CN111812478A - Device for selecting rectifier bridge diode during rectifier bridge detection and rectifier bridge detection system - Google Patents
Device for selecting rectifier bridge diode during rectifier bridge detection and rectifier bridge detection system Download PDFInfo
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Abstract
The application relates to a device and rectifier bridge detecting system of selecting rectifier bridge diode when rectifier bridge detects belongs to rectifier bridge test technical field, and this application includes: one end of each relay contact of the first relay group and the second relay group is used for being in one-to-one corresponding connection with a pin of the rectifier bridge, and in the first relay group and the second relay group, the other end of one relay contact is used for being connected with the first output port, and the other end of the other relay contact is used for being connected with the second output port; the driving module is used for being connected with the control ends of the relays of the driving module and the relay; and the control module is used for sending two control signals to the driving module simultaneously so that one relay is conducted to form a corresponding diode in the selected rectifier bridge for independent testing. Through this application, help satisfying efficiency demand under big rectifier bridge tests in batches.
Description
Technical Field
The application belongs to the technical field of rectifier bridge testing, and particularly relates to a device for selecting a rectifier bridge diode during rectifier bridge detection and a rectifier bridge detection system.
Background
The power circuit can be called as the heart of an electronic product, and the rectifier bridge plays a role in rectification in the power circuit and is a core element in AC-DC conversion. Therefore, the stability and reliability of the rectifier bridge operation plays a crucial role in the overall quality of the entire electronic circuit.
The rectifier bridge is generally formed by two or four rectifier diodes connected in a bridge manner, a half bridge is arranged in the rectifier bridge with two rectifier diodes, and the four rectifier diodes are called a full bridge. Taking a full-bridge rectifier bridge as an example, as shown in fig. 1, fig. 1 is a schematic structural diagram of the full-bridge rectifier bridge, four leading-out terminals are arranged outside the full-bridge rectifier bridge, a connection point of two diode cathodes is an anode of a full-bridge direct-current output terminal, a connection point of two diode anodes is a cathode of the full-bridge direct-current output terminal, and the other two ends are alternating-current input terminals. In the IQC inspection of full-bridge rectifier bridge, need test the electrical property to full-bridge rectifier bridge supplied materials, because every full-bridge rectifier bridge is inside all to contain four diodes, need test four diodes respectively during the test. Under the condition of manually switching the pins for testing, the test is fashionable and can meet the requirements in sporadic quantity, but in most electronic factories, the material feeding inspection needs large-proportion sampling test and even full inspection, the number of rectifier bridges for testing and inspecting can be counted by tens of thousands every day, and under the condition, the test efficiency is very low by manually switching the pins for testing.
Disclosure of Invention
In order to overcome the problems in the related art at least to a certain extent, the device for selecting the rectifier bridge diode during rectifier bridge detection and the rectifier bridge detection system are provided, and the efficiency requirement under the test of a large number of rectifier bridges can be met.
In order to achieve the purpose, the following technical scheme is adopted in the application:
in a first aspect,
the application provides a device of selection rectifier bridge diode when rectifier bridge detects includes:
the rectifier bridge comprises a first relay group and a second relay group, wherein one ends of relay contacts of the first relay group and the second relay group are used for being in one-to-one corresponding connection with pins of the rectifier bridge, the other end of one relay contact is used for being connected with a first output port, and the other end of the other relay contact is used for being connected with a second output port;
the driving module is used for being connected with the control ends of the relays of the driving module and the relay;
and the control module is used for sending two control signals to the driving module simultaneously so that one relay is conducted for the two control signals respectively to form a corresponding diode in the selected rectifier bridge for independent testing.
Further, the control module includes:
a single chip microcomputer; and
multiple function keys for triggering the single chip microcomputer to execute corresponding function instructions, wherein the function instructions comprise: the device comprises a test start-stop instruction, a manual-automatic mode switching instruction and a test speed switching instruction, wherein the test speed is used for indicating the test duration of testing one diode each time.
Further, the control module is specifically configured to:
if the detection mode is an automatic test mode, when a test starting instruction is received, the test speed which is selected currently is determined, based on the preset conduction sequence of the respective relays of the first relay group and the second relay group, the test speed which is selected currently is sent to the driving module at intervals, wherein the two control signals which are sent at each time can control the conduction of the respective corresponding sequential relays of the first relay group and the second relay group.
Further, the control module is specifically configured to:
if the detection mode is a manual test mode, when a test starting instruction is received once, based on the preset conduction sequence of the respective relays of the first relay group and the second relay group, the driving module sends two control signals, wherein the two control signals sent at each time can control the conduction of the respective corresponding sequential relays of the first relay group and the second relay group.
Further, the driving module comprises a plurality of driving units, each driving unit is used for correspondingly controlling the on-off of one relay, and each driving unit comprises a two-stage amplifying circuit formed by connecting two triodes in series.
Furthermore, the driving module adopts a chip integrated with multiple paths of Darlington tubes, and each path of Darlington tube is used as a driving unit for correspondingly controlling the on-off of one relay.
Further, the apparatus further comprises:
and the test fixture is used for enabling one ends of relay contacts of the first relay group and the second relay group to form one-to-one corresponding connection with pins of the rectifier bridge through the test seat.
Further, the relays of the first relay group and the second relay group adopt electromagnetic relays or solid-state relays.
Further, if the rectifier bridge is a full bridge rectifier bridge, the first relay group and the second relay group each have four relays.
In a second aspect of the present invention,
the application provides a rectifier bridge detecting system includes:
the device of any of the above; and
and the diode tester is connected with the device through the first output port and the second output port and is used for providing a test power supply for the rectifier bridge and displaying a test result of the diode in the rectifier bridge.
This application adopts above technical scheme, possesses following beneficial effect at least:
this application forms the one-to-one through each relay one end of first relay group and second relay group and the pin of rectifier bridge and is connected, and control module sends two control signal to drive module simultaneously for first relay group and second relay group respectively have a relay to switch on, and it is used for the independent test to form a diode that selects to correspond in the rectifier bridge, with replacing artifical manual switching pin test, satisfies the efficiency demand under the rectifier bridge test of big batch.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a full bridge rectifier bridge;
FIG. 2 is a schematic diagram illustrating a configuration of an apparatus for selecting a rectifier bridge diode during rectifier bridge detection according to an exemplary embodiment;
FIG. 3 is a schematic diagram of a drive unit shown in accordance with an exemplary embodiment;
fig. 4 is a block diagram configuration diagram illustrating a rectifier bridge detection system according to an exemplary embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail below. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the examples given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 2, fig. 2 is a schematic structural diagram illustrating an apparatus for selecting a rectifier bridge diode during a rectifier bridge detection according to an exemplary embodiment, and as shown in fig. 2, the apparatus 1 includes:
one end of each relay contact of the first relay group 11 and the second relay group 12 is used for forming one-to-one corresponding connection with a pin of the rectifier bridge 2, and in the two relay groups, the other end of one relay contact is used for connecting a first output port 13a, and the other end of the other relay contact is used for connecting a second output port 13 b;
the driving module 14 is used for being connected with the control ends of the relays of the two modules;
and the control module 15 is used for sending two control signals to the driving module 14 at the same time, so that one relay of each control signal is conducted to form a corresponding diode in the selected rectifier bridge 2 for individual testing.
In the above scheme, the first output port 13a and the second output port 13b are used for connecting an external instrument, and the external instrument is used for diode testing. The control module 15 can select the on/off of the relay in the first relay group 11 and the second relay group 12 by using the driving module 14, and thus can realize a circuit switching function. Based on the above-mentioned line switching function that can be realized, the present application performs a setting that the control module 15 sends two control signals to the driving module 14 at each time, so that the first relay group 11 and the second relay group 12 have one relay to be turned on, and the two relays that are turned on at each time form a diode that is selected to be connected to the corresponding diode in the rectifier bridge 2 for individual testing.
As shown in fig. 2, fig. 2 illustrates a full bridge rectifier 2, where the first relay group 11 and the second relay group 12 are respectively provided with four relays, eight single-pole single-throw type relays are connected to four pins of the rectifier 2 in fig. 2, the eight relays are divided into 2 groups, each group corresponds to one output port, each pin of the rectifier 2 is connected to two relays located in different groups, and in fig. 2, the relays numbered as K1, K2, K3, and K4 are used as the first relay group 11 and connected to the first output port 13 a; relays numbered K5, K6, K7 and K8 are used as the second relay group 12 and are connected with the second output port 13 b. The control module 15 controls the on and off of each relay (each relay is controlled by an independent I/O port of the control module 15, the I/O port outputs high level to attract the corresponding relay, and outputs low level to disconnect the corresponding relay). As shown in fig. 2, the selective conduction of the relays under the first relay group 11 and the second relay group 12 completes the diode test between the pins AB, AC, BD and CD, for example, the conduction of the relay K3 and the relay K8 at a certain time of the relay may represent the testing of the diode forward characteristic between the pins a and C of the rectifier bridge 2, and the conduction of the relay K1 and the relay K6 at a certain time of the relay may represent the testing of the diode reverse characteristic between the pins a and C of the rectifier bridge 2.
Under the manual switching pin test mode, manual switching pin access consumes time, and the in-process of switching different test pins also appears the error easily, therefore, under big rectifier bridge 2 tests in batches, the efficiency of manual switching pin test just seems very low. And through this application, after connecting rectifier bridge 2 pin, realize the circuit through control module 15 and switch over the operation, and then realize the switching that the pin inserts, the centre need not artifical manual intervention of switching over the pin, can satisfy the efficiency demand under the test of 2 rectifier bridges in batches.
In one embodiment, the control module 15 comprises:
a single chip microcomputer; and
multiple function keys for triggering the single chip microcomputer to execute corresponding function instructions, wherein the function instructions comprise: the device comprises a test start-stop instruction, a manual-automatic mode switching instruction and a test speed switching instruction, wherein the test speed is used for indicating the test duration of testing one diode each time.
Specifically, each physical function key may be provided on the operation panel of the device 1, or each virtual function key may be provided by touching the display screen. A plurality of I/O ports of the single chip microcomputer are utilized for independent control, the I/O ports output high levels to be corresponding to the actuation of the relay, and the I/O ports output low levels to be corresponding to the disconnection of the relay.
In a specific application, the manual operation mode may be used to implement a single-step debug, and the automatic mode may be used to implement a "one-touch test," which will be further described below with respect to the manual/automatic mode.
The device 1 has the function of adjusting the testing speed, and because the rectifier bridges 2 of different specifications need to be tested, the rectifier bridge 2 with small rated current needs to prolong the testing time to ensure the stability of the testing result, and the rectifier bridge 2 with large rated current needs to properly reduce the testing time to reduce the potential damage to the testing sample possibly caused by the large current condition. In order to meet different requirements of rectifier bridges 2 with different specifications on test time, the test speed switching function is provided, the singlechip can realize the switching of the test speed by controlling the on-off time of the relay, and the function is triggered by a speed switching key on the tool, for example, the three gears of high speed, medium speed and low speed can be switched to adapt to the balance of test efficiency and test precision under various conditions.
In one embodiment, the control module 15 is specifically configured to:
if the detection mode is an automatic test mode, when a test starting instruction is received, the test speed which is selected currently is determined, based on the preset relay conduction sequence of the first relay group 11 and the second relay group 12, two control signals are sent to the driving module 14 at intervals according to the test speed which is selected currently, wherein the two control signals which are sent at each time can control the conduction of the relays which correspond to the sequence of the first relay group 11 and the second relay group 12.
In one embodiment, the control module 15 is specifically configured to:
if the detection mode is a manual test mode, when a test starting instruction is received once, based on the preset conduction sequence of the respective relays of the first relay group 11 and the second relay group 12, the driving module 14 sends two control signals once, wherein the two control signals sent at each time can control the conduction of the respective corresponding sequential relays of the first relay group 11 and the second relay group 12.
The two embodiments described above show the specific control modes of the control module 15 in the manual and automatic modes. A mode switching key switch triggers a switching instruction notification singlechip to change the control mode of the relay. Automatic mode: when the start button is pressed down, the conduction of two groups of respective relays is automatically controlled by a program set in the single chip microcomputer, and the pins of each group preset in the rectifier bridge 2 are sequentially connected, so that the sequential test of the four diodes in the single chip microcomputer is realized. Manual mode: the difference from the automatic mode is that: in the manual mode, after a diode switching selection instruction is given through a manual key, the single chip microcomputer can change the conduction of the primary relay, and the key is changed once.
In one embodiment, the driving module 14 includes a plurality of driving units, each of which is used for controlling on/off of a relay, where the driving unit includes a two-stage amplifying circuit formed by two transistors connected in series.
In specific application, in order to simplify the circuit structure, a chip integrated with multiple paths of darlington tubes can be used as the driving module 14, wherein each path of darlington tubes is used as a driving unit for correspondingly controlling the on-off of one relay. Taking the full bridge rectifier 2 as an example, an integrated chip ULN2803 with eight darlington transistors inside may be used to drive eight relays.
In addition, in a specific application, each driving unit may also be used as an independent component, as shown in fig. 3, fig. 3 is a schematic structural diagram of the driving unit according to an exemplary embodiment, which includes a two-stage amplifying circuit formed by serially connecting transistors Q1 and Q2, and the purpose of pull-in disconnection of the driving relay can also be achieved.
In one embodiment, the apparatus 1 further comprises:
and the test fixture is used for enabling one ends of relay contacts of the first relay group 11 and the second relay group 12 to form one-to-one corresponding connection with pins of the rectifier bridge 2 through the test seat.
Specifically, the test fixture is used as a clamping and fixing fixture for the pins of the rectifier bridge 2, and if a plug is inserted into a socket, when the pins of the rectifier bridge 2 are inserted into the test fixture, the test fixture can clamp and fix the pins of the rectifier bridge 2 through the reeds.
In one embodiment, the relays of the first relay set 11 and the second relay set 12 are electromagnetic relays or solid-state relays.
In one embodiment, if the rectifier bridge 2 is a full bridge rectifier bridge 2, the first relay set 11 and the second relay set 12 each have four relays.
Referring to fig. 4, fig. 4 is a block diagram of a rectifier bridge detection system according to an exemplary embodiment, and as shown in fig. 4, the rectifier bridge detection system 100 includes:
the device 1 according to any one of the preceding claims; and
and the diode tester 3 is connected with the device 1 through the first output port 13a and the second output port 13b, and the diode tester 3 is used for providing a test power supply for the rectifier bridge 2 and displaying a test result of the diode in the rectifier bridge 2.
Specifically, the diode tester 3 may be applied to products in the related art.
It is understood that the same or similar parts in the above embodiments may be mutually referred to, and the same or similar parts in other embodiments may be referred to for the content which is not described in detail in some embodiments.
It should be noted that, in the description of the present application, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. In addition, in the description of the present application, the meaning of "plurality" means at least two unless otherwise specified.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present; when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present, and further, as used herein, connected may include wirelessly connected; the term "and/or" is used to include any and all combinations of one or more of the associated listed items.
Any process or method descriptions in flow charts or otherwise described herein may be understood as: represents modules, segments or portions of code which include one or more executable instructions for implementing specific logical functions or steps of a process, and the scope of the preferred embodiments of the present application includes other implementations in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the embodiments of the present application.
It should be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory 13 and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present application may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory 13, a magnetic or optical disk, etc.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Although embodiments of the present application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present application, and that variations, modifications, substitutions and alterations may be made to the above embodiments by those of ordinary skill in the art within the scope of the present application.
Claims (10)
1. Device of selection rectifier bridge diode during rectifier bridge detects, its characterized in that includes:
the rectifier bridge comprises a first relay group and a second relay group, wherein one ends of relay contacts of the first relay group and the second relay group are used for being in one-to-one corresponding connection with pins of the rectifier bridge, the other end of one relay contact is used for being connected with a first output port, and the other end of the other relay contact is used for being connected with a second output port;
the driving module is used for being connected with the control ends of the relays of the driving module and the relay;
and the control module is used for sending two control signals to the driving module simultaneously so that one relay is conducted for the two control signals respectively to form a corresponding diode in the selected rectifier bridge for independent testing.
2. The apparatus of claim 1, wherein the control module comprises:
a single chip microcomputer; and
multiple function keys for triggering the single chip microcomputer to execute corresponding function instructions, wherein the function instructions comprise: the device comprises a test start-stop instruction, a manual-automatic mode switching instruction and a test speed switching instruction, wherein the test speed is used for indicating the test duration of testing one diode each time.
3. The apparatus of claim 2, wherein the control module is specifically configured to:
if the detection mode is an automatic test mode, when a test starting instruction is received, the test speed which is selected currently is determined, based on the preset conduction sequence of the respective relays of the first relay group and the second relay group, the test speed which is selected currently is sent to the driving module at intervals, wherein the two control signals which are sent at each time can control the conduction of the respective corresponding sequential relays of the first relay group and the second relay group.
4. The apparatus of claim 2, wherein the control module is specifically configured to:
if the detection mode is a manual test mode, when a test starting instruction is received once, based on the preset conduction sequence of the respective relays of the first relay group and the second relay group, the driving module sends two control signals, wherein the two control signals sent at each time can control the conduction of the respective corresponding sequential relays of the first relay group and the second relay group.
5. The device according to claim 1, wherein the driving module comprises a plurality of driving units, each driving unit is used for correspondingly controlling the on/off of one relay, and the driving unit comprises a two-stage amplifying circuit formed by connecting two triodes in series.
6. The device as claimed in claim 5, wherein the driving module adopts a chip integrated with multiple paths of Darlington tubes, and each path of Darlington tubes is used as a driving unit for correspondingly controlling the on-off of a relay.
7. The apparatus of claim 1, further comprising:
and the test fixture is used for enabling one ends of relay contacts of the first relay group and the second relay group to form one-to-one corresponding connection with pins of the rectifier bridge through the test seat.
8. The apparatus of claim 1, wherein the relays of the first relay set and the second relay set are electromagnetic relays or solid state relays.
9. The apparatus of any one of claims 1-8, wherein the first relay set and the second relay set each have four relays if the rectifier bridge is a full bridge rectifier bridge.
10. A rectifier bridge detection system, comprising:
the device of any one of claims 1-9; and
and the diode tester is connected with the device through the first output port and the second output port and is used for providing a test power supply for the rectifier bridge and displaying a test result of the diode in the rectifier bridge.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010604708.3A CN111812478A (en) | 2020-06-29 | 2020-06-29 | Device for selecting rectifier bridge diode during rectifier bridge detection and rectifier bridge detection system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010604708.3A CN111812478A (en) | 2020-06-29 | 2020-06-29 | Device for selecting rectifier bridge diode during rectifier bridge detection and rectifier bridge detection system |
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| CN111812478A true CN111812478A (en) | 2020-10-23 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112904169A (en) * | 2021-01-18 | 2021-06-04 | 陕西君普新航科技有限公司 | Universal single event effect test system for high-power diode and triode |
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| JP2008141901A (en) * | 2006-12-05 | 2008-06-19 | Matsushita Electric Ind Co Ltd | Dc power supply unit |
| CN106054008A (en) * | 2016-08-15 | 2016-10-26 | 扬州虹扬科技发展有限公司 | Full-automatic single-grain testing device for rectifier bridge |
| CN106526397A (en) * | 2016-09-23 | 2017-03-22 | 上海送变电工程公司 | Automatic intelligent checking method for intelligent substation |
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2020
- 2020-06-29 CN CN202010604708.3A patent/CN111812478A/en active Pending
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| JP2008141901A (en) * | 2006-12-05 | 2008-06-19 | Matsushita Electric Ind Co Ltd | Dc power supply unit |
| CN106054008A (en) * | 2016-08-15 | 2016-10-26 | 扬州虹扬科技发展有限公司 | Full-automatic single-grain testing device for rectifier bridge |
| CN106526397A (en) * | 2016-09-23 | 2017-03-22 | 上海送变电工程公司 | Automatic intelligent checking method for intelligent substation |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112904169A (en) * | 2021-01-18 | 2021-06-04 | 陕西君普新航科技有限公司 | Universal single event effect test system for high-power diode and triode |
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Application publication date: 20201023 |