CN112214827A - Rail transit electronic control device service life assessment method and device based on multiple stresses - Google Patents
Rail transit electronic control device service life assessment method and device based on multiple stresses Download PDFInfo
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Abstract
The invention discloses a method and a device for evaluating the service life of a rail transit electronic control device based on multiple stresses, wherein the method comprises the following steps: s1, establishing an acceleration model between various sensitive stresses and the service life of an electronic control device, and establishing a service life estimation model of the electronic control device according to the acceleration model; s2, executing a plurality of groups of accelerated life tests on the electronic control device to be evaluated, wherein each group of accelerated life tests respectively corresponds to a combination of different sensitive stress levels; s3, carrying out parameter solution on the constructed service life estimation model according to the service life test results of each group of sensitive stress levels to obtain a service life estimation model after parameter solution; and S4, acquiring each sensitive stress of the electronic control device to be evaluated under the normal operation condition, and obtaining a service life evaluation result of the electronic control device to be evaluated according to the service life evaluation model after parameter solution. The method has the advantages of simple implementation method, high evaluation efficiency and reliability and the like.
Description
Technical Field
The invention relates to the technical field of rail transit electronic control devices, in particular to a method and a device for evaluating the service life of a rail transit electronic control device based on multiple stresses.
Background
The rail transit electronic control device is used as a vehicle-mounted device integrating functions of control, network communication, fault diagnosis and the like, and the service life and the reliability of the rail transit electronic control device are important for the stability and the reliability of a train network system. In order to quickly evaluate the reliability and the service life level of the rail transit electronic control device and reduce the test cost, the test evaluation is generally required to be performed by using an accelerated stress test such as an accelerated service life test. However, the conventional accelerated life test can only realize the product life evaluation of a single environmental stress (such as temperature, etc.), while the rail transit electronic device can bear various environmental stresses (such as temperature, humidity, vibration, etc.) during actual operation, each environmental stress can directly affect the service life of the device, the single environmental stress cannot truly reflect the working state of the rail transit electronic control device in the actual operation process, so that the real environmental stress working condition borne by the rail transit electronic control device on the spot cannot be accurately simulated, and the evaluation precision of the life evaluation mode based on the single environmental stress is not high. Even if multiple environmental stresses are considered, the service life of the device is usually evaluated firstly based on each single environmental stress at present, then the final evaluation result is obtained by integrating each evaluation result, the realization process is complex, the efficiency is low, the working state of the rail transit electronic control device in the actual operation process cannot be accurately reflected by the above independent evaluation mode based on each single environmental stress, and the evaluation precision is still not high. Therefore, it is desirable to provide a method for evaluating the lifetime of an electronic control device based on multiple stresses, so as to improve the accuracy and efficiency of lifetime evaluation.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: aiming at the technical problems in the prior art, the invention provides the service life evaluation method and the service life evaluation device of the rail transit electronic control device based on the multi-stress, which have the advantages of simple implementation method, high evaluation efficiency and high reliability.
In order to solve the technical problems, the technical scheme provided by the invention is as follows:
a rail transit electronic control device service life assessment method based on multiple stresses comprises the following steps:
s1, acceleration model construction: establishing an acceleration model between various sensitive stresses which comprehensively influence the service life and the service life of the electronic control device, and establishing a service life estimation model of the electronic control device according to the acceleration model;
s2, accelerated life test: executing a plurality of groups of accelerated life tests on the electronic control device to be evaluated, wherein each group of accelerated life tests respectively correspond to the combination of different sensitive stress levels during the test, and obtaining a plurality of groups of life test results corresponding to different sensitive stress levels;
s3, model solving: carrying out parameter solution on the constructed life estimation model according to the obtained life test result of each group of sensitive stress levels to obtain a life estimation model after parameter solution;
s4, service life assessment: and acquiring each sensitive stress of the electronic control device to be evaluated under the normal operation condition, and obtaining a service life evaluation result of the electronic control device to be evaluated according to the service life evaluation model after the parameter solution.
As a further improvement of the invention, the acceleration model is specifically constructed based on a generalized einlin model and three sensitive stresses of temperature, humidity and vibration, and the specific formula is as follows:
wherein, L is the life of the electronic control device, T is the high temperature stress, RH is the humidity stress, V is the vibration stress, A, B, C, D is the unknown parameter of the model respectively.
As a further improvement of the present invention, the life estimation model constructed according to the acceleration model specifically includes:
wherein the content of the first and second substances,
for the life estimation of the electronic control unit at each test stress level,
is a parameter alpha0、α1、α2、α3Estimated value of, alpha0＝lnA，α1＝B，α2＝C，α3And D, i is the number of trials.
As a further improvement of the present invention, the specific steps of constructing the life estimation model of the electronic control device in step S1 are as follows:
the method comprises the following steps of constructing an acceleration model comprehensively comprising three stresses of temperature, humidity and vibration:
carrying out logarithm taking operation on the constructed acceleration model to convert the acceleration model into:
let lnA be alpha0、B＝α1、C＝α2、-D＝α3Obtaining:
and then converting based on the estimation parameters to obtain a final life estimation model as follows:
wherein the content of the first and second substances,
for the life estimates of the electronic control unit at each set of test stress levels,
is a parameter alpha0、α1、α2、α3I is the number of test groups.
As a further improvement of the present invention, the specific steps of step S3 are: acquiring the temperature, humidity and vibration level of the electronic control device to be evaluated in each group of tests, and acquiring a service life estimated value according to the service life test result of the electronic control device to be evaluated in each group of test stress levels
Obtaining alpha using maximum likelihood estimation0、α1、α2、α3Is estimated value of
And obtaining a life estimation model after parameter solution.
As a further improvement of the present invention, before the step S1, a sensitive stress determining step is further included, and the specific steps are as follows: and acquiring one or more of operating environment data, field operating data, fault data and test data of the electronic control device to be evaluated, and determining each sensitive stress influencing the service life.
As a further improvement of the present invention, the specific steps of step S2 are:
s21, selecting the highest value of each stress in each test to ensure that each stress level does not exceed the normal working limit of the electronic control device in the test, and determining the number of test groups to be executed according to the number of unknown parameters in the constructed acceleration model;
s22, configuring each stress level in each group of tests according to the selected highest value of each stress in each test and the required number of test groups;
and S23, controlling each stress level in each group of tests configured in the step S22 to execute an accelerated life test on the electronic control device to be evaluated.
As a further improvement of the present invention, in step S22, the stress levels in each set of tests are determined by specifically using an orthogonal table formed by each stress.
As a further improvement of the present invention, the step S2 is preceded by a step of performing an accelerated life test pre-test on the electronic control device to be evaluated to determine the operating limit of each sensitive stress when the electronic control device to be evaluated is powered on.
As a further improvement of the present invention, when the accelerated life test is performed, the stress is applied in a step stress manner, and the working limit results of the temperature, the humidity and the vibration stress of the electronic control device to be evaluated are obtained by performing a low temperature step stress test, a high temperature step stress test, a rapid temperature change cycle test, a humidity step test and a vibration step test respectively.
A rail transit electronic control device life evaluation device based on multiple stresses comprises:
the system comprises an acceleration model building module, a service life estimation module and a service life estimation module, wherein the acceleration model building module is used for building an acceleration model between various sensitive stresses which comprehensively influence the service life and the service life of an electronic control device and building a service life estimation model of the electronic control device according to the acceleration model;
the accelerated life test module is used for executing a plurality of groups of accelerated life tests on the electronic control device to be evaluated, and each group of accelerated life tests respectively correspond to the combination of different sensitive stress levels to obtain a plurality of groups of life test results corresponding to different sensitive stress levels;
the model solving module is used for carrying out parameter solving on the built life estimation model according to the obtained life test results of each group of sensitive stress levels to obtain a life estimation model after parameter solving;
and the service life evaluation module is used for acquiring each sensitive stress of the electronic control device to be evaluated under the normal operation condition and obtaining a service life evaluation result of the electronic control device to be evaluated according to the service life evaluation model after the parameter solution.
The service life evaluation device of the rail transit electronic control device based on the multiple stresses comprises computer equipment, wherein the computer equipment is programmed to execute the steps of the service life evaluation method of the rail transit electronic control device based on the multiple stresses.
A computer-readable storage medium storing a computer program, which when executed implements the method for estimating the lifetime of an electronic control device for rail transit based on multiple stresses as described above.
Compared with the prior art, the invention has the advantages that:
1. the invention considers the characteristics of environmental stress of an electronic control device during actual operation, constructs an acceleration model integrating various sensitive stresses, so that the acceleration model can truly and comprehensively reflect the relation between various sensitive stresses and the service life of the device during the actual operation, constructs a service life estimation model of the device by the acceleration model, and estimates the service life of the device by stress data during normal operation of the device after solving model parameters by combining the data of the accelerated service life test of the device.
2. The invention comprehensively influences three main sensitive stresses of the rail transit electronic control device: an acceleration model is established by temperature, humidity and vibration, and the actual service life state of the rail transit electronic control device can be accurately reflected, so that the service life evaluation of the rail transit electronic control device can be accurately realized based on the three comprehensive stresses of temperature, humidity and vibration.
3. The method is expanded on the basis of the traditional AILIN model, the generalized AILIN model is used as an acceleration model, the acceleration model is constructed on the basis of the generalized AILIN model, the acceleration relation between the service life characteristics of the product and the three comprehensive stresses of temperature, humidity and vibration can be comprehensively embodied, the relation between the temperature, humidity and vibration of the main sensitive stress and the service life of the rail transit electronic device can be accurately represented, and therefore reliable service life evaluation of the device is achieved.
Drawings
Fig. 1 is a schematic flow chart of the implementation of the method for evaluating the service life of the electronic control device of rail transit based on multiple stresses according to the embodiment.
Fig. 2 is a schematic flow chart illustrating the implementation of the service life evaluation of the rail transit electronic control device in the embodiment of the present invention.
Detailed Description
The invention is further described below with reference to the drawings and specific preferred embodiments of the description, without thereby limiting the scope of protection of the invention.
As shown in fig. 1, the method for evaluating the service life of the rail transit electronic control device based on multiple stresses in the embodiment includes the following steps:
s1, acceleration model construction: establishing an acceleration model between various sensitive stresses which comprehensively influence the service life and the service life of the electronic control device, and establishing a service life estimation model of the electronic control device according to the acceleration model;
s2, accelerated life test: executing a plurality of groups of accelerated life tests on the electronic control device to be evaluated, wherein each group of accelerated life tests respectively correspond to the combination of different sensitive stress levels during the test, and obtaining a plurality of groups of life test results corresponding to different sensitive stress levels;
s3, model solving: carrying out parameter solution on the constructed service life estimation model according to the obtained service life test results of each group of sensitive stress levels to obtain a service life estimation model after parameter solution;
s4, service life assessment: and acquiring each sensitive stress of the electronic control device to be evaluated under the normal operation condition, and obtaining a service life evaluation result of the electronic control device to be evaluated according to the service life evaluation model after parameter solution.
In the embodiment, the characteristic of environmental stress of the electronic control device during actual operation is considered, the acceleration model integrating various sensitive stresses is constructed, so that the relation between various sensitive stresses and the service life of the device during the actual operation can be truly and comprehensively reflected by the acceleration model, the service life estimation model of the device is constructed by the acceleration model, after model parameters are solved by combining the data of the accelerated service life test of the device, the service life of the device can be estimated by stress data during the normal operation of the device, compared with the traditional method which can only realize the service life estimation of single environmental stress, the actual service life condition of the device can be more accurately and comprehensively estimated, the reliability of the service life estimation is ensured, the estimation precision is improved, meanwhile, based on the model integrating various sensitive stresses, the efficiency of the service life estimation can be effectively improved, the test cost is reduced, and based on the form of the accelerated service life, by increasing the stress level of the test, the time and cost required for life assessment can be further reduced.
In this embodiment, before step S1, a sensitive stress determining step is further included, and the specific steps are: the method comprises the steps of obtaining operating environment data, field operating data, fault data, test data and the like of an electronic control device to be evaluated, and determining each sensitive stress influencing the service life based on one or more data. The electronic control device is subjected to different environments such as temperature, humidity and vibration in the operation process, the key sensitive stress affecting the service life in the device is possibly different, the service life state of the device can be reflected by operation environment data, field operation data, fault data, test data and the like, and the sensitive stress affecting the service life can be obtained correspondingly.
The test data may be data obtained by performing an accelerated life test (reliability enhancement test) on the electronic control device to be evaluated, the accelerated life test may be used to determine the sensitive type and the working limit of each sensitive stress, and other test data may be used or added according to actual requirements. The fault data is fault data when the electronic control device to be evaluated fails, the corresponding sensitive stress is determined according to a fault generation reason corresponding to the fault data, and if the situation that the service life of the device is influenced by frequent over-temperature faults is monitored, the temperature can be determined to be the key sensitive stress.
As shown in fig. 2, in a specific application embodiment of the present invention, first, based on the operation environment and the operation mode of the rail transit electronic control device on the spot, the critical sensitive stress types affecting the product life and reliability are analyzed:
during the life cycle of the rail transit electronic control device working on site, the experienced environment mainly comprises the following aspects:
1) ground transportation and storage environment: subjected to vibration and impact during ground transportation, and subjected to temperature and humidity during storage.
2) Mechanical environment: vibration, impact, noise and acceleration generated when the train is accelerated to start and decelerated to stop, high-temperature, low-temperature, high-humidity and rapid temperature change environments and the like.
3) Working environment of normal operation: noise generated in the normal and stable running process of the train, electric stress such as surge and pulse in a network control system, vibration and impact of the rail on the train and other environments.
4) And (3) inducing environment: magnetic devices on the train and an induced magnetic field generated by a current loop.
As described above, the influence of the environmental conditions on the electronic control device can be found out that the temperature, the electrical stress, the vibration and the humidity have influence on each component of the electronic control device, that is, the temperature, the humidity and the vibration stress are main sensitive stresses affecting the service life of the electronic control device, and the final sensitive stresses are determined to be the temperature, the humidity and the vibration stress based on the analysis.
Based on the above key sensitive stress analysis, the present embodiment comprehensively affects three main sensitive stresses of the rail transit electronic control device: an acceleration model is established by temperature, humidity and vibration, and the actual service life state of the rail transit electronic control device can be accurately reflected, so that the service life evaluation of the rail transit electronic control device can be accurately realized based on the three comprehensive stresses of temperature, humidity and vibration.
In this embodiment, the acceleration model is specifically constructed based on a generalized einlin model and three sensitive stresses of temperature, humidity, and vibration, and the specific formula is as follows:
where L is the lifetime of the electronic control device, T is the high temperature stress (unit K), RH is the humidity stress (unit%), V is the vibration stress (unit Grms), and A, B, C, D is 4 unknown parameters of the model.
The original concept model of the generalized Ehrun model can be expressed as follows:
in the above formula, Λ and BiAnd CiIs a constant to be determined; eaTo activate energy; k is Boltzmann constant; t is temperature stress; siAs a function of a second non-temperature stress.
Let L ═ LT, humidity stress
Stress of vibration S2＝lnV-cThen, equation (2) becomes:
after removing T of L', and assuming no interaction between the temperature T, the relative humidity H and the vibration V, the equation (4) is changed to:
and finally, enabling the A to be equal to the Lambda,
C＝C1b，D＝c·C2then, the acceleration model represented by the above formula (1) is finally obtained from the formula (4).
The traditional Ailin model is mainly used for describing the incidence relation between temperature stress and product life, the embodiment is expanded on the basis of the traditional Ailin model, the generalized Ailin model is used as an acceleration model, and the acceleration model constructed based on the generalized Ailin model can comprehensively show the acceleration relation between the product life characteristics and the three comprehensive stresses of temperature, humidity and vibration, so that the relation between the temperature, humidity and vibration of main sensitive stress and the service life of the rail transit electronic device is effectively represented, and reliable service life evaluation of the device is realized.
In the embodiment, the acceleration model is constructed based on the generalized einlin model, and it can be understood that other model construction modes can be adopted according to actual requirements, and even the functional expression relationship between the stress and the product life can be independently tested, such as other expression forms of the vibration stress, the humidity and the temperature stress.
In the embodiment, an acceleration model is constructed based on a generalized Ehrrin model based on three comprehensive stresses of temperature, humidity and vibration, and it can be understood that other sensitive stresses can be further added according to actual requirements on the basis of temperature, humidity and vibration sensitive stresses to further improve the evaluation accuracy by synthesizing other various sensitive stresses, and even can be applied to other types of electronic products to be realized by using sensitive stresses including electrical stress, mechanical stress and the like; when other sensitive stress needs to be added, if interaction is not considered, an acceleration model can be constructed by adopting the mode of the formula (4); if the interaction between the stresses is to be considered, the expression of the interaction is as shown in the last two items of the above equation (3).
Since each term in the acceleration model shown in the above formula (1) is a multiplication relation and is relatively complex in mathematical computation, in this embodiment, logarithms are taken from the left and right sides in the formula (1), and each term is changed into an addition-subtraction relation, which is convenient for parameter computation, and after logarithms are taken from the two sides, the result is as follows:
let lnA be alpha0，B＝α1，C＝α2，-D＝α3Then equation (5) can be converted to:
obtaining estimated values of the service life of the electronic control device at each stress level i
Then, using maximum likelihood estimation, the parameter α can be obtained0、α1、α2、α3Is estimated value of
The parameterized acceleration model of the electronic control unit is finally obtained as follows:
that is, in the present embodiment, the lifetime estimation model constructed according to the acceleration model of the formula (1) is as shown in the above formula (7)One step of solving the estimation value of the unknown parameter through an accelerated life test
In this embodiment, step S2 is preceded by a step of performing an accelerated life test preliminary test (reliability enhancement test) on the electronic control device to be evaluated when the electronic control device to be evaluated is powered on to operate, so as to determine the operating limits of the respective sensitive stresses. The working limit of the sensitive stress of the electronic control device is determined by utilizing the pre-test, and the accelerated life test pre-test mainly comprising temperature stress, vibration stress and humidity stress is applied under the condition that the electronic control device works in a power-on mode, so that the potential defects of the device can be excited, the working limit of the life sensitive stress can be determined, the sensitive stress type and the working limit of the product can be verified, and meanwhile, the subsequent accelerated life test required to be executed can be conveniently determined.
In this embodiment, when the accelerated life test is performed, the stress is applied in a stepping stress manner, and the working limit results of the temperature, the humidity, and the vibration stress of the electronic control device to be evaluated are obtained by performing a low-temperature stepping stress test, a high-temperature stepping stress test, a rapid temperature change cycle test, a humidity stepping test, and a vibration stepping test, respectively. In a specific application embodiment, through the implementation of the above pre-test items, the results of the working limits of the temperature, humidity and vibration stress of the electronic control device are obtained as follows: the low temperature working limit is-65 ℃ and the high temperature working limit is 95 ℃; the humidity working limit is 93% RH; the vertical vibration limit is 3.4Grms, and the transverse and longitudinal vibration limits are 3.2 Grms.
In this embodiment, the specific steps of step S2 are as follows:
s21, selecting the highest value of each stress in each test to ensure that each stress level does not exceed the normal working limit of the electronic control device in the test, and determining the number of test groups to be executed according to the number of unknown parameters in the constructed acceleration model;
s22, configuring each stress level in each group of tests according to the selected highest value of each stress in each test and the required number of test groups;
and S23, controlling each stress level in each group of tests configured in the step S22 to execute an accelerated life test on the electronic control device to be evaluated.
When the number of the test groups to be executed is determined, the number is determined according to unknown parameters in the acceleration model or the life estimation model, if n unknown parameters exist in the model, it is determined that at least n groups of tests need to be executed for parameter estimation, so that the test results of at least n groups of tests can be solved to obtain each unknown parameter.
After the number of test sets and the stress operating limit are determined, in step S22, the stress levels in each set of tests are determined by specifically using the orthogonal table formed by each stress. By combining the design principle of test orthogonality, an orthogonality table L is utilized4(23) And each stress level in each group of tests is determined, so that each stress interaction test can be realized, and the state of the electronic control device under different stress actions can be fully tested.
In a specific application embodiment, when an accelerated life test based on three comprehensive stresses of temperature, humidity and vibration is carried out on an electronic control device according to the life sensitive stress analysis and the pre-test result of the electronic control device, the detailed steps comprise:
firstly, according to the principle that the accelerated life test does not change the failure mechanism of a product, namely, the test stress level is required to be ensured not to exceed the normal working limit of the product, the highest value of each test stress is selected, and the highest value of each test stress can be selected as follows by taking the working limit result obtained in the specific application embodiment as an example: high temperature 90 deg.C, humidity 85% RH, vibration (vertical) 2.5 Grms;
then, according to the minimum number of test stress levels required for estimating the unknown parameters of the acceleration model, that is, estimating n unknown parameters in the acceleration model, it is determined that at least n sets of tests need to be carried out for parameter estimation, and since the generalized einlin model is adopted as the acceleration model in this embodiment, 4 unknown parameters need to be estimated (as shown in the above formulas (6) and (7)), at least 4 sets of acceleration tests with different stress levels need to be carried out;
finally, combining the test orthogonal design principle and utilizing an orthogonal table L4(23) Fitting for mixingEach stress level was tested by an electronic control unit, and 4 sets of accelerated stress level tests were arranged.
Since the influence of three stresses of temperature, humidity and vibration on the product life is considered and 2 stress steps (e.g. 80 ℃ and 90 ℃; humidity 85% and 65%; and vibration 2.5Grms and 2Grms) are determined for each test stress, the above considerations are combined to use L at two levels of the three factors in the orthogonal table4(23) Orthogonal table, as follows:
table 1: three factor two level L4(23) Orthogonal table
The test configuration table shown in table 2 can be obtained by substituting the relevant test stress levels into table 1.
Table 2: three-comprehensive stress accelerated life test configuration of electronic control device
In this embodiment, the specific steps of step S3 are as follows: acquiring the temperature, humidity and vibration level of the electronic control device to be evaluated in each group of tests, and acquiring a service life estimated value according to the service life test result of the electronic control device to be evaluated in each group of test stress levels
Then, using maximum likelihood estimation to obtain alpha0、α1、α2、α3Is estimated value of
Obtaining a final life estimation model after parameter solution; in step S4, the normal operating temperature, humidity and vibration level of the electronic control device during field operation are substituted into the model according to the solved life estimation model, so as to obtain the temperature-humidity-based vibrationService life evaluation result L of electronic control device of three comprehensive stressescTherefore, the field service life of the electronic control device can be comprehensively evaluated based on the generalized Ehrun model and the field working stress level.
As shown in fig. 2, after determining the type of the sensitive stress (three comprehensive stresses of temperature, humidity, and vibration), the embodiment determines the working limit of each sensitive stress through an accelerated life test performed on the electronic control device, configures an accelerated life test scheme to be performed based on the three comprehensive stresses, and finally implements life evaluation of the electronic control device based on the life evaluation model after solving parameters in the life evaluation model based on the generalized einlin model from the test result.
The service life evaluation device of the rail transit electronic control device based on the multi-stress comprises:
the acceleration model building module is used for building an acceleration model between various sensitive stresses which comprehensively influence the service life and the service life of the electronic control device based on the generalized Ehrun model, and building a service life estimation model of the electronic control device according to the acceleration model;
the accelerated life test module is used for executing a plurality of groups of accelerated life tests on the electronic control device to be evaluated, and each group of accelerated life tests respectively correspond to different combinations of the sensitive stress levels during the test to obtain a plurality of groups of life test results corresponding to different sensitive stress levels;
and the service life evaluation module is used for evaluating the service life of the electronic control device to be evaluated according to each group of service life test results and the service life estimation model.
The service life evaluation device of the rail transit electronic control device based on multiple stresses in this embodiment corresponds to the service life evaluation method of the rail transit electronic control device based on multiple stresses one to one, and is not described in detail herein.
The service life evaluation device of the rail transit electronic control device based on the multi-stress in the embodiment can also adopt the following steps: comprises computer equipment programmed to execute the steps of the service life evaluation method of the rail transit electronic control device based on the multi-stress.
The embodiment further includes a computer readable storage medium storing a computer program, and the computer program realizes the service life evaluation method of the rail transit electronic control device based on the multi-stress when the computer program is executed.
The service life evaluation device and the service life evaluation method are suitable for rail transit electronic control devices, and can be also suitable for realizing comprehensive service life evaluation in other types of electronic products.
The foregoing is considered as illustrative of the preferred embodiments of the invention and is not to be construed as limiting the invention in any way. Although the present invention has been described with reference to the preferred embodiments, it is not intended to be limited thereto. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical spirit of the present invention should fall within the protection scope of the technical scheme of the present invention, unless the technical spirit of the present invention departs from the content of the technical scheme of the present invention.
Claims (13)
1. A rail transit electronic control device service life assessment method based on multiple stresses is characterized by comprising the following steps:
s1, acceleration model construction: establishing an acceleration model between various sensitive stresses which comprehensively influence the service life and the service life of the electronic control device, and establishing a service life estimation model of the electronic control device according to the acceleration model;
s2, accelerated life test: executing a plurality of groups of accelerated life tests on the electronic control device to be evaluated, wherein each group of accelerated life tests respectively correspond to the combination of different sensitive stress levels during the test, and obtaining a plurality of groups of life test results corresponding to different sensitive stress levels;
s3, model solving: carrying out parameter solution on the constructed life estimation model according to the obtained life test result of each group of sensitive stress levels to obtain a life estimation model after parameter solution;
s4, service life assessment: and acquiring each sensitive stress of the electronic control device to be evaluated under the normal operation condition, and obtaining a service life evaluation result of the electronic control device to be evaluated according to the service life evaluation model after the parameter solution.
2. The method for evaluating the service life of the rail transit electronic control device based on the multiple stresses as claimed in claim 1, wherein the acceleration model is constructed based on a generalized Ailin model and three sensitive stresses of temperature, humidity and vibration, and the specific formula is as follows:
wherein, L is the life of the electronic control device, T is the high temperature stress, RH is the humidity stress, V is the vibration stress, A, B, C, D is the unknown parameter of the model respectively.
3. The method for evaluating the service life of the electronic control device for rail transit based on multiple stresses as claimed in claim 2, wherein the service life estimation model constructed according to the acceleration model is specifically:
wherein the content of the first and second substances,
for the life estimation of the electronic control unit at each test stress level,
is a parameter alpha0、α1、α2、α3Estimated value of, alpha0＝lnA，α1＝B，α2＝C，α3And D, i is the number of trials.
4. The method for evaluating the service life of the electronic control device for rail transit based on multiple stresses as claimed in claim 3, wherein the specific steps of constructing the service life estimation model of the electronic control device in the step S1 are as follows:
the method comprises the following steps of constructing an acceleration model comprehensively comprising three stresses of temperature, humidity and vibration:
carrying out logarithm taking operation on the constructed acceleration model to convert the acceleration model into:
let lnA be alpha0、B＝α1、C＝α2、-D＝α3Obtaining:
and then converting based on the estimation parameters to obtain a final life estimation model as follows:
wherein the content of the first and second substances,
for the life estimates of the electronic control unit at each set of test stress levels,
is a parameter alpha0、α1、α2、α3I is the number of test groups.
5. The method for evaluating the service life of the electronic control device for rail transit based on multiple stresses as claimed in claim 3 or 4, wherein the specific steps of the step S3 are as follows: acquiring the temperature, humidity and vibration level of the electronic control device to be evaluated in each group of tests according to the conditionsEvaluating the service life test results of the electronic control device under each group of test stress levels to obtain a service life estimated value
Obtaining alpha using maximum likelihood estimation0、α1、α2、α3Is estimated value of
And obtaining a life estimation model after parameter solution.
6. The method for evaluating the service life of the rail transit electronic control device based on multiple stresses as claimed in any one of claims 1 to 4, wherein before the step S1, a sensitive stress determination step is further included, and the specific steps are as follows: and acquiring one or more of operating environment data, field operating data, fault data and test data of the electronic control device to be evaluated, and determining each sensitive stress influencing the service life.
7. The method for evaluating the service life of the rail transit electronic control device based on multiple stresses as claimed in any one of claims 1 to 4, wherein the step S2 comprises the following steps:
s21, selecting the highest value of each stress in each test to ensure that each stress level does not exceed the normal working limit of the electronic control device in the test, and determining the number of test groups to be executed according to the number of unknown parameters in the constructed acceleration model;
s22, configuring each stress level in each group of tests according to the selected highest value of each stress in each test and the required number of test groups;
and S23, controlling each stress level in each group of tests configured in the step S22 to execute an accelerated life test on the electronic control device to be evaluated.
8. The method for evaluating service life of electronic control device for rail transit based on multiple stresses as claimed in claim 7, wherein the step S22 is implemented by using an orthogonal table formed by each stress to determine each stress level in each set of tests.
9. The method for evaluating service life of electronic control devices for rail transit based on multiple stresses as claimed in claim 7, wherein the step S2 is preceded by the step of performing an accelerated life test pre-test on the electronic control device to be evaluated to determine the working limit of each sensitive stress when the electronic control device to be evaluated is powered on to work.
10. The method for evaluating the service life of the electronic control device for rail transit based on multiple stresses according to claim 9, wherein when the preliminary test for the accelerated service life test is executed, the stress is applied in a stepping stress mode, and the working limit results of the temperature, the humidity and the vibration stress of the electronic control device to be evaluated are obtained by respectively executing a low-temperature stepping stress test, a high-temperature stepping stress test, a rapid temperature change cycle test, a humidity stepping test and a vibration stepping test.
11. A rail transit electronic control device life evaluation device based on multiple stresses is characterized by comprising:
the system comprises an acceleration model building module, a service life estimation module and a service life estimation module, wherein the acceleration model building module is used for building an acceleration model between various sensitive stresses which comprehensively influence the service life and the service life of an electronic control device and building a service life estimation model of the electronic control device according to the acceleration model;
the accelerated life test module is used for executing a plurality of groups of accelerated life tests on the electronic control device to be evaluated, and each group of accelerated life tests respectively correspond to the combination of different sensitive stress levels to obtain a plurality of groups of life test results corresponding to different sensitive stress levels;
the model solving module is used for carrying out parameter solving on the built life estimation model according to the obtained life test results of each group of sensitive stress levels to obtain a life estimation model after parameter solving;
and the service life evaluation module is used for acquiring each sensitive stress of the electronic control device to be evaluated under the normal operation condition and obtaining a service life evaluation result of the electronic control device to be evaluated according to the service life evaluation model after the parameter solution.
12. A service life evaluation device of an electronic control device of rail transit based on multiple stresses, comprising computer equipment, characterized in that the computer equipment is programmed to execute the steps of the service life evaluation method of the electronic control device of rail transit based on multiple stresses according to any one of claims 1 to 10.
13. A computer-readable storage medium storing a computer program, which when executed implements the method for estimating the lifetime of an electronic control device for multi-stress-based rail transit according to any one of claims 1 to 10.
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