CN112327063A - Device and method for improving spatial resolution of microwave electric field measurement - Google Patents

Device and method for improving spatial resolution of microwave electric field measurement Download PDF

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CN112327063A
CN112327063A CN202011014188.7A CN202011014188A CN112327063A CN 112327063 A CN112327063 A CN 112327063A CN 202011014188 A CN202011014188 A CN 202011014188A CN 112327063 A CN112327063 A CN 112327063A
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fabry
detection light
perot optical
electric field
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CN112327063B (en
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贾凤东
谢锋
张剑
钟志萍
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Tsinghua University
University of Chinese Academy of Sciences
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    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G01R29/12Measuring electrostatic fields or voltage-potential
    • G01R29/14Measuring field distribution

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Abstract

The invention discloses a device and a method for improving the spatial resolution of microwave electric field measurement, wherein the device comprises: the device comprises a cylindrical lens group, a Fabry-Perot optical resonant cavity, a square atom vapor pool and a detector with spatial resolution capability; the detection light is emitted into the cylindrical lens group from one side, and the coupling light is emitted into the square atom steam pool from the other side. The invention utilizes the cylindrical lens to shape the detection light into a sheet beam, the coupling light is emitted into the square atom steam pool from the other side, and the sheet beams of the coupling light and the detection light are vertically crossed in the square atom steam pool in the propagation process. Meanwhile, a Fabry-Perot optical resonant cavity is additionally arranged outside the square atom steam pool, the interaction length of the detection light, the coupling light and the atoms is increased by utilizing the back-and-forth reflection of the optical cavity, the signal to noise ratio of signal reading is improved, the space-resolved spectrum of the detection light is obtained through a detector with space resolution, and then the real three-dimensional space resolution measurement of the microwave electric field is obtained.

Description

Device and method for improving spatial resolution of microwave electric field measurement
Technical Field
The invention relates to the field of microwave electric fields, in particular to a device and a method for improving the measurement spatial resolution of a microwave electric field.
Background
The rydberg atoms have large electric dipole moment, so the method has great application prospect in the aspects of quantum storage, quantum computation, quantum simulation and quantum sensors. The ladder type electromagnetic induction transparency based on the rydberg atoms is widely researched, and in recent years, a scheme for measuring a microwave electric field based on the Electromagnetic Induction Transparency (EIT) and Autler-townes (AT) splitting effect of the rydberg atoms is developed, so that the intensity of the microwave electric field can be directly obtained from the splitting distance of the AT. The microwave electric field quantum sensor provides a quantum reference for the measurement of a microwave electric field (Nature Physics,8,819-824 (2012)), and has the advantages of self calibration, high precision, high sensitivity and the like, and people pay more attention to the quantum sensor. How to measure the microwave electric field with high spatial resolution simultaneously is one of the key core problems of the microwave in the application fields of medical care, nondestructive testing of materials, radar and the like. The spatial resolution of the present microwave electric field quantum sensor refers to the size of the laser beam, but in practical application, in order to obtain sufficient signal-to-noise ratio, the two beams of the detecting light and the coupling light are generally propagated and coincided in a reverse direction in an atomic vapor pool, then the signal is the superposition of all signals of the two beams of light interacting with atoms in the propagation direction, namely, the spatial resolution is only two-dimensional resolution on the beam cross section, and the resolution can be as accurate as the spot size to hundreds of micrometers [ Nature Physics,8, 819. 824(2012) ], or the CCD is used to observe the spot to realize higher two-dimensional spatial resolution [ Opt.Lett.39,3030-3033(2014) ]. However, high spatial resolution is not achieved in the beam propagation direction, and a signal with a sufficiently good signal-to-noise ratio can be obtained with an effective length of typically several tens of millimeters. The size of the atomic vapor pool is also made small, but the same signal still cannot obtain a high spatial resolution measurement in the laser transmission direction. In summary, it is difficult for current methods to achieve true three-dimensional spatial resolution.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a device and a method for improving the spatial resolution of microwave electric field measurement, which can simultaneously and efficiently obtain high-precision three-dimensional spatial resolution microwave electric field measurement.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
an apparatus for improving the spatial resolution of microwave electric field measurements, said apparatus comprising: the device comprises a cylindrical lens group, a Fabry-Perot optical resonant cavity, a square atom vapor pool and a detector with spatial resolution capability; the detection light is emitted into the cylindrical lens group from one side, and the coupling light is emitted into the square atom steam pool from the other side;
the cylindrical lens group is positioned above the Fabry-Perot optical resonant cavity and is used for converting the probe light from a Gaussian beam into a thin beam and then coupling the thin beam into the Fabry-Perot optical resonant cavity;
the Fabry-Perot optical resonant cavity comprises reflectors with two horizontally arranged surfaces and parallel to each other, the square atom steam pool is positioned between the reflectors with the two surfaces, and piezoelectric ceramics are respectively arranged at two ends of the reflector positioned above the square atom steam pool and used for accurately controlling the cavity length;
the thin-sheet light beam of the detection light is coupled into the Fabry-Perot optical resonant cavity, passes through the square atom steam pool and then is emitted out through a reflector positioned below the square atom steam pool; the coupled light is emitted into the square atom steam pool from the other side and vertically intersects with the flake light beam of the detection light in the square atom steam pool;
the detector is located below the Fabry-Perot optical resonant cavity and used for collecting the detection light and obtaining the spatial resolution spectrum information of the detection light.
Further, as above, the device for improving the spatial resolution of microwave electric field measurement includes two vertically arranged and parallel cylindrical lenses arranged in sequence from left to right, and a reflector with one side at a preset angle with the horizontal direction, wherein the distance between the two cylindrical lenses is the sum of the focal lengths of the two cylindrical lenses.
Further, according to the device for improving the spatial resolution of microwave electric field measurement, two reflectors of the fabry-perot optical resonant cavity are coated reflectors, and the coating material is a dielectric film.
Further, according to the device for improving the spatial resolution of microwave electric field measurement, the reflectivity of the coating of the fabry-perot optical resonant cavity is 96.91%, and the fineness is 100.
Further, according to the device for improving the spatial resolution of microwave electric field measurement, the cavity length of the Fabry-Perot optical resonant cavity is 1.5cm, and the free path is 10 GHz.
Further, according to the device for improving the spatial resolution of microwave electric field measurement, the coupling light is emitted into the square atom steam pool through the reflecting mirrors with two parallel surfaces.
Further, according to the device for improving the spatial resolution of microwave electric field measurement, the detector is an array type photodiode or a CCD.
Further, according to the device for improving the spatial resolution of microwave electric field measurement, the probe light is probe light with a wavelength of 780nm, and the fabry-perot optical resonant cavity is a fabry-perot optical resonant cavity with a wavelength of 780 nm.
The embodiment of the invention also provides a method for improving the spatial resolution of microwave electric field measurement, which comprises the following steps:
(1) emitting the detection light into the cylindrical lens group from one side, and emitting the coupling light into the square atom steam pool from the other side;
(2) the cylindrical lens group converts the detection light from a Gaussian beam into a thin sheet beam and then couples the thin sheet beam into a Fabry-Perot optical resonant cavity;
(3) the thin sheet beam of the detection light is coupled into the Fabry-Perot optical resonant cavity, passes through the square atom steam pool and then is emitted out through a reflector positioned below the square atom steam pool, and meanwhile, the coupled light is emitted into the square atom steam pool from the other side, so that the coupled light and the thin sheet beam of the detection light are vertically intersected in the square atom steam pool;
(4) the detector collects the detection light emitted from the lower part of the Fabry-Perot optical resonant cavity, and obtains the spectral information of the detection light.
Further, a method for improving the spatial resolution of microwave electric field measurement as described above, step (4) includes:
when the detector scans the frequency of the detection light, the change of the detection light intensity in space is recorded AT the same time, a Reedberg atom electromagnetic induction transparent AT split spectrum on a Y-Z plane is obtained by selecting a pixel point collection, the intensity of a microwave electric field is obtained from the AT split spectrum, and then the intensities of the microwave electric field in three directions of XYZ are obtained, namely the real three-dimensional space high-resolution measurement of the microwave electric field is obtained AT the same time.
The invention has the beneficial effects that: the invention utilizes the cylindrical lens to shape the detection light into a sheet beam, the coupling light is emitted into the square atom steam pool from the other side, and the sheet beams of the coupling light and the detection light are vertically crossed in the square atom steam pool in the propagation process. Meanwhile, a Fabry-Perot optical resonant cavity is additionally arranged outside the square atom steam pool, the interaction length of the probe light, the coupling light and the atoms is increased by utilizing the back-and-forth reflection of the optical cavity, the signal to noise ratio of the signal reading of the detector is improved, and the real three-dimensional space resolution measurement of a microwave electric field is further obtained simultaneously.
Drawings
Fig. 1 is a schematic structural diagram of an apparatus for improving spatial resolution of microwave electric field measurement according to an embodiment of the present invention;
FIG. 2 is a schematic illustration of experimental data analysis provided in an embodiment of the present invention;
FIG. 3 is a schematic diagram of AT splitting of a Reedberg EIT provided in an embodiment of the present invention;
fig. 4 is a schematic flowchart of a method for improving spatial resolution of microwave electric field measurement according to an embodiment of the present invention.
In the attached figure, 1-detecting light, 2-cylindrical lens group, 3-square atom steam pool, 4-Fabry-Perot optical resonant cavity, 5-piezoelectric ceramic, 6-coupling light and 7-detector.
Detailed Description
The invention is described in further detail below with reference to the drawings and the detailed description.
As shown in fig. 1, an apparatus for improving the spatial resolution of microwave electric field measurement includes: the device comprises a cylindrical lens, a Fabry-Perot optical resonant cavity, a square atom vapor pool and a detector with spatial resolution capability; the detection light is emitted into the cylindrical lens from one side, and the coupling light is emitted into the square atom steam pool from the other side.
The cylindrical lens is positioned above the Fabry-Perot optical resonant cavity and is used for converting the detection light from the Gaussian beam into the thin-sheet beam and coupling the thin-sheet beam into the Fabry-Perot optical resonant cavity. Optionally, the cylindrical lens group includes two vertically arranged and parallel cylindrical lenses arranged in sequence from left to right, and a reflector having one surface forming a preset angle with the horizontal direction, and the distance between the two cylindrical lenses is the sum of the focal lengths of the two cylindrical lenses. Specifically, the probe light is converted from a gaussian beam with a diameter of 300 micrometers to a thin-sheet beam with a thickness of 300 micrometers and a width of 35 millimeters by using a set of cylindrical lenses, and the optical path of the probe light is indicated by solid arrows in fig. 1.
The Fabry-Perot optical resonant cavity comprises reflectors with two horizontally arranged surfaces and parallel to each other, a square atom steam pool is positioned between the reflectors with the two surfaces, and piezoelectric ceramics are respectively installed at two ends of the reflector positioned above the square atom steam pool and used for accurately controlling the cavity length. Two reflectors of the Fabry-Perot optical resonant cavity are coated reflectors, and coating materials are designed to be dielectric films so as not to influence the transmission of microwaves. The reflectivity of the coating of the Fabry-Perot optical resonant cavity is 96.91%, and the fineness is 100%. The cavity length of the Fabry-Perot optical resonant cavity is 1.5cm, and the free path is 10 GHz. Optionally, if the probe light is probe light with a wavelength of 780nm, the fabry-perot optical resonant cavity is a fabry-perot optical resonant cavity with a wavelength of 780 nm.
Since the film coating reflectivity will determine the fineness F of the optical cavity and the line width of the transmitted spectrum, in order to meet the requirement of the spectrum scanning range, it is necessary to select a proper film coating reflectivity R and a proper cavity length for the 780nm fabry-perot optical resonant cavity. Firstly, the higher the fineness F is, the more times the detection light is reflected in the atomic pool is, and the longer the length equivalent to the interaction with atoms and coupling light is; secondly, the higher the fineness F is, the narrower the spectral line width transmitted through the optical resonator is, and the line width of the transmitted spectrum is required to be greater than 100MHz in the process of actually measuring the microwave electric field. To balance these two points, the fineness F was taken to be around 100 (corresponding to a reflectivity R of 96.91%), and the interaction length was 100 × 300 μm and 30 mm, which completely satisfied the experimental requirements. Meanwhile, piezoelectric ceramics are arranged on one mirror of the optical cavity and used for accurately controlling the cavity length to meet the condition of 780nm Reedberg EIT resonance transmission. The length of the cavity is 1.5cm, the free path of the corresponding cavity is 10GHz, and the transmission spectrum line width with the fineness F of 100 is 100MHz, so that the requirement of the spectrum scanning range is met. For the R96.91% coating and the coupling adjustment for the F100 optical resonator, it is very simple and easy to operate.
It is to be understood that all numerical values used herein are preferred embodiments.
The thin-sheet light beam of the detection light is coupled into a Fabry-Perot optical resonant cavity, passes through a square atom vapor pool and then is emitted out through a reflector positioned below the square atom vapor pool. The coupled light is emitted into the square atom steam pool from the other side, and vertically intersects with the flake light beam of the detection light in the square atom steam pool, and the light path of the coupled light is indicated by a dotted arrow in fig. 1. The coupled light can be emitted into the square atom steam pool through the reflecting mirrors with two parallel surfaces, and the size of the square atom steam pool is larger than the diameter of the coupled light. In order to reduce the absorption of the probe light passing through the atoms back and forth many times, the square atom vapor pool is designed to be as small as possible in the propagation direction (X direction in fig. 1) of the probe light with the wavelength of 780nm, and in practical implementation, the square atom vapor pool is larger than the diameter of the coupled light. Or reducing the absorption of the probe light passing through the atoms repeatedly by reducing the rubidium partial pressure in the atom steam pool.
The detector is positioned below the Fabry-Perot optical resonant cavity and used for collecting the detection light and obtaining the spectral information of the detection light. Alternatively, the detector may be an array of photodiodes or CCDs. Assuming that the detector is a CCD, when the frequency of the detected light is scanned, the CCD simultaneously records the change of the detected light intensity in space, and the AT splitting spectrum which is transparent in electromagnetic induction of the rydberg atoms on the Y-Z plane can be obtained by selecting the collection of the pixel points, the intensity of the microwave electric field can be obtained from the AT splitting interval, and then the intensity of the microwave electric field in three directions of XYZ can be obtained, namely the real three-dimensional high-resolution measurement of the microwave electric field can be obtained simultaneously. Fig. 2 shows a schematic diagram of experimental data analysis, wherein the data is from simulation, the vertical axis represents frequency change of the probe light, and the horizontal axis represents distribution in the Z direction of the space, and the distribution is formed by splicing CCD screenshots of different frequencies. Fig. 2 shows the sum of the intensities of all pixels of the probe light in the Y direction on the CCD. In fact, if a part of the Y direction is cut as described above, the spatial distribution of the Y direction can be further obtained. The spatial resolution of the Y-Z plane depends on the selection of the number of pixel points, the maximum ultrahigh spatial resolution can reach dozens of microns of a single pixel, and the spatial resolution in the X direction is determined by the size of a light spot of 480nm coupled light. Fig. 3 shows a schematic diagram of AT splitting of the riedberg EIT, which is obtained by cutting data of fig. 2, where Z is 0-0.3mm, the horizontal axis represents the detuning amount of the probe light, and the vertical axis represents the intensity of the probe light. From the interval of the two peaks, i.e., the AT break interval, the intensity of the microwave electric field can be obtained. Meanwhile, three-dimensional spatial resolution is obtained, the spatial resolution in the X direction is 300 microns and is determined by the diameter of the coupled light; the spatial resolution in the Y-direction and the spatial resolution in the Z-direction depend on the choice of CCD data, here again 300 microns.
Corresponding to the apparatus shown in fig. 1, an embodiment of the present invention further provides a method for improving the spatial resolution of microwave electric field measurement, as shown in fig. 4, the method includes the following steps:
s100, emitting the detection light into a cylindrical lens group from one side, and emitting the coupling light into a square atom steam pool from the other side;
s200, the cylindrical lens group converts the detection light from a Gaussian beam into a thin sheet beam and then couples the thin sheet beam into a Fabry-Perot optical resonant cavity;
s300, coupling the sheet beam of the detection light into a Fabry-Perot optical resonant cavity, passing through a square atom steam pool, then emitting the sheet beam through a reflector positioned below the Fabry-Perot optical resonant cavity, and simultaneously emitting the coupling light into the square atom steam pool from the other side, so that the coupling light and the sheet beam of the detection light are vertically intersected in the square atom steam pool;
s400, collecting the detection light emitted from the lower part of the Fabry-Perot optical resonant cavity by a detector to obtain the spectral information of the detection light.
Step S400 includes:
when the detector scans the detection light frequency, the change of the detection light intensity in space is recorded AT the same time, a Reedberg atom electromagnetic induction transparent AT split spectrum on a Y-Z plane is obtained by selecting a pixel point collection, the intensity of a microwave electric field is obtained from the AT split spectrum, and then the intensity of the microwave electric field in three directions of XYZ is obtained, namely the real three-dimensional high-resolution measurement of the microwave electric field is obtained AT the same time.
In this embodiment, the detection light is emitted into the cylindrical lens group from one side, the detection light is integrated into the sheet beam by the cylindrical lens, that is, the detection light is a surface, the coupling light is a line, and the coupling light is emitted into the square atom vapor pool from the other side, so that the sheet beams of the coupling light and the detection light vertically intersect in the square atom vapor pool during the propagation process. In order to improve the signal-to-noise ratio of signal reading, a pair of 780 nm-wavelength coated reflectors are added outside a square atom steam pool, a fabry-perot optical resonant cavity is provided in the propagation direction of detection light, the interaction length of the detection light, coupling light and atoms is increased by utilizing the back-and-forth reflection of the optical cavity, the signal-to-noise ratio of signal reading of a detector is improved, and further real three-dimensional space resolution measurement of a microwave electric field is obtained.
The invention realizes real three-dimensional high-precision spatial resolution of a microwave electric field, the spatial resolution is expanded from the existing two-dimensional to three-dimensional, the spatial resolution in the direction vertical to the propagation direction of the detection light depends on the spatial resolution of a CCD detector, which is referred to as a Y-Z plane in the text and can be dozens of micrometers, and the spatial resolution in the direction parallel to the propagation direction of the detection light depends on the diameter of a light spot of the coupling light, which is referred to as an X direction in the text. The method for increasing the interaction length of the probe light, the atoms and the coupling light by combining the optical cavity can obtain real microwave electric field three-dimensional space high-resolution measurement while ensuring the signal to noise ratio of the spectral data reading. The method has the characteristics of high measurement speed, high efficiency and the like, can quickly obtain the three-dimensional space distribution of the microwave electric field, and is very suitable for the application fields of microwave technology in medical care, nondestructive testing of materials, radar and the like.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is intended to include such modifications and variations.

Claims (10)

1. An apparatus for improving the spatial resolution of microwave electric field measurements, said apparatus comprising: the device comprises a cylindrical lens group, a Fabry-Perot optical resonant cavity, a square atom vapor pool and a detector with spatial resolution capability; the detection light is emitted into the cylindrical lens group from one side, and the coupling light is emitted into the square atom steam pool from the other side;
the cylindrical lens group is positioned above the Fabry-Perot optical resonant cavity and is used for converting the probe light from a Gaussian beam into a thin beam and then coupling the thin beam into the Fabry-Perot optical resonant cavity;
the Fabry-Perot optical resonant cavity comprises reflectors with two horizontally arranged surfaces and parallel to each other, the square atom steam pool is positioned between the reflectors with the two surfaces, and piezoelectric ceramics are respectively arranged at two ends of the reflector positioned above the square atom steam pool and used for accurately controlling the cavity length;
the thin-sheet light beam of the detection light is coupled into the Fabry-Perot optical resonant cavity, passes through the square atom steam pool and then is emitted out through a reflector positioned below the square atom steam pool; the coupled light is emitted into the square atom steam pool from the other side and vertically intersects with the flake light beam of the detection light in the square atom steam pool;
the detector is located below the Fabry-Perot optical resonant cavity and used for collecting the detection light and obtaining the spatial resolution spectrum information of the detection light.
2. The apparatus of claim 1, wherein the cylindrical lens group comprises two vertically arranged cylindrical lenses and a reflector, wherein the two vertically arranged cylindrical lenses are parallel to each other, and the reflector has a preset angle with the horizontal direction, and the distance between the two cylindrical lenses is the sum of the focal lengths of the two cylindrical lenses.
3. The apparatus of claim 1, wherein the two mirrors of the fabry-perot optical resonator are coated mirrors, and the coating material is a dielectric film.
4. The apparatus as claimed in claim 1, wherein the fabry-perot optical resonator has a reflectivity of 96.91% and a fineness of 100.
5. The apparatus as claimed in claim 1, wherein the Fabry-Perot optical resonator has a cavity length of 1.5cm and a free path of 10 GHz.
6. The apparatus according to claim 1, wherein the coupled light is emitted into the square atom vapor pool through a mirror with two parallel surfaces.
7. The apparatus according to claim 1, wherein the detector is an array of photodiodes or a CCD.
8. The apparatus of claim 1, wherein the probe light is probe light with a wavelength of 780nm, and the Fabry-Perot optical resonator is a Fabry-Perot optical resonator with a wavelength of 780 nm.
9. A method for improving the spatial resolution of microwave electric field measurement, which is applied to the device for improving the spatial resolution of microwave electric field measurement according to any one of claims 1 to 8, and which comprises the following steps:
(1) emitting the detection light into the cylindrical lens group from one side, and emitting the coupling light into the square atom steam pool from the other side;
(2) the cylindrical lens group converts the detection light from a Gaussian beam into a thin sheet beam and then couples the thin sheet beam into a Fabry-Perot optical resonant cavity;
(3) the thin sheet beam of the detection light is coupled into the Fabry-Perot optical resonant cavity, passes through the square atom steam pool and then is emitted out through a reflector positioned below the square atom steam pool, and meanwhile, the coupled light is emitted into the square atom steam pool from the other side, so that the coupled light and the thin sheet beam of the detection light are vertically intersected in the square atom steam pool;
(4) the detector collects the detection light emitted from the lower part of the Fabry-Perot optical resonant cavity, and obtains the spectral information of the detection light.
10. The method for improving the spatial resolution of microwave electric field measurement according to claim 9, wherein the step (4) comprises:
when the detector scans the frequency of the detection light, the change of the detection light intensity in space is recorded AT the same time, a Reedberg atom electromagnetic induction transparent AT split spectrum on a Y-Z plane is obtained by selecting a pixel point collection, the intensity of a microwave electric field is obtained from the AT split spectrum, and then the intensities of the microwave electric field in three directions of XYZ are obtained, namely the real three-dimensional space high-resolution measurement of the microwave electric field is obtained AT the same time.
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Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB736790A (en) * 1951-09-20 1955-09-14 Emi Ltd Improvements relating to detecting arrangements for electrical signals
GB1219122A (en) * 1967-01-19 1971-01-13 Varian Associates Optically driven atomic resonator systems
US4885527A (en) * 1987-08-04 1989-12-05 Aerospatiale Societe Nationale Industrielle Device for continuously measuring the rate at which fibers conducting or not conducting electricity are impregnated by a substance
JPH06249886A (en) * 1993-02-26 1994-09-09 Ricoh Co Ltd Electric field measuring device
JPH11287772A (en) * 1998-04-03 1999-10-19 Kuraray Co Ltd Method and device for calculating natural frequency of microwave resonance system
JP2006222448A (en) * 1996-07-19 2006-08-24 Tadahiro Omi Continuous emission excimer laser oscillation equipment
CN104064441A (en) * 2014-06-12 2014-09-24 单家芳 Microwave resonant cavity for plasma light source
US20180087965A1 (en) * 2015-03-30 2018-03-29 University Court Of The University Of St Andrews Electro-optic terahertz detector
CN110988504A (en) * 2019-12-27 2020-04-10 北京无线电计量测试研究所 Laser intensity stability control device and method for Reidberg atom microwave electric field intensity meter
CN111308228A (en) * 2020-01-15 2020-06-19 中国科学院大学 Method and device for improving microwave electric field intensity measurement signal-to-noise ratio through Zeeman frequency modulation
CN111581860A (en) * 2020-04-12 2020-08-25 西安电子科技大学 Microwave near-field probe spatial resolution analysis method and system and microwave microscope

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB736790A (en) * 1951-09-20 1955-09-14 Emi Ltd Improvements relating to detecting arrangements for electrical signals
GB1219122A (en) * 1967-01-19 1971-01-13 Varian Associates Optically driven atomic resonator systems
US4885527A (en) * 1987-08-04 1989-12-05 Aerospatiale Societe Nationale Industrielle Device for continuously measuring the rate at which fibers conducting or not conducting electricity are impregnated by a substance
JPH06249886A (en) * 1993-02-26 1994-09-09 Ricoh Co Ltd Electric field measuring device
JP2006222448A (en) * 1996-07-19 2006-08-24 Tadahiro Omi Continuous emission excimer laser oscillation equipment
JPH11287772A (en) * 1998-04-03 1999-10-19 Kuraray Co Ltd Method and device for calculating natural frequency of microwave resonance system
CN104064441A (en) * 2014-06-12 2014-09-24 单家芳 Microwave resonant cavity for plasma light source
US20180087965A1 (en) * 2015-03-30 2018-03-29 University Court Of The University Of St Andrews Electro-optic terahertz detector
CN110988504A (en) * 2019-12-27 2020-04-10 北京无线电计量测试研究所 Laser intensity stability control device and method for Reidberg atom microwave electric field intensity meter
CN111308228A (en) * 2020-01-15 2020-06-19 中国科学院大学 Method and device for improving microwave electric field intensity measurement signal-to-noise ratio through Zeeman frequency modulation
CN111581860A (en) * 2020-04-12 2020-08-25 西安电子科技大学 Microwave near-field probe spatial resolution analysis method and system and microwave microscope

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
KAI-KAI XU, ZHONG-YIN XIAO: "Ultra-broad band and dual-band highly efficient polarization conversion based on the three-layered chiral structure", PHYSICA E: LOW-DIMENSIONAL SYSTEMS AND NANOSTRUCTURES, vol. 81, pages 169 - 176, XP029545068, DOI: 10.1016/j.physe.2016.03.015 *
王璐;刘庆纲;李锁印;魏泽峰;李敏;栗大超;胡小唐;: "超高速电光采样技术及应用", 微纳电子技术, no. 04, pages 197 - 202 *

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