CN111737072B - Eye pattern testing system and method for hard disk TX signal - Google Patents
Eye pattern testing system and method for hard disk TX signal Download PDFInfo
- Publication number
- CN111737072B CN111737072B CN202010605009.0A CN202010605009A CN111737072B CN 111737072 B CN111737072 B CN 111737072B CN 202010605009 A CN202010605009 A CN 202010605009A CN 111737072 B CN111737072 B CN 111737072B
- Authority
- CN
- China
- Prior art keywords
- test
- result
- hard disk
- eye pattern
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 136
- 238000000034 method Methods 0.000 title claims abstract description 27
- 238000010586 diagram Methods 0.000 claims abstract description 49
- 238000013101 initial test Methods 0.000 claims description 4
- 238000010998 test method Methods 0.000 claims description 2
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000013500 data storage Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2268—Logging of test results
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
- G06F11/2635—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers using a storage for the test inputs, e.g. test ROM, script files
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Dc Digital Transmission (AREA)
Abstract
The application discloses an eye pattern test system for a hard disk TX signal, which comprises a test terminal, a test module and a control module, wherein the test terminal is used for determining the current balance value of equipment to be tested according to a test working condition so that the equipment to be tested outputs the hard disk TX signal according to the current balance value; the oscilloscope is used for obtaining an actual eye pattern result according to the hard disk TX signal; and when the test working condition is other test working conditions, the balance value obtained according to the actual eye diagram result is used as the current balance value. According to the method and the device, the eye pattern test of the hard disk TX signal is automatically carried out through the test terminal and the oscilloscope, and the eye pattern result is fed back to the test terminal to adjust the balance value, so that the investment of a large amount of labor cost is avoided, the optimal balance value which should be used by the server can be quickly determined, and the reliability of the storage performance of the system is improved. The application also discloses an eye pattern testing method of the hard disk TX signal, which has the beneficial effects.
Description
Technical Field
The present application relates to the field of servers, and in particular, to an eye pattern testing system and method for hard disk TX signals.
Background
In order to ensure the stable operation of the server and the perfect use of each interface and each part of the server, measuring whether the signal integrity of each interface of the server meets the standard or not has become an essential important flow in the development process of the server. Generally, a large number of SATA hard disks are used in a server, and in order to ensure the security and reliability of data storage, testing of SATA links has a crucial influence on the evaluation of storage performance of the server. At present, the eye diagram test is generally carried out on the hard disk TX signal manually, if the actual eye diagram result is not ideal, a worker manually adjusts the TX equilibrium value of the signal generation system, and the manual test efficiency is low due to the fact that the TX equilibrium value is large, so that the optimization efficiency of the eye diagram is low, and a large amount of time and labor are wasted.
Therefore, how to provide a solution to the above technical problem is a problem that needs to be solved by those skilled in the art.
Disclosure of Invention
The system and the method for testing the eye pattern of the hard disk TX signal automatically test the eye pattern of the hard disk TX signal through the test terminal and the oscilloscope and feed back the eye pattern result to the test terminal to adjust the equalization value, so that the investment of a large amount of labor cost is avoided, the optimal equalization value which should be used by a server can be quickly determined, and the reliability of the storage performance of the system is improved.
In order to solve the above technical problem, the present application provides an eye pattern testing system for hard disk TX signals, including:
the test terminal is used for determining a current balance value of the equipment to be tested according to the test working condition so that the equipment to be tested outputs a hard disk TX signal according to the current balance value;
the oscilloscope is used for obtaining an actual eye pattern result according to the hard disk TX signal;
and when the test working condition is an initial test working condition, taking the initial balance value as a current balance value, and when the test working condition is other test working conditions, taking the balance value obtained according to the actual eye pattern result as the current balance value.
Preferably, the test terminal is specifically configured to obtain the actual eye diagram result from the oscilloscope through a query instruction and a read instruction.
Preferably, the test terminal is specifically configured to obtain a current equilibrium value according to the actual eye diagram result and the target eye diagram result when the test condition is another test condition.
Preferably, the process of obtaining the current equalization value according to the actual eye diagram result and the target eye diagram result specifically includes:
extracting feature points from the actual eye diagram result;
comparing the characteristic points with the characteristic points corresponding to the target eye pattern result;
and obtaining the current equilibrium value according to the comparison result.
Preferably, the feature points include eye height and/or eye width and/or jitter.
Preferably, the oscilloscope is specifically used for obtaining an actual eye pattern result according to an afterglow superposition technology and a hard disk TX signal.
Preferably, the test terminal is a PC.
Preferably, the test terminal, the oscilloscope and the device to be tested are connected to the same network.
In order to solve the above technical problem, the present application further provides an eye pattern testing method for a hard disk TX signal, which is applied to the eye pattern testing system for a hard disk TX signal described in any one of the above paragraphs, and the eye pattern testing method includes:
determining a current balance value of equipment to be tested according to a test working condition through a test terminal so that the equipment to be tested outputs a hard disk TX signal according to the current balance value;
obtaining an actual eye pattern result according to the hard disk TX signal through an oscilloscope;
and when the test working condition is other test working conditions, the balance value obtained according to the actual eye diagram result is used as the current balance value.
Preferably, the determining, by the test terminal, the current equalization value of the device under test according to the test condition so that the process of the device under test outputting the hard disk TX signal according to the current equalization value specifically includes:
and the test terminal acquires the actual eye pattern result from the oscilloscope through the query instruction and the read instruction.
The eye pattern test system for the hard disk TX signal automatically tests the eye pattern of the hard disk TX signal through the test terminal and the oscilloscope and feeds an eye pattern result back to the test terminal to adjust the balance value, so that the investment of a large amount of labor cost is avoided, the test efficiency is improved, the optimal balance value which should be used by a server can be determined more quickly, and the reliability of the storage performance of the system is improved. The application also provides an eye pattern test method of the hard disk TX signal, which has the same beneficial effects as the eye pattern test system of the hard disk TX signal.
Drawings
In order to more clearly illustrate the embodiments of the present application, the drawings required for the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained by those skilled in the art without inventive effort.
Fig. 1 is a schematic structural diagram of an eye diagram testing system for hard disk TX signals provided in the present application;
FIG. 2 is a schematic diagram of an eye diagram testing system for a hard disk TX signal according to another embodiment of the present disclosure;
fig. 3 is a flowchart illustrating steps of a method for testing an eye diagram of a hard disk TX signal according to the present disclosure.
Detailed Description
The core of the application is to provide an eye pattern test system and method for a hard disk TX signal, the eye pattern test of the hard disk TX signal is automatically carried out through a test terminal and an oscilloscope, and an eye pattern result is fed back to the test terminal to adjust a balance value, so that a large amount of labor cost is avoided, an optimal balance value which should be used by a server can be quickly determined, and the reliability of the storage performance of the system is improved.
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, fig. 1 is a schematic structural diagram of an eye pattern testing system for a hard disk TX signal provided in the present application, where the eye pattern testing system for a hard disk TX signal includes:
the test terminal 1 is used for determining a current balance value of the equipment to be tested according to the test working condition so that the equipment to be tested outputs a hard disk TX signal according to the current balance value;
the oscilloscope 2 is used for obtaining an actual eye pattern result according to the hard disk TX signal;
and when the test working condition is other test working conditions, the balance value obtained according to the actual eye diagram result is used as the current balance value.
Specifically, in this embodiment, the test terminal 1 may be a PC, where the PC controls a device under test DUT to set an equalization value, the device under test sends a hard disk TX signal corresponding to the current equalization value to the oscilloscope 2, where the hard disk TX signal is a signal at the hard disk output end, and the oscilloscope 2 draws an eye diagram according to built-in analysis software after receiving the hard disk TX signal. The PC reads the eye pattern result output by the oscilloscope 2, and adjusts the current equalization value according to the eye pattern result, so that the test terminal 1 sends a hard disk TX signal corresponding to the current equalization value to the oscilloscope 2 until an optimal equalization value is obtained.
Specifically, the device to be tested in this embodiment may specifically be an SATA hard disk, and the same principle applies to the test process of other hard disks by using the scheme of this application. When the test is started, namely the system is in an initial test working condition, the normally used SATA hard disk is loaded on the corresponding SATA port, an initial balance value is set for the equipment to be tested through the PC, the equipment to be tested outputs a hard disk TX signal corresponding to the initial balance value, the oscilloscope 2 receives the hard disk TX signal, and an eye diagram result is obtained through built-in analysis software and the afterglow superposition technology. The PC end sends out a query instruction and a read instruction through a VISA program interface to obtain an eye diagram result in the oscilloscope 2, and analyzes the eye diagram result to judge whether the eye diagram result is an optimal eye diagram, specifically, characteristic points such as eye height, eye width and jitter in the eye diagram result are extracted and compared with the characteristic points corresponding to a target eye diagram result, if the deviation is within a preset range or a better eye diagram result cannot be obtained no matter whether the deviation is increased or decreased, the eye diagram result is the optimal eye diagram result, an equilibrium value corresponding to the eye diagram result is used as the optimal equilibrium value, otherwise, the corresponding equilibrium value is increased or decreased according to the comparison result, so that the device to be tested outputs a corresponding hard disk TX signal according to the adjusted equilibrium value until the optimal equilibrium value is obtained. In the embodiment, the eye pattern test is automatically performed through the coordination of the PC, the equipment to be tested and the oscilloscope 2, and the result is fed back to the PC to adjust the equilibrium value, so that an optimal equilibrium value searching method is provided, and the test efficiency of the hard disk is greatly improved.
Referring to fig. 2, as a preferred embodiment, each device may be connected through a local area network, so that the testing device is liberated, and a tester can remotely obtain a testing process and a testing result. Specifically, the physical layer of the eye pattern testing system mainly comprises the following four parts, namely a local area network, an oscilloscope 2, a PC and equipment to be tested, all the equipment is connected into the same local area network, repeated comparison labor can be automatically and remotely carried out, the investment of a large amount of manpower is avoided, the testing efficiency is improved, a crucial effect is realized on the design of a server, the equilibrium value which should be used by the server is more quickly determined, and the reliability of the storage performance of the system is improved.
It can be seen that in this embodiment, the test terminal 1 and the oscilloscope 2 automatically perform the eye pattern test on the hard disk TX signal and feed back the eye pattern result to the test terminal 1 to adjust the equalization value, so that a large amount of manpower is avoided, the test efficiency is improved, the optimal equalization value that the server should use can be determined more quickly, and the reliability of the system storage performance is improved.
Referring to fig. 3, fig. 3 is a flowchart illustrating steps of an eye pattern testing method for a hard disk TX signal according to an embodiment of the present invention, applied to an eye pattern testing system for a hard disk TX signal according to any one of the above embodiments, where the eye pattern testing method includes:
s101: determining a current balance value of the equipment to be tested according to the test working condition through the test terminal so that the equipment to be tested outputs a hard disk TX signal according to the current balance value;
s102: obtaining an actual eye pattern result according to a hard disk TX signal through an oscilloscope;
and when the test working condition is other test working conditions, the balance value obtained according to the actual eye diagram result is used as the current balance value.
Therefore, in the embodiment, the test terminal and the oscilloscope automatically perform the eye pattern test on the hard disk TX signal and feed back the eye pattern result to the test terminal to adjust the balance value, so that the investment of a large amount of manpower is avoided, the test efficiency is improved, the optimal balance value which should be used by the server can be determined more quickly, and the reliability of the storage performance of the system is improved.
As a preferred embodiment, the process of determining, by the test terminal, the current equalization value of the device under test according to the test condition, so that the device under test outputs the hard disk TX signal according to the current equalization value specifically includes:
and the test terminal acquires an actual eye pattern result from the oscilloscope through the query instruction and the read instruction.
As a preferred embodiment, when the test condition is another test condition, the test terminal obtains the current equalization value according to the actual eye diagram result and the target eye diagram result.
As a preferred embodiment, the process of obtaining the current equalization value according to the actual eye diagram result and the target eye diagram result specifically includes:
extracting feature points from the actual eye diagram result;
comparing the characteristic points with the characteristic points corresponding to the target eye pattern result;
and obtaining the current equilibrium value according to the comparison result.
As a preferred embodiment, the characteristic points comprise eye height and/or eye width and/or jitter.
As a preferred embodiment, the process of obtaining the actual eye diagram result according to the hard disk TX signal by using an oscilloscope specifically includes:
and the oscilloscope obtains an actual eye pattern result according to the afterglow superposition technology and the hard disk TX signal.
In a preferred embodiment, the test terminal is a PC.
As a preferred embodiment, the test terminal, the oscilloscope and the equipment to be tested are connected to the same network.
It should also be noted that, in this specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising one of 8230; \8230;" 8230; "does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (7)
1. An eye diagram test system for hard disk TX signals, comprising:
the test terminal is used for determining the current balance value of the equipment to be tested according to the test working condition so that the equipment to be tested outputs a hard disk TX signal according to the current balance value;
the oscilloscope is used for obtaining an actual eye pattern result according to the hard disk TX signal;
when the test working condition is an initial test working condition, taking an initial equilibrium value as a current equilibrium value, and when the test working condition is other test working conditions, taking an equilibrium value obtained according to the actual eye diagram result as the current equilibrium value;
the test terminal is specifically used for obtaining a current equilibrium value according to the actual eye pattern result and the target eye pattern result when the test working condition is other test working conditions;
the process of obtaining the current equilibrium value according to the actual eye diagram result and the target eye diagram result specifically comprises the following steps:
extracting feature points from the actual eye diagram result;
comparing the characteristic points with characteristic points corresponding to the target eye diagram result;
obtaining a current equilibrium value according to the comparison result;
the oscilloscope is specifically used for obtaining an actual eye pattern result according to an afterglow superposition technology and a hard disk TX signal.
2. The eye pattern test system according to claim 1, wherein the test terminal is specifically configured to obtain the actual eye pattern result from the oscilloscope through a query instruction and a read instruction.
3. The eye test system of claim 1, wherein the feature points comprise eye height and/or eye width and/or jitter.
4. The eye diagram test system of claim 1, wherein the test terminal is a PC.
5. The eye pattern test system according to any one of claims 1 to 4, wherein the test terminal, the oscilloscope and the device under test are connected to the same network.
6. An eye pattern test method for a hard disk TX signal, which is applied to the eye pattern test system for the hard disk TX signal according to any one of claims 1-5, and comprises the following steps:
determining a current balance value of equipment to be tested according to a test working condition through a test terminal so that the equipment to be tested outputs a hard disk TX signal according to the current balance value;
obtaining an actual eye pattern result according to the hard disk TX signal through an oscilloscope;
when the test working condition is an initial test working condition, taking an initial balance value as a current balance value, and when the test working condition is other test working conditions, taking a balance value obtained according to the actual eye pattern result as the current balance value;
the process of determining the current balance value of the equipment to be tested according to the test working condition through the test terminal comprises the following steps:
when the test working condition is other test working conditions, obtaining a current balance value through the test terminal according to the actual eye pattern result and the target eye pattern result;
the process of obtaining the current equilibrium value according to the actual eye diagram result and the target eye diagram result specifically comprises the following steps:
extracting feature points from the actual eye diagram result;
comparing the characteristic points with characteristic points corresponding to the target eye diagram result;
obtaining a current equilibrium value according to the comparison result;
the process of obtaining the actual eye diagram result according to the hard disk TX signal through the oscilloscope comprises the following steps:
and obtaining an actual eye pattern result through an oscilloscope according to an afterglow superposition technology and a hard disk TX signal.
7. The eye pattern testing method according to claim 6, wherein the process of determining the current equalization value of the device under test by the testing terminal according to the testing condition so that the device under test outputs the hard disk TX signal according to the current equalization value specifically comprises:
and the test terminal acquires the actual eye pattern result from the oscilloscope through the query instruction and the read instruction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010605009.0A CN111737072B (en) | 2020-06-29 | 2020-06-29 | Eye pattern testing system and method for hard disk TX signal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010605009.0A CN111737072B (en) | 2020-06-29 | 2020-06-29 | Eye pattern testing system and method for hard disk TX signal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111737072A CN111737072A (en) | 2020-10-02 |
| CN111737072B true CN111737072B (en) | 2022-11-18 |
Family
ID=72652133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010605009.0A Active CN111737072B (en) | 2020-06-29 | 2020-06-29 | Eye pattern testing system and method for hard disk TX signal |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111737072B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112804169B (en) * | 2021-01-20 | 2022-11-04 | 浪潮电子信息产业股份有限公司 | High-speed signal equalization parameter optimization method, system and related components |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109739698A (en) * | 2018-09-20 | 2019-05-10 | 郑州云海信息技术有限公司 | A kind of parameter regulation means and system for SATA signal quality |
| CN109766232B (en) * | 2019-01-15 | 2022-02-18 | 郑州云海信息技术有限公司 | PCIe pressure eye pattern test calibration method |
-
2020
- 2020-06-29 CN CN202010605009.0A patent/CN111737072B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN111737072A (en) | 2020-10-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10488468B2 (en) | Quality-control-testing system for portable charging devices and methods of use | |
| CN105680960A (en) | Automatic test method for Bluetooth card reader, test upper computer and test system | |
| CN108459850B (en) | Method, device and system for generating test script | |
| CN111400154A (en) | Performance test method and related device for solid state disk | |
| TW201216048A (en) | Test system | |
| CN111737072B (en) | Eye pattern testing system and method for hard disk TX signal | |
| CN112269697B (en) | Equipment storage performance testing method, system and related device | |
| CN108571997A (en) | A kind of method and apparatus that measured point is steadily contacted in detection probe | |
| CN104008033A (en) | System and method for I2C bus testing | |
| CN105515893A (en) | Method for determining location of sample point | |
| CN101344562A (en) | Test method and device for circuit printing plate component | |
| CN114325276A (en) | Automatic verification method and system for pattern recognition of partial discharge detection device | |
| CN104063308B (en) | The verification method and device of data | |
| CN110264928B (en) | Backlight chip detection method and device and storage medium | |
| CN109697161A (en) | A kind of test method of storing process, storage medium and database server | |
| CN107703360A (en) | A kind of impedance test system and method for server complete signal link | |
| CN116244133A (en) | Hard disk test management method, system, terminal and storage medium | |
| CN116153382A (en) | Test system, method and device for verifying SSD signal of SATA interface | |
| CN107357701B (en) | SAS signal testing method and device under distributed scene | |
| CN113656318A (en) | Software version testing method and device and computer equipment | |
| CN114356677A (en) | NVMe SSD hot plug test method, device, equipment and storage medium | |
| CN107562587A (en) | A kind of method of assessment signal link load | |
| CN114138579A (en) | Prometous-based GPU (graphics processing Unit) interactive test method, device, equipment and readable medium | |
| CN109903803B (en) | Method and system for testing storage module | |
| CN113866606A (en) | Module pin detection method and device, electronic equipment and storage medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |