CN111463574A - Two-dimensional scanning reflective array - Google Patents
Two-dimensional scanning reflective array Download PDFInfo
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- CN111463574A CN111463574A CN202010146857.XA CN202010146857A CN111463574A CN 111463574 A CN111463574 A CN 111463574A CN 202010146857 A CN202010146857 A CN 202010146857A CN 111463574 A CN111463574 A CN 111463574A
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- array
- reflective array
- reflective
- feed source
- reflection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q3/00—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system
- H01Q3/12—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system using mechanical relative movement between primary active elements and secondary devices of antennas or antenna systems
- H01Q3/16—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system using mechanical relative movement between primary active elements and secondary devices of antennas or antenna systems for varying relative position of primary active element and a reflecting device
- H01Q3/20—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system using mechanical relative movement between primary active elements and secondary devices of antennas or antenna systems for varying relative position of primary active element and a reflecting device wherein the primary active element is fixed and the reflecting device is movable
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q13/00—Waveguide horns or mouths; Slot antennas; Leaky-waveguide antennas; Equivalent structures causing radiation along the transmission path of a guided wave
- H01Q13/02—Waveguide horns
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q19/00—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic
- H01Q19/10—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using reflecting surfaces
- H01Q19/104—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using reflecting surfaces using a substantially flat reflector for deflecting the radiated beam, e.g. periscopic antennas
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- Aerials With Secondary Devices (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
Abstract
The invention relates to the technical field of reflective array antennas, and discloses a two-dimensional scanning reflective array, which comprises a fixed feed source and a reflective array, wherein the feed source is fixed in position, a beam emitted by the feed source points to the reflective array, and the reflective array rotates around an array central point O to change incident phase distribution on the reflective array to form a scanning beam. The invention realizes two-dimensional beam scanning by fixing the feed source and rotating the reflection array surface, and simultaneously, the invention expands the scanning range without side lobes and reduces the number of array elements by reasonably distributing the reflection units.
Description
Technical Field
The invention relates to the field of reflective array antennas, in particular to a two-dimensional scanning reflective array.
Background
The high-gain antenna is widely applied in the fields of wireless communication, radar, imaging, remote sensing and the like. In high gain antenna designs, a reflecting surface is typically used to achieve the convergence of the electromagnetic waves. In the transmitting antenna, the reflecting surface converges the electromagnetic wave transmitted from the feed source to generate a narrow transmitting beam. In the receiving antenna, the reflecting surface converges the space incoming wave to the feed source so as to realize the focusing and receiving of energy.
The reflective array antenna combines the advantages of the array antenna and the reflector antenna, has the characteristics of being planar, simple in structure, easy to integrate, adjustable in reflection coefficient and the like, and can be applied to high-gain antenna design. The reflection array is composed of a plurality of reflection units, each reflection unit provides a phase compensation quantity, so that electromagnetic waves emitted by the feed source form the same phase on the surface where the reflection array units are located, and high-gain narrow-beam radiation is generated.
In the searching and tracking of the radar to the target and the communication to the moving target, the beam scanning reflection array can increase the flexibility of the system and improve the use efficiency of the system. For a reflective array antenna capable of forming a scanning beam, in the prior art, beam scanning is realized by moving a feed source and controlling the phase of a reflecting unit.
Beam Scanning is achieved by changing the phase on the reflective array through a mobile feed source (see G.B.Wu, S.W.Qu, S.Yang.Wide-Angle Beam-Scanning reflection With Mechanical characteristics. IEEETransmission on extensions and amplification, 2017,66(1): 172-181; S.Renga.J.scanning and amplification of Microtrip reflection Antennas. IEEE extensions and Wireless amplification L equivalents, 2011,9: 163-166; Chengman. Beam Scanning Microstrip reflective array antenna design. Western electronics report, 2015,42(6 dAto 173; B.Khayation; Y.Rahh-Transmission J.amplification. slurry and amplification, 2006. emission and amplification, 2017. distribution, application cost of the mobile feed source, feedback, balance of feedback, interference.
The Beam scanning is realized by controlling the reflection phase of the single reflection unit to adjust the phase distribution of the reflection array, which includes a unit rotation (V.F. Fusco, "Mechanical Beam scanning and reflection arrangement," IEEETransmission on antenna and reflection, 2005,53(11): 3842-.
In summary, the method of changing each reflection unit has the problems of complex control and high cost, and the method of moving the feed source is not suitable for the problem of fixing the feed source.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: aiming at the existing problems, the reflecting array with fixed feed source and capable of realizing two-dimensional high-gain beam scanning by rotating the reflecting array surface is provided. Meanwhile, through reasonable distribution of the reflection units, the sidelobe-free scanning range is expanded, and the number of array elements is reduced.
The technical scheme adopted by the invention is as follows: a two-dimensional scanning reflectarray, comprising: the position of the feed source is fixed, and the feed source wave beam points to the reflective array; the reflective array rotates around the central point of the array.
Further, the reflection front of the reflection array is a plane.
Furthermore, different metal patterns are arranged on the back of the reflection array to form different reflection phases.
Furthermore, a reflection unit is arranged in the reflection array, and the reflection unit is periodically arranged in the reflection array.
Further, the periodic arrangement mode is a triangular grid mode.
Further, the reflection unit includes a metal pattern, a substrate, and a metal floor, the metal pattern is disposed on one side of the substrate, and the metal floor is disposed on the other side of the substrate.
Compared with the prior art, the beneficial effects of adopting the technical scheme are as follows: the content designed reflective array antenna of the invention has the advantages that the feed source position is fixed, and the high-gain wave beam scanning is realized by rotating the reflective array.
Drawings
FIG. 1 is a schematic diagram of a two-dimensional scanning reflective array.
Fig. 2 is a schematic diagram of the position of the reflecting unit array.
Fig. 3 is a schematic side view of the reflective array unit.
FIG. 4 is a schematic diagram of the coordinate system definition of the reflective array.
FIG. 5 is a schematic diagram of a reflection surface compensated phase profile.
Fig. 6 does not turn the pitch plane pattern.
Fig. 7 is a schematic view of a 10 ° pitch turn.
Fig. 8 pitch plane pattern for 10 pitch rotation.
Fig. 9 is a schematic view of a 20 ° pitch turn.
Fig. 10 pitch plane pattern when pitched 20.
Fig. 11 azimuth pattern with 10 ° azimuth rotation.
Fig. 12 azimuth patterns with 5 deg. azimuth rotation.
Reference numerals: 101-feed source, 102-reflection array, 103-reflection unit, 201-metal pattern, 202-substrate and 203-metal floor.
Detailed Description
The invention is further described below with reference to the accompanying drawings.
Example 1
As shown in fig. 1, the present invention provides a two-dimensional scanning reflective array, which comprises a feed source and a reflective array, wherein the feed source is fixed in position and arranged at the front end of the central point O of the reflective array, so that a beam emitted by the feed source can point to the reflective array. The reflective array rotates about the center point O to change the incident phase distribution on the reflective array, thereby forming a scanned beam.
The reflecting array surface of the reflecting array is set to be a plane, the back surface of the reflecting array is made of metal, and different metal patterns are arranged on the surface of the back surface to form different reflecting phases.
As shown in fig. 2, the reflective array is provided with reflective units, and the reflective units are arranged periodically in a triangular grid manner.
As shown in fig. 3, the reflecting surface unit includes a metal pattern, a substrate and a metal floor; the metal pattern is arranged above the substrate, and the metal floor is arranged below the substrate.
Preferably, the metal pattern is formed on the substrate through a printing process or a machining process.
Preferably, a gap may be provided between the base plate and the metal floor.
The operation mode of the reflective array is as follows:
the reflective array units are arranged in a regular triangle, as shown in fig. 2, the side length of the regular triangle is 0.96 times of the working wavelength. The length and width of the reflecting array are both 13.2 times of wavelength. The focal length of the reflecting array in the horizontal direction (the distance between the feed source and the center of the reflecting surface) is 30 times of the wavelength.
The coordinate system is defined as shown in fig. 4, the azimuth angle is the rotation angle of the reflective array around the y-axis, and the pitch angle is the rotation angle of the reflective array around the x-axis. The phase compensation amount of the reflective array unit is shown in fig. 5, wherein the ordinate X is the serial number of the reflective unit on the X axis, and Y is the serial number of the reflective unit on the Y axis.
The initial position of the reflection array surface is positioned on the xoy plane, and the feed source irradiates the reflection array along the-z direction. The pitch normalized pattern is shown in fig. 6 when the reflecting surface is not rotated. The rotation center O is the center of the upper surface of the reflective array, the reflective array rotates 10 degrees around the x-axis, as shown in fig. 7, and a pitch surface normalized directional diagram is formed as shown in fig. 8. The reflective array is rotated 20 about the x-axis as shown in fig. 9, resulting in a pitch normalized pattern as shown in fig. 10. The reflection array is rotated 10 around the y-axis from the initial position to form an azimuth normalized directional pattern as shown in fig. 11. The array is rotated 5 about the y-axis from the initial position to form an azimuth normalized pattern as shown in fig. 12.
As seen from the directional diagram after the reflection array rotates, the reflection array rotates around the x axis to form beam scanning on the pitching surface; rotation of the reflective array about the y-axis forms a beam sweep in the azimuth plane.
The invention is not limited to the foregoing embodiments. The invention extends to any novel feature or any novel combination of features disclosed in this specification and any novel method or process steps or any novel combination of features disclosed. Those skilled in the art to which the invention pertains will appreciate that insubstantial changes or modifications can be made without departing from the spirit of the invention as defined by the appended claims.
Claims (6)
1. A two-dimensional scanning reflectarray, comprising: the position of the feed source is fixed, and the feed source wave beam points to the reflective array; the reflective array rotates around the central point of the array.
2. A two-dimensional scanning reflective array according to claim 1, wherein said reflective array has a planar reflective front.
3. A two-dimensional scanning reflective array according to claim 1 or claim 2, wherein said reflective array is provided with different metal patterns on its back surface.
4. A two-dimensional scanning reflective array according to claim 1 or 2, wherein said reflective array has reflective elements arranged therein, said reflective elements being arranged periodically within said reflective array.
5. A two-dimensional scanning reflective array according to claim 4, wherein said periodic arrangement is a triangular grid arrangement.
6. A two-dimensional scanning reflective array according to claim 4, wherein said reflective elements comprise a metal pattern, a substrate and a metal floor, said metal pattern being disposed on one side of said substrate, said metal floor being disposed on the other side of said substrate.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021150384A1 (en) * | 2020-01-08 | 2021-07-29 | Metawave Corporation | Reflectarray antenna with two-dimensional beam scanning |
CN114914696A (en) * | 2022-05-30 | 2022-08-16 | 中国电子科技集团公司第二十九研究所 | Reflective array antenna |
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CN101136504A (en) * | 2007-09-28 | 2008-03-05 | 中国电子科技集团公司第五十四研究所 | Method for manufacturing mirror scanning array antenna |
CN102769173A (en) * | 2012-04-28 | 2012-11-07 | 深圳光启创新技术有限公司 | Portable metamaterial panel satellite antenna and satellite antenna receiving system comprising thereof |
CN104779442A (en) * | 2015-04-24 | 2015-07-15 | 电子科技大学 | Electronic control beam scanning reflection array antenna and beam scanning method thereof |
US20180136313A1 (en) * | 2016-11-17 | 2018-05-17 | Rohde & Schwarz Gmbh & Co. Kg | Calibration device and calibration method for calibrating antenna arrays |
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2020
- 2020-03-05 CN CN202010146857.XA patent/CN111463574A/en active Pending
Patent Citations (4)
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CN101136504A (en) * | 2007-09-28 | 2008-03-05 | 中国电子科技集团公司第五十四研究所 | Method for manufacturing mirror scanning array antenna |
CN102769173A (en) * | 2012-04-28 | 2012-11-07 | 深圳光启创新技术有限公司 | Portable metamaterial panel satellite antenna and satellite antenna receiving system comprising thereof |
CN104779442A (en) * | 2015-04-24 | 2015-07-15 | 电子科技大学 | Electronic control beam scanning reflection array antenna and beam scanning method thereof |
US20180136313A1 (en) * | 2016-11-17 | 2018-05-17 | Rohde & Schwarz Gmbh & Co. Kg | Calibration device and calibration method for calibrating antenna arrays |
Non-Patent Citations (1)
Title |
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NAN-NAN WANG ET AL: "A Wide-Angle Beam Scanning Reflectarray Antenna with Four Focuses Design and Staggered Arrangement of Elements", 《2018 INTERNATIONAL SYMPOSIUM ON ANTENNAS AND PROPAGATION (ISAP)》 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021150384A1 (en) * | 2020-01-08 | 2021-07-29 | Metawave Corporation | Reflectarray antenna with two-dimensional beam scanning |
CN114914696A (en) * | 2022-05-30 | 2022-08-16 | 中国电子科技集团公司第二十九研究所 | Reflective array antenna |
CN114914696B (en) * | 2022-05-30 | 2023-04-18 | 中国电子科技集团公司第二十九研究所 | Reflective array antenna |
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Application publication date: 20200728 |