CN111505526A - Intelligent test system and method for secondary power supply circuit - Google Patents
Intelligent test system and method for secondary power supply circuit Download PDFInfo
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Abstract
The invention relates to an intelligent test system and method for a secondary power supply circuit, belongs to the technical field of secondary power supply circuit test, and is used for automatically testing a plurality of secondary power supply circuits simultaneously. The test system realizes real-time monitoring, recording and diagnosis of the running state of the equipment: the test system collects the output state information of the incubator, the power supply and the load in real time, displays, updates and stores the information in real time for analyzing and tracing the influence of the output state of the equipment on the performance index of the product, and controls the equipment in a closed loop; meanwhile, the test system compares the equipment state information with the abnormal mode, realizes the identification, alarm and processing of the equipment operation fault in the test process, and realizes the protection of products and equipment.
Description
Technical Field
The invention relates to an intelligent test system and method for a secondary power supply circuit, belongs to the technical field of secondary power supply circuit test, and is used for automatically testing a plurality of secondary power supply circuits simultaneously.
Background
The secondary power supply circuit testing system is a necessary tool for carrying out adjustment and test tests on the secondary power supply circuit. The test of the secondary power supply circuit generally utilizes equipment such as a temperature box, a power supply, a load, a multimeter and an oscilloscope to carry out resistance value test and output voltage test on the secondary power supply circuit under the condition of full temperature, and in the test process, the test equipment needs to be controlled to meet the requirements of the test process. Because the number of devices involved in the test process is large, manual operation and data recording of the devices are low in efficiency, errors are prone to occur, and product quality is affected.
The existing secondary power supply circuit test system can realize automatic test and each channel switching function, but the resistance characteristic test of a tested product and the safety monitoring conditions of test equipment and a tested circuit are not clearly explained, and an internal circuit has a charging and discharging process in the resistance test process of the secondary power supply circuit, so that the test time cannot be fixed, and whether the test result is stable or not lacks a uniform judgment standard; the input voltage and the load capacity of the secondary power supply have a certain range, and the test safety is threatened if the power supply/load is abnormal or the secondary power supply fails in the test process.
Disclosure of Invention
The technical problem solved by the invention is as follows: the system and the method for intelligently testing the secondary power supply circuit limit the types and control parameters of the testing equipment according to the testing requirements and control the working process of the testing equipment according to the control parameters, thereby automatically completing the testing process, effectively improving the consistency and reliability of the whole process of product testing and improving the working efficiency.
The technical scheme of the invention is as follows:
an intelligent test system for secondary power supply circuits is used for testing N channels of M products to be tested, each channel is provided with a load, each load consists of Q groups of authority resistors with different magnitudes, Q is a positive integer, and the required resistance value is obtained according to the authority ratio of 1, 2, 5 or the combination of 1, 2, 3 and 4;
m, N are positive integers, the test system comprises an industrial personal computer, a test configuration module, a test equipment subsystem and a state monitoring alarm subsystem;
the test equipment subsystem comprises an incubator, an input power supply, a matrix switching unit, a digital multimeter and an oscilloscope;
the state monitoring and alarming subsystem comprises an incubator state abnormity diagnosis module, an input power supply abnormity diagnosis module, a load state abnormity diagnosis module and an output voltage state abnormity diagnosis module;
the test configuration module is used for controlling the test equipment subsystem to perform decomposition to form a test configuration parameter A and also used for decomposing data indexes of M products to be tested to form a test configuration parameter B, and the formed test configuration parameter A and the formed test configuration parameter B are input to the industrial personal computer;
the incubator is used for receiving a temperature control instruction output by the industrial personal computer and providing environment temperature for the M products to be tested according to the received temperature control instruction;
the input power supply is used for receiving a voltage control instruction and a current control instruction output by the industrial personal computer, and providing working voltages for the M products to be tested according to the received voltage control instruction and current control instruction, wherein the working voltages comprise constant voltages (no voltage, fixed voltage values and any voltage value) and dynamic voltages (voltage values, change rates and duration time);
the matrix switching unit is used for receiving a channel switching control instruction output by the industrial personal computer and realizing switching among N channels of M products to be tested according to the received channel switching control instruction;
the digital multimeter is used for receiving a working mode control instruction output by the industrial personal computer and testing the resistance value or the voltage value of each channel of the M products to be tested according to the received working mode control instruction;
the oscilloscope is used for receiving the waveform control instruction output by the industrial personal computer and testing the waveform of each channel of the M products to be tested according to the received waveform control instruction;
the incubator state abnormity diagnosis module is used for receiving an incubator temperature abnormity alarm control instruction output by the industrial personal computer and alarming for incubator temperature abnormity according to the received incubator temperature abnormity alarm control instruction, wherein the incubator temperature abnormity refers to the fact that the difference value between the set temperature of the incubator and the actually measured temperature of the incubator exceeds a threshold value;
the input power supply abnormity diagnosis module is used for receiving an abnormity alarm control instruction of an input power supply output by the industrial personal computer and alarming abnormity of the input power supply according to the received abnormity alarm control instruction of the input power supply, wherein the abnormity of the input power supply means that the difference value between the actual output voltage value or current value of the input power supply and the set output voltage value or current value of the input power supply exceeds a threshold value;
the load state abnormity diagnosis module is used for receiving a load abnormity alarm control instruction output by the industrial personal computer and alarming load abnormity according to the received load abnormity alarm control instruction, wherein the load abnormity refers to the fact that the relative error between the actual resistance value of the load and the set resistance value of the load exceeds a threshold value;
the output voltage state abnormity diagnosis module is used for receiving an output voltage abnormity alarm control command output by the industrial personal computer and alarming the output voltage abnormity of each channel of M products to be tested according to the received output voltage abnormity alarm control command, wherein the output voltage abnormity of each channel means that the difference value of the actual output voltage value and the set voltage value of each channel exceeds a threshold value;
the industrial personal computer is used for receiving the test configuration parameters A and B input by the test configuration module, outputting a temperature control instruction to the incubator, outputting a voltage control instruction and a current control instruction to the input power supply, outputting a resistance control instruction to the load, outputting a channel switching control instruction to the matrix switching unit, outputting a working mode control instruction (a voltage working mode and a resistance working mode, when the output is in the voltage working mode, the digital multimeter is used for testing voltage, when the output is in the resistance working mode, the digital multimeter is used for testing resistance) to the digital multimeter, outputting a waveform control instruction to the oscilloscope, outputting an incubator temperature abnormity alarm control instruction to the incubator state abnormity diagnosis module, outputting an input power supply abnormity alarm control instruction to the input power supply abnormity diagnosis module, outputting a temperature control instruction to the incubator state abnormity diagnosis module, outputting an output power supply abnormity control instruction to the output power supply abnormity diagnosis module, outputting a test control instruction, The load state abnormity diagnosis module is also used for outputting a load abnormity alarm control instruction to the load state abnormity diagnosis module and outputting a voltage abnormity alarm control instruction to the output voltage state abnormity diagnosis module.
An intelligent test method for a secondary power supply circuit comprises the following steps of carrying out insulation resistance test, characteristic resistance test, voltage precision test, voltage stability test, load stability test, starting characteristic test, output ripple test, temperature stability test, temperature screening test and voltage impact test on the secondary power supply circuit:
the insulation resistance value testing method comprises the following steps: under normal temperature (without starting the incubator), an input power supply and a load are not switched on, and insulation resistance values among N channel points of M products to be tested are sequentially measured by using a digital multimeter;
the characteristic resistance value testing method comprises the following steps: under normal temperature (without starting the incubator), the input power supply and the load are not switched on, and the characteristic resistance values among N channel point positions of M products to be detected are sequentially measured by using a digital multimeter;
the voltage precision testing method comprises the following steps: under a set temperature, an input power supply (set with a constant voltage) and an N-path load (set with a constant resistance value) are connected, and a digital multimeter is used for sequentially measuring N channel output voltages of M products to be measured;
the method for testing the voltage stability comprises the following steps: under a set temperature, connecting N loads (setting a constant resistance value), adjusting the output value of an input power supply (setting a plurality of constant voltages), sequentially measuring N channel output voltages corresponding to input voltages of M products to be tested by using a digital multimeter, and calculating voltage stability;
the method for testing the load stability comprises the following steps: under a set temperature, an input power supply is connected (a constant voltage is set), load resistance values are adjusted (each path of channel corresponds to a plurality of resistance values), N channel output voltages corresponding to the load resistance values of M products to be tested are sequentially measured by using a digital multimeter, and load stability is calculated;
the method for starting the characteristic check comprises the following steps: under a set temperature, an input power supply (a constant voltage is set) and N paths of loads (a constant resistance value is set in each path) are connected, an oscilloscope is used for measuring the starting time, the starting current and the starting overshoot of N channels of M products to be tested in sequence, and the waveforms are recorded;
the method for checking the output ripple comprises the following steps: under a set temperature, an input power supply (a constant voltage is set) and N paths of loads (a constant resistance value is set in each path) are connected, voltage ripples of N channels of M products to be tested are measured in sequence by using an oscilloscope, and waveforms are recorded;
the method for testing the temperature stability comprises the following steps: under the condition of setting a plurality of constant temperatures, connecting an input power supply (setting a constant voltage) and N paths of loads (setting a constant resistance value for each path), sequentially measuring output voltages of N channels of M products to be measured at the set constant temperatures by using a digital multimeter, and calculating the temperature stability;
the method for the temperature screening test comprises the following steps: under the condition of constant temperature or variable temperature, an input power supply (setting a constant voltage) and N paths of loads (each path is a constant resistance value) are connected, and a digital multimeter is used for sequentially measuring the output voltages of N channels of M products to be measured;
the voltage impact test method comprises the following steps: at normal temperature (without starting the incubator), switching on the dynamic voltage and the N-path load (setting a constant resistance value), and sequentially measuring the output voltages of N channels of M products to be measured by using a digital multimeter;
the matrix switching unit is used for measuring and switching resistance values or voltages among N channels of M products to be tested, point positions among measurement points of the resistance values or the voltages are set to be (Xi, Yi), all measurement point positions of the test channels form a measurement matrix and are input into the test configuration module, and X-Y connection is controlled by controlling a cross point (namely a relay) of a switching device between X lines and Y lines, so that a routing relation is established between the channels to be tested and the subsystem of the test equipment, and the switching of the N channels is realized;
method for reading digital multimeter values (voltage or resistance): and setting the basic time T0 and the step time Tp, wherein the test time of each measuring point is T0+ n Tp, n is an integer, the resistance value or the voltage is measured once at each time, and when the difference value between the current acquired value of the resistance or the voltage and the previous acquired value of the resistance or the voltage is less than a threshold value, the resistance value or the voltage can be recorded when the resistance value or the voltage reaches a stable state.
Compared with the prior art, the invention has the beneficial effects that:
(1) the invention can realize the automatic operation of the whole test process according to the content and the configuration parameters of the test items, thereby realizing the automatic control of the whole test process;
(2) in the automatic testing process, each testing device and the tested product respectively return the working state of the device and the product testing data to the industrial personal computer in real time, so that the industrial personal computer can conveniently monitor and control the testing process by using the data;
(3) the industrial personal computer automatically controls the actions of equipment such as a temperature box, a power supply, a load and the like according to a process flow, can arrange, store, analyze and generate reports on collected product data, and finally realizes the test automation of a secondary power supply circuit in a full temperature range;
(4) the testing system opens up a plurality of channels, and carries out parallel testing on M products and N channels with consistent testing flows by using one set of equipment, so that the testing accuracy and reliability are improved;
(5) the test system realizes real-time monitoring, recording and diagnosis of the running state of the equipment: the test system collects the output state information of the incubator, the power supply and the load in real time, displays, updates and stores the information in real time for analyzing and tracing the influence of the output state of the equipment on the performance index of the product, and controls the equipment in a closed loop; meanwhile, the test system compares the equipment state information with the abnormal mode, realizes the identification, alarm and processing of the equipment operation fault in the test process, and realizes the protection of products and equipment.
Drawings
FIG. 1 is a schematic diagram of the system of the present invention.
Detailed Description
The invention is further illustrated by the following examples.
Example 1
Taking 2 products to be tested as an example, the 1 st product to be tested has 1 input channel, 1 output channel and 1 shell endpoint; the 2 nd product to be tested is provided with 1 input channel, 3 output channels and 1 shell endpoint; the explanation is given according to the whole experimental procedure, i.e. M is 2 and N is 8.
As shown in fig. 1, an intelligent test system for a secondary power supply circuit is used for testing 4 channels of 2 products to be tested, each channel is provided with a load, each load consists of Q groups of authority resistors with different magnitudes, Q is a positive integer, and the authority ratio is 1, 2, 5 or 1, 2, 3, 4, so as to obtain a required resistance value;
the test system comprises an industrial personal computer, a test configuration module, a test equipment subsystem and a state monitoring alarm subsystem;
the test equipment subsystem comprises an incubator, an input power supply, a matrix switching unit, a digital multimeter and an oscilloscope;
the state monitoring and alarming subsystem comprises an incubator state abnormity diagnosis module, an input power supply abnormity diagnosis module, a load state abnormity diagnosis module and an output voltage state abnormity diagnosis module;
the test configuration module is used for controlling the test equipment subsystem to perform decomposition to form a test configuration parameter A and also used for decomposing data indexes of 2 products to be tested to form a test configuration parameter B, and the formed test configuration parameter A and the formed test configuration parameter B are input to the industrial personal computer;
the incubator is used for receiving a temperature control instruction output by the industrial personal computer and providing the environmental temperature for 2 products to be tested according to the received temperature control instruction;
the input power supply is used for receiving a voltage control instruction and a current control instruction output by the industrial personal computer, and providing working voltage for 2 products to be tested according to the received voltage control instruction and current control instruction, wherein the working voltage comprises constant voltage (no voltage, a fixed voltage value and any voltage value) and dynamic voltage (a voltage value, a change rate and duration);
the matrix switching unit is used for receiving a channel switching control instruction output by the industrial personal computer and realizing switching among 8 channels of 2 products to be tested according to the received channel switching control instruction;
the digital multimeter is used for receiving a working mode control instruction output by the industrial personal computer and testing the resistance value or the voltage value of each channel of 2 products to be tested according to the received working mode control instruction;
the oscilloscope is used for receiving the waveform control instruction output by the industrial personal computer and testing the waveform of each channel of the 2 products to be tested according to the received waveform control instruction;
the incubator state abnormity diagnosis module is used for receiving an incubator temperature abnormity alarm control instruction output by the industrial personal computer and alarming for incubator temperature abnormity according to the received incubator temperature abnormity alarm control instruction, wherein the incubator temperature abnormity refers to the fact that the difference value between the set temperature of the incubator and the actually measured temperature of the incubator exceeds a threshold value;
the input power supply abnormity diagnosis module is used for receiving an abnormity alarm control instruction of an input power supply output by the industrial personal computer and alarming abnormity of the input power supply according to the received abnormity alarm control instruction of the input power supply, wherein the abnormity of the input power supply means that the difference value between the actual output voltage value or current value of the input power supply and the set output voltage value or current value of the input power supply exceeds a threshold value;
the load state abnormity diagnosis module is used for receiving a load abnormity alarm control instruction output by the industrial personal computer and alarming load abnormity according to the received load abnormity alarm control instruction, wherein the load abnormity refers to the fact that the difference value between the actual resistance value of the load and the set resistance value of the load exceeds a threshold value;
the output voltage state abnormity diagnosis module is used for receiving an output voltage abnormity alarm control command output by the industrial personal computer, and performing output voltage abnormity alarm of each channel of 2 products to be tested according to the received output voltage abnormity alarm control command, wherein the output voltage abnormity of each channel means that the difference value of the actual output voltage value and the set voltage value of each channel exceeds a threshold value;
the industrial personal computer is used for receiving the test configuration parameters A and B input by the test configuration module, outputting a temperature control instruction to the incubator, outputting a voltage control instruction and a current control instruction to the input power supply, outputting a resistance control instruction to the load, outputting a channel switching control instruction to the matrix switching unit, outputting a working mode control instruction (a voltage working mode and a resistance working mode, when the output is in the voltage working mode, the digital multimeter is used for testing voltage, when the output is in the resistance working mode, the digital multimeter is used for testing resistance) to the digital multimeter, outputting a waveform control instruction to the oscilloscope, outputting an incubator temperature abnormity alarm control instruction to the incubator state abnormity diagnosis module, outputting an input power supply abnormity alarm control instruction to the input power supply abnormity diagnosis module, outputting a temperature control instruction to the incubator state abnormity diagnosis module, outputting an output power supply abnormity control instruction to the output power supply abnormity diagnosis module, outputting a test control instruction, The load state abnormity diagnosis module is also used for outputting a load abnormity alarm control instruction to the load state abnormity diagnosis module and outputting an output voltage abnormity alarm control instruction to the output voltage state abnormity diagnosis module.
An intelligent test method for a secondary power supply circuit comprises the following steps of carrying out insulation resistance test, characteristic resistance test, voltage precision test, voltage stability test, load stability test, starting characteristic test, output ripple test, temperature stability test, temperature screening test and voltage impact test on the secondary power supply circuit:
the insulation resistance value testing method comprises the following steps: under normal temperature (without starting the incubator), an input power supply and a load are not switched on, and insulation resistance values among 8 channel points of 2 products to be detected are sequentially measured by using a digital multimeter;
the characteristic resistance value testing method comprises the following steps: under normal temperature (without starting the incubator), the input power supply and the load are not switched on, and characteristic resistance values among 8 channel point positions of 2 products to be detected are sequentially measured by using a digital multimeter;
the voltage precision testing method comprises the following steps: under a set temperature, an input power supply (a constant voltage is set) and an N-path load (a constant resistance value is set) are connected, and a digital multimeter is used for sequentially measuring 4 channel output voltages of 2 products to be measured;
the method for testing the voltage stability comprises the following steps: under a set temperature, connecting 4 paths of loads (setting a constant resistance value), adjusting the output value of an input power supply (setting a plurality of constant voltages), sequentially measuring 4 channel output voltages corresponding to input voltages of 2 products to be tested by using a digital multimeter, and calculating the voltage stability;
the method for testing the load stability comprises the following steps: under a set temperature, an input power supply is connected (a constant voltage is set), load resistance values are adjusted (each path of channel corresponds to a plurality of resistance values), 4 channel output voltages corresponding to the load resistance values of 2 products to be tested are sequentially measured by using a digital multimeter, and load stability is calculated;
the method for starting the characteristic check comprises the following steps: under a set temperature, an input power supply (a constant voltage is set) and 4 paths of loads (a constant resistance value is set in each path) are connected, an oscilloscope is used for sequentially measuring the starting time, the starting current and the starting overshoot of 4 channels of 2 products to be tested, and the waveforms are recorded;
the method for checking the output ripple comprises the following steps: under a set temperature, an input power supply (a constant voltage is set) and 4 paths of loads (a constant resistance value is set for each path) are connected, voltage ripples of 4 channels of 2 products to be tested are measured in sequence by using an oscilloscope, and waveforms are recorded;
the method for testing the temperature stability comprises the following steps: under the condition of setting a plurality of constant temperatures, connecting an input power supply (setting a constant voltage) and 4 paths of loads (setting a constant resistance value for each path), sequentially measuring output voltages of 4 channels of 2 products to be measured at each set constant temperature by using a digital multimeter, and calculating the temperature stability;
the method for the temperature screening test comprises the following steps: under the condition of constant temperature or variable temperature, an input power supply (setting a constant voltage) and 4 paths of loads (each path is a constant resistance value) are connected, and a digital multimeter is used for sequentially measuring the output voltages of 4 channels of 2 products to be measured;
the voltage impact test method comprises the following steps: at normal temperature (without starting the incubator), switching on the dynamic voltage and 4 paths of loads (setting a constant resistance value), and sequentially measuring the output voltages of 4 channels of 2 products to be measured by using a digital multimeter;
the matrix switching unit is used for measuring and switching resistance values or voltages among 4 channels of 2 products to be tested, point positions among measurement points of the resistance values or the voltages are set to be (Xi, Yi), all measurement point positions of the test channels form a measurement matrix and are input into the test configuration module, and X-Y connection is controlled by controlling a cross point (namely a relay) of a switching device between X lines and Y lines, so that a routing relation is established between the channels to be tested and the subsystem of the test equipment, and the switching of N channels is realized;
method for reading digital multimeter values (voltage or resistance): and setting the basic time T0 and the step time Tp, wherein the test time of each measuring point is T0+ n Tp, n is an integer, the resistance value or the voltage is measured once at each time, and when the difference value between the current acquired value of the resistance or the voltage and the previous acquired value of the resistance or the voltage is less than a threshold value, the resistance value or the voltage can be recorded when the resistance value or the voltage reaches a stable state.
Example 2
Taking 2 products to be tested as an example, the 1 st product to be tested has 1 input channel, 1 output channel and 1 shell endpoint; the 2 nd product to be tested is provided with 1 input channel, 3 output channels and 1 shell endpoint; the following steps are specifically described according to the whole experimental flow, namely, M is 2 and N is 8:
(1) and connecting the tested product, opening the industrial personal computer, entering a test configuration module, and setting a test equipment configuration parameter A and a test configuration parameter B according to the test items.
The corresponding parameters of each test item, test equipment, indexes and alarm in the test configuration module are shown in the following tables.
Resistance value test configuration item table
Voltage test configuration item table
Waveform test configuration item table
Temperature screening test configuration item table
Voltage impact test configuration item table
Alarm threshold configuration item table
(2) And (3) carrying out insulation resistance test according to test configuration parameters: the industrial personal computer controls the digital multimeter to be in a resistance value range; the industrial personal computer controls a matrix switching unit to firstly switch on 11-10 point locations which are connected with high and low point locations of the multimeter; setting basic time to be 5s, reading the resistance value every 1s later, and recording the resistance value at the current time by the industrial personal computer when the difference value between the current resistance value and the resistance value at the last 1s is less than 1K omega; and switching to the next group of point positions one by one and measuring the resistance value of the point position until the insulation resistance value test is finished.
(3) And (3) testing the characteristic resistance according to the test configuration parameters: the test method is the same as the insulation resistance test.
(4) And (3) performing voltage precision test according to the test configuration parameters: the industrial personal computer controls the start and the operation of the incubator, and the incubator is started for 1h for timing after the temperature reaches the set temperature of 30 ℃; simultaneously, the industrial personal computer controls 4 paths of loads and is connected with a channel to be tested, the 1 st and 2 nd paths of loads respectively consist of 1 5 omega resistor, and the 3 rd and 4 th paths of loads respectively consist of 1 50 omega resistor, 1 20 omega resistor and 1 5 omega resistor which are connected in series; after the heat preservation time is reached, the industrial personal computer starts an input power supply to provide 28V voltage for 2 tested products; the industrial personal computer controls the digital multimeter to be in a voltage range; the industrial personal computer controls a matrix switching unit to firstly switch on 13-14 point locations which are connected with high and low point locations of the multimeter; setting basic time for 2s, reading the resistance value every 1s later, and recording the voltage value at the current moment by the industrial personal computer when the voltage difference between the current resistance value and the last 1s moment is less than 0.01V; switching to the next group of point locations one by one and measuring the voltage values of the point locations until the voltage precision test is finished; the industrial personal computer controls the input power supply to be powered off, and the incubator recovers to the normal temperature state and is closed.
(5) And (3) performing voltage stability test according to test configuration parameters: the industrial personal computer controls the incubator, the load, the digital multimeter and the data recording device (4); after the heat preservation time is reached, the industrial personal computer controls the input power supply to output 23V voltage at first; the industrial personal computer control matrix switching unit is firstly connected with 13-14 point locations, connected with high and low point locations of the multimeter, and records the current voltage value after the digital multimeter is stable; switching to the next group of point locations one by one and measuring voltage values of the point locations until the voltage test of each channel is finished; the industrial personal computer controls the input power supply to be powered off; then the industrial personal computer controls the input power supply to sequentially output 28V voltage and 32V voltage, and the industrial personal computer controls the matrix switching unit and the digital multimeter to repeat the operations to complete the voltage test of each channel; calculating the voltage stability, and finishing the whole test; the industrial personal computer controls the input power supply to be powered off, and the incubator recovers to the normal temperature state and is closed.
(6) And (3) carrying out load stability test according to the test configuration parameters: the industrial control machine controls the temperature box, the input power supply, the digital multimeter and the data recording (4); after the heat preservation time is reached, the industrial personal computer firstly controls 4 paths of loads to be connected with a channel to be tested, the 1 st and 2 nd paths of loads respectively consist of 12 omega resistor, and the 3 rd and 4 th paths of loads respectively consist of 1 20 omega resistor, 1 10 omega resistor, 1 5 omega resistor and 2 omega resistors connected in series; the industrial personal computer control matrix switching unit is firstly connected with 13-14 point locations, connected with high and low point locations of the multimeter, and records the current voltage value after the digital multimeter is stable; switching to the next group of point locations one by one and measuring voltage values of the point locations until the voltage test of each channel is finished; the industrial personal computer controls 4 paths of loads to adjust, the 1 st and 2 nd paths of loads are respectively formed by connecting 12 omega and 1 0.5 omega resistor in series, and the 3 rd and 4 th paths of loads are respectively formed by connecting 1 omega, 20 omega and 5 omega resistor in series; the industrial personal computer controls the digital multimeter and the matrix switching unit to complete the voltage test of each channel; the controller controls 4 paths of loads to carry out third adjustment, the 1 st and 2 th paths of loads are respectively formed by connecting 1 resistor in series at 10 omega, 5 omega and 1 omega, and the 3 rd and 4 th paths of loads are respectively formed by connecting 1 resistor in series at 100 omega and 50 omega; the industrial personal computer controls the digital multimeter and the matrix switching unit to complete the voltage test of each channel; calculating the load stability, and finishing the whole test; the industrial personal computer controls the input power supply to be powered off, and the incubator recovers to the normal temperature state and is closed.
(7) And (3) carrying out temperature stability test according to test configuration parameters: the industrial personal computer controls the input power supply, the load, the matrix switching unit, the digital multimeter and the data record (4), the industrial personal computer controls the start and the operation of the incubator, and the start of 1h for timing is carried out after the temperature of the incubator reaches the set temperature of minus 40 ℃; the industrial personal computer controls the matrix switching unit and the digital multimeter to complete voltage testing of each channel; the industrial personal computer controls the input power supply to be powered off, then the industrial personal computer respectively controls the temperature boxes to reach 20 ℃ and 60 ℃, the temperature is kept for 1h, and the industrial personal computer controls the matrix switching unit and the digital multimeter to complete voltage testing of each channel at each temperature; calculating the negative temperature definite degree, and finishing the whole test; the industrial personal computer controls the input power supply to be powered off, and the incubator recovers to the normal temperature state and is closed.
(9) Start-up characteristic check and output ripple check: the industrial personal computer controls the temperature control box, the input power supply and the load to be same as (4), the industrial personal computer controls the start of the oscilloscope and connects 4 paths of loads, and the industrial personal computer controls the matrix switching unit to be firstly connected with 13-14 point positions and connected with the oscilloscope; the industrial personal computer starts the input power supply and simultaneously controls the oscilloscope to record the starting waveform or ripple wave of the channel; after the waveform information is recorded, the input power of the industrial personal computer is powered off, the matrix switching unit is adjusted, and the waveform recording of other channels is carried out one by one; after the whole test is finished, the industrial personal computer controls the input power supply to be powered off, and the incubator recovers to a normal temperature state and is closed.
(10) Temperature screening test: the industrial control machine controls the temperature box, the input power supply, the load, the digital multimeter and the data record are the same (7).
(11) And (3) voltage impact test: the industrial control computer controls the input power supply, the load, the digital multimeter and the data record (5).
(12) And (4) state alarm: in each test process, the industrial personal computer receives actual data of the incubator, the input power supply, the load and the output voltage of the tested product, compares the actual data with alarm parameters in the test configuration parameters, and controls corresponding equipment to power off and alarm when the actual data exceeds a set threshold value.
The above description is only one embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Although the present invention has been described with reference to the preferred embodiments, it is not intended to limit the present invention, and those skilled in the art can make variations and modifications of the present invention without departing from the spirit and scope of the present invention by using the methods and technical contents disclosed above.
Claims (10)
1. The utility model provides a secondary power supply circuit intelligence test system which characterized in that: the test system is used for testing N channels of M products to be tested, and each channel is provided with a load;
the test system comprises an industrial personal computer, a test configuration module, a test equipment subsystem and a state monitoring alarm subsystem;
the test equipment subsystem comprises an incubator, an input power supply, a matrix switching unit, a digital multimeter and an oscilloscope;
the state monitoring and alarming subsystem comprises an incubator state abnormity diagnosis module, an input power supply abnormity diagnosis module, a load state abnormity diagnosis module and an output voltage state abnormity diagnosis module;
the test configuration module is used for controlling the test equipment subsystem to perform decomposition to form a test configuration parameter A and also used for decomposing data indexes of M products to be tested to form a test configuration parameter B, and the formed test configuration parameter A and the formed test configuration parameter B are input to the industrial personal computer;
the incubator is used for receiving a temperature control instruction output by the industrial personal computer and providing environment temperature for the M products to be tested according to the received temperature control instruction;
the input power supply is used for receiving a voltage control instruction and a current control instruction output by the industrial personal computer, and providing working voltages for the M products to be tested according to the received voltage control instruction and current control instruction, wherein the working voltages comprise constant voltages and dynamic voltages;
the matrix switching unit is used for receiving a channel switching control instruction output by the industrial personal computer and realizing switching among N channels of M products to be tested according to the received channel switching control instruction;
the digital multimeter is used for receiving a working mode control instruction output by the industrial personal computer and testing the resistance value or the voltage value of each channel of the M products to be tested according to the received working mode control instruction;
the oscilloscope is used for receiving the waveform control instruction output by the industrial personal computer and testing the waveform of each channel of the M products to be tested according to the received waveform control instruction;
the incubator state abnormity diagnosis module is used for receiving an incubator temperature abnormity alarm control instruction output by the industrial personal computer and alarming for incubator temperature abnormity according to the received incubator temperature abnormity alarm control instruction, wherein the incubator temperature abnormity refers to the fact that the difference value between the set temperature of the incubator and the actually measured temperature of the incubator exceeds a threshold value;
the input power supply abnormity diagnosis module is used for receiving an abnormity alarm control instruction of an input power supply output by the industrial personal computer and alarming abnormity of the input power supply according to the received abnormity alarm control instruction of the input power supply, wherein the abnormity of the input power supply means that the difference value between the actual output voltage value or current value of the input power supply and the set output voltage value or current value of the input power supply exceeds a threshold value;
the load state abnormity diagnosis module is used for receiving a load abnormity alarm control instruction output by the industrial personal computer and alarming load abnormity according to the received load abnormity alarm control instruction, wherein the load abnormity refers to the fact that the relative error between the actual resistance value of the load and the set resistance value of the load exceeds a threshold value;
the output voltage state abnormity diagnosis module is used for receiving an output voltage abnormity alarm control command output by the industrial personal computer and alarming the output voltage abnormity of each channel of M products to be tested according to the received output voltage abnormity alarm control command, wherein the output voltage abnormity of each channel means that the difference value of the actual output voltage value and the set voltage value of each channel exceeds a threshold value;
the industrial personal computer is used for receiving a test configuration parameter A and a test configuration parameter B input by the test configuration module;
the industrial personal computer is also used for outputting a temperature control instruction to the incubator;
the industrial personal computer is also used for outputting a voltage control instruction and a current control instruction to the input power supply;
the industrial personal computer is also used for outputting a resistance control instruction to a load;
the industrial personal computer is also used for outputting a channel switching control instruction to the matrix switching unit;
the industrial personal computer is also used for outputting a working mode control instruction to the digital multimeter;
the industrial personal computer is also used for outputting a waveform control instruction to the oscilloscope;
the industrial personal computer is also used for outputting an alarm control command of temperature abnormity of the incubator to the incubator state abnormity diagnosis module;
the industrial personal computer is also used for outputting an abnormity alarm control instruction of the input power supply to the input power supply abnormity diagnosis module;
the industrial personal computer is also used for outputting a load abnormity alarm control command to the load state abnormity diagnosis module;
the industrial personal computer is also used for outputting a voltage abnormity alarm control command to the output voltage state abnormity diagnosis module.
2. The intelligent test system for secondary power supply circuits according to claim 1, characterized in that: each load is composed of Q groups of authority resistors with different magnitudes, Q is a positive integer, the authority ratio is 1, 2 and 5 or the combination of 1, 2, 3 and 4, the required resistance value is obtained, and M, N are all positive integers.
3. An intelligent test method for a secondary power supply circuit is characterized in that: the method comprises the steps of performing insulation resistance testing, characteristic resistance testing, voltage precision testing, voltage stability testing, load stability testing, starting characteristic testing, output ripple wave testing, temperature stability testing, temperature screening testing and voltage impact testing on the secondary power supply circuit.
4. The intelligent test method of the secondary power supply circuit according to claim 3, characterized in that: the insulation resistance value test method comprises the following steps: the method comprises the following steps of (1) sequentially measuring insulation resistance values among N channel points of M products to be measured by using a digital multimeter without starting a temperature box and connecting an input power supply and a load at normal temperature;
the characteristic resistance value testing method comprises the following steps: the incubator is not started at normal temperature, the input power supply and the load are not switched on, and the digital multimeter is used for sequentially measuring the characteristic resistance values among N channel point positions of M products to be measured.
5. The intelligent test method of the secondary power supply circuit according to claim 3, characterized in that: the voltage precision testing method comprises the following steps: under a set temperature, an input power supply and N paths of loads are connected, and N channel output voltages of M products to be tested are sequentially measured by using a digital multimeter;
the method for testing the voltage stability comprises the following steps: and under the set temperature, connecting N paths of loads, adjusting the output value of the input power supply, sequentially measuring N channel output voltages corresponding to the input voltages of M products to be tested by using a digital multimeter, and calculating the voltage stability.
6. The intelligent test method of the secondary power supply circuit according to claim 3, characterized in that: the method for testing the load stability comprises the following steps: and under the set temperature, switching on an input power supply, adjusting the resistance value of the load, sequentially measuring N channel output voltages corresponding to the resistance values of the loads of M products to be tested by using a digital multimeter, and calculating the stability of the load.
7. The intelligent test method of the secondary power supply circuit according to claim 3, characterized in that: the method for starting the characteristic check comprises the following steps: under a set temperature, an input power supply and N paths of loads are switched on, an oscilloscope is used for measuring the starting time, the starting current and the starting overshoot of N channels of M products to be tested in sequence, and the waveform is recorded;
the method for checking the output ripple comprises the following steps: and under the set temperature, switching on an input power supply and N paths of loads, sequentially measuring the voltage ripples of N channels of M products to be measured by using an oscilloscope, and recording the waveforms.
8. The intelligent test method of the secondary power supply circuit according to claim 3, characterized in that: the method for testing the temperature stability comprises the following steps: setting a plurality of constant temperatures, switching on an input power supply and N paths of loads, sequentially measuring output voltages of N channels of M products to be measured at the set constant temperatures by using a digital multimeter, and calculating temperature stability;
the method for the temperature screening test comprises the following steps: and under the condition of constant temperature or variable temperature, connecting an input power supply and N paths of loads, and sequentially measuring the output voltages of N channels of M products to be measured by using a digital multimeter.
9. The intelligent test method of the secondary power supply circuit according to claim 3, characterized in that: the voltage impact test method comprises the following steps: the incubator is not started at normal temperature, the dynamic voltage and the N-path load are connected, and the digital multimeter is used for sequentially measuring the output voltages of N channels of M products to be measured.
10. The intelligent test method of the secondary power supply circuit according to claim 3, characterized in that: the matrix switching unit is used for measuring and switching resistance values or voltages among N channels of M products to be tested, point positions among measurement points of the resistance values or the voltages are set to be (Xi, Yi), all measurement point positions of the test channels form a measurement matrix and are input into the test configuration module, and X-Y connection is controlled by controlling a cross point (namely a relay) of a switching device between X lines and Y lines, so that a routing relation is established between the channels to be tested and the subsystem of the test equipment, and the switching of the N channels is realized;
the method for reading the numerical value of the digital multimeter comprises the following steps: and setting the basic time T0 and the step time Tp, wherein the test time of each measuring point is T0+ n Tp, n is an integer, the resistance value or the voltage is measured once at each time, and when the difference value between the current acquired value of the resistance or the voltage and the previous acquired value of the resistance or the voltage is less than a threshold value, the resistance value or the voltage can be recorded when the resistance value or the voltage reaches a stable state.
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