CN111538662A - System testing method and device - Google Patents

System testing method and device Download PDF

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Publication number
CN111538662A
CN111538662A CN202010333877.8A CN202010333877A CN111538662A CN 111538662 A CN111538662 A CN 111538662A CN 202010333877 A CN202010333877 A CN 202010333877A CN 111538662 A CN111538662 A CN 111538662A
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tested
data
function
command
test
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孙孝文
林森
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Beijing Ruying Intelligent Technology Co ltd
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Beijing Ruying Intelligent Technology Co ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management

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  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
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Abstract

The present disclosure relates to a system testing method and apparatus. The method comprises the following steps: reading a plurality of data to be tested written in a configuration file according to a preset format, wherein each data to be tested comprises a function identifier of a corresponding function and a parameter list required by a test function; acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program; a plurality of functions of the system are tested by the test program calling at least one command included in each command set. In the technical scheme, the data to be tested corresponding to the system function to be tested can be written into the configuration file in advance, the test program can test the system function by reading the data to be tested in the configuration file without recompiling the test program, the test process is simplified, the time consumption is short, and the iterative development and utilization of the system are facilitated.

Description

System testing method and device
Technical Field
The present disclosure relates to the field of terminal control technologies, and in particular, to a system test method and apparatus.
Background
With the popularization of automatic control, more and more simple work in production and life is completed by robots.
In the related art, when testing the functions and stability of the robot operating system, a corresponding test program needs to be compiled according to the operating system, then the operating system to be tested is installed in the robot body, and then the test program can be run to start testing. With the iterative development of the operating system of the robot, developers can continuously modify the operating system to add new functions, and then the test program needs to be compiled once each modification, so that the test process is complicated, the time consumption is long, and the development and the utilization of the operating system of the robot are not facilitated.
Disclosure of Invention
To overcome the problems in the related art, embodiments of the present disclosure provide a system testing method and apparatus. The technical scheme is as follows:
according to a first aspect of embodiments of the present disclosure, there is provided a system testing method, the method including:
reading a plurality of data to be tested written in a configuration file according to a preset format, wherein the data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function;
acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program;
and testing a plurality of functions of the system through the calling of at least one command included in each command set by the test program.
The technical scheme provided by the embodiment of the disclosure can have the following beneficial effects: the data to be tested corresponding to the system function to be tested can be written into the configuration file in advance, the test program can test the system function by reading the data to be tested in the configuration file, the test program does not need to be compiled again, the test process is simplified, the time consumption is short, and the iterative development and utilization of the system are facilitated.
In one embodiment, said invoking, by said test program, at least one command included in each of said command sets, a plurality of functions of said system are tested, including:
acquiring an output result of at least one command included in each command set after the test program calls the at least one command included in each command set respectively;
determining whether a plurality of functions of the system pass the test according to an output result of at least one command included in each of the command sets.
In one embodiment, reading the plurality of data to be tested written in the preset format in the configuration file includes:
and receiving a test instruction, and reading a plurality of to-be-tested data written according to a preset format in the configuration file in response to the test instruction.
In one embodiment, the method further comprises:
acquiring data to be tested corresponding to a reference function, wherein the reference function is a function added after the system is updated;
and writing the data to be tested corresponding to the reference function into the configuration file.
According to a second aspect of embodiments of the present disclosure, there is provided a system test apparatus, the apparatus comprising:
the system comprises a reading module, a processing module and a processing module, wherein the reading module is used for reading a plurality of data to be tested written in a configuration file according to a preset format, the plurality of data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function;
the first acquisition module is used for acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program;
and the testing module is used for testing a plurality of functions of the system through the calling of the testing program to at least one command included in each command set.
In one embodiment, the test module comprises:
the obtaining submodule is used for obtaining an output result of at least one command included in each command set after the test program calls the at least one command included in each command set respectively;
and the testing submodule is used for determining whether a plurality of functions of the system pass the test or not according to the output result of at least one command included in each command set.
In one embodiment, the reading module includes:
and the instruction reading submodule is used for receiving a test instruction and reading a plurality of to-be-tested data written according to a preset format in the configuration file in response to the test instruction.
In one embodiment, the apparatus further comprises:
the second acquisition module is used for acquiring data to be tested corresponding to a reference function, wherein the reference function is a function added after the system is updated;
and the writing module is used for writing the data to be tested corresponding to the reference function into the configuration file.
According to a third aspect of the embodiments of the present disclosure, there is provided a system test apparatus including:
a processor;
a memory for storing processor-executable instructions;
wherein the processor is configured to:
reading a plurality of data to be tested written in a configuration file according to a preset format, wherein the data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function;
acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program;
and testing a plurality of functions of the system through the calling of at least one command included in each command set by the test program.
According to a fourth aspect of embodiments of the present disclosure, there is provided a computer-readable storage medium having stored thereon computer instructions which, when executed by a processor, implement the steps of the method according to any one of the embodiments of the first aspect.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure.
FIG. 1a is a flow chart illustrating a method of system testing according to an exemplary embodiment.
FIG. 1b is a flowchart illustrating step 103 of a system testing method according to an exemplary embodiment.
FIG. 1c is a flow chart illustrating a method of system testing according to an exemplary embodiment.
Fig. 2a is a schematic structural diagram illustrating a system test apparatus according to an exemplary embodiment.
Fig. 2b is a schematic diagram illustrating a system test apparatus according to an exemplary embodiment.
Fig. 2c is a schematic diagram illustrating a system test apparatus according to an exemplary embodiment.
Fig. 2d is a schematic diagram illustrating a system test apparatus according to an exemplary embodiment.
Fig. 3 is a block diagram illustrating a system test apparatus according to an exemplary embodiment.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure, as detailed in the appended claims.
Fig. 1a is a flowchart illustrating a system testing method applied to a software testing apparatus according to an exemplary embodiment, where the system testing method includes the following steps 101 and 103, as shown in fig. 1 a:
in step 101, a plurality of data to be tested written in a configuration file according to a preset format are read, the plurality of data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested includes a function identifier corresponding to a function and a parameter list required for testing the function.
In step 102, a command set corresponding to each piece of data to be tested is obtained according to the parameter list included in each piece of data to be tested, where each command set includes at least one command that can be called by the test program.
In step 103, a plurality of functions of the system are tested through the call of the test program to at least one command included in each command set.
By way of example, the system may be a robotic manipulation system, a cell phone manipulation system, a robotic arm manipulation system, and other systems developed for automation. The developer can write the data to be tested corresponding to the function of the system to be tested according to the actual test requirement and the preset format, for example, assuming that the function a needs to be tested, the data to be tested corresponding to the function a written by the developer can be { "name": "function identifier of the function a", "params": { parameter list required by the test function a } }, and then write the data to be tested into the configuration file. In practical applications, the preset format may be adjusted according to the setting of a developer, which is not limited in the embodiment of the disclosure.
When the function of the system needs to be tested, the testing apparatus may first read a plurality of data to be tested included in the configuration file, then analyze the plurality of data to be tested, and construct a command set corresponding to each data to be tested, where each command set includes at least one command that can be called by the testing program. Specifically, assume that a command set corresponding to data to be tested of a function a is obtained, and parameters required for testing the function a include m, n, s, p, q, that is, the data to be tested of the function a is { "name": function identifier of the function a, and "params": m, n, s, p, q } }. After reading the data to be tested of the function A, the testing device can obtain the parameters m, n, s, p and q required by testing the function A by analyzing the data to be tested, then obtain a plurality of commands with input parameters of m, n, s, p and/or q to form a command set corresponding to the data to be tested of the function A, and then determine whether the function A passes the test by calling results of the plurality of commands included in the command set by a testing program.
Specifically, when testing the system, a tester may send a test instruction to the testing device through a physical key, a virtual key, or a terminal, and after detecting the test instruction, the testing device may read a plurality of to-be-tested data written in the configuration file according to a preset format and perform a test.
In the technical scheme provided by the embodiment of the disclosure, the data to be tested corresponding to the system function to be tested can be written into the configuration file in advance, the test program can test the system function by reading the data to be tested in the configuration file, recompilation of the test program is not needed, the test process is simplified, the time consumption is short, and the iterative development and utilization of the system are facilitated.
In one embodiment, as shown in fig. 1b, step 103, that is, the step of testing the plurality of functions of the system through the invocation of at least one command included in each command set by the test program, may be implemented through step 1031 and step 1032:
in step 1031, an output result of at least one command included in each command set after the test program calls the at least one command included in each command set, respectively, is obtained.
In step 1032, it is determined whether a plurality of functions of the system pass the test based on the output result of the at least one command included in each command set.
For example, when testing a function a of the system, the testing apparatus may run a test program, call at least one command included in a command set corresponding to the function a through the test program, then obtain an output result of the at least one command, and determine whether the output result of the at least one command is expected, for example, whether the output result is the same as preset data, or whether the output result of a part of the commands is greater than or equal to, or less than or equal to a preset threshold, or whether a preset data interval is met, or the like. If the output result of the at least one command is in accordance with the expectation, the function A passes the test; if there is an output that does not match the expected command, the function fails the test.
In one embodiment, as shown in fig. 1c, the method further comprises steps 104 and 105:
in step 104, data to be tested corresponding to a reference function is obtained, where the reference function is a function added after the system is updated.
In step 105, the data to be tested corresponding to the reference function is written into the configuration file.
Since the system can be developed iteratively, the functionality of each new version of the system is changed, e.g. new functionality is added. In order to realize the test of the newly added function, after the system is developed, a developer can determine parameters required for testing the newly added function, then write the to-be-tested data of the newly added function according to a preset format, and send the to-be-tested data to the testing device. After receiving the data to be tested of the newly added function, the testing device may write the data to be tested into a configuration file. Therefore, during testing, the testing program can read the data to be tested and then acquire the command set corresponding to the data to be tested, thereby realizing the testing of the newly added function.
The embodiment of the disclosure provides a system testing method, which can write to-be-tested data corresponding to a system function to be tested into a configuration file in advance, and a test program can test the function of the system by reading the to-be-tested data in the configuration file without recompiling the test program, so that the testing process is simplified, the time consumption is short, and the iterative development and utilization of the system are facilitated.
The following are embodiments of the disclosed apparatus that may be used to perform embodiments of the disclosed methods.
Fig. 2a is a schematic structural diagram illustrating a system testing apparatus 20 according to an exemplary embodiment, where the apparatus 20 may be implemented as part or all of an electronic device through software, hardware or a combination of both. As shown in fig. 2a, the system test apparatus 20 includes:
the reading module 201 is configured to read a plurality of data to be tested written in a configuration file according to a preset format, where the plurality of data to be tested correspond to a plurality of functions of the system, respectively, and each data to be tested includes a function identifier corresponding to a function and a parameter list required for testing the function.
The first obtaining module 202 is configured to obtain, according to a parameter list included in each piece of data to be tested, a command set corresponding to each piece of data to be tested, where each command set includes at least one command that can be called by a test program.
The testing module 203 is configured to test a plurality of functions of the system through the invocation of at least one command included in each command set by the testing program.
In one embodiment, as shown in fig. 2b, the test module 203 comprises:
the obtaining sub-module 2031 is configured to obtain an output result of at least one command included in each command set after the test program calls the at least one command included in each command set, respectively.
The testing sub-module 2032 is configured to determine whether a plurality of functions of the system pass the test according to an output result of at least one command included in each of the command sets.
In one embodiment, as shown in fig. 2c, the reading module 201 includes:
the instruction reading sub-module 2011 is configured to receive a test instruction, and read a plurality of to-be-tested data written in the configuration file according to a preset format in response to the test instruction.
In one embodiment, as shown in fig. 2d, the apparatus 20 further comprises:
a second obtaining module 204, configured to obtain data to be tested corresponding to a reference function, where the reference function is a function added after the system is updated.
A writing module 205, configured to write the data to be tested corresponding to the reference function into the configuration file.
The embodiment of the disclosure provides a system testing device, which can write data to be tested corresponding to a system function to be tested into a configuration file in advance, and the device can test the function of the system by reading the data to be tested in the configuration file without recompiling a test program, thereby simplifying the testing process, having short time consumption and being beneficial to iterative development and utilization of the system.
The disclosed embodiment provides a system test device, which includes:
a processor;
a memory for storing processor-executable instructions;
wherein the processor is configured to:
reading a plurality of data to be tested written in a configuration file according to a preset format, wherein the data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function;
acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program;
and testing a plurality of functions of the system through the calling of at least one command included in each command set by the test program.
In one embodiment, the processor may be further configured to: acquiring an output result of at least one command included in each command set after the test program calls the at least one command included in each command set respectively; determining whether a plurality of functions of the system pass the test according to an output result of at least one command included in each of the command sets.
In one embodiment, the processor may be further configured to: and receiving a test instruction, and reading a plurality of to-be-tested data written according to a preset format in the configuration file in response to the test instruction.
In one embodiment, the processor may be further configured to: acquiring data to be tested corresponding to a reference function, wherein the reference function is a function added after the system is updated; and writing the data to be tested corresponding to the reference function into the configuration file.
The embodiment of the disclosure provides a system testing device, which can write data to be tested corresponding to a system function to be tested into a configuration file in advance, and the device can test the function of the system by reading the data to be tested in the configuration file without recompiling a test program, thereby simplifying the testing process, having short time consumption and being beneficial to iterative development and utilization of the system.
With regard to the apparatus in the above-described embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.
FIG. 3 is a block diagram illustrating a system test device 30 according to an exemplary embodiment. For example, the apparatus 30 may be provided as a server. The apparatus 30 comprises a processing component 302, which further comprises one or more processors, and memory resources, represented by memory 303, for storing instructions, such as application programs, executable by the processing component 302. The application programs stored in memory 303 may include one or more modules that each correspond to a set of instructions. Further, the processing component 302 is configured to execute instructions to perform the above-described system testing method.
The device 30 may also include a power component 306 configured to perform power management of the device 30, a wired or wireless network interface 305 configured to connect the device 30 to a network, and an input/output (I/O) interface 308. The device 30 may operate based on an operating system stored in the memory 303, such as Windows Server, Mac OS XTM, UnixTM, LinuxTM, FreeBSDTM, or the like.
The disclosed embodiments provide a non-transitory computer-readable storage medium, whose instructions, when executed by a processor of a device 30, enable the device 30 to perform the above-mentioned system testing method, the method including:
reading a plurality of data to be tested written in a configuration file according to a preset format, wherein the data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function.
And acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program.
And testing a plurality of functions of the system through the calling of at least one command included in each command set by the test program.
In one embodiment, said invoking, by said test program, at least one command included in each of said command sets, a plurality of functions of said system are tested, including: acquiring an output result of at least one command included in each command set after the test program calls the at least one command included in each command set respectively; determining whether a plurality of functions of the system pass the test according to an output result of at least one command included in each of the command sets.
In one embodiment, reading the plurality of data to be tested written in the preset format in the configuration file includes: and receiving a test instruction, and reading a plurality of to-be-tested data written according to a preset format in the configuration file in response to the test instruction.
In one embodiment, the method further comprises: acquiring data to be tested corresponding to a reference function, wherein the reference function is a function added after the system is updated; and writing the data to be tested corresponding to the reference function into the configuration file.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims (10)

1. A method of system testing, the method comprising:
reading a plurality of data to be tested written in a configuration file according to a preset format, wherein the data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function;
acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program;
and testing a plurality of functions of the system through the calling of at least one command included in each command set by the test program.
2. The method of claim 1, wherein said invoking by said test program of at least one command included in each of said command sets, testing a plurality of functions of said system comprises:
acquiring an output result of at least one command included in each command set after the test program calls the at least one command included in each command set respectively;
determining whether a plurality of functions of the system pass the test according to an output result of at least one command included in each of the command sets.
3. The method of claim 1 or 2, wherein reading the plurality of data to be tested written in the configuration file according to the preset format comprises:
and receiving a test instruction, and reading a plurality of to-be-tested data written according to a preset format in the configuration file in response to the test instruction.
4. The method according to claim 1 or 2, characterized in that the method further comprises:
acquiring data to be tested corresponding to a reference function, wherein the reference function is a function added after the system is updated;
and writing the data to be tested corresponding to the reference function into the configuration file.
5. A system test apparatus, the apparatus comprising:
the system comprises a reading module, a processing module and a processing module, wherein the reading module is used for reading a plurality of data to be tested written in a configuration file according to a preset format, the plurality of data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function;
the first acquisition module is used for acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program;
and the testing module is used for testing a plurality of functions of the system through the calling of the testing program to at least one command included in each command set.
6. The apparatus of claim 5, wherein the test module comprises:
the obtaining submodule is used for obtaining an output result of at least one command included in each command set after the test program calls the at least one command included in each command set respectively;
and the testing submodule is used for determining whether a plurality of functions of the system pass the test or not according to the output result of at least one command included in each command set.
7. The apparatus of claim 5 or 6, wherein the reading module comprises:
and the instruction reading submodule is used for receiving a test instruction and reading a plurality of to-be-tested data written according to a preset format in the configuration file in response to the test instruction.
8. The apparatus of claim 5 or 6, further comprising:
the second acquisition module is used for acquiring data to be tested corresponding to a reference function, wherein the reference function is a function added after the system is updated;
and the writing module is used for writing the data to be tested corresponding to the reference function into the configuration file.
9. A system test apparatus, comprising:
a processor;
a memory for storing processor-executable instructions;
wherein the processor is configured to:
reading a plurality of data to be tested written in a configuration file according to a preset format, wherein the data to be tested respectively correspond to a plurality of functions of the system, and each data to be tested comprises a function identifier corresponding to the function and a parameter list required for testing the function;
acquiring a command set corresponding to each piece of data to be tested according to a parameter list included in each piece of data to be tested, wherein each command set comprises at least one command capable of being called by a test program;
and testing a plurality of functions of the system through the calling of at least one command included in each command set by the test program.
10. A computer-readable storage medium having stored thereon computer instructions, which when executed by a processor, perform the steps of the method of any one of claims 1 to 4.
CN202010333877.8A 2020-04-24 2020-04-24 System testing method and device Pending CN111538662A (en)

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CN106371868A (en) * 2016-08-29 2017-02-01 浪潮(北京)电子信息产业有限公司 Automatic test method, system and test device
CN108519933A (en) * 2018-02-08 2018-09-11 广州视源电子科技股份有限公司 Board test method, device, readable storage medium storing program for executing and computer equipment

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Publication number Priority date Publication date Assignee Title
US20130231895A1 (en) * 2012-03-01 2013-09-05 Inventec Appliances (Pudong) Corporation Diagnose System for Rearranging Order of Testing Items in Diagnose Program in Accordance with a Log File
CN103294577A (en) * 2012-03-01 2013-09-11 英华达(上海)科技有限公司 Detecting system and method for adjusting sequence of test projects in diagnositc program
CN106371868A (en) * 2016-08-29 2017-02-01 浪潮(北京)电子信息产业有限公司 Automatic test method, system and test device
CN108519933A (en) * 2018-02-08 2018-09-11 广州视源电子科技股份有限公司 Board test method, device, readable storage medium storing program for executing and computer equipment

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