to the value range of the factor;
a4: filling an orthogonal table according to the factors and the levels of the factors;
a5: and obtaining a test case according to the orthogonal table.
The level of the factors can adopt equivalent class division, boundary value analysis and other software testing technologies, and representative test values such as valid equivalent classes, invalid equivalent classes, just equal to, just larger than or just smaller than the boundary value and the like are selected in the value range of each factor. The test case may be obtained from the table with the least number of rows.
For example, when a university communication system has two classes, 1 class and 2 classes, and a class is just taken into account, the college communication system wants to perform a personnel query on the score distribution, male and female ratio or class ratio of the class of the communication system according to three query conditions, namely ' gender ', ' class ' and ' score. The sex, the class and the score are factors, the sex takes the value of a male and a female, the class takes the value of 1 class and 2 classes, and the score takes the value of passing and failing, namely, each factor has two values, namely, the level value s is 2. As shown in table (1) below, the number of test cases obtained by taking the number of rows as the smallest one with a prime number of 3 is 3 × (2-1) +1 ═ 4, as shown in table (2). If a full test is used, design 2 is required 3 As can be seen, the number of test cases, i.e., the number of test data, is reduced, so that the occupied resources can be reduced.
TABLE 1
| Sex | Class | Achievement | |
| Level 1 | For male | 1 class | Passing and lattice |
| Level 2 | Woman | 2 class | Failing to meet the specification |
TABLE 2
In the embodiment of the present disclosure, the test case corresponding to the first test parameter may be obtained by an orthogonal test method, and then the test data may be obtained according to the test case, so that the number of the test cases may be reduced, that is, the number of the test data may be reduced, and thus the occupied resources may be reduced.
The method for obtaining the first test data set is not limited in the present application, and a first test parameter in the first test parameter set is used as an example, where the first test parameter is any one of the test parameters in the first test parameter set. In one possible example, step S105 includes the following steps B1-B5, wherein:
b1: and acquiring a first value range of the first test parameter.
The test parameters themselves have a range of values, for example, 0-120 years of age, male or female gender, occupation including doctors, nurses, inspectors, engineers, lawyers, students, teachers, and so on. The first value range of the first test parameter refers to the value range of the first test parameter itself, i.e. is independent of the first test logic.
B2: and if the second test parameter in the first test parameter set is associated with the first test parameter, acquiring a first constraint condition between the first test parameter and the second test parameter according to the first test logic.
The correlation between the second test parameter and the first test parameter means that the second test parameter and the first test parameter are constrained with each other, and it can be understood that the value range of the second test parameter affects the value of the first test parameter. The method for determining whether the first test parameter set exists in the second test parameter of the first test parameter is not limited in the present application, and the determination may be performed according to a data type between the first test parameter and the second test parameter, or the first sub-test logic of the first test parameter may be searched from the first test logic, and it is determined whether the first sub-test logic includes the second test parameter, and the like.
The first constraint condition is used for describing constraint information of the first test parameter and the second test parameter in the first test logic. The present application is also not limited to the method for obtaining the first constraint, and in a possible example, the step B2 includes the following steps C1 to C4, where:
c1: and acquiring a first incidence relation between the first test parameter and the second test parameter.
The first incidence relation refers to the incidence relation between the first test parameter and the second test parameter, namely, the first incidence relation is not related to the first test logic.
C2: and acquiring a first sub-test logic corresponding to the first test parameter in the first test logic and a second sub-test logic corresponding to the second test parameter.
C3: and acquiring a second incidence relation between the first test parameter and the second test parameter according to the first sub-test logic and the second sub-test logic.
The first sub-test logic is a test logic of which the first test logic comprises first test parameters, and the second sub-test logic is a test logic of which the first test logic comprises second test parameters. The second correlation is the correlation between the first test parameter and the second test parameter in the test logic of the object to be tested. It can be understood that, according to the first sub-test logic and the second sub-test logic, the association relationship between the first test parameter and the second test parameter in the test logic of the object to be tested, that is, the second association relationship, can be obtained.
C4: and acquiring a first constraint condition between the first test parameter and the second test parameter according to the first incidence relation and the second incidence relation.
The method for obtaining the first constraint condition according to the first association relationship and the second association relationship is not limited in the present application, and the obtaining is performed according to an intersection portion or an association range between the first association relationship and the second association relationship, for example, when the first association relationship and the second association relationship are the first association value and the second association value respectively, the first constraint condition may be obtained according to a minimum value or a maximum value between the first association value and the second association value, or a weighted average value.
It can be understood that, in steps C1 to C4, the first association relationship between the first test parameter and the second test parameter itself is obtained, and then the second association relationship in the first test logic is obtained according to the first sub-test logic corresponding to the first test parameter in the first test logic and the second sub-test logic corresponding to the second test parameter. And finally, acquiring the first constraint condition according to the first incidence relation and the second incidence relation, so that the accuracy of acquiring the first constraint condition can be improved.
B3: and updating the first value range according to the first constraint condition to obtain a second value range of the first test parameter.
It will be appreciated that the test parameters have certain limitations in different application scenarios, for example, in hospital application scenarios, the careers include doctors, nurses, inspectors, etc. In this example, the first value range is updated according to the first constraint condition, so that the second value range can be obtained, and the accuracy of obtaining the value range is improved.
B4: and filling the orthogonal table corresponding to the first test parameter according to the second value range.
B5: and acquiring a first test data set according to the orthogonal table corresponding to each test parameter in the first test parameter set.
The method for obtaining the orthogonal table corresponding to the first test parameter is not limited, and the orthogonal processing can be performed on the second value range of different first test parameters according to an orthogonal test method, that is, the second value range includes the number of horizontal values of the number of values, and the corresponding numerical values can be represented by 0, 1 and 2, so that the orthogonal table is filled, and finally, the test case is obtained based on the orthogonal table corresponding to each orthogonal table, and the corresponding test data is obtained.
It is understood that, in steps B1 to B5, a first value range of the first test parameter is obtained first, and if there is a second test parameter associated with the first test parameter, a first constraint between the first test parameter and the second test parameter is obtained. And then updating the first value range according to the first constraint condition to obtain a second value range. That is, based on the constraint conditions in the test logic, the value range of the test parameters is updated, and the accuracy of obtaining the test data can be improved. And then filling an orthogonal form corresponding to the first test parameter according to the second value range, and acquiring the first test data set according to the orthogonal form, so that test data can be reduced under the condition of effective coverage, the occupied resources are reduced, and the test efficiency can be improved.
In another possible example, after step B1, before step B5, the method includes the following steps D1-D3, wherein:
d1: and if the first test parameter set does not comprise the second test parameter, acquiring a first sub-test logic corresponding to the first test parameter in the first test logic.
D2: and acquiring a second constraint condition of the first test parameter according to the first sub-test logic.
D3: and filling the orthogonal table corresponding to the first test parameter according to the second constraint condition and the first value range of the first test parameter.
The step of obtaining the first sub-test logic may refer to step C2, which is not described herein again. The second constraint condition is used for describing constraint information of the first test parameter in the first test logic, namely a limited condition of the first test parameter in the test logic.
It can be understood that when the second test parameter is not included in the first test parameter set, the first test parameter is an independent parameter, and the value range of the other first test parameters does not affect the value of the first test parameter. Therefore, a first sub-test logic corresponding to the first test parameter in the first test logic is directly obtained, and then a second constraint condition of the first test parameter is obtained according to the first sub-test logic. And finally, filling the orthogonal tables corresponding to the first test parameters according to the second constraint conditions and the first value ranges of the first test parameters, and acquiring the first test data set according to the orthogonal tables corresponding to the first test parameters. That is, the test data is obtained based on the value range of the test parameter itself and the constraint condition in the test logic, so that the accuracy of obtaining the test data can be improved.
S106: and testing the object to be tested according to the first test data set.
In the method shown in fig. 1, when a test request is received, a first test data set of an object to be tested is searched from a preset test database according to an object identifier of the object to be tested. If the search fails, the test data of the object to be tested is not stored in the test database. And then, searching the first test logic of the object to be tested from a preset test logic library according to the object identification of the object to be tested. The first test logic is analyzed to obtain the first test parameter set, and the first test data set corresponding to the first test parameter set is obtained, so that the generation efficiency of the test data can be improved. And the test data is generated according to the test parameters corresponding to the test logic, and the object to be tested is tested according to the first test data set, so that the test efficiency and the test accuracy are improved conveniently.
Referring to fig. 2, fig. 2 is a schematic flow chart of another testing method provided in the present application, consistent with the embodiment of fig. 1. This aspect includes the following steps S201 to S209, wherein:
s201: and acquiring a test request, wherein the test request comprises an object identifier of the object to be tested.
S202: and searching a first test data set of the object to be tested from a preset test database according to the object identification.
S203: and if the first test data set is searched for unsuccessfully, searching for the first test logic of the object to be tested from a preset test logic library according to the object identification.
S204: and acquiring a first test parameter set of the object to be tested according to the first test logic.
The descriptions of steps S101 to S104 can be referred to in steps S201 to S204, which are not described herein again.
S205: second test logic similar to the first test logic is looked up from the test logic library.
In the embodiment of the present application, the second test logic is similar to the first test logic, which means that there are many steps in the second test logic and the first test logic. The method for searching for the second test logic is not limited in the present application, and the second test logic similar to the first test logic may be searched for in the test logic library based on the first test parameter. It can be understood that when the second test logic is similar to the first test logic, similar test parameters are necessarily existed, and the second test logic is searched according to the first test parameters, so that the searching accuracy can be improved. Or the search can be performed based on the test step corresponding to the first test logic, and it can be understood that when the second test logic is similar to the first test logic, similar test steps inevitably exist, and the second test logic is directly searched according to the test steps, so that the search accuracy can be improved.
In one possible example, step S205 includes: obtaining a test step corresponding to the first test logic; a second test logic similar to the first test logic is looked up from the library of test logics according to the testing step and the first set of test parameters.
The method for searching for the second test logic by the test step and the first test parameter is not limited, and optionally, the test logic including the first test parameter in the test logic library is used as a third test logic; acquiring a first ratio between a first test parameter included in the third test logic and all test parameters; a second ratio between the test step of the third test logic and the test step corresponding to the first test logic is calculated; obtaining a similarity value of the third test logic according to the first ratio and the second ratio; and if the similarity value is preset with a threshold value, determining that the third test logic is the second test logic. The preset threshold is not limited, and is, for example, 0.8. That is, the third test logic is selected according to the test parameters, and then the similarity value between each third test logic and the first test logic is obtained from the two aspects of the test parameters and the test steps, so that the second test logic is selected according to the similarity value, and the accuracy of searching the second test logic can be improved.
It will be appreciated that when the second test logic is similar to the first test logic, there must be similar test steps and similar test parameters, so that in this example, searching for the second test logic based on the test steps and the first test parameters may improve the accuracy of the search.
S206: and if the test database comprises a second test data set corresponding to the second test logic, acquiring a second test parameter set corresponding to the second test data set.
S207: and comparing the first test parameter set with the second test parameter set to obtain a third test parameter and/or a fourth test parameter.
In this embodiment of the application, the second test parameter set includes test parameters corresponding to the second test data set, which may be understood as a data type corresponding to the second test data, and may also be understood as a data type required by the second test logic to execute. The second test parameter is the same test parameter between the first test parameter set and the second test parameter set, and the fourth test parameter is different test parameters between the first test parameter set and the second test parameter set, which may be understood as the fourth test parameter is a parameter existing in the first test parameter set but not existing in the second test parameter set, or may be a parameter not existing in the first test parameter set but existing in the second test parameter set, and is not limited herein.
S208: and processing the second test data set according to the third test parameter and/or the fourth test parameter to obtain the first test data set.
It can be understood that, if the first test parameter and the first test parameter have the same second test parameter and different fourth test parameters, the test data corresponding to the fourth test parameter can be added or deleted on the basis of the second test parameter, so that the efficiency of obtaining the test data can be improved.
For example, the first test logic and the second test logic are both applications of identity authentication, in the first test logic, the account and the password are authenticated, in the second test logic, the authentication code is authenticated first, and if the authentication is successful, the account and the password are authenticated. And the first test parameters of the first test logic are an account and a password, and the first test parameters of the second test logic are the account, the password and a verification code. It can be seen that the second test parameter is the account and the password, the fourth test parameter is the verification code, and no influence is caused between the fourth test parameter and the second test parameter. And deleting the data corresponding to the verification code in the second test data corresponding to the second test logic to obtain the first test data. Through the steps, the efficiency of generating the test data can be improved.
S209: and testing the object to be tested according to the first test data set.
In the method shown in fig. 2, when a test request is received, a first test data set of an object to be tested is searched from a preset test database according to an object identifier of the object to be tested. If the search fails, the test data of the object to be tested is not stored in the test database. And then, searching the first test logic of the object to be tested from a preset test logic library according to the object identification of the object to be tested. And searching whether a second test logic similar to the first test logic exists in the test logic library, wherein the test database comprises a second test data set corresponding to the second test logic. If so, comparing the first test parameter set with a second test parameter set corresponding to the second test data set to obtain a third test parameter which is the same between the first test parameter set and the second test parameter set and/or a fourth test parameter which is different between the first test parameter set and the second test parameter set. And then, processing the second test data set according to the third test parameter and/or the fourth test parameter to obtain the first test data set. That is, new test data is generated based on previously generated test data, and the efficiency of generating test data can be further improved. And testing the object to be tested according to the first test data set, so that the efficiency and the accuracy of the test are improved conveniently.
Referring to fig. 3, fig. 3 is a schematic flow chart of another testing method provided in the present application, consistent with the embodiments of fig. 1 and fig. 2. This aspect includes steps S301 to S307, wherein:
s301: and acquiring a test request, wherein the test request comprises an object identifier of the object to be tested.
S302: and searching the test data of the object to be tested from a preset test database according to the object identification.
S303: and if the test data is failed to be searched, searching the first test logic of the object to be tested from a preset test logic library according to the object identification.
The descriptions of steps S101 to S103 can be referred to in steps S301 to S303, and are not repeated herein.
S304: and if the first test logic is found to be failed, acquiring the function to be tested of the object to be tested.
In the embodiment of the present application, the function to be tested is used to describe an application function to be tested of the object to be tested. The method for acquiring the function to be tested is not limited, and the function to be tested can be acquired by identifying through a user interface of the object to be tested. It can be understood that the text characters and the component elements in the user interface can be obtained through a character recognition mode, and then the application functions corresponding to all the text characters and the component elements are determined, so that the function to be tested of the object to be tested is obtained.
The function to be tested can also be obtained by analyzing the program to be tested. The program to be tested is a program of an object to be tested. The program to be tested is used for describing the execution flow and the test function of the object to be tested, and it can be understood that the function to be tested and the test step of the object to be tested can be obtained by analyzing the program to be tested, so that the accuracy of obtaining the test parameters and the test logic is improved.
S305: and acquiring a first test parameter set of the object to be tested according to the function to be tested.
S306: a first set of test data is obtained according to the first set of test parameters.
S307: and testing the object to be tested according to the first test data set.
In the method shown in fig. 3, when a test request is received, a first test data set of an object to be tested is searched from a preset test database according to an object identifier of the object to be tested. If the search fails, the test data of the object to be tested is not stored in the test database. And then, searching the first test logic of the object to be tested from a preset test logic library according to the object identification of the object to be tested. If the search fails, the function to be tested of the object to be tested is obtained, and the first test parameter set is obtained according to the function to be tested. That is, when neither the test logic nor the test data is found, the test parameters can be obtained through the function to be tested of the object to be tested. And finally, the first test data set is obtained according to the first test parameter set, so that the generation efficiency of the test data is improved. And the test data is generated according to the test parameters corresponding to the test logic, and the object to be tested is tested according to the first test data set, so that the test efficiency and the test accuracy are improved conveniently.
The method of the embodiments of the present application is set forth above in detail and the apparatus of the embodiments of the present application is provided below.
Referring to fig. 4, fig. 4 is a schematic structural diagram of a testing apparatus according to the present application, and as shown in fig. 4, the testing apparatus 400 includes:
a storage unit 402, configured to store a test database and a test logic library;
a processing unit 401, configured to obtain a test request, where the test request includes an object identifier of an object to be tested; searching the test data of the object to be tested from the test database according to the object identification; if the test data is searched for unsuccessfully, searching for the first test logic of the object to be tested from the test logic library according to the object identification; acquiring a first test parameter set of the object to be tested according to the first test logic; acquiring the first test data set according to the first test parameter set; and testing the object to be tested according to the first test data set.
In a possible example, the processing unit 401 is specifically configured to obtain a first value range of a first test parameter, where the first test parameter is any one first test parameter in the first test parameter set; if a second test parameter in the first test parameter set is associated with the first test parameter, acquiring a first constraint condition between the first test parameter and the second test parameter according to the first test logic; updating the first value range of the first test parameter according to the first constraint condition to obtain a second value range of the first test parameter; filling an orthogonal table corresponding to the first test parameter according to the second value range; and acquiring the first test data set according to the orthogonal table corresponding to each first test parameter in the first test parameter set.
In a possible example, the processing unit 401 is specifically configured to obtain a first association relationship between the first test parameter and the second test parameter; acquiring a first sub-test logic corresponding to the first test parameter in the first test logic and a second sub-test logic corresponding to the second test parameter; acquiring a second incidence relation between the first test parameter and the second test parameter according to the first sub-test logic and the second sub-test logic; and acquiring a first constraint condition between a first test parameter and a second test parameter according to the first incidence relation and the second incidence relation.
In a possible example, the processing unit 401 is further configured to, if the second test parameter is not included in the first test parameter set, obtain a first sub-test logic corresponding to the first test parameter in the first test logic; acquiring a second constraint condition of the first test parameter according to the first sub-test logic; and filling an orthogonal table corresponding to the first test parameter according to the second constraint condition and the first value range.
In one possible example, the processing unit 401 is further configured to look up a second test logic similar to the first test logic from the test logic library; if the test database comprises a second test data set corresponding to the second test logic, acquiring a second test parameter set corresponding to the second test data set; comparing the first test parameter set with the second test parameter set to obtain a third test parameter and/or a fourth test parameter, wherein the third test parameter is the same test parameter between the first test parameter set and the second test parameter set, and the fourth test parameter is different test parameters between the first test parameter set and the second test parameter set; and processing the second test data set according to the third test parameter and/or the fourth test parameter to obtain the first test data set.
In a possible example, the processing unit 401 is specifically configured to obtain a test step corresponding to the first test logic; and searching a second test logic similar to the first test logic from the test logic library according to the test step and the first test parameter set.
In a possible example, the processing unit 401 is further configured to obtain a function to be tested of the object to be tested if the first test logic fails to find; and acquiring the first test parameter set according to the function to be tested.
For the detailed process executed by each unit in the testing apparatus 400, reference may be made to the execution steps in the foregoing method embodiments, which are not described herein again.
Referring to fig. 5, fig. 5 is a schematic structural diagram of another testing apparatus according to an embodiment of the present disclosure, which is identical to the embodiments shown in fig. 1 to fig. 3. As shown in fig. 5, the testing device 500 includes a processor 510, a memory 520, a communication interface 530, and one or more programs 540. The related functions implemented by the storage unit 402 shown in fig. 4 may be implemented by the memory 520, and the related functions implemented by the processing unit 401 shown in fig. 4 may be implemented by the processor 510.
The one or more programs 540 are stored in the memory 520 and configured to be executed by the processor 510, the programs 540 including instructions for:
acquiring a test request, wherein the test request comprises an object identifier of an object to be tested;
searching a first test data set of the object to be tested from a preset test database according to the object identification;
if the first test data set is searched for unsuccessfully, searching for the first test logic of the object to be tested from a preset test logic library according to the object identification;
acquiring a first test parameter set of the object to be tested according to the first test logic;
acquiring the first test data set according to the first test parameter set;
and testing the object to be tested according to the first test data set.
In one possible example, in the aspect of obtaining the first set of test data according to the first set of test parameters, the program 540 is specifically configured to execute the following steps:
acquiring a first value range of a first test parameter, wherein the first test parameter is any one test parameter in the first test parameter set;
if a second test parameter in the first test parameter set is associated with the first test parameter, acquiring a first constraint condition between the first test parameter and the second test parameter according to the first test logic;
updating the first value range of the first test parameter according to the first constraint condition to obtain a second value range of the first test parameter;
filling an orthogonal table corresponding to the first test parameter according to the second value range;
and acquiring the first test data set according to the orthogonal table corresponding to each test parameter in the first test parameter set.
In one possible example, in terms of obtaining the first constraint between the first test parameter and the second test parameter according to the first test logic, the program 540 is specifically configured to execute the following steps:
acquiring a first incidence relation between the first test parameter and the second test parameter;
acquiring a first sub-test logic corresponding to the first test parameter in the first test logic and a second sub-test logic corresponding to the second test parameter;
acquiring a second incidence relation between the first test parameter and the second test parameter according to the first sub-test logic and the second sub-test logic;
and acquiring a first constraint condition between a first test parameter and a second test parameter according to the first incidence relation and the second incidence relation.
In one possible example, after the obtaining the first range of values of the first test parameter, before the obtaining the first test data set according to the orthogonal table corresponding to each test parameter in the first test parameter set, the program 540 is further configured to execute the following steps:
if the first test parameter set does not include the second test parameter, acquiring a first sub-test logic corresponding to the first test parameter in the first test logic;
acquiring a second constraint condition of the first test parameter according to the first sub-test logic;
and filling an orthogonal table corresponding to the first test parameter according to the second constraint condition and the first value range.
In one possible example, after the obtaining the first set of test parameters of the object under test according to the first test logic, the program 540 is further configured to execute the following steps:
searching a second test logic similar to the first test logic from the test logic library;
if the test database comprises a second test data set corresponding to the second test logic, acquiring a second test parameter set corresponding to the second test data set;
comparing the first test parameter set with the second test parameter set to obtain a third test parameter and/or a fourth test parameter, wherein the third test parameter is the same test parameter between the first test parameter set and the second test parameter set, and the fourth test parameter is different test parameters between the first test parameter set and the second test parameter set;
and processing the second test data set according to the third test parameter and/or the fourth test parameter to obtain the first test data set.
In one possible example, in the aspect of searching the test logic library for the second test logic similar to the first test logic, the program 540 is specifically configured to execute the instructions of:
obtaining a test step corresponding to the first test logic;
and searching a second test logic similar to the first test logic from the test logic library according to the test step and the first test parameter set.
In one possible example, after the first test logic of the object to be tested is searched from a preset test logic library according to the object identifier, the program 540 is further configured to execute the following steps:
if the first test logic search fails, acquiring a function to be tested of the object to be tested;
and acquiring the first test parameter set according to the function to be tested.
Embodiments of the present application also provide a computer storage medium, where the computer storage medium stores a computer program for causing a computer to execute to implement part or all of the steps of any one of the methods described in the method embodiments, and the computer includes an electronic device.
Embodiments of the application also provide a computer program product comprising a non-transitory computer readable storage medium storing a computer program operable to cause a computer to perform to implement some or all of the steps of any of the methods recited in the method embodiments. The computer program product may be a software installation package and the computer comprises the electronic device.
It should be noted that, for simplicity of description, the foregoing method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present application is not limited by the order of acts, as some steps may occur in other orders or concurrently depending on the application. Further, those skilled in the art will also appreciate that the embodiments described in this specification are presently preferred and that no particular act or mode of operation is required in the present application.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the above-described embodiments of the apparatus are merely illustrative, and for example, a division of a unit is merely a logical division, and an actual implementation may have another division, for example, at least one unit or component may be combined or integrated with another system, or some features may be omitted, or not executed. In addition, the shown or discussed coupling or direct coupling or communication connection between each other may be through some interfaces, indirect coupling or communication connection between devices or units, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may also be distributed on at least one network unit. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a hardware mode or a software program mode.
The integrated unit, if implemented in the form of a software program module and sold or used as a stand-alone product, may be stored in a computer readable memory. With such an understanding, the technical solution of the present application may be embodied in the form of a software product, which is stored in a memory and includes several instructions for causing a computer device (which may be a personal computer, a server, a network device, or the like) to perform all or part of the steps of the method according to the embodiments of the present application. And the aforementioned memory comprises: various media capable of storing program codes, such as a usb disk, a read-only memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and the like.
Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by associated hardware instructed by a program, which may be stored in a computer-readable memory, which may include: flash disk, ROM, RAM, magnetic or optical disk, and the like.
The foregoing detailed description of the embodiments of the present application has been presented to illustrate the principles and implementations of the present application, and the above description of the embodiments is only provided to help understand the method and the core concept of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (9)
1. A method of testing, comprising:
acquiring a test request, wherein the test request comprises an object identifier of an object to be tested;
searching a first test data set of the object to be tested from a preset test database according to the object identification;
if the first test data set is searched for unsuccessfully, searching for the first test logic of the object to be tested from a preset test logic library according to the object identification;
acquiring a first test parameter set of the object to be tested according to the first test logic;
acquiring a first value range of a first test parameter, wherein the first test parameter is any one test parameter in the first test parameter set;
if a second test parameter in the first test parameter set is associated with the first test parameter, acquiring a first constraint condition between the first test parameter and the second test parameter according to the first test logic;
updating the first value range of the first test parameter according to the first constraint condition to obtain a second value range of the first test parameter;
filling an orthogonal table corresponding to the first test parameter according to the second value range;
acquiring the first test data set according to the orthogonal table corresponding to each test parameter in the first test parameter set;
and testing the object to be tested according to the first test data set.
2. The method of claim 1, wherein obtaining a first constraint between the first test parameter and the second test parameter according to the first test logic comprises:
acquiring a first incidence relation between the first test parameter and the second test parameter;
acquiring a first sub-test logic corresponding to the first test parameter in the first test logic and a second sub-test logic corresponding to the second test parameter;
acquiring a second incidence relation between the first test parameter and the second test parameter according to the first sub-test logic and the second sub-test logic;
and acquiring a first constraint condition between a first test parameter and a second test parameter according to the first incidence relation and the second incidence relation.
3. The method of claim 1, wherein after the obtaining the first range of values of the first test parameter, before the obtaining the first test data set according to the orthogonal table corresponding to each test parameter in the first test parameter set, the method further comprises:
if the first test parameter set does not include the second test parameter, acquiring a first sub-test logic corresponding to the first test parameter in the first test logic;
acquiring a second constraint condition of the first test parameter according to the first sub-test logic;
and filling an orthogonal table corresponding to the first test parameter according to the second constraint condition and the first value range.
4. The method of any of claims 1-3, wherein after said obtaining the first set of test parameters for the object under test according to the first test logic, the method further comprises:
searching a second test logic similar to the first test logic from the test logic library;
if the test database comprises a second test data set corresponding to the second test logic, acquiring a second test parameter set corresponding to the second test data set;
comparing the first test parameter set with the second test parameter set to obtain a third test parameter and/or a fourth test parameter, wherein the third test parameter is the same test parameter between the first test parameter set and the second test parameter set, and the fourth test parameter is different test parameters between the first test parameter set and the second test parameter set;
and processing the second test data set according to the third test parameter and/or the fourth test parameter to obtain the first test data set.
5. The method of claim 4, wherein said searching for a second test logic similar to said first test logic from said library of test logics comprises:
obtaining a test step corresponding to the first test logic;
and searching a second test logic similar to the first test logic from the test logic library according to the test step and the first test parameter set.
6. The method according to any of claims 1-3, wherein after said searching for the first test logic of the object to be tested from a preset test logic library according to the object identifier, the method further comprises:
if the first test logic search fails, acquiring a function to be tested of the object to be tested;
and acquiring the first test parameter set according to the function to be tested.
7. A test apparatus, comprising:
the storage unit is used for storing a test database and a test logic library;
the processing unit is used for acquiring a test request, and the test request comprises an object identifier of an object to be tested; searching the test data of the object to be tested from the test database according to the object identification; if the test data is searched for unsuccessfully, searching for the first test logic of the object to be tested from the test logic library according to the object identification; acquiring a first test parameter set of the object to be tested according to the first test logic; acquiring a first value range of a first test parameter, wherein the first test parameter is any one test parameter in the first test parameter set; if a second test parameter in the first test parameter set is associated with the first test parameter, acquiring a first constraint condition between the first test parameter and the second test parameter according to the first test logic; updating the first value range of the first test parameter according to the first constraint condition to obtain a second value range of the first test parameter; filling an orthogonal table corresponding to the first test parameter according to the second value range; acquiring the first test data set according to the orthogonal table corresponding to each test parameter in the first test parameter set; and testing the object to be tested according to the first test data set.
8. A test apparatus comprising a processor, a memory, a communication interface, and one or at least one program, wherein the one or at least one program is stored in the memory and configured to be executed by the processor, the program comprising instructions for performing the steps in the method of any of claims 1-6.
9. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program, the computer program causing a computer to execute to implement the method of any one of claims 1-6.
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