CN111352009B - 一种二极管击穿电压检测设备 - Google Patents
一种二极管击穿电压检测设备 Download PDFInfo
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- CN111352009B CN111352009B CN202010312765.4A CN202010312765A CN111352009B CN 111352009 B CN111352009 B CN 111352009B CN 202010312765 A CN202010312765 A CN 202010312765A CN 111352009 B CN111352009 B CN 111352009B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/129—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geophysics And Detection Of Objects (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
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Claims (5)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010312765.4A CN111352009B (zh) | 2020-04-20 | 2020-04-20 | 一种二极管击穿电压检测设备 |
JP2020121003A JP2021173741A (ja) | 2020-04-20 | 2020-07-15 | ダイオードの降伏電圧の測定装置 |
Applications Claiming Priority (1)
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CN202010312765.4A CN111352009B (zh) | 2020-04-20 | 2020-04-20 | 一种二极管击穿电压检测设备 |
Publications (2)
Publication Number | Publication Date |
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CN111352009A CN111352009A (zh) | 2020-06-30 |
CN111352009B true CN111352009B (zh) | 2020-11-27 |
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CN202010312765.4A Active CN111352009B (zh) | 2020-04-20 | 2020-04-20 | 一种二极管击穿电压检测设备 |
Country Status (2)
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JP (1) | JP2021173741A (zh) |
CN (1) | CN111352009B (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112611948B (zh) * | 2020-12-29 | 2022-06-21 | 深圳市丰颜光电有限公司 | 一种发光二极管产品检验装置 |
CN112578256B (zh) * | 2021-01-12 | 2022-05-24 | 广东宝元通检测设备有限公司 | 一种二极管高温环境工作状态检测设备 |
CN112904168B (zh) * | 2021-01-13 | 2021-10-29 | 深圳市灿升实业发展有限公司 | 一种半导体击穿电压检测装置 |
CN114325191B (zh) * | 2021-12-30 | 2023-07-14 | 江苏商贸职业学院 | 电气接口检测维护装置及其检测维护方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2746794A1 (en) * | 2011-09-22 | 2014-06-25 | Tokyo Electron Limited | Probe apparatus |
CN109713857A (zh) * | 2018-12-29 | 2019-05-03 | 浙江方德机器人***技术有限公司 | 一种小电机转子自动装配与测试***、方法及存储介质 |
CN109932628A (zh) * | 2019-04-10 | 2019-06-25 | 益阳市开元电子有限公司 | 一种电容器性能自动测试装置 |
CN209182443U (zh) * | 2018-09-10 | 2019-07-30 | 深圳市矽电半导体设备有限公司 | 一种倒装发光二极管测试设备 |
CN210323263U (zh) * | 2020-01-08 | 2020-04-14 | 深圳市顺达宏基电子有限公司 | 一种smd发光二极管及全自动精准物料检测设备 |
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2020
- 2020-04-20 CN CN202010312765.4A patent/CN111352009B/zh active Active
- 2020-07-15 JP JP2020121003A patent/JP2021173741A/ja active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2746794A1 (en) * | 2011-09-22 | 2014-06-25 | Tokyo Electron Limited | Probe apparatus |
CN209182443U (zh) * | 2018-09-10 | 2019-07-30 | 深圳市矽电半导体设备有限公司 | 一种倒装发光二极管测试设备 |
CN109713857A (zh) * | 2018-12-29 | 2019-05-03 | 浙江方德机器人***技术有限公司 | 一种小电机转子自动装配与测试***、方法及存储介质 |
CN109932628A (zh) * | 2019-04-10 | 2019-06-25 | 益阳市开元电子有限公司 | 一种电容器性能自动测试装置 |
CN210323263U (zh) * | 2020-01-08 | 2020-04-14 | 深圳市顺达宏基电子有限公司 | 一种smd发光二极管及全自动精准物料检测设备 |
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JP2021173741A (ja) | 2021-11-01 |
CN111352009A (zh) | 2020-06-30 |
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Inventor after: Fang Xi Inventor after: Zhang Yuhong Inventor after: Yu Qun Inventor after: Xie Zifang Inventor after: Yang Yang Inventor after: Zheng Wen Inventor after: Liao Yi Inventor after: Zhao Yun Inventor before: Zhao Yun |
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Effective date of registration: 20201109 Address after: 550002 17 Binhe Road, Nanming District, Guiyang City, Guizhou Province Applicant after: GUIZHOU POWER GRID Corp. Address before: 318000 No. 391 Huangjiao Village, Zhang'an Street, Jiaojiang District, Taizhou City, Zhejiang Province Applicant before: Taizhou Jiaojiang Nantun Electronics Co.,Ltd. |
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