CN112415367B - 驱动芯片异常侦测方法、装置、电子设备及可读存储介质 - Google Patents
驱动芯片异常侦测方法、装置、电子设备及可读存储介质 Download PDFInfo
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- CN112415367B CN112415367B CN202011336193.XA CN202011336193A CN112415367B CN 112415367 B CN112415367 B CN 112415367B CN 202011336193 A CN202011336193 A CN 202011336193A CN 112415367 B CN112415367 B CN 112415367B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
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CN202011336193.XA CN112415367B (zh) | 2020-11-25 | 2020-11-25 | 驱动芯片异常侦测方法、装置、电子设备及可读存储介质 |
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Families Citing this family (3)
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CN113296998A (zh) * | 2021-06-22 | 2021-08-24 | 中国第一汽车股份有限公司 | 数据通信异常恢复方法、装置、电子设备及存储介质 |
CN114373410B (zh) * | 2021-12-20 | 2024-05-03 | 厦门天马微电子有限公司 | 一种异常侦测方法、异常侦测装置和显示装置 |
CN117037654B (zh) * | 2023-08-25 | 2024-06-07 | 北京显芯科技有限公司 | 一种背光模组的检测方法、ic芯片及背光模组 |
Citations (7)
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CN103389455A (zh) * | 2013-08-09 | 2013-11-13 | 友达光电(苏州)有限公司 | 驱动芯片的检测***及检测方法 |
CN105719587A (zh) * | 2016-04-19 | 2016-06-29 | 深圳市华星光电技术有限公司 | 液晶面板检测***及方法 |
CN105976778A (zh) * | 2016-07-04 | 2016-09-28 | 深圳市华星光电技术有限公司 | 液晶显示面板的数据驱动*** |
CN107527588A (zh) * | 2017-10-27 | 2017-12-29 | 京东方科技集团股份有限公司 | 一种显示驱动电路、其驱动方法及显示装置 |
CN109147690A (zh) * | 2018-08-24 | 2019-01-04 | 惠科股份有限公司 | 控制方法及装置、控制器 |
CN109949734A (zh) * | 2017-12-21 | 2019-06-28 | 硅工厂股份有限公司 | 显示面板的数据驱动设备、数据处理设备以及驱动*** |
CN111816124A (zh) * | 2020-08-07 | 2020-10-23 | 合肥奕斯伟集成电路有限公司 | 一种驱动电路、显示装置及利用时序控制器的检测方法 |
Family Cites Families (1)
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TWI415064B (zh) * | 2010-12-30 | 2013-11-11 | Au Optronics Corp | 顯示面板之控制電路裝置及其控制方法 |
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- 2020-11-25 CN CN202011336193.XA patent/CN112415367B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103389455A (zh) * | 2013-08-09 | 2013-11-13 | 友达光电(苏州)有限公司 | 驱动芯片的检测***及检测方法 |
CN105719587A (zh) * | 2016-04-19 | 2016-06-29 | 深圳市华星光电技术有限公司 | 液晶面板检测***及方法 |
CN105976778A (zh) * | 2016-07-04 | 2016-09-28 | 深圳市华星光电技术有限公司 | 液晶显示面板的数据驱动*** |
CN107527588A (zh) * | 2017-10-27 | 2017-12-29 | 京东方科技集团股份有限公司 | 一种显示驱动电路、其驱动方法及显示装置 |
CN109949734A (zh) * | 2017-12-21 | 2019-06-28 | 硅工厂股份有限公司 | 显示面板的数据驱动设备、数据处理设备以及驱动*** |
CN109147690A (zh) * | 2018-08-24 | 2019-01-04 | 惠科股份有限公司 | 控制方法及装置、控制器 |
CN111816124A (zh) * | 2020-08-07 | 2020-10-23 | 合肥奕斯伟集成电路有限公司 | 一种驱动电路、显示装置及利用时序控制器的检测方法 |
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Address after: 100176 no.2179, 2 / F, building D, 33, 99 Kechuang 14th Street, Beijing Economic and Technological Development Zone, Beijing (centralized office area) Applicant after: Beijing yisiwei Computing Technology Co.,Ltd. Applicant after: HEFEI YISIWEI INTEGRATED CIRCUIT Co.,Ltd. Address before: 100176 no.2179, 2 / F, building D, 33, 99 Kechuang 14th Street, Beijing Economic and Technological Development Zone, Beijing (centralized office area) Applicant before: Beijing yisiwei Computing Technology Co.,Ltd. Applicant before: HEFEI YISIWEI INTEGRATED CIRCUIT Co.,Ltd. |
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Address after: 100176 no.2179, 2 / F, building D, 33, 99 Kechuang 14th Street, Beijing Economic and Technological Development Zone, Beijing (centralized office area) Applicant after: Beijing yisiwei Computing Technology Co.,Ltd. Applicant after: Hefei Yisiwei Computing Technology Co.,Ltd. Address before: 100176 no.2179, 2 / F, building D, 33, 99 Kechuang 14th Street, Beijing Economic and Technological Development Zone, Beijing (centralized office area) Applicant before: Beijing yisiwei Computing Technology Co.,Ltd. Applicant before: HEFEI YISIWEI INTEGRATED CIRCUIT Co.,Ltd. |
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