CN111968187A - Annular structure optical parameter calibration method - Google Patents
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Abstract
The invention provides an optical parameter calibration method of an annular structure, which comprises the following steps: s10: the auxiliary cameras and the system cameras form a binocular measurement system at a plurality of positions to obtain a primary structured light parameter; and S20: and optimizing the primary structure optical parameters by using the inner diameter measurement result of the standard ring gauge. The multi-position auxiliary camera calibration method is improved on the basis of the auxiliary camera calibration method, inherits the advantage of simple calibration operation, expands the observation range of structured light in a calibration experiment, eliminates the interference of the device structure and improves the parameter calibration precision; meanwhile, structural optical parameter optimization is added in the calibration process, a measuring device is used for measuring the standard ring gauge, and the inner diameter measurement result is used for optimizing the parameter calibration preliminary result of the multi-position auxiliary camera calibration method.
Description
Technical Field
The invention relates to the technical field of annular structure optical inner wall measurement, in particular to an annular structure optical parameter calibration method.
Background
With the progress of manufacturing technology, a large number of bobbin-type parts are processed and applied to the fields of energy, chemical industry, aerospace and the like, and in order to meet specific functional requirements, the inner wall of the bobbin-type parts often comprises a groove, a boss, a curved surface, an opening and other structures. The machining precision of the shape and the size of the parts has direct influence on the final using effect, so a reliable and high-precision method for measuring the three-dimensional shape of the inner wall of the sleeve part needs to be found, and a measuring instrument can measure in a narrow working space and ensure the measuring efficiency and the measuring precision of the instrument.
The inner wall three-dimensional topography measuring technology based on the annular structured light has the advantages of simple instrument structure, high measuring precision, high measuring efficiency and the like, and the measuring process is not easily interfered by an external light source, so that the method is widely researched by researchers. The method mainly comprises the steps that a structured light generator is formed by a laser and a conical reflector to generate annular structured light, and the structured light is intersected with the surface of the inner wall to be detected to form an annular light bar. A camera in the device shoots the annular light bar, extracts the central point of the annular light bar in the picture, and calculates the space coordinate of the point on the annular light bar by utilizing the principle of a laser trigonometry. The displacement mechanism drives the measuring device to scan and measure the complete appearance of the inner wall, and the shape of the inner wall is reconstructed along the motion direction through the motion positioning of the displacement mechanism. Wherein, the calibration precision of the structured light parameters directly influences the accuracy of the final measurement result.
For the annular structure light inner wall measuring device, a common calibration method is an auxiliary camera calibration method: the auxiliary camera calibration method uses an additional calibration auxiliary camera to calibrate with a flat plate, the auxiliary camera and a camera in the device form a binocular measurement system, the flat plate is placed at any positions and intersects with structured light to generate light bars on the surface. The binocular measurement system shoots the light bars, calculates the space coordinates of the light bar central points in the picture according to a binocular measurement principle, and fits to obtain the structured light parameters. There are problems: the structure of the structured light measuring device is easy to interfere with binocular measurement, the observation range of the structured light is limited, and the calibration precision of the structured light equation is influenced. Meanwhile, the measurement precision of binocular measurement is limited, and the calibration precision of the structured light parameters is influenced.
Disclosure of Invention
In view of this, the present invention provides a method for calibrating optical parameters of an annular structure, so as to solve the problems in the prior art.
In order to solve the technical problems, the invention adopts the technical scheme that: an optical parameter calibration method for an annular structure comprises the following steps:
s10: the auxiliary cameras and the system cameras form a binocular measurement system at a plurality of positions to obtain a primary structured light parameter; and
s20: and optimizing the primary structure optical parameters by using the inner diameter measurement result of the standard ring gauge.
Preferably, the auxiliary camera and the system camera form a binocular measurement system at a plurality of positions, and obtaining the preliminary structured light parameter includes:
s101: determining a plurality of auxiliary camera fixing positions;
s102: shooting a plurality of groups of light bars formed by intersecting the annular structured light and the auxiliary flat plate by using the formed binocular measuring system at each determined auxiliary camera fixing position;
s103: and acquiring preliminary structured light parameters through multiple groups of shot light bars.
Preferably, a plurality of auxiliary camera fixing positions are determined in step S101, so as to ensure that the system camera and the auxiliary camera form a binocular measuring system and the full-range observation of the structured light can be performed at the positions.
Preferably, step S102 includes:
s1021: fixing an auxiliary camera at one determined auxiliary camera fixing position, carrying out binocular calibration, and determining external parameters of a binocular measurement system;
s1022: placing an auxiliary flat plate to enable the auxiliary flat plate to be intersected with the annular structured light to generate a clear light strip, and shooting the light strip through a binocular measurement system;
s1023: changing the placing positions and placing angles of the auxiliary flat plates for multiple times, and measuring light bars formed by intersecting a plurality of groups of auxiliary flat plates and the annular structure light;
s1024: repeating steps S1021 to S1023, completing the shooting of the light bar formed by the auxiliary flat plate and the annular structure light at the determined plurality of auxiliary camera fixing positions.
Preferably, step S103 includes:
s1031: processing the obtained multiple groups of light bar pictures, and calculating the central space coordinates of the light bars;
s1032: the preliminary structured light parameters were fitted by the least squares method using the central spatial coordinates of the light bars.
Preferably, before determining the plurality of auxiliary camera fixing positions, the method further comprises: s100: calibrating internal parameters of the system camera and the auxiliary camera.
Preferably, step S20 includes:
s201: shooting annular light bar pictures of a plurality of groups of standard ring gauges in the measuring range of a measuring device;
s202: extracting the central coordinates of the annular light bars of each image to obtain the pixel coordinates of the central points of the annular light bars of the image;
s203: and calculating to obtain the measured inner diameter of the standard ring gauge, and optimizing the initial calibration result of the structured light parameter by combining the measured inner diameter of the standard ring gauge and the nominal inner diameter of the standard ring gauge to obtain the final structured light parameter.
Preferably, in step S201, during the process of taking the picture of each group of annular light bars, the placing positions and the placing angles of the standard ring gauges are different.
Preferably, in step S203, the pixel coordinates are obtained by calculating the spatial coordinates of the central point of the annular light bar by using a laser triangulation method, and fitting a cylindrical equation by using the spatial coordinates to obtain the internal diameter measurement result of the standard ring gauge measured at each time.
Preferably, in step S203, the preliminary calibration result of the structured light parameter is optimized by a nonlinear optimization method.
The invention has the advantages and positive effects that: the multi-position auxiliary camera calibration method is improved on the basis of the auxiliary camera calibration method, inherits the advantage of simple calibration operation, expands the observation range of structured light in a calibration experiment, eliminates the interference of the device structure and improves the parameter calibration precision; meanwhile, structural optical parameter optimization is added in the calibration process, a measuring device is used for measuring the standard ring gauge, and the inner diameter measurement result is used for optimizing the parameter calibration preliminary result of the multi-position auxiliary camera calibration method. The method has the advantages that no special requirements are basically required for the placement position of the standard ring gauge in parameter optimization operation, the operation is simple and rapid, the method can be synchronously carried out with the trial operation of the device, and the time is saved. The influence of binocular measurement errors on the structural light parameter calibration precision in the multi-position auxiliary camera calibration process can be corrected, and the parameter calibration precision is further improved; the calibration experiment equipment such as the auxiliary camera, the standard ring gauge, the flat plate and the like used by the invention is easy to obtain, and the experiment cost is reduced.
Drawings
FIG. 1 is a schematic view of the structure of a ring-shaped structured light measuring device of the present invention;
FIG. 2 is a block flow diagram of a method for calibrating optical parameters of an annular structure according to the present invention;
FIG. 3 is a schematic diagram of the auxiliary calibration system of the present invention;
FIG. 4 is a schematic diagram of the operation of the multi-position aided camera calibration method of the present invention;
FIG. 5 is a block flow diagram of the preliminary structured light parameter step obtained by the multi-position aided camera calibration method of the present invention;
FIG. 6 is a block flow diagram of the present invention process of using a formed binocular measurement system to capture sets of annular structured light intersecting an auxiliary plate to form a light bar at each determined auxiliary camera fixation location;
FIG. 7 is a schematic diagram of the present invention measuring a standard ring gauge using a standard ring gauge;
FIG. 8 is a block flow diagram of the process of optimizing preliminary structured light parameters using inside diameter measurements of a standard ring gauge in accordance with the present invention.
Detailed Description
For a better understanding of the present invention, reference is made to the following detailed description and accompanying drawings that illustrate the invention.
As shown in fig. 1, the annular structured light measuring device 10 includes an annular structured light generator 102 and a system camera 101; the ring-shaped structured light generator 102 is composed of a laser 1021 together with a cone mirror 1022, which is arranged in the measuring device directly in front of the system camera 101. Laser 1021 emits laser, and is reflected by a conical reflector 1022 to generate annular structured light 103 to irradiate the measured inner wall 20, and the annular structured light 103 intersects with the measured inner wall 20 to form an annular light bar; the system camera 101 shoots the annular light strip, extracts the central point of the annular light strip, and calculates the spatial coordinate of the central point of the light strip by combining the structural light parameter to be calibrated according to the laser triangulation principle, so as to complete the measurement of the measured inner wall 20. The structured light parameters are obtained by calibration before measurement, and the accuracy of the parameter calibration result directly influences the final measurement precision.
The invention provides an annular structure optical parameter calibration method, which can accurately obtain annular structure optical parameters and realize high-precision measurement of the inner wall surface profile of a pipeline and a cylindrical part, thereby improving the detection precision of the parts; as shown in fig. 2, the method for calibrating optical parameters of an annular structure includes: s10: obtaining a preliminary structured light parameter by a multi-position auxiliary camera calibration method; and S20: and optimizing the primary structure optical parameters by using the inner diameter measurement result of the standard ring gauge.
The multi-position auxiliary camera calibration method is improved on the basis of the auxiliary camera calibration method, inherits the advantage of simple calibration operation, expands the observation range of structured light in a calibration experiment, eliminates the interference of the device structure and improves the parameter calibration precision; meanwhile, structural optical parameter optimization is added in the calibration process, a measuring device is used for measuring the standard ring gauge, and the inner diameter measurement result is used for optimizing the parameter calibration preliminary result of the multi-position auxiliary camera calibration method. The method has the advantages that no special requirements are basically required for the placement position of the standard ring gauge in parameter optimization operation, the operation is simple and rapid, the method can be synchronously carried out with the trial operation of the device, and the time is saved. The influence of binocular measurement errors on the structural light parameter calibration precision in the multi-position auxiliary camera calibration process can be corrected, and the parameter calibration precision is further improved; the calibration experiment equipment such as the auxiliary camera, the standard ring gauge, the flat plate and the like used by the invention is easy to obtain, and the experiment cost is reduced.
Further, as shown in fig. 3, in the process of obtaining the preliminary structured light parameter by the multi-position auxiliary camera calibration method according to the present invention, an auxiliary calibration system 30 is needed, the auxiliary calibration system includes one or more additional calibration auxiliary cameras 301 and an auxiliary flat plate 302, the auxiliary cameras 301 and the system cameras 101 in the annular structured light measuring device 10 form a binocular measuring system, the auxiliary flat plate 302 is placed at any number of positions, and intersects the structured light to generate a light bar on the surface; the binocular measurement system shoots the light bars, calculates the space coordinates of the light bar central points in the picture according to a binocular measurement principle, and fits to obtain the structured light parameters.
In the calibration process, the auxiliary camera 301 is moved to more than two positions, so that the binocular measurement system consisting of the system camera 101 and the auxiliary camera 301 performs full-range observation on the annular structured light at a plurality of visual fields, and the interference of an instrument structure on the calibration observation is eliminated in the multi-position auxiliary camera calibration method.
Specifically, as shown in fig. 3 and 4, the annular structured light generator 102 generates annular structured light 103, and the annular structured light 103 intersects with an auxiliary plate 302 to generate a light bar 50 on the auxiliary plate 302, which is illuminated by the structured light. The binocular measurement system composed of the system camera 101 and the auxiliary camera 301 captures the light bar 50, and the pictures collected on the system camera image plane 1011 and the auxiliary camera image plane 3011 respectively include the first light bar 501 on the system camera image plane 1011 and the second light bar 502 on the auxiliary camera image plane 3011. And performing polar line correction on the light strip pictures acquired by the two cameras, and processing the two pictures obtained after the polar line correction to obtain the central pixel coordinates of the two light strips in the same row or the same column in the two pictures. Then substituting the binocular measurement principle into the coordinates of the central pixels of the two light bars to calculate the space coordinate P of the central point of the light baric。
The spatial equation of the annular structured light is expressed by the following formula, wherein xic、yic、zicAs a spatial coordinate PicThe coordinate values of (a) and (b),a、b、c、dis an annular structured optical parameter.
The spatial coordinates are sorted into according to the transformation relation of the epipolar line correctionUnder a system camera coordinate system, the spatial coordinates are used for solving the optical parameters of the primary annular structure through least square fittinga、b、c、d。
Further, as shown in fig. 5, the multi-position auxiliary camera calibration method for obtaining the preliminary structured light parameters includes:
s100: calibrating internal parameters of the system camera 101 and the auxiliary camera 301; specifically, the system camera 101 and the auxiliary camera 301 may be calibrated using the zhang-shi calibration method.
S101: determining the fixed positions of a plurality of auxiliary cameras 301, and ensuring that a binocular measurement system consisting of the system camera 101 and the auxiliary cameras 301 can carry out full-range observation on the structured light at a plurality of positions; in particular, by observationNIs at an auxiliary camera fixing position, whereinNRepresents an integer of 2 or more, and ensures that the binocular measurement system composed of the system camera 101 and the auxiliary camera 301 is inNThe field of view at the position can carry out full-range observation on the structured light;
s102: shooting a plurality of groups of light bars 50 formed by the intersection of the annular structured light and the auxiliary flat plate 302 by using a binocular measuring system formed by the auxiliary camera 301 and the system camera 101 at each determined auxiliary camera 301 fixing position; as shown in fig. 6, the process specifically includes:
s1021: fixing an auxiliary camera at one determined auxiliary camera fixing position, carrying out binocular calibration, and determining external parameters of a binocular measurement system;
s1022: placing an auxiliary flat plate to enable the auxiliary flat plate to be intersected with the annular structured light to generate a clear light strip, and shooting the light strip through a binocular measurement system; in the step, the auxiliary flat plate 302 is placed at a position where the observation of the binocular measurement system is not blocked, and the position simultaneously ensures that the annular structured light and the flat plate are intersected to generate a clear light bar on the flat plate, and in addition, no additional requirements are required on the placement position and the angle of the flat plate; then fixing the auxiliary flat plate 302 and keeping the auxiliary flat plate still, and shooting light bars on the flat plate by using a binocular measurement system;
s1023: changing the placing positions and placing angles of the auxiliary flat plates 302 for multiple times, and measuring the light bars 50 formed by the intersection of the auxiliary flat plates 302 and the annular structure light; in a specific embodiment, the placing position and the angle of the auxiliary plate 302 are changed, and the steps are repeated for 10 to 15 times;
s1024: repeating steps S1021 to S1023, completing the shooting of the light bar formed by the auxiliary flat plate and the annular structure light at the determined plurality of auxiliary camera fixing positions.
S103: and acquiring preliminary structured light parameters through multiple groups of shot light bars.
Specifically, step S103 includes:
s1031: processing the obtained multiple groups of light bar pictures, and calculating the central space coordinates of the light bars;
s1032: the preliminary structured light parameters were fitted by the least squares method using the central spatial coordinates of the light bars.
In the multi-position auxiliary camera calibration method, the annular structured light measuring device 10 is calibrated at a plurality of positions, so that a binocular measuring system consisting of a system camera and an auxiliary camera performs full-range observation on annular structured light at a plurality of visual fields, and the interference of an instrument structure on the calibration observation is eliminated; the method is improved on the basis of an auxiliary camera calibration method, inherits the advantage of simple calibration operation, expands the observation range of structured light in a calibration experiment, eliminates the interference of a device structure, and improves the parameter calibration precision.
Further, as shown in fig. 7, in step S20, the standard ring gauge 60 is needed; the specific process comprises the following steps:
s201: shooting annular light bar pictures of a plurality of groups of standard ring gauges in the measuring range of a measuring device;
s202: extracting the central coordinates of the annular light bars of each image to obtain the pixel coordinates of the central points of the annular light bars of the image;
s203: and calculating to obtain the measured inner diameter of the standard ring gauge, and optimizing the initial calibration result of the structured light parameter by combining the measured inner diameter of the standard ring gauge and the nominal inner diameter of the standard ring gauge to obtain the final structured light parameter.
In step S201, during the process of taking pictures of each group of annular light bars, the placement positions and the placement angles of the standard ring gauges are different; during measurement, the annular structured light 103 intersects with the inner wall of the standard ring gauge 60 to generate an annular light bar 601 inside the standard ring gauge, and the system camera 101 takes a picture of the annular light bar. The arrangement position and the angle of the standard ring gauge are required to be adjusted in each measurement, so that the position and the angle of the standard ring gauge are different in each measurement, but no other special requirements are required for the position and the angle, and the conditions of coaxiality with a measuring device and the like are not required to be met.
Specifically, in one embodiment of the present invention, the processes are performed in combinationKA secondary measurement to obtainKStretching a ring-shaped light bar picture; further, for each image of the annular light bar, extracting the central coordinates of the annular light bar to obtain a central pixel coordinate set P of the annular light bar under the imageiWhereini = 1, 2, … K。
A set P of central pixel coordinates of annular light bariAnd structural optical parametersa、b、c、dCalculating the relation by substituting laser trigonometry
Calculating to obtain the space point coordinate set P of the center of the annular light bar measured by the groupi. Calculating the inner diameter R of the standard ring gauge obtained by the measurement by using the space coordinate set obtained by the solution of the pictureiThe calculation process for solving the inner diameter is herein referred to as
Wherein the content of the first and second substances,G[]representing a set of spatial point coordinates P from the center of an annular light bariAnd calculating the inner diameter measurement result of the standard ring gauge by using a least square method cylindrical fitting method. Nominal internal diameter of standard ring gaugeRAs reference quantity and inner diameter measurement result RiOptimizing the structured light parameters using LM (Levenberg-Marquarelt) optimization algorithma、b、c、d. The optimization error amount used in the optimization calculation is shown as follows.
According to the steps, the structured light parameters are optimized through simple calibration operation to obtain more accurate parameters, the influence of binocular measurement errors on the structured light parameter calibration precision in the multi-position auxiliary camera calibration process is eliminated, and the final measurement precision of the system is improved.
In the invention, the multi-position auxiliary camera calibration method is improved on the basis of the auxiliary camera calibration method, inherits the advantage of simple calibration operation, expands the observation range of structured light in a calibration experiment, eliminates the interference of a device structure and improves the parameter calibration precision; meanwhile, structural optical parameter optimization is added in the calibration process, a measuring device is used for measuring the standard ring gauge, and the inner diameter measurement result is used for optimizing the parameter calibration preliminary result of the multi-position auxiliary camera calibration method. The method has the advantages that no special requirements are basically required for the placement position of the standard ring gauge in parameter optimization operation, the operation is simple and rapid, the method can be synchronously carried out with the trial operation of the device, and the time is saved. The influence of binocular measurement errors on the structural light parameter calibration precision in the multi-position auxiliary camera calibration process can be corrected, and the parameter calibration precision is further improved; the calibration experiment equipment such as the auxiliary camera, the standard ring gauge, the flat plate and the like used by the invention is easy to obtain, and the experiment cost is reduced.
The embodiments of the present invention have been described in detail, but the description is only for the preferred embodiments of the present invention and should not be construed as limiting the scope of the present invention. All equivalent changes and modifications made within the scope of the present invention should be covered by the present patent.
Claims (10)
1. An optical parameter calibration method of an annular structure is characterized in that: the method comprises the following steps:
s10: the auxiliary cameras and the system cameras form a binocular measurement system at a plurality of positions to obtain a primary structured light parameter; and
s20: and optimizing the primary structure optical parameters by using the inner diameter measurement result of the standard ring gauge.
2. The method for calibrating optical parameters of an annular structure according to claim 1, wherein: the multi-position auxiliary camera calibration method for obtaining the preliminary structured light parameters comprises the following steps:
s101: determining a plurality of auxiliary camera fixing positions;
s102: shooting a plurality of groups of light bars formed by intersecting the annular structured light and the auxiliary flat plate by using the formed binocular measuring system at each determined auxiliary camera fixing position;
s103: and acquiring preliminary structured light parameters through multiple groups of shot light bars.
3. The annular structure optical parameter calibration method according to claim 2, characterized in that: in step S101, a plurality of auxiliary camera fixing positions are determined, so as to ensure that the system camera and the auxiliary camera form a binocular measuring system and the structured light can be observed in the full range at the positions.
4. The annular structure optical parameter calibration method according to claim 2, characterized in that: step S102 includes:
s1021: fixing an auxiliary camera at one determined auxiliary camera fixing position, carrying out binocular calibration, and determining external parameters of a binocular measurement system;
s1022: placing an auxiliary flat plate to enable the auxiliary flat plate to be intersected with the annular structured light to generate a clear light strip, and shooting the light strip through a binocular measurement system;
s1023: changing the placing positions and placing angles of the auxiliary flat plates for multiple times, and measuring light bars formed by intersecting a plurality of groups of auxiliary flat plates and the annular structure light;
s1024: repeating steps S1021 to S1023, completing the shooting of the light bar formed by the auxiliary flat plate and the annular structure light at the determined plurality of auxiliary camera fixing positions.
5. The annular structure optical parameter calibration method according to claim 2, characterized in that: step S103 includes:
s1031: processing the obtained multiple groups of light bar pictures, and calculating the central space coordinates of the light bars;
s1032: the preliminary structured light parameters were fitted by the least squares method using the central spatial coordinates of the light bars.
6. The annular structure optical parameter calibration method according to claim 2, characterized in that: before determining the plurality of auxiliary camera fixing positions, the method further comprises the following steps: s100: calibrating internal parameters of the system camera and the auxiliary camera.
7. The method for calibrating optical parameters of an annular structure according to claim 1, wherein: step S20 includes:
s201: shooting annular light bar pictures of a plurality of groups of standard ring gauges in the measuring range of a measuring device;
s202: extracting the central coordinates of the annular light bars of each image to obtain the pixel coordinates of the central points of the annular light bars of the image;
s203: and calculating to obtain the measured inner diameter of the standard ring gauge, and optimizing the initial calibration result of the structured light parameter by combining the measured inner diameter of the standard ring gauge and the nominal inner diameter of the standard ring gauge to obtain the final structured light parameter.
8. The annular structure optical parameter calibration method according to claim 7, wherein: in step S201, during the process of taking pictures of each group of annular light bars, the standard ring gauges are different in placement position and placement angle.
9. The method for calibrating optical parameters of annular structures according to claim 7 or 8, characterized in that: in step S203, the pixel coordinates are used to calculate the spatial coordinates of the central point of the annular light bar by using a laser triangulation method, and the spatial coordinates are used to fit a cylindrical equation, so as to obtain the internal diameter measurement result of the standard ring gauge for each measurement.
10. The annular structure optical parameter calibration method according to claim 7, wherein: in step S203, the preliminary calibration result of the structured light parameters is optimized by a nonlinear optimization method.
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Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19830596B4 (en) * | 1997-07-10 | 2008-08-21 | Ruprecht-Karls-Universität Heidelberg | Wave field microscope, wave field microscopy method, also for DNA sequencing, and calibration method for wave field microscopy |
| US20080247746A1 (en) * | 2007-04-05 | 2008-10-09 | David Law | Tripod Mounting, Stand, or Support Attachment, Accessory, or Mechanism for Cameras and Similar Devices or Objects |
| CN103604389A (en) * | 2013-11-14 | 2014-02-26 | 上海交通大学 | Apparatus and method for measuring spline dimension of besides-star wheel |
| CN104084669A (en) * | 2014-06-20 | 2014-10-08 | 河北工业大学 | Visual detecting method and device based on decoupling detection for circular seams |
| CN104567722A (en) * | 2015-01-23 | 2015-04-29 | 成都实唯物联网科技有限公司 | Internal thread detection device and method |
| US20160026253A1 (en) * | 2014-03-11 | 2016-01-28 | Magic Leap, Inc. | Methods and systems for creating virtual and augmented reality |
| CN105974611A (en) * | 2016-07-27 | 2016-09-28 | 东南大学 | Multifunctional detection contact lenses and preparing and checking method thereof |
| CN107101582A (en) * | 2017-07-03 | 2017-08-29 | 吉林大学 | Axial workpiece run-out error On-line Measuring Method based on structure light vision |
| CN107883874A (en) * | 2017-11-09 | 2018-04-06 | 中国科学技术大学 | A kind of scaling method of circle structure light |
| CN108288294A (en) * | 2018-01-17 | 2018-07-17 | 视缘(上海)智能科技有限公司 | A kind of outer ginseng scaling method of a 3D phases group of planes |
| US20190094981A1 (en) * | 2014-06-14 | 2019-03-28 | Magic Leap, Inc. | Methods and systems for creating virtual and augmented reality |
| CN208984026U (en) * | 2018-08-15 | 2019-06-14 | 吉林省计量科学研究院 | A kind of contactless flywheel ring gear internal diameter on-line measuring device |
| CN109883443A (en) * | 2019-02-19 | 2019-06-14 | 北京工业大学 | A kind of line structure optical sensor spatial attitude scaling method |
| CN110702008A (en) * | 2019-11-11 | 2020-01-17 | 三明图灵智能科技有限公司 | Machine vision and scanning detection device and working method thereof |
| CN211085108U (en) * | 2019-11-11 | 2020-07-24 | 三明图灵智能科技有限公司 | Machine vision and scanning detection device |
-
2020
- 2020-10-21 CN CN202011130039.7A patent/CN111968187B/en active Active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19830596B4 (en) * | 1997-07-10 | 2008-08-21 | Ruprecht-Karls-Universität Heidelberg | Wave field microscope, wave field microscopy method, also for DNA sequencing, and calibration method for wave field microscopy |
| US20080247746A1 (en) * | 2007-04-05 | 2008-10-09 | David Law | Tripod Mounting, Stand, or Support Attachment, Accessory, or Mechanism for Cameras and Similar Devices or Objects |
| CN103604389A (en) * | 2013-11-14 | 2014-02-26 | 上海交通大学 | Apparatus and method for measuring spline dimension of besides-star wheel |
| US20160026253A1 (en) * | 2014-03-11 | 2016-01-28 | Magic Leap, Inc. | Methods and systems for creating virtual and augmented reality |
| US20190094981A1 (en) * | 2014-06-14 | 2019-03-28 | Magic Leap, Inc. | Methods and systems for creating virtual and augmented reality |
| CN104084669A (en) * | 2014-06-20 | 2014-10-08 | 河北工业大学 | Visual detecting method and device based on decoupling detection for circular seams |
| CN104567722A (en) * | 2015-01-23 | 2015-04-29 | 成都实唯物联网科技有限公司 | Internal thread detection device and method |
| CN105974611A (en) * | 2016-07-27 | 2016-09-28 | 东南大学 | Multifunctional detection contact lenses and preparing and checking method thereof |
| CN107101582A (en) * | 2017-07-03 | 2017-08-29 | 吉林大学 | Axial workpiece run-out error On-line Measuring Method based on structure light vision |
| CN107883874A (en) * | 2017-11-09 | 2018-04-06 | 中国科学技术大学 | A kind of scaling method of circle structure light |
| CN108288294A (en) * | 2018-01-17 | 2018-07-17 | 视缘(上海)智能科技有限公司 | A kind of outer ginseng scaling method of a 3D phases group of planes |
| CN208984026U (en) * | 2018-08-15 | 2019-06-14 | 吉林省计量科学研究院 | A kind of contactless flywheel ring gear internal diameter on-line measuring device |
| CN109883443A (en) * | 2019-02-19 | 2019-06-14 | 北京工业大学 | A kind of line structure optical sensor spatial attitude scaling method |
| CN110702008A (en) * | 2019-11-11 | 2020-01-17 | 三明图灵智能科技有限公司 | Machine vision and scanning detection device and working method thereof |
| CN211085108U (en) * | 2019-11-11 | 2020-07-24 | 三明图灵智能科技有限公司 | Machine vision and scanning detection device |
Non-Patent Citations (2)
| Title |
|---|
| WEI HUA等: "A Germanosilicate Structure with 11 11 12-Ring Channels Solved by Electron Crystallography", 《ANGEWANDTE CHEMIE》 * |
| 李醒飞等: "多传感器测量***的联合标定", 《光学精密工程》 * |
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