CN111398701B - Equipment test method, device, computer equipment and storage medium - Google Patents
Equipment test method, device, computer equipment and storage medium Download PDFInfo
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- CN111398701B CN111398701B CN201910002112.3A CN201910002112A CN111398701B CN 111398701 B CN111398701 B CN 111398701B CN 201910002112 A CN201910002112 A CN 201910002112A CN 111398701 B CN111398701 B CN 111398701B
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K7/10544—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation by scanning of the records by radiation in the optical part of the electromagnetic spectrum
- G06K7/10821—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation by scanning of the records by radiation in the optical part of the electromagnetic spectrum further details of bar or optical code scanning devices
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Abstract
The application relates to a device testing method, a device, computer equipment and a storage medium. The method comprises the following steps: acquiring first data of the tested equipment through a communication interface, wherein the first data is used for uniquely marking the tested equipment; scanning a display screen connected with the tested equipment through a scanning gun; when a scanning gun scans a display screen to obtain second data, comparing the first data with the second data, wherein the second data is obtained by scanning according to a coding pattern displayed when the display screen is lighted, the coding pattern is generated by the tested equipment according to the first data and is transmitted to the display screen, and the display screen is controlled by a pin which is used for connecting the display screen and arranged on the tested equipment; and when the first data is matched with the second data, the tested device is tested to pass. The equipment testing method, the equipment testing device, the computer equipment and the storage medium can improve the accuracy of equipment testing.
Description
Technical Field
The present application relates to the field of computer technologies, and in particular, to a device testing method and apparatus, a computer device, and a storage medium.
Background
In a device manufacturer, after electronic devices are produced in a large scale, the electronic devices often need to be tested to ensure that the electronic devices can be used normally after being purchased by a user. In the conventional device testing method, a professional technician is required to detect whether the device passes the test. However, this device testing method often causes the situation that the electronic device that passes the test cannot be used normally, and has a problem of low accuracy.
Disclosure of Invention
In view of the above, it is necessary to provide a device testing method, apparatus, computer device and storage medium capable of improving accuracy.
A method of device testing, the method comprising:
acquiring first data of the tested device through the communication interface, wherein the first data is used for uniquely marking the tested device;
scanning a display screen connected with the tested equipment through the scanning gun;
when the scanning gun scans the display screen to obtain second data, comparing the first data with the second data, wherein the second data is obtained by scanning according to a coding pattern displayed when the display screen is lighted, the coding pattern is generated by the tested device according to the first data and is sent to the display screen, and the display screen is controlled by a pin which is used for connecting the display screen and is arranged on the tested device;
and when the first data is matched with the second data, the tested device is tested to pass.
A device testing apparatus, the apparatus comprising:
the first data acquisition module is used for acquiring first data of the tested device through the communication interface, wherein the first data is used for uniquely marking the tested device;
the scanning module is used for scanning a display screen connected with the tested equipment through the scanning gun;
the comparison module is used for comparing the first data with the second data when the scanning gun scans the display screen to obtain the second data, wherein the second data is obtained by scanning according to a coding pattern displayed when the display screen is lighted, the coding pattern is generated by the tested device according to the first data and is sent to the display screen, and the display screen is controlled by a pin which is used for connecting the display screen and arranged on the tested device;
and the matching module is used for passing the test of the tested equipment when the first data is matched with the second data.
A computer device comprising a memory storing a computer program and a processor implementing the steps of the device testing method when the computer program is executed.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the above-mentioned device testing method.
According to the equipment testing method, the equipment testing device, the computer equipment and the storage medium, the first data which uniquely mark the tested equipment is obtained through the communication interface, the display screen connected with the tested equipment is scanned through the scanning gun, when the second data is obtained, the pin of the tested equipment can enable the display screen to be normally lighted, when the first data is matched with the second data, the pin of the tested equipment can control the display screen to display the correct second data, the tested equipment is tested to pass, and the equipment testing accuracy is improved.
Drawings
FIG. 1 is a diagram of an exemplary environment in which a method for testing a device may be implemented;
FIG. 2 is a flow diagram illustrating a method for testing a device according to one embodiment;
FIG. 3 is a flow diagram illustrating the steps in testing the device according to one embodiment;
FIG. 4 is a schematic flow chart showing the steps of testing the device in another embodiment;
FIG. 5 is a schematic flow chart showing the steps of testing the device in another embodiment;
FIG. 6 is a flow diagram illustrating a method for testing a device according to one embodiment;
FIG. 7 is a block diagram showing the structure of a device testing apparatus according to an embodiment;
FIG. 8 is a block diagram showing the construction of a device testing apparatus according to another embodiment;
FIG. 9 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The device testing method provided by the embodiment of the application can be applied to the application environment shown in fig. 1. Wherein, the terminal 102 communicates with the device under test 104 through the communication interface. The terminal 102 acquires first data of the device under test 104 through the communication interface, wherein the first data is used for uniquely marking the device under test; scanning a display screen connected with the tested equipment through a scanning gun; when a scanning gun scans a display screen to obtain second data, comparing the first data with the second data, wherein the second data is obtained by scanning according to a coding pattern displayed when the display screen is lighted, the coding pattern is generated by the tested equipment according to the first data and is transmitted to the display screen, and the display screen is controlled by a pin which is used for connecting the display screen and arranged on the tested equipment; and when the first data is matched with the second data, the tested device is tested to pass. The terminal 102 may be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, and portable wearable devices.
In one embodiment, as shown in fig. 2, there is provided a device testing method comprising the steps of:
The first data refers to data uniquely identifying the device under test, and may be an identifier of the device under test, such as an IMEI (International Mobile Equipment Identity) number, an Equipment code of the device under test, or a unique Equipment name, which is not limited to this. The communication Interface refers to an Interface for transmitting a communication message, such as a Serial port 232, a Serial port 485, an ethernet Interface, a GPIB (General-Purpose-Bus) Interface, a USB (Universal Serial Bus) Interface, a wireless Interface, an optical fiber Interface, and the like.
In the device under test, first data uniquely identifying the device under test may be stored. The terminal can acquire the first data of the tested device through the communication interface. It should be noted that some devices under test do not store the first data, and when the terminal does not acquire the first data through the communication interface, the terminal ends the device testing process for the devices under test, and does not pass the test for the devices under test.
And step 204, scanning a display screen connected with the tested equipment through a scanning gun.
Wherein, the scanning gun refers to a device for scanning the coding pattern to obtain the data carried by the coding information. For example, when a scanning gun scans a bar code of a commodity, data such as price, number, name and the like of the commodity can be obtained.
The tested device is connected with the display screen and can transmit data to the display screen. The terminal can scan the display screen through the scanning gun, and therefore data on the display screen can be acquired.
And step 206, when the scanning gun scans the display screen to obtain second data, comparing the first data with the second data, wherein the second data is obtained by scanning according to a coding pattern displayed when the display screen is lighted, the coding pattern is generated by the tested device according to the first data and is sent to the display screen, and the display screen is controlled by a pin used for connecting the display screen on the tested device.
The code pattern refers to a pattern composed of codes, such as a bar code, a two-dimensional code, and the like. The second data refers to data obtained by scanning the coding pattern by the scanning gun. The pins refer to the connection wires led out from the internal circuit of the device to be tested and connected with the external circuit, namely the display screen.
The tested device is connected with the display screen through pins, and the pins of the tested device can control the display screen. Specifically, when the pin is turned on, the display screen is lighted; when the pin is not conducted, the display screen is not lighted. When the pin contact is poor, the display screen may have the problems of incomplete display, large noise of the coding pattern displayed on the display screen, and the like, but the pin contact is not limited to this. Therefore, the second data obtained by scanning the coding pattern on the display screen is compared with the first data, whether the pin works normally is judged according to the comparison result, and whether the tested equipment passes the test can be further judged.
In the tested equipment, the first data is coded by using a coding pattern generation algorithm to obtain a coding pattern, and the coding pattern is sent to a display screen. The scanning gun of the terminal scans the coding pattern on the display screen, a coding pattern analysis algorithm corresponding to the coding pattern generation algorithm can be applied to analyze the coding pattern to obtain second data, and the first data and the second data are compared.
And step 208, when the first data is matched with the second data, the tested device is tested to pass.
When the first data is matched with the second data, the pins of the tested equipment work normally, a complete coding pattern can be displayed on the display screen, and the testing of the tested equipment is passed if the coding pattern generation algorithm corresponds to the coding pattern analysis algorithm.
When the first data is not matched with the second data, it indicates that the pin of the tested device cannot work normally, that is, the complete coding pattern cannot be displayed on the display screen, or the coding pattern generation algorithm is not corresponding to the coding pattern analysis algorithm, and the tested device is not tested.
In the embodiment, the first data which uniquely marks the tested device is acquired through the communication interface, the display screen connected with the tested device is scanned through the scanning gun, when the second data is acquired, the pin of the tested device can enable the display screen to be normally lighted, when the first data is matched with the second data, the pin of the tested device can control the display screen to display correct second data, the tested device passes the test, and the accuracy of the device test is improved.
In one embodiment, acquiring first data of a device under test through a communication interface includes:
The equipment test instruction is used for instructing the terminal to test the equipment. The device test instruction may be obtained through user input, or may be generated at a time point that passes through a preset time point, without being limited thereto.
And step 304, detecting whether the communication interface is connected with the tested device according to the device test instruction.
And after the terminal acquires the equipment test instruction, detecting whether the communication interface is connected with the tested equipment or not according to the equipment test instruction. Detection may be by a question-answer to the instruction. For example, after the terminal sends an inquiry instruction to the device to be tested through the communication interface, when a response instruction sent by the device to be tested is received within a preset time period, it indicates that the communication interface is normally connected with the device to be tested, and when the response instruction sent by the device to be tested is not received within the preset time period, it indicates that the communication interface is abnormally connected with the device to be tested and normal communication cannot be performed.
When the communication interface is detected to be in a connection state with the tested device, the terminal generates a first data acquisition instruction and sends the first data acquisition instruction to the tested device through the communication interface.
And 308, acquiring first data sent by the device to be tested through the communication interface.
The terminal sends a first data acquisition instruction to the tested device through the communication interface, acquires first data sent by the tested device through the communication interface, and stores the first data in the terminal.
In the embodiment, whether the communication interface is connected with the tested device or not is detected according to the device test instruction, and when the communication interface is in a connection state with the tested device, the first data acquisition instruction is sent through the communication interface and the first data of the tested device is acquired, so that the device test failure caused by the fact that the tested device is not connected with the communication interface is avoided, and the device test accuracy is improved.
In one embodiment, after detecting whether the communication interface is connected to the device under test according to the device test instruction, the method further includes:
A timestamp refers to a sequence of characters at a particular time that uniquely identifies the time of a particular moment. And when the terminal detects that the communication interface and the tested equipment are in a non-connection state, acquiring a time stamp of the equipment test instruction.
And step 404, acquiring a target duration of the non-connection state of the communication interface and the tested device according to the timestamp of the device test instruction.
After the timestamp of the device test instruction is obtained, the target duration of the non-connection state of the communication interface and the tested device can be obtained through calculation according to the timestamp. For example, when the terminal detects that the communication interface and the device under test are in the disconnected state, the timestamp for acquiring the device test instruction is 44 minutes 21 seconds at 12 months, 28 days and 10 days in 2018. The target time length of the non-connection state between the communication interface and the device to be tested is the difference value between the time stamp of the device test instruction and the time stamp of the target time length. If the long time stamp is 44 minutes and 31 seconds at the time of calculating the target, the time stamp is 12, 28 and 10 hours in 2018, the target time duration is 10 seconds; if the time stamp of the long time when the target is calculated is 12, 28, 10, 45, 31 and seconds in 2018, the target time length is 70 seconds.
And 406, generating prompt information when the target duration is greater than the duration threshold.
The user can preset a time length threshold value, and when the target time length is larger than the time length threshold value, prompt information is generated to prompt that the user communication interface and the tested equipment are in a non-connection state. The prompt message may be a voice message, a text message, a terminal vibration message, etc., but is not limited thereto.
For example, the time length threshold is 10 seconds, when the target time length is 11 seconds, an alarm voice is generated, and text information such as 'the communication interface and the tested device are in a non-connection state' is displayed on a display screen of the terminal.
In this embodiment, when the communication interface and the device under test are in the unconnected state, the target duration in the unconnected state is acquired, and when the target duration is greater than the duration threshold, the prompt message is generated, so that the situation that when the duration in the unconnected state between the communication interface and the device under test is too long, the terminal performs the device test, the device test fails, and computer resources are wasted is avoided. By adopting the scheme of the embodiment, the computer resource can be saved and the accuracy of the equipment test is improved.
In one embodiment, after scanning the display screen connected with the device under test by the scanning gun, the method further comprises: when the scanning gun scans the display screen and does not acquire second data, acquiring target current passing through a pin of the tested equipment; and when the target current is smaller than the current threshold, sending a current adjusting instruction to the tested device, wherein the current adjusting instruction is used for adjusting the target current passing through the pin to reach the current threshold.
It will be appreciated that when the scanning gun scans the code pattern of the display screen, the display screen must be lit and bright enough to allow the scanning gun to scan the code pattern and acquire the data carried by the code pattern. And the brightness of the display screen is controlled by the target current of the pin of the tested device. When the target current of the pin of the tested device is larger, the brightness of the display screen is brighter; when the target current of the pin of the tested device is small, the brightness of the display screen is dark.
In the process of testing the device to be tested, some devices to be tested which normally operate often fail to test because the current of the external power supply is small or unstable, and the problem of low accuracy of the device test exists.
When the scanning gun scans the display screen and does not acquire the second data and the acquired target current passing through the pin of the tested device is smaller than the current threshold, the target current passing through the pin of the tested device is smaller, and the brightness of the display screen is darker. The terminal generates a current regulation instruction and sends the current regulation instruction to the tested device. After the tested device obtains the current adjusting instruction, the target current passing through the pin can be adjusted to reach the current threshold according to the current adjusting instruction. When the target current passing through the pin reaches the current threshold, the target current passing through the pin can enable the brightness of the display screen to be brighter, and the scanning gun can scan the display screen to obtain second data.
In this embodiment, when the scanning gun scans the display screen and does not acquire the second data and the target current acquired through the pin is smaller than the current threshold, the current adjustment instruction is sent to the device to be tested for adjusting the target current passing through the pin to reach the current threshold, so that the problem that the device to be tested normally works cannot pass the test due to the fact that the current of the power supply is small or unstable is avoided, and the accuracy of the device test is improved.
In one embodiment, acquiring the target current through the pin of the device under test when the second data is not acquired by the scanning gun scanning the display screen comprises: when the scanning gun cannot acquire the second data, detecting whether the display screen is lightened; when the display screen is on, a target current through the pin of the device under test is obtained.
When the scanning gun cannot acquire the second data, whether the display screen is lightened or not is detected, namely whether the communication interface is connected with the tested equipment or not is detected. When the display screen is bright, namely the communication interface and the tested device are in a connection state, the target current passing through the pins of the tested device is obtained.
When the display screen is not bright, namely the communication interface and the tested device are in a non-connection state, the target current passing through the pin of the tested device is 0, and another prompt message can be generated.
In this embodiment, when the scan gun does not obtain the second data and the display screen is on, the target current passing through the pin of the device under test is obtained, which further improves the accuracy of the device test.
In one embodiment, when the scan gun scans the display screen for the second data, comparing the first data with the second data includes:
When the display screen is detected to be lightened, scanning the coding pattern of the display screen through the scanning gun to obtain a scanning pattern obtained through scanning.
And after the terminal acquires the scanning pattern, analyzing the scanning pattern to obtain second data, wherein an algorithm for analyzing the scanning pattern to obtain the second data corresponds to an algorithm for generating a coding pattern according to the first data.
In this embodiment, when it is detected that the display screen is lighted, the coding pattern on the display screen is scanned to obtain a scanning pattern, the scanning pattern is analyzed to obtain second data, and the first data and the second data are compared, so that the accuracy of the device test can be further improved.
In one embodiment, the device testing method further includes: acquiring test data of the tested device, wherein the test data is used for representing the attributes of pins of the tested device; and generating a device test report according to the first data, the second data and the test data.
The test data may be the pin identification of the device under test, the magnitude of the current through the pin, whether the pin of the device under test is connected to the display screen, and the like.
And generating a device test report according to the first data, the second data and the test data when the test of the device to be tested passes or the test of the device to be tested does not pass. The device test report may be a result of the device test, such as whether the device test is passed or not, or a reason why the device test is not passed, or performance of the device under test obtained from test data in the device test process, such as a time period from obtaining a device test instruction to displaying a coding pattern on a display screen, or performance of a code of the device under test; such as the magnitude of the current through the pin, the performance of the pin of the device under test can be obtained, but is not limited thereto.
In this embodiment, the test data of the device under test is obtained, and a device test report is generated according to the first data, the second data, and the test data, so that a device test result can be obtained more clearly.
It should be understood that although the various steps in the flow diagrams of fig. 2-5 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 2-5 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performing the sub-steps or stages is not necessarily sequential, but may be performed alternately or alternatingly with other steps or at least some of the sub-steps or stages of other steps.
In one embodiment, the terminal performs step 602 to obtain the device test instruction. When the communication interface is detected to be in a connection state with the device under test according to the device test instruction, step 604 is executed to obtain first data of the device under test. Step 606 is executed to scan the display screen connected to the device under test through the scan gun, where the display screen is controlled by the pins on the device under test for connecting to the display screen. When the second data is not acquired by the scanning gun scanning the display screen, step 608 is executed, and the device test is not passed. When the scanning gun scans the display screen to obtain the second data, step 610 is executed to compare the first data with the second data. When the first data does not match the second data, step 608 is performed and the device test fails. When the first data matches the second data, step 612 is performed and the device test passes.
In one embodiment, as shown in fig. 7, there is provided a device testing apparatus including: a first data acquisition module 702, a scanning module 704, a comparison module 706, and a matching module 708, wherein:
the first data acquiring module 702 is configured to acquire first data of the device under test through the communication interface, where the first data is used to uniquely identify the device under test.
And the scanning module 704 is used for scanning the display screen connected with the tested device through the scanning gun.
And the comparing module 706 is configured to compare the first data with the second data when the scanning gun scans the display screen to obtain the second data, where the second data is obtained by scanning according to a coding pattern displayed when the display screen is lit, the coding pattern is generated by the device under test according to the first data and is sent to the display screen, and the display screen is controlled by a pin on the device under test, which is used to connect to the display screen.
And the matching module 708 is used for passing the test of the device under test when the first data is matched with the second data.
According to the device testing device, the first data which uniquely mark the tested device is obtained through the communication interface, the display screen connected with the tested device is scanned through the scanning gun, when the second data is obtained, the pin of the tested device can enable the display screen to be normally lighted, when the first data is matched with the second data, the pin of the tested device can control the display screen to display the correct second data, the tested device is tested to pass, and the accuracy of device testing is improved.
In one embodiment, as shown in fig. 8, there is provided a device testing apparatus including: a prompt generation module 802, a first data acquisition module 804, a scan module 806, a target current adjustment module 808, a comparison module 810, a matching module 812, and a test report generation module 814, wherein:
a prompt information generating module 802, configured to obtain a timestamp of the device test instruction when the communication interface and the device under test are in a non-connected state; acquiring the target duration of the non-connection state of the communication interface and the tested equipment according to the timestamp of the equipment test instruction; and when the target duration is greater than the duration threshold, generating prompt information.
The first data obtaining module 804 is configured to obtain first data of the device under test through the communication interface, where the first data is used to uniquely identify the device under test.
And the scanning module 806 is used for scanning the display screen connected with the device to be tested through the scanning gun.
The target current adjusting module 808 is configured to obtain a target current passing through a pin of the device under test when the scanning gun scans the display screen and does not obtain the second data; and when the target current is smaller than the current threshold, sending a current adjusting instruction to the tested device, wherein the current adjusting instruction is used for adjusting the target current passing through the pin to reach the current threshold.
The comparison module 810 is configured to compare the first data with the second data when the scanning gun scans the display screen to obtain the second data, where the second data is obtained by scanning according to a coding pattern displayed when the display screen is lit, the coding pattern is generated by the device under test according to the first data and is sent to the display screen, and the display screen is controlled by a pin on the device under test, the pin being used for connecting the display screen.
And a matching module 812, configured to pass the test of the device under test when the first data matches the second data.
A test report generating module 814, configured to obtain test data of the device under test, where the test data is used to represent an attribute of a pin of the device under test; and generating a device test report according to the first data, the second data and the test data.
According to the device testing device, when the target duration of the non-connection state between the communication interface and the tested device is greater than the duration threshold, the prompt message is generated. When the communication interface is connected with the tested equipment, first data which uniquely mark the tested equipment is obtained through the communication interface, and then a display screen connected with the tested equipment is scanned through the scanning gun. When the scanning gun scans the display screen and does not acquire second data and the target current passing through the pin of the tested device is smaller than the current threshold value, a current adjusting instruction is sent to the tested device, wherein the current adjusting instruction is used for adjusting the target current to reach the current threshold value, and the situation that the tested device which normally works cannot pass the test due to the fact that the current of an external power supply is small or unstable is avoided. When the scanning gun scans the display screen to acquire second data, the pin of the tested device can enable the display screen to be normally lighted up, when the first data is matched with the second data, the pin of the tested device can control the display screen to display correct second data, the tested device passes the test, the test data of the tested device is acquired, a device test report is generated according to the first data, the second data and the test data, and the accuracy of device test is improved.
In an embodiment, the first data obtaining module 804 is further configured to obtain a device testing instruction; detecting whether the communication interface is connected with the tested equipment or not according to the equipment test instruction; when the communication interface is connected with the tested device, a first data acquisition instruction is sent to the tested device through the communication interface, wherein the first data acquisition instruction is used for indicating the tested device to acquire first data; the method comprises the steps of obtaining first data sent by a device to be tested through a communication interface.
In one embodiment, the target current adjustment module 808 is further configured to detect whether the display screen is on when the scanning gun does not obtain the second data; when the display screen is on, a target current through the pin of the device under test is obtained.
In one embodiment, the comparing module 810 is further configured to scan the coding pattern displayed on the display screen to obtain a scan pattern when it is detected that the display screen is bright; analyzing the scanning pattern to obtain second data, wherein an algorithm for analyzing the scanning pattern to obtain the second data corresponds to an algorithm for generating a coding pattern according to the first data; the first data and the second data are compared.
For the specific definition of the device testing apparatus, reference may be made to the above definition of the device testing method, which is not described herein again. The various modules in the device testing apparatus described above may be implemented in whole or in part by software, hardware, and combinations thereof. The modules can be embedded in a hardware form or independent of a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 9. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operating system and the computer program to run on the non-volatile storage medium. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a device testing method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on a shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 9 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory in which a computer program is stored and a processor which, when executing the computer program, carries out the steps of the device testing method described above.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of the above-mentioned device testing method.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above may be implemented by hardware instructions of a computer program, which may be stored in a non-volatile computer-readable storage medium, and when executed, may include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include non-volatile and/or volatile memory. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A device testing method is applied to a terminal, the terminal comprises a scanning gun, the terminal is connected with a tested device through a communication interface, and the method comprises the following steps:
acquiring first data of the tested device through the communication interface, wherein the first data is used for uniquely marking the tested device;
scanning a display screen connected with the tested equipment through the scanning gun;
when the scanning gun scans the display screen to obtain second data, comparing the first data with the second data, wherein the second data is obtained by scanning according to a coding pattern displayed when the display screen is lighted, the coding pattern is generated by the tested device according to the first data and is sent to the display screen, and the display screen is controlled by a pin which is used for connecting the display screen and is arranged on the tested device;
and when the first data is matched with the second data, the tested device is tested to pass.
2. The method of claim 1, wherein said obtaining first data of the device under test via the communication interface comprises:
acquiring a device test instruction;
detecting whether the communication interface is connected with the tested equipment or not according to the equipment test instruction;
when the communication interface is in a connection state with the tested device, sending a first data acquisition instruction to the tested device through the communication interface, wherein the first data acquisition instruction is used for indicating the tested device to acquire the first data;
and acquiring the first data sent by the tested device through the communication interface.
3. The method of claim 2, wherein after detecting whether the communication interface is connected to the device under test according to the device test instruction, the method further comprises:
when the communication interface and the tested equipment are in a non-connection state, acquiring a timestamp of the equipment test instruction;
acquiring the target duration of the non-connection state of the communication interface and the tested equipment according to the timestamp of the equipment test instruction;
and when the target duration is greater than the duration threshold, generating prompt information.
4. The method of claim 1, wherein after scanning a display screen connected to the device under test with the scanning gun, further comprising:
when the scanning gun scans the display screen and does not acquire second data, acquiring target current passing through a pin of the tested equipment;
and when the target current is smaller than a current threshold, sending a current adjusting instruction to the tested device, wherein the current adjusting instruction is used for adjusting the target current passing through the pin to reach the current threshold.
5. The method of claim 4, wherein the obtaining a target current through a pin of the device under test when the second data is not obtained by the scanning gun scanning the display screen comprises:
when the scanning gun cannot acquire second data, detecting whether the display screen is lightened;
when the display screen is on, a target current through a pin of the device under test is obtained.
6. The method of claim 1, wherein comparing the first data and the second data as the scan gun scans the display screen for the second data comprises:
when the display screen is detected to be lightened, scanning the coding pattern displayed on the display screen to obtain a scanning pattern;
analyzing the scanning pattern to obtain the second data, wherein an algorithm for analyzing the scanning pattern to obtain the second data corresponds to an algorithm for generating the coding pattern according to the first data;
the first data and the second data are compared.
7. The method according to any one of claims 1-6, further comprising:
acquiring test data of the device under test, wherein the test data is used for representing the attributes of pins of the device under test;
and generating a device test report according to the first data, the second data and the test data.
8. The device testing device is applied to a terminal, the terminal comprises a scanning gun, the terminal is connected with a tested device through a communication interface, and the device comprises:
the first data acquisition module is used for acquiring first data of the tested equipment through the communication interface, and the first data is used for uniquely marking the tested equipment;
the scanning module is used for scanning a display screen connected with the tested equipment through the scanning gun;
the comparison module is used for comparing the first data with the second data when the scanning gun scans the display screen to obtain the second data, wherein the second data is obtained by scanning according to a coding pattern displayed when the display screen is lighted, the coding pattern is generated by the tested device according to the first data and is sent to the display screen, and the display screen is controlled by a pin which is used for connecting the display screen and arranged on the tested device;
and the matching module is used for passing the test of the tested equipment when the first data is matched with the second data.
9. A computer device comprising a memory and a processor, the memory storing a computer program, wherein the processor when executing the computer program performs the steps of the method according to any of claims 1 to 7.
10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
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