CN112179864A - Infrared spectrum appearance amplification sampling circuit - Google Patents
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- CN112179864A CN112179864A CN202011048825.2A CN202011048825A CN112179864A CN 112179864 A CN112179864 A CN 112179864A CN 202011048825 A CN202011048825 A CN 202011048825A CN 112179864 A CN112179864 A CN 112179864A
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- 238000005070 sampling Methods 0.000 title claims abstract description 49
- 230000003321 amplification Effects 0.000 title claims abstract description 26
- 238000003199 nucleic acid amplification method Methods 0.000 title claims abstract description 26
- 238000002329 infrared spectrum Methods 0.000 title description 2
- 238000006243 chemical reaction Methods 0.000 claims abstract description 16
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 12
- 238000010586 diagram Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 241000282414 Homo sapiens Species 0.000 description 3
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 description 3
- MCMSPRNYOJJPIZ-UHFFFAOYSA-N cadmium;mercury;tellurium Chemical compound [Cd]=[Te]=[Hg] MCMSPRNYOJJPIZ-UHFFFAOYSA-N 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
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- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- VXPLXMJHHKHSOA-UHFFFAOYSA-N propham Chemical compound CC(C)OC(=O)NC1=CC=CC=C1 VXPLXMJHHKHSOA-UHFFFAOYSA-N 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
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- 238000012360 testing method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/21—Pc I-O input output
- G05B2219/21129—Low pass filter for input
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/21—Pc I-O input output
- G05B2219/21137—Analog to digital conversion, ADC, DAC
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Abstract
An infrared spectrometer amplification sampling circuit belongs to the field of atmospheric composition measurement. The infrared spectrometer amplification sampling circuit comprises a power supply conversion module, a sensor and preamplifier module, an amplifier main body module, an ADC (analog to digital converter) module and an interface module, wherein the amplifier main body module comprises a fixed gain amplifier, a variable gain amplifier and a low-pass filter which are sequentially connected. The sampling circuit has 18-bit resolution, low noise and 6-gear variable gain, the maximum gain is ll0dB, and the bandwidth covers 8 KHz-110 KHz.
Description
Technical Field
The invention relates to an amplification sampling circuit of an infrared spectrometer, belonging to the field of atmospheric component measurement.
Background
In recent years, the global climate changes remarkably, the average air temperature rises year by year, the climate directly affects the living environment of human beings, and the climate becomes one of the political problems of several hot spots in the world along with the increase of attention and disputes in the world, and the climate, the economy and the national safety in the world including China are deeply affected. Since the industrial revolution, atmospheric pollution events frequently occurring around the world have more urgently caused human beings to feel the severity of atmospheric problems. The atmospheric problem has become not only a leading-edge problem of natural science but also a political problem concerning sustainable development of society and economy, national security, and environmental outages. The crux of solving the atmospheric problem is to measure the atmospheric components of a specific level. The UARS of the upper atmosphere research satellite emitted in the United states in 1991 has proved the destruction of the ozone layer by Freon and other substances generated by human production activities through the direct determination of the structure and components of the ozone layer for the first time, and directly prompted the first decision on the prohibition of Freon in 1994 by the International pollution control agency (IPPC). The atmospheric composition is used for researching the atmospheric ring, the atmospheric ring plays an important role in researching climate change and atmospheric pollution, and the measurement of atmospheric related data and dynamic characteristics is the basis for analyzing the climate change trend of the earth and evaluating the gas pollution degree.
For the detection of atmospheric components, a spectrometer with an infrared band and a microwave band is usually selected for remote sensing measurement, because for some important intermediate layers of the atmosphere, a meteorological balloon is too high, a sphere with too low air pressure may burst and cannot be used, and a satellite carrying a contact type measurement load is too low in orbit, and can be burnt or cannot be used due to serious friction, so that remote sensing measurement equipment such as the infrared spectrometer and the like is widely applied. In an infrared spectrometer, an amplification sampling circuit for amplifying and quantifying weak remote sensing signals is one of key components, and the performance of the amplification sampling circuit is good and bad, so that the precision of the infrared spectrometer is directly influenced.
Disclosure of Invention
The invention provides an infrared spectrometer amplification sampling circuit, which has the advantages of 18-bit resolution, low noise, 6-grade variable gain and maximum gain ll0dB, and the bandwidth covers 18 KHz-110 KHz, and the structure is simple and reasonable.
The invention adopts the following technical scheme for solving the technical problems:
an infrared spectrometer amplification sampling circuit comprises a power supply conversion module, a sensor and preamplifier module, an amplifier main body module, an ADC (analog to digital converter) module and an interface module, wherein the sensor and preamplifier module, the amplifier main body module, the ADC module and the interface module are sequentially connected; the amplifier main body module comprises a fixed gain amplifier, a variable gain amplifier and a low-pass filter which are connected in sequence.
The sensor and preamplifier module includes an indium antimonide (InSb) sensor and a Mercury Cadmium Telluride (MCT) sensor.
The InSb sensor will produce an electrical signal of 47 KHz-110 KHz and the MCT sensor will produce an electrical signal of 18 KHz-47 KHz.
The variable gain amplifier sets six exponentially increasing amplification factor steps of 1, 2, 4, 8, 16, 32.
The bandwidth of the low-pass filter is set to be 18 KHz-110 KHz.
The invention has the following beneficial effects:
the sampling circuit has 18-bit resolution, low noise and 6-gear variable gain, the maximum gain is ll0dB, and the bandwidth covers 8 KHz-110 KHz.
Drawings
FIG. 1 is a block diagram of the system of the present invention.
Fig. 2 is a basic structure diagram of the amplifying and sampling circuit according to the present invention.
Fig. 3 is a hierarchical diagram of an infrared sampling amplifying circuit according to the present invention.
Fig. 4 is a circuit diagram of a fixed gain amplifier according to the present invention.
Fig. 5 is a circuit diagram of a variable gain amplifier according to the present invention.
Fig. 6 is a circuit diagram of a low pass filter according to the present invention.
Fig. 7 is a circuit diagram of an ADC sampling clock according to the present invention.
Fig. 8 is a circuit diagram of an ADC input driver according to the present invention.
FIG. 9 is a circuit diagram of an input/output interface according to the present invention.
Fig. 10 is a circuit diagram of a digital power supply according to the present invention.
Fig. 11 is a circuit diagram of an analog power supply according to the present invention.
FIG. 12 is a circuit diagram of a reference power supply according to the present invention.
Detailed Description
In order to make the technical spirit of the present invention fully understandable, the following detailed description of the embodiments of the present invention is described in detail with reference to the accompanying drawings, but the description of the embodiments is not a limitation to the technical solution, and any changes in form and not in substance according to the inventive concept should be regarded as the protection scope of the present invention.
Referring to fig. 1, an amplification and sampling circuit of a low-noise 18-bit resolution infrared spectrometer with a bandwidth covering 18KHz to 110KHz converts an interference optical signal obtained by an optical module into an electrical signal, and amplifies and quantizes the electrical signal according to a gain required by a control module.
Referring to fig. 2, the circuit design of the amplifier main body is shown first. Considering the ll0dB gain required by the system, the amplifier circuit main body part needs to provide 70dB gain, rather than the 40dB gain provided by the sensor matched preamplifier, and is relatively high, so that a multi-stage amplification structure is adopted; the amplifier main body part also comprises a first-stage variable gain amplifier; in order to ensure the noise performance of the system, a fixed gain stage with excellent noise performance is arranged at the forefront end of the amplifier; in order to further reduce the noise of the amplifier, a low-pass filter is arranged at the last stage of the amplifier to filter out the out-of-band noise. The gain of 40dB is set for the fixed gain amplifier, the variable gain amplifier is set to six amplification factor steps of 1, 2, 4, 8, 16, 32 and the like, and the bandwidth of the low-pass filter is set to be 18 KHz-110 KHz. The second is ADC circuit, sampling circuit, the input and output interface part for easy connection with other parts in the infrared spectrometer system, and the last is power supply part. The circuits are processed in a unified mode, a power supply conversion module is added, and a unified power supply of the system is converted into a power supply meeting the requirements of the circuits.
Referring to fig. 2, the ADC circuit is implemented with AD7679 as a core, and further includes a sampling clock circuit and a driving circuit, in this embodiment, since there is no control module with good real-time performance at the rear end of the amplifying and sampling circuit, and the measurement accuracy of the instrument itself is directly related to the real-time performance of the circuit system in the measurement process, and the ADC cannot be controlled in real time well, the ADC selects an active working mode, the ADC processes most of the sampling process, and other modules simply control the ADC only by the sampling clock and gating of the output signal.
Referring to fig. 3, a schematic diagram of an amplifying and sampling circuit is specifically designed according to a basic structure diagram of the amplifying and sampling circuit. The schematic diagram of the amplifying and sampling circuit adopts a hierarchical design method from top to bottom, and the amplifying and sampling circuit is divided into the following layers, namely: the infrared sampling amplifying circuit includes: a power conversion part, an amplifier main body part, an ADC analog/digital conversion part and an interface circuit part; wherein the amplifier main part includes: a fixed gain amplifier, a variable gain amplifier and a low pass filter.
With continued reference to fig. 3, one of the two symmetrical amplifying and sampling circuits is shown, and in order to reduce mutual interference, the two circuits are completely isolated except for the ± 8V power supply, and are composed of two separate circuit boards.
Referring to fig. 4, in this stage, the very low noise operational amplifier AD797 is directly used to form a homodromous amplifier circuit, and the 50-ohm resistor R8 matches the output port of the front-end operational amplifier on one hand, and provides a current channel for the operational amplifier on the other hand, so that the AD797 can normally operate even when no input is provided. Gain setting resistors R1 and R7 are selected to be small as much as possible to reduce noise, a precise multi-turn adjustable resistor is arranged between an operational amplifier 1 pin and an operational amplifier 5 pin and used for compensating input offset, and the total adjusting range of the resistor is several mV. The capacitance between the 6-pin and the 8-pin, and the 8-pin and the ground is used for compensating signal distortion.
Referring to fig. 5, the variable gain stage is implemented by LTC6910-2, the gain is set by three pins G2, G1, G0, the gain is 0 when G2G1G0=000, the gain is-1 when G2G1G0=001, the gain is-2 when G2G1G0=010, the gain is-4 when G2G1G0=011, and so on until the gain is-64 when G2G1G0=111, which is not used in actual circuits, but is very useful in circuit testing.
Referring to fig. 6, to design a filter, first, an appropriate filter type and cutoff frequency are selected. Among the commonly used low-pass filters, the Butterworth (Butterworth) filter has the flattest passband, the Chebyshev (Chebyshev) filter has the fastest passband edge cutoff, and the Bessel (Bessel) filter has the best group delay characteristics and is substantially constant within the passband. In the invention, the output of the infrared amplification sampling circuit needs to be synchronous with the clock of the laser circuit to correct the deviation of the movement of a mechanical part, only when the time delay of the amplification circuit is constant, the later synchronization only needs to add the time delay to a signal with smaller time delay, therefore, the filter in the invention adopts a Bessel filter, simultaneously, the gain reduction of a pass band brings signal distortion, the frequency spectrum is properly extended at the edge of the pass band, the cut-off frequency of the filter is set to 73KHZ (18 KHZ to 47KHZ pass band) and 156KHZ (47 KHZ to 110KHZ pass band) to reduce the distortion, the order of the filter is set to 4 orders, namely, the noise bandwidth is effectively controlled, the realization is convenient, and based on the consideration of convenience and circuit stability, a 156c 3-3 monolithic filter chip of Linear company is adopted in the realization process.
Referring to fig. 7, the ADC circuit is implemented with AD7679 as a core, and further includes a sampling clock circuit, a driver circuit, and a single-ended signal to differential circuit.
Referring to fig. 7, since the AD7679 has a plurality of operation modes and output interfaces, an appropriate operation mode and output interface are selected according to the requirement. In the invention, the rear end of the amplifying and sampling circuit is not provided with a control module with enough real-time performance, and the measurement precision of the instrument is directly related to the real-time performance of a circuit system in the measurement process, so that the ADC cannot be well controlled in real time. Most of the sampling process is processed by the ADC, and other modules simply control the ADC through a sampling clock and gating of an output signal. Considering that in some measurement environments, the amplifying and sampling circuit and the back-end module are separated by a certain distance (generally within 2 meters), in order to enable the digital signal to be transmitted between the amplifying and sampling circuit and the back-end module with low bit error rate, not only a driving or buffering chip needs to be added at the signal sending and receiving ends, but also the signal sending speed needs to be reduced, so that the data communication between the ADC and the back-end module adopts a low-speed parallel mode, and the ADC output interface is set to be 18-bit parallel output. According to the conclusion, the mode bit of the ADC is set, and the ADC circuit can normally sample the input signal under the control of the clock after the normal power supply is grounded.
Referring to fig. 7, the AD7679 is high in accuracy, and the sampling accuracy is affected by various disturbances, wherein the aperture jitter of the sampling clock has a great influence on the accuracy, so that the sampling clock of the invention is from a laser circuit with extremely high stability, but the clock output by the laser circuit is a negative level signal, and the overall amplitude is lower than the common 5V TTL level. In order to raise the level of the negative level and fully isolate the laser circuit and the amplification sampling circuit at the same time to avoid mutual interference of the laser circuit and the amplification sampling circuit, a high-speed optocoupler 6N137 is adopted to complete the functions of level conversion and circuit isolation. The 6N137 is a high-speed device with the speed of 10Mbps, and two resistors R36 and R27 in the circuit respectively play roles in impedance matching and current limiting.
Referring to FIG. 8, the ADC input driving circuit selects AD8021 as the core chip, which has high DC precision, less than 1mv of offset, and temperature drift as low as 0.5uV ^ based on the standard value0And C, alternating current noise is 2.1nV/rtHz, the gain bandwidth is 190MHz, the transient response is excellent, the 1V step response is stabilized to 0.01 percent and only 23ns is needed, and the requirement of an AD7679 driver can be fully met.
Referring to fig. 8, the circuit directly adopts AD8021 to form a voltage follower, a first-order low-pass filter is added at the output end of the voltage follower, the cut-off frequency of the first-order low-pass filter is as high as 7.2MHz, the first-order low-pass filter does not affect the input signal of 385KHz which is half of the maximum sampling rate of the ADC, and can effectively suppress broadband noise, in addition, the resistance of R28 is very small, the setup time of the input end is not affected, but when the input voltage is higher than 5V, R28 plays a role in protecting the ADC by limiting voltage.
Referring to fig. 9, the input/output interface circuit mainly plays a role of buffering and level conversion, and here, since the back-end module and the amplifying and sampling circuit both use 5V TTL levels, the level conversion function is not performed. Since the input and output signals comprise 8-bit status interfaces and the 20-bit data interface (including two ground wires) totals 28 bits, two SN74AHCT16245 sheets are adopted.
The bandwidth of the infrared spectrometer amplification sampling circuit covers 18 KHz-110 KHz, 18bit resolution, low noise, 6-gear variable gain and maximum gain of 110 dB. The circuit converts interference light signals obtained by the optical module into electric signals, amplifies and quantifies the electric signals according to gains required by the control module, and belongs to the field of atmospheric composition measurement. The amplifier part in the circuit is composed of a fixed gain amplifier, a variable gain amplifier and a 4-order Bessel low-pass filter according to the signal flow direction, the overall performance is 70dB gain, a low noise amplifier with the bandwidth of 18 KHz-110 KHz, in addition, the basic structure also comprises an 18bit high-precision sampling circuit, an input and output interface circuit and a power supply conversion circuit which can provide a power supply meeting the requirements for other modules and can work normally.
The amplification sampling circuit specifically comprises a power supply conversion part, an amplifier main body, an ADC part and an interface part, wherein the amplifier main body comprises a fixed gain amplifier, a variable gain amplifier and a low-pass filter.
Referring to fig. 10, in the analog-to-digital mixed signal circuit, power supplies are respectively designed based on the consideration of reducing the mutual interference of the analog and digital signals. The digital power supply is relatively simple, common levels such as 5V, 3.3V and the like are generally used, and a proper chip is selected according to requirements of voltage, current, precision, noise and the like. In the invention, a 5V power supply is independently selected for a digital part, and according to the typical application of AD7679, an ADP3334 variable output chip is used, and the output voltage of the ADP3334 variable output chip can be adjusted through a resistor. The regulated voltage can be used for normal work of the AD7679 digital part, SN74AHCT16245 and the like, and the working temperature of the voltage is within an allowable range.
Referring to fig. 11, the design of the analog power supply is the key of the power supply design in the high-precision analog-digital hybrid circuit. Firstly, an analog signal is bipolar input, but finally can not exceed +/-5V at an ADC input port, in an analog circuit signal transmission line, except a first-stage chip AD7679 and an ADC driving AD8021, the analog circuit signal transmission line is a rail-to-rail input and output chip, so that the requirement can be met by using +/-5V as a power supply for the chips, and the AD7679 is at the forefront, so that the processed signal is smaller, and the required +/-5V is enough; the power supply can output +/-5V only when the power supply is more than +/-7V, but the power supply input by the system cannot be directly used as the power supply of the AD8021 to ensure the noise performance, and the power supply needs to be subjected to one-stage conversion. The digital power supply chip ADP3334 can only ensure that +5V is output when the input voltage is higher than 5.2V, and meanwhile, the input voltage cannot exceed 11V. According to the requirement that a bipolar high-precision power supply is needed by a system, particularly a high-precision negative power supply, the circuit selects an LT1962, LT1964 and low-noise low-voltage-drop power supply conversion chip as candidates of a positive power supply chip and a negative power supply chip, and a 0.5V voltage difference is needed between the input and the output of the chip. In order to reduce the voltage difference on each chip and reduce the power and the heat productivity of the chip, a group of power supplies which are in accordance with the constraints and have the lowest voltage are selected, according to the standard, an input power supply is selected to be +/-8V (an infrared spectrometer is provided with a special power supply module, the total power supply voltage of an amplification sampling circuit can be selected), an AD8021 power supply is +/-7V, other analog chip power supplies are selected to be +/-5V, and +/-7V generated by +/-8V conversion and +/-5V generated by +/-7V conversion are determined based on the difference of noise requirements of all parts, so that +/-5V has the highest precision, the noise is the minimum, the power supplies are used as the power supplies of the front-stage circuits of the amplifier with strict noise performance requirements, and +/-7V has noise characteristics which are compared with +/-5V times, and the power supplies are used as ADC driving.
Referring to fig. 12, the design of the circuit reference source is also based on noise and precision considerations, two reference sources are required in the circuit, the ADC reference source REF +5V, the single-ended to differential chip reference source REF +2.5V, the two reference sources are directly related, precision noise and the like are consistent, because REF +2.5V exists as a common mode voltage at the input end of the ADC, when the ADC reference source is determined, the common mode voltage directly affects the conversion behavior of the ADC, in order to allow the two to change synchronously to reduce circuit noise, REF +2.5V and REF +5V need to be from the same chip, an ADR43x series chip is adopted in the circuit to generate REF +2.5V, and REF +5V is generated by an in-phase amplifying circuit.
Claims (5)
1. An infrared spectrometer amplification sampling circuit is characterized by comprising a power supply conversion module, a sensor and preamplifier module, an amplifier main body module, an ADC (analog to digital converter) module and an interface module, wherein the sensor and preamplifier module, the amplifier main body module, the ADC module and the interface module are sequentially connected; the amplifier main body module comprises a fixed gain amplifier, a variable gain amplifier and a low-pass filter which are connected in sequence.
2. The infrared spectrometer amplification sampling circuit of claim 1, wherein the sensor and preamplifier module comprises an InSb sensor and an MCT sensor.
3. The infrared spectrometer amplification sampling circuit of claim 2, wherein the InSb sensor will generate an electrical signal of 47 KHz-110 KHz, and the MCT sensor will generate an electrical signal of 18 KHz-47 KHz.
4. The infrared spectrometer amplification sampling circuit of claim 1, wherein the variable gain amplifier is configured with 1, 2, 4, 8, 16, 32, six exponentially increasing amplification factor steps.
5. The infrared spectrometer amplification sampling circuit of claim 1, wherein the low pass filter has a bandwidth set in a range of 18KHz to 110 KHz.
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| CN202011048825.2A CN112179864A (en) | 2020-09-29 | 2020-09-29 | Infrared spectrum appearance amplification sampling circuit |
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| CN202011048825.2A CN112179864A (en) | 2020-09-29 | 2020-09-29 | Infrared spectrum appearance amplification sampling circuit |
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|---|---|---|---|---|
| US20100027004A1 (en) * | 2008-07-30 | 2010-02-04 | Precisive, LLC | Methods and systems for chemical composition measurement and monitoring using a rotating filter spectrometer |
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| CN104298149A (en) * | 2014-09-22 | 2015-01-21 | 北京工业大学 | Self-adaptive range signal collecting circuit of chromatographic instrument |
| CN206727963U (en) * | 2017-05-18 | 2017-12-08 | 武汉大学 | A kind of radio-frequency power amplifier of controllable gain |
| CN107525781A (en) * | 2016-06-22 | 2017-12-29 | 许亚夫 | A kind of infrared spectrometer amplifies sample circuit |
-
2020
- 2020-09-29 CN CN202011048825.2A patent/CN112179864A/en active Pending
Patent Citations (5)
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|---|---|---|---|---|
| US20100027004A1 (en) * | 2008-07-30 | 2010-02-04 | Precisive, LLC | Methods and systems for chemical composition measurement and monitoring using a rotating filter spectrometer |
| US20120075131A1 (en) * | 2010-09-23 | 2012-03-29 | Lsi Corporation | Systems and Methods for Enhancing Analog to Digital Conversion Resolution |
| CN104298149A (en) * | 2014-09-22 | 2015-01-21 | 北京工业大学 | Self-adaptive range signal collecting circuit of chromatographic instrument |
| CN107525781A (en) * | 2016-06-22 | 2017-12-29 | 许亚夫 | A kind of infrared spectrometer amplifies sample circuit |
| CN206727963U (en) * | 2017-05-18 | 2017-12-08 | 武汉大学 | A kind of radio-frequency power amplifier of controllable gain |
Non-Patent Citations (2)
| Title |
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