CN111726176A - Wireless performance test method, device, system, equipment and storage medium of wireless equipment - Google Patents
Wireless performance test method, device, system, equipment and storage medium of wireless equipment Download PDFInfo
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- CN111726176A CN111726176A CN202010776620.XA CN202010776620A CN111726176A CN 111726176 A CN111726176 A CN 111726176A CN 202010776620 A CN202010776620 A CN 202010776620A CN 111726176 A CN111726176 A CN 111726176A
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Abstract
The present disclosure provides a wireless performance testing method, apparatus, system, device and storage medium for wireless devices, wherein the testing method comprises: the test antenna scans a preset scanning surface positioned in the near-field radiation distance of the wireless equipment to obtain a scanning result; obtaining a test position according to the scanning result; and the test antenna tests the wireless equipment at the test position to obtain a test result. The wireless performance of the wireless device can be rapidly and accurately evaluated.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to a method, an apparatus, a system, a device, and a storage medium for testing performance of a wireless device.
Background
With the development of communication technology, various wireless devices are becoming indispensable tools in people's work and life. Wireless devices need to be tested for their wireless performance in research, development, testing, production, and other stages. With the increase of the frequency bands to be tested and the number of antennas of the wireless device, the time required for testing is longer, so that the testing efficiency becomes a bottleneck restricting the production efficiency and the cost.
Disclosure of Invention
The present disclosure describes a wireless performance testing method, apparatus, system, device and storage medium for wireless devices, which can implement efficient testing of wireless transceiving performance of wireless devices.
According to a first aspect of embodiments of the present disclosure, there is provided a wireless performance testing method of a wireless device, including: the test antenna scans a preset scanning surface positioned in the near-field radiation distance of the wireless equipment to obtain a scanning result; obtaining a test position according to the scanning result; the test antenna tests the wireless device at the test position to obtain a test result.
According to an embodiment of the testing method, the step of obtaining the test locations from the scan results comprises: obtaining qualified scan points in the scan results that satisfy the following conditions: the scanning value is greater than the first preset value, or the scanning value is the maximum value in the scanning result; and determining the test position according to the position of the qualified scanning point.
According to one embodiment of the test method, a reference test position is obtained according to a scanning result of reference equipment, wherein the reference equipment is wireless equipment with performance meeting preset requirements; a reference test position of a reference device identical to the wireless device is determined as the test position of the wireless device.
According to one embodiment of the testing method, further comprising: and comparing the test result with a reference test result, judging the test result to be qualified when the difference value between the test result and the reference test result is smaller than a preset value, and judging the test result to be unqualified when the difference value between the test result and the reference test result is larger than the preset value, wherein the reference test result is the preset value or is obtained by testing the reference equipment with the performance meeting the preset requirement at the same test position through a test antenna.
According to one embodiment of a test method, N wireless devices are scanned or tested simultaneously by N test antennas, wherein at least adjacent test antennas scan or test at different frequencies, N being greater than or equal to 2.
According to one embodiment of the test method, the near field radiation distance is obtained according to the following formula:
Where R represents the near-field radiation distance, D represents the maximum physical size of the wireless device, and λ represents the wavelength of a wireless signal transmitted or received by the wireless device.
According to one embodiment of the test method, the near field radiation distance is 5mm to 30 mm.
According to a second aspect of embodiments of the present disclosure, there is provided a wireless performance testing apparatus of a wireless device, including: the scanning module is used for controlling the test antenna to scan on a preset scanning surface positioned in the near-field radiation distance of the wireless equipment to obtain a scanning result; the test position acquisition module is used for acquiring a test position according to the scanning result; and the test module is used for controlling the test antenna to test the wireless equipment at the test position to obtain a test result.
According to one embodiment of the test apparatus, the test position acquisition module includes: a qualified scanning point obtaining unit, configured to obtain a qualified scanning point satisfying the following conditions in the scanning result: the scanning value is greater than the first preset value, or the scanning value is the maximum value in the scanning result; and the first test position acquisition unit is used for determining a test position according to the position of the qualified scanning point.
According to an embodiment of the testing device, the test position acquisition module further comprises: the device comprises a reference test position acquisition unit, a reference test position acquisition unit and a control unit, wherein the reference test position acquisition unit is used for acquiring a reference test position according to a scanning result of reference equipment, and the reference equipment is wireless equipment with wireless performance meeting preset requirements; a second test position acquisition unit for determining a reference test position of the same reference device as the wireless device as the test position of the wireless device.
According to a third aspect of embodiments of the present disclosure, there is provided a wireless performance testing system of a wireless device, including: the shielding box is internally provided with wave-absorbing materials; the placing assembly is arranged in the shielding box and used for placing the wireless equipment; the test antenna is arranged in the shielding box; a moving assembly connected to at least one of the placing assembly and the test antenna for changing the relative positions of the wireless device and the test antenna; and a wireless performance testing device of the wireless device.
According to one embodiment of the test system, the test antenna comprises at least 2; the placement component is suitable for placing at least 2 wireless devices; the test apparatus further comprises means for controlling N test antennas to scan or test N wireless devices simultaneously, wherein at least adjacent test antennas scan or test at different frequencies, and N is greater than or equal to 2.
According to an embodiment of the test system, a wave absorbing material is arranged between adjacent test antennas or/and adjacent wireless devices.
According to one embodiment of the test system, the part of the test antenna other than the radiation aperture is covered with a wave-absorbing material.
According to one embodiment of the test system, the test system further comprises a test meter coupled to the test antenna.
According to a fourth aspect of embodiments of the present disclosure, there is provided an electronic apparatus including: a processor; a memory for storing a computer program executable by the processor; when the processor executes the computer program, the wireless performance testing method of the wireless device is realized.
According to a fifth aspect of embodiments of the present disclosure, there is provided a non-transitory computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the aforementioned wireless performance testing method of a wireless device.
The embodiment of the disclosure scans in the near-field radiation distance, and obtains the test position according to the scanning result, so that when the test antenna and the wireless device perform near-field energy transmission in the test, the receiving party can obtain larger radiation energy at the test position, and the test can be accurately performed.
Drawings
Fig. 1 is a flow chart illustrating a method of performance testing of a wireless device according to one embodiment of the present disclosure.
Fig. 2 is a flow chart illustrating a method of performance testing of a wireless device according to one embodiment of the present disclosure.
Fig. 3 is a flow chart illustrating a method of performance testing of a wireless device according to one embodiment of the present disclosure.
Fig. 4 is a block diagram illustrating a structure of a performance testing apparatus of a wireless device according to an embodiment of the present disclosure.
Fig. 5 is a block diagram illustrating a structure of a performance testing apparatus of a wireless device according to an embodiment of the present disclosure.
Fig. 6 is a block diagram illustrating a structure of a performance testing apparatus of a wireless device according to an embodiment of the present disclosure.
FIG. 7 is a schematic diagram of a performance testing system of a wireless device shown in accordance with one embodiment of the present disclosure.
FIG. 8 is a schematic diagram of a performance testing system of a wireless device shown in accordance with one embodiment of the present disclosure.
FIG. 9 is a test result diagram illustrating a performance testing system for a wireless device according to one embodiment of the present disclosure.
FIG. 10 is a test result diagram illustrating a performance testing system of a wireless device according to one embodiment of the present disclosure.
FIG. 11 is a block diagram illustrating the structure of an electronic device according to one embodiment of the present disclosure.
Detailed Description
Embodiments of the present disclosure are described below with reference to the drawings. It should be understood that the drawings are not necessarily to scale. The described embodiments are exemplary and not intended to limit the present disclosure, which features may be combined with or substituted for those of the embodiments in the same or similar manner. As used in this disclosure and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should also be understood that the term "and/or" as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items.
An embodiment of one aspect of the disclosure is a performance testing method of a wireless device. The wireless device refers to a device capable of performing wireless communication, and may be, for example, a wireless terminal, including a fixed wireless terminal or a mobile wireless terminal, and specifically may be a computer, a mobile phone, a tablet, a wearable smart device, a wireless router, or the like. The performance of a wireless device refers to the wireless signal transmission capability of the antenna of the wireless device, including the transmission performance or/and the reception performance.
As shown in fig. 1, according to one embodiment of a test method, comprises:
step S11, the test antenna scans on a preset scanning surface located within the near-field radiation distance of the wireless device to obtain a scanning result;
step S12, obtaining a test position according to the scanning result;
and step S13, the test antenna tests the wireless device at the test position to obtain a test result.
In the testing method of the embodiment, the testing position is selected by scanning the near-field radiation distance, so that when the testing antenna and the wireless device perform near-field energy transmission during testing, a receiving party can obtain larger radiation energy at the testing position, and the testing is accurately performed. In addition, the near-field energy transmission has smaller test path loss and large test dynamic.
It should be noted that for a single antenna wireless device, only one antenna needs to be scanned and tested. For a multi-antenna wireless device, multiple antennas may need to be scanned and tested according to testing requirements. For example, when a plurality of antennas of a multi-antenna wireless device need to be tested, each antenna to be tested needs to be scanned to select a test position. In addition, according to the test requirement, the same antenna to be tested may need to scan at different frequencies, for example, when the performance of a certain frequency band needs to be tested, one or more frequencies may be selected to scan at each frequency. The shape of the scanning surface may be a plane, a spherical surface, or the like, and is not limited in this embodiment. For wireless devices with unknown radiation directions, the preset scanning plane may include various directions of the wireless devices; for a wireless device with a known radiation direction or design radiation direction, the predefined scanning plane may be located in the main radiation direction of the wireless device.
As shown in fig. 2, according to some embodiments of the testing method, step S12 includes:
step S121, obtaining qualified scanning points satisfying the following conditions in the scanning result: the scanning value is greater than the first preset value, or the scanning value is the maximum value in the scanning result;
and step S122, determining a test position according to the position of the qualified scanning point.
In steps S121 to S122 of this embodiment, the position of the qualified scanning point corresponding to the maximum scanning value may be determined as the test position, or one or more points may be selected from the qualified scanning points whose scanning values are greater than the first preset value, and the position of the selected point is determined as the test position. For most wireless devices, care needs to be taken to avoid "dead spots," i.e., spots that have unreasonably abrupt changes in their scanned values compared to the scanned values of surrounding spots. As an example, in an antenna under test of a wireless device, a test location is determined by:
step S1211, for the frequency f1，f2，……，f10Scanning results obtained by scanning are obtained, and first presets corresponding to frequencies greater than the frequencies in the scanning results are respectively obtainedAnd setting qualified scanning points. Specifically, the frequency f is selected1Is greater than the preset value P in the scanning result1Is acceptable for scanning point T11，T12，……，T1mSelecting a frequency f2Is greater than the preset value P in the scanning result2Is acceptable for scanning point T21，T22，……，T2nScanning results of other frequencies are processed similarly;
step S1221, merging the qualified scan points with the same or similar positions to obtain at least one test position corresponding to each frequency. Specifically, for example, the frequency f is selected1，f2，f3The qualified scanning points T with the same or similar positions (less than a certain preset value)iIs determined as frequency f1，f2，f3The test position of (1). Qualified scan points for other frequencies are processed similarly until test positions for all frequencies are determined.
According to the embodiment, the test positions can be reduced on the premise of ensuring the test precision, which means that the time for moving among different test positions is reduced, so that the test efficiency is improved.
According to an embodiment of the test method, the reference test position is obtained from the scan result of the reference device, e.g. the steps S121 to S122 are performed on the reference device to determine the reference test position. The reference device is a wireless device whose performance meets a preset requirement, for example, a wireless device whose test result meets the preset requirement is tested by a test method specified by the CTIA standard. A reference test position of a reference device identical to the wireless device is determined as the test position of the wireless device. By "reference device identical to the wireless device", it is meant that the wireless device and the reference device employ the same antenna design and layout, and the device physical dimensions are the same or similar. In this embodiment, after the test position is determined by the reference device, the reference test position is directly determined as the test position of the wireless device for the same wireless device, so that the time for repeated scanning can be saved, and the test efficiency can be improved.
As shown in fig. 3, according to an embodiment of the testing method, further comprising:
and step S14, comparing the test result with the reference test result, judging the test result to be qualified when the difference between the test result and the reference test result is smaller than a preset value, and judging the test result to be unqualified when the difference between the test result and the reference test result is larger than the preset value. And the reference test result is a preset value or is obtained by testing the reference equipment with the performance meeting the preset requirement at the same test position through the test antenna.
According to one embodiment of a test method, N wireless devices are scanned or tested simultaneously by N test antennas, wherein at least adjacent test antennas scan or test at different frequencies, N being greater than or equal to 2. As an example, the number of test antennas is 6, the placing component is adapted to place 6 wireless devices, when 6 test antennas simultaneously test 6 wireless devices, adjacent test antennas test at different frequencies, or all test antennas test at different frequencies. In the related art, the OTA (Over-the-air) test mode of the wireless device is generally a single-device test, that is, only one device is tested in one test. With the increase of the number of antennas and frequency bands to be tested of wireless devices, for example, in the MIMO wireless device, there are multiple antennas for communication, each antenna has a certain frequency band to be tested, the test is more complicated, and the time required for testing one wireless device is longer, for example, if a single device test mode is adopted, the work efficiency is lower. In addition, for a large batch of wireless devices on a production line, the mode of single-device testing is not only low in efficiency, but also high in cost, and the testing requirement is difficult to meet. This embodiment adopts the mode of many equipment parallel test, adopts a plurality of test antennas to test a plurality of wireless devices simultaneously, and adjacent test antenna tests in order to improve the isolation between the adjacent test at different frequencies at least, reduces the interference between the adjacent test return circuit, has guaranteed the precision of test when improving efficiency of software testing.
According to one embodiment of the test method, the near field radiation distance is obtained according to the following formula:
Where R represents the near-field radiation distance, D represents the maximum physical size of the wireless device, and λ represents the wavelength of a wireless signal transmitted or received by the wireless device.
The near-field radiation distance is described in detail below, and in particular, for electrically small antennas (the maximum physical size is less than half the operating wavelength), the different radiation ranges L are defined as:
when in use
A reaction near field region;
when in use
A radiation near field region;
when in use
A transmission near field region;
when in use
A radiation far field region;
when the antenna to be measured of the wireless equipment is an electrically small antenna, the near-field radiation distance R is located in the reaction near-field region or the radiation near-field region.
For electrically large antennas, (the maximum physical dimension is greater than or equal to half the operating wavelength), the different radiation ranges L are defined as:
when in use
A radiation near field region;
when in use
A Fresnel zone;
when in use
The far field region is radiated.
When the antenna to be measured of the wireless equipment is an electrically large antenna, the near-field radiation distance R is located in a radiation near-field region.
It should be noted that the definitions of the electrically small antenna and the electrically large antenna are different in different antenna theories, and the classification and definition of the radiation field region are also different, and the above description is only an exemplary description.
According to one embodiment of the test method, the near field radiation distance is 5mm to 30mm, which is suitable for wireless devices with electrically small antennas, such as mobile phones, tablets, etc. When the scanning distance is too close, the wireless device may load the test antenna, resulting in inaccurate scanning/testing results; when the scan distance is too far, the test antenna may not be able to obtain a test location ready to reflect the performance of the wireless device.
Corresponding to the foregoing embodiment of the method for testing the performance of the wireless device, as shown in fig. 4, fig. 4 is a block diagram of a structure of a performance testing apparatus of a wireless device according to another embodiment of the present disclosure, and includes:
the scanning module 21 is configured to control the test antenna to scan a preset scanning surface located within a near-field radiation distance of the wireless device, so as to obtain a scanning result;
a test position obtaining module 22, configured to obtain a test position according to the scanning result;
and the test module 23 is configured to control the test antenna to test the wireless device at the test position to obtain a test result.
According to an embodiment of the test apparatus, as shown in fig. 5, the test position acquisition module 22 includes:
a qualified scan point obtaining unit 221, configured to obtain a qualified scan point satisfying the following conditions in the scan result: the scanning value is greater than the first preset value, or the scanning value is the maximum value in the scanning result;
a first test position obtaining unit 222, configured to determine a test position according to the position of the qualified scan point.
According to an embodiment of the testing apparatus, as shown in fig. 5, the test position acquisition module 22 further includes:
a reference test position obtaining unit 223, configured to obtain a reference test position according to a scanning result of a reference device, where the reference device is a wireless device whose wireless performance meets a preset requirement; and
a second test position obtaining unit 224 for determining a reference test position of the same reference device as the wireless device as the test position of the wireless device.
According to an embodiment of the testing device, as shown in fig. 6, further comprising:
and the judging module 24 is configured to compare the test result with a reference test result, determine that the test result is qualified when a difference between the test result and the reference test result is smaller than a preset value, and determine that the test result is unqualified when the difference between the test result and the reference test result is larger than the preset value, where the reference test result is the preset value or is obtained by testing, at the same test position, reference devices whose performance meets a preset requirement through a test antenna.
Specifically, the determination module 24 includes:
a reference result obtaining unit 241, configured to receive and store a preset value for result determination, or obtain and store a reference test result obtained by testing the reference device at the same test position by the test antenna;
the determining unit 242 is configured to compare the test result with a reference test result, determine that the test result is qualified when a difference between the test result and the reference test result is smaller than a preset value, and determine that the test result is unqualified when the difference between the test result and the reference test result is larger than the preset value.
According to an embodiment of the testing apparatus, the testing antennas include N, where N is greater than or equal to 2, and the scanning module 21 is configured to control the N testing antennas to scan simultaneously on a preset scanning surface located within a near-field radiation distance of the N wireless devices, so as to obtain a scanning result; the test position obtaining module 22 is configured to obtain test positions of the N wireless devices according to the scanning result; the test module 23 is configured to control the N test antennas to test the N wireless devices at the test positions at the same time, so as to obtain a test result.
According to an embodiment of the test apparatus, the near field radiation distance is obtained according to the following formula:
Where R represents the near-field radiation distance, D represents the maximum physical size of the wireless device, and λ represents the wavelength of a wireless signal transmitted or received by the wireless device.
According to one embodiment of the test apparatus, the near field radiation distance is 5mm to 30mm, which is suitable for wireless devices with electrically small antennas, such as mobile phones, tablets, etc. When the scanning distance is too close, the wireless device may load the test antenna, resulting in inaccurate scanning/testing results; when the scan distance is too far, the test antenna may not be able to obtain a test location ready to reflect the performance of the wireless device.
Corresponding to the foregoing embodiments of the method for testing performance of a wireless device, another embodiment of the present disclosure is a system for testing performance of a wireless device, including:
the shielding box is internally provided with wave-absorbing materials;
the placing assembly is arranged in the shielding box and used for placing the wireless equipment;
the test antenna is arranged in the shielding box;
a moving assembly connected to at least one of the placing assembly and the test antenna for changing the relative positions of the wireless device and the test antenna;
and a performance testing device of the wireless device.
In this embodiment, the placing component may be, for example, a placing table provided with a fixture, so that the wireless device is placed on the placing component, and the wireless device is conveniently tested. The test antenna can adopt a broadband test antenna covering all test frequency bands, and the test antenna does not need to be switched in the test process, so that the test time is shortened, and the test efficiency is improved. The moving assembly may be connected to the placing assembly, for example, and the relative positions (including a horizontal position, a vertical position, an angle, and the like) of the wireless device and the test antenna are changed by adjusting the position of the wireless device, when the placing assembly is suitable for placing a plurality of wireless devices, the moving assembly may be configured to control a single wireless device to move or control a plurality of wireless devices to be linked according to needs, and the specific form of the moving assembly may be, for example, a two-axis mobile station, a three-axis mobile station, a rotating station, or a combination thereof, or other structures capable of implementing the above functions in the related art; the mobile component can also be connected with the test antenna in the aforementioned manner to realize the same function, which is not described herein again. It is understood that the moving assembly may be controlled manually or automatically by a preset program, for example, the wireless device to be tested is lifted and rotated to a testing position automatically according to testing requirements, so as to meet the testing requirements.
FIG. 7 is a schematic diagram of a performance testing system of a wireless device according to one embodiment of a testing system of the present disclosure. As shown in fig. 7, the test system 10 includes:
the wave absorbing material shielding box comprises a shielding box 100, wherein wave absorbing materials 101 are arranged in the shielding box 100, and as an example, the wave absorbing materials 101 are arranged on the inner wall of the shielding box 100;
a placement member (not shown) provided in the shield case 100 for placing the wireless devices 1 and 2;
the test antennas 201 and 202 are disposed in the shielding box 100, and as an example, the number of the test antennas includes 2, and the positions of the test antennas correspond to the wireless devices 1 and 2 one to one, that is, the test antenna 201 and the wireless device 1 perform energy transmission to obtain a test result, and the test antenna 202 and the wireless device 2 perform energy transmission to obtain a test result;
a moving assembly (not shown) coupled to at least one of the placement assembly and the test antenna for changing the relative positions of the wireless device and the test antenna;
and a performance testing device (not shown) of the aforementioned wireless device.
In this embodiment, the testing apparatus controls the testing antennas 201 and 202 to test the wireless devices 1 and 2 at different frequencies simultaneously, that is, at the same testing time, the frequency of receiving/transmitting signals of the testing antenna 201 and the wireless device 1 is different from the frequency of receiving/transmitting signals of the testing antenna 202 and the wireless device 2, so that the isolation between adjacent tests can be improved, the interference between adjacent testing loops can be reduced, and the testing efficiency is improved while the testing precision is ensured.
According to other embodiments of the test system, the number of test antennas comprises at least 2, the placing assembly is adapted to place at least 2 wireless devices, and the test apparatus further comprises means for controlling N test antennas to scan or test N wireless devices simultaneously, wherein at least adjacent test antennas scan or test at different frequencies, N being greater than or equal to 2. As an example, the number of the test antennas is 6, the placing component is suitable for placing 6 wireless devices, when the 6 test antennas simultaneously test the 6 wireless devices, the adjacent test antennas test at different frequencies, or all the test antennas test at different frequencies, and the test antennas/tested pieces can be arranged in a linear shape, a polygonal shape, a honeycomb shape, or the like without limitation.
According to an embodiment of the test system, a wave absorbing material is arranged between adjacent test antennas or/and adjacent wireless devices. The wave-absorbing material can further improve the isolation between adjacent test antennas/wireless equipment, reduce the interference between adjacent test loops and ensure the test precision. Optionally, as shown in fig. 8, the test system shown in fig. 8 is based on fig. 7, and a wave-absorbing material 300 is arranged between adjacent wireless devices 1 and 2 as an isolation. In other embodiments, a wave-absorbing material may be disposed between adjacent test antennas, or a wave-absorbing material may be disposed between adjacent wireless devices and test antennas to completely isolate adjacent tests, as required. The shape and specification of the wave-absorbing material are not particularly limited in this disclosure.
According to one embodiment of the test system, the part of the test antenna other than the radiation aperture is covered with a wave-absorbing material. Specifically, the test antenna only reserves an aperture area for effective transceiving for energy transmission with the wireless device, and the rest part is covered with a wave-absorbing material to reduce interference to and from proximity testing. The specific form of covering the wave-absorbing material can be that the wave-absorbing material is tightly attached and fixed on the surface of the antenna, or the wave-absorbing material is arranged around the antenna in other modes and has a certain distance from the surface of the antenna.
It should be noted that, when the distance between adjacent test antennas/wireless devices is large enough, a higher isolation degree can be achieved without performing tests at different frequencies or providing a wave-absorbing material for isolation, but this increases the volume of the test system and increases the cost.
The test accuracy of the present embodiment is explained here by the actual test results. As shown in fig. 9 and 10, a mobile phone is used as a wireless device to be tested, and the test system of the present embodiment is used to perform a transmit-receive test on two mobile phones simultaneously. Fig. 9 shows the test results of the wireless device receiving performance, where each curve represents the result of one test, please refer to the test results of "test antenna 201 transmits, wireless device 1 receives" compared with the test results of " test antenna 201, 202 transmits, wireless device 1 receives", and the test results of "test antenna 202 transmits, wireless device 2 receives" compared with the test results of " test antenna 201, 202 transmits, wireless device 2 receives". It can be seen that the difference between the test results of the reception performance of one wireless device tested alone and the test results of two wireless devices tested simultaneously is less than 0.6 dB. It can be considered that, when the parallel downlink test is performed in the embodiment, the interference between adjacent tests is small, and the test precision is high. Similarly, fig. 10 shows the test result of the transmission performance of the wireless device, where each curve represents the result of one test, please refer to the comparison between the test result of "transmission by the wireless device 1 and received by the test antenna 201" and the test result of "transmission by the wireless device 1, 2 and received by the test antenna 201" and the comparison between the test result of "transmission by the wireless device 2 and received by the test antenna 202" and the test result of "transmission by the wireless device 1, 2 and received by the test antenna 202". It can be seen that the difference between the test results of the transmission performance of one wireless device tested alone and the test results of two wireless devices tested simultaneously is less than 0.17 dB. It can be considered that, when the parallel downlink test is performed in the embodiment, the interference between adjacent tests is small, and the test precision is high.
According to one embodiment of the test system, the test system further comprises a test meter coupled to the test antenna. The test meter is used to generate test signals to the test antenna or/and to receive signals from the wireless device to obtain test data. The test meter may have a number of test channels corresponding to the number of test antennas, and the test meter may be one or more.
According to an embodiment of the test system, the near field radiation distance is obtained according to the following formula:
Where R represents the near-field radiation distance, D represents the maximum physical size of the wireless device, and λ represents the wavelength of a wireless signal transmitted or received by the wireless device.
According to one embodiment of the test system, the near field radiation distance is 5mm to 30mm, which is suitable for wireless devices with electrically small antennas, such as mobile phones, tablets, etc.
Some of the benefits of the present disclosure are described herein in terms of test results for one embodiment of a test system. In this embodiment, the test system includes:
the inner wall of the shielding box is provided with a wave-absorbing material so as to form an anechoic chamber;
the mobile phone placing assembly is arranged in the shielding box and is suitable for placing 4 pieces of wireless equipment, the wireless equipment in the embodiment is a mobile phone, 4 mobile phones with the same model are placed on the placing assembly in the same test, the screens of the mobile phones face upwards, wave-absorbing materials are arranged between the adjacent mobile phones to serve as isolation, and the wave-absorbing materials are fixed on the placing assembly;
the test antenna comprises 4 test antennas, a shielding box and a power supply, wherein the test antennas are arranged in the shielding box, the parts of the test antennas except radiation apertures are covered with wave-absorbing materials, the positions of the test antennas correspond to the 4 mobile phones one by one, the apertures of the test antennas face downwards, namely the maximum polarization direction of the test antennas is opposite to the screen of the mobile phones, and it can be understood that for most mobile phones, the radiation or receiving direction of the antennas is mainly the direction from the screen to a user, and the maximum polarization direction of the test antennas is opposite to the main radiation direction of the mobile phone antennas, so that main energy can be effectively captured;
the first moving assembly is connected with the placing assembly and used for controlling the 4 mobile phones to be linked in the horizontal direction so as to reach a target position;
the second moving assembly is connected with the test antennas and used for controlling the 4 test antennas to be linked in the horizontal and vertical directions so as to reach the target position;
the test instrument is connected with the test antenna;
and a performance testing device of the wireless device.
In the case where the test position of the handset is unknown, a scan test is required to obtain the test position. In this embodiment, since the main radiation or receiving direction of the antenna of the mobile phone is known information, the preset scanning plane is set in the direction, and for a wireless device whose radiation or receiving direction is unknown, the preset scanning plane may include various directions of the wireless device.
The reference mobile phone is placed in a test system for scanning, the reference mobile phone is a mobile phone with wireless performance meeting preset requirements, and the reference mobile phone is called a golden machine in some related technologies. Specifically, the method comprises the following steps:
the testing device controls the testing antenna to scan on a preset scanning surface located within the near-field radiation distance of the reference mobile phone to obtain a scanning result, and scans all frequency bands of the LTE of 1 transmitting antenna of the reference mobile phone;
the testing device obtains a testing position according to the scanning result, and a testing position is determined in a higher frequency band, a middle frequency band and a lower frequency band in the testing frequency band respectively.
In the testing stage, the testing device controls the testing antenna to test the wireless equipment at the testing position, in the same test, the testing equipment is a mobile phone with the same model as the reference mobile phone, the testing position is the same (the first mobile assembly or/and the second mobile assembly can control the mobile phone or/and the testing antenna to be linked to reach the testing position), adjacent tests are carried out at different frequencies, and the mobile phone is connected and tested through Wi-Fi.
The test time was 24.5s, and the test results of the transmission performance (Tx) are shown in table 1 below:
TABLE 1 Tx test results
The Total Radiated Power (TRP) test is performed on the same mobile phone, both the test method and the test system conform to the CTIA specification, and the test results are shown in the following table 2:
TABLE 2 TRP test results
As can be seen from the above results, the Tx test result obtained in the test system of the present embodiment is monotonically correlated with the TRP test result, with higher consistency. The Tx test results of the mobile phone 1 at low frequencies of 704 MHz, 710 MHz, 823 MHz, and 825MHz are significantly lower, and compared with the test result of the mobile phone 4 at the same frequency, the difference is about 3dB, which is basically consistent with the test result of the TRP, which indicates that the test system of this embodiment can effectively distinguish mobile phones with different performances, and can screen out mobile phones with obviously abnormal antenna performance.
Corresponding to the foregoing embodiment of the method for testing performance of a wireless device, another embodiment of the present disclosure is an electronic device, including: a processor; a memory for storing a computer program executable by the processor; the processor implements the performance testing method of the wireless device when executing the computer program, which is not described herein again. Fig. 11 shows a block diagram of the present embodiment according to an embodiment of the electronic device. The electronic device may be a computer, a mobile phone, a tablet device, a messaging device, or other terminal device. The electronic device may include a memory 1001, a processor 1002, and a computer program stored on the memory 1001 and executable on the processor 1002. The processor 1002, when executing the computer program, implements the method of wireless device performance testing provided in the embodiments described above.
Optionally, the electronic device of this embodiment further includes: a communication interface 1003 for communicating between the memory 1001 and the processor 1002. Memory 1001 may include high-speed RAM memory and may also include non-volatile memory (e.g., at least one disk memory). If the memory 1001, the processor 1002, and the communication interface 1003 are implemented independently, the communication interface 1003, the memory 1001, and the processor 1002 may be connected to each other through a bus and perform communication with each other. The bus may be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, an Extended ISA (Extended Industry Standard Architecture) bus, or the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one thick line is shown in FIG. 11, but this is not intended to represent only one bus or type of bus.
Optionally, in a specific implementation, if the memory 1001, the processor 1002, and the communication interface 1003 are integrated on one chip, the memory 1001, the processor 1002, and the communication interface 1003 may complete communication with each other through an internal interface.
The processor 1002 may be a Central Processing Unit (CPU), an Application Specific Integrated Circuit (ASIC), or one or more Integrated circuits configured to implement embodiments of the present disclosure.
Corresponding to the foregoing embodiments of the performance testing method of the wireless device, another embodiment of the present disclosure is a non-transitory computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the performance testing method of the wireless device is implemented, which is not described herein again.
In the description above, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples" or the like are intended to mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present disclosure. In the present disclosure, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present disclosure, "a plurality" means at least two, e.g., two, three, etc., unless explicitly specifically limited otherwise.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing steps of a custom logic function or process, and alternate implementations are included within the scope of the present disclosure in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present disclosure.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this disclosure, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
It should be understood that portions of the present disclosure may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present disclosure may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc. Although embodiments of the present disclosure have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present disclosure, and that changes, modifications, substitutions and alterations may be made to the above embodiments by those of ordinary skill in the art within the scope of the present disclosure.
Claims (17)
1. A wireless performance testing method of a wireless device, comprising:
the test antenna scans a preset scanning surface positioned in the near-field radiation distance of the wireless equipment to obtain a scanning result;
obtaining a test position according to the scanning result; and
and the test antenna tests the wireless equipment at the test position to obtain a test result.
2. The testing method of claim 1, wherein obtaining test locations from the scan results comprises:
obtaining qualified scanning points in the scanning result, wherein the qualified scanning points meet the following conditions: the scanning value is greater than a first preset value, or the scanning value is the maximum value in the scanning result; and
and determining the test position according to the position of the qualified scanning point.
3. The test method according to claim 2,
obtaining a reference test position according to the scanning result of the reference device, wherein the reference device is a wireless device with wireless performance meeting preset requirements; and
determining a reference test location of the reference device that is the same as the wireless device as the test location of the wireless device.
4. The test method of claim 1, further comprising:
and comparing the test result with a reference test result, judging the test result to be qualified when the difference value between the test result and the reference test result is smaller than a second preset value, and judging the test result to be unqualified when the difference value between the test result and the reference test result is larger than the second preset value, wherein the reference test result is a preset value or is obtained by testing the reference equipment with the wireless performance meeting the preset requirement at the same test position through the test antenna.
5. The method of claim 1, wherein N of the wireless devices are scanned or tested simultaneously by N of the test antennas, wherein at least adjacent test antennas are scanned or tested at different frequencies, and wherein N is greater than or equal to 2.
6. The testing method of claim 1, wherein the near-field radiation distance is obtained according to the following formula:
Wherein R represents the near-field radiation distance, D represents a maximum physical dimension of the wireless device, and λ represents a wavelength of a wireless signal transmitted or received by the wireless device.
7. The test method of claim 6, wherein the near-field radiation distance is 5mm to 30 mm.
8. A wireless performance testing apparatus for a wireless device, comprising:
the scanning module is used for controlling the test antenna to scan on a preset scanning surface positioned in the near-field radiation distance of the wireless equipment to obtain a scanning result;
the test position acquisition module is used for acquiring a test position according to the scanning result; and
and the test module is used for controlling the test antenna to test the wireless equipment at the test position to obtain a test result.
9. The test device of claim 8, wherein the test position acquisition module comprises:
a qualified scanning point obtaining unit, configured to obtain a qualified scanning point in the scanning result, where the qualified scanning point satisfies the following conditions: the scanning value is greater than a first preset value, or the scanning value is the maximum value in the scanning result; and
and the first test position acquisition unit is used for determining the test position according to the position of the qualified scanning point.
10. The testing device of claim 9, wherein the test position acquisition module further comprises:
a reference test position obtaining unit, configured to obtain a reference test position according to the scanning result of a reference device, where the reference device is a wireless device whose wireless performance meets a preset requirement; and
a second test position acquisition unit configured to determine a reference test position of a reference device that is the same as the wireless device as the test position of the wireless device.
11. A wireless performance testing system for a wireless device, comprising:
the shielding box is internally provided with wave-absorbing materials;
the placing assembly is arranged in the shielding box and used for placing the wireless equipment;
the test antenna is arranged in the shielding box;
a moving assembly coupled to at least one of the placement assembly and the test antenna for changing the relative positions of the wireless device and the test antenna; and
a test device according to any one of claims 8-10.
12. The test system of claim 11, wherein:
the test antennas comprise at least 2;
the placement component is adapted to place at least 2 of the wireless devices;
the testing device also comprises a device for controlling N testing antennas to scan or test N wireless devices simultaneously, wherein at least adjacent testing antennas scan or test at different frequencies, and N is greater than or equal to 2.
13. The test system according to claim 12, wherein a wave absorbing material is provided between adjacent test antennas or/and adjacent wireless devices.
14. The test system of claim 12, wherein the portion of the test antenna other than the radiating aperture is covered with a wave absorbing material.
15. The test system defined in any one of claims 11-14, further comprising a test meter coupled to the test antenna.
16. An electronic device, comprising:
a processor;
a memory for storing a computer program executable by the processor;
wherein the processor, when executing the computer program, implements the testing method of any of claims 1-7.
17. Non-transitory computer-readable storage medium, on which a computer program is stored, which, when executed by a processor, implements a testing method according to any one of claims 1-7.
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