CN111596158A - Photosensitive amplification system and method based on product aging test state - Google Patents

Photosensitive amplification system and method based on product aging test state Download PDF

Info

Publication number
CN111596158A
CN111596158A CN202010481955.9A CN202010481955A CN111596158A CN 111596158 A CN111596158 A CN 111596158A CN 202010481955 A CN202010481955 A CN 202010481955A CN 111596158 A CN111596158 A CN 111596158A
Authority
CN
China
Prior art keywords
module
photosensitive
amplification
sensitization
product
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010481955.9A
Other languages
Chinese (zh)
Inventor
喻成
党代表
张永举
许俊
章孝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Yuntaili Automation Equipment Co ltd
Original Assignee
Suzhou Yuntaili Automation Equipment Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Yuntaili Automation Equipment Co ltd filed Critical Suzhou Yuntaili Automation Equipment Co ltd
Priority to CN202010481955.9A priority Critical patent/CN111596158A/en
Publication of CN111596158A publication Critical patent/CN111596158A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

The invention discloses a photosensitive amplification system based on a product aging test state, which comprises a sensor module, a photosensitive amplification module, a single chip microcomputer and a three-color lamp module, wherein the photosensitive amplification module comprises a photosensitive amplification circuit, the sensor module is in communication connection with the photosensitive amplification module, the photosensitive amplification module is in connection with the single chip microcomputer, the single chip microcomputer is in connection with the three-color lamp module, the sensor module collects visible light information of a tested product and transmits the visible light information to the photosensitive amplification module, and the single chip microcomputer controls the photosensitive amplification module to adjust the intensity of the visible light information and transmits the intensity to the three-color lamp module for feedback. The intensity of the visible light is freely controlled and output through a single chip microcomputer program, the visible light information is properly amplified through the photosensitive amplification module, the circuit is simplified, the power consumption is reduced, and the resolution is high. The invention also discloses a photosensitive amplification method based on the product aging test state.

Description

Photosensitive amplification system and method based on product aging test state
Technical Field
The invention relates to the field of electronics, in particular to a photosensitive amplification system and a photosensitive amplification method based on a product aging test state.
Background
At present, with the rapid development of society, more and more electronic products enter the daily life and work of people. The electronic product is a related product based on electric energy, and mainly comprises: watches, smart phones, telephones, televisions, video disc players (VCD, SVCD, DVD), video recorders, camcorders, radios, radio cassettes, combination speakers, compact disc players (CD), computers, games, mobile communication products, and the like.
However, the conventional electronic product has the following defects in the process of observing the aging test state:
when measuring electronic product aging status, prior art is generally direct with test element and surveyed product data connection, gathers the inside charged state rethread outside LED of product and shows, surveys the product standby screen weak light through the gathering and observes to the reflector, because the intensity of light is more weak, can't obviously observe out, and the resolution is low.
Disclosure of Invention
In order to overcome the defects of the prior art, an object of the present invention is to provide a photosensitive amplifying system and method based on a product aging test state, which can solve the problem of low resolution due to weak light.
One of the purposes of the invention is realized by adopting the following technical scheme:
the utility model provides a sensitization system of enlargiing based on product aging testing state, includes sensor module, sensitization amplifier module, singlechip and tristimulus lamp module, sensitization amplifier module includes sensitization amplifier circuit, sensor module with sensitization amplifier module establishes the communication and connects, sensitization amplifier module with the singlechip is established and is connected, the singlechip with tristimulus lamp module establishes and connects, sensor module gathers the visual light information of being surveyed the product and transmits extremely sensitization amplifier module, single chip microcomputer control sensitization amplifier module adjusts the intensity of visual light information and carries to tristimulus lamp module and feed back.
Further, the photosensitive amplifying circuit comprises a first resistor, the sensor module is provided with an interruption pin, and the first resistor is connected with the power supply and the interruption pin respectively.
Further, the photosensitive amplifying circuit comprises a second resistor, the sensor module is provided with a clock line pin, the second resistor is respectively connected with the power supply and the clock line pin, and the clock line pin is connected with the single chip microcomputer.
Further, the photosensitive amplifying circuit comprises a third resistor, the sensor module is provided with a data line pin, the third resistor is respectively connected with the power supply and the data line pin, and the data line pin is connected with the single chip microcomputer.
Further, the model of the sensor module is TCS34725FN, and the model of the singlechip is STM32F103RCT 6.
The utility model provides a sensitization amplification method based on product aging testing state, is applied to the sensitization amplification system based on product aging testing state, and the sensitization amplification system based on product aging testing state includes sensor module, sensitization amplification module, singlechip and tristimulus lamp module, sensitization amplification module includes sensitization amplifier circuit, sensor module with sensitization amplification module establishes communication connection, sensitization amplification module with the singlechip is established and is connected, the singlechip with tristimulus lamp module establishes to be connected, includes following step:
a signal acquisition step: the sensor module collects visible light information of a tested product through a line;
a signal amplification step: the photosensitive amplifying module amplifies the visible light information to form information to be analyzed;
and (3) intensity detection: detecting whether the strength of the information to be analyzed meets the requirements, if so, executing the next step, and if not, returning to the signal amplification step;
a signal detection step: the single chip microcomputer detects information to be analyzed and forms output information, and the three-color lamp module displays the output information.
Further, in the signal amplification step, the single chip microcomputer sends an enhancement signal to the photosensitive amplification module and controls the photosensitive amplification module to enhance the intensity of the visible light information.
Further, in the signal amplification step, the amplification factor of the photosensitive amplification module is 5-20 times.
Further, in the signal detection step, the light of the three-color light module includes red light, green light and yellow light, the red light represents that the product is not up to standard, the green light represents that the product is up to standard, and the yellow light represents that the product is under detection.
Compared with the prior art, the invention has the beneficial effects that:
the sensitization enlargies the module and includes sensitization amplifier circuit, the sensor module with sensitization enlargies the module and establishes the communication and connect, sensitization enlargies the module with the singlechip is established and is connected, the singlechip with the tricolor light module is established and is connected, the sensor module gathers the visual light information of being surveyed the product and transmits extremely sensitization enlargies the module, single chip microcomputer control sensitization enlargies the module and adjusts and carry the intensity of visual light information to the tricolor light module and feed back. The intensity of the visible light is freely controlled and output through a single chip microcomputer program, the visible light information is properly amplified through the photosensitive amplification module, the circuit is simplified, the power consumption is reduced, and the resolution is high.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly understood, the present invention may be implemented in accordance with the content of the description, and in order to make the above and other objects, features, and advantages of the present invention more clearly understood, the following preferred embodiments are described in detail with reference to the accompanying drawings.
Drawings
FIG. 1 is a block diagram of a preferred embodiment of a photosensitive amplifying system based on a product aging test state according to the present invention;
FIG. 2 is a circuit diagram of the photosensitive amplifying system based on the product aging test state shown in FIG. 1;
FIG. 3 is another circuit diagram of the photosensitive amplifying system based on the product aging test status shown in FIG. 1;
FIG. 4 is a flow chart of a photosensitive amplification method based on a product aging test state.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and the detailed description, and it should be noted that any combination of the embodiments or technical features described below can be used to form a new embodiment without conflict.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1-3, a photosensitive amplification system based on a product aging test state comprises a sensor module, a photosensitive amplification module, a single chip microcomputer and a three-color lamp module, wherein the photosensitive amplification module comprises a photosensitive amplification circuit, the sensor module is in communication connection with the photosensitive amplification module, the photosensitive amplification module is connected with the single chip microcomputer, the single chip microcomputer is connected with the three-color lamp module, the sensor module collects visible light information of a tested product and transmits the visible light information to the photosensitive amplification module, and the single chip microcomputer controls the photosensitive amplification module to adjust the intensity of the visible light information and transmit the visible light information to the three-color lamp module for feedback. The intensity of the visible light is freely controlled and output through a single chip microcomputer program, the visible light information is properly amplified through the photosensitive amplification module, the circuit is simplified, the power consumption is reduced, and the resolution is high.
Specifically, referring to fig. 2-3, the model of the sensor module is TCS34725FN, and the model of the single chip microcomputer is STM32F103RCT 6. The sensor module comprises an interrupt pin INT, a clock line pin SCL, a data line pin SDA, a data line pin VDD, a GND pin and an NC pin. The photosensitive amplifying circuit comprises a first resistor, a second resistor and a third resistor, the sensor module is provided with an interruption pin, and the first resistor is connected with the power supply and the interruption pin respectively. The sensor module is provided with a clock line pin, the second resistor is respectively connected with the power supply and the clock line pin, and the clock line pin is connected with the single chip microcomputer. The sensor module is provided with a data line pin, the third resistor is respectively connected with a power supply and the data line pin, and the data line pin is connected with the single chip microcomputer. The first resistor is 10K, and the second resistor and the third resistor are 5.1K.
Specifically, the photosensitive amplification system based on the product aging test state is used for testing the standby weak light monitoring charging state of a specific electronic product screen, when the test system is connected and completed, the standby weak light of the product screen is collected through the sensor module, a signal is input to the single chip microcomputer control IO port, and after the single chip microcomputer program is processed, the single chip microcomputer control IO port outputs a signal to the three-color lamp module. The input of the sensor module is controlled by the peripheral IO, and the output of the three-color lamp module is controlled by the peripheral IO. Through the input and output of 16 passageways of singlechip STM32F103RCT6 control, 16 products that await measuring can be controlled to a system, simplify the circuit, reduce the consumption.
Referring to fig. 4, a photosensitive amplifying method based on a product aging test state is applied to a photosensitive amplifying system based on a product aging test state, the photosensitive amplifying system based on the product aging test state includes a sensor module, a photosensitive amplifying module, a single chip microcomputer and a three-color lamp module, the photosensitive amplifying module includes a photosensitive amplifying circuit, the sensor module is in communication connection with the photosensitive amplifying module, the photosensitive amplifying module is in connection with the single chip microcomputer, and the single chip microcomputer is in connection with the three-color lamp module, and the method includes the following steps:
a signal acquisition step: the sensor module collects visible light information of a tested product through a line;
a signal amplification step: the photosensitive amplifying module amplifies the visible light information to form information to be analyzed;
and (3) intensity detection: detecting whether the strength of the information to be analyzed meets the requirements, if so, executing the next step, and if not, returning to the signal amplification step;
a signal detection step: the single chip microcomputer detects information to be analyzed and forms output information, and the three-color lamp module displays the output information.
Preferably, in the signal amplification step, the single chip sends an enhancement signal to the photosensitive amplification module and controls the photosensitive amplification module to enhance the intensity of the visible light information. The singlechip controls the function of converting weak light into strong light through electricity, and is beneficial to better observing the aging test state of the product by operating personnel.
Preferably, in the signal amplifying step, the amplification factor of the photosensitive amplification module is 5 to 20 times. And program control is adopted, the input of signals is flexibly adjusted according to the intensity of received light, and the intensity of output optical signals is ensured.
Preferably, in the signal detection step, the light of the three-color lamp module comprises red light, green light and yellow light, the red light represents that the detected product does not reach the standard, the green light represents that the detected product reaches the standard, and the yellow light represents that the detected product is detecting, and the three color states are used for distinguishing, so that the control of operators is facilitated, the observation is simple and convenient, and the management efficiency is high.
The above embodiments are only preferred embodiments of the present invention, and the protection scope of the present invention is not limited thereby, and any insubstantial changes and substitutions made by those skilled in the art based on the present invention are within the protection scope of the present invention.

Claims (9)

1. The utility model provides a sensitization amplification system based on product aging testing state, includes sensor module, sensitization amplification module, singlechip and tristimulus lamp module, its characterized in that:
the sensitization enlargies the module and includes sensitization amplifier circuit, the sensor module with sensitization enlargies the module and establishes the communication and connect, sensitization enlargies the module with the singlechip is established and is connected, the singlechip with the tricolor light module is established and is connected, the sensor module gathers the visual light information of being surveyed the product and transmits extremely sensitization enlargies the module, single chip microcomputer control sensitization enlargies the module and adjusts and carry the intensity of visual light information to the tricolor light module and feed back.
2. The product degradation test condition-based photosensitive amplification system of claim 1, wherein: the photosensitive amplifying circuit comprises a first resistor, the sensor module is provided with an interruption pin, and the first resistor is connected with the power supply and the interruption pin respectively.
3. The product degradation test condition-based photosensitive amplification system of claim 1, wherein: the photosensitive amplifying circuit comprises a second resistor, the sensor module is provided with a clock line pin, the second resistor is respectively connected with the power supply and the clock line pin, and the clock line pin is connected with the single chip microcomputer.
4. The product degradation test condition-based photosensitive amplification system of claim 1, wherein: the photosensitive amplifying circuit comprises a third resistor, the sensor module is provided with a data line pin, the third resistor is respectively connected with the power supply and the data line pin, and the data line pin is connected with the single chip microcomputer.
5. The product degradation test condition-based photosensitive amplification system of claim 1, wherein: the model of the sensor module is TCS34725FN, and the model of the singlechip is STM32F103RCT 6.
6. The utility model provides a sensitization amplification method based on product aging testing state, is applied to the sensitization amplification system based on product aging testing state, and the sensitization amplification system based on product aging testing state includes sensor module, sensitization amplification module, singlechip and tristimulus lamp module, sensitization amplification module includes sensitization amplifier circuit, sensor module with sensitization amplification module establishes communication connection, sensitization amplification module with the singlechip is established and is connected, the singlechip with tristimulus lamp module establishes to be connected, its characterized in that includes following step:
a signal acquisition step: the sensor module collects visible light information of a tested product through a line;
a signal amplification step: the photosensitive amplifying module amplifies the visible light information to form information to be analyzed;
and (3) intensity detection: detecting whether the strength of the information to be analyzed meets the requirements, if so, executing the next step, and if not, returning to the signal amplification step;
a signal detection step: the single chip microcomputer detects information to be analyzed and forms output information, and the three-color lamp module displays the output information.
7. The photosensitive amplification method based on the product aging test state according to claim 6, wherein: in the signal amplification step, the single chip microcomputer sends an enhancement signal to the photosensitive amplification module and controls the photosensitive amplification module to enhance the intensity of the visible light information.
8. The photosensitive amplification method based on the product aging test state according to claim 6, wherein: in the signal amplification step, the amplification factor of the photosensitive amplification module is 5-20 times.
9. The photosensitive amplification method based on the product aging test state according to claim 6, wherein: in the signal detection step, the light of the three-color lamp module comprises red light, green light and yellow light, wherein the red light represents that the detected product does not reach the standard, the green light represents that the detected product reaches the standard, and the yellow light represents that the detection is in progress.
CN202010481955.9A 2020-05-29 2020-05-29 Photosensitive amplification system and method based on product aging test state Pending CN111596158A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010481955.9A CN111596158A (en) 2020-05-29 2020-05-29 Photosensitive amplification system and method based on product aging test state

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010481955.9A CN111596158A (en) 2020-05-29 2020-05-29 Photosensitive amplification system and method based on product aging test state

Publications (1)

Publication Number Publication Date
CN111596158A true CN111596158A (en) 2020-08-28

Family

ID=72187957

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010481955.9A Pending CN111596158A (en) 2020-05-29 2020-05-29 Photosensitive amplification system and method based on product aging test state

Country Status (1)

Country Link
CN (1) CN111596158A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204119578U (en) * 2014-06-11 2015-01-21 广东凯乐斯光电科技有限公司 A kind of optical-controlled light controller with Radio Control Function
CN105954664A (en) * 2016-04-25 2016-09-21 广东欧珀移动通信有限公司 Method, apparatus, and mobile terminal for determining aging of light-emitting element
US20180156860A1 (en) * 2015-05-29 2018-06-07 Hamamatsu Photonics K.K. Light source device and inspection device
CN207765141U (en) * 2017-12-25 2018-08-24 深圳Tcl新技术有限公司 Backlight detection circuit and backlight detection device
CN108831357A (en) * 2018-05-02 2018-11-16 广州市统云网络科技有限公司 A kind of LED display working condition automated measurement &control method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204119578U (en) * 2014-06-11 2015-01-21 广东凯乐斯光电科技有限公司 A kind of optical-controlled light controller with Radio Control Function
US20180156860A1 (en) * 2015-05-29 2018-06-07 Hamamatsu Photonics K.K. Light source device and inspection device
CN105954664A (en) * 2016-04-25 2016-09-21 广东欧珀移动通信有限公司 Method, apparatus, and mobile terminal for determining aging of light-emitting element
CN207765141U (en) * 2017-12-25 2018-08-24 深圳Tcl新技术有限公司 Backlight detection circuit and backlight detection device
CN108831357A (en) * 2018-05-02 2018-11-16 广州市统云网络科技有限公司 A kind of LED display working condition automated measurement &control method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
舒娜 白凤山: "《现代通信技术》", 30 April 2016 *

Similar Documents

Publication Publication Date Title
CN105049731B (en) Intelligent camera device and its shoot with video-corder mode switching method
CN101881657A (en) Light sensing device having a color sensor and a clear sensor for infrared rejection
CN106686511A (en) Earphone function testing method and testing system
CN109803248B (en) Intelligent bracelet rapid automatic testing method based on BLE4.0
CN110650397B (en) Wireless earphone detection method and detection device
CN110609220A (en) Transmission cable insulation state detection and evaluation system based on multiple signal acquisition and analysis
CN109581192A (en) A kind of PCBA powers on rear test device and system
CN103248766B (en) Automatic detecting system and method for audio circuit and keyboard quality of mobile phone
CN111596158A (en) Photosensitive amplification system and method based on product aging test state
CN103376577A (en) Automatic test method and system for liquid crystal display panel with LVDS (low voltage differential signaling) interface
CN110957979A (en) Solar cell panel operating condition detecting system
CN105657116B (en) Test result wiring method, device, mobile terminal and test macro
CN210721769U (en) Wireless smoke detector
CN112269345A (en) Recorder for monitoring equipment data bus and equipment state
CN210272192U (en) Intelligent contactor
CN201926852U (en) FQC automatic inspection device used in production process of projector
CN106482771A (en) A kind of product detection device on intelligent production line, advertiser and products detection system
CN202372254U (en) LED brilliancy automatic detector based on CL-200 brilliancy meter
CN207780966U (en) A kind of taiwan area communication intelligent detector
CN111585670A (en) Detection method and detection system of wireless detection system
CN220858107U (en) Satellite signal repeater
CN109283300A (en) A kind of intelligent gas data analyzer remotely controlled
CN214899187U (en) Intelligent disaster prevention energy-saving socket based on load identification algorithm
CN221177804U (en) Display equipment testing device for identifying nuclear power station DCS equipment
CN215297521U (en) RSSI-based optical transceiver test circuit structure and system

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20200828