CN111650744B - Method, device and equipment for adjusting parameters of galvanometer and readable storage medium - Google Patents
Method, device and equipment for adjusting parameters of galvanometer and readable storage medium Download PDFInfo
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- CN111650744B CN111650744B CN202010769679.6A CN202010769679A CN111650744B CN 111650744 B CN111650744 B CN 111650744B CN 202010769679 A CN202010769679 A CN 202010769679A CN 111650744 B CN111650744 B CN 111650744B
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- G—PHYSICS
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- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
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- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0875—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more refracting elements
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Abstract
The invention discloses a parameter adjusting method of a galvanometer, which comprises the steps of collecting vibration images corresponding to the galvanometer under a plurality of set different parameter states; wherein the parameters comprise a gain parameter and a duration parameter; obtaining an offset value between the vibrating thick line and the vibrating thin line in each vibrating image; and selecting the gain parameter and the duration parameter corresponding to the minimum deviation value in all deviation values as parameters of the vibrating mirror, and adjusting the parameters of the vibrating mirror. The method and the device determine the size of the parameters of the vibrating mirror by utilizing the relevance of the size of the deviation value between the vibrating thick line and the vibrating thin line in the vibrating image and the suitability of the parameters of the vibrating mirror, and ensure the working performance of the vibrating mirror. The application also provides a parameter adjusting device and equipment of the galvanometer, and the beneficial effects are achieved.
Description
Technical Field
The present invention relates to the field of galvanometer technology, and in particular, to a method, an apparatus, a device, and a computer readable storage medium for adjusting parameters of a galvanometer.
Background
The galvanometer is a component of the optical machine and is located between the DMD (digital micromirror device) and the lens. The main body is a glass lens and two coils, and the coils can drive the lens to slightly vibrate up and down along the x/y directions. The main principle is that there is refraction phenomenon when light passes through the lens, and refraction angle is relevant with the lens angle, utilizes this principle, shakes about controlling the lens through the drive coil and reaches to make a pixel point on the DMD reflect to four positions at four time points, improves the purpose of ray apparatus picture resolution.
The galvanometer needs to be preset with various different parameters in the actual working process, and the accuracy of parameter setting directly influences the performance of the galvanometer in cooperation with the optical machine and the like, so that the definition of an optical machine picture is influenced. Therefore, setting appropriate parameters for the galvanometer is one of the technical problems to be solved at present.
Disclosure of Invention
The invention aims to provide a method, a device and equipment for adjusting parameters of a galvanometer and a computer readable storage medium, which solve the problem of low working performance of the galvanometer caused by improper parameter setting of the galvanometer.
In order to solve the above technical problem, the present invention provides a method for adjusting parameters of a galvanometer, comprising:
collecting each vibration image corresponding to the galvanometer under a plurality of set different parameter states; wherein the parameters comprise a gain parameter and a duration parameter;
obtaining an offset value between a vibrating thick line and a vibrating thin line in each vibrating image;
and selecting the gain parameter and the time length parameter corresponding to the minimum deviation value in the deviation values as the parameters of the vibrating mirror, and adjusting the parameters of the vibrating mirror.
Optionally, obtaining an offset value between the vibrating thick line and the vibrating thin line in each of the vibrating images includes:
identifying white point pixel coordinate values of white points in the vibration image and obtaining standard white point pixel coordinate values of white points in a standard vibration image, wherein each group of vibration thick lines and vibration thin lines of the standard vibration image are distributed in the horizontal direction and the vertical direction;
acquiring a homography matrix between the vibration image and the standard vibration image according to the white point pixel coordinate value and the standard white point pixel coordinate value;
carrying out coordinate transformation on the vibration image according to the homography matrix to obtain a transformation vibration image;
and determining the offset value according to the pixel coordinate values of the vibrating thick line and the vibrating thin line in the transformed vibrating image.
Optionally, determining the offset value according to pixel coordinate values of a vibrating thick line and a vibrating thin line in the transformed vibration image includes:
identifying unit vibration images in the transformation vibration images according to the area range of standard unit vibration images in the standard vibration images, wherein the unit vibration images comprise a group of horizontal vibration thick lines and vertical vibration thin lines;
collecting offset values of the vibrating thick lines and the vibrating thin lines in the horizontal direction as first offset values, and collecting offset values of the vibrating thick lines and the vibrating thin lines in the vertical direction as second offset values;
and performing summation operation on the first offset value and the second offset value to obtain the offset value.
Optionally, each set of the vibrating thick lines and the vibrating thin lines in the unit vibration image includes a red vibrating thick line and a red vibrating thin line, a green vibrating thick line and a green vibrating thin line, and a blue vibrating thick line and a blue vibrating thin line;
correspondingly, summing the first offset value and the second offset value to obtain the offset value, including:
and summing the 3 first offset values of the group of the horizontal vibrating thick lines and the group of the vertical vibrating thin lines in the unit vibrating image and the 3 second offset values of the group of the vertical vibrating thick lines and the group of the vertical vibrating thin lines to obtain the offset values.
Optionally, selecting a gain parameter and a duration parameter corresponding to a minimum offset value in the offset values as parameters of the galvanometer, where the selecting includes:
selecting a specific offset value which is the smallest and has no corresponding first offset value and second offset value larger than a preset offset value from the offset values;
and taking the gain parameter and the time length parameter corresponding to the specific deviation value as the parameters of the galvanometer.
Optionally, identifying white point pixel coordinate values of white points in the vibration image comprises:
carrying out graying processing and binarization processing on the vibration image to obtain a binarization vibration image;
and finding the contours of all white points in the binary vibration image in a contour finding mode, and taking the centroid of the contour as the pixel coordinate value of the white point.
Optionally, obtaining a homography matrix between the vibration image and the standard vibration image according to the white point pixel coordinate value and the standard white point pixel coordinate value includes:
and identifying a central white point and three adjacent white points which are closest to the central white point and meet preset conditions in the vibration image according to the pixel coordinate values of the white points, wherein the preset conditions are that the central white point and the three adjacent white points are respectively connected, and included angles among three line segments formed are 105 degrees, 145 degrees and 110 degrees in sequence.
And obtaining the homography matrix by using the pixel coordinate values of one central white point and three adjacent white points and the coordinate values of the standard white points of the four white points which meet the preset condition in the standard vibration image.
Optionally, acquiring respective vibration images of the galvanometer corresponding to a plurality of set different parameter states, and obtaining an offset value between a vibration thick line and a vibration thin line in each vibration image, includes:
acquiring vibration images of the galvanometer in two states of unchanged duration parameter and increased gain parameter, and acquiring deviation values of the two vibration images;
if the offset value corresponding to the increased gain parameter is larger than the offset value corresponding to the gain parameter before the increase, acquiring each corresponding vibration image of the vibrating mirror in a state that the gain parameter is gradually reduced by taking the gain parameter before the increase as a reference, and obtaining a plurality of corresponding offset values until the currently obtained offset value is larger than the offset value obtained last time;
if the offset value corresponding to the increased gain parameter is smaller than the offset value corresponding to the gain parameter before the increase, acquiring each corresponding vibration image of the vibrating mirror in a state that the gain parameter is gradually increased by taking the increased gain parameter as a reference, and acquiring a plurality of corresponding offset values until the currently acquired offset value is larger than the offset value acquired last time;
acquiring vibration images of the vibrating mirror in two states of keeping gain parameters unchanged and increasing duration parameters, and obtaining deviation values of the two vibration images, wherein the gain parameters are gain parameters corresponding to the minimum deviation value in the deviation values corresponding to the gain parameters;
if the offset value corresponding to the increased duration parameter is larger than the offset value corresponding to the duration parameter before the increase, acquiring each corresponding vibration image of the galvanometer in a state that the duration parameter is gradually reduced by taking the duration parameter before the increase as a reference, and obtaining a plurality of corresponding offset values until the currently obtained offset value is larger than the offset value obtained last time;
if the offset value corresponding to the increased time length parameter is smaller than the offset value corresponding to the time length parameter before the increase, the increased time length parameter is taken as a reference, and each corresponding vibration image of the vibrating mirror in the state that the time length parameter is gradually increased is collected and a plurality of corresponding offset values are obtained until the currently obtained offset value is larger than the offset value obtained last time.
The application also provides a parameter adjustment device of mirror that shakes, includes:
the data acquisition module is used for acquiring a vibration image of the galvanometer;
an offset value module, configured to obtain an offset value between a vibrating thick line and a vibrating thin line in each of the vibrating images;
and the parameter determining module is used for selecting the gain parameter and the time length parameter corresponding to the minimum deviation value in the deviation values as the parameters of the vibrating mirror and adjusting the parameters of the vibrating mirror.
The application also provides a parameter adjusting device of the galvanometer, which comprises a projector, a projection screen, a camera and a processor;
the projector is used for projecting an image generated by the vibration of the galvanometer to a projection screen;
the camera is used for shooting an image on the projection screen to obtain a vibration image;
the processor is used for executing the steps of the parameter adjusting method of the galvanometer according to any one of the vibration images.
The present application further provides a computer-readable storage medium storing a computer program for executing the steps of the method for adjusting parameters of a galvanometer according to any one of the above methods by a processor.
The parameter adjusting method of the galvanometer comprises the steps of collecting vibration images corresponding to the galvanometer under a plurality of set different parameter states; wherein the parameters comprise a gain parameter and a duration parameter; obtaining an offset value between the vibrating thick line and the vibrating thin line in each vibrating image; and selecting the gain parameter and the duration parameter corresponding to the minimum deviation value in all deviation values as parameters of the vibrating mirror, and adjusting the parameters of the vibrating mirror.
The method and the device utilize the principle that the smaller the deviation value between the vibrating thick line and the vibrating thin line in the vibrating image of the vibrating mirror, the more appropriate the vibrating mirror parameter setting is, the vibrating image of the vibrating mirror is taken as the reference basis, the gain parameter and the time length parameter of the vibrating mirror are adjusted, the deviation value between the vibrating thick line and the vibrating thin line corresponding to different gain parameters and time length parameters of the vibrating mirror is obtained, the deviation value corresponds to the gain parameter and the time length parameter when the deviation value is the minimum and serves as the final parameter of the vibrating mirror, the reasonable degree of the vibrating mirror parameter setting is ensured, and the performance of the vibrating mirror in the practical application process is ensured.
The application also provides a parameter adjusting device and equipment of the galvanometer, and the beneficial effects are achieved.
Drawings
In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic illustration of a vibration image of a galvanometer;
FIG. 2 is a schematic illustration of vibration shift in a vibration image of a galvanometer;
fig. 3 is a schematic flowchart of a method for adjusting parameters of a galvanometer according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram of an optical path structure for acquiring a vibration image according to the present application;
fig. 5 is a schematic flowchart of determining a first offset value and a second offset value according to an embodiment of the present disclosure;
FIG. 6 is a diagram illustrating a distribution of local white dots in the vibration image shown in FIG. 1;
fig. 7 is a schematic flowchart of obtaining a plurality of offset values according to an embodiment of the present application;
fig. 8 is a block diagram of a parameter adjustment apparatus for a galvanometer according to an embodiment of the present invention.
Detailed Description
As shown in fig. 1, fig. 1 is a schematic view of a vibration image of a galvanometer. It should be noted that the vibration image referred to in this application is an image generated by mixing light beams emitted by three light sources of red, green, and blue, which are parallel to each other, and then entering the galvanometer and outputting the light beams to the photosensitive chip by the galvanometer, and is a test image commonly used for galvanometer detection, which is not described in detail herein.
The vibration image includes a plurality of basic vibration images 01, and the content of the entire vibration image is a repetition of the plurality of basic vibration images 01. The basic vibration image 01 includes four sets of vibration thick lines and vibration thin lines, which are vibration line one 011, vibration line two 012, vibration line three 013, and vibration line four 014.
The first vibrating line 011 comprises a red vibrating thick line 11, a red vibrating thin line 21, a green vibrating thick line 12, a green vibrating thin line 22, a blue vibrating thick line 13 and a blue vibrating thin line 23, wherein the vibrating thick lines and the vibrating thin lines are parallel to each other.
The distribution of the thick vibrating lines and the thin vibrating lines in the second vibrating line 012, the third vibrating line 013, and the fourth vibrating line 014 is the same; in contrast, the vibration thick lines and the vibration thin lines in the second vibration line 012 and the third vibration line 013 are perpendicular to the vibration thick lines and the vibration thin lines in the first vibration line 011, the vibration thick lines and the vibration thin lines in the second vibration line 012 and the third vibration line 013 are distributed in the vertical direction in an opposite manner, and the vibration thick lines and the vibration thin lines in the first vibration line 011 and the fourth vibration line 014 are distributed in the horizontal direction in an opposite manner.
Taking the vibration line one 011 as an example, theoretically, if the gain parameter and the duration parameter of the galvanometer are set very properly, two red vibration thick lines 11 and one red vibration thin line 21 of the same kind should be distributed in a Y shape, the symmetry axes of the red vibration thin line 21 and the two red vibration thick lines 11 of the same color are on the same straight line, and the similar green and blue vibration thick lines and the similar blue vibration thin lines are also distributed in the same way; the thick lines and thin lines of vibration of the respective colors in the second vibration line 012, the third vibration line 013, and the fourth vibration line 014 are also distributed similarly.
As shown in fig. 2, fig. 2 is a schematic diagram of vibration offset in a vibration image of a galvanometer, and when the gain parameter and the duration parameter of the galvanometer are set improperly, the thin vibrating wire 2 and the thick vibrating wire 1 may relatively translate along a direction perpendicular to the thin vibrating wire 2, that is, there is an offset in a straight line where the thin vibrating wire 2 is located relative to a straight line where a symmetry axis of the thick vibrating wire 1 is located, and the more improper the setting of the gain parameter and the duration parameter is, the larger the offset is.
At present, when the gain parameter and the duration parameter of the galvanometer are set, the vibration image is observed only through human eyes, and the parameter of the galvanometer is repeatedly adjusted, so that the adjustment defense line is obviously low in efficiency and poor in accuracy.
Therefore, the technical scheme for automatically realizing the adjustment of the vibration parameters based on the image recognition is provided, the adjustment efficiency and accuracy are improved to a great extent, and the wide application of the galvanometer is facilitated.
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 3, fig. 3 is a schematic flow chart of a method for adjusting parameters of a galvanometer according to an embodiment of the present disclosure, where the method may include
S11: and collecting each vibration image corresponding to the galvanometer under a plurality of set different parameter states.
The parameters of the galvanometer may include a gain parameter and a duration parameter.
Before adjusting the parameters of the galvanometer, a light path structure as shown in fig. 4 can be set up, so that the vibration image of the galvanometer can be projected onto a projection screen 6 through a projector 4, and then the vibration image on the projection screen 6 is shot through a camera 5.
S12: offset values between the vibrating thick lines and the vibrating thin lines in each of the vibrating images are obtained.
As described above, in conjunction with fig. 1 and 2, when the gain parameter and the time length parameter of the galvanometer are set reasonably, the thin vibrating wires 2 of the same color in one set of the thick vibrating wires 1 and the thin vibrating wires 2 should be on the straight line where the symmetry axes of the two thick vibrating wires 1 are located.
Accordingly, in the case where the parameter setting is not appropriate, the offset value between the vibrating thick line 1 and the vibrating thin line 2 should be an offset value satisfying the following condition:
the first one refers to the offset value between the vibrating thick lines and the vibrating thin lines in the same group, for example, vibrating thick line 1 and vibrating thin line 2 belonging to the same group in vibrating line one 011;
second, it should be referred to an offset value between the vibrating thick line 1 and the vibrating thin line 2 of the same color.
Thirdly, the pixel distance of the vibrating thick line 1 and the vibrating thin line 2 in the direction perpendicular to the vibrating thin line 2, that is, the pixel distance between the line on which the symmetry axis of the vibrating thick line 1 is located and the line on which the vibrating thin line 2 is located, should be the same.
Alternatively, as can be seen by referring to fig. 1 and 2, the distributions between different sets of the vibrating thick lines 1 and the vibrating thin lines 2 are not exactly the same in the vibrating image. For example, the vibration lines in vibration line one 011 and vibration line two 012 in fig. 1 are vertically distributed. Therefore, in order to obtain the offset value between the vibrating thick line 1 and the vibrating thin line 2 more reflecting the overall imaging of the vibrating image, the offset value between the vibrating thick line 1 and the vibrating thin line 2 in two mutually perpendicular directions is also obtained when obtaining the offset value. As shown in fig. 2, the first offset value may be L1 in fig. 2, and the second offset value may be L2.
Further, as shown in fig. 2, each set of the vibrating thick lines 1 and the vibrating thin lines 2 includes a red vibrating thick line 11 and a red vibrating thin line 21, a green vibrating thick line 12 and a green vibrating thin line 22, and a blue vibrating thick line 13 and a blue vibrating thin line 23. And the offset value is two sets of the vibrating thick line 1 and the vibrating thin line 2 perpendicular to each other. When actually calculating the offset value, the offset value calculation may be performed on the vibrating thick lines 1 and the vibrating thin lines 2 of each color, accordingly, each group of the vibrating thick lines 1 and the vibrating thin lines 2 includes three colors and 3 offset values, and two groups of the vibrating thick lines 1 and the vibrating thin lines 2 perpendicular to each other include 6 offset values, and the finally obtained offset value may be the sum of the 6 offset values.
S13: and selecting the gain parameter and the duration parameter corresponding to the minimum deviation value in all deviation values as parameters of the vibrating mirror, and adjusting the parameters of the vibrating mirror.
As described above, the more appropriate the parameter setting of the galvanometer, the smaller the relative offset between the thick vibrating line 1 and the thin vibrating line 2 is, and therefore, the gain parameter and the duration parameter corresponding to the minimum offset value are used as the parameters of the galvanometer, and the working performance of the galvanometer can be ensured to some extent.
Further, considering that it is possible that the first offset value L1 is 0 and the second offset value L2 is relatively large during actual detection and the sum of the two is the smallest among the offset values corresponding to a plurality of different parameters, the parameter corresponding to the smallest offset value is not available.
For this reason, when selecting the minimum offset value, the offset value should also satisfy the condition that neither the first offset value L1 nor the second offset value L2 is too large, for example, the offset value may be not greater than a certain threshold value, or may be not greater than two thirds of the offset value, and the like, which may be set according to the actual situation, and is not particularly limited in this application.
To sum up, utilize in this application to shake the vibration image of mirror relative position relation and the gain parameter of vibration and the relation between the length of a time parameter that the vibration thick line and the vibration thin line that distribute among the vibration image, adjust the parameter of mirror that shakes many times to the deviant size that corresponds under the different parameters determines the most suitable mirror parameter that shakes, has improved the gain parameter of mirror that shakes and the accuracy of length of a time parameter to a certain extent, and then has promoted the working property of mirror that shakes.
The process of determining the first and second offset values of the vibrating thick and thin lines in the above embodiments will be described in detail with specific embodiments.
As shown in fig. 5, fig. 5 is a schematic flowchart of determining a first offset value and a second offset value according to an embodiment of the present application, where the process may include:
s21: and identifying white point pixel coordinate values of white points in the vibration image and obtaining standard white point pixel coordinate values of white points in the standard vibration image.
Wherein, each group of the vibrating thick lines and vibrating thin lines of the standard vibrating image are distributed in the horizontal direction and the vertical direction.
As shown in fig. 1, in addition to the vibrating thick lines 1 and the vibrating thin lines 2, white dots 3 are included in the vibrating image, and the white dots 3 are located at the ends of the vibrating thick lines away from the vibrating thin lines 2, and each end of two vibrating thick lines 1 has one white dot 3.
In addition, in order to more clearly identify the white dots 3 in the vibration image, the vibration image can be converted into a gray image, and then the gray image is subjected to binarization processing to obtain a binary vibration image; and then finding the outline of all white points 3 in the binary vibration image in an outline finding way, and taking the outline centroid as the pixel coordinate value of the white point 3.
Because the vibration thick lines 1 and the vibration thin lines 2 in the vibration image have darker colors in the vibration image, the vibration image is converted into a gray image and subjected to binarization processing, and only white points 3 are displayed in the obtained binarization vibration image, so that the identification of the white points 3 is facilitated; and when the position of the white point 3 is determined, the pixel coordinates of the white point 3 are represented by the pixel coordinates of the center of mass of the white point, so that the complexity of the subsequent homography matrix operation is simplified.
S22: and acquiring a homography matrix between the vibration image and the standard vibration image according to the white point pixel coordinate value and the standard white point pixel coordinate value.
It can be appreciated that to determine the homography matrix based on the white point pixel coordinate values and the standard white point pixel coordinate values, one-to-one correspondence of the white point 3 in the vibratory image and the white point in the standard vibratory image needs to be found.
For this reason, in this embodiment, when determining white points for performing a homography matrix operation in a vibration image, identifying each white point may specifically include:
according to the pixel coordinate values of the white dots, a central white dot and three adjacent white dots which are closest to the central white dot and meet preset conditions are identified in the vibration image, wherein the preset conditions are that the central white dot and the three adjacent white dots are respectively connected, and included angles formed among three line segments are 105 in sequenceo、145o、110o。
And acquiring a homography matrix by using the pixel coordinate values of one central white point and three adjacent white points and the standard white point coordinate values of four white points meeting preset conditions in the standard vibration image.
As shown in fig. 1, two of the two sets of the vibrating thick lines 1 and the vibrating thin lines 2 vertically distributed in the vibrating image have white dots at the ends of the vibrating thick lines 1, and one set of the vibrating thick lines 1 and the vibrating thin lines 2 perpendicular to the set has no white dots 3 at the ends of the vibrating thick lines 1; in addition, in the two sets of the vibrating thick lines 1 and the vibrating thin lines 2 which are horizontally distributed, the end of one set of the vibrating thick lines 1 has two white points 3, and the end of the other set of the vibrating thick lines 1 has only one white point 3. In the present embodiment, each white point 3 is identified based on this characteristic.
Referring to fig. 6, fig. 6 is a schematic diagram of the distribution of the local white dots in the vibration image shown in fig. 1, in this embodiment, the most marginal one of the three white dots 3 at the end of the vibration thick line 1 in the vertical direction is the central white dot 31, and the nearest three white dots 3 adjacent to the central white dot are the adjacent white dots 32. The angles of three line segments formed by respectively connecting the central white point 31 and the three adjacent white points 32 are respectively 105 degrees, 145 degrees and 110 degrees, and no other white point exists in the vibration image and the positional relationship is different from the positional relationship of the central white point 31 and the three adjacent white points 32, so that the white points 3 with the same angle are formed, and therefore, the white points 3 are sequentially used as bases for identifying the white points 3 in the embodiment.
Of course, it is understood that the angles of the three line segments formed by respectively connecting the central white point 31 and the three adjacent white points 32 may have errors when calculated according to the white point pixel coordinate values, and the white point 3 satisfying the condition is considered as long as the error is within the allowable range.
In practical applications, there may be a plurality of other identification manners, for example, three white dots 3 located on the same horizontal line, three white dots 3 located on the same vertical line, and so on, which is not limited in this application.
S23: and carrying out coordinate transformation on the vibration image according to the homography matrix to obtain a transformation vibration image.
S24: the offset value is determined based on the pixel coordinate values of the vibrating thick line and the vibrating thin line in the transformed vibration image.
The thick vibrating lines 1 and the thin vibrating lines 2 in the vibration images shown in fig. 1 and 2 are arranged in the horizontal direction or in the vertical direction. However, the camera 5 does not necessarily perform shooting at the angle shown in fig. 1 in the actually acquired vibration image, and the vibration thick line 1 and the vibration thin line 2 in the finally obtained vibration image may not be in a vertical state, which brings difficulty in determining the vibration thick line 1, the vibration thin line 2, and the offset value in the vibration image.
For this purpose, in this embodiment, with a known pixel coordinate value of each of the vibrating thick line 1, the vibrating thin line 2, the white point 3, etc., and the vibrating thick lines 1 and the vibrating thin lines 2 are each a standard vibration image distributed in the horizontal direction and the vertical direction as a reference, for example, fig. 1 is a partial image of the standard vibration image, the vibration image collected by the camera is converted, so that the distribution mode of the vibration thick lines 1 and the vibration thin lines 2 in the converted image is the same as that in the standard vibration image, then the vibration thick lines 1 and the vibration thin lines 2 are distributed in the horizontal direction and the vertical direction, when the first and second offset values L1 and L2 of the vibrating thick line 1 and the vibrating thin line 2 are obtained, for the vibrating thick line 1 and the vibrating thin line 2 in the horizontal direction, the deviation value can be obtained by comparing the pixel ordinate values of the central pixel point of the two vibrating thick lines 1 and the central pixel point of the vibrating thin line 2; similarly, the vibration thick line 1 and the vibration thin line 2 in the vertical direction can be offset as long as the pixel ordinate values of the central pixel point of the two vibration thick lines 1 and the central pixel point of the vibration thin line 2 are compared.
As described above, the vibration image includes a plurality of repeated basic image units 01, and it is difficult to recognize a single group of vibration thick lines and vibration thin lines in the conversion image. Alternatively, the unit vibration image in the transform vibration image may be identified according to the area range of the standard unit vibration image in the standard vibration image.
As shown in fig. 1 and 2, the unit vibration image 02 includes a group of horizontal vibration thick lines 1 and horizontal vibration thin lines 2, and a group of vertical vibration thick lines 1 and vertical vibration thin lines 2;
there is a certain difficulty in identifying and searching for a unit vibration image 02 in a vibration image including a plurality of repeated basic image units 01. In the present embodiment, since the vibration image is converted into a format consistent with the standard vibration image, the position ranges of the unit vibration image 02 in the standard vibration image and the vibration image are similar, and thus the unit vibration image 02 in the vibration image can be relatively simply divided, and the difficulty in dividing and identifying the unit vibration image 02 is simplified.
After the unit vibration image 02 is recognized, the central offset values of the horizontally vibrating thick lines and the vibrating thin lines are collected as a first offset value L1, the central offset values of the vertically vibrating thick lines and the vibrating thin lines are collected as a second offset value L2, and the sum of the first offset value L1 and the second offset value L2 is used as a final offset value.
In the embodiment, the pixel coordinate values of the vibrating thick line 1, the vibrating thin line 2 and the white point 3 are known, and the vibrating thick line 1 and the vibrating thin line 2 are standard vibrating images distributed in the horizontal direction and the vertical direction and are used as standards, so that the vibrating image of the vibrating mirror is converted into a form consistent with the standard vibrating image, the difficulty of dividing the unit vibrating image 02 and the difficulty of calculating the first offset value L1 and the second offset value L2 are simplified, and the implementation difficulty of the application is greatly simplified.
Based on the foregoing embodiment, in another embodiment of the present application, as shown in fig. 7, fig. 7 is a schematic flowchart of a process for obtaining multiple offset values according to the present application, where for the above adjustment of the gain parameter and the duration parameter of the galvanometer, and the repeated execution of the process of acquiring the vibration image of the galvanometer to obtain the multiple offset values may include:
s31: the gain parameter is increased while the duration parameter is kept unchanged, and an offset value corresponding to the increased gain parameter is obtained;
s32: judging whether the offset value corresponding to the current gain parameter is smaller than the offset value obtained last time, if so, entering S33, and if not, entering S35;
of course, the gain parameter may be reduced first, and the actual operation may be set empirically, which is not limited in this application.
S33: increasing the current gain parameter and obtaining a corresponding offset value;
s34: judging whether the offset value corresponding to the current gain parameter is larger than the offset value obtained last time, if so, entering S37, and if not, entering S33;
s35: reducing the current gain parameter and obtaining a corresponding offset value;
s36: judging whether the offset value corresponding to the current gain parameter is larger than the offset value obtained last time, if so, entering S35, and if not, entering S37;
s37: keeping the gain parameter corresponding to the minimum offset value of the gain parameter of the vibrating mirror unchanged, increasing the time length parameter and obtaining the offset value corresponding to the increased time length parameter;
s38: judging whether the offset value corresponding to the current time length parameter is smaller than the offset value obtained last time, if so, entering S39, and if not, entering S311;
s39: increasing the current time length parameter and obtaining a corresponding offset value;
s310: judging whether the offset value corresponding to the current time length parameter is larger than the offset value obtained last time, if so, ending, otherwise, entering S39;
s311: reducing the current time length parameter and obtaining a corresponding offset value;
s312: and judging whether the offset value corresponding to the current time length parameter is larger than the offset value obtained last time, if so, ending, otherwise, entering S311.
As mentioned above, the offset value is the smallest when the parameter setting of the galvanometer is the most suitable, and then when the gain parameter and the duration parameter are changed from suitable to unsuitable, the offset value is inevitably decreased and then increased, in this embodiment, the gain parameter and the duration parameter are adjusted step by step according to this principle, and finally, the gain parameter and the duration parameter with the smallest offset value are obtained.
It can be understood that, when performing parameter adjustment, there is no necessarily order in which to adjust the gain parameter first or adjust the duration parameter first, and this embodiment is only described by taking the example of adjusting the gain parameter first.
In addition, the step length of each increase or decrease of the gain parameter and the duration parameter may be set to be the same, so as to simplify the adjustment process, and certainly, in order to improve the accuracy of the determined gain parameter and duration parameter, a smaller step length may be set near the gain parameter and duration parameter corresponding to the determined minimum offset value.
The following describes a parameter adjustment device for a galvanometer according to an embodiment of the present invention, and the parameter adjustment device for a galvanometer described below and the parameter adjustment method for a galvanometer described above may be referred to in correspondence with each other.
Fig. 8 is a block diagram of a parameter adjustment apparatus for a galvanometer according to an embodiment of the present invention, where the parameter adjustment apparatus for a galvanometer according to fig. 8 may include:
the data acquisition module 100 is used for acquiring a vibration image of the galvanometer;
an offset value module 200 for obtaining an offset value between the vibrating thick line and the vibrating thin line in each of the vibrating images;
the parameter determining module 300 is configured to select a gain parameter and a duration parameter corresponding to a minimum offset value of the offset values as parameters of the galvanometer, and adjust the parameters of the galvanometer.
The parameter adjusting device of the galvanometer of this embodiment is configured to implement the parameter adjusting method of the galvanometer, and therefore a specific implementation manner of the parameter adjusting device of the galvanometer may be found in the foregoing embodiment portions of the parameter adjusting method of the galvanometer, for example, the data acquisition module 100, the offset module 200, and the parameter determination module 300 are respectively configured to implement steps S11 to S13 in the parameter adjusting method of the galvanometer, so that the specific implementation manner thereof may refer to descriptions of corresponding embodiments of the respective portions, and is not described herein again.
The application also provides an embodiment of a parameter adjusting device of a galvanometer, which may include a projector 4, a projection screen 6, a camera 5, and a processor;
the projector 4 is used for projecting an image generated by the vibration of the galvanometer to the projection screen 6;
the camera 5 is used for shooting an image on the projection screen 6 to obtain a vibration image;
the processor is used for executing the steps of the parameter adjusting method of the galvanometer according to any one of the above items according to the vibration images.
As shown in fig. 4, the present embodiment provides a parameter adjusting apparatus for a galvanometer, after a vibration image generated by the galvanometer is projected onto a projection screen 6 by a projector 4, a camera 5 is used to capture the vibration image, and a processor finally obtains the most appropriate gain parameter and duration parameter according to the variation of the offset value between the vibration thick line and the vibration thin line in the vibration image along with the gain parameter and duration parameter of the galvanometer, so that the adjusting efficiency is high, and the adjusting result is accurate.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include elements inherent in the list. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. In addition, parts of the above technical solutions provided in the embodiments of the present application, which are consistent with the implementation principles of corresponding technical solutions in the prior art, are not described in detail so as to avoid redundant description.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
Claims (8)
1. A method for adjusting parameters of a galvanometer is characterized by comprising the following steps:
collecting each vibration image corresponding to the galvanometer under a plurality of set different parameter states; wherein the parameters comprise a gain parameter and a duration parameter;
obtaining an offset value between a vibrating thick line and a vibrating thin line in each vibrating image;
selecting a gain parameter and a duration parameter corresponding to the minimum offset value in the offset values as parameters of the galvanometer, and adjusting the parameters of the galvanometer;
the obtaining an offset value between a vibrating thick line and a vibrating thin line in each of the vibrating images includes:
identifying white point pixel coordinate values of white points in the vibration image and obtaining standard white point pixel coordinate values of white points in a standard vibration image, wherein each group of vibration thick lines and vibration thin lines of the standard vibration image are distributed in the horizontal direction and the vertical direction;
acquiring a homography matrix between the vibration image and the standard vibration image according to the white point pixel coordinate value and the standard white point pixel coordinate value;
carrying out coordinate transformation on the vibration image according to the homography matrix to obtain a transformation vibration image;
determining the offset value according to the pixel coordinate values of the vibrating thick line and the vibrating thin line in the transformed vibrating image;
the determining the offset value according to the pixel coordinate values of the vibrating thick line and the vibrating thin line in the transformed vibration image includes:
identifying unit vibration images in the transformation vibration images according to the area range of standard unit vibration images in the standard vibration images, wherein the unit vibration images comprise a group of horizontal vibration thick lines and vertical vibration thin lines;
collecting offset values of the vibrating thick lines and the vibrating thin lines in the horizontal direction as first offset values, and collecting offset values of the vibrating thick lines and the vibrating thin lines in the vertical direction as second offset values;
and performing summation operation on the first offset value and the second offset value to obtain the offset value.
2. The parameter adjustment method for a galvanometer according to claim 1, wherein each set of the vibrating thick lines and the vibrating thin lines in the unit vibration image includes red vibrating thick lines and red vibrating thin lines, green vibrating thick lines and green vibrating thin lines, blue vibrating thick lines and blue vibrating thin lines;
correspondingly, summing the first offset value and the second offset value to obtain the offset value, including:
and summing the 3 first offset values of the group of the horizontal vibrating thick lines and the group of the vertical vibrating thin lines in the unit vibrating image and the 3 second offset values of the group of the vertical vibrating thick lines and the group of the vertical vibrating thin lines to obtain the offset values.
3. The method for adjusting parameters of a galvanometer according to claim 1, wherein selecting the gain parameter and the duration parameter corresponding to the smallest offset value among the offset values as the parameters of the galvanometer comprises:
selecting a specific offset value which is the smallest and has no corresponding first offset value and second offset value larger than a preset offset value from the offset values;
and taking the gain parameter and the time length parameter corresponding to the specific deviation value as the parameters of the galvanometer.
4. The galvanometer parameter adjustment method of claim 1, wherein identifying white point pixel coordinate values of white points in the vibration image comprises:
carrying out graying processing and binarization processing on the vibration image to obtain a binarization vibration image;
and finding the contours of all white points in the binary vibration image in a contour finding mode, and taking the centroid of the contour as the pixel coordinate value of the white point.
5. The method for adjusting parameters of a galvanometer of claim 1, wherein obtaining a homography matrix between the vibratory image and the standard vibratory image from the white point pixel coordinate values and the standard white point pixel coordinate values comprises:
and identifying a central white point and three adjacent white points which are closest to the central white point and meet preset conditions in the vibration image according to the pixel coordinate values of the white points, wherein the preset conditions are that the central white point and the three adjacent white points are respectively connected, and included angles among three line segments formed are 105 degrees, 145 degrees and 110 degrees in sequence.
And obtaining the homography matrix by using the pixel coordinate values of one central white point and three adjacent white points and the coordinate values of the standard white points of the four white points which meet the preset condition in the standard vibration image.
6. The method for adjusting parameters of a galvanometer according to any one of claims 1 to 5, wherein acquiring respective vibration images of the galvanometer corresponding to a plurality of different set parameter states to obtain an offset value between a vibration thick line and a vibration thin line in each vibration image comprises:
acquiring vibration images of the galvanometer in two states of unchanged duration parameter and increased gain parameter, and acquiring deviation values of the two vibration images;
if the offset value corresponding to the increased gain parameter is larger than the offset value corresponding to the gain parameter before the increase, acquiring each corresponding vibration image of the vibrating mirror in a state that the gain parameter is gradually reduced by taking the gain parameter before the increase as a reference, and obtaining a plurality of corresponding offset values until the currently obtained offset value is larger than the offset value obtained last time;
if the offset value corresponding to the increased gain parameter is smaller than the offset value corresponding to the gain parameter before the increase, acquiring each corresponding vibration image of the vibrating mirror in a state that the gain parameter is gradually increased by taking the increased gain parameter as a reference, and acquiring a plurality of corresponding offset values until the currently acquired offset value is larger than the offset value acquired last time;
acquiring vibration images of the vibrating mirror in two states of keeping gain parameters unchanged and increasing duration parameters, and obtaining deviation values of the two vibration images, wherein the gain parameters are gain parameters corresponding to the minimum deviation value in the deviation values corresponding to the gain parameters;
if the offset value corresponding to the increased duration parameter is larger than the offset value corresponding to the duration parameter before the increase, acquiring each corresponding vibration image of the galvanometer in a state that the duration parameter is gradually reduced by taking the duration parameter before the increase as a reference, and obtaining a plurality of corresponding offset values until the currently obtained offset value is larger than the offset value obtained last time;
if the offset value corresponding to the increased time length parameter is smaller than the offset value corresponding to the time length parameter before the increase, the increased time length parameter is taken as a reference, and each corresponding vibration image of the vibrating mirror in the state that the time length parameter is gradually increased is collected and a plurality of corresponding offset values are obtained until the currently obtained offset value is larger than the offset value obtained last time.
7. A parameter adjusting apparatus of a galvanometer, comprising:
the data acquisition module is used for acquiring a vibration image of the galvanometer;
an offset value module, configured to obtain an offset value between a vibrating thick line and a vibrating thin line in each of the vibrating images;
the parameter determination module is used for selecting a gain parameter and a time length parameter corresponding to the minimum offset value in all the offset values as parameters of the galvanometer and adjusting the parameters of the galvanometer;
the method for obtaining the offset value between the vibrating thick line and the vibrating thin line in each vibrating image by the offset value module comprises the following steps:
identifying white point pixel coordinate values of white points in the vibration image and obtaining standard white point pixel coordinate values of white points in a standard vibration image, wherein each group of vibration thick lines and vibration thin lines of the standard vibration image are distributed in the horizontal direction and the vertical direction;
acquiring a homography matrix between the vibration image and the standard vibration image according to the white point pixel coordinate value and the standard white point pixel coordinate value;
carrying out coordinate transformation on the vibration image according to the homography matrix to obtain a transformation vibration image;
determining the offset value according to the pixel coordinate values of the vibrating thick line and the vibrating thin line in the transformed vibrating image;
the determining the offset value according to the pixel coordinate values of the vibrating thick line and the vibrating thin line in the transformed vibration image includes:
identifying unit vibration images in the transformation vibration images according to the area range of standard unit vibration images in the standard vibration images, wherein the unit vibration images comprise a group of horizontal vibration thick lines and vertical vibration thin lines;
collecting offset values of the vibrating thick lines and the vibrating thin lines in the horizontal direction as first offset values, and collecting offset values of the vibrating thick lines and the vibrating thin lines in the vertical direction as second offset values;
and performing summation operation on the first offset value and the second offset value to obtain the offset value.
8. A parameter adjusting device of a galvanometer is characterized by comprising a projector, a projection screen, a camera and a processor;
the projector is used for projecting an image generated by the vibration of the galvanometer to a projection screen;
the camera is used for shooting an image on the projection screen to obtain a vibration image;
the processor is configured to perform the steps of the method for adjusting parameters of a galvanometer according to any one of claims 1 to 6, based on the vibration image.
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PCT/CN2020/136295 WO2022027896A1 (en) | 2020-08-04 | 2020-12-15 | Parameter adjustment method for vibrating mirror, apparatus, device, and readable storage medium |
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CN113610779B (en) * | 2021-07-20 | 2024-06-11 | 歌尔光学科技有限公司 | Vibrating mirror state detection method, device, equipment and computer readable storage medium |
CN114022571B (en) * | 2022-01-05 | 2022-05-17 | 中国科学院自动化研究所 | High-speed virtual camera system based on galvanometer, observation method and equipment |
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