CN112164412A - 一种基于多尺度磁性隧道结的多比特忆阻器 - Google Patents
一种基于多尺度磁性隧道结的多比特忆阻器 Download PDFInfo
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- CN112164412A CN112164412A CN202010915039.1A CN202010915039A CN112164412A CN 112164412 A CN112164412 A CN 112164412A CN 202010915039 A CN202010915039 A CN 202010915039A CN 112164412 A CN112164412 A CN 112164412A
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- China
- Prior art keywords
- read
- bit
- mtj
- write
- memristor
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1653—Address circuits or decoders
- G11C11/1655—Bit-line or column circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1653—Address circuits or decoders
- G11C11/1657—Word-line or row circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Hall/Mr Elements (AREA)
- Semiconductor Memories (AREA)
Abstract
Description
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010915039.1A CN112164412A (zh) | 2020-09-03 | 2020-09-03 | 一种基于多尺度磁性隧道结的多比特忆阻器 |
Applications Claiming Priority (1)
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CN202010915039.1A CN112164412A (zh) | 2020-09-03 | 2020-09-03 | 一种基于多尺度磁性隧道结的多比特忆阻器 |
Publications (1)
Publication Number | Publication Date |
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CN112164412A true CN112164412A (zh) | 2021-01-01 |
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CN202010915039.1A Pending CN112164412A (zh) | 2020-09-03 | 2020-09-03 | 一种基于多尺度磁性隧道结的多比特忆阻器 |
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CN (1) | CN112164412A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113314178A (zh) * | 2021-05-07 | 2021-08-27 | 浙江树人学院(浙江树人大学) | 一种忆阻器读写方法 |
CN115394444A (zh) * | 2022-09-06 | 2022-11-25 | 广东技术师范大学 | 基于模糊理论的健康状况分层量化评估实现方法及*** |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040047204A1 (en) * | 2002-09-09 | 2004-03-11 | Industrial Technology Research Institute | High density magnetic random access memory |
US20080298119A1 (en) * | 2007-05-30 | 2008-12-04 | Industrial Technology Research Institute | Magnetic memory cell with multiple-bit in stacked strucrute and magnetic memory device |
US20130201757A1 (en) * | 2012-02-07 | 2013-08-08 | Qualcomm Incorporated | Multi-free layer mtj and multi-terminal read circuit with concurrent and differential sensing |
US20200013443A1 (en) * | 2017-03-09 | 2020-01-09 | Sony Semiconductor Solutions Corporation | Magnetic memory, recording method of magnetic memory, and reading method of magnetic memory |
-
2020
- 2020-09-03 CN CN202010915039.1A patent/CN112164412A/zh active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040047204A1 (en) * | 2002-09-09 | 2004-03-11 | Industrial Technology Research Institute | High density magnetic random access memory |
US20080298119A1 (en) * | 2007-05-30 | 2008-12-04 | Industrial Technology Research Institute | Magnetic memory cell with multiple-bit in stacked strucrute and magnetic memory device |
US20130201757A1 (en) * | 2012-02-07 | 2013-08-08 | Qualcomm Incorporated | Multi-free layer mtj and multi-terminal read circuit with concurrent and differential sensing |
US20200013443A1 (en) * | 2017-03-09 | 2020-01-09 | Sony Semiconductor Solutions Corporation | Magnetic memory, recording method of magnetic memory, and reading method of magnetic memory |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113314178A (zh) * | 2021-05-07 | 2021-08-27 | 浙江树人学院(浙江树人大学) | 一种忆阻器读写方法 |
CN115394444A (zh) * | 2022-09-06 | 2022-11-25 | 广东技术师范大学 | 基于模糊理论的健康状况分层量化评估实现方法及*** |
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PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Li Hai Inventor after: Zhi Taoyun Inventor after: Zhou Tiejun Inventor after: Fu Jiayu Inventor after: Wang Zhe Inventor before: Zhi Taoyun Inventor before: Li Hai Inventor before: Zhou Tiejun Inventor before: Fu Jiayu Inventor before: Wang Zhe |
|
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20210101 |