CN111562485A - Anti-aging testing device for Beidou navigation chip - Google Patents
Anti-aging testing device for Beidou navigation chip Download PDFInfo
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- CN111562485A CN111562485A CN202010502410.1A CN202010502410A CN111562485A CN 111562485 A CN111562485 A CN 111562485A CN 202010502410 A CN202010502410 A CN 202010502410A CN 111562485 A CN111562485 A CN 111562485A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2862—Chambers or ovens; Tanks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
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- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention provides an anti-aging testing device for a Beidou navigation chip, relates to the technical field of anti-aging testing equipment, and solves the problems that when a box door is opened, high-temperature heat is rapidly discharged and burns hands and arms of a novice operator due to the fact that the novice operator forgets to stand for 10-20 minutes for heat dissipation for a few times. The utility model provides an ageing resistance testing arrangement for big dipper navigation chip, includes the high temperature ageing test case, the adjacent chamber door right side below position of terminal surface rotates before the high temperature ageing test case box and installs the rectangle limiting plate. Through the starting of the timer and the design of the arrow mark pointing to the signboard, the reminding effect is played for the operator, the operation step that the operator forgets to wait for cooling is avoided, and therefore the operator is effectively prevented from being burnt by high temperature.
Description
Technical Field
The invention belongs to the technical field of anti-aging test equipment, and particularly relates to an anti-aging test device for a Beidou navigation chip.
Background
The existing chip thermal aging test mode is that a chip is arranged on a PCBA circuit, is electrified to operate, is placed in a high-temperature aging test box, operates for 4 to 8 hours or even longer, and then determines thermal aging test data by observing parameter changes.
For example, application No.: CN201610973308.3 the invention relates to a novel high-temperature aging test box, which comprises a support and a box body, wherein a box door is arranged on the front side wall of the box body, a motor and a speed reducer are respectively arranged at the bottom end outside the box body, a horizontally arranged turntable is further arranged at the top end of an output shaft of the speed reducer, a plurality of universal balls are further arranged at the bottom end of the turntable, a rotating shaft extending vertically and upwardly is further connected onto the turntable, a plurality of annular trays are further fixedly sleeved on the rotating shaft, a plurality of tray through holes are further uniformly formed in the annular trays, a plurality of vertically and upwardly extending convex rods are further uniformly distributed on the top plane of the annular trays, a vertically arranged left electric heating rod is further arranged at the left end inside the box body, and a vertically arranged right electric heating rod is further arranged at the right end. By adopting the structure, the invention can greatly reduce the heating difference among a plurality of test parts, thereby effectively improving the service performance of the invention.
Based on the search of the above patent and the discovery of the equipment in the prior art, the existing high-temperature aging test box has the following potential safety hazards in practical application: when a novice operator uses the high-temperature aging test box for carrying out the chip thermal aging test for a plurality of times, due to the unfamiliarity with the specific flow steps of the high-temperature aging test box, after the running time of the high-temperature aging test is finished, the novice operator can easily forget to stand for 10-20 minutes, the box door can be opened after the exhaust system dissipates the high-temperature heat in the high-temperature aging test box, and the problem that the novice operator forgets to stand for 10-20 minutes for heat dissipation is caused, so that the high-temperature heat is rapidly discharged when the box door is opened, and the hands and the arms of the novice operator are burnt.
Disclosure of Invention
In order to solve the technical problems, the invention provides an anti-aging testing device for a Beidou navigation chip, which is used for solving the problems that when a novice operator uses a high-temperature aging test box for carrying out a chip heat aging test for a plurality of times, the novice operator is unfamiliar with the specific flow steps of the high-temperature aging test box, after the running time of the high-temperature aging test is finished, the novice operator is very easy to forget to stand for 10-20 minutes, the air exhaust system can open a box door after dissipating high-temperature heat in the high-temperature aging test box, and when the box door is opened, the high-temperature heat is quickly exhausted to burn hands and arms of the novice operator due to the forgetting of the problem that the high-temperature heat is required to be stood.
The invention relates to an anti-aging testing device for a Beidou navigation chip, which is achieved by the following specific technical means:
an anti-aging testing device for a Beidou navigation chip comprises a high-temperature aging test box, wherein a rectangular limiting plate is rotatably arranged at the position, adjacent to the right lower part of a box door, of the front end surface of a box body of the high-temperature aging test box; the high-temperature aging test box comprises a signboard, a rubber clamping block, a rectangular embedded groove and an arc-shaped notch, wherein the rectangular embedded groove is formed in the lower side part in the middle of the front end surface of the box body of the high-temperature aging test box, rubber clamping blocks are arranged on the left side surface and the right side surface of the inner end of the rectangular embedded groove respectively, the arc-shaped notch is formed in the middle of the top side surface and the bottom side surface of the inner end of the rectangular embedded groove respectively, the signboard is fixedly installed at the lower side part of the rectangular embedded groove on the front end surface of the box body of the high-temperature aging test box, a group of timers are embedded in the rectangular embedded groove, and the timers are limited and fixed through the rubber clamping blocks; and a timer is embedded in the square part of the lower side of the rectangular limiting plate on the front end surface of the box body of the high-temperature aging test box.
Furthermore, the high-temperature aging test box comprises a bearing and a limiting hole groove, the bearing is installed at the position, adjacent to the right lower part of the box door, of the front end surface of the box body of the high-temperature aging test box, the limiting hole groove is formed in the position, adjacent to the right lower part of the box door, of the front end surface of the box door of the high-temperature aging test box, and the limiting hole groove and the bearing are located on the same horizontal line.
Further, the rectangle limiting plate is including ball, pivot, rectangle limiting plate rear end face right side position is provided with a pivot, and the pivot rotates with the bearing and is connected, the rectangle limiting plate rear end face does not contact with terminal surface before high temperature aging test case box and the terminal surface before the chamber door, state the embedded rotation in rectangle limiting plate rear end face left side middle part and install a ball, and the terminal surface is in same tangent horizontal plane before ball and the high temperature aging test case box and the chamber door.
Further, the rectangle limiting plate is including circular dog, spacing bolt, reset spring, rubber cushion, arrow point sign, slip through-hole, a slip through-hole has been seted up to terminal surface left side square position before the rectangle limiting plate, and sliding connection has a spacing bolt in the slip through-hole, terminal surface fixedly connected with one before the spacing bolt is rather than the circular dog with the axle center, and the terminal surface is fixed through a reset spring before circular dog rear end face and the rectangle limiting plate and is connected, spacing bolt rear end face is provided with one rather than the rubber cushion with the diameter, the terminal surface is provided with the arrow point sign before the circular dog.
Further, when the top end face of the rectangular limiting plate and the top end face of the high-temperature aging test box are in a parallel state, the limiting bolt and a limiting hole groove formed in a box door of the high-temperature aging test box in a closed state are in the same axis state, and the limiting bolt and the rubber cushion block are in limiting insertion in the limiting hole groove.
Further, when the top end face of the rectangular limiting plate and the top end face of the high-temperature aging test box are in a vertical state, the rear end face of the rubber cushion block is in contact with the front end face of the timer, and the arrow end of the arrow mark points to the signboard.
Furthermore, the rectangular limiting plate comprises a circular limiting column, the part to the right in the middle of the top end face of the rectangular limiting plate is fixedly connected with the circular limiting column, and when the top end face of the rectangular limiting plate and the top end face of the high-temperature aging test box are in a vertical state, the circular limiting column is located at the part below the bottom end face of the box door of the high-temperature aging test box in a closed state.
Further, the bearing is in same vertical line with the push type starting switch of terminal surface before the timer, works as when rectangle limiting plate top end face is in the vertical state with high temperature aging test case top end face, the ball contacts with the push type starting switch of terminal surface before the timer, and push type starting switch is in by the press starting state.
Compared with the prior art, the invention has the following beneficial effects:
when the running time set by the high-temperature aging test box is over, an operator needs to rotate the rectangular limiting plate of the current limiting box door before opening the box door of the high-temperature aging test box, and when the operator rotates the rectangular limiting plate, the operator needs to rotate the rectangular limiting plate along the bearing anticlockwise until the top end face and the top end face of the high-temperature aging test box are in a vertical state, which is an essential condition, because the right part in the middle of the top end face of the rectangular limiting plate is fixedly connected with a round limiting column, when the rectangular limiting plate rotates anticlockwise along the bearing and does not reach ninety degrees (the top end face of the rectangular limiting plate and the top end face of the high-temperature aging test box are in a vertical state), the round limiting column still corresponds to the box door part of the high-temperature aging test box; therefore, through the arrangement of the circular limiting column, an operator is forced to rotate the rectangular limiting plate ninety degrees anticlockwise before the door needs to be opened (the top end face of the rectangular limiting plate is in a vertical state with the top end face of the high-temperature aging test box), when the top end face of the rectangular limiting plate is in a vertical state with the top end face of the high-temperature aging test box, the ball is contacted with the pressing type starting switch of the front end face of the timer, the pressing type starting switch is in a pressed starting state, therefore, after the operator rotates the rectangular limiting plate ninety degrees anticlockwise, the pressing type starting switch of the front end face of the timer is pressed through the ball, so that the timer is started to carry out timing, the front end face of the circular block is provided with an arrow mark, when the top end face of the rectangular limiting plate is in a vertical state with the top end face of the high-temperature aging test box, through the starting of the timer and the design of the arrow mark pointing to the signboard, the reminding effect is played for the operator, the operation step that the operator forgets to wait for cooling is avoided, and therefore the operator is effectively prevented from being burnt by high temperature.
Drawings
Fig. 1 is a schematic structural view of a rectangular limiting plate according to the present invention in a horizontal state.
FIG. 2 is a partial cross-sectional view of A-A of FIG. 1 according to the present invention.
FIG. 3 is a schematic structural diagram of a high temperature aging test chamber according to the present invention.
Fig. 4 is a schematic axial view of the top end of the rectangular limiting plate of the invention.
Fig. 5 is a schematic axial view of the bottom end of the rectangular limiting plate of the invention.
Fig. 6 is a schematic cross-sectional structure view of the rectangular limiting plate of the invention.
Fig. 7 is a schematic structural view of the rectangular limiting plate of the invention in a longitudinal state.
In the drawings, the corresponding relationship between the component names and the reference numbers is as follows:
1. a high temperature aging test chamber; 101. a signboard; 102. a rubber clamping block; 103. a bearing; 104. a limiting hole groove; 105. a rectangular embedded groove; 106. an arc notch; 2. a rectangular limiting plate; 201. a circular limiting column; 202. a circular stopper; 203. a limiting bolt; 204. a ball bearing; 205. a return spring; 206. a rotating shaft; 207. a rubber cushion block; 208. an arrow mark; 209. a slide through hole; 3. a timer;
Detailed Description
The embodiments of the present invention will be described in further detail with reference to the drawings and examples. The following examples are intended to illustrate the invention but are not intended to limit the scope of the invention.
In the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "connected" and "connected" are to be interpreted broadly, e.g., as being fixed or detachable or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Example (b):
as shown in figures 1 to 7:
the invention provides an anti-aging testing device for a Beidou navigation chip, which comprises: the high-temperature aging test box 1 is characterized in that a rectangular limiting plate 2 is rotatably arranged at the position, adjacent to the right lower part of the box door, of the front end surface of the box body of the high-temperature aging test box 1; the high-temperature aging test box 1 comprises a signboard 101, a rubber clamping block 102, a rectangular embedded groove 105 and an arc-shaped notch 106, wherein the rectangular embedded groove 105 is formed in the lower middle part of the front end face of the box body of the high-temperature aging test box 1, the rubber clamping blocks 102 are arranged on the left side face and the right side face of the inner end of the rectangular embedded groove 105, the arc-shaped notch 106 is formed in the middle parts of the top side face and the bottom side face of the inner end of the rectangular embedded groove 105, the signboard 101 is fixedly arranged in the lower middle part of the rectangular embedded groove 105 on the front end face of the box body of the high-temperature aging test box 1, a group of timers 3 are embedded in the rectangular embedded groove 105, and the timers 3 are limited and fixed through the rubber clamping block 102; the timer 3 is embedded in the lower side square part of the rectangular limiting plate 2 on the front end face of the box body of the high-temperature aging test box 1.
The high-temperature aging test box 1 comprises a bearing 103 and a limiting hole groove 104, the bearing 103 is installed at the position, on the right lower side of the adjacent box door, of the front end face of the box body of the high-temperature aging test box 1, the limiting hole groove 104 is formed in the position, on the right lower side of the front end face of the box door of the high-temperature aging test box 1, and the limiting hole groove 104 and the bearing 103 are located on the same horizontal line.
Wherein, rectangle limiting plate 2 is including ball 204, pivot 206, and 2 rear end face right side positions of rectangle limiting plate are provided with a pivot 206, and pivot 206 rotates with bearing 103 to be connected, and 2 rear end faces of rectangle limiting plate do not contact with terminal surface before 1 box of high temperature aging test case and the terminal surface before the chamber door, states 2 rear end face left side middle part of rectangle limiting plate and embeds to rotate and installs a ball 204, and ball 204 is in same tangent horizontal plane with terminal surface before 1 box of high temperature aging test case and the chamber door.
Wherein, rectangle limiting plate 2 is including circular dog 202, spacing bolt 203, reset spring 205, rubber cushion 207, arrow mark 208, sliding through hole 209, rectangle limiting plate 2 preceding terminal surface left side position has seted up one sliding through hole 209, and sliding through hole 209 internal sliding connection has a spacing bolt 203, terminal surface fixedly connected with one rather than the circular dog 202 with the axle center before spacing bolt 203, and circular dog 202 rear end face is connected through a reset spring 205 fixed connection with rectangle limiting plate 2 preceding terminal surface, spacing bolt 203 rear end face is provided with one rather than the rubber cushion 207 with the diameter, circular dog 202 preceding terminal surface is provided with arrow mark 208.
When the top end face of the rectangular limiting plate 2 and the top end face of the high-temperature aging test box 1 are in a parallel state, the limiting bolt 203 and the limiting hole groove 104 formed in the box door of the high-temperature aging test box 1 in a closed state are in the same axis state, and the limiting bolt 203 and the rubber cushion block 207 are in limiting insertion in the limiting hole groove 104.
When the top end face of the rectangular limiting plate 2 and the top end face of the high-temperature aging test box 1 are in a vertical state, the rear end face of the rubber cushion block 207 is in contact with the front end face of the timer 3, and the arrow end of the arrow mark 208 points to the signboard 101.
The rectangular limiting plate 2 comprises a circular limiting column 201, the middle of the top end face of the rectangular limiting plate 2 is fixedly connected with the circular limiting column 201 to the right, when the top end face of the rectangular limiting plate 2 and the top end face of the high-temperature aging test box 1 are in a vertical state, the circular limiting column 201 is located at the position below the bottom end face of the box door of the high-temperature aging test box 1 in a closed state.
The bearing 103 and the press type starting switch on the front end face of the timer 3 are located on the same vertical line, when the top end face of the rectangular limiting plate 2 and the top end face of the high-temperature aging test box 1 are in a vertical state, the ball 204 is in contact with the press type starting switch on the front end face of the timer 3, and the press type starting switch is in a pressed starting state.
When in use:
when the chip is aged at high temperature, the chip is arranged on a PCBA circuit, the power is switched on for operation, the chip is placed in a high-temperature aging test box 1, and an operator selects the operation time according to the difference of the chips; when the chip is put in, after the box door is closed, the operator can rotate the rectangular limiting plate 2 under the condition that the current top end face and the top end face of the high-temperature aging test box 1 are in the vertical state, through the rotating fit of the rotating shaft 206 and the bearing 103, the rectangular limiting plate 2 is rotated clockwise, until the top end face of the rectangular limiting plate 2 and the top end face of the high-temperature aging test box 1 are in the parallel state, and before the rectangular limiting plate 2 is rotated, the rectangular limiting plate 2 is pulled forward along the sliding through hole 209 by grabbing and pinching the circular stopper 202, so that the reset spring 205 is stretched, so that the rear end face of the rubber cushion block 207 is not in the same horizontal plane with the front end face of the box body of the high-temperature aging test box 1, and is prevented from blocking the clockwise rotating rectangular limiting plate 2, at this time, the rectangular limiting plate 2 can be rotated clockwise along the bearing 103, until the top end face of the rectangular limiting plate 2 and the Under the condition of an axial center, an operator can loosen the circular stop block 202, and under the resilience action of the return spring 205, the limiting bolt 203 and the rubber cushion block 207 can be rapidly inserted into the limiting hole groove 104 formed in the front end surface of the door of the high-temperature aging test box 1 in a limiting manner, so that the door of the high-temperature aging test box 1 is limited;
when the running time set by the high-temperature aging test box 1 is over, an operator needs to rotate the rectangular limit plate 2 of the current limit box door before opening the box door of the high-temperature aging test box 1, and when the operator rotates the rectangular limit plate 2, the operator also pulls the circular stop block 202 forwards along the sliding through hole 209 to stretch the return spring 205, so that the limit bolt 203 and the rubber cushion block 207 are separated from the limit hole groove 104 formed on the front end surface of the box body of the high-temperature aging test box 1, and then rotates the rectangular limit plate 2 anticlockwise along the bearing 103 until the top end surface and the top end surface of the high-temperature aging test box 1 are in a vertical state, which is a necessary condition, because the right part in the middle of the top end surface of the rectangular limit plate 2 is fixedly connected with the circular limit column 201, when the rectangular limit plate 2 rotates anticlockwise along the bearing 103 and does not reach ninety degrees (the top end surface of the rectangular limit plate 2 and the top, the round limiting column 201 also corresponds to the position of the box door of the high-temperature aging test box 1 and has a limiting effect on the box door; therefore, through the arrangement of the circular limiting column 201, the operator is forced to rotate the rectangular limiting plate 2 ninety degrees counterclockwise before opening the door (the top end surface of the rectangular limiting plate 2 is vertical to the top end surface of the high temperature aging test chamber 1), the structure is designed mainly because the bearing 103 is in the same vertical line with the press type start switch of the front end surface of the timer 3, when the top end surface of the rectangular limiting plate 2 is vertical to the top end surface of the high temperature aging test chamber 1, the ball 204 is in contact with the press type start switch of the front end surface of the timer 3, and the press type start switch is in the pressed state, so when the operator rotates the rectangular limiting plate 2 ninety degrees counterclockwise, the press type start switch of the front end surface of the timer 3 is pressed through the ball 204, thereby starting the timer 3 to time, and the front end surface of the circular stopper 202 is provided with the arrow mark 208, when the top end face of the rectangular limiting plate 2 and the top end face of the high-temperature aging test box 1 are in a vertical state, the arrow end of the arrow mark 208 points to the signboard 101 with a slogan needing to be kept stand for waiting for cooling written on the front end face, and by starting the timer 3 and designing that the arrow mark 208 points to the signboard 101, a reminding effect is achieved for an operator, the operator is prevented from forgetting the operation step needing to be kept stand for cooling, and therefore the operator is effectively prevented from being burnt by high temperature;
furthermore, through the design of the rubber cushion block 207, when the top end face of the rectangular limiting plate 2 and the top end face of the high-temperature aging test box 1 are in a vertical state, the rubber cushion block 207 is favorable for blocking the direct contact between the limiting bolt 203 and the display screen of the timer 3, and the limiting bolt 203 is prevented from scratching the display screen of the timer 3; the timer 3 is embedded in the rectangular embedded groove 105 and is limited and fixed through the rubber clamping block 102, when the electric quantity of the timer 3 is insufficient, the arc-shaped notch 106 is formed in the middle of the top side face and the bottom side face of the inner end of the rectangular embedded groove 105, so that the timer 3 can be taken out of the rectangular embedded groove 105 by being held between the two arc-shaped notches 106 in a grabbing mode, and corresponding charging operation is carried out.
The embodiments of the present invention have been presented for purposes of illustration and description, and are not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiment was chosen and described in order to best explain the principles of the invention and the practical application, and to enable others of ordinary skill in the art to understand the invention for various embodiments with various modifications as are suited to the particular use contemplated.
Claims (8)
1. The utility model provides an ageing resistance testing arrangement for beidou navigation chip which characterized in that: the high-temperature aging test box comprises a high-temperature aging test box (1), wherein a rectangular limiting plate (2) is rotatably arranged at the position, adjacent to the right lower part of a box door, of the front end face of a box body of the high-temperature aging test box (1); the high-temperature aging test box (1) comprises a signboard (101), a rubber clamping block (102), a rectangular embedded groove (105) and an arc notch (106), the middle lower side part of the front end surface of the box body of the high-temperature aging test box (1) is provided with a rectangular embedded groove (105), and the left side surface and the right side surface of the inner end of the rectangular embedded groove (105) are respectively provided with a rubber clamping block (102), the middle parts of the top side surface and the bottom side surface of the inner end of the rectangular embedded groove (105) are respectively provided with an arc notch (106), the front end face of the box body of the high-temperature aging test box (1) is fixedly provided with a signboard (101) at the lower side part of the rectangular embedded groove (105), a group of timers (3) are embedded in the rectangular embedded groove (105), and the timers (3) are limited and fixed through rubber clamping blocks (102); the front end face of the box body of the high-temperature aging test box (1) is embedded with a timer (3) at the lower side part of the rectangular limiting plate (2).
2. The anti-aging testing device for the Beidou navigation chip as set forth in claim 1, characterized in that: the high-temperature aging test box (1) comprises a bearing (103) and a limiting hole groove (104), wherein the bearing (103) is installed at the position, adjacent to the right lower side of the box door, of the front end face of the box body of the high-temperature aging test box (1), the limiting hole groove (104) is formed in the position, adjacent to the right lower side of the box door, of the front end face of the box door of the high-temperature aging test box (1), and the limiting hole groove (104) and the bearing (103) are located on the same horizontal line.
3. The anti-aging testing device for the Beidou navigation chip as set forth in claim 1, characterized in that: rectangle limiting plate (2) is including ball (204), pivot (206), rectangle limiting plate (2) rear end face right side position is provided with a pivot (206), and pivot (206) rotate with bearing (103) and be connected, rectangle limiting plate (2) rear end face does not contact with terminal surface before high temperature aging test case (1) box and the terminal surface before the chamber door, state that rectangle limiting plate (2) rear end face left side middle part is embedded to rotate and install a ball (204), and terminal surface is in same tangent horizontal plane before ball (204) and high temperature aging test case (1) box and the chamber door.
4. The anti-aging testing device for the Beidou navigation chip as set forth in claim 1, characterized in that: rectangle limiting plate (2) is including circular dog (202), spacing bolt (203), reset spring (205), rubber pad (207), arrow mark (208), slip through-hole (209), one slip through-hole (209) has been seted up to rectangle limiting plate (2) preceding terminal surface left side position, and sliding connection has a spacing bolt (203) in slip through-hole (209), terminal surface fixedly connected with one rather than circular dog (202) with the axle center before spacing bolt (203), and circular dog (202) rear end face is through a reset spring (205) fixed connection with rectangle limiting plate (2) preceding terminal surface, spacing bolt (203) rear end face is provided with one rather than with the diameter rubber pad (207), circular dog (202) preceding terminal surface is provided with arrow mark (208).
5. The anti-aging testing device for the Beidou navigation chip as set forth in claim 1, characterized in that: when the top end face of the rectangular limiting plate (2) and the top end face of the high-temperature aging test box (1) are in a parallel state, the limiting bolt (203) and a limiting hole groove (104) formed in the box door of the high-temperature aging test box (1) in a closed state are in the same axis state, and the limiting bolt (203) and the rubber cushion block (207) are in limiting insertion in the limiting hole groove (104).
6. The anti-aging testing device for the Beidou navigation chip as set forth in claim 1, characterized in that: when the top end face of the rectangular limiting plate (2) and the top end face of the high-temperature aging test box (1) are in a vertical state, the rear end face of the rubber cushion block (207) is in contact with the front end face of the timer (3), and the arrow end of the arrow mark (208) points to the signboard (101).
7. The anti-aging testing device for the Beidou navigation chip as set forth in claim 1, characterized in that: the rectangular limiting plate (2) comprises a circular limiting column (201), the middle of the top end face of the rectangular limiting plate (2) is fixedly connected with the circular limiting column (201) at the position which is inclined to the right, when the top end face of the rectangular limiting plate (2) and the top end face of the high-temperature aging test box (1) are in a vertical state, the circular limiting column (201) is located at the position of the lower side of the bottom end face of the box door of the high-temperature aging test box (1) in a closed state.
8. The anti-aging testing device for the Beidou navigation chip as set forth in claim 2, characterized in that: the push type starting switch of terminal surface is in same perpendicular line before bearing (103) and timer (3), works as when rectangle limiting plate (2) top terminal surface is in the vertical state with high temperature aging test case (1) top terminal surface, the push type starting switch contact of terminal surface before ball (204) and timer (3), push type starting switch is in by the press starting state.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010502410.1A CN111562485A (en) | 2020-06-05 | 2020-06-05 | Anti-aging testing device for Beidou navigation chip |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010502410.1A CN111562485A (en) | 2020-06-05 | 2020-06-05 | Anti-aging testing device for Beidou navigation chip |
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| CN111562485A true CN111562485A (en) | 2020-08-21 |
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| CN202010502410.1A Withdrawn CN111562485A (en) | 2020-06-05 | 2020-06-05 | Anti-aging testing device for Beidou navigation chip |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115031686A (en) * | 2022-06-06 | 2022-09-09 | 新疆卓越工程项目管理有限公司 | Intelligent automatic level gauge for building supervision site |
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2020
- 2020-06-05 CN CN202010502410.1A patent/CN111562485A/en not_active Withdrawn
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115031686A (en) * | 2022-06-06 | 2022-09-09 | 新疆卓越工程项目管理有限公司 | Intelligent automatic level gauge for building supervision site |
| CN115031686B (en) * | 2022-06-06 | 2024-08-02 | 新疆卓越工程项目管理有限公司 | Intelligent automatic level gauge for building supervision site |
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Application publication date: 20200821 |
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