CN111860339B - Voltage drop event tracing method, computer equipment and storage medium - Google Patents

Voltage drop event tracing method, computer equipment and storage medium Download PDF

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CN111860339B
CN111860339B CN202010708963.2A CN202010708963A CN111860339B CN 111860339 B CN111860339 B CN 111860339B CN 202010708963 A CN202010708963 A CN 202010708963A CN 111860339 B CN111860339 B CN 111860339B
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郭建龙
李力杭
刘善伟
张志强
易仕敏
王干军
陈英杰
王东
陈福祥
曾宏毅
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Zhongshan Power Supply Bureau of Guangdong Power Grid Co Ltd
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Abstract

The invention provides a voltage drop event tracing method, computer equipment and a storage medium, wherein the voltage drop event tracing method comprises the following steps: collecting implementation current operation data in a certain time width, and constructing a high-dimensional random matrix; carrying out standardization treatment on the high-dimensional random matrix to convert the high-dimensional random matrix into a non-Hermite matrix; solving a standard matrix product of a non-Hermite matrix; and (3) verifying whether disturbance exists in a specified time period by using a single law: if no disturbance exists, outputting a result as a voltage-free drop event; if disturbance exists, calculating the average spectrum radius, drawing an average spectrum radius time-varying curve, searching the mutation moment of the average spectrum radius, and determining the occurrence moment of the voltage drop event; and partitioning the target power system, drawing an average spectral radius curve of each region, searching a corresponding region with the most serious deviation from a normal value, namely a voltage drop event occurrence region, and outputting the voltage drop event occurrence region and the voltage drop event occurrence time as tracing results.

Description

Voltage drop event tracing method, computer equipment and storage medium
Technical Field
The invention relates to the technical field of power system disturbance detection, in particular to a voltage drop event tracing method based on a high-dimensional random matrix theory, computer equipment and a storage medium.
Background
Voltage sag is a transient power quality problem that is generally not long-lasting, but with non-trivial consequences. For individuals, voltage drop easily causes the accidental shutdown of a personal computer, and causes the interruption of personal work or information loss; for the industry, part of electric power industry equipment is sensitive to voltage variation, so voltage drop can cause damage to the electric power industry equipment, and economic loss is caused.
At present, the traditional fault line selection method and fault location method usually need to start from the topological structure of the actual power grid, and different topologies need to be performed according to different modes, so that the problems of low fault line selection and fault location efficiency and low accuracy exist.
Disclosure of Invention
The invention provides a voltage drop event tracing method based on a high-dimensional random matrix theory, and computer equipment and a computer storage medium applying the method, aiming at overcoming the defects of low fault line selection and fault positioning efficiency and low accuracy in the prior art.
In order to solve the technical problems, the technical scheme of the invention is as follows:
a voltage sag event tracing method comprises the following steps:
s1: acquiring implementation current operation data of all feeder lines of a target power system in a certain time width T, and constructing a high-dimensional random matrix X;
s2: for the high-dimensional random momentThe matrix X is subjected to standardization treatment, and the high-dimensional random matrix X is converted into a non-Hermite matrixX；
S3: calculating the non-Hermite matrixXStandard matrix product of
Figure BDA0002595852960000011
S4: verifying whether the target power system has disturbance within a specified time period by using a single law: if the disturbance exists, executing a step S5; if no disturbance exists, outputting the tracing result as a no-voltage drop event;
s5: calculating the average spectrum radius phi according to the high-dimensional random matrix theory MSR And according to said mean spectral radius phi MSR Drawing an average spectrum radius time-varying curve, searching the sudden change moment of the average spectrum radius, and determining the occurrence moment of a voltage drop event caused by a short-circuit fault;
s6: partitioning the target power system according to the average spectrum radius phi MSR And drawing an average spectrum radius curve of each region in the target power system, searching a corresponding region with the most serious deviation from a normal value according to the average spectrum radius curve, namely a voltage drop event occurrence region, and outputting the voltage drop event occurrence region and the voltage drop event occurrence time as tracing results.
In the technical scheme, voltage drop event tracing is carried out on the basis of single-loop law and linear characteristic statistics of a high-dimensional random matrix theory and voltage drop caused by short-circuit fault generally accompanied with large line current, specifically, the high-dimensional random matrix is constructed by collecting a large amount of multidimensional real-time line current operation data of a power network, then the operation condition of a power system within the time width of an object is confirmed by using the single-loop law and linear characteristic statistics, and further the determination of the time and the position of the short-circuit fault is completed through the linear characteristic statistics. In the technical scheme, the average spectrum radius is used as a linear characteristic value to statistically judge the running state of each region of the power system, and the time when the power system is switched from the normal state to the abnormal state is judged according to the magnitude relation between the average spectrum radius and the inner diameter radius of the single-loop law, namely the short-circuit fault time.
Preferably, in the S1 step, the time width is set to 1 to 5 seconds.
Preferably, in the step S1, the implementation current operation data includes three-phase current amplitudes of all feeders of the target power system.
Preferably, in the step S1, the specific steps of constructing the high-dimensional random matrix X are as follows:
s11: within the time width T, T i Three-phase current amplitude data acquired at the moment form a column vector x (t) i ) The expression formula is as follows:
x(t i )＝[I 1A (t i ),I 1B (t i ),I 1C (t i ),I 2A (t i ),I 2B (t i ),I 2C (t i ),...,I nA (t i ),I nB (t i ),I nC (t i )] T
wherein n is the number of feeder lines of the target power system;
s12: a column vector x (T) within the time width T i ) Constructing a high-dimensional random matrix X, wherein the dimension of the high-dimensional random matrix X is n multiplied by T; the expression formula of the high-dimensional random matrix X is as follows:
X＝[x(t i-(T-1) ),...,x(t i )]。
preferably, in the step S2, an expression formula for normalizing the high-dimensional random matrix X is as follows:
Figure BDA0002595852960000021
wherein,x i,j representing the normalized matrix elements of the high-dimensional random matrix X; x is the number of i Is a row vector of an original high-dimensional random matrix X;
Figure BDA0002595852960000022
and σ (x) i ) Respectively representing a row vector x i Mean and standard deviation of;
Figure BDA0002595852960000023
representing the mean value of the row vectors of the normalized matrix;
Figure BDA0002595852960000024
and expressing the normalized matrix row vector standard deviation.
Preferably, in the step S3, the non-hermitian matrix is obtainedXStandard matrix product of
Figure BDA0002595852960000031
The method comprises the following specific steps:
s31: the non-Hermite matrix is formedXConversion to singular value equivalence matrix X u The calculation formula is as follows:
Figure BDA0002595852960000032
wherein, U is a Ha' er unitary matrix, and H represents the conjugate transposition of the matrix;
s32: make matrix product
Figure BDA0002595852960000033
And further performing table conversion processing on the matrix into a standard matrix product
Figure BDA0002595852960000034
The expression formula is as follows:
Figure BDA0002595852960000035
wherein z is i And
Figure BDA0002595852960000036
respectively representing the matrix product Z and the standard matrix product
Figure BDA0002595852960000037
The row vector of (c), σ (z) i ) Indicates the row directionQuantity z i The standard deviation of (a); l represents the number of high-dimensional random matrices X.
Preferably, the specific steps of verifying whether the target power system has disturbance within the specified time period by using the single-loop law are as follows: calculating the non-Hermite matrix standard matrix product
Figure BDA00025958529600000315
According to the probability density function, drawing a single-loop effect diagram, and then judging according to the single-loop effect diagram: if the standard matrix product of the non-Hermite matrix
Figure BDA0002595852960000038
Characteristic root λ of i Distributed over the radius of the inner ring
Figure BDA0002595852960000039
In the circle determined by the radius of the outer ring being 1, the target power system is not disturbed, and the tracing result is output as a voltage-free falling event; if the characteristic root λ i And if the distribution is outside the circular ring, the disturbance of the target power system is shown, and the step S5 is executed.
Preferably, in the step S5, the average spectral radius Φ is calculated MSR The calculation formula of (a) is as follows:
Figure BDA00025958529600000310
wherein,
Figure BDA00025958529600000311
representing the product of a non-Hermite matrix standard matrix
Figure BDA00025958529600000312
The characteristic root of (a) is,
Figure BDA00025958529600000313
representing feature roots
Figure BDA00025958529600000314
Radius in the complex plane.
The invention further provides computer equipment which comprises a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to realize the voltage drop event tracing method.
The invention also proposes a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the above voltage sag event tracing method.
Compared with the prior art, the technical scheme of the invention has the beneficial effects that: the voltage drop event tracing method can effectively finish voltage drop event tracing, determine time and position of the voltage drop event, and effectively improve fault line selection and fault positioning efficiency and positioning accuracy.
Drawings
Fig. 1 is a flowchart of a voltage sag event tracing method in an embodiment.
FIG. 2 is a topology diagram of an IEEE-9 node system in an embodiment.
FIG. 3 is a graph showing the effect of single loop law in the time period of 0.998s to 1.502s in the example.
Fig. 4 is a graph of the average spectral radius time variation in an example.
FIG. 5 is a graph of the effect of voltage droop disturbance localization in an embodiment.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the patent;
it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
The technical solution of the present invention is further described below with reference to the accompanying drawings and examples.
A voltage drop event tracing method provided in this embodiment is a flowchart of the voltage drop event tracing method of this embodiment, as shown in fig. 1.
The voltage sag event tracing method provided by the embodiment comprises the following steps:
s1: and acquiring implementation current operation data of all feeder lines of the target power system in a certain time width T, and constructing a high-dimensional random matrix X.
In this step, the collected implementation current operation data includes three-phase current amplitudes of all feeders of the target power system.
In this step, the specific steps of constructing the high-dimensional random matrix X are as follows:
s11: will be within time width T i Three-phase current amplitude data acquired at the moment form a column vector x (t) i ) The expression formula is as follows:
x(t i )＝[I 1A (t i ),I 1B (t i ),I 1C (t i ),I 2A (t i ),I 2B (t i ),I 2C (t i ),...,I nA (t i ),I nB (t i ),I nC (t i )] T
wherein n is the number of feeder lines of the target power system;
s12: the column vector x (T) within the time width T i ) Constructing a high-dimensional random matrix X, wherein the dimension of the high-dimensional random matrix X is n multiplied by T; the expression formula of the high-dimensional random matrix X is as follows:
X＝[x(t i-(T-1) ),...,x(t i )]。
s2: standardizing the high-dimensional random matrix X, and converting the high-dimensional random matrix X into a non-Hermite matrixX。
In this step, an expression formula for normalizing the high-dimensional random matrix X is as follows:
Figure BDA0002595852960000051
wherein,x i,j expressing the matrix elements of the high-dimensional random matrix X after normalization; x is the number of i Is a row vector of an original high-dimensional random matrix X;
Figure BDA0002595852960000052
and σ (x) i ) Respectively representing a row vector x i Mean and standard deviation of;
Figure BDA0002595852960000053
representing the mean value of the row vectors of the normalized matrix;
Figure BDA0002595852960000054
and expressing the normalized matrix row vector standard deviation.
S3: calculating the non-Hermite matrixXStandard matrix product of
Figure BDA0002595852960000055
In this step, the non-Hermite matrix is obtainedXStandard matrix product of
Figure BDA0002595852960000056
The method comprises the following specific steps:
s31: the non-Hermite matrix is formedXConversion to singular value equivalence matrix X u The calculation formula is as follows:
Figure BDA0002595852960000057
wherein, U is a Ha' er unitary matrix, and H represents the conjugate transposition of the matrix;
s32: make matrix product
Figure BDA0002595852960000058
And further performing table conversion processing on the matrix to obtain a standard matrix product
Figure BDA0002595852960000059
The expression formula is as follows:
Figure BDA00025958529600000510
wherein z is i And
Figure BDA00025958529600000511
respectively representing the matrix product Z and the standard matrix product
Figure BDA00025958529600000512
The row vector of σ (z) i ) Representing a row vector z i Standard deviation of (d); l represents the number of high-dimensional random matrices X.
S4: verifying whether the target power system has disturbance within a specified time period by using a single law: if the disturbance exists, executing a step S5; and if no disturbance exists, outputting the tracing result as a voltage-free falling event.
In this step, the specific steps of verifying whether the target power system has disturbance within the specified time period by using the single-loop rule are as follows: calculating the standard matrix product of the non-Hermite matrix
Figure BDA00025958529600000513
According to the probability density function, a single-loop-law effect graph is drawn, and then judgment is carried out according to the single-loop-law effect graph: standard matrix product of non-Hermite matrix
Figure BDA00025958529600000514
Characteristic root λ of i Distributed over the radius of the inner ring
Figure BDA00025958529600000515
In the circular ring determined by the radius of the outer ring being 1, the target power system is not disturbed, and the tracing result is output as a no-voltage-drop event; if the characteristic root λ i And if the distribution is outside the circular ring, the disturbance of the target power system is shown, and the step S5 is executed.
Wherein a non-Hermite matrix for order nxTXWhen the elements in the matrix are independently distributed, the average value is 0, and the standard deviation is 1,
Figure BDA0002595852960000061
for the processed standard matrix product, then when n, T → ∞ and n/T = c ∈ (0,1)]Hour, not earlyStandard matrix product of hermitian matrix
Figure BDA0002595852960000062
The probability density function of the feature root of (a) is as follows:
Figure BDA0002595852960000063
wherein c is a constant, and c satisfies n/T = c ∈ (0,1)]；
Figure BDA0002595852960000064
Represents the inner ring radius of a single law; lambda [ alpha ] i Representing the product of a non-Hermite matrix standard matrix
Figure BDA0002595852960000065
The characteristic root of (c). According to the above formula, under the normal state, the standard matrix product of the non-Hermite matrix
Figure BDA0002595852960000066
Characteristic root distribution of (2) in inner ring radius
Figure BDA0002595852960000067
And the radius of the outer ring is 1.
S5: calculating the average spectrum radius phi according to the high-dimensional random matrix theory MSR And according to the mean spectral radius phi MSR And drawing a time-varying curve of the average spectrum radius, searching the sudden change moment of the average spectrum radius, and determining the occurrence moment of a voltage drop event caused by the short-circuit fault.
In this step, the average spectral radius Φ is calculated MSR The calculation formula of (a) is as follows:
Figure BDA0002595852960000068
wherein,
Figure BDA0002595852960000069
representing a non-Hermite matrixStandard matrix product
Figure BDA00025958529600000610
The characteristic root of (a) is,
Figure BDA00025958529600000611
representing feature roots
Figure BDA00025958529600000612
Radius in the complex plane.
Mean spectral radius phi MSR The method is a common linear eigenvalue statistic in the random matrix theory, and can reflect the distribution condition of the eigenvalues of the high-dimensional random matrix. In the present embodiment, the average spectral radius Φ is used as a basis MSR And inner ring radius
Figure BDA00025958529600000613
The time when the target power system is changed from the normal state to the abnormal state, namely the sudden change time of the average spectrum radius can be judged, so that the occurrence time of the voltage drop event caused by the short-circuit fault can be determined.
S6: partitioning the target power system according to the average spectrum radius phi MSR And drawing an average spectrum radius curve of each region in the target power system, searching a corresponding region with the most serious deviation from the normal value according to the average spectrum radius curve, namely a voltage drop event occurrence region, and outputting the voltage drop event occurrence region and the voltage drop event occurrence time as tracing results.
In this step, in the process of partitioning the target power system, the partitioned areas may be virtual areas, and there is not necessarily a direct connection between topologies.
In the embodiment, the operation condition of the target power system in a specified time period is obtained by taking a voltage drop event caused by a short-circuit fault and a large current of a line as a basis and combining a single-loop law and linear characteristic statistics of a high-dimensional random matrix theory, and when the voltage drop time (disturbance) is judged to exist, the time and the position of the voltage drop event are further determined through the linear characteristic statistics, so that the fault line selection efficiency, the fault positioning efficiency and the fault positioning accuracy are improved.
In a specific implementation process, a target power network is selected to carry out voltage sag event tracing on an IEEE-9 node system. Fig. 2 is a topological diagram of the IEEE-9 node system according to the present embodiment. In the embodiment, the IEEE-9 node system has 6 lines, each line is provided with an ammeter, and three-phase current of each line is transmitted in real time, that is, 18 groups of current operation monitoring data are available at each moment.
Suppose that an A-phase fault occurs on lines b4-b6 (bx-by means of the line connecting the bus of x number and the bus of y number) within 1.2s, and then the fault is cleared by self-recovery; a three-phase fault occurred at lines b4-b5 at 2.8s, followed by a self-recovery clearing of the fault.
In the specific process, the current of each line of 0.998 s-1.502 s is collected to generate a random matrix, the random matrix is expanded into a high-dimensional random matrix, and then the operation condition of the power system in the time period is detected by using a single-loop law. As shown in FIG. 3, the effect of single loop law in the time period of 0.998 s-1.502 s is shown. As can be seen from the figure, the power system in the period no longer conforms to the single-loop law due to the existence of the fault, and a large number of characteristic roots of the power system are close to the circle center position, which indicates that the fault disturbance exists in the period.
Further, a time-varying curve of the average spectral radius of 0.98s to 5s is plotted, and as shown in fig. 4, the time-varying curve of the average spectral radius of the present embodiment is shown. It can be known from the figure that the average spectrum radius changes suddenly in 1.2s and 2.8s, which is consistent with the setting time, and it is proved that the voltage sag event tracing method of the embodiment can determine the voltage sag time caused by the short-circuit fault of the line.
Taking the first failure as an example, network partitioning is carried out, and lines b4-b5 and b4-b6 are divided into areas 1, b7-b5 and b8-b9 are divided into areas 2; b9-b6 and b9-b5 are divided into areas 3, and then the average spectral radius curve of each area in a specified time period (0.5 s-2.5 s) is drawn. As shown in fig. 5, a graph of the effect of localizing a voltage droop disturbance. As can be seen from the figure, the deviation of the average spectrum radius curve of the region 1 from the normal value is the largest, so that the region 1 is the occurrence region of the fault voltage sag, and is consistent with the setting, which proves that the voltage sag event tracing method of the embodiment is effective.
The present embodiment also provides a computer device, which includes a memory and a processor, where the memory stores a computer program, and the processor implements the steps in the voltage sag event tracing method according to the foregoing embodiment when executing the computer program.
The present embodiment also proposes a computer-readable storage medium storing a computer program, which when executed by a processor implements the steps in the voltage sag event tracing method of the above-mentioned embodiment.
The same or similar reference numerals correspond to the same or similar parts;
the terms describing positional relationships in the drawings are for illustrative purposes only and are not to be construed as limiting the patent;
it should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.

Claims (10)

1. A voltage sag event tracing method is characterized by comprising the following steps:
s1: acquiring implementation current operation data of all feeder lines of a target power system in a certain time width T, and constructing a high-dimensional random matrix X;
s2: standardizing the high-dimensional random matrix X, and converting the high-dimensional random matrix X into a non-Hermite matrixX；
S3: calculating the non-Hermite matrixXStandard matrix product of
Figure FDA0002595852950000011
S4: verifying whether a target power system has disturbance within a specified time period by using a single law: if disturbance exists, executing a step S5; if no disturbance exists, outputting the tracing result as a voltage-free falling event;
s5: calculating the average spectrum radius phi according to the high-dimensional random matrix theory MSR And according to said mean spectral radius phi MSR Drawing an average spectrum radius time-varying curve, searching the sudden change moment of the average spectrum radius, and determining the occurrence moment of a voltage drop event caused by a short-circuit fault;
s6: partitioning a target power system according to the average spectrum radius phi MSR Drawing an average spectrum radius curve of each region in the target power system, searching a corresponding region with the most serious deviation from a normal value according to the average spectrum radius curve, namely a voltage drop event occurrence region, and outputting the voltage drop event occurrence region and the voltage drop event occurrence time as tracing results.
2. The voltage sag event tracing method according to claim 1, wherein: in the step S1, the time width is set to 5 seconds.
3. The voltage sag event tracing method according to claim 1, wherein: in the step S1, the implementation current operation data includes three-phase current amplitudes of all feeders of the target power system.
4. The voltage sag event tracing method of claim 1, wherein: in the step S1, the specific steps of constructing the high-dimensional random matrix X are as follows:
s11: within the time width T, T i Three-phase current amplitude data acquired at the moment form a column vector x (t) i ) The expression formula is as follows:
x(t i )＝[I 1A (t i ),I 1B (t i ),I 1C (t i ),I 2A (t i ),I 2B (t i ),I 2C (t i ),...,I nA (t i ),I nB (t i ),I nC (t i )] T
wherein n is the number of feeder lines of the target power system;
s12: a column vector x (T) within the time width T i ) Constructing a high-dimensional random matrix X with dimensions of nxT; the expression formula of the high-dimensional random matrix X is as follows:
X＝[x(t i-(T-1) ),...,x(t i )]。
5. the voltage sag event tracing method of claim 4, wherein: in the step S2, an expression formula for normalizing the high-dimensional random matrix X is as follows:
Figure FDA0002595852950000021
wherein,x i,j expressing the matrix elements of the high-dimensional random matrix X after normalization; x is the number of i Is a row vector of an original high-dimensional random matrix X;
Figure FDA0002595852950000022
and σ (x) i ) Respectively representing a row vector x i Mean and standard deviation of;
Figure FDA0002595852950000023
representing the mean value of the row vectors of the normalized matrix;
Figure FDA0002595852950000024
and expressing the normalized matrix row vector standard deviation.
6. The voltage sag event tracing method according to claim 5, wherein: in the step S3, the non-Hermite matrix is obtainedXStandard matrix product of
Figure FDA0002595852950000025
The method comprises the following specific steps:
s31: the non-Hermite matrix is formedXConversion to singular value equivalence matrix X u The calculation formula is as follows:
Figure FDA0002595852950000026
wherein, U is a Ha' er unitary matrix, and H represents the conjugate transposition of the matrix;
s32: make matrix product
Figure FDA0002595852950000027
And further performing table conversion processing on the matrix into a standard matrix product
Figure FDA0002595852950000028
The expression formula is as follows:
Figure FDA0002595852950000029
wherein z is i And
Figure FDA00025958529500000210
respectively representing the matrix product Z and the standard matrix product
Figure FDA00025958529500000211
The row vector of (c), σ (z) i ) Representing a row vector z i Standard deviation of (d); l represents the number of high-dimensional random matrices X.
7. The voltage sag event tracing method of claim 6, wherein: in the step S4, the specific steps of verifying whether the target power system has disturbance within the specified time period by using the single law are as follows: calculating the non-Hermite matrix criterionMatrix product
Figure FDA00025958529500000212
According to the probability density function, drawing a single-loop effect diagram, and then judging according to the single-loop effect diagram: if the non-Hermite matrix standard matrix product
Figure FDA00025958529500000213
Characteristic root λ of i Distributed over the radius of the inner ring
Figure FDA00025958529500000214
In the circular ring determined by the radius of the outer ring being 1, the target power system is not disturbed, and the tracing result is output as a no-voltage-drop event; if the characteristic root λ i And if the distribution is outside the circular ring, the disturbance of the target power system is shown, and the step S5 is executed.
8. The voltage sag event tracing method of claim 7, wherein: in the step S5, the average spectrum radius phi is calculated MSR The calculation formula of (c) is as follows:
Figure FDA0002595852950000031
wherein,
Figure FDA0002595852950000032
representing the product of a non-Hermite matrix standard matrix
Figure FDA0002595852950000033
The characteristic root of (a) is,
Figure FDA0002595852950000034
representing feature roots
Figure FDA0002595852950000035
Radius in the complex plane.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 8.
10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 8.
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