CN112069170B - Probe Card Cloud Management System - Google Patents
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- CN112069170B CN112069170B CN202010758215.5A CN202010758215A CN112069170B CN 112069170 B CN112069170 B CN 112069170B CN 202010758215 A CN202010758215 A CN 202010758215A CN 112069170 B CN112069170 B CN 112069170B
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- 238000004519 manufacturing process Methods 0.000 claims abstract description 26
- 238000012544 monitoring process Methods 0.000 claims abstract description 20
- 238000003780 insertion Methods 0.000 claims abstract description 13
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- 230000002457 bidirectional effect Effects 0.000 claims description 4
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- 230000002093 peripheral effect Effects 0.000 description 1
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- G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
- G06F16/22—Indexing; Data structures therefor; Storage structures
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a probe card cloud management system, which relates to the field of probe card test management and comprises the following components: and the probe station is used for connecting a testing machine and recording and sending the probe needle insertion times. The invention realizes that the needle insertion times can be recorded in real time and the server is uploaded by simply modifying the test program used by the probe card through the probe station, the recording module, the testing machine, the storage module, the server and the production management system, and data archiving statistics can be carried out by matching with the production operation management system, so that the use state and the service life of the probe card can be effectively managed, the data interface management is defined creatively, the communication management with an MES (production management system) can be efficiently carried out, the needle insertion service life information can be uploaded to the system in real time, the hardware management and control are convenient, the on-cloud system management can be realized by the state of the probe card, and the monitoring can be checked at any time and any place.
Description
Technical Field
The invention relates to the field of probe card test management, in particular to a probe card cloud management system.
Background
The probe card is a test interface device, which is used for directly contacting the probe on the probe card with the welding pad or the convex block on the chip to lead out the chip signal, and then matching with the peripheral test instrument and the software control to achieve the purpose of automatic measurement.
The probe card is mainly divided into two parts, one part is a PCB card, the other part is a probe, the probe is an easy-to-consume product, the needle inserting frequency is of a certain service life, after the service life is reached, the probe card can not be used basically, so that effective statistics on the needle inserting frequency of the probe card is required to be carried out timely and accurately, the state of the probe card is monitored, the statistics mode of the needle inserting frequency of the probe card in the market at present mainly uses a probe station to automatically record the needle inserting frequency, then manually records data on the probe station to collect and accumulate the needle inserting frequency of the probe card, the needle inserting frequency of the probe card is required to be manually cleared and reset before the probe card is used each time, when the probe card is replaced, the needle inserting frequency data of the probe card is required to be manually uploaded to a server, the automation degree of the mode is very low, if an operator forgets to clear and reset the needle inserting frequency of the probe card collected on the probe station or forgets to upload the needle inserting frequency of the probe card on the probe station timely, the total needle inserting frequency of the probe card is inaccurate, and the total number of the probe card can not be pre-determined in advance for the service life of the probe card.
Disclosure of Invention
The invention aims at solving the problems of the prior art, and provides a probe card cloud management system, which aims at solving the problems that in the current market, the statistics mode of the probe card puncture times is mainly to automatically record the puncture times by using a probe station, then manually recording data on the probe station to record the probe card puncture times in a summarizing and accumulating way, manually resetting the probe card puncture data on the probe station before each use of the probe card, and manually uploading the probe card puncture times data to a server when the probe card is replaced.
The aim of the invention can be achieved by the following technical scheme: a probe card cloud management system comprising:
the probe station is used for connecting a testing machine and recording and transmitting the needle insertion times of the probe;
the recording module is used for recording the needle insertion times of the probe in real time and sending the recorded data to the storage module in real time;
the testing machine is used for testing the service life of the probe part of the probe card;
the storage module is used for receiving the real-time data sent by the recording module, storing the real-time data and then sending the real-time data to the server;
the server is used for receiving the service life data of the testing machine and the real-time data sent by the storage module and sending the service life data and the real-time data to the production management system;
and the production management system is used for displaying the service life of the probe and can be checked through the client.
Preferably, the output end of the probe station is electrically connected with a recording module, the output end of the recording module is electrically connected with a testing machine, the output end of the testing machine is electrically connected with a storage module, the output end of the storage module is electrically connected with a server, the output end of the server is electrically connected with a production management system, and the input end of the production management system is electrically connected with a client.
Preferably, the probe station is in bidirectional electrical connection with the testing machine, the output end of the recording module is electrically connected with a frequency recording module, a data monitoring module and a data decision module, and the output end of the frequency recording module is electrically connected with a data superposition module and a data repetition module.
Preferably, the data repeating module is electrically connected with the data monitoring module in a bidirectional manner, and the output end of the data monitoring module is electrically connected with the data decision module.
Preferably, the output end of the frequency recording module is electrically connected with a storage module, and the output end of the data decision module is electrically connected with the storage module.
Preferably, the output end of the storage module is electrically connected with a data collection module, a data packaging module and a data sending module, and the output end of the data collection module is electrically connected with a time module and a state module.
Preferably, the method comprises the following steps:
s1: firstly, a probe station is required to be connected with a testing machine, then testing can be started, a recording module in the probe station records data tested by the testing machine, under normal use conditions, the data in the recording module are continuously overlapped and refreshed, a frequency recording module sends the recorded refreshed data comprising time and state to a storage module, and the storage module stores the data;
s2: if the service life of the probe is about to end, the data is repeated, the data monitoring module is triggered after the data is repeated once to monitor the recording process, and if the data is repeated for three times by the data repeating module, the data monitoring module informs the data decision module, and the data decision module sends a control command to the storage module;
s3: in the storage module, not only the superposition data from the recording module, including the repetition data, but also the repetition data, including the time and the state, can be received together, a data collection module can be formed in the storage module, the data decision module notifies the storage module that the probe is damaged, then the data packing module in the storage module packs all the data, and then the data is sent to the server through the data sending module, and the packed data is remained in the storage module;
s4: the server receives all the data and sends it to the production management system where the customer can view it through the client.
Compared with the prior art, the invention has the beneficial effects that:
1. the invention realizes that the needle insertion times can be recorded in real time and the server is uploaded by simply modifying the test program used by the probe card through the probe station, the recording module, the testing machine, the storage module, the server and the production management system, and data archiving statistics can be carried out by matching with the production operation management system, so that the use state and the service life of the probe card can be effectively managed, the data interface management is defined creatively, the communication management with an MES (production management system) can be efficiently carried out, the needle insertion service life information can be uploaded to the system in real time, the hardware management and control are convenient, the on-cloud system management can be realized by the state of the probe card, and the monitoring can be checked at any time and any place.
Drawings
FIG. 1 is a flow chart of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "configured" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art. Hereinafter, an embodiment of the present invention will be described in accordance with its entire structure.
Referring to fig. 1, a probe card cloud management system includes:
the probe station is used for connecting a testing machine and recording and transmitting the needle insertion times of the probe;
the recording module is used for recording the needle insertion times of the probe in real time and sending the recorded data to the storage module in real time;
the testing machine is used for testing the service life of the probe part of the probe card;
the storage module is used for receiving the real-time data sent by the recording module, storing the real-time data and then sending the real-time data to the server;
the server is used for receiving the service life data of the testing machine and the real-time data sent by the storage module and sending the service life data and the real-time data to the production management system;
and the production management system is used for displaying the service life of the probe and can be checked through the client.
The invention realizes that the needle insertion times can be recorded in real time and the server is uploaded by simply modifying the test program used by the probe card through the probe station, the recording module, the testing machine, the storage module, the server and the production management system, and data archiving statistics can be carried out by matching with the production operation management system, so that the use state and the service life of the probe card can be effectively managed, the data interface management is defined creatively, the communication management with an MES (production management system) can be efficiently carried out, the needle insertion service life information can be uploaded to the system in real time, the hardware management and control are convenient, the on-cloud system management can be realized by the state of the probe card, and the monitoring can be checked at any time and any place.
Referring to fig. 1, the output end of the probe station is electrically connected with a recording module, the output end of the recording module is electrically connected with a testing machine, the output end of the testing machine is electrically connected with a storage module, the output end of the storage module is electrically connected with a server, the output end of the server is electrically connected with a production management system, and the input end of the production management system is electrically connected with a client.
In the invention, the recording module is added between the probe station and the testing machine, so that the test program actively records the adaptation times of the probe card in the wafer test, and manual recording and picking are not needed.
Referring to fig. 1, the probe station is electrically connected to the tester in two directions, the output end of the recording module is electrically connected to the frequency recording module, the data monitoring module and the data decision module, and the output end of the frequency recording module is electrically connected to the data superposition module and the data repetition module.
According to the invention, when the probe card is replaced between the testing machine and the server, the storage module can actively upload the use frequency record to the server, so that the reset and zero clearing are not convenient to manually carry out, and the operation trouble is reduced.
Referring to fig. 1, the data repeating module is electrically connected to the data monitoring module in two directions, and the output end of the data monitoring module is electrically connected to the data decision module.
In the invention, if the data repeating module generates three times of data repeating, the data monitoring module directly informs the data decision module, and if the data repeating module continuously generates data superposition after generating one time of data repeating, the recording module also continuously records until the data repeating module generates three times of data repeating, and the data repeating module does not require three times of continuous repeating.
Referring to fig. 1, the output end of the frequency recording module is electrically connected to the storage module, and the output end of the data decision module is electrically connected to the storage module.
In the invention, after three repetitions, the data decision module judges that the probe card is damaged and informs the data decision module to pack all data and directly send the data to the server.
Referring to fig. 1, the output end of the storage module is electrically connected to the data collection module, the data packaging module and the data transmitting module, and the output end of the data collection module is electrically connected to the time module and the status module.
In the invention, the probe card using frequency data is imported into the production management system between the server and the production management system, so that the management is convenient, and the client can be logged in directly for checking.
Please refer to fig. 1, which includes the following steps:
s1: firstly, a probe station is required to be connected with a testing machine, then testing can be started, a recording module in the probe station records data tested by the testing machine, under normal use conditions, the data in the recording module are continuously overlapped and refreshed, a frequency recording module sends the recorded refreshed data comprising time and state to a storage module, and the storage module stores the data;
s2: if the service life of the probe is about to end, the data is repeated, the data monitoring module is triggered after the data is repeated once to monitor the recording process, and if the data is repeated for three times by the data repeating module, the data monitoring module informs the data decision module, and the data decision module sends a control command to the storage module;
s3: in the storage module, not only the superposition data from the recording module, including the repetition data, but also the repetition data, including the time and the state, can be received together, a data collection module can be formed in the storage module, the data decision module notifies the storage module that the probe is damaged, then the data packing module in the storage module packs all the data, and then the data is sent to the server through the data sending module, and the packed data is remained in the storage module;
s4: the server receives all the data and sends it to the production management system where the customer can view it through the client.
In the invention, the modular programming principle is adopted, and the module for recording the test times and the module program for storing the test times are added into the test program used by the probe card, so that a large number of program codes are not required to be rewritten, and the maintenance and the update are convenient.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (4)
1. The probe card cloud management system is characterized by comprising:
the probe station is used for connecting a testing machine and recording and transmitting the needle insertion times of the probe;
the recording module is used for recording the needle insertion times of the probe in real time and sending the recorded data to the storage module in real time;
the testing machine is used for testing the service life of the probe part of the probe card;
the storage module is used for receiving the real-time data sent by the recording module, storing the real-time data and then sending the real-time data to the server;
the server is used for receiving the service life data of the testing machine and the real-time data sent by the storage module and sending the service life data and the real-time data to the production management system;
the production management system is used for displaying the service life of the probe and checking the service life of the probe through the client;
the output end of the probe station is electrically connected with a recording module, the output end of the recording module is electrically connected with a testing machine, the output end of the testing machine is electrically connected with a storage module, the output end of the storage module is electrically connected with a server, the output end of the server is electrically connected with a production management system, and the input end of the production management system is electrically connected with a client; the probe station is in bidirectional electrical connection with the testing machine, the output end of the recording module is electrically connected with a frequency recording module, a data monitoring module and a data decision module, the output end of the frequency recording module is electrically connected with a data superposition module and a data repetition module, the data repetition module is in bidirectional electrical connection with the data monitoring module, and the output end of the data monitoring module is electrically connected with the data decision module;
if the data repeating module is used for repeating three times, the data monitoring module can directly inform the data decision module, and after the data repeating module is used for repeating three times, the data decision module can judge that the probe card is damaged and inform the data decision module to package all data and directly send the data to the server.
2. The probe card cloud management system of claim 1, wherein: the output end of the frequency recording module is electrically connected with a storage module, and the output end of the data decision module is electrically connected with the storage module.
3. The probe card cloud management system of claim 1, wherein: the output end of the storage module is electrically connected with a data collection module, a data packaging module and a data sending module, and the output end of the data collection module is electrically connected with a time module and a state module.
4. The probe card cloud management system of claim 1, comprising the steps of:
s1: firstly, a probe station is required to be connected with a testing machine, then testing can be started, a recording module in the probe station records data tested by the testing machine, under normal use conditions, the data in the recording module are continuously overlapped and refreshed, a frequency recording module sends the recorded refreshed data comprising time and state to a storage module, and the storage module stores the data;
s2: if the service life of the probe is about to end, the data is repeated, the data monitoring module is triggered after the data is repeated once to monitor the recording process, and if the data is repeated for three times by the data repeating module, the data monitoring module informs the data decision module, and the data decision module sends a control command to the storage module;
s3: in the storage module, not only the superposition data from the recording module, including the repetition data, but also the repetition data, including the time and the state, can be received together, a data collection module can be formed in the storage module, the data decision module notifies the storage module that the probe is damaged, then the data packing module in the storage module packs all the data, and then the data is sent to the server through the data sending module, and the packed data is remained in the storage module;
s4: the server, after receiving all the data, sends it to the production management system where the client looks through the client.
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| CN112834907A (en) * | 2020-12-31 | 2021-05-25 | 杭州广立微电子股份有限公司 | Test system supporting log file configuration |
| CN115656587A (en) * | 2022-11-15 | 2023-01-31 | 广州粤芯半导体技术有限公司 | Probe card monitoring system and method |
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