CN111723471B - Method, device, equipment and storage medium for determining ablation thickness - Google Patents
Method, device, equipment and storage medium for determining ablation thickness Download PDFInfo
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- 238000002679 ablation Methods 0.000 title claims abstract description 104
- 238000000034 method Methods 0.000 title claims abstract description 60
- 239000011435 rock Substances 0.000 claims abstract description 146
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 17
- 230000008859 change Effects 0.000 claims description 15
- 238000004590 computer program Methods 0.000 claims description 9
- 238000004088 simulation Methods 0.000 claims description 7
- 238000005260 corrosion Methods 0.000 claims description 6
- 230000007797 corrosion Effects 0.000 claims description 6
- 230000003628 erosive effect Effects 0.000 claims description 3
- 230000015556 catabolic process Effects 0.000 claims 1
- 238000006731 degradation reaction Methods 0.000 claims 1
- 238000011160 research Methods 0.000 abstract description 2
- 230000002452 interceptive effect Effects 0.000 description 18
- 230000003287 optical effect Effects 0.000 description 7
- 230000006870 function Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000003491 array Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 230000004992 fission Effects 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000004321 preservation Methods 0.000 description 2
- 230000000644 propagated effect Effects 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 229910052845 zircon Inorganic materials 0.000 description 2
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 230000009545 invasion Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000010583 slow cooling Methods 0.000 description 1
- 238000004901 spalling Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/20—Design optimisation, verification or simulation
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- G—PHYSICS
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Abstract
The application provides an ablation thickness determination method, an ablation thickness determination device and a storage medium, wherein the method comprises the following steps: acquiring a first heat Shi Quxian of the rock sample; determining an inflection point and a low temperature section of the first heat history curve; trend fitting the high temperature section of the first thermal history curve according to the low temperature section, and performing trend fitting according to the high Wen Duanyi and the second heat Shi Quxian of the rock sample at the low temperature Duan Shengcheng; from the second heat Shi Quxian, the ablation thickness of the formation in which the rock sample is located is determined at each historical time. The method realizes that the ablation thickness of the rock stratum where the rock sample is positioned in each historical time is accurately determined according to the heat Shi Quxian of the rock sample, so that important data is provided for subsequent research on later combined ablation thickness.
Description
Technical Field
The application relates to the technical field of geological exploration, in particular to a method, a device, equipment and a storage medium for determining an ablation thickness.
Background
The recovery of the thickness evolution history of the ablation has very important value for researching the structural evolution of the geology of a region, mineral products and oil and gas exploration. Therefore, accurate recovery of the ablation thickness is important.
Disclosure of Invention
The embodiment of the application provides a method, a device, electronic equipment and a computer readable storage medium for determining the ablation thickness, which are used for accurately determining the ablation thickness of a rock layer where a rock sample is located in each historical time according to the heat Shi Quxian of the rock sample, so that important data are provided for later subsequent research on the combined ablation thickness.
To this end, an embodiment of an aspect of the present application provides an ablation thickness determining method, including: acquiring a first heat Shi Quxian of the rock sample; determining an inflection point and a low temperature section of the first heat history curve; trend fitting the high temperature section of the first thermal history curve according to the low temperature section, and performing trend fitting according to the high Wen Duanyi and the second heat Shi Quxian of the rock sample at the low temperature Duan Shengcheng; from the second heat Shi Quxian, the ablation thickness of the formation in which the rock sample is located is determined at each historical time.
Another embodiment of the present application proposes an ablation thickness determining apparatus, the apparatus comprising: an acquisition module for acquiring a first heat Shi Quxian of the rock sample; the first determining module is used for determining an inflection point and a low-temperature section of the first heat history curve; the generating module is used for carrying out trend fitting on the high-temperature section of the first heat history curve according to the low-temperature section, and carrying out second heat Shi Quxian on the rock sample according to the high Wen Duanyi and the low temperature Duan Shengcheng after trend fitting; and a second determining module, configured to determine an ablation thickness of the rock stratum where the rock sample is located at each historical time according to the second heat Shi Quxian.
In a further aspect, an embodiment of the present application proposes a computer device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor executes the program to implement the method for determining an ablation thickness according to the embodiment of the first aspect.
In a further aspect, the present application proposes a computer readable storage medium, on which a computer program is stored, which program, when being executed by a processor, implements the ablation thickness determination method according to the embodiment of the first aspect.
The technical scheme disclosed by the application has the following beneficial effects:
the method realizes accurate determination of the ablation thickness of the rock stratum where the rock sample is located at each historical time according to the heat Shi Quxian of the rock sample, thereby providing important data for subsequent study on the later combined ablation thickness.
Additional aspects and advantages of the application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the application.
Drawings
The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:
FIG. 1 is a flow chart of a method of determining ablation thickness in accordance with one embodiment of the present application;
FIG. 2 is a schematic representation of a first thermal history curve of a rock sample according to one embodiment of the present application;
FIG. 3 is a flow chart of a method of determining ablation thickness in accordance with another embodiment of the present application;
FIG. 4 is a schematic diagram of an interactive interface according to one embodiment of the present application;
FIG. 5 is a schematic diagram of another interactive interface of an embodiment of the present application;
FIG. 6 is a schematic view of the structure of an ablation thickness determining apparatus according to an embodiment of the present application;
FIG. 7 is a schematic diagram of a computer device according to one embodiment of the present application;
fig. 8 is a schematic structural diagram of a computer device according to another embodiment of the present application.
Detailed Description
Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and intended for the purpose of explaining the present application and are not to be construed as limiting the present application.
An ablation thickness determination method, apparatus, computer device, and storage medium of embodiments of the present application are described below with reference to the accompanying drawings.
First, a method for determining an ablation thickness according to an embodiment of the present application will be specifically described with reference to fig. 1.
FIG. 1 is a flow chart of a method for determining ablation thickness according to one embodiment of the present application.
As shown in fig. 1, the ablation thickness determination method of the present application may include the steps of:
step 101, a first thermal history curve of a rock sample is obtained.
The main implementation body of the method for determining the ablation thickness according to the embodiment of the present application is the device for determining the ablation thickness according to the embodiment of the present application, where the device for determining the ablation thickness may be configured in any electronic device capable of performing data processing, so as to accurately determine the ablation thickness of the rock layer where the rock sample is located at each historical time according to the heat Shi Quxian of the rock sample.
The electronic device may be a hardware device such as a computer, a tablet computer, a mobile phone, etc., which is not limited in this application. The determination device of the ablation thickness may be a hardware device such as an electronic device, a server, or software installed on the hardware device, which is not limited in this application. The present embodiment will be described taking an ablation thickness determination device as an example of ablation thickness management software. For convenience of description, the ablation thickness management software will be simply referred to as management software hereinafter.
The rock sample may be any rock sample obtained from the surface or any rock layer, which is not limited in this application.
The first thermal history curve may characterize a correspondence between historical time and temperature values of the rock sample.
Specifically, thermal history simulations may be performed on the rock sample based on the low temperature chronology data to generate a first thermal history curve for the rock sample. The method for generating the first heat history curve of the rock sample is not limited, and any method in the related art can be adopted.
In an exemplary embodiment, the first thermal history curve may be an average curve or a weighted average curve of the thermal history simulation results.
In an exemplary embodiment, the first thermal history curve may be a curve with an abscissa as the history time and an ordinate as the temperature value. Wherein, the unit of the abscissa may be millions of years (Ma), and the unit of the ordinate may be degrees celsius (c). It should be noted that the historical time in the first thermal history curve may be understood as the previous time, for example, 30Ma indicates that the historical time is 30Ma years from the previous time.
Step 102, determining an inflection point and a low temperature section of the first heat history curve.
It is understood that the inflection point of the first heat history curve may be the point where the corner of the first heat Shi Quxian is greatest.
Specifically, the inflection point of the first heat history curve may be determined in a variety of ways.
Mode one
Temperature slope information of each historical time in the first heat history curve is obtained, and inflection points of the first heat history curve are determined according to the temperature slope information of each historical time.
The temperature slope information of a certain historical time in the first heat history curve can include a slope of a tangent line of the first heat history curve at the historical time.
Specifically, the management software may obtain temperature slope information of each history time in the first thermal history curve, and compare the temperature slope information of each history time with temperature slope information of a previous history time to obtain a change value of the temperature slope information of each history time relative to the temperature slope information of the previous history time, so that a point with the maximum change value of the temperature slope information may be determined as an inflection point of the first thermal history curve.
Mode two
And determining the inflection point of the first heat history curve according to the temperature inflection point interval of the first heat history curve input by the user.
The temperature inflection point interval is an interval including an inflection point of the first heat history curve, for example, when the history time corresponding to the inflection point is 125Ma, the temperature inflection point interval may be 120Ma-130Ma, and the length of the history time interval included in the temperature inflection point interval is not limited in this application.
Specifically, after the management software obtains the first thermal history curve of the rock sample, an interactive interface may be provided for a user, and an input box for inputting a temperature inflection point interval by the user may be set in the interactive interface, so that after the user determines a section of the temperature inflection point interval of the first thermal history curve according to experience in combination with related data of thermal history simulation, a change trend of the thermal history curve, a geological actual condition and the like, the temperature inflection point interval may be input in the input box of the interactive interface, and further the management software may determine an inflection point of the first thermal history curve according to the temperature inflection point interval input by the user.
In specific implementation, the management software may first obtain temperature slope information of each history time in the temperature inflection point interval according to the temperature inflection point interval input by the user, and then compare the temperature slope information of each history time in the temperature inflection point interval with temperature slope information of a previous history time to obtain a change value of the temperature slope information of each history time in the temperature inflection point interval relative to the temperature slope information of the previous history time, so that a point with the largest change value of the temperature slope information in the temperature inflection point interval may be determined as an inflection point of the first thermal history curve.
It can be understood that when the inflection point of the first heat history curve is determined according to the temperature inflection point interval of the first heat history curve, only the temperature slope information of each history time in the temperature inflection point interval is required to be obtained, and then the inflection point of the first heat history curve is determined according to the temperature slope information of each history time in the temperature inflection point interval.
Mode three
The inflection point of the first heat history curve is determined according to the inflection point of the first heat history curve input by the user.
In an exemplary embodiment, after the management software obtains the first thermal history curve of the rock sample, an interactive interface may be provided for a user, and an input box for inputting an inflection point may be set in the interactive interface, so that after the user empirically determines the inflection point of the first thermal history curve in combination with related data of thermal history simulation, a trend of change of the thermal history curve, a geological actual condition, and the like, the inflection point may be input in the input box in the interactive interface, and further the management software may determine the inflection point input by the user as the inflection point of the first thermal history curve.
Further, after the inflection point of the first heat history curve is determined, the low-temperature section of the first heat history curve can be determined according to the inflection point.
It will be appreciated that in a typical thermal history curve of a rock sample, the longer the time since the present history, the higher the corresponding temperature, the shorter the time since the present history, and the lower the corresponding temperature, and therefore, the management software may determine the curve segment of the history period after the inflection point of the first thermal history curve (i.e., the history period shorter since the present time than the time since the present corresponding to the inflection point) as the low temperature segment of the first thermal history curve, and the curve segment of the history period before the inflection point of the first thermal history curve (i.e., the history period longer since the present time than the present time corresponding to the inflection point) as the high temperature segment of the first thermal history curve.
For example, assuming that the first heat history curve of the rock sample is in the form shown in fig. 2, the point a in fig. 2 is the inflection point of the first heat history curve, the curve segment on the left of the point a (i.e., the curve segment of the history period shorter than the previous time corresponding to the inflection point) is the low temperature segment of the first heat history curve, and the curve segment on the right of the point a (i.e., the curve segment of the history period longer than the previous time corresponding to the inflection point) is the high temperature segment of the first heat history curve. Wherein, the abscissa of the first heat history curve in FIG. 2 is Time (Time), the ordinate is Temperature (Temperature), and the unit is degrees Celsius (C.).
It is understood that in embodiments of the present application, the low temperature segment of the first heat history curve, determined from the inflection point, may be a segment of the curve that includes a segment within (i.e., less than 250 ℃) of the zircon fission track sealing temperature (about 250 ℃). Alternatively, in 40 Ar/ 39 The curve segment from the Ar (isotope dating) seal temperature (about 300 ℃ -400 ℃) to the zircon fission track seal temperature (about 250 ℃) also shows slow cooling, and the low temperature segment of the first heat history curve may also be the curve segment from about 300 ℃ -400 ℃ to about 250 ℃ because the temperature change of the rock sample is likely to be caused by regional spalling and does not belong to the rapid crystallization cooling stage of the magma.
And 103, performing trend fitting according to a high-temperature section of the low-temperature Duan Duidi-heat history curve, and generating a second heat history curve of the rock sample according to the high-temperature section and the low-temperature section after trend fitting.
Step 104, determining the ablation thickness of the rock layer where the rock sample is located at each historical time according to the second heat Shi Quxian.
Specifically, after the low-temperature section of the first heat history curve is determined, a plurality of scattered points in the low-temperature section can be obtained, trend fitting is carried out on the plurality of scattered points to obtain a trend fitting line, then a curve section matched with the history time section of the high-temperature section in the trend fitting line can be determined to be a high-temperature section after trend fitting, and accordingly a second heat history curve of the rock sample is generated according to the high Wen Duanyi after trend fitting and the low-temperature section before trend fitting. After determining the second thermal history of the rock sample, the thickness of the formation in which the rock sample is located may be determined for each historical time period.
Wherein the plurality of scatter points in the low-temperature segment used for trend fitting may be a plurality of scatter points obtained from a segment of the curve segment after (i.e., shorter than the present time corresponding to) and adjacent to the inflection point of the first heat history curve. In specific implementation, the interval length of the historical time period corresponding to the curve segment may be set according to factors such as a thermal history curve change trend or comprehensive judgment of geological information by a user, for example, a plurality of scattered points may be obtained from the curve segment X to perform trend fitting, where the curve segment X is a curve segment after the inflection point (i.e. in a direction shorter than the present time corresponding to the inflection point) and a segment adjacent to the inflection point has an interval length of 5Ma, 10Ma or 20 Ma.
For example, with continued reference to fig. 2, assuming that the history time corresponding to the inflection point a is 132Ma, a plurality of points obtained from a curve segment having a section length of 10Ma after and adjacent to the inflection point of the first heat history curve is preset as a plurality of points in the low-temperature segment for trend fitting, a plurality of points may be obtained from a curve segment having a history time of 122Ma-132Ma of the first heat history curve as a plurality of points in the low-temperature segment for trend fitting.
It will be appreciated that the temperature evolution record of rock during the deep-up stripping process from the subsurface can be characterized by the heat Shi Quxian of the rock, but only the low temperature section of the thermal history curve of the rock can correspond to the surface stripping evolution, while the high temperature section cannot correspond to the surface stripping evolution, so that the stripping thickness determined from the low temperature section of the thermal history curve of the rock is accurate, and the stripping thickness cannot be accurately determined from the high temperature section of the thermal history curve of the rock. In the second heat history curve of the rock sample for determining the ablation thickness, the high-temperature section is obtained by performing trend fitting according to the low-temperature section, so that the high-temperature section can also accurately correspond to the surface ablation evolution, and the ablation thickness of the rock sample in the rock layer at each historical time can be accurately determined according to the newly generated second heat history curve of the rock sample.
It can be understood that the method for determining the ablation thickness provided by the embodiment of the application can be applied to the condition that the high-temperature section is a magma crystallization cooling stage, and because the cooling time of the high-temperature section in the condition is relatively short, the method for determining the ablation thickness performs trend fitting on the high-temperature section of the first heat history curve according to the first heat Shi Quxian of the low-temperature section, so as to generate a new second heat history curve, thereby accurately determining the ablation thickness of the rock stratum where the rock sample is located in each historical time, and being helpful for estimating the ablation thickness of the high-temperature section and estimating the magma invasion depth.
It is understood that accurate determination of the thickness of the ablation plays a very important role in studying geologic structure evolution, deposit preservation, oil exploration and the like. Taking deposit preservation study as an example, the method for determining the ablation thickness accurately determines the ablation thickness of the rock sample at high temperature according to the thermal history curve, and can be used for estimating the depth of deposit formation and the ablation thickness of overlying strata of the ore body in the aspects of deep mining and the like, and finally estimating whether the ore body still exists or not and what depth is buried.
According to the method for determining the ablation thickness, firstly, a first heat history curve of a rock sample is obtained, then, the inflection point and the low-temperature section of the first heat history curve are determined, trend fitting is carried out according to the high-temperature section of the low-temperature Duan Duidi heat history curve, and second heat Shi Quxian of the rock sample is generated according to the high-temperature section and the low-temperature section after trend fitting, so that the ablation thickness of a rock layer where the rock sample is located in each history time is determined according to the second heat Shi Quxian. Therefore, the method and the device realize accurate determination of the ablation thickness of the rock stratum where the rock sample is located at each historical time according to the heat Shi Quxian of the rock sample, thereby providing important data for subsequent study on the later combined ablation thickness.
The method of determining the ablation thickness of the present application will be further described with reference to fig. 3.
Fig. 3 is a flow chart of a method for determining an ablation thickness according to another embodiment of the present application.
As shown in fig. 3, the method for determining the ablation thickness according to the embodiment of the present application may include the following steps:
in step 201, a first thermal history curve of a rock sample is obtained.
The first heat history curve can represent the corresponding relation between the historical time and the temperature value of the rock sample.
Step 202, a temperature inflection point interval of the first heat history curve is obtained.
Step 203, temperature slope information of each history time in the temperature inflection point interval is obtained.
Step 204, determining the inflection point of the first heat history curve according to the temperature slope information of each history time in the temperature inflection point interval.
Specifically, after the management software obtains the first thermal history curve of the rock sample, an interactive interface may be provided for a user, and an input box for inputting a temperature inflection point interval by the user may be set in the interactive interface, so that after the user determines a section of the temperature inflection point interval of the first thermal history curve according to experience in combination with related data of thermal history simulation, a change trend of the thermal history curve, a geological actual condition and the like, the temperature inflection point interval may be input in the input box of the interactive interface, and further the management software may determine an inflection point of the first thermal history curve according to the temperature inflection point interval input by the user.
In specific implementation, the management software may first obtain temperature slope information of each history time in the temperature inflection point interval according to the temperature inflection point interval input by the user, and then compare the temperature slope information of each history time in the temperature inflection point interval with temperature slope information of a previous history time to obtain a change value of the temperature slope information of each history time in the temperature inflection point interval relative to the temperature slope information of the previous history time, so that a point with the maximum change value of the temperature slope information in the temperature inflection point interval may be determined as an inflection point of the first heat history curve according to the temperature slope information of each history time in the temperature inflection point interval.
Step 205, determining a low temperature section of the first heat history curve according to the inflection point.
It will be appreciated that in a typical thermal history curve of a rock sample, the longer the time since the present history, the higher the corresponding temperature, the shorter the time since the present history, and the lower the corresponding temperature, and therefore, the management software may determine the curve segment of the history period after the inflection point of the first thermal history curve (i.e., the history period shorter since the present time than the time since the present corresponding to the inflection point) as the low temperature segment of the first thermal history curve, and the curve segment of the history period before the inflection point of the first thermal history curve (i.e., the history period longer since the present time than the present time corresponding to the inflection point) as the high temperature segment of the first thermal history curve.
Step 206, obtaining a plurality of scattered points in the low temperature section.
Step 207, performing trend fitting on the plurality of scattered points to obtain a trend fitting curve.
And step 208, determining a curve segment matched with the historical time segment of the high temperature segment in the trend fitting curve as the high temperature segment after trend fitting.
Step 209, generating a second thermal history curve of the rock sample according to the high temperature section and the low temperature section after trend fitting.
Specifically, after the low-temperature section of the first heat history curve is determined, a plurality of scattered points in the low-temperature section can be obtained, trend fitting is carried out on the plurality of scattered points to obtain a trend fitting line, then a curve section matched with the history time section of the high-temperature section in the trend fitting line is determined to be the high-temperature section after trend fitting, and accordingly a second heat history curve of the rock sample can be generated according to the high Wen Duanyi after trend fitting and the low-temperature section before trend fitting.
At step 210, a surface temperature value and a surface temperature gradient value of the formation are obtained.
The surface temperature value may refer to a surface temperature of the formation.
In practice, the surface temperature value may be determined based on the surface temperature at sea level and the elevation of the formation relative to sea level. For example, assuming a surface temperature at sea level of Ts, a height of the formation relative to sea level of E, a temperature drop of 6 degrees per kilometer of formation relative to sea level, the surface temperature value may be Ts-E6.
The ground temperature gradient can represent the temperature increment value of 100 meters or 1000 meters in depth, and can be set according to the needs in practical application.
In an exemplary embodiment, the management software may provide an interactive interface to the user, and an input box for the user to input the geothermal gradient value and the surface temperature value or an input box for the user to input the geothermal gradient value and the surface temperature of the sea level and the height of the rock layer relative to the sea level may be provided in the interactive interface, so that the management software may determine the surface temperature and the geothermal gradient of the rock layer according to the input information of the user in the input box.
Step 211, determining the ablation thickness of the rock stratum at each historical time according to the temperature value, the surface temperature value and the ground temperature gradient value of each historical time in the second thermal history curve.
Specifically, the management software may subtract the surface temperature value from the temperature value of each historical time in the second thermal history curve to obtain a difference between the temperature value of each historical time and the surface temperature value in the second thermal history curve, and then use a ratio of the difference corresponding to each historical time to the ground temperature gradient value as the corresponding denudation thickness of each historical time.
In an exemplary embodiment, before determining the ablation thickness of the rock layer where the rock sample is located at each historical time according to the first heat Shi Quxian of the rock sample, an interactive interface may also be provided for the user, where a button for starting the calculation of the ablation thickness is provided in the interactive interface, so that after the user touches the button by clicking, sliding, etc., the determination of the ablation thickness of the rock layer where the rock sample is located at each historical time according to the first heat Shi Quxian is started again.
Step 212, generating and displaying a corrosion thickness curve of the rock stratum according to the corrosion thickness of the rock stratum at each historical time.
It will be appreciated that after determining the thickness of the formation to be removed at each historical time, a profile of the thickness of the formation to be removed may also be generated and displayed to visually display the trend of the thickness of the formation to be removed at each historical time. And the user can extract the required thickness corresponding to the historical time from the erosion thickness curve of the rock stratum according to the requirement.
Additionally, in exemplary embodiments, the second heat history curve may also be displayed after the second heat history curve of the rock sample is generated.
It should be noted that, in this embodiment of the present application, a curve digitized point distance value may also be set, so that the first heat Shi Quxian, the second heat history curve, and the ablation thickness curve may be digitally processed according to the curve digitized point distance value, so as to implement unified normalization processing on each curve, and provide data for drawing a contour map of the ablation thickness of a same period plane using a plurality of rock samples.
For example, the digitization point spacing value may be set to 5Ma, so that the first heat Shi Quxian, the second heat history curve, and the ablation thickness curve may be digitally processed at a time interval of 5 Ma.
The distance value between the digitized points of the curve can be set by a user or can be set automatically by management software, and the application is not limited to this.
The method for determining the thickness of ablation provided in the present application will be described with reference to fig. 2, 4, and 5.
As shown in fig. 4 and 5, the management software may provide an interactive interface to the user. As shown in fig. 4, an input box for inputting the ground temperature gradient value, the surface temperature of the sea level, the height of the rock layer relative to the sea level, the temperature inflection point interval, and the curve digital point interval value by the user may be set in the interactive interface, so that the user may input data such as the ground temperature gradient value, the surface temperature of the sea level, the height of the rock layer relative to the sea level, the temperature inflection point interval, and the curve digital point interval value in the input box. As shown in fig. 5, a "time" button for inputting a history time, a "temperature" button for inputting a temperature, and a "ablation thickness determination" button for starting the ablation thickness calculation may be provided in the interactive interface, so that a user may touch the "temperature" and "time" buttons by clicking, sliding, etc. to input temperature data and time data.
After the first heat history curve of the rock sample shown in fig. 2 and the upper area of fig. 5 is obtained, after a user touches the "ablation thickness determination" button by clicking, sliding or other touch methods, the management software may obtain temperature slope information of each history time in the temperature inflection point interval according to the temperature inflection point interval (shown in area B in fig. 2) input by the user, and determine inflection point a of the first heat history curve according to the temperature slope information of each history time in the temperature inflection point interval. And then determining a low-temperature section of the first heat history curve according to the inflection point A, acquiring a plurality of scattered points in the low-temperature section, carrying out trend fitting on the plurality of scattered points to obtain a trend fitting curve, determining a curve section matched with the historical time section of the high-temperature section in the trend fitting curve as a high-temperature section after trend fitting, and generating a second heat history curve of the rock sample according to the high-temperature section and the low-temperature section after trend fitting. Then, the thickness of the rock layer in each historical time can be determined according to the temperature value of each historical time in the second thermal history curve, the surface temperature on the sea level input by the user, the height of the rock layer relative to the sea level and the ground temperature gradient value, and the calculated thickness curve of the rock layer is displayed according to the calculated thickness curve of the rock layer.
The surface temperature at sea level in fig. 4 is expressed in degrees celsius (°c), the height of the rock formation relative to sea level is expressed in meters (m), the ground temperature gradient is expressed in ℃/km, the temperature inflection point interval is expressed in Ma, and the curve digitized point spacing value is expressed in Ma. In fig. 5, the abscissa represents Time (Time), the unit is Ma, and the ordinate represents ablation thickness (Exhumation thinckness), the unit is kilometer (km).
According to the two curves shown in fig. 5, the first heat history curve of the low temperature section corresponds to the ablation thickness curve one by one, but the first heat history curve of the high temperature section does not correspond to the ablation thickness curve one by one because the ablation thickness is determined not by the first heat history curve of the high temperature section but by the high temperature section after trend fitting according to the high temperature section of the low temperature Duan Duidi heat history curve.
According to the method for determining the ablation thickness of the rock sample, after a first heat history curve of the rock sample is obtained, a temperature inflection point interval of the first heat history curve can be obtained, then the inflection point of the first heat history curve is determined according to temperature slope information of each history time in the temperature inflection point interval, then a low-temperature section of the first heat history curve is determined according to the inflection point, a plurality of scattered points in the low-temperature section are obtained, trend fitting is carried out on the scattered points to obtain a trend fitting curve, a curve section matched with the history time section of the high-temperature section in the trend fitting curve is determined to be a high-temperature section after trend fitting, and then second heat Shi Quxian of the rock sample is generated according to the high-temperature section and the low-temperature section after trend fitting, so that the ablation thickness of the rock layer at each history time is determined according to the temperature value, the surface temperature value and the ground temperature gradient value of the second heat history time in the second heat history curve, and then the generated ablation thickness curve of the rock layer is displayed. Therefore, the method and the device realize accurate determination of the ablation thickness of the rock stratum where the rock sample is located at each historical time according to the heat Shi Quxian of the rock sample, thereby providing important data for subsequent study on the later combined ablation thickness.
The ablation thickness determining apparatus according to the embodiment of the present application is described below with reference to the drawings.
Fig. 6 is a schematic structural view of an ablation thickness determining apparatus according to an embodiment of the present application.
As shown in fig. 6, the ablation thickness determining apparatus includes: the device comprises an acquisition module 11, a first determination module 12, a generation module 13 and a second determination module 14.
Wherein the acquisition module 11 is configured to acquire a first heat Shi Quxian of the rock sample;
a first determination module 12 for determining an inflection point and a low temperature section of the first heat history curve;
the generating module 13 is configured to perform trend fitting according to a high temperature section of a low temperature Duan Duidi-thermal history curve, and generate second heat Shi Quxian of the rock sample according to the high temperature section and the low temperature section after the trend fitting;
the second determination module 14 is configured to determine an ablation thickness of the formation at each historical time at which the rock sample is located based on the second heat Shi Quxian.
In one possible implementation form, the above-mentioned obtaining module 11 is specifically configured to:
performing thermal history modeling on the rock sample to generate a first heat Shi Quxian;
wherein the first heat Shi Quxian characterizes a correspondence between historical time and temperature values of the rock sample.
In another possible implementation form, the first determining module 12 is specifically configured to:
Acquiring a temperature inflection point interval of a first heat history curve;
acquiring temperature slope information of each historical time in a temperature inflection point interval;
determining an inflection point of a first heat history curve according to temperature slope information of each history time in a temperature inflection point interval;
from the inflection point, a low temperature section of the first heat history curve is determined.
In another possible implementation form, the generating module 13 is specifically configured to:
acquiring a plurality of scattered points in a low-temperature section;
performing trend fitting on the scattered points to obtain a trend fitting curve;
and determining a curve segment matched with the historical time segment of the high temperature segment in the trend fitting curve as the high temperature segment after trend fitting.
In another possible implementation form, the second determining module 14 is specifically configured to:
acquiring a ground surface temperature value and a ground temperature gradient value of a rock stratum;
and determining the ablation thickness of the rock stratum at each historical time according to the temperature value, the surface temperature value and the ground temperature gradient value of each historical time in the second thermal history curve.
In another possible implementation form, the ablation thickness determining apparatus may further include:
and the display module is used for generating and displaying a corrosion thickness curve of the rock stratum according to the corrosion thickness of the rock stratum at each historical time.
It should be noted that, the implementation process and the technical principle of the ablation thickness determining apparatus of the present embodiment refer to the foregoing explanation of the ablation thickness determining method of the first embodiment, and are not repeated herein.
According to the ablation thickness determining device provided by the embodiment of the application, the first heat history curve of the rock sample is firstly obtained, then the inflection point and the low-temperature section of the first heat history curve are determined, trend fitting is carried out according to the high-temperature section of the low-temperature Duan Duidi heat history curve, and the second heat Shi Quxian of the rock sample is generated according to the high-temperature section and the low-temperature section after trend fitting, so that the ablation thickness of the rock layer where the rock sample is located in each history time is determined according to the second heat Shi Quxian. Therefore, the method and the device realize accurate determination of the ablation thickness of the rock stratum where the rock sample is located at each historical time according to the heat Shi Quxian of the rock sample, thereby providing important data for subsequent study on the later combined ablation thickness.
In order to implement the above embodiment, the present application further proposes a computer device.
Fig. 7 is a schematic structural diagram of a computer device according to an embodiment of the present application. The computer device shown in fig. 7 is only an example, and should not be construed as limiting the functionality and scope of use of the embodiments herein.
As shown in fig. 7, the computer device 200 includes: the processor 220, the memory 210, and a computer program stored on the memory 210 and executable on the processor 220, which when executed by the processor 220, implements the ablation thickness determination method described in the first aspect embodiment.
In an alternative implementation, as shown in fig. 8, the computer device 200 may further include: the processor 220 and the memory 210, the bus 230 connecting the different components (including the memory 210 and the processor 220), the memory 210 stores a computer program, and the processor 220 implements the ablation thickness determination method described in the embodiments of the present application when executing the program.
Bus 230 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus architectures. By way of example, and not limitation, such architectures include Industry Standard Architecture (ISA) bus, micro channel architecture (MAC) bus, enhanced ISA bus, video Electronics Standards Association (VESA) local bus, and Peripheral Component Interconnect (PCI) bus.
Computer device 200 typically includes a variety of computer device readable media. Such media can be any available media that is accessible by computer device 200 and includes both volatile and nonvolatile media, removable and non-removable media.
Memory 210 may also include computer system readable media in the form of volatile memory, such as Random Access Memory (RAM) 240 and/or cache memory 250. The computer device 200 may further include other removable/non-removable, volatile/nonvolatile computer system storage media. By way of example only, storage system 260 may be used to read from or write to non-removable, nonvolatile magnetic media (not shown in FIG. 8, commonly referred to as a "hard disk drive"). Although not shown in fig. 8, a magnetic disk drive for reading from and writing to a removable non-volatile magnetic disk (e.g., a "floppy disk"), and an optical disk drive for reading from or writing to a removable non-volatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In such cases, each drive may be coupled to bus 230 via one or more data medium interfaces. Memory 210 may include at least one program product having a set (e.g., at least one) of program modules configured to carry out the functions of the embodiments of the present application.
Program/utility 280 having a set (at least one) of program modules 270 may be stored in, for example, memory 210, such program modules 270 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, each or some combination of which may include an implementation of a network environment. Program modules 270 generally perform the functions and/or methods in the embodiments described herein.
The computer device 200 may also communicate with one or more external devices 290 (e.g., keyboard, pointing device, display 291, etc.), one or more devices that enable a user to interact with the computer device 200, and/or any device (e.g., network card, modem, etc.) that enables the computer device 200 to communicate with one or more other computing devices. Such communication may occur through an input/output (I/O) interface 292. Moreover, computer device 200 may also communicate with one or more networks such as a Local Area Network (LAN), a Wide Area Network (WAN) and/or a public network, such as the Internet, through network adapter 293. As shown, network adapter 293 communicates with other modules of computer device 200 over bus 230. It should be appreciated that although not shown, other hardware and/or software modules may be used in connection with computer device 200, including, but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, data backup storage systems, and the like.
It should be noted that, the implementation process and technical principle of the computer device in this embodiment refer to the foregoing explanation of the method for determining the ablation thickness in the embodiment of the first aspect, and are not repeated herein.
The computer equipment provided by the embodiment of the application firstly obtains a first heat history curve of the rock sample, then determines an inflection point and a low-temperature section of the first heat history curve, then carries out trend fitting according to a high-temperature section of the low-temperature Duan Duidi heat history curve, and generates second heat Shi Quxian of the rock sample according to the high-temperature section and the low-temperature section after trend fitting, so that the ablation thickness of the rock layer where the rock sample is located in each history time is determined according to the second heat Shi Quxian. Therefore, the method and the device realize accurate determination of the ablation thickness of the rock stratum where the rock sample is located at each historical time according to the heat Shi Quxian of the rock sample, thereby providing important data for subsequent study on the later combined ablation thickness.
To achieve the above embodiments, the present application also proposes a computer-readable storage medium.
Wherein the computer readable storage medium has stored thereon a computer program which, when executed by a processor, is adapted to carry out the method of determining ablation thickness according to an embodiment of the first aspect.
In alternative implementations, the present embodiments may employ any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium can be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, either in baseband or as part of a carrier wave. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Computer program code for carrying out operations of the present application may be written in one or more programming languages, including an object oriented programming language such as Java, smalltalk, C ++ and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider).
To achieve the above embodiments, the present application also proposes a computer program product which, when executed by a processor, performs the ablation thickness determination method as described in the foregoing embodiments.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and further implementations are included within the scope of the preferred embodiment of the present application in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the embodiments of the present application.
It is to be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above-described embodiments, the various steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, may be implemented using any one or combination of the following techniques, as is well known in the art: discrete logic circuits having logic gates for implementing logic functions on data signals, application specific integrated circuits having suitable combinational logic gates, programmable Gate Arrays (PGAs), field Programmable Gate Arrays (FPGAs), and the like.
Those of ordinary skill in the art will appreciate that all or a portion of the steps carried out in the method of the above-described embodiments may be implemented by a program to instruct related hardware, where the program may be stored in a computer readable storage medium, and where the program, when executed, includes one or a combination of the steps of the method embodiments.
The above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, or the like. Although embodiments of the present application have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the application, and that variations, modifications, alternatives, and variations may be made to the above embodiments by one of ordinary skill in the art within the scope of the application.
Claims (14)
1. A method of determining an ablation thickness, comprising:
acquiring a first heat Shi Quxian of the rock sample;
determining an inflection point and a low temperature section of the first heat history curve;
trend fitting the high temperature section of the first thermal history curve according to the low temperature section, and performing trend fitting according to the high Wen Duanyi and the second heat Shi Quxian of the rock sample at the low temperature Duan Shengcheng;
determining an ablation thickness of the rock formation in which the rock sample is located at each historical time based on the second heat Shi Quxian;
wherein determining the inflection point and the low temperature section of the first thermal history curve comprises: acquiring temperature slope information of each history time in the first heat history curve, comparing the temperature slope information of each history time with the temperature slope information of the previous history time to obtain a change value of the temperature slope information of each history time relative to the temperature slope information of the previous history time, determining a point with the maximum change value of the temperature slope information as the inflection point of the first heat history curve, determining a curve section of the history time section after the inflection point of the first heat history curve as the low temperature section of the first heat history curve, and determining the curve section of the history time section before the inflection point of the first heat history curve as the high temperature section of the first heat history curve;
Wherein, according to the low temperature section, trend fitting is performed on the high temperature section of the first heat history curve, and according to the high Wen Duanyi after trend fitting and the second heat history curve of the rock sample at the low temperature Duan Shengcheng, the method comprises: and obtaining a plurality of scattered points in the low-temperature section corresponding to the first heat Shi Quxian, performing trend fitting on the plurality of scattered points to obtain a trend fitting line, determining a curve section matched with the history time section of the high-temperature section in the trend fitting line as the high-temperature section after trend fitting, and generating the second heat Shi Quxian of the rock sample according to the high-temperature section after trend fitting and the low-temperature section before trend fitting, wherein the plurality of scattered points are the plurality of scattered points obtained in a section of curve section after the inflection point of the first heat history curve and adjacent to the inflection point.
2. The method of claim 1, wherein obtaining a first thermal history curve for the rock sample comprises:
performing a thermal history simulation on the rock sample, generating the first heat Shi Quxian;
wherein the first heat Shi Quxian characterizes a correspondence between historical time and temperature values of the rock sample.
3. The method of claim 1, wherein the determining the inflection point and low temperature section of the first thermal history curve comprises:
acquiring a temperature inflection point interval of the first heat history curve;
acquiring temperature slope information of each historical time in the temperature inflection point interval;
determining the inflection point of the first heat history curve according to the temperature slope information of each history time in the temperature inflection point interval;
and determining a low-temperature section of the first heat history curve according to the inflection point.
4. The method of claim 1, wherein trending the high temperature segment of the first thermal history curve from the low temperature segment comprises:
acquiring a plurality of scattered points in the low-temperature section;
performing trend fitting on the plurality of scattered points to obtain a trend fitting curve;
and determining a curve segment matched with the historical time segment of the high temperature segment in the trend fitting curve as a high temperature segment after trend fitting.
5. The method of claim 1, wherein determining the ablation thickness of the formation in which the rock sample is located at each historical time based on the second heat Shi Quxian comprises:
acquiring a ground surface temperature value and a ground temperature gradient value of the rock stratum;
And determining the ablation thickness of the rock stratum at each historical time according to the temperature value of each historical time in the second thermal history curve, the surface temperature value and the ground temperature gradient value.
6. The method of claim 5, wherein said determining the thickness of the formation after each historical time of degradation further comprises:
and generating and displaying an erosion thickness curve of the rock stratum according to the erosion thickness of the rock stratum at each historical time.
7. An ablation thickness determining apparatus, comprising:
an acquisition module for acquiring a first heat Shi Quxian of the rock sample;
the first determining module is used for determining an inflection point and a low-temperature section of the first heat history curve;
the generating module is used for carrying out trend fitting on the high-temperature section of the first heat history curve according to the low-temperature section, and carrying out second heat Shi Quxian on the rock sample according to the high Wen Duanyi and the low temperature Duan Shengcheng after trend fitting;
a second determining module, configured to determine, according to the second heat Shi Quxian, an ablation thickness of the rock stratum where the rock sample is located at each historical time;
wherein the inflection point and the low temperature segment of the first thermal history curve are determined, the first determination module further configured to: acquiring temperature slope information of each history time in the first heat history curve, comparing the temperature slope information of each history time with the temperature slope information of the previous history time to obtain a change value of the temperature slope information of each history time relative to the temperature slope information of the previous history time, determining a point with the maximum change value of the temperature slope information as the inflection point of the first heat history curve, determining a curve section of the history time section after the inflection point of the first heat history curve as the low temperature section of the first heat history curve, and determining the curve section of the history time section before the inflection point of the first heat history curve as the high temperature section of the first heat history curve;
Wherein, according to the low temperature section, trend fitting is performed on the high temperature section of the first heat history curve, and according to the high Wen Duanyi after trend fitting and the second heat Shi Quxian of the rock sample at the low temperature Duan Shengcheng, the generating module is further configured to: and obtaining a plurality of scattered points in the low-temperature section corresponding to the first heat Shi Quxian, performing trend fitting on the plurality of scattered points to obtain a trend fitting line, determining a curve section matched with the history time section of the high-temperature section in the trend fitting line as the high-temperature section after trend fitting, and generating the second heat Shi Quxian of the rock sample according to the high-temperature section after trend fitting and the low-temperature section before trend fitting, wherein the plurality of scattered points are the plurality of scattered points obtained in a section of curve section after the inflection point of the first heat history curve and adjacent to the inflection point.
8. The apparatus of claim 7, wherein the acquisition module is specifically configured to:
performing a thermal history simulation on the rock sample, generating the first heat Shi Quxian;
wherein the first heat Shi Quxian characterizes a correspondence between historical time and temperature values of the rock sample.
9. The apparatus of claim 7, wherein the first determining module is specifically configured to:
acquiring a temperature inflection point interval of the first heat history curve;
acquiring temperature slope information of each historical time in the temperature inflection point interval;
determining the inflection point of the first heat history curve according to the temperature slope information of each history time in the temperature inflection point interval;
and determining a low-temperature section of the first heat history curve according to the inflection point.
10. The apparatus of claim 7, wherein the generating module is specifically configured to:
acquiring a plurality of scattered points in the low-temperature section;
performing trend fitting on the plurality of scattered points to obtain a trend fitting curve;
and determining a curve segment matched with the historical time segment of the high temperature segment in the trend fitting curve as a high temperature segment after trend fitting.
11. The apparatus of claim 7, wherein the second determining module is specifically configured to:
acquiring a ground surface temperature value and a ground temperature gradient value of the rock stratum;
and determining the ablation thickness of the rock stratum at each historical time according to the temperature value of each historical time in the second thermal history curve, the surface temperature value and the ground temperature gradient value.
12. The apparatus as recited in claim 11, further comprising:
and the display module is used for generating and displaying the corrosion thickness curve of the rock stratum according to the corrosion thickness of the rock stratum at each historical time.
13. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor executing the program to implement the ablation thickness determination method of any of claims 1-6.
14. A computer-readable storage medium, on which a computer program is stored, characterized in that the program, when being executed by a processor, implements the ablation thickness determination method as claimed in any one of claims 1-6.
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