CN1116694C - Sample positioning method for microscope with scanning probe - Google Patents
Sample positioning method for microscope with scanning probe Download PDFInfo
- Publication number
- CN1116694C CN1116694C CN99126338A CN99126338A CN1116694C CN 1116694 C CN1116694 C CN 1116694C CN 99126338 A CN99126338 A CN 99126338A CN 99126338 A CN99126338 A CN 99126338A CN 1116694 C CN1116694 C CN 1116694C
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- CN
- China
- Prior art keywords
- sample
- scanning probe
- localization method
- probe microscopy
- dripping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q40/00—Calibration, e.g. of probes
- G01Q40/02—Calibration standards and methods of fabrication thereof
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Microscoopes, Condenser (AREA)
Abstract
The present invention belongs to a positioning method of a scanning probe microscope sample. In the method, one surface of a transparent substrate is divided into a tiny area which is marked with identifiers, such as different numbers, foreign letters or various mathematical symbols, etc., for distinction; or after various identifiers are marked in the small squares of coordinate axis square paper, the square paper is paseted on the back side of the transparent substrate by a double side adhesive or glue, etc.; or the etching technology is utilized, and one side of the transparent substrate is etched with coordinates and grids. The present invention preferably identifies the surface of a dropped sample and the surface of a not-dropped sample, and has a definite contraposed member during scanning samples.
Description
The invention belongs to the localization method of scanning probe microscopy sample.
Scanning probe microscopy is the eighties invention, the commercial multi-function modern precision instrument of the nineties.Scanning probe microscopy and electron microscope etc. are compared, and have easy to operate, sample and prepare advantages such as simple, that resolution is high, image is more directly perceived, operating environment is unrestricted.But because the solution that is made into of most samples is water white transparency, and the load sample substrate that resembles scanning probe microscopies such as atomic force microscope mostly is the transparency material of mica sheet and sheet glass and so on.In case solution drips in the substrate dry back and can not differentiate sample and where be positioned at substrate actually.Before the scanning samples, can only be after being fixed on substrate on the probe by means of light microscope, rely on instrumentation personnel's experience, seek sample in suprabasil approximate location, there is blindness in scanning to sample.In addition, have the substrate surface of sample to put upside down as if dripping accidentally when sample preparation, because sample and substrate surface all are transparent, can't pick out which surperficial dripping has sample, and the substrate surface that will not drip sample when consequently scanning scans, and obtains skimble-skamble result.Original another shortcoming by light microscope location sample is, in case sample is scanned the back probe and lifts, again needle point and sample surfaces position contacting make and think that the good experimental result that the repetition front is done becomes impossible before can't finding probe to lift behind the inserting needle.If experimental implementation person thinks that the image effect that the somewhere scanning samples obtains is bad, do not know again where the border of sample is positioned at when wanting to replace scanning, make and lift probe again behind the inserting needle, might scan the experiment conclusion that blank substrate must make mistake.
The localization method that the purpose of this invention is to provide a kind of scanning probe microscopy sample, this method are that the one side in transparent substrates marks off tiny area and identifies identifiers such as different numerals, foreign letter or various mathematic signs to show difference.Perhaps put on after the various identifiers in the lattice with the reference axis squared paper, be pasted on the reverse side of transparent substrates with double faced adhesive tape or glue etc., not only discerned surface that drips sample and the surface that does not drip sample well, and clear and definite specific aim has also been arranged during scanning samples.
Concrete localization method has four kinds: before 1) dripping sample, indicate the plane coordinates axle of the direction of arrow in the reverse side delineation of the various transparent substrates of mica sheet or other, then each quadrant of reference axis is divided into the tiny area of several little unanimities again, and in each tiny area, put on different identifiers; 2) be divided into several tiny areas of the same size again with the one side delineation plane coordinates axle of the double faced adhesive tape of anchoring base and with each quadrant, put on identifier; 3) put in the lattice with the reference axis squared paper after the various identifiers, it is affixed on the reverse side of transparent substrates; 4) utilize lithographic technique, with transparent substrate one side etching coordinate and grid.
Localization method of the present invention makes experimental implementation person before sample is scanned, and the tiny area that accurately finds sample and be positioned at makes inserting needle sweep sample and becomes clearly, has avoided blindness; Because in a single day the reverse side to substrate has carried out the division tiny area and indicated identifier to show difference, so the phenomenon that the sample positive and negative is put upside down takes place, just can discover at once, the behavior of having avoided scanning whole blank surface occurs; When sample is scanned, as long as lift position when writing down needle point before the pin and sweeping sample, still can find behind the inserting needle again and lift the preceding position of pin, this situation when thinking that the imaging of repetition front is better seems precious.Repeat to lift the preceding experimental result of pin, before adopting the method, may not accomplish; As long as write down sample at suprabasil bounds, in case after lifting pin, again during inserting needle as long as the zone that the position within the bounds of sample, just can be avoided rescaning exceeds the border of sample, and blank substrate has been carried out the situation that scans.Another advantage of this method is: even can add other raw material or add some raw material, also be to be easy to get very much as graph paper, general ordinary laboratory all can have, and does it yourself just can make even without the experimenter.
Embodiment provided by the invention is as follows:
Embodiment 1: mica sheet is simultaneously delineated plane coordinates axle sign positive direction, then each quadrant of reference axis is divided into several tiny areas, and in these zonules, put on different Arabic numerals, the surperficial drench of another on mica sheet adds transparent sample and tests again.
Embodiment 2: after coordinate lattice paper is put on different foreign letters, be affixed on the one side of substrate of glass, drip the laggard line scanning of solution on another surface of substrate of glass again.
Embodiment 3: the one side delineation reference axis of double faced adhesive tape is put on positive direction, and divide different tiny areas, then identify various mathematic signs, be affixed on the one side of mica sheet, the another side at mica sheet drips the laggard line scanning test of solution then.
Embodiment 4: utilize lithographic technique, with transparent substrate one side etching coordinate and grid, drip the laggard line scanning test of solution at the very smooth substrate surface of another side.
Claims (4)
1. the localization method of a scanning probe microscopy sample, before it is characterized in that dripping sample, indicate the plane coordinates axle of the direction of arrow in the reverse side delineation of mica sheet or other various water white substrates, then each quadrant with reference axis is divided into several tiny areas of the same size again, and puts on different identifiers in each tiny area.
2. the localization method of a scanning probe microscopy sample before it is characterized in that dripping sample, is divided into several tiny areas of the same size again with the one side delineation plane coordinates axle of the double faced adhesive tape of anchoring base and with each quadrant, puts on identifier.
3. the localization method of a scanning probe microscopy sample before it is characterized in that dripping sample, is put in the lattice with the reference axis squared paper after the various identifiers, and it is affixed on the reverse side of water white transparency substrate.
4. the localization method of a scanning probe microscopy sample before it is characterized in that dripping sample, utilizes lithographic technique, with water white substrate one side etching coordinate and grid.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN99126338A CN1116694C (en) | 1999-12-16 | 1999-12-16 | Sample positioning method for microscope with scanning probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN99126338A CN1116694C (en) | 1999-12-16 | 1999-12-16 | Sample positioning method for microscope with scanning probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1300095A CN1300095A (en) | 2001-06-20 |
| CN1116694C true CN1116694C (en) | 2003-07-30 |
Family
ID=5284402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN99126338A Expired - Fee Related CN1116694C (en) | 1999-12-16 | 1999-12-16 | Sample positioning method for microscope with scanning probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1116694C (en) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1558424B (en) * | 2004-01-16 | 2010-04-07 | 中国科学院长春应用化学研究所 | Gold thin film substrate making method for scanning probe microscope |
| EP1863066A1 (en) * | 2006-05-29 | 2007-12-05 | FEI Company | Sample carrier and sample holder |
| CN101191776B (en) * | 2006-11-24 | 2011-05-04 | 上海华虹Nec电子有限公司 | Focused ion beam microscope sample stage and method of use thereof |
| CN101413865B (en) * | 2008-11-19 | 2013-04-24 | 武汉大学 | Accurate positioning method based on atomic force microscope |
| CN107015027B (en) * | 2017-03-03 | 2020-09-01 | 复旦大学 | Sample positioning and fixing method and device of scanning probe microscope |
| CN108226572A (en) * | 2017-12-29 | 2018-06-29 | 国联汽车动力电池研究院有限责任公司 | A kind of atomic force microscope sample scaling method |
| CN110208190A (en) * | 2019-07-17 | 2019-09-06 | 四川沃文特生物技术有限公司 | A kind of method and system for sediments microscope inspection tracking |
| CN110982686A (en) * | 2019-12-27 | 2020-04-10 | 珠海迪尔生物工程有限公司 | Microorganism observation test card, observation system and observation method |
| CN114085731A (en) * | 2021-10-21 | 2022-02-25 | 华南理工大学 | Cell capturing device and processing method thereof |
-
1999
- 1999-12-16 CN CN99126338A patent/CN1116694C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1300095A (en) | 2001-06-20 |
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