CN112039557A - High-speed power line carrier testing system and method for High Performance Liquid Chromatography (HPLC) - Google Patents
High-speed power line carrier testing system and method for High Performance Liquid Chromatography (HPLC) Download PDFInfo
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Abstract
The invention provides an HPLC high-speed power carrier test system, which comprises a main control single chip microcomputer, an ID information single chip microcomputer, a measurement and control single chip microcomputer and a test driving mechanism, wherein the ID information single chip microcomputer is in signal connection with the main control single chip microcomputer, the measurement and control single chip microcomputer is in signal connection with an information code recognizer, the measurement and control module is in signal connection with the measurement and control single chip microcomputer, the measurement and control single chip microcomputer is also in signal connection with an attenuation control module and a copying control module, the attenuation control module is in signal connection with an attenuator group, the attenuator group is respectively in signal connection with the measurement and control module and the copying control module through a power carrier circuit to form a test circuit, and the sensitivity test of a power carrier module to be tested is completed. The automatic test process of the power carrier module is convenient to complete.
Description
Technical Field
The invention belongs to the technical field of power carrier module testing, and particularly relates to an HPLC high-speed power carrier testing system and a testing method thereof.
Background
The power line carrier communication is power system communication which takes a power transmission line as a transmission medium of a carrier signal. Power line communication technology has emerged in the early 20 s of the 20 th century. The method is a means for realizing data transmission and information exchange by using the existing low-voltage distribution network as a transmission medium. When the data is transmitted by using a power line communication mode, the transmitter firstly modulates the data onto a high-frequency carrier, and then couples the data onto a power line through a coupling circuit after power amplification. The peak-to-peak voltage of the signal frequency band does not exceed 10V generally, so that the power line is not influenced. The power line carrier communication differs from the general overhead line carrier communication in that: the available frequency spectrum range in the same power grid is from 8kHz to 500kHz, only limited channels can be opened, if each one-way channel needs to occupy 4kHz of standard frequency band, the frequency band can not be reused, otherwise serious crosstalk interference can be generated. Therefore, the common power line carrier equipment adopts a single-path single-sideband system, each channel occupies 2 multiplied by 4kHz bandwidth in two directions, and the total number of the channels is 61. If more circuits need to be opened, an isolation measure for additionally arranging a high-frequency division filter of the power grid is necessary.
Most of the existing methods utilize a single chip microcomputer to control a module to be tested, a semi-finished ammeter product and a meter reader, then attenuate information of the module to be tested by an attenuator, utilize signals attenuated by the attenuator, the semi-finished ammeter product and the meter reader, and realize loop test between the semi-finished ammeter product and the meter reading controller under the control of the single chip microcomputer to complete the sensitivity test process of the power carrier module to be tested.
However, the ID information of the power carrier module to be tested cannot be accurately recorded in the test process, the phenomenon of disordered recording is easily caused during the test of a plurality of power carrier modules to be tested, the test efficiency and the test precision can also be influenced by applying a single constant-power attenuator in the test process, the power carrier modules after the test cannot be classified according to the sensitivity of the power carrier modules, the processing in the later stage of the test is not facilitated, and the test efficiency of the automatic test is influenced.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide an HPLC high-speed power carrier test system and a test method thereof, aiming at the above-mentioned deficiencies of the prior art, so as to solve the problem that the test system proposed in the above-mentioned background art is low in efficiency when testing a power carrier module.
In order to solve the technical problems, the invention adopts the technical scheme that: an HPLC high-speed power carrier test system comprises a main control single chip microcomputer, an ID information single chip microcomputer, a measurement and control single chip microcomputer and a test driving mechanism, wherein the ID information single chip microcomputer is in signal connection with the main control single chip microcomputer, the information code recognizer is installed at the front end of the test driving mechanism, the test driving mechanism takes a power carrier module to be tested and puts the power carrier module into a measurement and control module, and the measurement and control module is in signal connection with the measurement and control single chip microcomputer;
the single chip microcomputer is further connected with an attenuation control module and a reading control module through signals, the attenuation control module is connected with an attenuator group through the signals, the attenuator group is respectively connected with the measurement and control module and the reading control module through power line carrier circuits through the signals to form a test circuit, and the sensitivity test of the power line carrier module to be tested is completed.
Preferably, the main control single chip microcomputer receives the ID information of the power carrier module to be tested of the ID information single chip microcomputer, and synchronously integrates the ID information with the synchronously received sensitivity information of the power carrier module to be tested, which is received by the measurement and control single chip microcomputer, so that the phenomenon that the test information is recorded disorderly when a plurality of power carrier modules to be tested are tested can be avoided.
Preferably, the information code identifier is specifically a code scanning device capable of identifying a two-dimensional code or a bar code, is installed at the front end of the test driving mechanism, and is used for identifying the ID information of the power carrier module to be tested and transmitting the ID information to the ID information single chip microcomputer for storage and recording.
Preferably, the test driving mechanism is a manipulator with multi-degree-of-freedom grabbing and conveying functions, and is used for grabbing the power carrier module to be tested, scanning and identifying the power carrier module through an information code identifier, sending the power carrier module to the measurement and control module, completing the test in the measurement and control module, taking out the power carrier module from the measurement and control module again, and placing the power carrier module in a classified mode.
Preferably, the measurement and control module is a semi-finished electric energy meter without a power carrier module, the reading and control module is a reading and control device with a standard power carrier module, the measurement and control module is in signal connection with a first coupler, the reading and control module is in signal connection with a second coupler, and the first coupler and the second coupler are in signal connection with the attenuator group through a power line carrier circuit respectively.
Preferably, the attenuator group comprises a first attenuator and a second attenuator which are respectively connected with the attenuation control module, and the power of the first attenuator is greater than that of the second attenuator.
Preferably, the main control single chip microcomputer is further in signal connection with a liquid crystal display.
A testing method of an HPLC high-speed power carrier testing system comprises the following steps:
s1, the master control single chip microcomputer is used for controlling the test driving mechanism to grab one or more power carrier modules to be tested, the information code identifier is used for identifying the ID information of the power carrier modules to be tested, the ID information is transmitted to the ID information single chip microcomputer to be recorded, and the recorded information is synchronously transmitted to the master control single chip microcomputer;
s2, the main control single chip microcomputer is used for controlling the test driving mechanism to load the power carrier module to be tested, which is identified with the ID information, into the measurement and control module, sending a test control signal to the measurement and control single chip microcomputer, and the measurement and control single chip microcomputer is used for controlling the sensitivity test process of the power carrier module to be tested;
s3, the measurement and control single chip microcomputer transmits the sensitivity information to be tested to the master control single chip microcomputer after the power carrier module to be tested completes the sensitivity test, and the master control single chip microcomputer integrates and stores the sensitivity information and the ID information of the power carrier module to be tested;
and S4, the main control singlechip controls the test driving mechanism to place the test driving mechanism into a preset sensitivity category of the power carrier according to the sensitivity information of the power carrier module to be tested synchronously, and the whole test process can be completed.
Preferably, the measurement and control singlechip generates specified information to the measurement and control module through the measurement and control module in the sensitivity test process of the power carrier module, the measurement and control module receives and demodulates a carrier signal by using a standard power line carrier module and then inputs the carrier signal into the measurement and control singlechip, meanwhile, the measurement and control singlechip can also send information outwards by using the standard power line carrier module in the measurement and control module, the power line carrier signal is received and demodulated by using the power line carrier module to be tested in the measurement and control module and then is transmitted into the measurement and control singlechip to realize duplex communication, the error rate of the received information and the improved information is compared and judged in the measurement and control singlechip, the error rate is generally 0, then the measurement and control singlechip controls the attenuator group to control the attenuator through the attenuation control module until the receiver can not effectively demodulate the information, and the sensitivity of the measurement and control singlechip is determined by detecting the level of the carrier side of the measurement, and completing the test of the sensitivity information.
Preferably, the specific control process of the measurement and control single chip microcomputer for controlling the attenuator group through the attenuation control module is that a high-power first attenuator is used for participating in a circuit test process under the initial condition, and a low-power second attenuator is used for participating in a test circuit at the later attenuation stage, so that the accuracy of sensitivity test is improved.
Compared with the prior art, the invention has the following advantages:
according to the invention, the main control single chip microcomputer is added in the test process and independently controls the ID information single chip microcomputer, the measurement and control single chip microcomputer and the test driving mechanism, wherein the test driving mechanism is a manipulator, and the ID information identification, the sensitivity test and the final classified placement of the power carrier module to be tested are completed through the manipulator, so that the test efficiency of the whole power carrier module is improved, the automation degree is improved, the phenomenon of disordered information recording during the test of a plurality of power carrier modules to be tested can be avoided, and the automatic test process of the power carrier modules is conveniently completed.
Drawings
FIG. 1 is an exploded view of the overall structure of the present invention;
description of reference numerals:
1-a master control singlechip; 2-ID information single chip microcomputer; 3-a measurement and control single chip microcomputer; 4-testing the driving mechanism; 5-liquid crystal display; 6-information code recognizer; 7-a measurement and control module; 8-an attenuation control module; 9-attenuator group; 91-a first attenuator; 92-a second attenuator; 10-a copying control module; 11-second coupler.
Detailed Description
In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it should be understood that the drawings in the present application are for illustrative and descriptive purposes only and are not used to limit the scope of protection of the present application. Additionally, it should be understood that the schematic drawings are not necessarily drawn to scale. The flowcharts used in this application illustrate operations implemented according to some embodiments of the present application. It should be understood that the operations of the flow diagrams may be performed out of order, and steps without logical context may be performed in reverse order or simultaneously. One skilled in the art, under the guidance of this application, may add one or more other operations to, or remove one or more operations from, the flowchart.
In addition, the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application.
Embodiment 1, as shown in fig. 1, the present invention provides a technical solution: an HPLC high-speed power carrier test system comprises a main control single chip microcomputer 1, an ID information single chip microcomputer 2, a measurement and control single chip microcomputer 3 and a test driving mechanism 4, wherein the ID information single chip microcomputer 2, the measurement and control single chip microcomputer 3 and the test driving mechanism are in signal connection with the main control single chip microcomputer 1; the main control single chip microcomputer 1 receives the ID information of the power carrier module to be tested of the ID information single chip microcomputer 2, and synchronously integrates the ID information with the sensitivity information of the power carrier module to be tested, which is synchronously received and received through the measurement and control single chip microcomputer 3, so that the phenomenon that the test information records are disordered when a plurality of power carrier modules to be tested are tested can be avoided.
The ID information singlechip 2 is in signal connection with an information code recognizer 6, the information code recognizer 6 is code scanning equipment capable of recognizing two-dimensional codes or bar codes and is installed at the front end of the test driving mechanism 4 and used for recognizing the ID information of the power carrier module to be tested, once each power carrier module is produced, a two-dimensional code or a bar code is pasted on the power carrier module to be tested, the unique ID representing the power carrier is stored in the two-dimensional code or the bar code, test information can be recorded under the ID during testing, and the ID information of the power carrier module to be tested is transmitted to the ID information singlechip 2 to be stored and recorded.
In order to facilitate timely identification of the ID information of the power carrier module to be tested, the information code identifier 6 is installed at the front end of the test driving mechanism 4.
In order to facilitate the cooperation to complete the test process, the test driving mechanism 4 is a mechanical arm with multi-degree-of-freedom grabbing and conveying functions, a control module of the mechanical arm is in signal connection with the main control single chip microcomputer 1 and is used for completing control in the working process of the mechanical arm through the main control single chip microcomputer 1, the work is specifically to grab a single or multiple power carrier modules to be tested, the single or multiple power carrier modules to be tested are firstly scanned and identified through the information code identifier 6 and then sent to the measurement and control module 7, and the power carrier modules are taken out from the measurement and control module 7 again and are placed in a classified mode after the test is.
The measurement and control module 7 is in signal connection with the measurement and control singlechip 3, the measurement and control module 7 is a semi-finished product electric energy meter without a power carrier module, the reading and control module 10 is a reading and control device with a standard power carrier module, the measurement and control module 7 is in signal connection with a first coupler 71, the reading and control module 10 is in signal connection with a second coupler 11, and the first coupler 71 and the second coupler 11 are in signal connection with the attenuator group 9 through power line carrier lines respectively;
observe and control singlechip 3 still signal connection have attenuation control module 8 and copy control module 10, attenuation control module 8 and signal connection have attenuator group 9, attenuator group 9 including respectively with first attenuator 91 and the second attenuator 92 of being connected between the attenuation control module 8, the power of first attenuator 91 is greater than the power of second attenuator 92, attenuator group 9 pass through the power line carrier circuit respectively with observe and control module 7 and copy control module 10 between signal connection, constitute test circuit, accomplish the sensitivity test of the power line carrier module that awaits measuring.
The measurement and control singlechip 3 generates specified information to the measurement and control module 10 through the measurement and control module 7 in the sensitivity test process of the power carrier module, the measurement and control module 10 receives a carrier signal by using a standard power line carrier module and demodulates the carrier signal and then inputs the demodulated carrier signal into the measurement and control singlechip 3, meanwhile, the measurement and control singlechip 3 can also send information outwards by using the standard power line carrier module in the measurement and control module 10, the power line carrier signal is received by using the power line carrier module to be tested in the measurement and control module 7 and is demodulated and then is transmitted into the measurement and control singlechip 3 to realize duplex communication, the error rate of the received information and the improved information is compared and judged in the measurement and control singlechip 3, the common error rate is 0, then, the measurement and control singlechip 3 controls an attenuator 9 through an attenuation control module 8, and uses a high-power first attenuator 91 to participate in the circuit test process under the initial condition, and in the later attenuation stage, a low-power second attenuator 92 is adopted to participate in the test circuit and is used for improving the accuracy of sensitivity test until a receiving party cannot effectively demodulate the information, and the sensitivity of the receiving party is determined by detecting the level of the carrier party of the module to be tested, so that the test of the sensitivity information is completed.
For the convenience of use, the main control single chip microcomputer 1 is further in signal connection with the liquid crystal display 5, and the test condition can be intuitively known through the liquid crystal display 5.
Embodiment 2, the present invention provides a technical solution: a testing method of an HPLC high-speed power carrier testing system comprises the following steps:
s1, the master control single chip microcomputer 1 is used for controlling the test driving mechanism 4 to grab one or more power carrier wave modules to be tested, the control module of the manipulator is in signal connection with the master control single chip microcomputer 1, the master control single chip microcomputer 1 is used for controlling the manipulator in the working process, the single or multiple power carrier wave modules to be tested are grabbed and then sent to the information code identifier 6, the information code identifier 6 is used for scanning and identifying, the information code identifier 6 is used for identifying the ID information of the power carrier wave modules to be tested, the ID information is transmitted to the ID information single chip microcomputer 2 for recording, and the recorded information is synchronously transmitted to the master control single chip microcomputer 1;
s2, using the main control single chip 1 to control the test driving mechanism 4 to load the power carrier module to be tested with ID information into the measurement and control module 7, and sending test control signal to the measurement and control single chip 3, that is, generating specified information to the reading and control module 10 through the measurement and control module 7, the reading and control module 10 using the standard power line carrier module to receive the carrier signal and demodulate and input it into the measurement and control single chip 3, at the same time, the measurement and control single chip 3 can also use the standard power carrier module in the reading and control module 10 to send information outwards, the measurement and control module 7 using the power line carrier module to be tested to receive the power line carrier signal, and demodulate it, then transmitting it into the measurement and control single chip 3, implementing duplex communication, comparing the received information with the improved information in the measurement and control single chip 3 to judge its error rate, generally the error rate is 0, then the measurement and control single chip 3 controlling the attenuator by the attenuation control module 8 controlling, in the initial situation, a high-power first attenuator 91 is used for participating in the circuit testing process, and in the later attenuation stage, a low-power second attenuator 92 is used for participating in the testing circuit, so that the accuracy of sensitivity testing is improved until a receiving party cannot effectively demodulate information, the sensitivity of the receiving party is determined by detecting the level of a carrier party of a module to be tested, and the testing of sensitivity information is completed;
s3, the measurement and control single chip microcomputer 3 transmits the tested sensitivity information to the main control single chip microcomputer 1 after the power carrier module to be tested completes the sensitivity test, the main control single chip microcomputer 1 integrates the sensitivity information and the ID information of the power carrier module to be tested, specifically, the ID information and the sensitivity information of the power carrier module to be tested are in one-to-one correspondence according to the test sequence recorded in the main control single chip microcomputer 1, and then the generated final test information is stored;
s4, the main control single chip microcomputer 1 synchronously controls the test driving mechanism 4 according to the sensitivity information of the power carrier module to be tested, and the power carrier module to be tested is placed in a classified mode in different types of sensitivity placing areas preset in the main control single chip microcomputer 1, so that the whole test process can be completed.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (10)
1. An HPLC high-speed power carrier test system, characterized in that: the system comprises a main control single chip microcomputer (1), an ID information single chip microcomputer (2) in signal connection with the main control single chip microcomputer (1), a measurement and control single chip microcomputer (3) and a test driving mechanism (4), wherein the ID information single chip microcomputer (2) is in signal connection with an information code recognizer (6), the information code recognizer (6) is installed at the front end of the test driving mechanism (4), the test driving mechanism (4) takes a power carrier module to be tested and puts the power carrier module into a measurement and control module (7), and the measurement and control module (7) is in signal connection with the measurement and control single chip microcomputer (3);
observe and control singlechip (3) and go back signal connection have attenuation control module (8) and copy control module (10), attenuation control module (8) and signal connection have attenuator group (9), attenuator group (9) through the power line carrier circuit respectively with observe and control module (7) and copy between the control module (10) signal connection, constitute test circuit, accomplish the sensitivity test of the power line carrier module that awaits measuring.
2. An HPLC high-speed power carrier test system according to claim 1, wherein the main control single chip microcomputer (1) receives ID information of a power carrier module to be tested of the ID information single chip microcomputer (2), and synchronously integrates the ID information with sensitivity information of the power carrier module to be tested, which is received synchronously through the measurement and control single chip microcomputer (3), so that the phenomenon of disordered recording of test information during testing of a plurality of power carrier modules to be tested can be avoided.
3. An HPLC high speed power carrier test system according to claim 1, wherein said information code identifier (6) is a code scanning device capable of identifying two-dimensional codes or bar codes, and is installed at the front end of the test driving mechanism (4) for identifying ID information of the power carrier module to be tested and transmitting it to the ID information single chip microcomputer (2) for storage and recording.
4. An HPLC high-speed power carrier test system according to claim 1, wherein the test driving mechanism (4) is a manipulator with multi-degree-of-freedom grabbing and conveying functions, and is configured to grab the power carrier module to be tested, scan and identify the power carrier module through the information code identifier (6), send the power carrier module to the measurement and control module (7), complete the test in the measurement and control module (7), take out the power carrier module from the measurement and control module (7) again, and place the power carrier module in a classified manner.
5. An HPLC high-speed power carrier test system according to claim 1, wherein the measurement and control module (7) is specifically a semi-finished electric energy meter without a power carrier module, the copying and control module (10) is specifically a copying and control device with a standard power carrier module, the measurement and control module (7) is in signal connection with a first coupler (71), the copying and control module (10) is in signal connection with a second coupler (11), and the first coupler (71) and the second coupler (11) are in signal connection with the attenuator group (9) through a power line carrier line respectively.
6. An HPLC high speed power carrier test system according to claim 1, wherein said set of attenuators (9) comprises a first attenuator (91) and a second attenuator (92) connected to the attenuation control module (8), respectively, the power of said first attenuator (91) being greater than the power of said second attenuator (92).
7. An HPLC high-speed power carrier test system according to claim 1, wherein said master single chip (1) is further signal connected to a liquid crystal display (5).
8. A method for testing an HPLC high speed power carrier test system according to any of claims 1-7, comprising the steps of:
s1, the main control single chip microcomputer (1) is used for controlling the test driving mechanism (4) to grab one or more power carrier modules to be tested, the information code identifier (6) is used for identifying the ID information of the power carrier modules to be tested, the ID information is transmitted to the ID information single chip microcomputer (2) to be recorded, and the recorded information is synchronously transmitted to the main control single chip microcomputer (1);
s2, the main control single chip microcomputer (1) is used for controlling the test driving mechanism (4) to install the power carrier module to be tested, which is identified with the ID information, into the measurement and control module (7), a test control signal is sent to the measurement and control single chip microcomputer (3), and the measurement and control single chip microcomputer (3) is used for controlling and completing the sensitivity test process of the power carrier module to be tested;
s3, the measurement and control single chip microcomputer (3) transmits the tested sensitivity information to the main control single chip microcomputer (1) after the power carrier module to be tested completes the sensitivity test, and the main control single chip microcomputer (1) integrates and stores the sensitivity information and the ID information of the power carrier module to be tested;
s4, the main control single chip microcomputer (1) controls the test driving mechanism to place the test driving mechanism into a preset power carrier sensitivity category according to the sensitivity information of the power carrier module to be tested synchronously, and then the whole test process can be completed.
9. The testing method of the HPLC high-speed power carrier testing system according to claim 8, wherein the measurement and control single chip (3) generates the specified information to the reading and control module (10) through the measurement and control module (7) during the sensitivity testing process of the power carrier module, the reading and control module (10) receives the carrier signal through the standard power line carrier module and demodulates the carrier signal and inputs the demodulated signal into the measurement and control single chip (3), meanwhile, the measurement and control single chip (3) can also send the information to the outside through the standard power line carrier module in the reading and control module (10), the power line carrier signal is received through the power line carrier module to be tested in the measurement and control module (7) and demodulates the demodulated signal, and then the demodulated signal is transmitted to the measurement and control single chip (3) to realize duplex communication, and the error rate of the received information is compared with the improved information in the measurement and control single chip (3), the bit error rate is 0 generally, then, the measurement and control singlechip (3) controls the attenuator group (9) to control the attenuator through the attenuation control module (8), until the receiver can not demodulate the information effectively, the sensitivity of the module to be tested is determined by detecting the level of the carrier side of the module to be tested, and the test of the sensitivity information is completed.
10. The testing method of an HPLC high-speed power carrier testing system according to claim 9, wherein the specific control process of the measurement and control single chip microcomputer (3) controlling the attenuator group (9) through the attenuation control module (8) is that a high-power first attenuator (91) is used to participate in a circuit testing process in an initial situation, and a low-power second attenuator (92) is used to participate in a testing circuit in an attenuation later period, so as to improve the accuracy of sensitivity testing.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113872639A (en) * | 2021-09-24 | 2021-12-31 | 广东电网有限责任公司 | Function test method of power line carrier module, electronic device and storage medium |
| CN114726404A (en) * | 2022-02-24 | 2022-07-08 | 江苏芯云电子科技有限公司 | Automatic detection system and method for broadband power line carrier communication module |
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| CN107659336A (en) * | 2017-08-21 | 2018-02-02 | 宁波德晶元科技有限公司 | The function test method and system of a kind of power line carrier module |
| CN111342865A (en) * | 2020-04-14 | 2020-06-26 | 深圳芯珑电子技术有限公司 | Power line carrier communication module production test system |
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| CN107659336A (en) * | 2017-08-21 | 2018-02-02 | 宁波德晶元科技有限公司 | The function test method and system of a kind of power line carrier module |
| CN111342865A (en) * | 2020-04-14 | 2020-06-26 | 深圳芯珑电子技术有限公司 | Power line carrier communication module production test system |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113872639A (en) * | 2021-09-24 | 2021-12-31 | 广东电网有限责任公司 | Function test method of power line carrier module, electronic device and storage medium |
| CN113872639B (en) * | 2021-09-24 | 2023-01-20 | 广东电网有限责任公司 | Function test method of power line carrier module, electronic device and storage medium |
| CN114726404A (en) * | 2022-02-24 | 2022-07-08 | 江苏芯云电子科技有限公司 | Automatic detection system and method for broadband power line carrier communication module |
| CN114726404B (en) * | 2022-02-24 | 2024-01-19 | 江苏芯云电子科技有限公司 | Automatic detection system and method for broadband power line carrier communication module |
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