CN111679135A

CN111679135A - OTA test system

Info

Publication number: CN111679135A
Application number: CN202010535473.7A
Authority: CN
Inventors: 陈重志; 钟兴顺; 孙冬祥
Original assignee: Huatian Technology Kunshan Electronics Co Ltd
Current assignee: Huatian Technology Kunshan Electronics Co Ltd
Priority date: 2020-06-12
Filing date: 2020-06-12
Publication date: 2020-09-18

Abstract

The invention provides an OTA test system, which comprises: the test device comprises a test chamber, a fixed jig and a material arm; the testing device comprises a testing room, a fixed jig, a material arm and a fixed jig, wherein a shielding layer is laid on the inner side wall of the testing room, a testing space is formed by a space surrounded by the shielding layer, the fixed jig is arranged in the testing space and provided with a bearing surface suitable for fixing a product to be tested, the material arm is arranged outside the testing room and can be driven by a first driving mechanism to enter the testing space, the material arm is provided with at least two suction nozzles, and the suction nozzles are arranged according to the translation direction of the material arm relative to the fixed jig. According to the invention, by changing the arrangement mode of the material arm and the feeding mode of the material arm, the interference of reflected waves can be avoided when a product packaged in an AIP mode is tested, the test can be completely carried out in an interference-free closed environment, and the accuracy of a test result is ensured.

Description

OTA test system

Technical Field

The invention relates to the technical field of semiconductor testing, in particular to an OTA testing system.

Background

The 5G product (28GHz) and the radar (24GHz/77GHz) product for vehicles both adopt the packaging structure of AIP (antenna InPackage). At such high frequencies, testing of radio frequencies requires the use of ota (over the air) measurement methods. The OTA testing method must be performed in a closed environment, and the dimensional ratio of the space needs to satisfy the frequency and the size of the product. However, the arm of the conventional similar testing device is located in a closed space, which causes signal reflection, resulting in inaccurate measurement. Therefore, it is necessary to provide a further solution to the above problems.

Disclosure of Invention

The invention aims to provide an OTA test system to overcome the defects in the prior art.

In order to solve the technical problems, the technical scheme of the invention is as follows:

an OTA test system, comprising: the test device comprises a test chamber, a fixed jig and a material arm;

the testing device comprises a testing room, a fixed jig, a material arm and a fixed jig, wherein a shielding layer is laid on the inner side wall of the testing room, a testing space is formed by a space surrounded by the shielding layer, the fixed jig is arranged in the testing space and provided with a bearing surface suitable for fixing a product to be tested, the material arm is arranged outside the testing room and can be driven by a first driving mechanism to enter the testing space, the material arm is provided with at least two suction nozzles, and the suction nozzles are arranged according to the translation direction of the material arm relative to the fixed jig.

As an improvement of the OTA test system, the shielding layer is a wave-absorbing material attached to the inner side wall of the test chamber.

As an improvement of the OTA testing system of the present invention, the testing chamber has a door panel that opens or closes an opening in the testing chamber through which the arm passes.

As an improvement of the OTA testing system of the present invention, the fixing jig includes: the socket is arranged on the load plate, and a groove suitable for fixedly placing a product to be tested is formed in the socket.

As an improvement of the OTA test system, the material arm is externally arranged at the bottom position of the test chamber and can be driven by the first driving mechanism to enter the test space in a lifting mode.

As an improvement of the OTA test system, the first driving mechanism is a screw rod or a linear motor or an air cylinder which is suitable for driving the material arm to lift.

As an improvement of the OTA test system, the material arm is driven by a second driving mechanism to move relative to the fixed jig.

As an improvement of the OTA test system, the second driving mechanism is a screw rod or a linear motor or an air cylinder which is suitable for driving the material arm to translate.

As an improvement of the OTA testing system of the present invention, the OTA testing system further includes a mobile carrier, the mobile carrier has a trough adapted to place a product to be tested, the mobile carrier is located at one side of the material arm and can be driven by a third driving mechanism to move relative to the material arm.

As an improvement of the OTA testing system of the present invention, the third driving mechanism is a screw rod, a linear motor or an air cylinder adapted to drive the mobile carrier to translate.

Compared with the prior art, the invention has the beneficial effects that: according to the invention, by changing the arrangement mode of the material arm and the feeding mode of the material arm, the interference of reflected waves can be avoided when a product packaged in an AIP mode is tested, the test can be completely carried out in an interference-free closed environment, and the accuracy of a test result is ensured.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a front view of an embodiment of an OTA test system of the present invention;

FIG. 2 is a front view of the mobile carrier of FIG. 1 moving closer to the arm;

FIG. 3 is a front view of the feeder arm of FIG. 2 entering the test chamber;

fig. 4 is a front view of the material arm of fig. 3 moving close to the fixed fixture.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

As shown in fig. 1, an embodiment of the present invention provides an OTA testing system, which includes: a test chamber 1, a fixing tool 2 and a material arm 3.

In order to form a closed test environment without reflected wave interference, a shielding layer 11 is laid on the inner side wall of the test chamber 1, and a space surrounded by the shielding layer 11 forms a test space. In one embodiment, the shielding layer 11 is a wave-absorbing material attached to the inner side wall of the test chamber 1. Therefore, the wave absorbing material can absorb interference signal waves, and interference of reflected waves during testing is avoided. According to actual requirements, the wave-absorbing material can be installed on the inner side wall of the test chamber 1 through bonding or by means of a connecting piece.

The fixing jig 2 is disposed in the testing space and has a carrying surface suitable for fixing a product to be tested. Specifically, the fixing jig 2 includes: the test device comprises a load board 21 and a socket 22, wherein the load board 21 is positioned at the bottom of the test space, the socket 22 is installed on the load board 21, the top surface of the socket 22 forms the bearing surface, and a groove suitable for fixedly placing a product to be tested is formed in the bearing surface. In order to accommodate the placement and fixation of products of different sizes and shapes to be tested, the socket 22 can be detachably mounted on the load board 21 to facilitate the replacement of different types of sockets 22.

In order to overcome the problem that the material arm 3 in the prior art interferes with the rf signal during the test, the material arm 3 is disposed outside the test chamber 1 so as to be separated from the test space formed by the test chamber 1. Simultaneously, this embodiment still optimizes the material loading mode of material arm 3 to with the external cooperation that sets up the mode of material arm 3.

The arm 3 placed outside the test chamber 1 includes: the material arm 3 is arranged at the bottom, two sides and the like of the test chamber 1. At this time, the material arm 3 can be driven by the first driving mechanism to enter the testing space to complete the feeding action, and is continuously driven by the first driving mechanism to leave the testing space when the feeding action is completed.

Accordingly, the test chamber 1 should have an opening to facilitate the passage of the arm 3 in and out. At this time, in order to secure a sealed test environment, the test chamber 1 further has a door panel 12, and the door panel 12 opens or closes an opening of the test chamber 1 through which the feeding arm 3 passes.

Simultaneously, the material loading mode of optimizing material arm 3 of this embodiment still includes: at least two suction nozzles 31 are arranged on the material arm 3, and the suction nozzles 31 are arranged according to the translation direction of the material arm 3 relative to the fixed jig 2. This is so as to pick up the product that has completed the test, while placing the product waiting for the test on the fixed jig 2. In one embodiment, the arm 3 has two suction nozzles 31, and the two suction nozzles 31 are arranged side by side according to the translation direction of the arm 3 relative to the fixed jig 2. In addition, "the translation direction of the material arm 3 relative to the fixed jig 2" includes both: the situation that the material arm 3 actively translates to be close to the fixed jig 2 also includes: the fixed jig 2 actively translates to approach the material arm 3.

In one embodiment, the arm 3 is externally arranged at the bottom of the test chamber 1 and can be moved by the first drive mechanism into the test space in an ascending manner. The mechanical mechanism capable of lifting the material arm 3 may be a mechanical form of the first driving mechanism, and this embodiment does not limit the mechanical form.

For example, the first driving mechanism is a screw rod or a linear motor or an air cylinder suitable for driving the material arm 3 to lift. When a screw rod structure is adopted, the material arm 3 is integrally driven to lift by a vertically arranged screw rod, and the screw rod is driven to rotate by a motor; when a linear motor is adopted, the material arm 3 is driven to lift by a vertically arranged motor; when the cylinder is adopted, the material arm 3 is driven to lift by the vertically arranged cylinder.

When the arm 3 enters the testing chamber 1, in order to allow the arm 3 to move relative to the fixture 2, in one embodiment, the arm 3 is driven by the second driving mechanism to move relative to the fixture 2. The second driving mechanism and the first driving mechanism are in a relation that the material arm 3 and the second driving mechanism are integrally driven by the first driving mechanism to lift. All the mechanical mechanisms capable of realizing the translation of the material arm 3 can be used as the mechanical form of the second driving mechanism, and the embodiment does not limit the mechanical form.

For example, the second driving mechanism is a screw rod or a linear motor or an air cylinder suitable for driving the material arm 3 to lift. When a screw rod structure is adopted, the material arm 3 is integrally driven to lift by a horizontally arranged screw rod, and the screw rod is driven to rotate by a motor; when a linear motor is adopted, the material arm 3 is driven to lift by a horizontally arranged motor; when the cylinder is adopted, the material arm 3 is driven to lift by the cylinder which is horizontally arranged.

In addition, in order to facilitate the material arm 3 to pick up the product to be tested through the suction nozzle 31, the OTA testing system further comprises a mobile carrier 4, the mobile carrier 4 is provided with a trough suitable for placing the product to be tested, the mobile carrier 4 is located on one side of the material arm 3, and the third driving mechanism can drive the material arm 3 to move relatively. This third drive mechanism is arranged in a similar manner to the second drive mechanism described above and will not be described again here.

Taking the example of the arm 3 having two suction nozzles 31, the OTA testing system of this example operates when one product a is tested and the arm 3 is ready to feed another product B to be tested into the testing chamber 1.

At this time, the product to be tested is placed on the mobile carrier 4, and the material arm 3 is waited for picking up (as shown in fig. 1); the arm 3 adsorbs the product to be tested and is ready to enter the test chamber 1 (as shown in fig. 2); a door plate 12 of the test chamber 1 is opened, the material arm 3 sends products to be tested into the test space of the test chamber 1 for gathering, the tested products are moved away, and untested products are placed into a socket (as shown in fig. 3); the arm 3 leaves the test space with the tested product, and the door 12 of the test chamber 1 is reset to form a closed test space again, so as to continue to test the product on the socket (as shown in fig. 4).

In addition, since the AIP product has a matrix antenna of a directional antenna, a horn antenna is required to receive more signals, and thus the horn antenna 13 is installed at the top of the test chamber 1. The AIP product has dipole antenna around it, and the emitted signal is ring wave without directivity, so the surrounding only needs to use the general antenna 14. When testing the AIP product, the upper matrix antenna can be tested first, and then the surrounding dipole antennas can be tested, so as to avoid the interference of the signals of the dipole antennas to the matrix antenna. Therefore, after the material loading in the above way, the test of an AIP product is completed by processing the received signal of the AIP product.

In summary, in this embodiment, by changing the setting mode of the material arm and the loading mode of the material arm, the interference of reflected waves can be avoided when the product packaged in the AIP mode is tested, and the test can be performed completely in an interference-free closed environment, so that the accuracy of the test result is ensured.

It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

1. An OTA test system, comprising: the test device comprises a test chamber, a fixed jig and a material arm;

2. The OTA test system of claim 1, wherein the shielding layer is a wave absorbing material attached to the inner sidewall of the test chamber.

3. The OTA testing system of claim 1, wherein the test chamber has a door that opens or closes an opening in the test chamber through which the arm passes.

4. The OTA test system of claim 1, wherein the fixture comprises: the socket is arranged on the load plate, and a groove suitable for fixedly placing a product to be tested is formed in the socket.

5. The OTA testing system of claim 1, wherein the arm is externally disposed at a bottom position of the testing chamber and can be moved into the testing space by the first driving mechanism in an ascending manner.

6. The OTA test system of claim 5, wherein the first drive mechanism is a lead screw or linear motor or pneumatic cylinder adapted to move the boom up and down.

7. The OTA test system of claim 5, wherein the arm is further moved relative to the fixture by a second drive mechanism.

8. The OTA test system of claim 7, wherein the second drive mechanism is a lead screw or linear motor or pneumatic cylinder adapted to translate the feed arm.

9. The OTA testing system of claim 1, further comprising a mobile carrier having a trough adapted to receive a product to be tested, the mobile carrier being located at one side of the arm and being movable relative to the arm by a third driving mechanism.

10. The OTA testing system of claim 9, wherein the third driving mechanism is a screw or a linear motor or an air cylinder adapted to translate the mobile carrier.